AU2013308186B9 - Long wavelength infrared detection and imaging with long wavelength infrared source - Google Patents

Long wavelength infrared detection and imaging with long wavelength infrared source Download PDF

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Publication number
AU2013308186B9
AU2013308186B9 AU2013308186A AU2013308186A AU2013308186B9 AU 2013308186 B9 AU2013308186 B9 AU 2013308186B9 AU 2013308186 A AU2013308186 A AU 2013308186A AU 2013308186 A AU2013308186 A AU 2013308186A AU 2013308186 B9 AU2013308186 B9 AU 2013308186B9
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Prior art keywords
detection system
radiation
infrared detection
wavelength
laser
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AU2013308186A1 (en
AU2013308186B2 (en
Inventor
Graeme Malcolm
Gordon Robertson
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ITI Scotland Ltd
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ITI Scotland Ltd
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Priority claimed from GB201215423A external-priority patent/GB201215423D0/en
Priority claimed from GB201302026A external-priority patent/GB201302026D0/en
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Publication of AU2013308186A1 publication Critical patent/AU2013308186A1/en
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Publication of AU2013308186B2 publication Critical patent/AU2013308186B2/en
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G01J3/108—Arrangements of light sources specially adapted for spectrometry or colorimetry for measurement in the infrared range
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/359—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/05—Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
    • H01S3/08—Construction or shape of optical resonators or components thereof
    • H01S3/081—Construction or shape of optical resonators or components thereof comprising three or more reflectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/09—Processes or apparatus for excitation, e.g. pumping
    • H01S3/091—Processes or apparatus for excitation, e.g. pumping using optical pumping
    • H01S3/094—Processes or apparatus for excitation, e.g. pumping using optical pumping by coherent light
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/106—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity
    • H01S3/108—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity using non-linear optical devices, e.g. exhibiting Brillouin or Raman scattering
    • H01S3/1083—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity using non-linear optical devices, e.g. exhibiting Brillouin or Raman scattering using parametric generation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/11—Mode locking; Q-switching; Other giant-pulse techniques, e.g. cavity dumping
    • H01S3/1123—Q-switching
    • H01S3/117—Q-switching using intracavity acousto-optic devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/14—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range characterised by the material used as the active medium
    • H01S3/16—Solid materials
    • H01S3/163—Solid materials characterised by a crystal matrix
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N2021/4764—Special kinds of physical applications
    • G01N2021/4769—Fluid samples, e.g. slurries, granulates; Compressible powdery of fibrous samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V8/00—Prospecting or detecting by optical means
    • G01V8/005—Prospecting or detecting by optical means operating with millimetre waves, e.g. measuring the black losey radiation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/05—Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
    • H01S3/08—Construction or shape of optical resonators or components thereof
    • H01S3/081—Construction or shape of optical resonators or components thereof comprising three or more reflectors
    • H01S3/082—Construction or shape of optical resonators or components thereof comprising three or more reflectors defining a plurality of resonators, e.g. for mode selection or suppression
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/14—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range characterised by the material used as the active medium
    • H01S3/16—Solid materials
    • H01S3/1601—Solid materials characterised by an active (lasing) ion
    • H01S3/1603—Solid materials characterised by an active (lasing) ion rare earth
    • H01S3/161—Solid materials characterised by an active (lasing) ion rare earth holmium
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/14—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range characterised by the material used as the active medium
    • H01S3/16—Solid materials
    • H01S3/163—Solid materials characterised by a crystal matrix
    • H01S3/164—Solid materials characterised by a crystal matrix garnet
    • H01S3/1643—YAG

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nonlinear Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
AU2013308186A 2012-08-30 2013-08-30 Long wavelength infrared detection and imaging with long wavelength infrared source Active AU2013308186B9 (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
GB201215423A GB201215423D0 (en) 2012-08-30 2012-08-30 Long wavelength infrared detection adn imaging
GB1215423.3 2012-08-30
GB1302026.8 2013-02-05
GB201302026A GB201302026D0 (en) 2013-02-05 2013-02-05 Optical parametric device for use in infrared
PCT/GB2013/052279 WO2014033465A1 (en) 2012-08-30 2013-08-30 Long wavelength infrared detection and imaging with long wavelength infrared source

Publications (3)

Publication Number Publication Date
AU2013308186A1 AU2013308186A1 (en) 2015-04-09
AU2013308186B2 AU2013308186B2 (en) 2017-09-07
AU2013308186B9 true AU2013308186B9 (en) 2017-09-21

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AU2013308186A Active AU2013308186B9 (en) 2012-08-30 2013-08-30 Long wavelength infrared detection and imaging with long wavelength infrared source

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US (2) US10247606B2 (enExample)
EP (1) EP2890971B1 (enExample)
JP (1) JP6333257B2 (enExample)
AU (1) AU2013308186B9 (enExample)
CA (1) CA2883482C (enExample)
WO (1) WO2014033465A1 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016002466A1 (ja) * 2014-07-03 2016-01-07 株式会社村田製作所 ガス濃度測定装置
EP3165905B1 (en) * 2014-07-03 2019-10-02 Murata Manufacturing Co., Ltd. Gas concentration measurement device
JP6187696B2 (ja) * 2014-07-03 2017-08-30 株式会社村田製作所 ガス濃度測定装置
JP6415606B2 (ja) * 2015-01-21 2018-10-31 国立研究開発法人量子科学技術研究開発機構 血中物質濃度測定装置及び血中物質濃度測定方法
US10724945B2 (en) 2016-04-19 2020-07-28 Cascade Technologies Holdings Limited Laser detection system and method
US10180393B2 (en) 2016-04-20 2019-01-15 Cascade Technologies Holdings Limited Sample cell
GB201700905D0 (en) 2017-01-19 2017-03-08 Cascade Tech Holdings Ltd Close-Coupled Analyser
EP3616002B1 (en) * 2017-04-24 2024-11-27 Ramot at Tel-Aviv University Ltd. Multi-frequency infrared imaging based on frequency conversion
GB2563005B (en) * 2017-05-23 2021-04-21 M Squared Lasers Ltd Nonlinear crystal
US10234745B2 (en) 2017-07-05 2019-03-19 Bae Systems Information And Electronic Systems Integration Inc. Optical solid-state beam steering using non-linear converter
CN113646619A (zh) * 2019-02-14 2021-11-12 开米美景公司 扩展粒子群波段选择
US11048143B1 (en) * 2020-10-02 2021-06-29 Bae Systems Information And Electronic Systems Integration Inc. Single beamline multiwavelength infrared radiation source
SE544814C2 (sv) * 2020-10-12 2022-11-29 Thoernberg Benny Avbildande materialanalysator samt förfarande för att använda denna
CN113300204A (zh) * 2021-05-08 2021-08-24 济南森峰科技有限公司 一种近红外人眼安全相干光超快扫描装置及方法
CN113523577A (zh) * 2021-07-09 2021-10-22 济南森峰激光科技股份有限公司 基于转镜的perc电池片高速激光开槽方法、装置及perc电池片

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1503204A1 (en) * 2003-07-29 2005-02-02 Northrop Grumman Corporation Detection and analysis of chemical and biological aerosols
WO2007098034A2 (en) * 2006-02-17 2007-08-30 University Of Alabama At Birmingham, Research Foundation Mid-ir laser instrument for analyzing a gaseous sample and method for using the same

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5325229A (en) * 1993-05-10 1994-06-28 Phillips Petroleum Company Temperature control of crystals used in optical oscillators
US5412681A (en) * 1994-03-30 1995-05-02 Carl Zeiss, Inc. Slab-waveguide CO2 laser
JPH08136455A (ja) * 1994-11-02 1996-05-31 Kobe Steel Ltd レーザレーダによる大気の汚染監視方法とその監視装置
JPH08227085A (ja) * 1995-02-22 1996-09-03 Nec Corp レーザ装置
JP2687934B2 (ja) * 1995-06-14 1997-12-08 日本電気株式会社 波長可変レーザ発振器
JP2904189B2 (ja) * 1997-05-30 1999-06-14 日本電気株式会社 光パラメトリック発振器
JP2001330793A (ja) * 2000-05-24 2001-11-30 Atr Adaptive Communications Res Lab パルス光生成装置
US7239653B2 (en) * 2003-02-03 2007-07-03 Bae Systems Information And Electronic Systems Integration Inc. Method and apparatus for generating MID and long IR wavelength radiation
US7023545B2 (en) * 2003-06-12 2006-04-04 Textron Systems Corporation Chemical identification by flash spectroscopy
JP2005077606A (ja) 2003-08-29 2005-03-24 Toshiba Corp レーザ発振装置と大気汚染物質モニタリング装置
US7151787B2 (en) * 2003-09-10 2006-12-19 Sandia National Laboratories Backscatter absorption gas imaging systems and light sources therefore
JP2006092156A (ja) * 2004-09-22 2006-04-06 Namco Ltd プログラム、情報記憶媒体及び画像生成装置
GB0426662D0 (en) * 2004-12-06 2005-01-05 Univ St Andrews Gas imager
JP4454523B2 (ja) * 2005-03-08 2010-04-21 日本電信電話株式会社 電磁波発生素子
US7956991B2 (en) * 2005-04-04 2011-06-07 Chemimage Corporation Method and apparatus for interactive hyperspectral image subtraction
US7474685B2 (en) 2005-05-24 2009-01-06 Itt Manufacturing Enterprises, Inc. Multi-line tunable laser system
EP1902301A4 (en) * 2005-07-14 2010-09-22 Chemimage Corp HYPERSPECTRAL LIDAIRE DETECTOR OF REMOTE IMPROVISED EXPLOSIVES WITH TEMPORAL AND SPATIAL RESOLUTION
US20090122816A1 (en) * 2005-09-22 2009-05-14 Lockheed Martin Coherent Technologies, Inc. Rapidly and electronically broadly tunable IR laser source
JP2008026190A (ja) * 2006-07-21 2008-02-07 Univ Of Fukui ガス検知装置
JP2009139569A (ja) * 2007-12-05 2009-06-25 Toshiba Corp 光応答装置及び光応答システム
GB0813980D0 (en) * 2008-07-31 2008-09-10 Univ St Andrews Control of relaxation oscillations in intracavity optical parametric oscillato rs
US8687055B2 (en) * 2010-03-16 2014-04-01 Eli Margalith Spectral imaging of moving objects with a stare down camera
CA2814356C (en) * 2011-05-25 2018-03-27 Fuji Electric Co., Ltd. Light source device, analysis device, and light generation method
US20130044769A1 (en) * 2011-08-18 2013-02-21 United States Of America, As Represented By The Secretary Of The Army MEMS Q-Switched Monoblock Laser

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1503204A1 (en) * 2003-07-29 2005-02-02 Northrop Grumman Corporation Detection and analysis of chemical and biological aerosols
WO2007098034A2 (en) * 2006-02-17 2007-08-30 University Of Alabama At Birmingham, Research Foundation Mid-ir laser instrument for analyzing a gaseous sample and method for using the same

Also Published As

Publication number Publication date
CA2883482C (en) 2020-06-16
EP2890971A1 (en) 2015-07-08
EP2890971C0 (en) 2025-04-30
CA2883482A1 (en) 2014-03-06
AU2013308186A1 (en) 2015-04-09
US10788369B2 (en) 2020-09-29
WO2014033465A1 (en) 2014-03-06
JP2015526741A (ja) 2015-09-10
EP2890971B1 (en) 2025-04-30
JP6333257B2 (ja) 2018-05-30
US20190226911A1 (en) 2019-07-25
AU2013308186B2 (en) 2017-09-07
US10247606B2 (en) 2019-04-02
US20150260572A1 (en) 2015-09-17

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