BR0303222A - Método e sistema para inspecionar dispositivos óticos - Google Patents

Método e sistema para inspecionar dispositivos óticos

Info

Publication number
BR0303222A
BR0303222A BR0303222-1A BR0303222A BR0303222A BR 0303222 A BR0303222 A BR 0303222A BR 0303222 A BR0303222 A BR 0303222A BR 0303222 A BR0303222 A BR 0303222A
Authority
BR
Brazil
Prior art keywords
wavelength band
light
transmitted
optical device
background
Prior art date
Application number
BR0303222-1A
Other languages
English (en)
Other versions
BRPI0303222B1 (pt
Inventor
Anthony J Dispenza
Michael F Widman
Kevin H Gilles
James Ebel
Original Assignee
Johnson & Johnson Vision Care
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Johnson & Johnson Vision Care filed Critical Johnson & Johnson Vision Care
Publication of BR0303222A publication Critical patent/BR0303222A/pt
Publication of BRPI0303222B1 publication Critical patent/BRPI0303222B1/pt

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0242Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0278Detecting defects of the object to be tested, e.g. scratches or dust
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0207Details of measuring devices
    • G01M11/0214Details of devices holding the object to be tested

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

"MéTODO E SISTEMA PARA INSPECIONAR DISPOSITIVOS óTICOS". Um método para inspecionar dispositivos óticos que compreende (a) iluminar o dispositivo ótico e um fundo circundante com luz, em que a dita luz compreende uma primeira banda de comprimento de onda e uma segunda banda de comprimento de onda, em que a dita primeira banda de comprimento de onda e a dita segunda banda de comprimento de onda são comprimentos de onda diferentes, e em que a dita primeira banda de comprimento de onda tem uma primeira intensidade e a dita segunda banda de comprimento de onda tem uma segunda intensidade; (b) transmitir a dita luz através do dito dispositivo ótico em que a maior parte da dita primeira banda de comprimento de onda é absorvida pelo dito dispositivo ótico e a maior parte da segunda banda de comprimento de onda é transmitida através do dito dispositivo ótico, e capturar a dita luz transmitida da lente sobre uma rede de pixels fotossensível; (c) transmitir a dita luz através do dito fundo circundante em que a maior parte da dita primeira banda de comprimento de onda e da dita segunda banda de comprimento de onda são transmitidas, e capturar a dita luz transmitida do fundo sobre uma rede de pixels fotossensível; (d) ler os pixels gerados da etapa (b) e da etapa (c) e comparar os valores de escala de cinza da dita leitura, em que a diferença entre os valores de escala de cinza dos pixels gerados da dita luz transmitida do fundo e da dita luz transmitida da lente é de um valor suficiente para distinguir entre os furos do dito dispositivo ótico e as bolhas no dito fundo circundante.
BRPI0303222A 2002-02-21 2003-02-21 método e aparelho para inspecionar dispositivos óticos BRPI0303222B1 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US35907402P 2002-02-21 2002-02-21
PCT/US2003/005356 WO2003073061A2 (en) 2002-02-21 2003-02-21 Method and system for inspecting optical devices

Publications (2)

Publication Number Publication Date
BR0303222A true BR0303222A (pt) 2004-12-21
BRPI0303222B1 BRPI0303222B1 (pt) 2017-03-28

Family

ID=27766039

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0303222A BRPI0303222B1 (pt) 2002-02-21 2003-02-21 método e aparelho para inspecionar dispositivos óticos

Country Status (13)

Country Link
US (1) US6882411B2 (pt)
EP (1) EP1476738B1 (pt)
JP (1) JP2005518537A (pt)
KR (1) KR100972945B1 (pt)
CN (3) CN101793595B (pt)
AU (2) AU2003225591B2 (pt)
BR (1) BRPI0303222B1 (pt)
CA (1) CA2444517C (pt)
DE (1) DE60323207D1 (pt)
HK (2) HK1066857A1 (pt)
SG (1) SG135070A1 (pt)
TW (1) TWI294031B (pt)
WO (1) WO2003073061A2 (pt)

Families Citing this family (28)

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Publication number Priority date Publication date Assignee Title
EP1816467A3 (en) * 2000-05-01 2009-11-18 Fujifilm Corporation Lens inspection device
WO2006039192A1 (en) * 2004-09-29 2006-04-13 Telco Testing Solutions, Llc Apparatus and method for detection of contaminant particles or component defects
US20060244954A1 (en) * 2005-03-29 2006-11-02 Daley Wayne D System and method for inspecting packaging quality of a packaged food product
US20060232766A1 (en) * 2005-03-31 2006-10-19 Watterson Robert J Jr Methods of inspecting ophthalmic lenses
CN101512323B (zh) 2006-09-08 2012-08-22 大日本印刷株式会社 污染性评价方法、污染性评价装置、光学部件的检查方法、光学叠层体以及显示器产品
US8107696B2 (en) * 2006-10-02 2012-01-31 Johnson & Johnson Consumer Companies, Inc. Calibration apparatus and method for fluorescent imaging
US8122878B1 (en) * 2006-10-20 2012-02-28 Energy Innovations, Inc. Solar concentrator with camera alignment and tracking
SG173233A1 (en) * 2010-01-28 2011-08-29 Visionxtreme Pte Ltd Inspection of defects in a contact lens
US8358830B2 (en) * 2010-03-26 2013-01-22 The Boeing Company Method for detecting optical defects in transparencies
US8736828B2 (en) * 2011-02-23 2014-05-27 Visionxtreme Pte Ltd Method and apparatus for inspecting ophthalmic lens
US20140028833A1 (en) * 2011-04-18 2014-01-30 Ismeca Semiconductor Holding Sa Inspection device
JP5960252B2 (ja) * 2011-06-03 2016-08-02 ジョンソン・アンド・ジョンソン・ビジョン・ケア・インコーポレイテッドJohnson & Johnson Vision Care, Inc. 眼科用レンズの複数放射検査
US8634068B2 (en) 2011-06-16 2014-01-21 Johnson & Johnson Vision Care, Inc. Method of determining the optimal wavelength for inspecting ophthalmic lenses
US20120320374A1 (en) 2011-06-17 2012-12-20 Sites Peter W Method of imaging and inspecting the edge of an ophthalmic lens
CN103162940B (zh) * 2013-02-22 2016-01-06 宁波舜宇光电信息有限公司 一种手机摄像模组自动测试机
WO2015053712A1 (en) * 2013-10-08 2015-04-16 Emage Vision Pte. Ltd. System and method for inspection of wet ophthalmic lens
WO2015134449A1 (en) * 2014-03-05 2015-09-11 Novartis Ag Method for automatic inspection of contact lenses
US10788393B2 (en) 2014-05-15 2020-09-29 Emage Vision Pte. Ltd System and method for inspecting opthalmic lenses
EP3062130B1 (de) * 2015-02-26 2022-03-30 Wincor Nixdorf International GmbH Verfahren zur steuerung mindestens einer lichtschranke, steuerungsschaltung und damit ausgestattetes selbstbedienungsterminal
FR3039660B1 (fr) * 2015-07-30 2017-09-08 Essilor Int Methode de verification d'une caracteristique geometrique et d'une caracteristique optique d'une lentille ophtalmique detouree et dispositif associe
SG10201509497VA (en) * 2015-11-18 2017-06-29 Emage Vision Pte Ltd Contact lens defect inspection using uv illumination
EP3309603B1 (en) * 2016-10-11 2019-01-02 Essilor International Method for determining a parameter of an optical equipment
EP3502769A1 (en) * 2017-12-21 2019-06-26 Essilor International A method for determining an optical parameter of a lens
CN111684266A (zh) * 2017-12-28 2020-09-18 光学转变有限公司 用于测量透明制品的光学特性的方法
US10634618B2 (en) * 2018-01-23 2020-04-28 Hong Kong Applied Science and Technology Research Institute Company Limited Apparatus and a method for inspecting a light transmissible optical component
KR20200134913A (ko) * 2019-05-24 2020-12-02 엘지이노텍 주식회사 액체 렌즈 제조 장치 및 방법
CN111855156B (zh) * 2020-07-29 2022-07-26 杭州海康微影传感科技有限公司 用于镜头检测的采样控制方法和测试装置以及采样工装
US12014480B2 (en) * 2021-10-19 2024-06-18 Johnson & Johnson Vision Care, Inc. Defect detection using synthetic data and machine learning

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD145805B1 (de) * 1979-08-27 1982-06-30 Johannes Grosser Beleuchtungsanordnung fuer mikroskope
AU649291B2 (en) * 1990-12-19 1994-05-19 Bodenseewerk Geratetechnik Gmbh Process and apparatus for examining optical components, especially optical components for the eye and device for illuminating clear-transparent test-objects
DE4236928A1 (de) * 1992-10-31 1994-05-05 Bodenseewerk Geraetetech Verfahren und Vorrichtung zur Reihenprüfung von Bildinformationen
IL107603A (en) * 1992-12-21 1997-01-10 Johnson & Johnson Vision Prod Ophthalmic lens inspection method and apparatus
US5500732A (en) * 1994-06-10 1996-03-19 Johnson & Johnson Vision Products, Inc. Lens inspection system and method
US5578331A (en) * 1994-06-10 1996-11-26 Vision Products, Inc. Automated apparatus for preparing contact lenses for inspection and packaging
US5649410A (en) * 1994-06-10 1997-07-22 Johnson & Johnson Vision Products, Inc. Post-hydration method and apparatus for transporting, inspecting and packaging contact lenses
DE29901791U1 (de) * 1999-02-02 2000-07-06 Novartis Ag Linsenmesseinrichtung
JP3544892B2 (ja) * 1999-05-12 2004-07-21 株式会社東京精密 外観検査方法及び装置
EP1213568B1 (de) * 2000-12-08 2005-12-28 Gretag-Macbeth AG Vorrichtung zur bildelementweisen Ausmessung eines flächigen Messobjekts
US6577387B2 (en) * 2000-12-29 2003-06-10 Johnson & Johnson Vision Care, Inc. Inspection of ophthalmic lenses using absorption
US6765661B2 (en) * 2001-03-09 2004-07-20 Novartis Ag Lens inspection

Also Published As

Publication number Publication date
HK1066857A1 (en) 2005-04-01
KR20040082271A (ko) 2004-09-24
AU2003225591A1 (en) 2003-09-09
CN1518662A (zh) 2004-08-04
AU2003225591B2 (en) 2008-12-11
CA2444517C (en) 2011-01-11
JP2005518537A (ja) 2005-06-23
WO2003073061A3 (en) 2003-10-30
CN1279341C (zh) 2006-10-11
CN101793595B (zh) 2012-05-16
CA2444517A1 (en) 2003-09-04
AU2008237532A1 (en) 2008-11-13
US20040042003A1 (en) 2004-03-04
HK1070131A1 (en) 2005-06-10
TWI294031B (en) 2008-03-01
DE60323207D1 (de) 2008-10-09
CN101793595A (zh) 2010-08-04
CN1896708A (zh) 2007-01-17
BRPI0303222B1 (pt) 2017-03-28
TW200532166A (en) 2005-10-01
EP1476738A2 (en) 2004-11-17
SG135070A1 (en) 2007-09-28
AU2008237532B2 (en) 2012-05-17
WO2003073061A2 (en) 2003-09-04
EP1476738B1 (en) 2008-08-27
CN1896708B (zh) 2010-08-04
US6882411B2 (en) 2005-04-19
KR100972945B1 (ko) 2010-07-30

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Legal Events

Date Code Title Description
B25A Requested transfer of rights approved

Owner name: JOHNSON AND JOHNSON (US)

Free format text: TRANSFERIDO DE: JOHNSON AND JOHNSON VISION CARE, INC.

B06A Patent application procedure suspended [chapter 6.1 patent gazette]
B09A Decision: intention to grant [chapter 9.1 patent gazette]
B16A Patent or certificate of addition of invention granted [chapter 16.1 patent gazette]
B21F Lapse acc. art. 78, item iv - on non-payment of the annual fees in time

Free format text: REFERENTE A 21A ANUIDADE.

B24J Lapse because of non-payment of annual fees (definitively: art 78 iv lpi, resolution 113/2013 art. 12)

Free format text: EM VIRTUDE DA EXTINCAO PUBLICADA NA RPI 2762 DE 12-12-2023 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDA A EXTINCAO DA PATENTE E SEUS CERTIFICADOS, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.