DK144898C - Ionoptisk apparat til undersoegelse af et proeveemnes overfladeved ionbeskydning og analyse af de fra det beskudte overfladeomraade udgaaende ioner - Google Patents

Ionoptisk apparat til undersoegelse af et proeveemnes overfladeved ionbeskydning og analyse af de fra det beskudte overfladeomraade udgaaende ioner

Info

Publication number
DK144898C
DK144898C DK122675A DK122675A DK144898C DK 144898 C DK144898 C DK 144898C DK 122675 A DK122675 A DK 122675A DK 122675 A DK122675 A DK 122675A DK 144898 C DK144898 C DK 144898C
Authority
DK
Denmark
Prior art keywords
ionoptical
emissions
examination
analysis
surface areas
Prior art date
Application number
DK122675A
Other languages
Danish (da)
English (en)
Other versions
DK122675A (cs
DK144898B (da
Inventor
W Heiland
E Taglauer
M Grundner
Original Assignee
Max Planck Gesellschaft
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Max Planck Gesellschaft filed Critical Max Planck Gesellschaft
Publication of DK122675A publication Critical patent/DK122675A/da
Publication of DK144898B publication Critical patent/DK144898B/da
Application granted granted Critical
Publication of DK144898C publication Critical patent/DK144898C/da

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/142—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46—Static spectrometers
    • H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
DK122675A 1974-03-25 1975-03-24 Ionoptisk apparat til undersoegelse af et proeveemnes overfladeved ionbeskydning og analyse af de fra det beskudte overfladeomraade udgaaende ioner DK144898C (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE2414221 1974-03-25
DE19742414221 DE2414221C3 (de) 1974-03-25 1974-03-25 Ionenoptisches Gerät zur Untersuchung der Oberfläche einer Probe durch IonenbeschuB und Analyse der vom beschossenen Oberflächenbereich ausgehenden Ionen

Publications (3)

Publication Number Publication Date
DK122675A DK122675A (cs) 1975-09-26
DK144898B DK144898B (da) 1982-06-28
DK144898C true DK144898C (da) 1982-11-22

Family

ID=5911045

Family Applications (1)

Application Number Title Priority Date Filing Date
DK122675A DK144898C (da) 1974-03-25 1975-03-24 Ionoptisk apparat til undersoegelse af et proeveemnes overfladeved ionbeskydning og analyse af de fra det beskudte overfladeomraade udgaaende ioner

Country Status (8)

Country Link
JP (1) JPS5199094A (cs)
BE (1) BE826966A (cs)
DE (1) DE2414221C3 (cs)
DK (1) DK144898C (cs)
FR (1) FR2266166B3 (cs)
GB (1) GB1445963A (cs)
IT (1) IT1034386B (cs)
NL (1) NL7503567A (cs)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4058724A (en) * 1975-06-27 1977-11-15 Minnesota Mining And Manufacturing Company Ion Scattering spectrometer with two analyzers preferably in tandem
DE2556291C3 (de) * 1975-12-13 1980-11-27 Gesellschaft Fuer Strahlen- Und Umweltforschung Mbh, 8000 Muenchen Raster-Ionenmikroskop
WO1981003395A1 (en) * 1980-05-12 1981-11-26 Univ Trobe Angular resolved spectrometer
JPH083988B2 (ja) * 1986-10-08 1996-01-17 株式会社日立製作所 二次イオン質量分析方法
JPH0589817A (ja) * 1991-03-16 1993-04-09 Eiko Eng:Kk 複合分析装置

Also Published As

Publication number Publication date
GB1445963A (en) 1976-08-11
FR2266166A1 (cs) 1975-10-24
DE2414221A1 (de) 1975-10-09
DK122675A (cs) 1975-09-26
DE2414221B2 (de) 1978-04-20
JPS5199094A (cs) 1976-09-01
IT1034386B (it) 1979-09-10
BE826966A (fr) 1975-07-16
NL7503567A (nl) 1975-09-29
DE2414221C3 (de) 1979-01-18
DK144898B (da) 1982-06-28
FR2266166B3 (cs) 1977-12-02

Similar Documents

Publication Publication Date Title
SE7513258L (sv) Forfarande och apparat for analys
DK549776A (da) Fremgangmsade og apparat til udtagning af prover til analyse
SE7805665L (sv) Forfarande och apparat for analys
DK150804C (da) Proeveskaal til proevetagning og optisk analyse
DK155765C (da) Fremgangsmaade til bestemmelse af koncentrationen af et stof i en proeve og apparat til anvendelse ved udoevelse af fremgangsmaaden
DK32480A (da) Fremgangsmaade apparat og omsaetter til dimensionsmaaling
DK212077A (da) Fremgangsmade til kontrol af gas-analyseapparater og apparat til gennemforelse af fremgangsmaden
IT1062498B (it) Metodo apparecchio e composizioni per spettroscopia a fluorescenza e analisi immunofluorimetrica
DK117380A (da) Blodgaskontrolproever praeparat fremgangsmaade og apparat
DK363878A (da) Apparat til klargoering af en vaeskeproeve til analyse
DK106878A (da) Fremgangsmaade og apparat til detektering af gasser
DK139994B (da) Fremgangsmåde til analyse af udstødningsgasser samt apparat til udøvelse af fremgangsmåden.
DK250878A (da) Fremgangsmaade og apparat til partikelanalyse
JPS53133079A (en) Testing and measuring apparatus for liquid sample
JPS5482286A (en) Method and device for chemical spot test analysis
JPS5247785A (en) Apparatus for analyzing color of test sample
AT378487B (de) Geraet zum trennen und messen von probenbestandteilen
DK400575A (da) Apparat og fremgangsmade til analysering af vesker
DK171877A (da) Fremgangsmade til analyse af flydende emner og apparat dertil
DK158405C (da) Fremgangsmaade og apparat til maaling af vaeskerumfang
JPS51145391A (en) Method and apparatus for liquid sample analysis
NO783216L (no) Fremgangsmaate og apparat til proevetagning og analysering av en fluidumblanding
GB1548953A (en) Method and apparatus for laboratory testing of carubettors
DK575075A (da) Fremgangsmade og apparat til analyse af udstodningsgas
DK163686C (da) Fremgangsmaade og apparat til ikke-destruktiv afproevning af daek