SG10201509497VA - Contact lens defect inspection using uv illumination - Google Patents

Contact lens defect inspection using uv illumination

Info

Publication number
SG10201509497VA
SG10201509497VA SG10201509497VA SG10201509497VA SG10201509497VA SG 10201509497V A SG10201509497V A SG 10201509497VA SG 10201509497V A SG10201509497V A SG 10201509497VA SG 10201509497V A SG10201509497V A SG 10201509497VA SG 10201509497V A SG10201509497V A SG 10201509497VA
Authority
SG
Singapore
Prior art keywords
illumination
contact lens
defect inspection
lens defect
inspection
Prior art date
Application number
SG10201509497VA
Inventor
Smorgon Sergey
Bee Chuan Tan
Original Assignee
Emage Vision Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Emage Vision Pte Ltd filed Critical Emage Vision Pte Ltd
Priority to SG10201509497VA priority Critical patent/SG10201509497VA/en
Priority to DE102016122146.5A priority patent/DE102016122146A1/en
Priority to US15/355,595 priority patent/US10739278B2/en
Priority to MYPI2016002040A priority patent/MY191431A/en
Priority to CN201611271119.8A priority patent/CN106940306A/en
Priority to KR1020160154233A priority patent/KR20170058318A/en
Priority to TW105137850A priority patent/TW201733335A/en
Priority to JP2016225222A priority patent/JP2017106909A/en
Publication of SG10201509497VA publication Critical patent/SG10201509497VA/en
Priority to US16/940,564 priority patent/US11408834B2/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0242Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0278Detecting defects of the object to be tested, e.g. scratches or dust
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/33Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/56Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00Television systems
    • H04N7/18Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
    • H04N7/183Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast for receiving images from a single remote source
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N2021/6417Spectrofluorimetric devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • G01N21/6456Spatial resolved fluorescence measurements; Imaging
    • G01N2021/646Detecting fluorescent inhomogeneities at a position, e.g. for detecting defects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9583Lenses
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/061Sources
    • G01N2201/06146Multisources for homogeneisation, as well sequential as simultaneous operation
    • G01N2201/06153Multisources for homogeneisation, as well sequential as simultaneous operation the sources being LED's
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10004Still image; Photographic image
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10024Color image
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10064Fluorescence image
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30164Workpiece; Machine component
SG10201509497VA 2015-11-18 2015-11-18 Contact lens defect inspection using uv illumination SG10201509497VA (en)

Priority Applications (9)

Application Number Priority Date Filing Date Title
SG10201509497VA SG10201509497VA (en) 2015-11-18 2015-11-18 Contact lens defect inspection using uv illumination
DE102016122146.5A DE102016122146A1 (en) 2015-11-18 2016-11-17 Contact lens defect examination using UV radiation
US15/355,595 US10739278B2 (en) 2015-11-18 2016-11-18 Contact lens defect inspection using UV illumination
MYPI2016002040A MY191431A (en) 2015-11-18 2016-11-18 Contact lens defect inspection using uv illumination
CN201611271119.8A CN106940306A (en) 2015-11-18 2016-11-18 Utilize the contact lenses defects detection of UV illumination
KR1020160154233A KR20170058318A (en) 2015-11-18 2016-11-18 Contact lens defect inspection using uv illumination
TW105137850A TW201733335A (en) 2015-11-18 2016-11-18 Contact lens defect inspection using UV illumination
JP2016225222A JP2017106909A (en) 2015-11-18 2016-11-18 Contact lens defect inspection using uv illumination
US16/940,564 US11408834B2 (en) 2015-11-18 2020-07-28 Contact lens defect inspection using UV illumination

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SG10201509497VA SG10201509497VA (en) 2015-11-18 2015-11-18 Contact lens defect inspection using uv illumination

Publications (1)

Publication Number Publication Date
SG10201509497VA true SG10201509497VA (en) 2017-06-29

Family

ID=58640351

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10201509497VA SG10201509497VA (en) 2015-11-18 2015-11-18 Contact lens defect inspection using uv illumination

Country Status (8)

Country Link
US (2) US10739278B2 (en)
JP (1) JP2017106909A (en)
KR (1) KR20170058318A (en)
CN (1) CN106940306A (en)
DE (1) DE102016122146A1 (en)
MY (1) MY191431A (en)
SG (1) SG10201509497VA (en)
TW (1) TW201733335A (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20180356558A1 (en) * 2017-06-08 2018-12-13 Novartis Ag Method for detecting the presence or absence of an ophthalmic lens within a receptacle
KR102194289B1 (en) * 2019-03-18 2020-12-22 주식회사 유니온커뮤니티 Apparatus and Method for Inspecting Cutting-off Ability of Blue or Violet Light
WO2022050151A1 (en) * 2020-09-02 2022-03-10 京セラ株式会社 Contact lens, case for contact lens, and contact lens unit
JP7309225B2 (en) * 2020-10-14 2023-07-18 イーメージ ヴィジョン ピーティーイー. エルティーディー. Contact lens defect analysis and tracking system
US11861823B2 (en) * 2021-04-27 2024-01-02 Johnson & Johnson Vision Care, Inc. Microfluidic device and method for quantifying contact lens deposition

Family Cites Families (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3189914A (en) * 1961-07-31 1965-06-15 Berry D Locke Fluorescent contact lens and method of locating same
US3981593A (en) * 1975-02-27 1976-09-21 Boyle Robert M Soft contact lens inspection device
US4695399A (en) * 1986-04-29 1987-09-22 Neefe Charles W Method of making a contact lens material which may be identified by colored fluorescence
US4632773A (en) * 1986-04-29 1986-12-30 Neefe Charles W Method of making a contact lens material which may be identified
JP2804308B2 (en) 1989-09-14 1998-09-24 大日本印刷株式会社 How to repair defects such as emulsion masks
US5633504A (en) * 1995-03-30 1997-05-27 Wesley-Jessen Corporation Inspection of optical components
US6914250B2 (en) * 1997-03-07 2005-07-05 Clare Chemical Research, Inc. Fluorometric detection using visible light
SG87848A1 (en) * 1998-11-05 2002-04-16 Johnson & Johnson Vision Prod Missing lens detection system and method
US6586740B1 (en) * 1999-12-15 2003-07-01 Bausch & Lomb Incorporated Method and apparatus for detecting lenses in package
US6757420B2 (en) * 1999-12-22 2004-06-29 Novartis Ag Inspection device for packages
JP2001215077A (en) 2000-02-02 2001-08-10 Hitachi Ltd Defrost controller, method for controlling and refrigerator
GB2360730B (en) * 2000-03-31 2004-09-22 Bausch & Lomb Uk Ltd Apparatus and method for separating contact lens molds
AU2002239542A1 (en) 2000-12-04 2002-06-18 The University Of Vermont And State Agricultural College System and method for automated fringe counting using image information
JP4727828B2 (en) * 2001-02-21 2011-07-20 株式会社メニコン Mark readout method for marked ophthalmic lens
JP4413440B2 (en) * 2001-01-23 2010-02-10 株式会社メニコン Thickness measurement method for ophthalmic lens
JP2002243581A (en) * 2001-02-13 2002-08-28 Menicon Co Ltd Method for inspecting lens posture of contact lens
EP1225441A3 (en) * 2001-01-23 2004-01-21 Menicon Co., Ltd. Method of obtaining particulars of ophthalmic lens
CN101793595B (en) * 2002-02-21 2012-05-16 庄臣及庄臣视力保护公司 Apparatus for inspecting optical devices
US7355692B2 (en) 2004-03-05 2008-04-08 Orbotech Ltd System and method for inspecting electrical circuits utilizing reflective and fluorescent imagery
US20070296963A1 (en) * 2004-05-20 2007-12-27 Sepha Limited Methods and Apparatus for Inspecting the Sealing and Integrity of Blister Packages
JP4455216B2 (en) * 2004-08-06 2010-04-21 キヤノン株式会社 Detection device
US7355700B2 (en) * 2004-12-10 2008-04-08 International Business Machines Corporation Automated inspection system and method
US7105834B2 (en) * 2005-01-21 2006-09-12 Innovative Productivity, Inc. Fluorescent coating void detection system and method
US7663742B2 (en) * 2005-11-24 2010-02-16 Novartis Ag Lens inspection system using phase contrast imaging
JP4988224B2 (en) * 2006-03-01 2012-08-01 株式会社日立ハイテクノロジーズ Defect inspection method and apparatus
US20080013820A1 (en) * 2006-07-11 2008-01-17 Microview Technology Ptd Ltd Peripheral inspection system and method
US7477366B2 (en) * 2006-12-07 2009-01-13 Coopervision International Holding Company, Lp Contact lens blister packages and methods for automated inspection of hydrated contact lenses
US7847927B2 (en) * 2007-02-28 2010-12-07 Hitachi High-Technologies Corporation Defect inspection method and defect inspection apparatus
TW200927424A (en) * 2007-12-20 2009-07-01 E Pin Industry Optical Co Ltd Molded fluorescent plastic lens and manufacturing method thereof
TWI420220B (en) 2008-07-25 2013-12-21 Hon Hai Prec Ind Co Ltd Projection apparatus
SG173233A1 (en) * 2010-01-28 2011-08-29 Visionxtreme Pte Ltd Inspection of defects in a contact lens
JP5352514B2 (en) * 2010-04-01 2013-11-27 有限会社アステ UV flaw detection lamp
US9282796B2 (en) * 2010-05-19 2016-03-15 Johnson & Johnson Vision Care, Inc. UV radiation control for disinfecting of ophthalmic lenses
CN102834704B (en) * 2011-02-23 2015-11-25 联达科技检测私人有限公司 The inspection of the defect in contact lenses
EP2797734B1 (en) * 2011-12-31 2016-04-06 Novartis AG Method of making colored contact lenses
US9205608B2 (en) * 2011-12-31 2015-12-08 Novartis Ag Contact lenses with identifying mark
US20150253257A1 (en) * 2014-03-05 2015-09-10 Novartis Ag Method for automatic inspect of contact lenses
US9933632B2 (en) * 2014-03-26 2018-04-03 Indizen Optical Technologies, S.L. Eyewear lens production by multi-layer additive techniques
US9952448B2 (en) * 2014-03-26 2018-04-24 Indizen Optical Technologies, S.L. Eyewear lens production by additive techniques
CN106537110A (en) * 2014-05-15 2017-03-22 伊麦视觉私人有限公司 System and method for inspecting opthalmic lenses
SG10201501672PA (en) * 2015-03-05 2016-10-28 Emage Vision Pte Ltd Inspection of sealing quality in blister packages
MY184638A (en) * 2015-12-15 2021-04-13 Alcon Inc Method for applying stable coating on silicone hydrogel contact lenses
US10768453B2 (en) * 2017-07-03 2020-09-08 Bolb Inc. Devices for cleaning contact lenses
EP3679340B1 (en) * 2017-09-07 2022-12-07 Alcon Inc. Contact lens inspection method and system

Also Published As

Publication number Publication date
JP2017106909A (en) 2017-06-15
US11408834B2 (en) 2022-08-09
TW201733335A (en) 2017-09-16
MY191431A (en) 2022-06-27
US10739278B2 (en) 2020-08-11
US20170138867A1 (en) 2017-05-18
US20200355626A1 (en) 2020-11-12
CN106940306A (en) 2017-07-11
KR20170058318A (en) 2017-05-26
DE102016122146A1 (en) 2017-05-18

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