SG10201509497VA - Contact lens defect inspection using uv illumination - Google Patents
Contact lens defect inspection using uv illuminationInfo
- Publication number
- SG10201509497VA SG10201509497VA SG10201509497VA SG10201509497VA SG10201509497VA SG 10201509497V A SG10201509497V A SG 10201509497VA SG 10201509497V A SG10201509497V A SG 10201509497VA SG 10201509497V A SG10201509497V A SG 10201509497VA SG 10201509497V A SG10201509497V A SG 10201509497VA
- Authority
- SG
- Singapore
- Prior art keywords
- illumination
- contact lens
- defect inspection
- lens defect
- inspection
- Prior art date
Links
- 230000007547 defect Effects 0.000 title 1
- 238000005286 illumination Methods 0.000 title 1
- 238000007689 inspection Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/33—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N7/00—Television systems
- H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
- H04N7/183—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast for receiving images from a single remote source
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N2021/6417—Spectrofluorimetric devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
- G01N2021/646—Detecting fluorescent inhomogeneities at a position, e.g. for detecting defects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
- G01N2021/9583—Lenses
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/061—Sources
- G01N2201/06146—Multisources for homogeneisation, as well sequential as simultaneous operation
- G01N2201/06153—Multisources for homogeneisation, as well sequential as simultaneous operation the sources being LED's
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10004—Still image; Photographic image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10024—Color image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10064—Fluorescence image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
Priority Applications (9)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SG10201509497VA SG10201509497VA (en) | 2015-11-18 | 2015-11-18 | Contact lens defect inspection using uv illumination |
DE102016122146.5A DE102016122146A1 (en) | 2015-11-18 | 2016-11-17 | Contact lens defect examination using UV radiation |
US15/355,595 US10739278B2 (en) | 2015-11-18 | 2016-11-18 | Contact lens defect inspection using UV illumination |
MYPI2016002040A MY191431A (en) | 2015-11-18 | 2016-11-18 | Contact lens defect inspection using uv illumination |
CN201611271119.8A CN106940306A (en) | 2015-11-18 | 2016-11-18 | Utilize the contact lenses defects detection of UV illumination |
KR1020160154233A KR20170058318A (en) | 2015-11-18 | 2016-11-18 | Contact lens defect inspection using uv illumination |
TW105137850A TW201733335A (en) | 2015-11-18 | 2016-11-18 | Contact lens defect inspection using UV illumination |
JP2016225222A JP2017106909A (en) | 2015-11-18 | 2016-11-18 | Contact lens defect inspection using uv illumination |
US16/940,564 US11408834B2 (en) | 2015-11-18 | 2020-07-28 | Contact lens defect inspection using UV illumination |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SG10201509497VA SG10201509497VA (en) | 2015-11-18 | 2015-11-18 | Contact lens defect inspection using uv illumination |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10201509497VA true SG10201509497VA (en) | 2017-06-29 |
Family
ID=58640351
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201509497VA SG10201509497VA (en) | 2015-11-18 | 2015-11-18 | Contact lens defect inspection using uv illumination |
Country Status (8)
Country | Link |
---|---|
US (2) | US10739278B2 (en) |
JP (1) | JP2017106909A (en) |
KR (1) | KR20170058318A (en) |
CN (1) | CN106940306A (en) |
DE (1) | DE102016122146A1 (en) |
MY (1) | MY191431A (en) |
SG (1) | SG10201509497VA (en) |
TW (1) | TW201733335A (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20180356558A1 (en) * | 2017-06-08 | 2018-12-13 | Novartis Ag | Method for detecting the presence or absence of an ophthalmic lens within a receptacle |
KR102194289B1 (en) * | 2019-03-18 | 2020-12-22 | 주식회사 유니온커뮤니티 | Apparatus and Method for Inspecting Cutting-off Ability of Blue or Violet Light |
WO2022050151A1 (en) * | 2020-09-02 | 2022-03-10 | 京セラ株式会社 | Contact lens, case for contact lens, and contact lens unit |
JP7309225B2 (en) * | 2020-10-14 | 2023-07-18 | イーメージ ヴィジョン ピーティーイー. エルティーディー. | Contact lens defect analysis and tracking system |
US11861823B2 (en) * | 2021-04-27 | 2024-01-02 | Johnson & Johnson Vision Care, Inc. | Microfluidic device and method for quantifying contact lens deposition |
Family Cites Families (44)
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US3189914A (en) * | 1961-07-31 | 1965-06-15 | Berry D Locke | Fluorescent contact lens and method of locating same |
US3981593A (en) * | 1975-02-27 | 1976-09-21 | Boyle Robert M | Soft contact lens inspection device |
US4695399A (en) * | 1986-04-29 | 1987-09-22 | Neefe Charles W | Method of making a contact lens material which may be identified by colored fluorescence |
US4632773A (en) * | 1986-04-29 | 1986-12-30 | Neefe Charles W | Method of making a contact lens material which may be identified |
JP2804308B2 (en) | 1989-09-14 | 1998-09-24 | 大日本印刷株式会社 | How to repair defects such as emulsion masks |
US5633504A (en) * | 1995-03-30 | 1997-05-27 | Wesley-Jessen Corporation | Inspection of optical components |
US6914250B2 (en) * | 1997-03-07 | 2005-07-05 | Clare Chemical Research, Inc. | Fluorometric detection using visible light |
SG87848A1 (en) * | 1998-11-05 | 2002-04-16 | Johnson & Johnson Vision Prod | Missing lens detection system and method |
US6586740B1 (en) * | 1999-12-15 | 2003-07-01 | Bausch & Lomb Incorporated | Method and apparatus for detecting lenses in package |
US6757420B2 (en) * | 1999-12-22 | 2004-06-29 | Novartis Ag | Inspection device for packages |
JP2001215077A (en) | 2000-02-02 | 2001-08-10 | Hitachi Ltd | Defrost controller, method for controlling and refrigerator |
GB2360730B (en) * | 2000-03-31 | 2004-09-22 | Bausch & Lomb Uk Ltd | Apparatus and method for separating contact lens molds |
AU2002239542A1 (en) | 2000-12-04 | 2002-06-18 | The University Of Vermont And State Agricultural College | System and method for automated fringe counting using image information |
JP4727828B2 (en) * | 2001-02-21 | 2011-07-20 | 株式会社メニコン | Mark readout method for marked ophthalmic lens |
JP4413440B2 (en) * | 2001-01-23 | 2010-02-10 | 株式会社メニコン | Thickness measurement method for ophthalmic lens |
JP2002243581A (en) * | 2001-02-13 | 2002-08-28 | Menicon Co Ltd | Method for inspecting lens posture of contact lens |
EP1225441A3 (en) * | 2001-01-23 | 2004-01-21 | Menicon Co., Ltd. | Method of obtaining particulars of ophthalmic lens |
CN101793595B (en) * | 2002-02-21 | 2012-05-16 | 庄臣及庄臣视力保护公司 | Apparatus for inspecting optical devices |
US7355692B2 (en) | 2004-03-05 | 2008-04-08 | Orbotech Ltd | System and method for inspecting electrical circuits utilizing reflective and fluorescent imagery |
US20070296963A1 (en) * | 2004-05-20 | 2007-12-27 | Sepha Limited | Methods and Apparatus for Inspecting the Sealing and Integrity of Blister Packages |
JP4455216B2 (en) * | 2004-08-06 | 2010-04-21 | キヤノン株式会社 | Detection device |
US7355700B2 (en) * | 2004-12-10 | 2008-04-08 | International Business Machines Corporation | Automated inspection system and method |
US7105834B2 (en) * | 2005-01-21 | 2006-09-12 | Innovative Productivity, Inc. | Fluorescent coating void detection system and method |
US7663742B2 (en) * | 2005-11-24 | 2010-02-16 | Novartis Ag | Lens inspection system using phase contrast imaging |
JP4988224B2 (en) * | 2006-03-01 | 2012-08-01 | 株式会社日立ハイテクノロジーズ | Defect inspection method and apparatus |
US20080013820A1 (en) * | 2006-07-11 | 2008-01-17 | Microview Technology Ptd Ltd | Peripheral inspection system and method |
US7477366B2 (en) * | 2006-12-07 | 2009-01-13 | Coopervision International Holding Company, Lp | Contact lens blister packages and methods for automated inspection of hydrated contact lenses |
US7847927B2 (en) * | 2007-02-28 | 2010-12-07 | Hitachi High-Technologies Corporation | Defect inspection method and defect inspection apparatus |
TW200927424A (en) * | 2007-12-20 | 2009-07-01 | E Pin Industry Optical Co Ltd | Molded fluorescent plastic lens and manufacturing method thereof |
TWI420220B (en) | 2008-07-25 | 2013-12-21 | Hon Hai Prec Ind Co Ltd | Projection apparatus |
SG173233A1 (en) * | 2010-01-28 | 2011-08-29 | Visionxtreme Pte Ltd | Inspection of defects in a contact lens |
JP5352514B2 (en) * | 2010-04-01 | 2013-11-27 | 有限会社アステ | UV flaw detection lamp |
US9282796B2 (en) * | 2010-05-19 | 2016-03-15 | Johnson & Johnson Vision Care, Inc. | UV radiation control for disinfecting of ophthalmic lenses |
CN102834704B (en) * | 2011-02-23 | 2015-11-25 | 联达科技检测私人有限公司 | The inspection of the defect in contact lenses |
EP2797734B1 (en) * | 2011-12-31 | 2016-04-06 | Novartis AG | Method of making colored contact lenses |
US9205608B2 (en) * | 2011-12-31 | 2015-12-08 | Novartis Ag | Contact lenses with identifying mark |
US20150253257A1 (en) * | 2014-03-05 | 2015-09-10 | Novartis Ag | Method for automatic inspect of contact lenses |
US9933632B2 (en) * | 2014-03-26 | 2018-04-03 | Indizen Optical Technologies, S.L. | Eyewear lens production by multi-layer additive techniques |
US9952448B2 (en) * | 2014-03-26 | 2018-04-24 | Indizen Optical Technologies, S.L. | Eyewear lens production by additive techniques |
CN106537110A (en) * | 2014-05-15 | 2017-03-22 | 伊麦视觉私人有限公司 | System and method for inspecting opthalmic lenses |
SG10201501672PA (en) * | 2015-03-05 | 2016-10-28 | Emage Vision Pte Ltd | Inspection of sealing quality in blister packages |
MY184638A (en) * | 2015-12-15 | 2021-04-13 | Alcon Inc | Method for applying stable coating on silicone hydrogel contact lenses |
US10768453B2 (en) * | 2017-07-03 | 2020-09-08 | Bolb Inc. | Devices for cleaning contact lenses |
EP3679340B1 (en) * | 2017-09-07 | 2022-12-07 | Alcon Inc. | Contact lens inspection method and system |
-
2015
- 2015-11-18 SG SG10201509497VA patent/SG10201509497VA/en unknown
-
2016
- 2016-11-17 DE DE102016122146.5A patent/DE102016122146A1/en not_active Ceased
- 2016-11-18 KR KR1020160154233A patent/KR20170058318A/en not_active Application Discontinuation
- 2016-11-18 TW TW105137850A patent/TW201733335A/en unknown
- 2016-11-18 US US15/355,595 patent/US10739278B2/en active Active
- 2016-11-18 MY MYPI2016002040A patent/MY191431A/en unknown
- 2016-11-18 JP JP2016225222A patent/JP2017106909A/en active Pending
- 2016-11-18 CN CN201611271119.8A patent/CN106940306A/en active Pending
-
2020
- 2020-07-28 US US16/940,564 patent/US11408834B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
JP2017106909A (en) | 2017-06-15 |
US11408834B2 (en) | 2022-08-09 |
TW201733335A (en) | 2017-09-16 |
MY191431A (en) | 2022-06-27 |
US10739278B2 (en) | 2020-08-11 |
US20170138867A1 (en) | 2017-05-18 |
US20200355626A1 (en) | 2020-11-12 |
CN106940306A (en) | 2017-07-11 |
KR20170058318A (en) | 2017-05-26 |
DE102016122146A1 (en) | 2017-05-18 |
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