BR112018069960A2 - método para detectar um defeito em uma superfície e dispositivo para detectar um defeito em uma superfície - Google Patents

método para detectar um defeito em uma superfície e dispositivo para detectar um defeito em uma superfície

Info

Publication number
BR112018069960A2
BR112018069960A2 BR112018069960A BR112018069960A BR112018069960A2 BR 112018069960 A2 BR112018069960 A2 BR 112018069960A2 BR 112018069960 A BR112018069960 A BR 112018069960A BR 112018069960 A BR112018069960 A BR 112018069960A BR 112018069960 A2 BR112018069960 A2 BR 112018069960A2
Authority
BR
Brazil
Prior art keywords
detecting
point
surface defect
optical
defect
Prior art date
Application number
BR112018069960A
Other languages
English (en)
Other versions
BR112018069960B1 (pt
Inventor
Skopinski Clément
Caput Gautier
Taglione Matthieu
Original Assignee
Framatome Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Framatome Sa filed Critical Framatome Sa
Publication of BR112018069960A2 publication Critical patent/BR112018069960A2/pt
Publication of BR112018069960B1 publication Critical patent/BR112018069960B1/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8812—Diffuse illumination, e.g. "sky"
    • G01N2021/8816—Diffuse illumination, e.g. "sky" by using multiple sources, e.g. LEDs

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

o método para detectar um defeito em uma superfície (12) inclui as seguintes etapas: adquirir (100) uma pluralidade de imagens (200) de superfície (12) usando um dispositivo ótico (14) possuindo um eixo ótico, cada imagem (200) sendo adquirida com uma iluminação de superfície ao longo de uma direção de iluminação (e, e?) determinada para cada ponto de superfície (12) e uma direção ótica (o), as imagens (200) sendo obtidas com diferentes direções de iluminação (e, e?) ou diferentes combinações e/ ou com diferentes direções óticas (o); para cada ponto (202), calcular uma pluralidade de parâmetros, os parâmetros incluindo coeficientes de uma equação que caracterizam a resposta do referido ponto de superfície como uma função da direção de iluminação (e, e?) e uma direção de observação (b, b?); deduzir (104) a partir dos parâmetros calculados se a superfície (12) possui um defeito no referido ponto (202).
BR112018069960-8A 2016-04-05 2017-04-05 Método para detectar um defeito em uma superfície e dispositivo para detectar um defeito em uma superfície BR112018069960B1 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR1652980A FR3049709B1 (fr) 2016-04-05 2016-04-05 Procede de detection d'un defaut sur une surface par eclairage multidirectionnel et dispositif associe
FR1652980 2016-04-05
PCT/EP2017/058162 WO2017174683A1 (fr) 2016-04-05 2017-04-05 Procédé de détection d'un défaut sur une surface par éclairage multidirectionnel et dispositif associé

Publications (2)

Publication Number Publication Date
BR112018069960A2 true BR112018069960A2 (pt) 2019-02-05
BR112018069960B1 BR112018069960B1 (pt) 2022-11-16

Family

ID=56741146

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112018069960-8A BR112018069960B1 (pt) 2016-04-05 2017-04-05 Método para detectar um defeito em uma superfície e dispositivo para detectar um defeito em uma superfície

Country Status (12)

Country Link
US (1) US10648920B2 (pt)
EP (1) EP3440452B1 (pt)
JP (1) JP7078543B2 (pt)
CN (1) CN108885181B (pt)
BR (1) BR112018069960B1 (pt)
ES (1) ES2956762T3 (pt)
FI (1) FI3440452T3 (pt)
FR (1) FR3049709B1 (pt)
HR (1) HRP20230954T1 (pt)
SA (1) SA518400151B1 (pt)
WO (1) WO2017174683A1 (pt)
ZA (1) ZA201806534B (pt)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3103602B1 (fr) * 2019-11-21 2021-12-10 Ingenico Group Terminal de paiement électronique, procédé d’optimisation du fonctionnement et programme d’ordinateur correspondants

Family Cites Families (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5952735A (ja) * 1982-09-20 1984-03-27 Kawasaki Steel Corp 熱間鋼片の表面欠陥検出方法
US5313542A (en) * 1992-11-30 1994-05-17 Breault Research Organization, Inc. Apparatus and method of rapidly measuring hemispherical scattered or radiated light
US6327374B1 (en) * 1999-02-18 2001-12-04 Thermo Radiometrie Oy Arrangement and method for inspection of surface quality
FR2806478B1 (fr) * 2000-03-14 2002-05-10 Optomachines Dispositif et procede de controle optique de pieces de vaisselle comme des assiettes emaillees ou tout produit ceramique emaille
US6850637B1 (en) * 2000-06-28 2005-02-01 Teradyne, Inc. Lighting arrangement for automated optical inspection system
US7113313B2 (en) * 2001-06-04 2006-09-26 Agilent Technologies, Inc. Dome-shaped apparatus for inspecting a component or a printed circuit board device
JP2003098100A (ja) 2001-09-25 2003-04-03 Konica Corp 表面欠陥検査装置
FR2858412B1 (fr) * 2003-07-31 2007-03-30 Stephane Louis Frederi Perquis Systeme et procede de mesure de l'aspect visuel des materiaux.
US20050180160A1 (en) * 2004-02-17 2005-08-18 Brett K. Nelson Hemispherical illuminator for three dimensional inspection
DE102004034160A1 (de) * 2004-07-15 2006-02-09 Byk Gardner Gmbh Vorrichtung zur Untersuchung optischer Oberflächeneigenschaften
ATE414270T1 (de) * 2004-10-08 2008-11-15 Koninkl Philips Electronics Nv Optische inspektion von testoberflächen
CN101184988A (zh) * 2005-12-14 2008-05-21 株式会社尼康 表面检测设备及表面检测方法
JP2008070145A (ja) 2006-09-12 2008-03-27 Dainippon Printing Co Ltd 印刷物検査装置及び印刷物検査方法
CN100547387C (zh) 2006-09-22 2009-10-07 中国科学院安徽光学精密机械研究所 地面brdf自动测量架
MX2009005276A (es) 2006-11-20 2009-06-03 Du Pont Proceso para generar funciones de distribucion de reflectancia bidireccional de materiales gonioaparentes con datos de medicion limitados.
US8103491B2 (en) * 2006-11-20 2012-01-24 E.I. Du Pont De Nemours And Company Process for generating bidirectional reflectance distribution functions of gonioapparent materials with limited measurement data
US8280144B2 (en) * 2007-02-21 2012-10-02 Goldfinch Solutions, Llc System and method for analyzing material properties using hyperspectral imaging
US7929142B2 (en) * 2007-09-25 2011-04-19 Microsoft Corporation Photodiode-based bi-directional reflectance distribution function (BRDF) measurement
JP5882730B2 (ja) * 2011-12-28 2016-03-09 株式会社ブリヂストン 外観検査装置及び外観検査方法
FI125320B (en) * 2012-01-05 2015-08-31 Helmee Imaging Oy ORGANIZATION AND SIMILAR METHOD FOR OPTICAL MEASUREMENTS
CN102590150B (zh) 2012-03-01 2014-02-26 浙江大学 室内高光谱brdf测定系统
JP6053506B2 (ja) * 2012-12-25 2016-12-27 キヤノン株式会社 反射特性の測定装置
JP6119663B2 (ja) * 2014-04-25 2017-04-26 Ｊｆｅスチール株式会社 表面欠陥検出方法及び表面欠陥検出装置
JP6287360B2 (ja) * 2014-03-06 2018-03-07 オムロン株式会社 検査装置
US9885671B2 (en) * 2014-06-09 2018-02-06 Kla-Tencor Corporation Miniaturized imaging apparatus for wafer edge
JP6470506B2 (ja) 2014-06-09 2019-02-13 株式会社キーエンス 検査装置
JP6405124B2 (ja) 2014-06-09 2018-10-17 株式会社キーエンス 検査装置、検査方法およびプログラム
JP6424020B2 (ja) 2014-06-09 2018-11-14 株式会社キーエンス 画像検査装置、画像検査方法、画像検査プログラム及びコンピュータで読み取り可能な記録媒体並びに記録した機器
CN104897616B (zh) * 2015-05-26 2017-09-01 北京理工大学 任意形状样品多光谱双向反射分布函数的测量方法和系统

Also Published As

Publication number Publication date
FR3049709B1 (fr) 2019-08-30
BR112018069960B1 (pt) 2022-11-16
JP7078543B2 (ja) 2022-05-31
US10648920B2 (en) 2020-05-12
CN108885181B (zh) 2021-01-29
SA518400151B1 (ar) 2022-12-05
FR3049709A1 (fr) 2017-10-06
US20190162674A1 (en) 2019-05-30
ZA201806534B (en) 2019-08-28
EP3440452B1 (fr) 2023-08-02
WO2017174683A1 (fr) 2017-10-12
HRP20230954T1 (hr) 2023-11-24
CN108885181A (zh) 2018-11-23
ES2956762T3 (es) 2023-12-27
EP3440452A1 (fr) 2019-02-13
JP2019510981A (ja) 2019-04-18
FI3440452T3 (fi) 2023-10-02

Similar Documents

Publication Publication Date Title
EP3721408A4 (en) MACHINE LEARNING INSPECTION OF RETICLES
BR122020014835A8 (pt) Método de inspeção de objetos
EA201691867A3 (ru) Система идентификации типа поезда
BR112017024165A2 (pt) aparelho, sistema e método para determinar um ou mais parâmetros óticos de uma lente
WO2014186407A3 (en) Machine learning method and apparatus for inspecting reticles
BR112018011850A2 (pt) método e aparelho para verificar um pneu
BR112016024187A2 (pt) sistema sensor de fibra óptica, e, método para a determinação de uma localização de uma perturbação
BR112015023345A2 (pt) criação in situ de alvos planos de recurso natural
MA46351A (fr) Oxystérols substitués en c7 et procédés en tant que modulateurs nmda
BR112017028029A2 (pt) sistema para adquirir dados de superfície, sistema para fabricar chapas de vidro curvadas, e método para adquirir dados de superfície de uma chapa de vidro curvada e desenvolver uma definição de superfície da chapa de vidro
WO2015114093A3 (de) Beleuchtungseinrichtung insbesondere zur fourier-ptychographie
ES2811835T3 (es) Procedimiento para determinar el riesgo de toxicidad por 5-fluorouracilo
BR112017009025A2 (pt) métodos para calibrar dispositivos de computação óptica ou sensores ópticos.
EP3761011A4 (en) LIGHTING DEVICE FOR SORTING MACHINE OR INSPECTION MACHINE
TR201900575T4 (tr) Bir hava taşıtından bir hava kablosunu algılamaya yönelik yöntem ve cihaz.
BR112017022247A2 (pt) método de inspeção de formato, aparelho de inspeção de formato, e programa
FR3018118B1 (fr) Procede de test d'un systeme electronique
EP3551986A4 (en) LED LIGHT SOURCE PROBE CARD TECHNOLOGY FOR TRYING CMOS IMAGE SCAN DEVICES
FR3037394B1 (fr) Procede et dispositif de determination de la vibration d'aubes de rotor
FR3026484B1 (fr) Procede et systeme d'inspection de plaquettes transparentes pour l'electronique, l'optique ou l'optoelectronique
BR112018069960A2 (pt) método para detectar um defeito em uma superfície e dispositivo para detectar um defeito em uma superfície
FR3083690B1 (fr) Procede de determination de l'etat de stress d'un individu
BR112017002856A2 (pt) dispositivo, e, método
BR112016024914A2 (pt) método de exame fototérmico de uma peça e unidade de exame fototérmico para uma peça
BR112016009030A2 (pt) aparelho e métodos para testar função visual e visão funcional em níveis de luminância variáveis

Legal Events

Date Code Title Description
B350 Update of information on the portal [chapter 15.35 patent gazette]
B06W Patent application suspended after preliminary examination (for patents with searches from other patent authorities) chapter 6.23 patent gazette]
B09A Decision: intention to grant [chapter 9.1 patent gazette]
B16A Patent or certificate of addition of invention granted [chapter 16.1 patent gazette]

Free format text: PRAZO DE VALIDADE: 20 (VINTE) ANOS CONTADOS A PARTIR DE 05/04/2017, OBSERVADAS AS CONDICOES LEGAIS