BR112014018083A8 - Método para a fabricação de um transdutor capacitivo micro-usinado, em particular um cmut e transdutor capacitivo micro-usinado, em particular um cmut - Google Patents
Método para a fabricação de um transdutor capacitivo micro-usinado, em particular um cmut e transdutor capacitivo micro-usinado, em particular um cmutInfo
- Publication number
- BR112014018083A8 BR112014018083A8 BR112014018083A BR112014018083A BR112014018083A8 BR 112014018083 A8 BR112014018083 A8 BR 112014018083A8 BR 112014018083 A BR112014018083 A BR 112014018083A BR 112014018083 A BR112014018083 A BR 112014018083A BR 112014018083 A8 BR112014018083 A8 BR 112014018083A8
- Authority
- BR
- Brazil
- Prior art keywords
- cmut
- micro
- capacitive transducer
- machining
- layer
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02N—ELECTRIC MACHINES NOT OTHERWISE PROVIDED FOR
- H02N1/00—Electrostatic generators or motors using a solid moving electrostatic charge carrier
- H02N1/002—Electrostatic motors
- H02N1/006—Electrostatic motors of the gap-closing type
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B06—GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
- B06B—METHODS OR APPARATUS FOR GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS OF INFRASONIC, SONIC, OR ULTRASONIC FREQUENCY, e.g. FOR PERFORMING MECHANICAL WORK IN GENERAL
- B06B1/00—Methods or apparatus for generating mechanical vibrations of infrasonic, sonic, or ultrasonic frequency
- B06B1/02—Methods or apparatus for generating mechanical vibrations of infrasonic, sonic, or ultrasonic frequency making use of electrical energy
- B06B1/0292—Electrostatic transducers, e.g. electret-type
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B06—GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
- B06B—METHODS OR APPARATUS FOR GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS OF INFRASONIC, SONIC, OR ULTRASONIC FREQUENCY, e.g. FOR PERFORMING MECHANICAL WORK IN GENERAL
- B06B1/00—Methods or apparatus for generating mechanical vibrations of infrasonic, sonic, or ultrasonic frequency
- B06B1/02—Methods or apparatus for generating mechanical vibrations of infrasonic, sonic, or ultrasonic frequency making use of electrical energy
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B3/00—Devices comprising flexible or deformable elements, e.g. comprising elastic tongues or membranes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00015—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
- B81C1/00134—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems comprising flexible or deformable structures
- B81C1/00158—Diaphragms, membranes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00349—Creating layers of material on a substrate
- B81C1/00373—Selective deposition, e.g. printing or microcontact printing
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02N—ELECTRIC MACHINES NOT OTHERWISE PROVIDED FOR
- H02N1/00—Electrostatic generators or motors using a solid moving electrostatic charge carrier
- H02N1/06—Influence generators
- H02N1/08—Influence generators with conductive charge carrier, i.e. capacitor machines
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2203/00—Basic microelectromechanical structures
- B81B2203/01—Suspended structures, i.e. structures allowing a movement
- B81B2203/0127—Diaphragms, i.e. structures separating two media that can control the passage from one medium to another; Membranes, i.e. diaphragms with filtering function
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Mechanical Engineering (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Transducers For Ultrasonic Waves (AREA)
- Pressure Sensors (AREA)
- Electrostatic, Electromagnetic, Magneto- Strictive, And Variable-Resistance Transducers (AREA)
- Micromachines (AREA)
Abstract
MÉTODO PARA A FABRICAÇÃO DE UM TRANSDUTOR CAPACITIVO MICRO-USINADO, EM PARTICULAR UM CMUT E TRANSDUTOR CAPACITIVO MICRO-USINADO, EM PARTICULAR UM CMUT. A presente invenção se refere a um método para a fabricação de um transdutor capacitivo micro-usinado (100), em particular um CMUT, o método compreendendo depositar uma primeira camada de eletrodo (10) em um substrato (1), depositar um primeiro filme dielétrico (20) na primeira camada de eletrodo (10), depositar uma camada de sacrifício (30) no primeiro filme dielétrico (20), a camada de sacrifício (30) sendo removível para a formação de uma cavidade (35) do transdutor, depositar um segundo filme dielétrico (40) na camada de sacrifício (30), e depositar uma segunda camada de eletrodo (50) no segundo filme dielétrico (40), em que o primeiro filme dielétrico (20) e/ou o segundo filme dielétrico (40) compreendem uma primeira camada compreendendo um óxido, uma segunda camada compreendendo um material com alto k, e uma terceira camada compreendendo um óxido, e em que as etapas de depósito são feitas por Deposição de Camada Atômica. A presente invenção ainda se refere a um transdutor capacitivo micro-usinado (100), em particular um CMUT, fabricado por esse método.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201261591344P | 2012-01-27 | 2012-01-27 | |
PCT/IB2013/050481 WO2013111040A1 (en) | 2012-01-27 | 2013-01-18 | Capacitive micro-machined transducer and method of manufacturing the same |
Publications (2)
Publication Number | Publication Date |
---|---|
BR112014018083A2 BR112014018083A2 (pt) | 2017-06-20 |
BR112014018083A8 true BR112014018083A8 (pt) | 2017-07-11 |
Family
ID=47780106
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BR112014018083A BR112014018083A8 (pt) | 2012-01-27 | 2013-01-18 | Método para a fabricação de um transdutor capacitivo micro-usinado, em particular um cmut e transdutor capacitivo micro-usinado, em particular um cmut |
Country Status (8)
Country | Link |
---|---|
US (2) | US9231496B2 (pt) |
EP (1) | EP2806982B1 (pt) |
JP (1) | JP6209537B2 (pt) |
CN (1) | CN104066521B (pt) |
BR (1) | BR112014018083A8 (pt) |
MX (1) | MX2014008859A (pt) |
RU (1) | RU2618731C2 (pt) |
WO (1) | WO2013111040A1 (pt) |
Families Citing this family (10)
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RU2607720C2 (ru) | 2011-12-20 | 2017-01-10 | Конинклейке Филипс Н.В. | Устройство ультразвукового преобразователя и способ его изготовления |
JP6209537B2 (ja) * | 2012-01-27 | 2017-10-04 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | 容量性マイクロマシン・トランスデューサ及びこれを製造する方法 |
JP6416232B2 (ja) * | 2013-09-24 | 2018-10-31 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | Cmutデバイス製造方法、cmutデバイス、及び装置 |
JP6381195B2 (ja) | 2013-10-22 | 2018-08-29 | キヤノン株式会社 | 静電容量型トランスデューサ及びその作製方法 |
JP6932085B2 (ja) | 2015-07-02 | 2021-09-08 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | マルチモード容量性マイクロマシン超音波トランスデューサ並びに関連するデバイス、システム及び方法 |
CN107799386B (zh) | 2016-09-06 | 2020-04-28 | 中芯国际集成电路制造(北京)有限公司 | 半导体装置及其制造方法 |
CN107092880B (zh) * | 2017-04-14 | 2023-06-20 | 杭州士兰微电子股份有限公司 | 超声波指纹传感器及其制造方法 |
US20220274134A1 (en) * | 2019-08-30 | 2022-09-01 | Vermon Sa | Cmut transducer |
US11988640B2 (en) * | 2020-03-11 | 2024-05-21 | Bfly Operations, Inc. | Bottom electrode material stack for micromachined ultrasonic transducer devices |
CN113873404A (zh) * | 2021-09-29 | 2021-12-31 | 瑞声声学科技(深圳)有限公司 | 一种振膜及其制备方法、mems麦克风 |
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US6831394B2 (en) * | 2002-12-11 | 2004-12-14 | General Electric Company | Backing material for micromachined ultrasonic transducer devices |
US6885056B1 (en) | 2003-10-22 | 2005-04-26 | Newport Fab, Llc | High-k dielectric stack in a MIM capacitor and method for its fabrication |
KR100577562B1 (ko) * | 2004-02-05 | 2006-05-08 | 삼성전자주식회사 | 핀 트랜지스터 형성방법 및 그에 따른 구조 |
JP4347885B2 (ja) * | 2004-06-03 | 2009-10-21 | オリンパス株式会社 | 静電容量型超音波振動子の製造方法、当該製造方法によって製造された静電容量型超音波振動子を備えた超音波内視鏡装置、静電容量型超音波プローブおよび静電容量型超音波振動子 |
JP4746291B2 (ja) * | 2004-08-05 | 2011-08-10 | オリンパス株式会社 | 静電容量型超音波振動子、及びその製造方法 |
US7172947B2 (en) * | 2004-08-31 | 2007-02-06 | Micron Technology, Inc | High dielectric constant transition metal oxide materials |
JP4371092B2 (ja) | 2004-12-14 | 2009-11-25 | セイコーエプソン株式会社 | 静電アクチュエータ、液滴吐出ヘッド及びその製造方法、液滴吐出装置並びにデバイス |
US7037746B1 (en) * | 2004-12-27 | 2006-05-02 | General Electric Company | Capacitive micromachined ultrasound transducer fabricated with epitaxial silicon membrane |
ITRM20050093A1 (it) | 2005-03-04 | 2006-09-05 | Consiglio Nazionale Ricerche | Procedimento micromeccanico superficiale di fabbricazione di trasduttori ultracustici capacitivi microlavorati e relativo trasduttore ultracustico capacitivo microlavorato. |
JP4724505B2 (ja) * | 2005-09-09 | 2011-07-13 | 株式会社日立製作所 | 超音波探触子およびその製造方法 |
US7902018B2 (en) * | 2006-09-26 | 2011-03-08 | Applied Materials, Inc. | Fluorine plasma treatment of high-k gate stack for defect passivation |
US8736000B1 (en) * | 2006-10-19 | 2014-05-27 | Sandia Corporation | Capacitive chemical sensor |
JP4961260B2 (ja) * | 2007-05-16 | 2012-06-27 | 株式会社日立製作所 | 半導体装置 |
US8203912B2 (en) * | 2007-07-31 | 2012-06-19 | Koninklijke Philips Electronics N.V. | CMUTs with a high-k dielectric |
CN101969856B (zh) * | 2007-09-17 | 2013-06-05 | 皇家飞利浦电子股份有限公司 | 预塌陷的电容微机械超声传感器的制造及其应用 |
JP5408937B2 (ja) * | 2007-09-25 | 2014-02-05 | キヤノン株式会社 | 電気機械変換素子及びその製造方法 |
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WO2009077961A2 (en) * | 2007-12-14 | 2009-06-25 | Koninklijke Philips Electronics, N.V. | Collapsed mode operable cmut including contoured substrate |
JP5305993B2 (ja) * | 2008-05-02 | 2013-10-02 | キヤノン株式会社 | 容量型機械電気変換素子の製造方法、及び容量型機械電気変換素子 |
CN102159334A (zh) * | 2008-09-16 | 2011-08-17 | 皇家飞利浦电子股份有限公司 | 电容性微机械加工的超声换能器 |
FR2939003B1 (fr) * | 2008-11-21 | 2011-02-25 | Commissariat Energie Atomique | Cellule cmut formee d'une membrane de nano-tubes ou de nano-fils ou de nano-poutres et dispositif d'imagerie acoustique ultra haute frequence comprenant une pluralite de telles cellules |
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US9368603B2 (en) * | 2011-09-15 | 2016-06-14 | Taiwan Semiconductor Manufacturing Company, Ltd. | Contact for high-k metal gate device |
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US8846468B2 (en) * | 2012-12-17 | 2014-09-30 | Intermolecular, Inc. | Methods to improve leakage of high K materials |
-
2013
- 2013-01-18 JP JP2014553833A patent/JP6209537B2/ja active Active
- 2013-01-18 BR BR112014018083A patent/BR112014018083A8/pt not_active IP Right Cessation
- 2013-01-18 RU RU2014134810A patent/RU2618731C2/ru not_active IP Right Cessation
- 2013-01-18 EP EP13707213.8A patent/EP2806982B1/en active Active
- 2013-01-18 CN CN201380006576.2A patent/CN104066521B/zh active Active
- 2013-01-18 WO PCT/IB2013/050481 patent/WO2013111040A1/en active Application Filing
- 2013-01-18 MX MX2014008859A patent/MX2014008859A/es unknown
- 2013-01-18 US US14/369,341 patent/US9231496B2/en active Active
-
2015
- 2015-02-18 US US14/624,945 patent/US10008958B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
JP6209537B2 (ja) | 2017-10-04 |
EP2806982B1 (en) | 2020-03-11 |
EP2806982A1 (en) | 2014-12-03 |
CN104066521A (zh) | 2014-09-24 |
US20150162852A1 (en) | 2015-06-11 |
CN104066521B (zh) | 2017-07-11 |
US20140375168A1 (en) | 2014-12-25 |
RU2618731C2 (ru) | 2017-05-11 |
JP2015508625A (ja) | 2015-03-19 |
US10008958B2 (en) | 2018-06-26 |
US9231496B2 (en) | 2016-01-05 |
WO2013111040A1 (en) | 2013-08-01 |
BR112014018083A2 (pt) | 2017-06-20 |
RU2014134810A (ru) | 2016-03-20 |
MX2014008859A (es) | 2014-10-06 |
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Legal Events
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B06F | Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette] | ||
B08F | Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette] |
Free format text: REFERENTE A 7A ANUIDADE. |
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B08K | Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette] |
Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2549 DE 12-11-2019 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013. |