BRPI0822092A8 - Dispositivo sensor microeletrônico para o exame de partículas alvo, método para o exame das partículas alvo, e, uso do dispositivo sensor microeletrônico - Google Patents

Dispositivo sensor microeletrônico para o exame de partículas alvo, método para o exame das partículas alvo, e, uso do dispositivo sensor microeletrônico

Info

Publication number
BRPI0822092A8
BRPI0822092A8 BRPI0822092A BRPI0822092A BRPI0822092A8 BR PI0822092 A8 BRPI0822092 A8 BR PI0822092A8 BR PI0822092 A BRPI0822092 A BR PI0822092A BR PI0822092 A BRPI0822092 A BR PI0822092A BR PI0822092 A8 BRPI0822092 A8 BR PI0822092A8
Authority
BR
Brazil
Prior art keywords
target particles
sensor device
examination
microelectronic sensor
carrier
Prior art date
Application number
BRPI0822092A
Other languages
English (en)
Portuguese (pt)
Inventor
M Bruls Dominique
J H B Schleipen Johannes
A H M Kahlman Josephus
W J Prins Menno
Original Assignee
Koninklijke Philips Electronics Nv
Koninklijke Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics Nv, Koninklijke Philips Nv filed Critical Koninklijke Philips Electronics Nv
Publication of BRPI0822092A2 publication Critical patent/BRPI0822092A2/pt
Publication of BRPI0822092A8 publication Critical patent/BRPI0822092A8/pt

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • G01N21/552Attenuated total reflection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • G01N21/648Specially adapted constructive features of fluorimeters using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G01N2021/1721Electromodulation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G01N2021/1727Magnetomodulation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/069Supply of sources
    • G01N2201/0691Modulated (not pulsed supply)

Landscapes

  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
BRPI0822092A 2007-12-20 2008-10-31 Dispositivo sensor microeletrônico para o exame de partículas alvo, método para o exame das partículas alvo, e, uso do dispositivo sensor microeletrônico BRPI0822092A8 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP07123741 2007-12-20
PCT/IB2008/054541 WO2009083814A2 (en) 2007-12-20 2008-10-31 Microelectronic sensor device for the detection of target particles

Publications (2)

Publication Number Publication Date
BRPI0822092A2 BRPI0822092A2 (pt) 2015-06-30
BRPI0822092A8 true BRPI0822092A8 (pt) 2016-03-22

Family

ID=40671102

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0822092A BRPI0822092A8 (pt) 2007-12-20 2008-10-31 Dispositivo sensor microeletrônico para o exame de partículas alvo, método para o exame das partículas alvo, e, uso do dispositivo sensor microeletrônico

Country Status (7)

Country Link
US (1) US8486689B2 (cg-RX-API-DMAC7.html)
EP (1) EP2225547B1 (cg-RX-API-DMAC7.html)
JP (1) JP2011508199A (cg-RX-API-DMAC7.html)
CN (1) CN101903758B (cg-RX-API-DMAC7.html)
BR (1) BRPI0822092A8 (cg-RX-API-DMAC7.html)
RU (1) RU2489704C2 (cg-RX-API-DMAC7.html)
WO (1) WO2009083814A2 (cg-RX-API-DMAC7.html)

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EP2513636B1 (en) * 2009-12-18 2020-08-05 Koninklijke Philips N.V. Substance determining apparatus
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JP5814806B2 (ja) * 2011-03-30 2015-11-17 株式会社東芝 光導波路型測定システム、測定方法及び光導波路型センサチップ
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WO2013057616A1 (en) * 2011-10-20 2013-04-25 Koninklijke Philips Electronics N.V. Magnetic particle detection with incubation period
DE102011088880A1 (de) * 2011-12-16 2013-06-20 Robert Bosch Gmbh Schlauchbeutelmaschine zur Abfüllung eines Produkts
US9677109B2 (en) 2013-03-15 2017-06-13 Accelerate Diagnostics, Inc. Rapid determination of microbial growth and antimicrobial susceptibility
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JP6263887B2 (ja) * 2013-07-22 2018-01-24 コニカミノルタ株式会社 表面プラズモン増強蛍光測定方法および表面プラズモン増強蛍光測定装置
JP2014025951A (ja) * 2013-10-28 2014-02-06 Konica Minolta Inc 測定方法及び表面プラズモン増強蛍光測定装置
JP2015025820A (ja) * 2014-11-04 2015-02-05 株式会社東芝 光導波路型測定システムおよび糖化ヘモグロビンの測定方法
US9759651B2 (en) * 2014-12-23 2017-09-12 Magellan Diagnostics, Inc. Combination optical hemoglobin and electrochemical lead assay
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US10253355B2 (en) 2015-03-30 2019-04-09 Accelerate Diagnostics, Inc. Instrument and system for rapid microorganism identification and antimicrobial agent susceptibility testing
KR20170132856A (ko) 2015-03-30 2017-12-04 액셀러레이트 다이어그노스틱스, 아이엔씨. 신속한 미생물 동정 및 항균제 감수성 시험을 위한 기기 및 시스템
WO2017001536A1 (en) * 2015-06-30 2017-01-05 Imec Vzw Modulation of luminescent dyes
CN105929149B (zh) * 2016-04-26 2018-09-11 中国科学院电子学研究所 一种基于磁富集和全内反射的光学检测仪
RU177920U1 (ru) * 2016-11-30 2018-03-15 Общество с ограниченной ответственностью "ГемаКор Лабс" (ООО "ГемаКор Лабс") Устройство мониторинга пространственно-временной динамики тромбина
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Also Published As

Publication number Publication date
CN101903758A (zh) 2010-12-01
EP2225547A2 (en) 2010-09-08
RU2489704C2 (ru) 2013-08-10
EP2225547B1 (en) 2016-07-27
US8486689B2 (en) 2013-07-16
US20100267165A1 (en) 2010-10-21
BRPI0822092A2 (pt) 2015-06-30
RU2010130170A (ru) 2012-01-27
WO2009083814A3 (en) 2009-10-15
JP2011508199A (ja) 2011-03-10
CN101903758B (zh) 2013-05-08
WO2009083814A2 (en) 2009-07-09

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Legal Events

Date Code Title Description
B25D Requested change of name of applicant approved

Owner name: KONINKLIJKE PHILIPS N. V. (NL)

B25G Requested change of headquarter approved

Owner name: KONINKLIJKE PHILIPS N. V. (NL)

B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]
B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2435 DE 05-09-2017 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.