JPS50147982A - - Google Patents

Info

Publication number
JPS50147982A
JPS50147982A JP50051965A JP5196575A JPS50147982A JP S50147982 A JPS50147982 A JP S50147982A JP 50051965 A JP50051965 A JP 50051965A JP 5196575 A JP5196575 A JP 5196575A JP S50147982 A JPS50147982 A JP S50147982A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP50051965A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS50147982A publication Critical patent/JPS50147982A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
JP50051965A 1974-04-30 1975-04-28 Pending JPS50147982A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US465510A US3920970A (en) 1974-04-30 1974-04-30 Laser scanner flaw detection system using baseline follower signal processing

Publications (1)

Publication Number Publication Date
JPS50147982A true JPS50147982A (ja) 1975-11-27

Family

ID=23848109

Family Applications (2)

Application Number Title Priority Date Filing Date
JP50051965A Pending JPS50147982A (ja) 1974-04-30 1975-04-28
JP1981032648U Pending JPS56157662U (ja) 1974-04-30 1981-03-09

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP1981032648U Pending JPS56157662U (ja) 1974-04-30 1981-03-09

Country Status (8)

Country Link
US (1) US3920970A (ja)
JP (2) JPS50147982A (ja)
CA (1) CA1043883A (ja)
DE (1) DE2519386A1 (ja)
FR (1) FR2269714B1 (ja)
GB (1) GB1512661A (ja)
NL (1) NL7505021A (ja)
SE (1) SE423282B (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58143250A (ja) * 1982-02-22 1983-08-25 Fuji Electric Corp Res & Dev Ltd 板状物体の欠陥検出方法
JPS58143251A (ja) * 1982-02-22 1983-08-25 Fuji Electric Corp Res & Dev Ltd 板状物体の欠陥検出方法
JPS59208408A (ja) * 1983-05-13 1984-11-26 Toshiba Corp 表面検査方法及びその装置

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2636401C3 (de) * 1976-08-11 1983-11-03 Mannesmann AG, 4000 Düsseldorf Verfahren zur automatischen Erkennung von Ultraschallanzeigen
US4202033A (en) * 1977-12-27 1980-05-06 Royco Instruments, Inc. Apparatus and method utilizing calculator for quality control of hematology sample analysis
US4219277A (en) * 1978-08-09 1980-08-26 Westinghouse Electric Corp. Method of detecting flaws on surfaces
US4253768A (en) * 1978-08-09 1981-03-03 Westinghouse Electric Corp. Processing system for detection and the classification of flaws on metallic surfaces
US4493554A (en) * 1979-02-27 1985-01-15 Diffracto Method and apparatus for determining physical characteristics of objects and object surfaces
US4357668A (en) * 1980-03-04 1982-11-02 The Perkin-Elmer Corp. Base line correction method and apparatus
DE3014191A1 (de) * 1980-04-14 1981-10-15 Siemens AG, 1000 Berlin und 8000 München Schaltungsanordnung zum feststellen von flecken auf einem von einer elektrooptischen abtasteinrichtung in ein videosignal umgesetzten objektbild
DE3028942A1 (de) 1980-07-30 1982-02-18 Krones Ag Hermann Kronseder Maschinenfabrik, 8402 Neutraubling Verfahren und inspektionsgeraet zum inspizieren eines gegenstandes, insbesondere einer flasche
US4483615A (en) * 1981-12-18 1984-11-20 Owens-Illinois, Inc. Method and apparatus for detecting checks in glass tubes
US4538915A (en) * 1981-12-23 1985-09-03 E. I. Du Pont De Nemours And Company Web inspection system having a product characteristic signal normalizing network
US4553838A (en) * 1982-04-15 1985-11-19 Eaton Corporation Optical inspection system
US4891530A (en) * 1986-02-22 1990-01-02 Helmut K. Pinsch Gmbh & Co. Testing or inspecting apparatus and method for detecting differently shaped surfaces of objects
EP0233970B1 (de) * 1986-02-22 1990-06-20 Helmut K. Pinsch GmbH & Co. Schnittholz-Prüfvorrichtung
US4803638A (en) * 1986-06-26 1989-02-07 Westinghouse Electric Corp. Ultrasonic signal processing system including a flaw gate
US4824250A (en) * 1986-11-17 1989-04-25 Newman John W Non-destructive testing by laser scanning
FR2624608A1 (fr) * 1987-12-11 1989-06-16 Tech Bois Ameublement Centre Dispositif de detection automatique de defauts dans un lot heterogene d'objets
JP3142852B2 (ja) * 1990-02-20 2001-03-07 株式会社日立製作所 表面欠陥検査装置
US5440648A (en) * 1991-11-19 1995-08-08 Dalsa, Inc. High speed defect detection apparatus having defect detection circuits mounted in the camera housing
US6219136B1 (en) 1998-03-03 2001-04-17 Union Underwear Company, Inc. Digital signal processor knitting scanner
US7381939B2 (en) * 2005-06-02 2008-06-03 Transcore Link Logistics Corporation Optical cargo detection
US20080079936A1 (en) * 2006-09-29 2008-04-03 Caterpillar Inc. Internal thread inspection probe

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3026415A (en) * 1958-10-20 1962-03-20 Eastman Kodak Co Flaw detector for continuous web
US3475600A (en) * 1966-02-28 1969-10-28 Infotronics Corp Base line control circuit means
GB1315654A (en) * 1969-05-21 1973-05-02 Pilkington Brothers Ltd Detection of faults in transparent material using lasers
US3628003A (en) * 1970-01-02 1971-12-14 Capital National Bank Baseline projection apparatus for use with baseline drift correction circuits

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58143250A (ja) * 1982-02-22 1983-08-25 Fuji Electric Corp Res & Dev Ltd 板状物体の欠陥検出方法
JPS58143251A (ja) * 1982-02-22 1983-08-25 Fuji Electric Corp Res & Dev Ltd 板状物体の欠陥検出方法
JPH0332734B2 (ja) * 1982-02-22 1991-05-14 Fuji Denki Sogo Kenkyusho Kk
JPH0332733B2 (ja) * 1982-02-22 1991-05-14 Fuji Denki Sogo Kenkyusho Kk
JPS59208408A (ja) * 1983-05-13 1984-11-26 Toshiba Corp 表面検査方法及びその装置

Also Published As

Publication number Publication date
GB1512661A (en) 1978-06-01
FR2269714B1 (ja) 1981-08-07
JPS56157662U (ja) 1981-11-25
SE7505028L (ja) 1975-12-18
NL7505021A (nl) 1975-11-03
SE423282B (sv) 1982-04-26
DE2519386A1 (de) 1975-11-13
CA1043883A (en) 1978-12-05
US3920970A (en) 1975-11-18
FR2269714A1 (ja) 1975-11-28

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