CA1043883A - Laser scanner flaw detection system using baseline follower signal processing - Google Patents
Laser scanner flaw detection system using baseline follower signal processingInfo
- Publication number
- CA1043883A CA1043883A CA222,949A CA222949A CA1043883A CA 1043883 A CA1043883 A CA 1043883A CA 222949 A CA222949 A CA 222949A CA 1043883 A CA1043883 A CA 1043883A
- Authority
- CA
- Canada
- Prior art keywords
- signal
- baseline
- detector
- output
- discriminator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 16
- 239000000463 material Substances 0.000 claims description 40
- 230000005855 radiation Effects 0.000 claims description 11
- 239000003990 capacitor Substances 0.000 claims description 9
- 230000000694 effects Effects 0.000 claims description 9
- 230000004044 response Effects 0.000 claims description 4
- 230000006872 improvement Effects 0.000 claims description 3
- 230000003213 activating effect Effects 0.000 claims 2
- AYFVYJQAPQTCCC-GBXIJSLDSA-N L-threonine Chemical compound C[C@@H](O)[C@H](N)C(O)=O AYFVYJQAPQTCCC-GBXIJSLDSA-N 0.000 description 7
- 150000002500 ions Chemical class 0.000 description 7
- 230000008859 change Effects 0.000 description 3
- 241000272470 Circus Species 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000002310 reflectometry Methods 0.000 description 2
- XUKUURHRXDUEBC-KAYWLYCHSA-N Atorvastatin Chemical compound C=1C=CC=CC=1C1=C(C=2C=CC(F)=CC=2)N(CC[C@@H](O)C[C@@H](O)CC(O)=O)C(C(C)C)=C1C(=O)NC1=CC=CC=C1 XUKUURHRXDUEBC-KAYWLYCHSA-N 0.000 description 1
- 101710083262 Ectin Proteins 0.000 description 1
- 241001481828 Glyptocephalus cynoglossus Species 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- XKRFYHLGVUSROY-UHFFFAOYSA-N argon Substances [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- -1 argon ion Chemical class 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- CPBQJMYROZQQJC-UHFFFAOYSA-N helium neon Chemical compound [He].[Ne] CPBQJMYROZQQJC-UHFFFAOYSA-N 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- KRTSDMXIXPKRQR-AATRIKPKSA-N monocrotophos Chemical compound CNC(=O)\C=C(/C)OP(=O)(OC)OC KRTSDMXIXPKRQR-AATRIKPKSA-N 0.000 description 1
- GWUSZQUVEVMBPI-UHFFFAOYSA-N nimetazepam Chemical compound N=1CC(=O)N(C)C2=CC=C([N+]([O-])=O)C=C2C=1C1=CC=CC=C1 GWUSZQUVEVMBPI-UHFFFAOYSA-N 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
Landscapes
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Pathology (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- Engineering & Computer Science (AREA)
- General Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Textile Engineering (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US465510A US3920970A (en) | 1974-04-30 | 1974-04-30 | Laser scanner flaw detection system using baseline follower signal processing |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA1043883A true CA1043883A (en) | 1978-12-05 |
Family
ID=23848109
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA222,949A Expired CA1043883A (en) | 1974-04-30 | 1975-03-24 | Laser scanner flaw detection system using baseline follower signal processing |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US3920970A (enExample) |
| JP (2) | JPS50147982A (enExample) |
| CA (1) | CA1043883A (enExample) |
| DE (1) | DE2519386A1 (enExample) |
| FR (1) | FR2269714B1 (enExample) |
| GB (1) | GB1512661A (enExample) |
| NL (1) | NL7505021A (enExample) |
| SE (1) | SE423282B (enExample) |
Families Citing this family (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2636401C3 (de) * | 1976-08-11 | 1983-11-03 | Mannesmann AG, 4000 Düsseldorf | Verfahren zur automatischen Erkennung von Ultraschallanzeigen |
| US4202033A (en) * | 1977-12-27 | 1980-05-06 | Royco Instruments, Inc. | Apparatus and method utilizing calculator for quality control of hematology sample analysis |
| US4219277A (en) * | 1978-08-09 | 1980-08-26 | Westinghouse Electric Corp. | Method of detecting flaws on surfaces |
| US4253768A (en) * | 1978-08-09 | 1981-03-03 | Westinghouse Electric Corp. | Processing system for detection and the classification of flaws on metallic surfaces |
| US4493554A (en) * | 1979-02-27 | 1985-01-15 | Diffracto | Method and apparatus for determining physical characteristics of objects and object surfaces |
| US4357668A (en) * | 1980-03-04 | 1982-11-02 | The Perkin-Elmer Corp. | Base line correction method and apparatus |
| DE3014191A1 (de) * | 1980-04-14 | 1981-10-15 | Siemens AG, 1000 Berlin und 8000 München | Schaltungsanordnung zum feststellen von flecken auf einem von einer elektrooptischen abtasteinrichtung in ein videosignal umgesetzten objektbild |
| DE3028942A1 (de) | 1980-07-30 | 1982-02-18 | Krones Ag Hermann Kronseder Maschinenfabrik, 8402 Neutraubling | Verfahren und inspektionsgeraet zum inspizieren eines gegenstandes, insbesondere einer flasche |
| US4483615A (en) * | 1981-12-18 | 1984-11-20 | Owens-Illinois, Inc. | Method and apparatus for detecting checks in glass tubes |
| US4538915A (en) * | 1981-12-23 | 1985-09-03 | E. I. Du Pont De Nemours And Company | Web inspection system having a product characteristic signal normalizing network |
| JPS58143251A (ja) * | 1982-02-22 | 1983-08-25 | Fuji Electric Corp Res & Dev Ltd | 板状物体の欠陥検出方法 |
| JPS58143250A (ja) * | 1982-02-22 | 1983-08-25 | Fuji Electric Corp Res & Dev Ltd | 板状物体の欠陥検出方法 |
| US4553838A (en) * | 1982-04-15 | 1985-11-19 | Eaton Corporation | Optical inspection system |
| JPS59208408A (ja) * | 1983-05-13 | 1984-11-26 | Toshiba Corp | 表面検査方法及びその装置 |
| US4891530A (en) * | 1986-02-22 | 1990-01-02 | Helmut K. Pinsch Gmbh & Co. | Testing or inspecting apparatus and method for detecting differently shaped surfaces of objects |
| DE3672163D1 (de) * | 1986-02-22 | 1990-07-26 | Pinsch Gmbh & Co Helmut K | Schnittholz-pruefvorrichtung. |
| US4803638A (en) * | 1986-06-26 | 1989-02-07 | Westinghouse Electric Corp. | Ultrasonic signal processing system including a flaw gate |
| US4824250A (en) * | 1986-11-17 | 1989-04-25 | Newman John W | Non-destructive testing by laser scanning |
| FR2624608A1 (fr) * | 1987-12-11 | 1989-06-16 | Tech Bois Ameublement Centre | Dispositif de detection automatique de defauts dans un lot heterogene d'objets |
| JP3142852B2 (ja) * | 1990-02-20 | 2001-03-07 | 株式会社日立製作所 | 表面欠陥検査装置 |
| US5440648A (en) * | 1991-11-19 | 1995-08-08 | Dalsa, Inc. | High speed defect detection apparatus having defect detection circuits mounted in the camera housing |
| US6219136B1 (en) | 1998-03-03 | 2001-04-17 | Union Underwear Company, Inc. | Digital signal processor knitting scanner |
| US7381939B2 (en) * | 2005-06-02 | 2008-06-03 | Transcore Link Logistics Corporation | Optical cargo detection |
| US20080079936A1 (en) * | 2006-09-29 | 2008-04-03 | Caterpillar Inc. | Internal thread inspection probe |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3026415A (en) * | 1958-10-20 | 1962-03-20 | Eastman Kodak Co | Flaw detector for continuous web |
| US3475600A (en) * | 1966-02-28 | 1969-10-28 | Infotronics Corp | Base line control circuit means |
| GB1315654A (en) * | 1969-05-21 | 1973-05-02 | Pilkington Brothers Ltd | Detection of faults in transparent material using lasers |
| US3628003A (en) * | 1970-01-02 | 1971-12-14 | Capital National Bank | Baseline projection apparatus for use with baseline drift correction circuits |
-
1974
- 1974-04-30 US US465510A patent/US3920970A/en not_active Expired - Lifetime
-
1975
- 1975-03-24 CA CA222,949A patent/CA1043883A/en not_active Expired
- 1975-04-24 GB GB17140/75A patent/GB1512661A/en not_active Expired
- 1975-04-28 JP JP50051965A patent/JPS50147982A/ja active Pending
- 1975-04-28 NL NL7505021A patent/NL7505021A/xx not_active Application Discontinuation
- 1975-04-29 SE SE7505028A patent/SE423282B/xx not_active IP Right Cessation
- 1975-04-29 FR FR7513440A patent/FR2269714B1/fr not_active Expired
- 1975-04-30 DE DE19752519386 patent/DE2519386A1/de not_active Withdrawn
-
1981
- 1981-03-09 JP JP1981032648U patent/JPS56157662U/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| GB1512661A (en) | 1978-06-01 |
| FR2269714A1 (enExample) | 1975-11-28 |
| FR2269714B1 (enExample) | 1981-08-07 |
| SE7505028L (enExample) | 1975-12-18 |
| US3920970A (en) | 1975-11-18 |
| DE2519386A1 (de) | 1975-11-13 |
| NL7505021A (nl) | 1975-11-03 |
| JPS50147982A (enExample) | 1975-11-27 |
| SE423282B (sv) | 1982-04-26 |
| JPS56157662U (enExample) | 1981-11-25 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CA1043883A (en) | Laser scanner flaw detection system using baseline follower signal processing | |
| US4402607A (en) | Automatic detector for microscopic dust on large-area, optically unpolished surfaces | |
| DE60140882D1 (de) | Vorrichtung und verfahren zum abtasten von produkten mit einem lichtstrahl, um verunreinigungen oder unregelmässigkeiten in einem geförderten strom der produkte zu erfassen und zu entfernen | |
| WO1985003353A1 (en) | Inspection system utilizing dark-field illumination | |
| US6661508B2 (en) | Inspection systems using sensor array and double threshold arrangement | |
| KR970003760A (ko) | 이물검사방법 및 장치 | |
| EP0797763A4 (en) | GRID DEVICE FOR EXAMINING SURFACE ANOMALITIES | |
| US6208750B1 (en) | Method for detecting particles using illumination with several wavelengths | |
| US4213702A (en) | Glass inspection method and apparatus | |
| JPS6080745A (ja) | 異物自動検出装置 | |
| CA2059226C (en) | Light beam detection apparatus | |
| JPH0534128A (ja) | 異物検査装置 | |
| JP2738108B2 (ja) | バーコード読取装置 | |
| US5796475A (en) | Signal process method and apparatus for defect inspection | |
| JPS5756704A (en) | Detector for surface flaw of bloom | |
| JPS6439543A (en) | Defective inspection device | |
| JPH05188004A (ja) | 異物検出装置 | |
| JP2880721B2 (ja) | 欠陥検査装置 | |
| JPH0540026A (ja) | パターン読み取り装置 | |
| JPH01239437A (ja) | 異物有無検査装置 | |
| JPH054026B2 (enExample) | ||
| JPH0310144A (ja) | 徴細粒子測定装置 | |
| JPH01257248A (ja) | 表面異物検査方法 | |
| JPS59208446A (ja) | レ−ザ式表面検査装置 | |
| JPH04282438A (ja) | 貫通孔検査装置 |