CA1194610A - Room temperature cryogenic test interface - Google Patents
Room temperature cryogenic test interfaceInfo
- Publication number
- CA1194610A CA1194610A CA000435248A CA435248A CA1194610A CA 1194610 A CA1194610 A CA 1194610A CA 000435248 A CA000435248 A CA 000435248A CA 435248 A CA435248 A CA 435248A CA 1194610 A CA1194610 A CA 1194610A
- Authority
- CA
- Canada
- Prior art keywords
- chip
- plug
- pass
- operating
- cryogenic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 42
- 230000005540 biological transmission Effects 0.000 claims abstract description 21
- 238000005070 sampling Methods 0.000 claims abstract description 11
- 238000010438 heat treatment Methods 0.000 claims abstract description 4
- 238000007789 sealing Methods 0.000 claims abstract description 4
- 239000004020 conductor Substances 0.000 claims description 4
- 230000000295 complement effect Effects 0.000 claims 4
- 239000000543 intermediate Substances 0.000 claims 2
- 239000000565 sealant Substances 0.000 claims 1
- 238000000926 separation method Methods 0.000 claims 1
- 239000001307 helium Substances 0.000 abstract description 15
- 229910052734 helium Inorganic materials 0.000 abstract description 15
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 abstract description 15
- 239000007788 liquid Substances 0.000 abstract description 13
- 239000004065 semiconductor Substances 0.000 abstract description 13
- 239000010453 quartz Substances 0.000 abstract description 8
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract description 8
- 229920006333 epoxy cement Polymers 0.000 abstract description 2
- 238000002955 isolation Methods 0.000 abstract 1
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 4
- 229910052802 copper Inorganic materials 0.000 description 4
- 239000010949 copper Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000007246 mechanism Effects 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 239000004568 cement Substances 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 230000005291 magnetic effect Effects 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000001902 propagating effect Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 239000002887 superconductor Substances 0.000 description 1
- KUAZQDVKQLNFPE-UHFFFAOYSA-N thiram Chemical compound CN(C)C(=S)SSC(=S)N(C)C KUAZQDVKQLNFPE-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F17—STORING OR DISTRIBUTING GASES OR LIQUIDS
- F17C—VESSELS FOR CONTAINING OR STORING COMPRESSED, LIQUEFIED OR SOLIDIFIED GASES; FIXED-CAPACITY GAS-HOLDERS; FILLING VESSELS WITH, OR DISCHARGING FROM VESSELS, COMPRESSED, LIQUEFIED, OR SOLIDIFIED GASES
- F17C13/00—Details of vessels or of the filling or discharging of vessels
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F17—STORING OR DISTRIBUTING GASES OR LIQUIDS
- F17C—VESSELS FOR CONTAINING OR STORING COMPRESSED, LIQUEFIED OR SOLIDIFIED GASES; FIXED-CAPACITY GAS-HOLDERS; FILLING VESSELS WITH, OR DISCHARGING FROM VESSELS, COMPRESSED, LIQUEFIED, OR SOLIDIFIED GASES
- F17C2203/00—Vessel construction, in particular walls or details thereof
- F17C2203/03—Thermal insulations
- F17C2203/0391—Thermal insulations by vacuum
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F17—STORING OR DISTRIBUTING GASES OR LIQUIDS
- F17C—VESSELS FOR CONTAINING OR STORING COMPRESSED, LIQUEFIED OR SOLIDIFIED GASES; FIXED-CAPACITY GAS-HOLDERS; FILLING VESSELS WITH, OR DISCHARGING FROM VESSELS, COMPRESSED, LIQUEFIED, OR SOLIDIFIED GASES
- F17C2203/00—Vessel construction, in particular walls or details thereof
- F17C2203/06—Materials for walls or layers thereof; Properties or structures of walls or their materials
- F17C2203/0602—Wall structures; Special features thereof
- F17C2203/0612—Wall structures
- F17C2203/0626—Multiple walls
- F17C2203/0629—Two walls
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F17—STORING OR DISTRIBUTING GASES OR LIQUIDS
- F17C—VESSELS FOR CONTAINING OR STORING COMPRESSED, LIQUEFIED OR SOLIDIFIED GASES; FIXED-CAPACITY GAS-HOLDERS; FILLING VESSELS WITH, OR DISCHARGING FROM VESSELS, COMPRESSED, LIQUEFIED, OR SOLIDIFIED GASES
- F17C2223/00—Handled fluid before transfer, i.e. state of fluid when stored in the vessel or before transfer from the vessel
- F17C2223/01—Handled fluid before transfer, i.e. state of fluid when stored in the vessel or before transfer from the vessel characterised by the phase
- F17C2223/0146—Two-phase
- F17C2223/0153—Liquefied gas, e.g. LPG, GPL
- F17C2223/0161—Liquefied gas, e.g. LPG, GPL cryogenic, e.g. LNG, GNL, PLNG
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F17—STORING OR DISTRIBUTING GASES OR LIQUIDS
- F17C—VESSELS FOR CONTAINING OR STORING COMPRESSED, LIQUEFIED OR SOLIDIFIED GASES; FIXED-CAPACITY GAS-HOLDERS; FILLING VESSELS WITH, OR DISCHARGING FROM VESSELS, COMPRESSED, LIQUEFIED, OR SOLIDIFIED GASES
- F17C2250/00—Accessories; Control means; Indicating, measuring or monitoring of parameters
- F17C2250/06—Controlling or regulating of parameters as output values
- F17C2250/0605—Parameters
- F17C2250/0631—Temperature
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F17—STORING OR DISTRIBUTING GASES OR LIQUIDS
- F17C—VESSELS FOR CONTAINING OR STORING COMPRESSED, LIQUEFIED OR SOLIDIFIED GASES; FIXED-CAPACITY GAS-HOLDERS; FILLING VESSELS WITH, OR DISCHARGING FROM VESSELS, COMPRESSED, LIQUEFIED, OR SOLIDIFIED GASES
- F17C2270/00—Applications
- F17C2270/01—Applications for fluid transport or storage
- F17C2270/0165—Applications for fluid transport or storage on the road
- F17C2270/0168—Applications for fluid transport or storage on the road by vehicles
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F17—STORING OR DISTRIBUTING GASES OR LIQUIDS
- F17C—VESSELS FOR CONTAINING OR STORING COMPRESSED, LIQUEFIED OR SOLIDIFIED GASES; FIXED-CAPACITY GAS-HOLDERS; FILLING VESSELS WITH, OR DISCHARGING FROM VESSELS, COMPRESSED, LIQUEFIED, OR SOLIDIFIED GASES
- F17C2270/00—Applications
- F17C2270/05—Applications for industrial use
- F17C2270/0509—"Dewar" vessels
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F17—STORING OR DISTRIBUTING GASES OR LIQUIDS
- F17C—VESSELS FOR CONTAINING OR STORING COMPRESSED, LIQUEFIED OR SOLIDIFIED GASES; FIXED-CAPACITY GAS-HOLDERS; FILLING VESSELS WITH, OR DISCHARGING FROM VESSELS, COMPRESSED, LIQUEFIED, OR SOLIDIFIED GASES
- F17C2270/00—Applications
- F17C2270/05—Applications for industrial use
- F17C2270/0518—Semiconductors
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S505/00—Superconductor technology: apparatus, material, process
- Y10S505/825—Apparatus per se, device per se, or process of making or operating same
- Y10S505/842—Measuring and testing
- Y10S505/843—Electrical
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Containers, Films, And Cooling For Superconductive Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Superconductor Devices And Manufacturing Methods Thereof (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US434,770 | 1982-10-18 | ||
| US06/434,770 US4498046A (en) | 1982-10-18 | 1982-10-18 | Room temperature cryogenic test interface |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA1194610A true CA1194610A (en) | 1985-10-01 |
Family
ID=23725618
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA000435248A Expired CA1194610A (en) | 1982-10-18 | 1983-08-24 | Room temperature cryogenic test interface |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US4498046A (en:Method) |
| EP (1) | EP0106196B1 (en:Method) |
| JP (1) | JPS5975687A (en:Method) |
| CA (1) | CA1194610A (en:Method) |
| DE (1) | DE3362552D1 (en:Method) |
Families Citing this family (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3417055C2 (de) * | 1984-05-09 | 1986-05-07 | Messerschmitt-Bölkow-Blohm GmbH, 8012 Ottobrunn | Helium-II-Phasentrenner |
| US4715189A (en) * | 1985-11-12 | 1987-12-29 | Hypres, Inc. | Open cycle cooling of electrical circuits |
| US4739633A (en) * | 1985-11-12 | 1988-04-26 | Hypres, Inc. | Room temperature to cryogenic electrical interface |
| JPH0436136Y2 (en:Method) * | 1986-01-07 | 1992-08-26 | ||
| JPS62267676A (ja) * | 1986-05-16 | 1987-11-20 | Fujitsu Ltd | 半導体素子評価装置 |
| US4809133A (en) * | 1986-09-26 | 1989-02-28 | Hypres, Inc. | Low temperature monolithic chip |
| JPS63142687A (ja) * | 1986-12-05 | 1988-06-15 | Agency Of Ind Science & Technol | 極低温用配線 |
| US4869077A (en) * | 1987-08-21 | 1989-09-26 | Hypres, Inc. | Open-cycle cooling apparatus |
| JPS6456151A (en) * | 1987-08-27 | 1989-03-03 | Yoshikage Oda | Medium circulation type temperature control device of thermostatic chamber |
| US4870830A (en) * | 1987-09-28 | 1989-10-03 | Hypres, Inc. | Cryogenic fluid delivery system |
| JP2551967Y2 (ja) * | 1988-08-19 | 1997-10-27 | 三菱自動車工業株式会社 | 発進制御装置 |
| US4921157A (en) * | 1989-03-15 | 1990-05-01 | Microelectronics Center Of North Carolina | Fluxless soldering process |
| US5166606A (en) * | 1989-11-03 | 1992-11-24 | John H. Blanz Company, Inc. | High efficiency cryogenic test station |
| US5160883A (en) * | 1989-11-03 | 1992-11-03 | John H. Blanz Company, Inc. | Test station having vibrationally stabilized X, Y and Z movable integrated circuit receiving support |
| US5077523A (en) * | 1989-11-03 | 1991-12-31 | John H. Blanz Company, Inc. | Cryogenic probe station having movable chuck accomodating variable thickness probe cards |
| US5052183A (en) * | 1991-01-04 | 1991-10-01 | The United States Of America As Represented By The Secretary Of The Army | Open cryogenic microwave test chamber |
| US5327733A (en) * | 1993-03-08 | 1994-07-12 | University Of Cincinnati | Substantially vibration-free shroud and mounting system for sample cooling and low temperature spectroscopy |
| US5499754A (en) * | 1993-11-19 | 1996-03-19 | Mcnc | Fluxless soldering sample pretreating system |
| US5407121A (en) * | 1993-11-19 | 1995-04-18 | Mcnc | Fluxless soldering of copper |
| US6188358B1 (en) * | 1997-10-20 | 2001-02-13 | Infrared Components Corporation | Antenna signal conduit for different temperature and pressure environments |
| US6207901B1 (en) | 1999-04-01 | 2001-03-27 | Trw Inc. | Low loss thermal block RF cable and method for forming RF cable |
| KR102545719B1 (ko) | 2018-06-27 | 2023-06-21 | 엘지전자 주식회사 | 진공단열체 및 냉장고 |
| CN111841674A (zh) * | 2020-07-28 | 2020-10-30 | 四川泰立科技股份有限公司 | 一种毒品检测用微流控芯片 |
| FR3120936B1 (fr) * | 2021-03-16 | 2023-04-14 | Air Liquide | Système de réfrigération pour des modules comprenant des puces quantiques |
| CN113339702B (zh) * | 2021-07-01 | 2022-12-23 | 段娜 | 一种制冷系统及液氦杜瓦瓶气体保护装置 |
| CN115542060A (zh) * | 2022-11-01 | 2022-12-30 | 中国科学院上海微系统与信息技术研究所 | 一种低温测试装置 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3560893A (en) * | 1968-12-27 | 1971-02-02 | Rca Corp | Surface strip transmission line and microwave devices using same |
| JPS55130198A (en) * | 1979-03-30 | 1980-10-08 | Hitachi Ltd | Hybrid integrated circuit board for tuner |
| US4401900A (en) * | 1979-12-20 | 1983-08-30 | International Business Machines Corporation | Ultra high resolution Josephson sampling technique |
| US4328530A (en) * | 1980-06-30 | 1982-05-04 | International Business Machines Corporation | Multiple layer, ceramic carrier for high switching speed VLSI chips |
| US4441088A (en) * | 1981-12-31 | 1984-04-03 | International Business Machines Corporation | Stripline cable with reduced crosstalk |
-
1982
- 1982-10-18 US US06/434,770 patent/US4498046A/en not_active Expired - Lifetime
-
1983
- 1983-07-20 JP JP58131119A patent/JPS5975687A/ja active Granted
- 1983-08-24 CA CA000435248A patent/CA1194610A/en not_active Expired
- 1983-09-20 EP EP83109315A patent/EP0106196B1/en not_active Expired
- 1983-09-20 DE DE8383109315T patent/DE3362552D1/de not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5975687A (ja) | 1984-04-28 |
| DE3362552D1 (en) | 1986-04-17 |
| EP0106196B1 (en) | 1986-03-12 |
| US4498046A (en) | 1985-02-05 |
| EP0106196A1 (en) | 1984-04-25 |
| JPS6359274B2 (en:Method) | 1988-11-18 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MKEC | Expiry (correction) | ||
| MKEX | Expiry |