SG11201401016YA - Web inspection calibration system and related methods - Google Patents

Web inspection calibration system and related methods

Info

Publication number
SG11201401016YA
SG11201401016YA SG11201401016YA SG11201401016YA SG11201401016YA SG 11201401016Y A SG11201401016Y A SG 11201401016YA SG 11201401016Y A SG11201401016Y A SG 11201401016YA SG 11201401016Y A SG11201401016Y A SG 11201401016YA SG 11201401016Y A SG11201401016Y A SG 11201401016YA
Authority
SG
Singapore
Prior art keywords
related methods
calibration system
web inspection
inspection calibration
web
Prior art date
Application number
SG11201401016YA
Inventor
Justin W Wilhelm
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Publication of SG11201401016YA publication Critical patent/SG11201401016YA/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274Calibration, base line adjustment, drift correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/93Detection standards; Calibrating baseline adjustment, drift correction
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65HHANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2557/00Means for control not provided for in groups B65H2551/00 - B65H2555/00
    • B65H2557/60Details of processes or procedures
    • B65H2557/61Details of processes or procedures for calibrating

Landscapes

  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
SG11201401016YA 2011-09-30 2012-09-26 Web inspection calibration system and related methods SG11201401016YA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/249,468 US8553228B2 (en) 2011-09-30 2011-09-30 Web inspection calibration system and related methods
PCT/US2012/057167 WO2013049090A1 (en) 2011-09-30 2012-09-26 Web inspection calibration system and related methods

Publications (1)

Publication Number Publication Date
SG11201401016YA true SG11201401016YA (en) 2014-04-28

Family

ID=47143263

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201401016YA SG11201401016YA (en) 2011-09-30 2012-09-26 Web inspection calibration system and related methods

Country Status (8)

Country Link
US (1) US8553228B2 (en)
EP (1) EP2761270A1 (en)
JP (1) JP6122015B2 (en)
KR (1) KR20140067162A (en)
CN (1) CN103842800B (en)
BR (1) BR112014007577A2 (en)
SG (1) SG11201401016YA (en)
WO (1) WO2013049090A1 (en)

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EP2186624B1 (en) * 2008-11-18 2015-08-26 Tetra Laval Holdings & Finance S.A. Apparatus and method for detecting the position of application of a sealing strip onto a web of packaging material for food products
US20160072579A1 (en) * 2013-05-01 2016-03-10 The University Of Sydney A system and a method for generating information indicative of an impairment of an optical signal
DE102013108485B4 (en) * 2013-08-06 2015-06-25 Khs Gmbh Device and method for error tracking in strip materials
US9910429B2 (en) * 2013-09-03 2018-03-06 The Procter & Gamble Company Systems and methods for adjusting target manufacturing parameters on an absorbent product converting line
US9841383B2 (en) 2013-10-31 2017-12-12 3M Innovative Properties Company Multiscale uniformity analysis of a material
US9151595B1 (en) * 2014-04-18 2015-10-06 Advanced Gauging Technologies, LLC Laser thickness gauge and method including passline angle correction
CN105329694B (en) * 2014-07-22 2017-10-03 宁波弘讯科技股份有限公司 One kind correction control method, controller and deviation correction control system
US9999924B2 (en) 2014-08-22 2018-06-19 Sigma Labs, Inc. Method and system for monitoring additive manufacturing processes
TWI559423B (en) * 2014-11-04 2016-11-21 梭特科技股份有限公司 Die image capture device
US10786948B2 (en) 2014-11-18 2020-09-29 Sigma Labs, Inc. Multi-sensor quality inference and control for additive manufacturing processes
CN107428081B (en) 2015-01-13 2020-07-07 西格马实验室公司 Material identification system and method
JP6475543B2 (en) * 2015-03-31 2019-02-27 株式会社デンソー Vehicle control apparatus and vehicle control method
US10207489B2 (en) * 2015-09-30 2019-02-19 Sigma Labs, Inc. Systems and methods for additive manufacturing operations
US10067069B2 (en) * 2016-03-11 2018-09-04 Smart Vision Lights Machine vision systems incorporating polarized electromagnetic radiation emitters
EP3339845A3 (en) * 2016-11-30 2018-09-12 Sumitomo Chemical Company, Ltd Defect inspection device, defect inspection method, method for producing separator roll, and separator roll
JP6575824B2 (en) * 2017-03-22 2019-09-18 トヨタ自動車株式会社 Film thickness measuring method and film thickness measuring apparatus
JP7262441B2 (en) * 2017-08-04 2023-04-21 テトラ ラバル ホールディングス アンド ファイナンス エス エイ Method and apparatus for applying a sealing strip to a web of packaging material
US10670745B1 (en) 2017-09-19 2020-06-02 The Government of the United States as Represented by the Secretary of the United States Statistical photo-calibration of photo-detectors for radiometry without calibrated light sources comprising an arithmetic unit to determine a gain and a bias from mean values and variance values
FR3074295B1 (en) * 2017-11-30 2019-11-15 Saint-Gobain Glass France METHOD FOR DETECTING ROLL DEFECTS IN PRINTED GLASS
TWI794400B (en) * 2018-01-31 2023-03-01 美商3M新設資產公司 Infrared light transmission inspection for continuous moving web
CN109060806B (en) * 2018-08-29 2019-09-13 陈青 Chest bottom end material type recognition mechanism
WO2020219076A1 (en) * 2019-04-26 2020-10-29 Hewlett-Packard Development Company, L.P. Evaluating surfaces
CN111993798B (en) * 2020-08-12 2022-04-12 福建实达电脑设备有限公司 Automatic correction method of page gap sensor
CN112800907B (en) * 2021-01-19 2024-06-07 广州华望半导体科技有限公司 Nose bridge strip material condition detection method, system, device and storage medium
CN117279849A (en) * 2021-05-06 2023-12-22 应用材料公司 Cross web tension measurement and control
CN114862843A (en) * 2022-06-06 2022-08-05 东北大学 Metal strip surface defect rapid detection method based on filter fusion

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US4247204A (en) * 1979-02-26 1981-01-27 Intec Corporation Method and apparatus for a web edge tracking flaw detection system
US4570074A (en) * 1982-09-29 1986-02-11 Q-Val Incorporated Flying spot scanner system
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JP2004309215A (en) 2003-04-03 2004-11-04 Mitsubishi Rayon Co Ltd Film thickness measuring device and film thickness measuring method
TWI427440B (en) * 2005-04-06 2014-02-21 Kodak Graphic Comm Canada Co Methods and apparatus for correcting banding of imaged regular patterns
RU2457513C2 (en) * 2007-07-06 2012-07-27 Шлюмбергер Текнолоджи Б.В. Methods and systems for processing microseismic data
US7773226B2 (en) * 2008-06-05 2010-08-10 3M Innovative Properties Company Web inspection calibration system and related methods
US8187424B2 (en) * 2008-08-01 2012-05-29 Honeywell Asca Inc. Time domain spectroscopy (TDS)-based method and system for obtaining coincident sheet material parameters
US20110141269A1 (en) * 2009-12-16 2011-06-16 Stephen Michael Varga Systems And Methods For Monitoring On-Line Webs Using Line Scan Cameras
US8270701B2 (en) * 2010-01-08 2012-09-18 3M Innovative Properties Company Optical web-based defect detection using intrasensor uniformity correction

Also Published As

Publication number Publication date
BR112014007577A2 (en) 2017-04-11
CN103842800B (en) 2016-04-20
EP2761270A1 (en) 2014-08-06
KR20140067162A (en) 2014-06-03
US20130083324A1 (en) 2013-04-04
JP2014528579A (en) 2014-10-27
US8553228B2 (en) 2013-10-08
CN103842800A (en) 2014-06-04
WO2013049090A1 (en) 2013-04-04
JP6122015B2 (en) 2017-04-26

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