AU2001263174A1 - Ate timing measurement unit and method - Google Patents

Ate timing measurement unit and method

Info

Publication number
AU2001263174A1
AU2001263174A1 AU2001263174A AU6317401A AU2001263174A1 AU 2001263174 A1 AU2001263174 A1 AU 2001263174A1 AU 2001263174 A AU2001263174 A AU 2001263174A AU 6317401 A AU6317401 A AU 6317401A AU 2001263174 A1 AU2001263174 A1 AU 2001263174A1
Authority
AU
Australia
Prior art keywords
measurement unit
timing measurement
ate
ate timing
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001263174A
Inventor
Benjamin Brown
Andrew Damian Firth
Erik V. Hultine
Chiyi Jin
John Robert Pane
Binwei Yang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of AU2001263174A1 publication Critical patent/AU2001263174A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
AU2001263174A 2000-05-31 2001-05-16 Ate timing measurement unit and method Abandoned AU2001263174A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09584636 2000-05-31
US09/584,636 US6609077B1 (en) 2000-05-31 2000-05-31 ATE timing measurement unit and method
PCT/US2001/015780 WO2001092904A2 (en) 2000-05-31 2001-05-16 Ate timing measurement unit and method

Publications (1)

Publication Number Publication Date
AU2001263174A1 true AU2001263174A1 (en) 2001-12-11

Family

ID=24338193

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001263174A Abandoned AU2001263174A1 (en) 2000-05-31 2001-05-16 Ate timing measurement unit and method

Country Status (8)

Country Link
US (1) US6609077B1 (en)
EP (1) EP1287370A2 (en)
JP (1) JP4669197B2 (en)
KR (1) KR100724115B1 (en)
AU (1) AU2001263174A1 (en)
MY (1) MY126156A (en)
TW (1) TW548421B (en)
WO (1) WO2001092904A2 (en)

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JP2002074988A (en) * 2000-08-28 2002-03-15 Mitsubishi Electric Corp Semiconductor device and test method for semiconductor device
US7015833B1 (en) * 2000-08-31 2006-03-21 Logitech Europe S.A. Multilink receiver for multiple cordless applications
US7017091B2 (en) * 2001-03-19 2006-03-21 Credence Systems Corporation Test system formatters configurable for multiple data rates
US7765443B1 (en) 2001-03-19 2010-07-27 Credence Systems Corporation Test systems and methods for integrated circuit devices
US6993695B2 (en) * 2001-06-06 2006-01-31 Agilent Technologies, Inc. Method and apparatus for testing digital devices using transition timestamps
US6721920B2 (en) * 2001-06-07 2004-04-13 Agilent Technologies, Inc. Systems and methods for facilitating testing of pad drivers of integrated circuits
US6885961B2 (en) * 2002-02-28 2005-04-26 Teradyne, Inc. Hybrid tester architecture
KR100446298B1 (en) * 2002-04-02 2004-08-30 삼성전자주식회사 Circuit for measuring a rising or falling time of high speed data and method thereof
DE10231419B4 (en) * 2002-07-11 2015-01-29 Qimonda Ag Device and method for calibrating signals
US6931338B2 (en) * 2003-01-07 2005-08-16 Guide Technology, Inc. System for providing a calibrated path for multi-signal cables in testing of integrated circuits
US6876938B2 (en) * 2003-01-07 2005-04-05 Guide Technology, Inc. Method to provide a calibrated path for multi-signal cables in testing of integrated circuits
US6956365B2 (en) * 2003-04-08 2005-10-18 Credence Systems Corporation System and method for calibration of testing equipment using device photoemission
EP1649299B1 (en) * 2003-07-23 2009-02-25 Intellitech Corporation System and method for optimized test and configuration throughput of electronic circuits
JP4564250B2 (en) * 2003-10-09 2010-10-20 Ｏｋｉセミコンダクタ株式会社 Function test method of semiconductor device
US7239971B2 (en) * 2004-04-16 2007-07-03 Formfactor, Inc. Method and apparatus for calibrating communications channels
US7379395B2 (en) * 2004-06-30 2008-05-27 Teradyne, Inc. Precise time measurement apparatus and method
US7085668B2 (en) 2004-08-20 2006-08-01 Teradyne, Inc. Time measurement method using quadrature sine waves
US20060043479A1 (en) * 2004-09-02 2006-03-02 Patrice Parris Metal oxide semiconductor device including a shielding structure for low gate-drain capacitance
US7590170B2 (en) * 2004-09-29 2009-09-15 Teradyne, Inc. Method and apparatus for measuring jitter
KR100630701B1 (en) * 2004-10-04 2006-10-02 삼성전자주식회사 Test board of semiconductor tester having modified I/O printed circuit pattern and method for testing thereof
US7076385B2 (en) * 2004-11-23 2006-07-11 Guide Technology, Inc. System and method for calibrating signal paths connecting a device under test to a test system
US7536663B2 (en) * 2005-02-25 2009-05-19 Verigy (Singapore) Pte. Ltd. Method and apparatus for quantifying the timing error induced by an impedance variation of a signal path
US7296203B2 (en) * 2005-10-11 2007-11-13 Advantest Corporation Test apparatus, program and recording medium
US7349818B2 (en) * 2005-11-10 2008-03-25 Teradyne, Inc. Determining frequency components of jitter
US7668235B2 (en) * 2005-11-10 2010-02-23 Teradyne Jitter measurement algorithm using locally in-order strobes
US7602873B2 (en) * 2005-12-23 2009-10-13 Agilent Technologies, Inc. Correcting time synchronization inaccuracy caused by asymmetric delay on a communication link
US7502974B2 (en) * 2006-02-22 2009-03-10 Verigy (Singapore) Pte. Ltd. Method and apparatus for determining which timing sets to pre-load into the pin electronics of a circuit test system, and for pre-loading or storing said timing sets
US7480581B2 (en) * 2006-06-27 2009-01-20 Teradyne, Inc. Calibrating a testing device
US7991046B2 (en) * 2007-05-18 2011-08-02 Teradyne, Inc. Calibrating jitter
US7786718B2 (en) * 2007-12-31 2010-08-31 Teradyne, Inc. Time measurement of periodic signals
US7996168B2 (en) * 2009-03-06 2011-08-09 Advantest Corporation Method and apparatus for time vernier calibration
US8938370B2 (en) 2010-07-12 2015-01-20 Advantest Corporation Method and apparatus for complex time measurements
US8692538B2 (en) * 2011-06-09 2014-04-08 Teradyne, Inc. Test equipment calibration
US9164158B2 (en) * 2013-06-07 2015-10-20 Teradyne, Inc. Calibration device
US9279857B2 (en) * 2013-11-19 2016-03-08 Teradyne, Inc. Automated test system with edge steering
CN104101767A (en) * 2014-08-08 2014-10-15 长沙金艺电子科技有限公司 Arrester resistive current tester allowing direct obtaining of voltage signals from high voltage bus
US10145893B2 (en) * 2016-12-25 2018-12-04 Nuvoton Technology Corporation Resolving automated test equipment (ATE) timing constraint violations
US11892186B2 (en) 2018-09-26 2024-02-06 Toshiba Carrier Corporation Detection device
CN112789507A (en) * 2018-12-20 2021-05-11 爱德万测试公司 Apparatus and method for testing a device under test
KR102179063B1 (en) * 2019-05-17 2020-11-16 주식회사 엑시콘 SoC test apparatus calculating signal line length
TWI742918B (en) 2020-11-11 2021-10-11 久元電子股份有限公司 Multi-channel timing calibration device and method thereof
KR20230148473A (en) * 2022-04-15 2023-10-25 삼성전자주식회사 Fan-out buffer with skew control function, method thereof, and probe card including same

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JPS5091295A (en) * 1973-12-12 1975-07-21
JPS5837896A (en) * 1981-08-31 1983-03-05 Fujitsu Ltd Mos dynamic circuit
US4703448A (en) 1984-10-25 1987-10-27 Nicolet Instrument Corporation Method for measuring skew or phase difference in electronic systems
US4792932A (en) 1987-01-16 1988-12-20 Teradyne, Inc. Time measurement in automatic test equipment
US5058087A (en) 1987-05-29 1991-10-15 Siemens Aktiengesellschaft Process for determining the electrical duration of signal paths
JP2831780B2 (en) 1990-02-02 1998-12-02 株式会社アドバンテスト IC test equipment
JP2853753B2 (en) * 1991-02-26 1999-02-03 日本電信電話株式会社 Transmission line length measurement method
DE69225262T2 (en) 1991-02-26 1998-09-03 Nippon Telegraph & Telephone Method of measuring the length of a transmission line
US5256964A (en) 1992-07-31 1993-10-26 International Business Machines Corporation Tester calibration verification device
CA2127192C (en) * 1993-07-01 1999-09-07 Alan Brent Hussey Shaping ate bursts, particularly in gallium arsenide
JPH0862308A (en) 1994-08-22 1996-03-08 Advantest Corp Timing calibration method for measuring signal of semiconductor testing device and its circuit
US5539305A (en) 1994-10-03 1996-07-23 Botka; Julius K. Calibration board for an electronic circuit tester
US5609489A (en) 1994-12-21 1997-03-11 Hewlett-Packard Company Socket for contacting an electronic circuit during testing
JP3410575B2 (en) * 1995-01-17 2003-05-26 株式会社光電製作所 Pulse radar
JPH0980124A (en) 1995-09-11 1997-03-28 Advantest Corp Calibration device and adjustment method of reference delay time
US5604751A (en) * 1995-11-09 1997-02-18 Teradyne, Inc. Time linearity measurement using a frequency locked, dual sequencer automatic test system
US5931962A (en) 1996-09-23 1999-08-03 Xilinx, Inc. Method and apparatus for improving timing accuracy of a semiconductor test system
US5809034A (en) 1996-09-27 1998-09-15 Altera Corporation Apparatus and method for operating electronic device testing equipment in accordance with a known overall timing accuracy parameter

Also Published As

Publication number Publication date
MY126156A (en) 2006-09-29
JP4669197B2 (en) 2011-04-13
EP1287370A2 (en) 2003-03-05
US6609077B1 (en) 2003-08-19
JP2003535344A (en) 2003-11-25
KR100724115B1 (en) 2007-06-04
WO2001092904A2 (en) 2001-12-06
KR20030022803A (en) 2003-03-17
WO2001092904A3 (en) 2002-04-25
TW548421B (en) 2003-08-21

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