BR112018009890A2 - composição de resina para encapsulação, e dispositivo semicondutor - Google Patents

composição de resina para encapsulação, e dispositivo semicondutor

Info

Publication number
BR112018009890A2
BR112018009890A2 BR112018009890-6A BR112018009890A BR112018009890A2 BR 112018009890 A2 BR112018009890 A2 BR 112018009890A2 BR 112018009890 A BR112018009890 A BR 112018009890A BR 112018009890 A2 BR112018009890 A2 BR 112018009890A2
Authority
BR
Brazil
Prior art keywords
resin composition
silica
encapsulation
semiconductor device
ga2o3
Prior art date
Application number
BR112018009890-6A
Other languages
English (en)
Japanese (ja)
Other versions
BR112018009890B1 (pt
Inventor
Yamashita Katsushi
Takahashi Yui
Original Assignee
Sumitomo Bakelite Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Bakelite Co., Ltd. filed Critical Sumitomo Bakelite Co., Ltd.
Publication of BR112018009890A2 publication Critical patent/BR112018009890A2/pt
Publication of BR112018009890B1 publication Critical patent/BR112018009890B1/pt

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00—Encapsulations, e.g. protective coatings
    • H10W74/40—Encapsulations, e.g. protective coatings characterised by their materials
    • H10W74/47—Encapsulations, e.g. protective coatings characterised by their materials comprising organic materials, e.g. plastics or resins
    • H10W74/473—Encapsulations, e.g. protective coatings characterised by their materials comprising organic materials, e.g. plastics or resins containing a filler
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00—Use of inorganic substances as compounding ingredients
    • C08K3/02—Elements
    • C08K3/08—Metals
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00—Use of inorganic substances as compounding ingredients
    • C08K3/34—Silicon-containing compounds
    • C08K3/36—Silica
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L101/00—Compositions of unspecified macromolecular compounds
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L101/00—Compositions of unspecified macromolecular compounds
    • C08L101/02—Compositions of unspecified macromolecular compounds characterised by the presence of specified groups, e.g. terminal or pendant functional groups
    • C08L101/025—Compositions of unspecified macromolecular compounds characterised by the presence of specified groups, e.g. terminal or pendant functional groups containing nitrogen atoms
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L79/00—Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen with or without oxygen or carbon only, not provided for in groups C08L61/00 - C08L77/00
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L79/00—Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen with or without oxygen or carbon only, not provided for in groups C08L61/00 - C08L77/00
    • C08L79/04—Polycondensates having nitrogen-containing heterocyclic rings in the main chain; Polyhydrazides; Polyamide acids or similar polyimide precursors
    • C08L79/08—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08L79/085—Unsaturated polyimide precursors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00—Encapsulations, e.g. protective coatings
    • H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00—Encapsulations, e.g. protective coatings
    • H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
    • H10W74/111—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00—Encapsulations, e.g. protective coatings
    • H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
    • H10W74/111—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
    • H10W74/114—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by a substrate and the encapsulations
    • H10W74/117—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by a substrate and the encapsulations the substrate having spherical bumps for external connection
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00—Encapsulations, e.g. protective coatings
    • H10W74/40—Encapsulations, e.g. protective coatings characterised by their materials
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00—Use of inorganic substances as compounding ingredients
    • C08K3/02—Elements
    • C08K3/08—Metals
    • C08K2003/0856—Iron
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00—Use of inorganic substances as compounding ingredients
    • C08K3/02—Elements
    • C08K3/08—Metals
    • C08K2003/0862—Nickel
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00—Use of inorganic substances as compounding ingredients
    • C08K3/02—Elements
    • C08K3/08—Metals
    • C08K2003/0881—Titanium
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K2201/00—Specific properties of additives
    • C08K2201/002—Physical properties
    • C08K2201/005—Additives being defined by their particle size in general
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L2203/00—Applications
    • C08L2203/20—Applications use in electrical or conductive gadgets
    • C08L2203/206—Applications use in electrical or conductive gadgets use in coating or encapsulating of electronic parts
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L2205/00—Polymer mixtures characterised by other features
    • C08L2205/02—Polymer mixtures characterised by other features containing two or more polymers of the same C08L -group
    • C08L2205/025—Polymer mixtures characterised by other features containing two or more polymers of the same C08L -group containing two or more polymers of the same hierarchy C08L, and differing only in parameters such as density, comonomer content, molecular weight, structure
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00—Encapsulations, e.g. protective coatings
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00—Package configurations
    • H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/754—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00—Package configurations
    • H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/756—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Compositions Of Macromolecular Compounds (AREA)

Abstract

a composição de resina de vedação é usada para vedar um elemento semicondutor de potência formado de sic, gan, ga2o3, ou diamante, e contém a resina termocurável (a) e sílica (b) em que a sílica (b) contém fe, a quantidade contida de fe é não mais do que 220 ppm com respeito à quantidade total da sílica (b), e a sílica (b) é granular, semelhante a comprimido, ou semelhante à folha.
BR112018009890-6A 2015-12-25 2016-11-28 Composição de resina para encapsulação, e dispositivo semicondutor BR112018009890B1 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2015254082 2015-12-25
JP2015-254082 2015-12-25
PCT/JP2016/085165 WO2017110373A1 (ja) 2015-12-25 2016-11-28 封止用樹脂組成物、および半導体装置

Publications (2)

Publication Number Publication Date
BR112018009890A2 true BR112018009890A2 (pt) 2018-11-13
BR112018009890B1 BR112018009890B1 (pt) 2022-01-18

Family

ID=59089296

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112018009890-6A BR112018009890B1 (pt) 2015-12-25 2016-11-28 Composição de resina para encapsulação, e dispositivo semicondutor

Country Status (9)

Country Link
US (1) US10262914B2 (pt)
EP (1) EP3395907B1 (pt)
JP (1) JP6168259B1 (pt)
KR (1) KR101947334B1 (pt)
CN (1) CN108473777B (pt)
BR (1) BR112018009890B1 (pt)
HU (1) HUE052360T2 (pt)
TW (1) TW201731935A (pt)
WO (1) WO2017110373A1 (pt)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102470719B1 (ko) * 2017-03-13 2022-11-24 린텍 가부시키가이샤 수지 조성물 및 수지 시트
TWI765028B (zh) * 2017-06-30 2022-05-21 日商琳得科股份有限公司 樹脂薄片、層合體及樹脂薄片的製造方法
TWI758489B (zh) * 2017-06-30 2022-03-21 日商琳得科股份有限公司 樹脂組成物及樹脂薄片
JP2019116532A (ja) * 2017-12-26 2019-07-18 京セラ株式会社 封止成形材料用組成物及び電子部品装置
FR3136889B1 (fr) * 2022-06-15 2025-04-25 Safran Matériau diélectrique composite et module de puissance comprenant une couche d’encapsulation formée d’un tel matériau
TWI876956B (zh) * 2024-04-16 2025-03-11 南亞塑膠工業股份有限公司 樹脂組成物

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04175358A (ja) * 1990-11-08 1992-06-23 Mitsubishi Kasei Corp 半導体封止用樹脂組成物
JP2542797B2 (ja) 1994-09-29 1996-10-09 日本化学工業株式会社 高純度シリカの製造方法
JPH11322816A (ja) 1998-03-11 1999-11-26 Hitachi Chem Co Ltd 樹脂ペースト組成物及びこれを用いた半導体装置
EP1090942B1 (en) * 1999-10-06 2004-06-02 Nitto Denko Corporation Resin composition for semiconductor encapsulation, semiconductor device comprising the same and process for the production of semiconductor device using the same
JP4614214B2 (ja) * 1999-12-02 2011-01-19 信越化学工業株式会社 半導体装置素子用中空パッケージ
JP4022640B2 (ja) * 2001-11-20 2007-12-19 東ソー株式会社 塊状高純度シリカ及びその製造方法
JP5330644B2 (ja) * 2006-12-01 2013-10-30 株式会社日本触媒 表面処理されたシリカ粒子
US8235870B2 (en) * 2008-08-15 2012-08-07 Phresh, Llc Method and apparatus for integrating physical exercise and interactive multimedia
KR101453729B1 (ko) * 2009-10-20 2014-10-22 가부시기가이샤 닛뽕쇼꾸바이 비정질 실리카 및 그 제조방법
JP2012089750A (ja) 2010-10-21 2012-05-10 Hitachi Chem Co Ltd 半導体封止充てん用熱硬化性樹脂組成物及び半導体装置
JP5733743B2 (ja) * 2010-12-15 2015-06-10 日東電工株式会社 光半導体装置
JP6251575B2 (ja) * 2013-01-23 2017-12-20 日東電工株式会社 シート状の電子部品封止用熱硬化性樹脂組成物、樹脂封止型半導体装置、及び樹脂封止型半導体装置の製造方法
JP6315368B2 (ja) * 2013-09-11 2018-04-25 パナソニックＩｐマネジメント株式会社 半導体封止用エポキシ樹脂組成物および半導体装置
JP6168153B2 (ja) 2013-09-13 2017-07-26 富士電機株式会社 半導体装置
JP2015101668A (ja) * 2013-11-26 2015-06-04 住友ベークライト株式会社 半導体封止用樹脂組成物および半導体装置
JP6311399B2 (ja) * 2014-03-28 2018-04-18 三菱ケミカル株式会社 熱硬化性樹脂組成物、およびその成形体
WO2016120953A1 (ja) 2015-01-26 2016-08-04 セントラル硝子株式会社 半導体封止用硬化性樹脂組成物およびその硬化物、並びにこれらを用いた半導体装置

Also Published As

Publication number Publication date
EP3395907A4 (en) 2019-08-14
JPWO2017110373A1 (ja) 2017-12-28
US20180337105A1 (en) 2018-11-22
EP3395907A1 (en) 2018-10-31
CN108473777A (zh) 2018-08-31
US10262914B2 (en) 2019-04-16
EP3395907B1 (en) 2020-08-05
WO2017110373A1 (ja) 2017-06-29
TW201731935A (zh) 2017-09-16
JP6168259B1 (ja) 2017-07-26
KR20180075690A (ko) 2018-07-04
HUE052360T2 (hu) 2021-04-28
BR112018009890B1 (pt) 2022-01-18
CN108473777B (zh) 2020-11-17
KR101947334B1 (ko) 2019-02-12

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B09A Decision: intention to grant [chapter 9.1 patent gazette]
B16A Patent or certificate of addition of invention granted [chapter 16.1 patent gazette]

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B21F Lapse acc. art. 78, item iv - on non-payment of the annual fees in time

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Free format text: EM VIRTUDE DA EXTINCAO PUBLICADA NA RPI 2856 DE 30-09-2025 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDA A EXTINCAO DA PATENTE E SEUS CERTIFICADOS, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.