US3264562A - Plural bridge system for simultaneously testing a plurality of interconnected circuit elements - Google Patents

Description

Aug. 2, 1966 J. M. BROWN ETAL Filed Sept. 28, 1.961

OF INTERCONNECTED CIRCUIT ELEMENTS 5 Sheets-Sheet 2 UNIT EH2 41 5 416 40 50URE "111 t] A Han E u HIGH HVDILFT R osrsaoe 4-3 oer-enro F g5 59 a 5 5x56 63 0 53a a I, 54 M 67 d ,3Z J3 l Z 56 1.

i vvvvv R5110 011T UNIT l i i a PLHTE 5 63 0F 50 J I {1 Z I 3 62 62 l l 3 To ena ouT U T0 LONTROL RID 0Ff0 ,1966 J M BROWN ETAL 3,264,562

PLURAL BRIDGE SYSTEM FR SIMULTANEOUSLY TESTING A-JPLURALITY OF INTERCONNEGTED CIRCUIT ELEMENTS Filed Sept. 28, 1961 5 Sheets-Sheet 5 Aug. 2, 1966 J. M. BROWN ETAL PLURAL BRIDGE SYSTEM FOR SIMULTANEOUSLY TESTING A PLURALITY OF INTERGONNECTED CIRCUIT ELEMENTS Filed Sept. 28, 1961 5 Sheets-Sheet 4 18a is} 153 s;

Aug. 2, 1966 J. M. BROWN ETAL 3,264,562

PLURAL BRIDGE SYSTEM FOR SIMULTANEOUSLY TESTING APLURALITY 0F INTERCONNECTED CIRCUIT ELEMENTS Filed Sept. 28, 1961 5 Sheets-Sheet 5 mum M U 18.85: ll Q MQ United States Patent PLURAL BRIDGE SYSTEM FOR SIMUL'IANEUUS- LY TEEIIWG A PLURALITY 0F INTER0N- NECTED QIRCUIT ELEMENTS James M. Brown, Waukegan, Ill., and Gwen C. Slater, Racine, and Paul V. Tollefson, Salem, Wis, assignors to Warwick Electronics Inc., a corporation of Delaware Filed Sept. 28, 1961, Ser. No. 141,456 7 Claims. (Cl. 324-73) This invention is concerned with an electronic circuit testing apparatus and more particularly with a testing apparatus for printed circuits, plug-in modules and the like to which connections may readily be made.

A common procedure for testing electronic circuits is to energize the circuits and observe the operation, as by making a plurality of tests which will indicate the nature of the circuit operation. This may require sequential reading of a plurality of meters or other operations. Where the electronic circuits include vacuum tubes, the test procedure requires an initial delay sufiicient to allow the tube filaments to warm. up.

The present invention provides an electronic circuit testing apparatus in which a simultaneous check is made of a plurality of elements in the circuit, providing an indication of the condition of the circuit in a single operation.

One object of the invention is the provision of such a circuit testing apparatus including a standard or reference circuit having circuit elements, a corresponding circuit to be tested having circuit elements corresponding with the elements of the reference circuit, a source of circuit energizing potential connected with each of the circuits and means for comparing an electrical circuit condition of corresponding circuit elements in the standard and test circuits.

Another object of the invention is the provision of such a system in which a plurality of bridge circuits are formed with one such circuit for each set of corresponding circuit elements, the elements comprising two of the legs of the bridge and wherein the indicating means is connected with the bridge and responsive to a condition of balance thereof.

A further object is that the reference and test circuits include elements having both resistance and reactance and the testing apparatus includes a source of direct current, a source of alternating current, means for sequentially connecting the sources with the reference and test circuits, direct current responsive means for detecting an electrical circuit condition of corresponding elements of the reference and test circuits, alternating current responsive means for detecting an electrical circuit condition of corresponding elements of the reference and test circuits, means for sequentially connecting the direct and alternating current responsive detecting means with the circuit elements and in synchronism with the connection of the circuit elements with the sources, and indicating means connected with and responsive to the detecting means for indicating differences in the detected electrical circuit conditions.

Still another object is the provision of testing apparatus including a standard reference circuit element, a corresponding circuit element to be tested, a power source, means connecting the standard and test elements in a bridge circuit with the power source, and a pair of indicators connected with the bridge circuit and responsive to an unbalance therein, one of the indicators being responsive to an undersize test element and the other being responsive to an oversize test element.

Yet a further object is that in testing resistive elements, a direct current power source is connected with the bridge circuit and a pair of direct current amplifiers 3,264,562 Patented August 2, 1&66

"ice

are connected across the bridge circuit one responsive to an oversize test element and the other responsive to an undersize test element.

Another object is that where the circuit elements are reactive, the bridge circuit is connected with an alternating current source, and phase sensitive detecting means are utilized for comparing an unbalance signal across the bridge with a reference signal from the source.

Still a further object is the provision of a testing apparatus including a standard reference circuit including resistive and reactive circuit elements, a corresponding circuit to be tested and having corresponding resistive and reactive circuit elements, a direct current source, an alternating current source, a direct current comparison circuit for each set of circuit elements, an alternating current comparison circuit for each set of circuit elements, a direct current error indicator for each pair of elements, an alternating current error indicator for each set of circuit elements, and switch means having a first condition interconnecting the standard and test circuits with the direct current source, the direct current comparison circuit and the direct current error indicator, and a second condition interconnecting the test and standard circuits with the alternating current source, the alternating current comparison circuit, and the alternating current error indicator.

And another feature of the invention is the provision of method of testing electronic circuits, including the provision of a reference circuit, the application of potential to both the standard circuit and a test circuit, anc' the comparison of a circuit condition of each circuit.

Further objects and advantages will become apparent from the following detailed description taken in connection with the accompanying drawings, in which:

FIGURE 1 is a diagrammatic illustration of a portior of the circuit test apparatus;

FIGURE 2 is a block diagram used in a discussion 01 the circuit testing apparatus;

FIGURE 3 is a block diagram of a direct current test ing circuit for a single circuit element;

FIGURE 4 is a block diagram of an alternating cur rent test circuit for a single circuit element;

FIGURE 5 is a block diagram of a testing system 01 a circuit having a plurality of elements;

FIGURE 6 is a schematic circuit diagram of a portior of a direct current error detection and indicating circuit FIGURE 7 is a schematic diagram of a further portior of a direct current error detection and indicating circuit FIGURE 8 is a schematic diagram of one embodimen of an alternating current error detection circuit;

FIGURE 9 is a schematic diagram of another embodi ment of an alternating current error detection circuit;

FIGURE 10 is a schematic diagram of another em bodiment of an alternating current detector circuit;

FIGURE 11 is a diagrammatic illustration of a read out unit for providing a record of the test results;

FIGURE 12 is a schematic diagram of a circuit fo. the readout unit of FIGURE 10;

FIGURE 13 is a diagrammatic illustration of a por tion of a modified circuit test apparatus; and

FIGURE 14 is a block diagram of a test control circuit While this invention is susceptible of embodiments i1 many different forms, there is shown in the drawings am will herein be described in detail an embodiment of th invention with the understanding that the present disclo sure is to be considered as an exemplification of th principles of the invention and it is not intended to limi the invention to the embodiment illustrated. The scop of the invention will be pointed out in the appende claims.

Much electronic equipment is manufactured toda using printed circuit techniques. In some instances pro duction lines are largely automated with the components being inserted on' the circuit board by automatic machines,

and the soldering operations carried out entirely automatically. These lines thus minimize the need for manual labor in the production of the electrical circuits. Furthermore, such. techniques reduce the time necessary in the assembly of the circuits and IILIIIHIIY cases, the circuits may be assembled more rapidly then they may be tested. Sometimes duplicate circuit'test setups are required so that several testing operations are carried on at the same time. This requiresduplication of test equipment and the labor of severaltest operators. As pointed out above, present test procedures often utilize normal energization of the circuits and observation of various operating conditions to determine whether the circuit performs properly. This type of testing operation often slows the handling of the circuits and provides a limiting factor on the speed of the production line.

The present invention provides a testing apparatus wherein each of the circuit elements, or selected combina-' tions of elements, of the circuit to be tested is compared.

with a corresponding circuit element: (or combination) in a standard or reference circuit. The testing apparatus is particulaly adapted for use with test circuits where electrical connections may be made readily to each of the circuit elements or combinations of elements to be tested. Printed circuits and modular plug-in units are examples of such circuits. Furthermore, certain tests may readily be made of hand wired circuits using connec tions to tube sockets for example.

It is believed at present that-the testing apparatus dis-v closed ,hereinwill find its principal use in production testing of circuits on rapidly moving assembly lines. However, the multiple circuit, simultaneous comparison technique may be utilized in' various other capacities. For example, some of the circuit checks of the lengthy missile :ountdown procedure might be speeded using comparison accordance with the usual practice,,and conductive areas 20 are afiixecl to the undersurface thereof. The terminals )f the various circuit components 16 and 17 are electrically ;ecured thereto as by soldering.

For' the purpose of electrical testing, the circuit board with the various circuit elements mounted thereon s placed in a suitable jig or frame whichis provided with a plurality of electrical contact members 23 which nake electrical-contact with each of the conductive areas )f the undersurtace of board 15. In accordance with he present invention, a pair of such testjigs-are provided, with a standard or reference circuit mounted in one and he circuit to be tested placed in the other so that similar :lectrical connections are made to the various circuit elenents of each circuit.

FIGURE 2 illustrates the basic principle of the circuit esting apparatus. A comparison circuit 25 is provided vhich includes both the circuit element to be tested and be standard or reference circuit element.- The comparion circuit is connected with a potential-source 26 and l detector circuit 27 senses any difierence in a circuit :ondition between the standard or reference element and R and R connected across the source and having their juncture connected to a reference potential-or ground 32.

Bridge circuit 31 is completed by the reference component R and the test component" R A detector circuit 1 32 is connected with the juncture, :between resistors R and R and withQground, sensing the unbalance output Aniindicator ;33 is connected with detector circuit 32 for indicating the nature of the test circuit element'RT, i.e.,.whethe1' .it:is of the correct) value, too large, or too small} Indicator 33 may take the formof lights or other physical signals, or .may'include. an apparatus for recording the necessary information regarding the test circuit; The ,matchedvresistors R and 5 signal across the 1 bridge.

R may, if desired, form a partof the direct current source 30 (as the internal impedance thereof), in which event the source has a balanced output withrespect to a reference potential and the detector circuitisconnected to this reference potential.- A pair?v of' matched batteries are preferred for accurate test work.

FIGURE 4 illustrates a similar testing.;.circuit for 're-, active tcircuitielements. An alternating current'source 35 hasan output including 'two signals and p out of phase with each othenand balanced with respect to ground 32. The standard circuit component Z and the nominally identical test element Z are connected across 'the two phase signals forming a bridge circuit with the source. An alternating current detector 37 is connected withrthe juncture of the reference andtest elements Z and Z The phase signals 12 and 5 are also connected to detector 37, providing a reference signal, so a determine-tion may be made whether the testelement is over. size or under sizes In the case of alternating'current;

tests of reactive elements, the magnitude. of; an error potential is representative of the. magnitude of error of a circuit element, while the phase of the. error signal indicates whether the element inv question 'is. over size ,or

under size. An indicator. 38 is connected-with detector 37, and may include ing apparatus.

FIGURE 5 illustrates a portion of a composite testing apparatus for simultaneously comparing .a plurality of circuitelements. A source. 40' provides a balanced output across which is connected a plurality ofpairs or sets of corresponding cir-cuitzelements; Each set of circuit elements 41 ,'41a' and .4lbineludes a.standard or refer- .ence element, as 42', and .a nominally identical test elernent,sas.42a. Thejun'cture of the two elements, which are connectedin series across thebalanced outputs of the source :40, is connected with a pair of detectonci-rcuits 43 and 44,'for detecting highfvalue and low value: element conditions,respectively. Connected with each of the detectorcircuits is a suitable indicator 45 and 46.1 Furthermore, each of the detector circuits 43 and 44 is connected with a simultaneous readout unit 47 which may provide a permanent record of they test. Two testing circuits as shown in FIGURE 5 are utilized, :one for the .directcurrent and the other for the alternating current test.'

Similar high andlow detector circuits, 43a, 44a, 43b and 44b are connected with the balancedcomparison cir-' cuits 41a and 411;,respectively. Indicators. 45a, 460,451), and 4611 are also connected with the detector circuits. With this testing arrangement-each of the, sets of circuit elements are energized simultaneously fromsource 40 and the various detectors and indicators are simultana eously actuated, providing an indication of the condition physical signalsorautomatic, record-i of the circuit being tested. As pointed out above, where the circuit is in printed form, the board may readily be placed in a jig or frame through which contact is made to the conductive areas on the board. Thus, in order to test the elements of the circuit, it is necessary merely that the circuit board to be tested be placed in the support and the elements thereof be energized in comparison circuits with the standard circuit elements, from the source 40. A simultaneous indication is provided of the condition of each of the circuit elements, and a permanent record may be made of the test. A pair of such tests, one utilizing direct current and the other alternating current provides a complete check of the resistive and reactive elements of the circuit. A suitable control circuit for eitecting the sequential circuit testing operation will be described in detail below.

During the course of the following description at specific circuit will be described and values and component types given for the circuit elements. It is to be understood that this specific disclosure is intended merely to illustrate an operative embodiment of the invention, and many changes and modifications will be apparent.

Turning now to FIGURE 6, the schematic circuit diagram for a direct current amplifier serving as .a detector is shown. The amplifier includes a pentode stage 50, and a triode stage 51, as the two sections of a 6U8, for example. An input terminal 52 is connected with the bridge comparison circuit, as at the juncture between R and R in FIGURE 3. A potentiometer 53 is from terminal 52 to ground 32, and the adjustable tap 53a is connected through an isolating resistor 54, 470,000 ohms, with the control grid of amplifier 50. The cathode of amplifier 50 is returned to ground through resistor 55, 820 ohms, which is connected with a fixed positive bias through a voltage divider including resistor 56, 39,000 ohms, and resistor 57, 22,000 ohms, connected across the positive supply. The plate of the pentode is connected through load resistor 59, 470,000 ohms, with the positive supply, while the screen grid is connected to the juncture between resistors 56 and 57.

The amplified output of pentode 50 is direct coupled to the control grid of triode section 51., the plate of which is connected with the positive supply. The cathode of the triode section is returned through the operating coil 62a of a relay 62 to the movable tap of a potentiometer '63, 60,000 ohms, connected across the B supply. The contacts associated with the relay 62 form a portion of the indicator circuit, as will appear.

With a balanced D.C. comparison circuit of the nature illustrated in FIGURE 3, the polarity of the unbalance potential of the comparison circuit indicates the nature of the error in the circuit component, a positive potential indicating an error in one direction and a negative potential indicating an error in the other. The magnitude of the error potential is related to the magnitude of the error or mismatch of the circuit elements. The circuit of FIG- URE 6 is arranged to be actuated by a negative error potential from the bridge circuit. A negative signal at terminal 52 decreases the conduction through pentode 50 resulting an increase in the potential applied to the control grid of triode 51. The triode stage 51 is initially adjusted for insufircient conduction to energize relay 62, so that as conduction increases the relay becomes energized. Upon energization contacts 62b close. Contact 62b completes a circuit connecting a neon indicator 65 across the entire output of the direct current supply, energizing the neon indicator and providing a visual indication of an error in the circuit being. tested. At the same time, a negative potential is applied through a switching network 64 to the control grid of pentode 50, cutting it off and holding the detection circuit in the actuated condition until reset switch 66 is opened. Zener diode 67 limits the potential at the grid of triode 51, preventing excessive current through relay coil 62a.

The energizing potential for neon indicator 65 is connected with the readout unit and may be utilized as described below to provide a record of incorrect components.

As pointed out above, potentiometer 63 is adjusted to the threshold of operation for the system, with the relay current just below the energization point. Potentiometer $3 adjusts the sensitivity of the circuit, establishing the amplitude of error potential necessary to cause operation of the detector. This permits set up of the test apparatus for any desired tolerance in the circuit elements.

As the single detector circuit is responsive only to either an oversize or undersize element, a pair of such circuits are necessary for each set of standard and test circuit elements which are to be compared. Basically, the two circuits are identical, and FIGURE 7 illustrates the changes which are necessary in the relay circuit. The triode section 51' has its plate connected with the positive supply and its cathode returned through the operating coil 62a of relay 62' to the tap of potentiometer 63'. In this circuit however the tap of potentiometer 63' is so adjusted that sutficient current flows through triode 51' to energize relay 62 in the absence of an error signal. A positive error signal at the output of the comparison circuit is applied to the pentode amplifier and as this positive signal increases in amplitude, with an incorrect circuit element, the pentode conducts more heavily and the potential applied to the control grid of the triode decreases in amplitude. At a desired error signal level, the conduction of triode 5-1 falls below the level necessary to maintain relay 62' energized and the relays drops out. Contact 62b closes completing a circuit from the positive terminal of the balanced power supply energizing the neon bulb 65. A positive signal is alsc applied to the control grid of pentode 50' holding it in 2 state of high conduction and maintaining the actuatec' state of the indicator circuit until reset switch 66' is opened.

Two direct current amplifier circuits are used for eacl'. of the DC. comparison circuits, one providing a higt value detector and the other a low value detector for the various elements of the circuit being tested.

In an alternating current check of reactive circuit components, the unbalance or error signal with an incorrec' component in the test circuit has a shift in phase iron the applied potential indicating the nature of the error i.e., overvalue or undervalue component, and an amplitude representing the magnitude of the mismatch. According ly, in order to provide a suitable indication of the nature of the error in the size of the component it is necessar to utilize a phase sensitive detector.

One such detector is shown in FIGURE 8, utilizing 2 type 6AS 6 pentode 69. A phase signal, as or i: applied through isolating resistor 70, 470,000 ohms, to th suppressor grid of the detector while the error signal from the comparison circuit is applied through resistor 71 470,000 ohms, to the control grid of the detector. Thr control grid is returned to ground through resistor 72 18 megohms. The cathode of the detector is connected tr the movable tap of potentiometer 73, 60,000 ohms, con nected in series with resistor 74, 1 megohm, across the 1 supply, volts. The cathode circuit is bypassed grounr through capacitor 75, 10 ,uf. The anode of the detecto tube is connected through a load resistor 76, 330,001 ohms, with the B supply. The screen grid is connected tr 2. positive potential provided by a voltage divider includin, resistor 77, 390,000 ohms, and resistor 78, 100,000 ohms connected across the B supply, with the screen grid by passed ground through capacitor 79, 0.01 ,uf.

Resistor 73 is adjusted in the absence of an error signal and with a phase signal of the order of 10 volts peak-to peak, so that the tube is nearly at cutoff. When an erro signal in phase with the phase or reference signal is pres cut the detector will conduct at a level dependent on th magnitude of the error signal. With an error signal out 0 phase with the reference signal, there is little conductioi 7 :hrough the tube. The AC. output of the synchronous detector is coupled through capacitor 80,? 0.1 ,uf., with a voltage doubler circuit including rectifiers 81 and 82. The rectifier output of the voltage doubler is filtered in a network including shunt capacitors 33, 0.1 ,uf. and 84, 0.01

reference phase signal from the alternating current ;ouroe While the other is energized by phase signal 30th synchronous detectors, of course, require a direct- :urrent detector-indicator circuit as pointed out above.

An alternate form of synchronous detector is illustrated n FIGUREQ. A triode amplifier -90 has the error signal Trom the balanced comparison circuit connected with the :ontrol grid thereof. The control grid is returned through 'esistor 9 1,10 megohms, to ground. The cathode of the implifier is-connected with ground through a resistor 92, 10,000 ohms, bypassed with a capacitor 93, -10 ,uf. The

Jlate of the triode is connected through load resistor 94,

18,000 ohms, with the positive B supply. A by-pass caiacitor 95, 0.01 ,uf., is connected to ground from the plate I :ircuit. Thearnplified output of triode 90 is connected hrough coupling capacitor 96, 0.01 i, with abalanced i-hase detecting circuit including diodes9'7 and 98,- as ype 1N46-l silicon diodes. [Dd are supplied from the alternating current source 5 (FIGURE 4) through coupling capacitors 99 and 10.0, =ach 0.01 pf, to the balanced phase detector. A potenti- 1 )1'1'16161 1101, l megohm, is connected across the detector [11d has its. tap returned; to ground for balancing the.

ircuit.

In the presence of an error signal-one or the other of liodes 9'7 and 08 will conduct depending upon the phase f the error signal, and a pulsating DC. current will e present atthe point 104, having a polarity determined y the nature of the error signal.

nd shunt capacitor 106, 0.01 ,uf., and a DC. control The pulsating direct. urrent is filtered by series resistor .105, 100,000 ohms- The two phase signals otential appears at output terminal 107; A pair of' irect current error detector circuits, as the circuits of IGURES 6 and 7, may be connected with the output f the phase detector (FIGURE .9) to provide the de-' ired error indication. In this case, of course, only a ingle phase detector is necessary.

Under certain conditions the circuit of FIGURE .9 my be ineffective, as where. sensing an open circuit or hort circuit condition. With this type of circuit fault, acre may be no voltage differential across one of the etectors while the voltage across the other is in the reerse direction and the circuit has no output. This night not be too serious where the short circuit or open ircuit error could The located by the direct current portion f the test. However, this is not always possible. Ac-

ordingly, a more sophisticated phase detector circuit" my be utilized, as shown in FIGURE 10. The alter,- ating current error signal is coupled through capacitor 50, 0.001 ,uf., .to the first stage 151 of an amplifier. The

utput of amplifier 151. is coupled to the input of a bal-' nced phase splitter 152 having cathode and plate load esistors 153 and 154, respectively, matched 18,000 hms resistors. The output of phase splitter 152 is con- :ected with a bridge detector circuit 155, to Whiohithe hase signals and from the signal source are also pplied. Each leg of the bridge detector circuit includes diode 156connected in series with capacitor 157, 0.02 f. The capacitor junctions are connected with the outut of phase splitter 152, while the reference phase voltages are applied to; the junctureszbetween the diodes. YA balanced resistive networkiis connected (across the capacitiorsof the, bridge and includes: potentiometer 158, 1 megohm, connected across the .two' series connected capacitors 157 a11d157ZLfA pair of .matchedresis'tors 159 and 160, each 470,000 ohmsgare connectedwacross capacitors 15% and 1570'. The tap of potentiometer158 t is connected with the :juncture between resistors 159' and 160,! and at this point the, output of'the phase detec- .tor appears. This output; is filtered through circuit 161,

and the-,directcurrent error, signal appears at terminal.

In a complete detection system for a circuit having a plurality of elements, including resistive and reactive ele-v ments,-a pluralityv of direct currentand alternating current error detectors; are required, :as-illustratedinFIG- URE 5. The particular number and arrangement of these elements depends. on the, natureof the circuit being tested- In general, there will be an 'overvalue and undervalue: detection "and indicating means for the" direct current test .of each element, and an overvalue and undervalue detectionand indicating :means for the alter nating current test for each of the reactivecircuit-ele' m'ents;

65', it is desirable to provide a permanent record of the incorrect components which, forexamiplm may be attached to the chassisorboard of the'test circuit to indi-' cate the replacements required. FIGURErll illustrates diagrammatically such-a readout circuit; A sensitized paper is=provided from a supply roll 110a and extends across a supporting base or platen 111; The :paper 110 isfsensitive to the application of an'electri cal potential: to character elements or electrodes 112,.1theY lower surfaces of which are formed with desired indicia, as numerals The readouttele'ctrodes 112 are connected with the neon indicator circuits of thevarious detectors,

from whichsa suitable marking, potential is derivednpon the occurrence of an incorrect-component. .Upon com: pletion of the alternating current and direct. current tests, if one ofthe neon indicators islighted showing that an incorrect. component is present, the operator causes actuation of an air cylinder 113 which moves base 111 upwardly to bring the: sensitized paper '110 into contact with the indicia bearing faces of electrodes 1'12 and a ground plate 114. The: base 111' has a resilient surface 111a which holdsithe paper against the electrodes with sutficientforce .to cause the appearance of the indicia on the paper. The base l'llmis then. released and a drive mechanism actuated to move the. paper 110 through. the readout unit, whereupon-the marked portion of the paper-may be torn off against. a cutter #115. The paper,

drive includes a motor '116 connected through a belt 116a with a pair of drive rollers116b.

FIGURE 12 shows a schematic diagram..=for controlling the operation of thereadout unit. Upon completion of the twoportions of the test'procedure, if an error is 166,: respectively. Contact 118a associated with relay 118 closes connecting the coil of an :air switch 167- with a suitable source of operating potential. Air switch 167, 1 controls the airsupply to pneumatic piston 113,. moving y the platen 11:1 upwardly to-hold the paper 110 against the; indicia bearing surfacesiof electrodeslIZ. The closing of contact 119a associated with re1ay119 hasno immediate effect;

A time vdelay network is connected with each of the pacitor 172, 200 wt; Relay 118 will drop out first, where- In addition to the .visual indioation of -a component. of the incorrect valueprovided ,by neon bulbs 65 and upon contact 118a opens and the platen 111 is retracted. Contact 118b closes completing an energizing circuit through contact 119a for drive motor 116. A holding circuit for the drive motor is provided through switch 173 which is operated by a cam 173a mounted on backup roller 174, associated with one of the drive rollers 1161). The initial movement of cam 173a closes switch 173 and it remains closed through a full revolution of the cam. The timing relationships of the drive are selected to feed a suflicient length of paper [through the unit to carry a complete indication of the component indicia.

It was pointed out in the introductory portion of the specification that the present inventionis not limited to use with printed circuits, but may provide for testing of many types of circuits and is particularly useful in testing circuits where connections may readily be made to selected circuit elements. FIGURE 13 illustrates such an arrangement where a test unit 1811 has connected therewith a cable 181 containing conductors connected at appropriate points in the circuit for testing various elements or combinations thereof. minate in the prongs 182 of a plug 183. The test ap-. paratus 184 is provided with a suitable socket 185 to which plug 183 may be connected.

FIGURE 14 illustrates a control circuit for effecting the sequential direct current and alternating current tests of a test circuit. The test apparatus is shown for one circuit element which is subjected to both direct current and alternating current tests. The apparatus includes the reference circuit 120, test circuit 121, an alternating current detector 122 having a pair of direct current detectors 123 and 124 connected therewith, and a pair of direct current detectors 125 and 126, used in the direct current portion of the testing operation. Each of the detectors has connected therewith an indicator 127-130. The indicators may, for example, be the neon indicators 65 and 65 of FIGURES 6 and 7. The apparatus includes a direct current source 30, an alternating current source 35, an operating relay potential supply 132 and an indicator potential supply 133. The desired interconnection-of the test potential sources and the reference and test circuits and the detectors are made through the contacts of a plurality of control relays 135a, 135b, 1350, and 135d. The relays in turn are under the control of a manual A.C.-D.C. switch 136. In the condition of the circuit shown in FIGURE 10, switch 136a in the circuits of the control relays is open and the relays are not energized, the respective contacts 135a-1, 13522-1, 1350-1 and 135d-1 being closed as shown. In this condition of the circuit, phase 96 of the alternating current source 135 is connected through relay contact 135a-1 with reference circuit 120 while is connected through contact 1350-1 with the test circuit. The reference and the test circuits are connected together and with the alternating current detector 122 through contacts 135b-1 and 135d-1.

The indicator circuits include a pair of relays 138 and 139 which are actuated through section 13Gb of the control switch and normally closed reset switch 140 from the positive output of indicator supply 133. Reset switch 140 may be located for actuation by the test circuit board 15, as shown in FIGURE 1. The switch is closed 'when a board is in the test position, and opens on removal of the board following the tests. In the position of switch 136 shown in the drawing, switch section 1361) connects the positive output of indicator supply 133 with alternating current indicator control relay 138. With reset switch 140 closed, relay 138 is energized closing contacts 138:: and 138k applying positive and negative potentials to detector circuits 123 and 124 and applying a holding potential to the relay through diode 1380. The positive and negative potentials provide the energization for indicators 127 and 128 and the holding potential for actuated detectors as described in connection with FIGURES 6 and 7. A time delay network is incorporated in the en- The conductors terergization circuit for control relay 138, to prevent premature energization of the detectors and indicators, before the reference and test circuits are properly situated and suitable connections may be made with the test potential sources and the comparison circuits. For this pur pose, a variable resistor 14-2 is connected in series with the coil of relay 138, while a capacitor 143 is connected in parallel with the relay coil. The time constant of the circuit of resistor 142 and capacitor 143 is made app-reciable, as of the order of several seconds, to provide the necessary delay in energizing the relay.

After the alternating current test is completed, control switch 136 is operated closing contact 136a-1 and energizing relays 135a through 135d. This connects the reference and test circuits with the positive and the negative terminals of direct current source 30 through contacts 135a2 and 135c-2. Similarly, contacts 135b-2 and 135d2 interconnect the reference and test circuits and 121 with DC. detectors and 126. Contact 136b-2 is closed connecting the positive terminal of indicator supply 133 with the operating coil of direct current indicator control relay 13%, through a time delay network including resistor 144 and capacitor 145. Contacts 139a and 13917 close following the time expiration of the desired time delay and apply the necessary positive and negative potentials to the detector circuits 129 and 130. A holding circuit is completed through diode 139C.

The holding circuits for relays 138 and 139 include diode elements 138a and 1390, which prevent interaction between the detector and relay circuits. Without the diodes, the energizing potential for the relays from switch 1361) would be applied prematurely to the detectors, and might result in a false indication.

Similar circuitry and switching is provided for the other elements of the reference and test circuits. The alternating and direct current test potentials are available at terminals A and B and are connected directly with the further circuit elements. Further relay contacts associated with relays 1351i and d may be provided for the interconnection of the reference and test circuits with the detectors, or if necessary additional relays for this purpose may be connected with terminals C and D. The indicator operating potentials available at terminals E, F, G, and H, for the indicators associated with further circuit elements. The alternating and direct current tests are sequentially performed with similar tests of each circuit element being made simultaneously. The order of the direct and alternating tests is unimportant.

We claim:

1. An electronic circuit testing apparatus for simultaneous testing of a plurality of interconnected circuit elements, comprising: a reference circuit having a plurality of interconnected circuit elements; a circuit to be tested having a corresponding plurality of nominally identical interconnected circuit elements; a source of circuit energizing potential having a pair of outputs balanced with respect to a reference potential and having connected thereacross a plurality of pairs of said nominally equal, series connected reference and test elements, the reference element of each pair being connected with one source output and the test element of each pair being connected with the other source output, the sense and magnitude of the unbalance potential at the junction of each pair of reference and test elements, with respect to said reference potential, indicating the sense and magnitude, respectively, of a difference in value between the associated reference and test elements; a plurality of bidirectional detector means, one for each pair of reference and test elements, each detector means being connected between the junction 01 one of said plurality of pairs of elements and said reference potential, each detector gneans isolating the associated pair of reference and test elements from the other pairs of reference and test elements, and each detector means including a pair of direct current detectors, one responsive to one sense of unbalance potential and the other responl l sive to the other sense of unbalance potential for detecting test elements which deviate from the corresponding refer.- ence elements in either direction, each detector having a threshold operating level and detecting the presence of an unbalance potential of the appropriate sense and, 111.

indicating means includes holding means responsive to the occurrence of an indication ofan unbalance potential in excess of the threshold level for=said detector for maintaining the unbalance indication upon removal of the unbalance potential from the detector.

3. The circuit testing apparatus of claim 2 wherein each detector is a direct current amplifier, one detector of each detector means being conductive and the other being non-conductive in the absence of 'an unbalance potential, each detector including a circuit completed on s.

a change of state thereof for applying a holding potential thereto to maintain the change of state indication thereof.

4. The circuit testing apparatus of claim 1 for testing the resistance of a plurality of interconnected circuit elements wherein said source .of circuit energizing potential is a direct current source and each detector means includes a pair of direct current amplifiers direct current connected With each junction.

5. The circuit-testing apparatus of claim 1 for testing :he reactance of a plurality of interconnected circuit elements wherein said source of circuit energizing potential Is an alternating source having a pair of outputs 180 out 3f phase with eachother balanced with respect to said reference potential and each detector means includes a phase sensitive detector responsive to said reference outputs and to the unbalance signal at said junction and havng. a direct current output, the polarity and amplitude of which represent the sense andmagnitude of a differance in value between the associated reference and test elements, and in which the pair of detectors are. direct current detectors connected ,with the. output of said phase sensitive detector.

6; The. circuit testing apparatus of claim 1 having a first source of direct currentzcircuit energizing potential and a plurality of direct current detector means, a second source of alternating current energizing potential and, a plurality of alternating current detector means, and control switch means having a first condition in which said firstsource and direct current detector means are connected With said reference and test circuit elements,tanda second condition in which said second source. and said alternating .current detector means areconnected with said reference and test elements.

, 7. The circuit testing apparatus. of claim'6 including" time delay means responsive to said control switch means delaying the, actuation of said indicator means after the connection of said sources'and detectors with ;said circuit elements.

References Cited by the Examiner UNITED STATES PATENTS E.

2,479,051 t 8/1949 Sunstein; 32457 2,686,293 8/1954 Davis 32462 2,791,746 5/1957 Bowersox 3244-113 2,892,133- 6/1959 Huge 317j-141 2,925,591 2/1960 Burkhart. 2,950,437 8/1960- Stahl 32473 2,968,031 I 1/1961 Higa 3244-83 XII 2,977,535 3/1961 OConnor et al. 32473 3,034,051 5/1962 Higgins 32473 3,039,604 6/ 19.62, Bickel 32415 8 X 3,049,649 8/1962 Burke et al 317141 3,059,215 10/1962 Proskauer 324.73 X;

3,065,414 11/1962. Sears 32473 3,090,913 5/1963 Boyer 32483 X 3,156,864 11/1964 Shaw 32451 X 3,182,253 5/1965 Dorsch 32473 X'i WALTER L: CARLSON, Primary Examiner;

G. S. KINDNESS, E. L. STOLARUN,

Assistant Examiners.

Claims (1)

1. AN ELECTRONIC CIRCUIT TESTING APPARATUS FOR SIMULTANEOUS TESTING OF A PLURALITY OF INTERCONNECTED CIRCUIT ELEMENTS, COMPRISING: A REFERENCE CIRCUIT HAVING A PLURALITY OF INTERCONNECTED CIRCUIT ELEMENTS; A CIRCUIT TO BE TESTED HAVING A CORRESPONDING PLURALITY OF NOMINALLY IDENTICAL INTERCONNECTED CIRCUIT ELEMENTS; A SOURCE OF CIRCUIT ENERGIZING POTENTIAL HAVING A PAIR OF OUTPUTS BALANCED WITH RESPECT TO A REFERENCE POTENTIAL AND HAVING CONNECTED THEREACROSS A PLURALITY OF PAIRS OF SAID NOMINALLY EQUAL, SERIES CONNECTED REFERENCE AND TEST ELEMENTS, THE REFERENCE ELEMENT OF EACH PAIR BEING CONNECTED WITH ONE SOURCE OUTPUT AND THE TEST ELEMENT OF EACH PAIR BEING CONNECTED WITH THE OTHER SOURCE OUTPUT, THE SENSE AND MAGNITUDE OF THE UNBALANCE POTENTIAL AT THE JUNCTION OF EACH PAIR OF REFERENCE AND TEST ELEMENTS, WITH RESPECT TO SAID REFERENCE POTENTIAL, INDICATING THE SENSE AND MAGNITUDE, RESPECTIVELY, OF A DIFFERENCE IN VALUE BETWEEN THE ASSOCIATED REFERENCE AND TEST ELEMENTS; A PLURALITY OF BIDIRECTIONAL DETECTOR MEANS, ONE FOR EACH PAIR OF REFERENCE AND TEST ELEMENTS, EACH DETECTOR MEANS BEING CONNECTED BETWEEN THE JUNCTION OF ONE OF SAID PLURALITY OF PAIRS OF ELEMENTS AND SAID REFER-

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