BE826966A - Appareil d'optique electronique pour la spectrometrie a diffusion d'ions et la spectrometrie de masse a ions secondaires - Google Patents
Appareil d'optique electronique pour la spectrometrie a diffusion d'ions et la spectrometrie de masse a ions secondairesInfo
- Publication number
- BE826966A BE826966A BE154569A BE154569A BE826966A BE 826966 A BE826966 A BE 826966A BE 154569 A BE154569 A BE 154569A BE 154569 A BE154569 A BE 154569A BE 826966 A BE826966 A BE 826966A
- Authority
- BE
- Belgium
- Prior art keywords
- spectrometry
- optical apparatus
- electronic optical
- mass spectrometry
- ion
- Prior art date
Links
- 238000009792 diffusion process Methods 0.000 title 1
- 230000003287 optical effect Effects 0.000 title 1
- 238000001004 secondary ion mass spectrometry Methods 0.000 title 1
- 238000004611 spectroscopical analysis Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/142—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19742414221 DE2414221C3 (de) | 1974-03-25 | 1974-03-25 | Ionenoptisches Gerät zur Untersuchung der Oberfläche einer Probe durch IonenbeschuB und Analyse der vom beschossenen Oberflächenbereich ausgehenden Ionen |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| BE826966A true BE826966A (fr) | 1975-07-16 |
Family
ID=5911045
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BE154569A BE826966A (fr) | 1974-03-25 | 1975-03-21 | Appareil d'optique electronique pour la spectrometrie a diffusion d'ions et la spectrometrie de masse a ions secondaires |
Country Status (8)
| Country | Link |
|---|---|
| JP (1) | JPS5199094A (cs) |
| BE (1) | BE826966A (cs) |
| DE (1) | DE2414221C3 (cs) |
| DK (1) | DK144898C (cs) |
| FR (1) | FR2266166B3 (cs) |
| GB (1) | GB1445963A (cs) |
| IT (1) | IT1034386B (cs) |
| NL (1) | NL7503567A (cs) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4058724A (en) * | 1975-06-27 | 1977-11-15 | Minnesota Mining And Manufacturing Company | Ion Scattering spectrometer with two analyzers preferably in tandem |
| DE2556291C3 (de) * | 1975-12-13 | 1980-11-27 | Gesellschaft Fuer Strahlen- Und Umweltforschung Mbh, 8000 Muenchen | Raster-Ionenmikroskop |
| WO1981003395A1 (en) * | 1980-05-12 | 1981-11-26 | Univ Trobe | Angular resolved spectrometer |
| JPH083988B2 (ja) * | 1986-10-08 | 1996-01-17 | 株式会社日立製作所 | 二次イオン質量分析方法 |
| JPH0589817A (ja) * | 1991-03-16 | 1993-04-09 | Eiko Eng:Kk | 複合分析装置 |
-
1974
- 1974-03-25 DE DE19742414221 patent/DE2414221C3/de not_active Expired
-
1975
- 1975-03-18 IT IT2138775A patent/IT1034386B/it active
- 1975-03-19 GB GB1137075A patent/GB1445963A/en not_active Expired
- 1975-03-21 BE BE154569A patent/BE826966A/xx unknown
- 1975-03-24 DK DK122675A patent/DK144898C/da active
- 1975-03-24 JP JP50035998A patent/JPS5199094A/ja active Pending
- 1975-03-25 NL NL7503567A patent/NL7503567A/xx not_active Application Discontinuation
- 1975-03-25 FR FR7509351A patent/FR2266166B3/fr not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| GB1445963A (en) | 1976-08-11 |
| FR2266166A1 (cs) | 1975-10-24 |
| DE2414221A1 (de) | 1975-10-09 |
| DK122675A (cs) | 1975-09-26 |
| DE2414221B2 (de) | 1978-04-20 |
| DK144898C (da) | 1982-11-22 |
| JPS5199094A (cs) | 1976-09-01 |
| IT1034386B (it) | 1979-09-10 |
| NL7503567A (nl) | 1975-09-29 |
| DE2414221C3 (de) | 1979-01-18 |
| DK144898B (da) | 1982-06-28 |
| FR2266166B3 (cs) | 1977-12-02 |
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