BRPI0416310A - processo de detecção de defeitos e sistema de detecção de defeitos de superfìcie - Google Patents
processo de detecção de defeitos e sistema de detecção de defeitos de superfìcieInfo
- Publication number
- BRPI0416310A BRPI0416310A BRPI0416310-9A BRPI0416310A BRPI0416310A BR PI0416310 A BRPI0416310 A BR PI0416310A BR PI0416310 A BRPI0416310 A BR PI0416310A BR PI0416310 A BRPI0416310 A BR PI0416310A
- Authority
- BR
- Brazil
- Prior art keywords
- defect detection
- cell
- eddy currents
- detection system
- surface defect
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/904—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9006—Details, e.g. in the structure or functioning of sensors
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Continuous Casting (AREA)
Abstract
"PROCESSO DE DETECçãO DE DEFEITOS E SISTEMA DE DETECçãO DE DEFEITOS DE SUPERFìCIE". A presente invenção se refere a uma processo de detecção de defeitos de superfície de um produto metálico bruto de fundição contínua, tal como uma placa de aço (4), sendo realizado por meio de um sensor (10) de defeitos de superfície por correntes de Foucault, sensor esse que compreende uma matriz que possui pelo menos duas fileiras (22, 24) de pelo menos três células de medida (21) cada uma contíguas e podendo ser comandadas por uma unidade de pilotagem (12) com multiplexador, sendo que cada célula está apta a gerar correntes de Foucault na superfície da placa de seção retangular e, de modo alternativo, a detectar correntes de Foucault nessa mesma superfície, e a um processo que compreende uma etapa de comando de uma primeira célula emissora e de uma segunda célula receptora da mesma fileira separadas uma da outra por pelo menos uma célula inativa.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0313498A FR2862384B3 (fr) | 2003-11-18 | 2003-11-18 | Procede et systeme de detection de defauts de surface d'un demi-produit metallique brut de coulee continue |
PCT/FR2004/002802 WO2005052569A1 (fr) | 2003-11-18 | 2004-10-29 | Procede et systeme de detection de defauts de surface d'un produit metallique brut de coulee continue. |
Publications (1)
Publication Number | Publication Date |
---|---|
BRPI0416310A true BRPI0416310A (pt) | 2007-01-09 |
Family
ID=34508559
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BRPI0416310-9A BRPI0416310A (pt) | 2003-11-18 | 2004-10-29 | processo de detecção de defeitos e sistema de detecção de defeitos de superfìcie |
Country Status (10)
Country | Link |
---|---|
US (1) | US7489129B2 (pt) |
EP (1) | EP1685396A1 (pt) |
JP (1) | JP4652336B2 (pt) |
KR (1) | KR101065472B1 (pt) |
CN (1) | CN100447565C (pt) |
BR (1) | BRPI0416310A (pt) |
FR (1) | FR2862384B3 (pt) |
RU (1) | RU2343473C2 (pt) |
UA (1) | UA80504C2 (pt) |
WO (1) | WO2005052569A1 (pt) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20090091318A1 (en) * | 2007-09-11 | 2009-04-09 | Benoit Lepage | Phased scan eddy current array probe and a phased scanning method which provide complete and continuous coverage of a test surface without mechanical scanning |
FR2944354B1 (fr) * | 2009-04-10 | 2011-06-24 | Commissariat Energie Atomique | Dispositif de controle non destructif d'une structure electriquement conductrice |
CA2842888C (en) * | 2012-06-21 | 2014-12-30 | Eddyfi Ndt Inc. | High resolution eddy current array probe |
FR3008490B1 (fr) * | 2013-07-10 | 2015-08-07 | Snecma | Dispositif pour l'inspection d'une surface d'une piece electriquement conductrice |
KR102023739B1 (ko) | 2019-04-17 | 2019-09-20 | 주식회사 엘지화학 | 와전류를 이용한 전지셀 내부의 균열 검사 방법 및 검사 장치 |
CN112824871B (zh) * | 2019-11-20 | 2022-11-15 | 中国南方电网有限责任公司超高压输电公司贵阳局 | 基于瞬变电磁视电阻率成像技术的接地网缺陷诊断方法 |
JP2024514358A (ja) * | 2021-04-22 | 2024-04-01 | エヴィデント・カナダ・インコーポレイテッド | 高温ecaプローブ |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS618361Y2 (pt) * | 1980-10-09 | 1986-03-14 | ||
US5047719A (en) * | 1990-05-25 | 1991-09-10 | The Failure Group, Inc. | Flexible coil assembly for reflectance-mode nondestructive eddy-current examination |
JP2700213B2 (ja) * | 1990-11-24 | 1998-01-19 | 株式会社エース電研 | パチンコ玉検知装置およびパチンコゲーム機 |
US5237271A (en) * | 1991-05-06 | 1993-08-17 | General Electric Company | Apparatus and method for non-destructive testing using multi-frequency eddy currents |
US5262722A (en) * | 1992-04-03 | 1993-11-16 | General Electric Company | Apparatus for near surface nondestructive eddy current scanning of a conductive part using a multi-layer eddy current probe array |
CA2076205C (en) * | 1992-08-14 | 1999-04-20 | Valentino S. Cecco | Differential transmit-receive eddy current probe incorporating bracelets of multi-coil units |
JP2833497B2 (ja) * | 1994-12-07 | 1998-12-09 | 財団法人雑賀技術研究所 | 移動導電体検出用コイルとそれを用いた移動導電体検出装置 |
JPH08334498A (ja) * | 1995-06-08 | 1996-12-17 | Ishikawajima Harima Heavy Ind Co Ltd | 全方位渦流探傷方法およびその装置 |
FR2758393B1 (fr) * | 1997-01-10 | 1999-10-15 | Commissariat Energie Atomique | Sonde a courants de foucault |
JPH1151905A (ja) * | 1997-08-04 | 1999-02-26 | Tokyo Gas Co Ltd | 渦流探傷装置用探傷コイルアレイおよび該探傷コイルアレイを用いた渦流探傷方法 |
FR2782803B3 (fr) * | 1998-08-31 | 2001-04-13 | Minh Quang Le | Capteur inductif multi-elements, pour le controle non destructif de pieces electriquement conductrices |
JP2000235019A (ja) * | 1999-02-12 | 2000-08-29 | Genshiryoku Engineering:Kk | 渦流探傷プローブ |
US6344739B1 (en) * | 1999-02-12 | 2002-02-05 | R/D Tech Inc. | Eddy current probe with multi-use coils and compact configuration |
US6172499B1 (en) * | 1999-10-29 | 2001-01-09 | Ascension Technology Corporation | Eddy current error-reduced AC magnetic position measurement system |
JP2002022706A (ja) * | 2000-07-12 | 2002-01-23 | Uchihashi Estec Co Ltd | 磁気センサ及び漏洩磁束探傷法並びに装置 |
CN1160567C (zh) * | 2001-11-23 | 2004-08-04 | 清华大学 | 阵列式柔性电涡流传感器 |
JP4327745B2 (ja) * | 2005-02-18 | 2009-09-09 | 株式会社日立製作所 | 渦電流探傷プローブ及び渦電流探傷装置 |
-
2003
- 2003-11-18 FR FR0313498A patent/FR2862384B3/fr not_active Expired - Lifetime
-
2004
- 2004-10-29 BR BRPI0416310-9A patent/BRPI0416310A/pt not_active IP Right Cessation
- 2004-10-29 US US10/579,533 patent/US7489129B2/en not_active Expired - Fee Related
- 2004-10-29 RU RU2006121448/28A patent/RU2343473C2/ru not_active IP Right Cessation
- 2004-10-29 WO PCT/FR2004/002802 patent/WO2005052569A1/fr active Application Filing
- 2004-10-29 CN CNB2004800377159A patent/CN100447565C/zh not_active Expired - Fee Related
- 2004-10-29 EP EP04805355A patent/EP1685396A1/fr not_active Withdrawn
- 2004-10-29 JP JP2006540505A patent/JP4652336B2/ja not_active Expired - Fee Related
- 2004-10-29 UA UAA200606743A patent/UA80504C2/uk unknown
- 2004-10-29 KR KR1020067012062A patent/KR101065472B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
US20070285088A1 (en) | 2007-12-13 |
WO2005052569A1 (fr) | 2005-06-09 |
EP1685396A1 (fr) | 2006-08-02 |
JP4652336B2 (ja) | 2011-03-16 |
RU2006121448A (ru) | 2007-12-27 |
US7489129B2 (en) | 2009-02-10 |
CN100447565C (zh) | 2008-12-31 |
FR2862384A3 (fr) | 2005-05-20 |
RU2343473C2 (ru) | 2009-01-10 |
UA80504C2 (en) | 2007-09-25 |
KR20060123349A (ko) | 2006-12-01 |
FR2862384B3 (fr) | 2005-11-04 |
CN1894579A (zh) | 2007-01-10 |
JP2007513330A (ja) | 2007-05-24 |
KR101065472B1 (ko) | 2011-09-16 |
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Legal Events
Date | Code | Title | Description |
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B08F | Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette] |
Free format text: REFERENTE A 9A ANUIDADE. |
|
B08K | Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette] |
Free format text: REFERENTE AO DESPACHO 8.6 PUBLICADO NA RPI 2260 DE 29/04/2014. |