BR112014007577A2 - sistema de calibração de inspeção de manta e métodos relacionados - Google Patents

sistema de calibração de inspeção de manta e métodos relacionados

Info

Publication number
BR112014007577A2
BR112014007577A2 BR112014007577A BR112014007577A BR112014007577A2 BR 112014007577 A2 BR112014007577 A2 BR 112014007577A2 BR 112014007577 A BR112014007577 A BR 112014007577A BR 112014007577 A BR112014007577 A BR 112014007577A BR 112014007577 A2 BR112014007577 A2 BR 112014007577A2
Authority
BR
Brazil
Prior art keywords
related methods
calibration system
inspection calibration
blanket
blanket inspection
Prior art date
Application number
BR112014007577A
Other languages
English (en)
Inventor
W Wilhelm Justin
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Publication of BR112014007577A2 publication Critical patent/BR112014007577A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/93—Detection standards; Calibrating baseline adjustment, drift correction
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2557/00—Means for control not provided for in groups B65H2551/00 - B65H2555/00
    • B65H2557/60—Details of processes or procedures
    • B65H2557/61—Details of processes or procedures for calibrating

Landscapes

  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

resumo “sistema de calibração de inspeção de manta e métodos relacionados” a presente invenção refere-se a sistemas e métodos para calibrar um sistema de inspeção da manta usando dados de um sensor de ponto calibrado, com o uso de análise à base de espectros de frequência. 1 / 1
BR112014007577A 2011-09-30 2012-09-26 sistema de calibração de inspeção de manta e métodos relacionados BR112014007577A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/249,468 US8553228B2 (en) 2011-09-30 2011-09-30 Web inspection calibration system and related methods
PCT/US2012/057167 WO2013049090A1 (en) 2011-09-30 2012-09-26 Web inspection calibration system and related methods

Publications (1)

Publication Number Publication Date
BR112014007577A2 true BR112014007577A2 (pt) 2017-04-11

Family

ID=47143263

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112014007577A BR112014007577A2 (pt) 2011-09-30 2012-09-26 sistema de calibração de inspeção de manta e métodos relacionados

Country Status (8)

Country Link
US (1) US8553228B2 (pt)
EP (1) EP2761270A1 (pt)
JP (1) JP6122015B2 (pt)
KR (1) KR20140067162A (pt)
CN (1) CN103842800B (pt)
BR (1) BR112014007577A2 (pt)
SG (1) SG11201401016YA (pt)
WO (1) WO2013049090A1 (pt)

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US20160072579A1 (en) * 2013-05-01 2016-03-10 The University Of Sydney A system and a method for generating information indicative of an impairment of an optical signal
DE102013108485B4 (de) * 2013-08-06 2015-06-25 Khs Gmbh Vorrichtung und Verfahren zum Fehlertracking bei Bandmaterialien
US9910429B2 (en) * 2013-09-03 2018-03-06 The Procter & Gamble Company Systems and methods for adjusting target manufacturing parameters on an absorbent product converting line
CN105683704B (zh) 2013-10-31 2019-03-01 3M创新有限公司 材料的多尺度均匀度分析
US9151595B1 (en) * 2014-04-18 2015-10-06 Advanced Gauging Technologies, LLC Laser thickness gauge and method including passline angle correction
CN105329694B (zh) * 2014-07-22 2017-10-03 宁波弘讯科技股份有限公司 一种纠偏控制方法、控制器及纠偏控制系统
DE102015011013B4 (de) 2014-08-22 2023-05-04 Sigma Additive Solutions, Inc. Verfahren zur Überwachung von generativen Fertigungsprozessen
TWI559423B (zh) * 2014-11-04 2016-11-21 梭特科技股份有限公司 晶粒攝影裝置
US10786948B2 (en) 2014-11-18 2020-09-29 Sigma Labs, Inc. Multi-sensor quality inference and control for additive manufacturing processes
EP3245045A4 (en) 2015-01-13 2018-10-31 Sigma Labs, Inc. Material qualification system and methodology
JP6475543B2 (ja) * 2015-03-31 2019-02-27 株式会社デンソー 車両制御装置、及び車両制御方法
US10207489B2 (en) 2015-09-30 2019-02-19 Sigma Labs, Inc. Systems and methods for additive manufacturing operations
US10067069B2 (en) * 2016-03-11 2018-09-04 Smart Vision Lights Machine vision systems incorporating polarized electromagnetic radiation emitters
EP3339845A3 (en) * 2016-11-30 2018-09-12 Sumitomo Chemical Company, Ltd Defect inspection device, defect inspection method, method for producing separator roll, and separator roll
JP6575824B2 (ja) * 2017-03-22 2019-09-18 トヨタ自動車株式会社 膜厚測定方法および膜厚測定装置
CN110944913B (zh) * 2017-08-04 2021-07-20 利乐拉瓦尔集团及财务有限公司 将密封条带施加到包装材料卷材上的方法和设备
US10670745B1 (en) 2017-09-19 2020-06-02 The Government of the United States as Represented by the Secretary of the United States Statistical photo-calibration of photo-detectors for radiometry without calibrated light sources comprising an arithmetic unit to determine a gain and a bias from mean values and variance values
FR3074295B1 (fr) * 2017-11-30 2019-11-15 Saint-Gobain Glass France Procede de detection de defauts de laminage dans un verre imprime
TWI794400B (zh) * 2018-01-31 2023-03-01 美商3M新設資產公司 用於連續移動帶材的紅外光透射檢查
CN109060806B (zh) * 2018-08-29 2019-09-13 陈青 箱子底端材料类型辨识机构
WO2020219076A1 (en) * 2019-04-26 2020-10-29 Hewlett-Packard Development Company, L.P. Evaluating surfaces
CN111993798B (zh) * 2020-08-12 2022-04-12 福建实达电脑设备有限公司 一种页缝传感器的自动校正方法
CN112800907B (zh) * 2021-01-19 2024-06-07 广州华望半导体科技有限公司 鼻梁条用料情况检测方法、系统、装置和存储介质

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US4247204A (en) * 1979-02-26 1981-01-27 Intec Corporation Method and apparatus for a web edge tracking flaw detection system
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JP2004003925A (ja) * 2002-03-29 2004-01-08 Mitsubishi Paper Mills Ltd 同時多点測定装置及び制御装置
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Also Published As

Publication number Publication date
CN103842800B (zh) 2016-04-20
WO2013049090A1 (en) 2013-04-04
EP2761270A1 (en) 2014-08-06
US8553228B2 (en) 2013-10-08
SG11201401016YA (en) 2014-04-28
US20130083324A1 (en) 2013-04-04
KR20140067162A (ko) 2014-06-03
CN103842800A (zh) 2014-06-04
JP6122015B2 (ja) 2017-04-26
JP2014528579A (ja) 2014-10-27

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Legal Events

Date Code Title Description
B06F Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette]
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE A 7A ANUIDADE.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2533 DE 23-07-2019 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.