AU4783900A - Short and break tester probe for plasma display pannel - Google Patents

Short and break tester probe for plasma display pannel

Info

Publication number
AU4783900A
AU4783900A AU47839/00A AU4783900A AU4783900A AU 4783900 A AU4783900 A AU 4783900A AU 47839/00 A AU47839/00 A AU 47839/00A AU 4783900 A AU4783900 A AU 4783900A AU 4783900 A AU4783900 A AU 4783900A
Authority
AU
Australia
Prior art keywords
short
plasma display
display pannel
tester probe
break tester
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU47839/00A
Other languages
English (en)
Inventor
Tae Wook Park
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of AU4783900A publication Critical patent/AU4783900A/en
Abandoned legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/42—Measurement or testing during manufacture

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
  • Gas-Filled Discharge Tubes (AREA)
AU47839/00A 2000-04-03 2000-05-10 Short and break tester probe for plasma display pannel Abandoned AU4783900A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
KR0017397 2000-04-03
KR1020000017397A KR100350513B1 (ko) 2000-04-03 2000-04-03 피디피 전극 검사 프로브장치
PCT/KR2000/000445 WO2001080275A1 (en) 2000-04-03 2000-05-10 Short and break tester probe for plasma display pannel

Publications (1)

Publication Number Publication Date
AU4783900A true AU4783900A (en) 2001-10-30

Family

ID=19661428

Family Applications (1)

Application Number Title Priority Date Filing Date
AU47839/00A Abandoned AU4783900A (en) 2000-04-03 2000-05-10 Short and break tester probe for plasma display pannel

Country Status (5)

Country Link
JP (1) JP2003531387A (ko)
KR (1) KR100350513B1 (ko)
CN (1) CN1353858A (ko)
AU (1) AU4783900A (ko)
WO (1) WO2001080275A1 (ko)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003302439A (ja) * 2002-04-09 2003-10-24 Tokyo Cathode Laboratory Co Ltd 表示パネル検査用プローブコンタクト装置
US7218127B2 (en) * 2004-02-18 2007-05-15 Formfactor, Inc. Method and apparatus for probing an electronic device in which movement of probes and/or the electronic device includes a lateral component
KR100752938B1 (ko) * 2006-08-03 2007-08-30 마이크로 인스펙션 주식회사 볼을 이용한 접촉식 프로브
JP5030624B2 (ja) * 2007-03-13 2012-09-19 株式会社ヒューモラボラトリー 回転式電極子装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2769015B2 (ja) * 1990-03-08 1998-06-25 株式会社神戸製鋼所 電子回路基板検査用プローバーピンヘッド及びその製造方法
JPH04242061A (ja) * 1991-01-11 1992-08-28 Hitachi Ltd 表面原子の加工方法及び装置及びこれを用いた原子メモリ装置
KR940005951Y1 (ko) * 1992-03-18 1994-08-31 이영서 식기세척기의 식기소독구조
KR100248571B1 (ko) * 1992-08-31 2000-03-15 히가시 데쓰로 프로우브 장치
US5773987A (en) * 1996-02-26 1998-06-30 Motorola, Inc. Method for probing a semiconductor wafer using a motor controlled scrub process
KR100395812B1 (ko) * 1999-07-27 2003-08-27 삼성에스디아이 주식회사 플라즈마 디스플레이 패널의 검사장치

Also Published As

Publication number Publication date
JP2003531387A (ja) 2003-10-21
KR20010094032A (ko) 2001-10-31
CN1353858A (zh) 2002-06-12
WO2001080275A1 (en) 2001-10-25
KR100350513B1 (ko) 2002-08-28

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase