BRPI0915188A2 - recipiente de carga de gás, aparelho de sonda de átomo e método para analisar a posição do hidrogênio em material - Google Patents

recipiente de carga de gás, aparelho de sonda de átomo e método para analisar a posição do hidrogênio em material

Info

Publication number
BRPI0915188A2
BRPI0915188A2 BRPI0915188A BRPI0915188A BRPI0915188A2 BR PI0915188 A2 BRPI0915188 A2 BR PI0915188A2 BR PI0915188 A BRPI0915188 A BR PI0915188A BR PI0915188 A BRPI0915188 A BR PI0915188A BR PI0915188 A2 BRPI0915188 A2 BR PI0915188A2
Authority
BR
Brazil
Prior art keywords
needle
shaped material
analyzing
hydrogen
probe apparatus
Prior art date
Application number
BRPI0915188A
Other languages
English (en)
Inventor
Ohmori Haruo
Takahashi Jun
Kawakami Kazuto
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Publication of BRPI0915188A2 publication Critical patent/BRPI0915188A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2255—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident ion beams, e.g. proton beams
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/285—Emission microscopes, e.g. field-emission microscopes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/006—Details of gas supplies, e.g. in an ion source, to a beam line, to a specimen or to a workpiece
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2001—Maintaining constant desired temperature

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)

Abstract

recipiente de carga de gás, aparelho de sonda de átomo e método para analisar a posição do hidrogênio em material a presente invenção refere-se a um recipiente de carga do gás inclui um suporte de amostra que mantém um material em formato de agulha, uma porção de abastecimento do gás de deutério que carrega o gás de deutério no material em formato de agulha mantido pelo suporte de amostra e uma porção de aquecimento que aquece o material em formato de agulha mantido pelo suporte de amostra. o material em formato de agulha é esfriado bloqueando o calor gerado pela porção de aquecimento depois que o material em formato de agulha é aquecido pela porção de aquecimento.
BRPI0915188A 2008-06-24 2009-06-24 recipiente de carga de gás, aparelho de sonda de átomo e método para analisar a posição do hidrogênio em material BRPI0915188A2 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2008164619 2008-06-24
JP2009115426 2009-05-12
PCT/JP2009/061478 WO2009157475A1 (ja) 2008-06-24 2009-06-24 ガスチャージ容器、アトムプローブ装置、及び材料中の水素位置分析方法

Publications (1)

Publication Number Publication Date
BRPI0915188A2 true BRPI0915188A2 (pt) 2019-01-15

Family

ID=41444539

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0915188A BRPI0915188A2 (pt) 2008-06-24 2009-06-24 recipiente de carga de gás, aparelho de sonda de átomo e método para analisar a posição do hidrogênio em material

Country Status (9)

Country Link
US (1) US8567233B2 (pt)
EP (1) EP2302349B1 (pt)
JP (1) JP4700766B2 (pt)
KR (1) KR101264498B1 (pt)
CN (1) CN102066898B (pt)
AU (1) AU2009263350B2 (pt)
BR (1) BRPI0915188A2 (pt)
RU (1) RU2466376C2 (pt)
WO (1) WO2009157475A1 (pt)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3164880B1 (en) 2014-07-01 2019-12-04 Atomnaut Inc. Systems and methods for using multimodal imaging to determine structure and atomic composition of specimens
CN107607561A (zh) * 2017-10-17 2018-01-19 新余钢铁股份有限公司 一种储氢容器加工件氢缺陷的检测装置
CN111829841A (zh) * 2019-04-15 2020-10-27 台湾积体电路制造股份有限公司 针状样品、针状样品的分析以及制备方法
CN113092205A (zh) * 2021-03-30 2021-07-09 北京科技大学 一种检测金属中氢分布的简易氢微印方法
CN114152660A (zh) * 2021-12-08 2022-03-08 中国工程物理研究院材料研究所 一种金属材料不同深度氢及其同位素含量检测装置及方法

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5127716Y2 (pt) * 1971-10-29 1976-07-13
JPS48100577U (pt) * 1972-02-28 1973-11-27
SU1126846A1 (ru) * 1983-04-22 1984-11-30 Запорожский Ордена "Знак Почета" Машиностроительный Институт Им.В.Я.Чубаря Способ определени дефектов в соединении
US4716736A (en) * 1986-01-17 1988-01-05 Syracuse University Metal assisted carbon cold storage of hydrogen
JPH03101852U (pt) * 1990-01-31 1991-10-23
US5440124A (en) * 1994-07-08 1995-08-08 Wisconsin Alumni Research Foundation High mass resolution local-electrode atom probe
JPH09152410A (ja) * 1995-12-01 1997-06-10 Hitachi Ltd 欠陥検出装置及びその測定方法
JPH09196831A (ja) * 1996-01-19 1997-07-31 Hitachi Ltd 試料冷却観察装置
JPH10104141A (ja) 1996-08-06 1998-04-24 Sumitomo Metal Ind Ltd 試料の調製方法、試料の調製機構および分析装置
JP3553318B2 (ja) 1997-05-20 2004-08-11 日本電子株式会社 ホルダ保持装置
AU781965B2 (en) 1999-11-24 2005-06-23 Procter & Gamble Company, The Method for controlling an amount of material delivered during a material transfer
JP2002033366A (ja) 2000-07-13 2002-01-31 Hitachi Ltd プローブユニットおよびそれを用いた試料操作装置
JP2003123682A (ja) 2001-10-18 2003-04-25 Hitachi High-Technologies Corp 荷電粒子線装置
US6857293B2 (en) * 2001-12-20 2005-02-22 3M Innovative Properties Company Apparatus for selective photosensitization of optical fiber
JP3101852U (ja) 2003-07-31 2004-06-24 光子 狩野 組立て式太陽光の集熱教材
JP5169157B2 (ja) 2007-11-09 2013-03-27 東京電力株式会社 給湯システム

Also Published As

Publication number Publication date
EP2302349B1 (en) 2018-12-19
US8567233B2 (en) 2013-10-29
EP2302349A1 (en) 2011-03-30
AU2009263350B2 (en) 2014-02-06
JPWO2009157475A1 (ja) 2011-12-15
KR101264498B1 (ko) 2013-05-14
WO2009157475A1 (ja) 2009-12-30
RU2466376C2 (ru) 2012-11-10
EP2302349A4 (en) 2014-05-14
CN102066898A (zh) 2011-05-18
US20110113858A1 (en) 2011-05-19
RU2010151790A (ru) 2012-07-27
AU2009263350A1 (en) 2009-12-30
KR20110009245A (ko) 2011-01-27
JP4700766B2 (ja) 2011-06-15
CN102066898B (zh) 2013-04-17

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Legal Events

Date Code Title Description
B25D Requested change of name of applicant approved

Owner name: NIPPON STEEL AND SUMITOMO METAL CORPORATION (JP)

B06F Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette]
B06T Formal requirements before examination [chapter 6.20 patent gazette]
B09A Decision: intention to grant [chapter 9.1 patent gazette]
B25D Requested change of name of applicant approved

Owner name: NIPPON STEEL CORPORATION (JP)

B11D Dismissal acc. art. 38, par 2 of ipl - failure to pay fee after grant in time
B350 Update of information on the portal [chapter 15.35 patent gazette]