BR0004579A - Dispositivo micromecânico e método para a sua fabricação - Google Patents
Dispositivo micromecânico e método para a sua fabricaçãoInfo
- Publication number
- BR0004579A BR0004579A BR0004579-9A BR0004579A BR0004579A BR 0004579 A BR0004579 A BR 0004579A BR 0004579 A BR0004579 A BR 0004579A BR 0004579 A BR0004579 A BR 0004579A
- Authority
- BR
- Brazil
- Prior art keywords
- silicon
- sensors
- micromechanical device
- manufacturing
- manufacture
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title abstract 3
- 238000000034 method Methods 0.000 title abstract 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract 4
- 229910052710 silicon Inorganic materials 0.000 abstract 4
- 239000010703 silicon Substances 0.000 abstract 4
- 230000001133 acceleration Effects 0.000 abstract 2
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical group C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 abstract 2
- 239000011521 glass Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P3/00—Measuring linear or angular speed; Measuring differences of linear or angular speeds
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B7/00—Microstructural systems; Auxiliary parts of microstructural devices or systems
- B81B7/0032—Packages or encapsulation
- B81B7/0045—Packages or encapsulation for reducing stress inside of the package structure
- B81B7/0048—Packages or encapsulation for reducing stress inside of the package structure between the MEMS die and the substrate
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B3/00—Devices comprising flexible or deformable elements, e.g. comprising elastic tongues or membranes
- B81B3/0064—Constitution or structural means for improving or controlling the physical properties of a device
- B81B3/0067—Mechanical properties
- B81B3/0072—For controlling internal stress or strain in moving or flexible elements, e.g. stress compensating layers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
- G01C19/5719—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using planar vibrating masses driven in a translation vibration along an axis
- G01C19/5733—Structural details or topology
- G01C19/5755—Structural details or topology the devices having a single sensing mass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P1/00—Details of instruments
- G01P1/006—Details of instruments used for thermal compensation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/0802—Details
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/03—Microengines and actuators
- B81B2201/032—Bimorph and unimorph actuators, e.g. piezo and thermo
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2203/00—Basic microelectromechanical structures
- B81B2203/01—Suspended structures, i.e. structures allowing a movement
- B81B2203/0109—Bridges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P2015/0805—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration
- G01P2015/0822—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass
- G01P2015/0825—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass for one single degree of freedom of movement of the mass
- G01P2015/0828—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass for one single degree of freedom of movement of the mass the mass being of the paddle type being suspended at one of its longitudinal ends
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S73/00—Measuring and testing
- Y10S73/01—Vibration
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Mechanical Engineering (AREA)
- Pressure Sensors (AREA)
- Weting (AREA)
- Gyroscopes (AREA)
- Micromachines (AREA)
Abstract
Patente de Invenção: DISPOSITIVO MICROMECâNICO E MéTODO PARA A SUA FABRICAçãO. Uma estrutura de pedestal e seu método de fabricação enfatiza a montagem por liberação de sensores micromecânicos em particular de um sensor de aceleração, sensores de taxa angular, sensores de inclinação, ou de aceleração angular. Pelo menos uma massa sísmica de silício é usada como elemento sensor. A pelo menos uma massa sísmica de silício é unida à moldura de silício por meio de pelo menos um pedestal de montagem, cuja superfície é ligada a uma pastilha de cobertura, seja de vidro ou silício.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP99308589A EP1096260B1 (en) | 1999-10-29 | 1999-10-29 | Micromechanical device |
Publications (1)
Publication Number | Publication Date |
---|---|
BR0004579A true BR0004579A (pt) | 2001-05-29 |
Family
ID=8241708
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BR0004579-9A BR0004579A (pt) | 1999-10-29 | 2000-10-02 | Dispositivo micromecânico e método para a sua fabricação |
Country Status (7)
Country | Link |
---|---|
US (1) | US6684699B1 (pt) |
EP (1) | EP1096260B1 (pt) |
JP (1) | JP2001203371A (pt) |
KR (1) | KR20010050327A (pt) |
CN (1) | CN1143135C (pt) |
BR (1) | BR0004579A (pt) |
DE (1) | DE69925837T2 (pt) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6795605B1 (en) * | 2000-08-01 | 2004-09-21 | Cheetah Omni, Llc | Micromechanical optical switch |
US7145704B1 (en) * | 2003-11-25 | 2006-12-05 | Cheetah Omni, Llc | Optical logic gate based optical router |
EP1423713A1 (en) | 2001-08-24 | 2004-06-02 | Honeywell International Inc. | Hermetically sealed silicon micro-machined electromechanical system (mems) device having diffused conductors |
US7110671B1 (en) * | 2001-12-03 | 2006-09-19 | Cheetah Omni, Llc | Method and apparatus for scheduling communication using a star switching fabric |
US6848304B2 (en) * | 2003-04-28 | 2005-02-01 | Analog Devices, Inc. | Six degree-of-freedom micro-machined multi-sensor |
CN1297470C (zh) * | 2003-07-28 | 2007-01-31 | 华新丽华股份有限公司 | 采用微结构间隙控制技术形成的结构及其形成方法 |
US20060037398A1 (en) * | 2004-08-19 | 2006-02-23 | Rich David B | Method for making an impact detector |
FI119299B (fi) * | 2005-06-17 | 2008-09-30 | Vti Technologies Oy | Menetelmä kapasitiivisen kiihtyvyysanturin valmistamiseksi ja kapasitiivinen kiihtyvyysanturi |
JP4945167B2 (ja) * | 2006-05-12 | 2012-06-06 | スタンレー電気株式会社 | 半導体発光素子の製造方法及び該製造方法により製造された半導体発光素子の実装方法 |
DE102008040970A1 (de) * | 2008-08-04 | 2010-02-11 | Robert Bosch Gmbh | Mikromechanische Vorrichtung mit Kavernen mit unterschiedlichem atmosphärischen Innendruck |
FR2944102B1 (fr) * | 2009-04-03 | 2011-06-10 | Onera (Off Nat Aerospatiale) | Element vibrant sur deux modes decouples et application a un gyrometre vibrant. |
DE102010010931A1 (de) * | 2010-03-10 | 2011-09-15 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Piezoresistiver Wandler |
EP2378246A1 (en) | 2010-04-16 | 2011-10-19 | SensoNor Technologies AS | MEMS Structure for an Angular Rate Sensor |
CN104797943A (zh) * | 2012-11-19 | 2015-07-22 | 株式会社村田制作所 | 角加速度传感器 |
CN104797944B (zh) * | 2012-11-19 | 2017-03-08 | 株式会社村田制作所 | 角加速度传感器 |
WO2014196320A1 (ja) * | 2013-06-04 | 2014-12-11 | 株式会社村田製作所 | 加速度センサ |
CN111650401B (zh) * | 2020-06-03 | 2021-05-07 | 西安交通大学 | 一种同平面贴装的金属基集成式谐振加速度计 |
GB2624843A (en) | 2022-07-08 | 2024-06-05 | Autorient Tech As | Micromechanical devices and methods of manufacturing thereof |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2176607B (en) * | 1985-06-18 | 1988-01-13 | Standard Telephones Cables Ltd | Accelerometer device |
GB2192718B (en) * | 1986-07-15 | 1990-06-13 | Stc Plc | Accelerometer or seismometer |
US4945765A (en) * | 1988-08-31 | 1990-08-07 | Kearfott Guidance & Navigation Corp. | Silicon micromachined accelerometer |
US5594172A (en) * | 1989-06-21 | 1997-01-14 | Nissan Motor Co., Ltd. | Semiconductor accelerometer having a cantilevered beam with a triangular or pentagonal cross section |
JPH05240874A (ja) * | 1991-12-06 | 1993-09-21 | Canon Inc | 角速度センサ |
US5643803A (en) * | 1992-09-18 | 1997-07-01 | Nippondenso Co., Ltd. | Production method of a semiconductor dynamic sensor |
US5484073A (en) * | 1994-03-28 | 1996-01-16 | I/O Sensors, Inc. | Method for fabricating suspension members for micromachined sensors |
JP3305516B2 (ja) * | 1994-10-31 | 2002-07-22 | 株式会社東海理化電機製作所 | 静電容量式加速度センサ及びその製造方法 |
US5591679A (en) * | 1995-04-12 | 1997-01-07 | Sensonor A/S | Sealed cavity arrangement method |
JPH11258265A (ja) * | 1998-03-16 | 1999-09-24 | Akebono Brake Ind Co Ltd | 半導体加速度センサ及びその製造方法 |
-
1999
- 1999-10-29 DE DE69925837T patent/DE69925837T2/de not_active Expired - Lifetime
- 1999-10-29 EP EP99308589A patent/EP1096260B1/en not_active Expired - Lifetime
-
2000
- 2000-09-04 KR KR1020000051999A patent/KR20010050327A/ko not_active Application Discontinuation
- 2000-09-13 US US09/660,676 patent/US6684699B1/en not_active Expired - Lifetime
- 2000-10-02 BR BR0004579-9A patent/BR0004579A/pt not_active IP Right Cessation
- 2000-10-27 JP JP2000329044A patent/JP2001203371A/ja active Pending
- 2000-10-27 CN CNB001331787A patent/CN1143135C/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE69925837D1 (de) | 2005-07-21 |
DE69925837T2 (de) | 2005-10-27 |
KR20010050327A (ko) | 2001-06-15 |
EP1096260A1 (en) | 2001-05-02 |
JP2001203371A (ja) | 2001-07-27 |
US6684699B1 (en) | 2004-02-03 |
CN1294303A (zh) | 2001-05-09 |
EP1096260B1 (en) | 2005-06-15 |
CN1143135C (zh) | 2004-03-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
B08F | Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette] |
Free format text: REFERENTE A 5 A 7A ANUIDADES |
|
B08K | Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette] |
Free format text: REFERENTE AO DESPACHO 8.6 PUBLICADO NA RPI 1913 DE 04/09/2007. |