EP2784486A4 - Measurement device and measurement method - Google Patents

Measurement device and measurement method

Info

Publication number
EP2784486A4
EP2784486A4 EP12851172.2A EP12851172A EP2784486A4 EP 2784486 A4 EP2784486 A4 EP 2784486A4 EP 12851172 A EP12851172 A EP 12851172A EP 2784486 A4 EP2784486 A4 EP 2784486A4
Authority
EP
European Patent Office
Prior art keywords
measurement
measurement device
measurement method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
EP12851172.2A
Other languages
German (de)
French (fr)
Other versions
EP2784486A1 (en
Inventor
Toshiaki Iwai
Toshiharu Watarai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo University of Agriculture and Technology NUC
University of Tokyo NUC
Original Assignee
Tokyo University of Agriculture and Technology NUC
University of Tokyo NUC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo University of Agriculture and Technology NUC, University of Tokyo NUC filed Critical Tokyo University of Agriculture and Technology NUC
Publication of EP2784486A1 publication Critical patent/EP2784486A1/en
Publication of EP2784486A4 publication Critical patent/EP2784486A4/en
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Electro-optical investigation, e.g. flow cytometers
    • G01N15/1429—Electro-optical investigation, e.g. flow cytometers using an analyser being characterised by its signal processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02041—Interferometers characterised by particular imaging or detection techniques
    • G01B9/02044—Imaging in the frequency domain, e.g. by using a spectrometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
    • G01J3/4412—Scattering spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
    • G01J3/4412—Scattering spectrometry
    • G01J2003/4418—Power spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G01N2015/0222—Investigating a scatter or diffraction pattern from dynamic light scattering, e.g. photon correlation spectroscopy
EP12851172.2A 2011-11-24 2012-10-24 Measurement device and measurement method Ceased EP2784486A4 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2011255782 2011-11-24
JP2012181474 2012-08-20
PCT/JP2012/077469 WO2013077137A1 (en) 2011-11-24 2012-10-24 Measurement device and measurement method

Publications (2)

Publication Number Publication Date
EP2784486A1 EP2784486A1 (en) 2014-10-01
EP2784486A4 true EP2784486A4 (en) 2015-07-08

Family

ID=48469587

Family Applications (1)

Application Number Title Priority Date Filing Date
EP12851172.2A Ceased EP2784486A4 (en) 2011-11-24 2012-10-24 Measurement device and measurement method

Country Status (4)

Country Link
US (1) US20140336990A1 (en)
EP (1) EP2784486A4 (en)
JP (1) JP5946193B2 (en)
WO (1) WO2013077137A1 (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5754067B2 (en) * 2012-11-06 2015-07-22 パルステック工業株式会社 Dynamic light scattering measuring apparatus and dynamic light scattering measuring method
JP6348349B2 (en) * 2014-06-20 2018-06-27 大塚電子株式会社 Dynamic light scattering measuring apparatus and dynamic light scattering measuring method
EP3317728B1 (en) * 2015-06-30 2019-10-30 IMEC vzw Holographic device and object sorting system
US11137519B2 (en) * 2016-07-21 2021-10-05 Rosemount Aerospace Inc. Multi-fiber optical sensor for icing
CN106248532A (en) * 2016-07-22 2016-12-21 浙江大学 The optical detecting method of particle shape and system
CN106680159B (en) * 2017-01-13 2023-05-23 浙江大学 Particle rapid detection method and system based on dynamic light scattering sample ensemble analysis
JP7071849B2 (en) * 2018-03-09 2022-05-19 リオン株式会社 Particle counter
CN112229822B (en) * 2020-08-25 2022-05-13 西安电子科技大学 Reflection type single-frame scattering imaging device and method for multiple targets in flowing liquid

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003106979A (en) * 2001-09-27 2003-04-09 Otsuka Denshi Co Ltd Dynamic light scattering measuring device using low coherence interferometry
US6738144B1 (en) * 1999-12-17 2004-05-18 University Of Central Florida Non-invasive method and low-coherence apparatus system analysis and process control
GB2407379A (en) * 2003-10-20 2005-04-27 Otsuka Denshi Kk Measuring dynamic light scattering of particles by using a phase modulation interferometric method
US20090079993A1 (en) * 2005-11-22 2009-03-26 Shofu Inc. Dental Optical Coherence Tomograph

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6831781B2 (en) * 1998-02-26 2004-12-14 The General Hospital Corporation Confocal microscopy with multi-spectral encoding and system and apparatus for spectroscopically encoded confocal microscopy
JP2003065930A (en) * 2001-08-28 2003-03-05 Japan Science & Technology Corp Method and apparatus for measuring local viscoelasticity in complex fluid
US7355716B2 (en) * 2002-01-24 2008-04-08 The General Hospital Corporation Apparatus and method for ranging and noise reduction of low coherence interferometry LCI and optical coherence tomography OCT signals by parallel detection of spectral bands
JP4513982B2 (en) * 2006-01-24 2010-07-28 株式会社島津製作所 Viscosity measuring device using particles
US7602501B2 (en) * 2006-07-10 2009-10-13 The Board Of Trustees Of The University Of Illinois Interferometric synthetic aperture microscopy

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6738144B1 (en) * 1999-12-17 2004-05-18 University Of Central Florida Non-invasive method and low-coherence apparatus system analysis and process control
JP2003106979A (en) * 2001-09-27 2003-04-09 Otsuka Denshi Co Ltd Dynamic light scattering measuring device using low coherence interferometry
GB2407379A (en) * 2003-10-20 2005-04-27 Otsuka Denshi Kk Measuring dynamic light scattering of particles by using a phase modulation interferometric method
US20090079993A1 (en) * 2005-11-22 2009-03-26 Shofu Inc. Dental Optical Coherence Tomograph

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2013077137A1 *

Also Published As

Publication number Publication date
US20140336990A1 (en) 2014-11-13
WO2013077137A1 (en) 2013-05-30
EP2784486A1 (en) 2014-10-01
JP5946193B2 (en) 2016-07-05
JPWO2013077137A1 (en) 2015-04-27

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Inventor name: WATARAI, TOSHIHARU

Inventor name: IWAI, TOSHIAKI

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Effective date: 20150610

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