DE3362552D1 - Electronic test apparatus with ambient-cryogenic temperature interface - Google Patents

Electronic test apparatus with ambient-cryogenic temperature interface

Info

Publication number
DE3362552D1
DE3362552D1 DE8383109315T DE3362552T DE3362552D1 DE 3362552 D1 DE3362552 D1 DE 3362552D1 DE 8383109315 T DE8383109315 T DE 8383109315T DE 3362552 T DE3362552 T DE 3362552T DE 3362552 D1 DE3362552 D1 DE 3362552D1
Authority
DE
Germany
Prior art keywords
ambient
test apparatus
cryogenic temperature
electronic test
temperature interface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8383109315T
Other languages
German (de)
English (en)
Inventor
Sadeg Mustafa Faris
Paul Andrew Moskowitz
Arthur Davidson
George Anthony Sai-Halasz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Application granted granted Critical
Publication of DE3362552D1 publication Critical patent/DE3362552D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F17—STORING OR DISTRIBUTING GASES OR LIQUIDS
    • F17C—VESSELS FOR CONTAINING OR STORING COMPRESSED, LIQUEFIED OR SOLIDIFIED GASES; FIXED-CAPACITY GAS-HOLDERS; FILLING VESSELS WITH, OR DISCHARGING FROM VESSELS, COMPRESSED, LIQUEFIED, OR SOLIDIFIED GASES
    • F17C13/00—Details of vessels or of the filling or discharging of vessels
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F17—STORING OR DISTRIBUTING GASES OR LIQUIDS
    • F17C—VESSELS FOR CONTAINING OR STORING COMPRESSED, LIQUEFIED OR SOLIDIFIED GASES; FIXED-CAPACITY GAS-HOLDERS; FILLING VESSELS WITH, OR DISCHARGING FROM VESSELS, COMPRESSED, LIQUEFIED, OR SOLIDIFIED GASES
    • F17C2203/00—Vessel construction, in particular walls or details thereof
    • F17C2203/03—Thermal insulations
    • F17C2203/0391—Thermal insulations by vacuum
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F17—STORING OR DISTRIBUTING GASES OR LIQUIDS
    • F17C—VESSELS FOR CONTAINING OR STORING COMPRESSED, LIQUEFIED OR SOLIDIFIED GASES; FIXED-CAPACITY GAS-HOLDERS; FILLING VESSELS WITH, OR DISCHARGING FROM VESSELS, COMPRESSED, LIQUEFIED, OR SOLIDIFIED GASES
    • F17C2203/00—Vessel construction, in particular walls or details thereof
    • F17C2203/06—Materials for walls or layers thereof; Properties or structures of walls or their materials
    • F17C2203/0602—Wall structures; Special features thereof
    • F17C2203/0612—Wall structures
    • F17C2203/0626—Multiple walls
    • F17C2203/0629—Two walls
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F17—STORING OR DISTRIBUTING GASES OR LIQUIDS
    • F17C—VESSELS FOR CONTAINING OR STORING COMPRESSED, LIQUEFIED OR SOLIDIFIED GASES; FIXED-CAPACITY GAS-HOLDERS; FILLING VESSELS WITH, OR DISCHARGING FROM VESSELS, COMPRESSED, LIQUEFIED, OR SOLIDIFIED GASES
    • F17C2223/00—Handled fluid before transfer, i.e. state of fluid when stored in the vessel or before transfer from the vessel
    • F17C2223/01—Handled fluid before transfer, i.e. state of fluid when stored in the vessel or before transfer from the vessel characterised by the phase
    • F17C2223/0146—Two-phase
    • F17C2223/0153—Liquefied gas, e.g. LPG, GPL
    • F17C2223/0161—Liquefied gas, e.g. LPG, GPL cryogenic, e.g. LNG, GNL, PLNG
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F17—STORING OR DISTRIBUTING GASES OR LIQUIDS
    • F17C—VESSELS FOR CONTAINING OR STORING COMPRESSED, LIQUEFIED OR SOLIDIFIED GASES; FIXED-CAPACITY GAS-HOLDERS; FILLING VESSELS WITH, OR DISCHARGING FROM VESSELS, COMPRESSED, LIQUEFIED, OR SOLIDIFIED GASES
    • F17C2250/00—Accessories; Control means; Indicating, measuring or monitoring of parameters
    • F17C2250/06—Controlling or regulating of parameters as output values
    • F17C2250/0605—Parameters
    • F17C2250/0631—Temperature
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F17—STORING OR DISTRIBUTING GASES OR LIQUIDS
    • F17C—VESSELS FOR CONTAINING OR STORING COMPRESSED, LIQUEFIED OR SOLIDIFIED GASES; FIXED-CAPACITY GAS-HOLDERS; FILLING VESSELS WITH, OR DISCHARGING FROM VESSELS, COMPRESSED, LIQUEFIED, OR SOLIDIFIED GASES
    • F17C2270/00—Applications
    • F17C2270/01—Applications for fluid transport or storage
    • F17C2270/0165—Applications for fluid transport or storage on the road
    • F17C2270/0168—Applications for fluid transport or storage on the road by vehicles
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F17—STORING OR DISTRIBUTING GASES OR LIQUIDS
    • F17C—VESSELS FOR CONTAINING OR STORING COMPRESSED, LIQUEFIED OR SOLIDIFIED GASES; FIXED-CAPACITY GAS-HOLDERS; FILLING VESSELS WITH, OR DISCHARGING FROM VESSELS, COMPRESSED, LIQUEFIED, OR SOLIDIFIED GASES
    • F17C2270/00—Applications
    • F17C2270/05—Applications for industrial use
    • F17C2270/0509—"Dewar" vessels
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F17—STORING OR DISTRIBUTING GASES OR LIQUIDS
    • F17C—VESSELS FOR CONTAINING OR STORING COMPRESSED, LIQUEFIED OR SOLIDIFIED GASES; FIXED-CAPACITY GAS-HOLDERS; FILLING VESSELS WITH, OR DISCHARGING FROM VESSELS, COMPRESSED, LIQUEFIED, OR SOLIDIFIED GASES
    • F17C2270/00—Applications
    • F17C2270/05—Applications for industrial use
    • F17C2270/0518—Semiconductors
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S505/00—Superconductor technology: apparatus, material, process
    • Y10S505/825—Apparatus per se, device per se, or process of making or operating same
    • Y10S505/842—Measuring and testing
    • Y10S505/843—Electrical

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mechanical Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Containers, Films, And Cooling For Superconductive Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Superconductor Devices And Manufacturing Methods Thereof (AREA)
DE8383109315T 1982-10-18 1983-09-20 Electronic test apparatus with ambient-cryogenic temperature interface Expired DE3362552D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/434,770 US4498046A (en) 1982-10-18 1982-10-18 Room temperature cryogenic test interface

Publications (1)

Publication Number Publication Date
DE3362552D1 true DE3362552D1 (en) 1986-04-17

Family

ID=23725618

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8383109315T Expired DE3362552D1 (en) 1982-10-18 1983-09-20 Electronic test apparatus with ambient-cryogenic temperature interface

Country Status (5)

Country Link
US (1) US4498046A (en:Method)
EP (1) EP0106196B1 (en:Method)
JP (1) JPS5975687A (en:Method)
CA (1) CA1194610A (en:Method)
DE (1) DE3362552D1 (en:Method)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3417055C2 (de) * 1984-05-09 1986-05-07 Messerschmitt-Bölkow-Blohm GmbH, 8012 Ottobrunn Helium-II-Phasentrenner
US4715189A (en) * 1985-11-12 1987-12-29 Hypres, Inc. Open cycle cooling of electrical circuits
US4739633A (en) * 1985-11-12 1988-04-26 Hypres, Inc. Room temperature to cryogenic electrical interface
JPH0436136Y2 (en:Method) * 1986-01-07 1992-08-26
JPS62267676A (ja) * 1986-05-16 1987-11-20 Fujitsu Ltd 半導体素子評価装置
US4809133A (en) * 1986-09-26 1989-02-28 Hypres, Inc. Low temperature monolithic chip
JPS63142687A (ja) * 1986-12-05 1988-06-15 Agency Of Ind Science & Technol 極低温用配線
US4869077A (en) * 1987-08-21 1989-09-26 Hypres, Inc. Open-cycle cooling apparatus
JPS6456151A (en) * 1987-08-27 1989-03-03 Yoshikage Oda Medium circulation type temperature control device of thermostatic chamber
US4870830A (en) * 1987-09-28 1989-10-03 Hypres, Inc. Cryogenic fluid delivery system
JP2551967Y2 (ja) * 1988-08-19 1997-10-27 三菱自動車工業株式会社 発進制御装置
US4921157A (en) * 1989-03-15 1990-05-01 Microelectronics Center Of North Carolina Fluxless soldering process
US5166606A (en) * 1989-11-03 1992-11-24 John H. Blanz Company, Inc. High efficiency cryogenic test station
US5160883A (en) * 1989-11-03 1992-11-03 John H. Blanz Company, Inc. Test station having vibrationally stabilized X, Y and Z movable integrated circuit receiving support
US5077523A (en) * 1989-11-03 1991-12-31 John H. Blanz Company, Inc. Cryogenic probe station having movable chuck accomodating variable thickness probe cards
US5052183A (en) * 1991-01-04 1991-10-01 The United States Of America As Represented By The Secretary Of The Army Open cryogenic microwave test chamber
US5327733A (en) * 1993-03-08 1994-07-12 University Of Cincinnati Substantially vibration-free shroud and mounting system for sample cooling and low temperature spectroscopy
US5499754A (en) * 1993-11-19 1996-03-19 Mcnc Fluxless soldering sample pretreating system
US5407121A (en) * 1993-11-19 1995-04-18 Mcnc Fluxless soldering of copper
US6188358B1 (en) * 1997-10-20 2001-02-13 Infrared Components Corporation Antenna signal conduit for different temperature and pressure environments
US6207901B1 (en) 1999-04-01 2001-03-27 Trw Inc. Low loss thermal block RF cable and method for forming RF cable
KR102545719B1 (ko) 2018-06-27 2023-06-21 엘지전자 주식회사 진공단열체 및 냉장고
CN111841674A (zh) * 2020-07-28 2020-10-30 四川泰立科技股份有限公司 一种毒品检测用微流控芯片
FR3120936B1 (fr) * 2021-03-16 2023-04-14 Air Liquide Système de réfrigération pour des modules comprenant des puces quantiques
CN113339702B (zh) * 2021-07-01 2022-12-23 段娜 一种制冷系统及液氦杜瓦瓶气体保护装置
CN115542060A (zh) * 2022-11-01 2022-12-30 中国科学院上海微系统与信息技术研究所 一种低温测试装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3560893A (en) * 1968-12-27 1971-02-02 Rca Corp Surface strip transmission line and microwave devices using same
JPS55130198A (en) * 1979-03-30 1980-10-08 Hitachi Ltd Hybrid integrated circuit board for tuner
US4401900A (en) * 1979-12-20 1983-08-30 International Business Machines Corporation Ultra high resolution Josephson sampling technique
US4328530A (en) * 1980-06-30 1982-05-04 International Business Machines Corporation Multiple layer, ceramic carrier for high switching speed VLSI chips
US4441088A (en) * 1981-12-31 1984-04-03 International Business Machines Corporation Stripline cable with reduced crosstalk

Also Published As

Publication number Publication date
CA1194610A (en) 1985-10-01
JPS5975687A (ja) 1984-04-28
EP0106196B1 (en) 1986-03-12
US4498046A (en) 1985-02-05
EP0106196A1 (en) 1984-04-25
JPS6359274B2 (en:Method) 1988-11-18

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee