AU2002348921A1 - A method of determining the background corrected counts of radiation quanta in an x-ray energy spectrum - Google Patents

A method of determining the background corrected counts of radiation quanta in an x-ray energy spectrum

Info

Publication number
AU2002348921A1
AU2002348921A1 AU2002348921A AU2002348921A AU2002348921A1 AU 2002348921 A1 AU2002348921 A1 AU 2002348921A1 AU 2002348921 A AU2002348921 A AU 2002348921A AU 2002348921 A AU2002348921 A AU 2002348921A AU 2002348921 A1 AU2002348921 A1 AU 2002348921A1
Authority
AU
Australia
Prior art keywords
determining
energy spectrum
ray energy
background corrected
radiation quanta
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2002348921A
Other languages
English (en)
Inventor
Klaus Bethke
Hendrik J. J. Bolk
Georges C. P. Zieltjens
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Publication of AU2002348921A1 publication Critical patent/AU2002348921A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AU2002348921A 2001-12-20 2002-11-14 A method of determining the background corrected counts of radiation quanta in an x-ray energy spectrum Abandoned AU2002348921A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP01205042.3 2001-12-20
EP01205042 2001-12-20
PCT/IB2002/004817 WO2003054531A1 (en) 2001-12-20 2002-11-14 A method of determining the background corrected counts of radiation quanta in an x-ray energy spectrum

Publications (1)

Publication Number Publication Date
AU2002348921A1 true AU2002348921A1 (en) 2003-07-09

Family

ID=8181483

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2002348921A Abandoned AU2002348921A1 (en) 2001-12-20 2002-11-14 A method of determining the background corrected counts of radiation quanta in an x-ray energy spectrum

Country Status (5)

Country Link
US (1) US20050067581A1 (cg-RX-API-DMAC7.html)
EP (1) EP1459056A1 (cg-RX-API-DMAC7.html)
JP (2) JP2005513478A (cg-RX-API-DMAC7.html)
AU (1) AU2002348921A1 (cg-RX-API-DMAC7.html)
WO (1) WO2003054531A1 (cg-RX-API-DMAC7.html)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8550738B2 (en) 2008-08-28 2013-10-08 Hct Asia Ltd Flow-through dispenser with helical actuation
US8534948B2 (en) 2009-03-06 2013-09-17 Hct Asia Ltd Dispenser with a cam path
WO2011021142A1 (en) * 2009-08-19 2011-02-24 Koninklijke Philips Electronics N.V. Detection of different target components by cluster formation
JP5076012B1 (ja) * 2011-05-20 2012-11-21 株式会社リガク 波長分散型蛍光ｘ線分析装置
CN104956211B (zh) * 2012-11-29 2019-01-11 赫尔穆特费希尔有限责任公司电子及测量技术研究所 用于实施x-射线荧光分析的方法和设备
EP3193661A4 (en) 2014-09-18 2018-04-04 HCT Group Holding Limited Container with quick release base and lid assembly
US9341596B1 (en) 2014-12-22 2016-05-17 International Business Machines Corporation Annular gas ionization delta E-E detector
US9993059B2 (en) 2015-07-10 2018-06-12 HCT Group Holdings Limited Roller applicator
USD784162S1 (en) 2015-10-08 2017-04-18 HCT Group Holdings Limited Tottle
USD818641S1 (en) 2016-03-16 2018-05-22 HCT Group Holdings Limited Cosmetics applicator with cap
JP2018091691A (ja) * 2016-12-01 2018-06-14 株式会社リガク 蛍光ｘ線分析装置
CN111551579B (zh) * 2020-06-03 2021-02-12 中国地质大学（武汉） 一种利用空白校正确定x射线背景强度的方法
CN115097512B (zh) * 2022-06-20 2025-08-12 上海市计量测试技术研究院 能谱数据处理方法、装置、电子设备及存储介质

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2703562A1 (de) * 1977-01-28 1978-08-03 Max Planck Gesellschaft Verfahren und einrichtung zur roentgenfluoreszenzanalyse
JPS59214743A (ja) * 1983-05-20 1984-12-04 Jeol Ltd Ｘ線分析装置
GB8621983D0 (en) * 1986-09-12 1986-10-22 K X Technology Ltd Ore analysis
JP2564896B2 (ja) * 1988-06-28 1996-12-18 株式会社島津製作所 Ｘ線分光マッピング装置
JP2589638B2 (ja) * 1991-12-04 1997-03-12 理学電機工業株式会社 蛍光ｘ線分析方法および装置
JPH06174663A (ja) * 1992-12-01 1994-06-24 Toshiba Corp 汚染元素分析方法
JP2692538B2 (ja) * 1993-07-31 1997-12-17 株式会社島津製作所 Ｘ線分光分析におけるバックグラウンド補正方法
JP3198763B2 (ja) * 1993-12-01 2001-08-13 富士電機株式会社 波高安定化回路
US5712720A (en) * 1996-12-16 1998-01-27 Umax Data Systems Inc. Lens switching apparatus for dual-lens optical scanner
JP3301729B2 (ja) * 1998-07-31 2002-07-15 理学電機工業株式会社 定量分析による蛍光ｘ線分析方法および装置
JP3367478B2 (ja) * 1999-07-29 2003-01-14 株式会社島津製作所 蛍光ｘ線分析装置
JP4237891B2 (ja) * 1999-09-20 2009-03-11 株式会社堀場製作所 蛍光ｘ線分析装置のバックグラウンド補正方法及びその方法を用いる蛍光ｘ線分析装置

Also Published As

Publication number Publication date
JP2008309807A (ja) 2008-12-25
US20050067581A1 (en) 2005-03-31
EP1459056A1 (en) 2004-09-22
JP2005513478A (ja) 2005-05-12
WO2003054531A1 (en) 2003-07-03

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase