AU1061599A - Scanning evanescent electro-magnetic microscope - Google Patents

Scanning evanescent electro-magnetic microscope

Info

Publication number
AU1061599A
AU1061599A AU10615/99A AU1061599A AU1061599A AU 1061599 A AU1061599 A AU 1061599A AU 10615/99 A AU10615/99 A AU 10615/99A AU 1061599 A AU1061599 A AU 1061599A AU 1061599 A AU1061599 A AU 1061599A
Authority
AU
Australia
Prior art keywords
electro
magnetic microscope
scanning evanescent
evanescent
scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU10615/99A
Other languages
English (en)
Inventor
Chen Gao
Xiaodong Xiang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of California
Original Assignee
University of California
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of California filed Critical University of California
Publication of AU1061599A publication Critical patent/AU1061599A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Length Measuring Devices By Optical Means (AREA)
AU10615/99A 1997-09-22 1998-09-22 Scanning evanescent electro-magnetic microscope Abandoned AU1061599A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US5947197P 1997-09-22 1997-09-22
US60059471 1997-09-22
PCT/US1998/019764 WO1999016102A1 (en) 1997-09-22 1998-09-22 Scanning evanescent electro-magnetic microscope

Publications (1)

Publication Number Publication Date
AU1061599A true AU1061599A (en) 1999-04-12

Family

ID=22023166

Family Applications (1)

Application Number Title Priority Date Filing Date
AU10615/99A Abandoned AU1061599A (en) 1997-09-22 1998-09-22 Scanning evanescent electro-magnetic microscope

Country Status (4)

Country Link
EP (1) EP1018138A4 (ja)
JP (1) JP4431273B2 (ja)
AU (1) AU1061599A (ja)
WO (1) WO1999016102A1 (ja)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7550963B1 (en) 1996-09-20 2009-06-23 The Regents Of The University Of California Analytical scanning evanescent microwave microscope and control stage
US6173604B1 (en) 1996-09-20 2001-01-16 The Regents Of The University Of California Scanning evanescent electro-magnetic microscope
JP2003509696A (ja) * 1999-09-10 2003-03-11 ユニヴァーシティー オブ メリーランド， カレッジ パーク 誘電体誘電率および同調性の定量結像
JP3536973B2 (ja) 2000-04-20 2004-06-14 日本電気株式会社 同軸プローブおよび該同軸プローブを用いた走査型マイクロ波顕微鏡
CN100370263C (zh) * 2005-06-23 2008-02-20 中国科学技术大学 用扫描近场微波显微镜测量材料压电系数的方法及装置
JP4732201B2 (ja) * 2006-03-17 2011-07-27 キヤノン株式会社 電磁波を用いたセンシング装置
JP2009229423A (ja) * 2008-03-25 2009-10-08 Kobe Steel Ltd 近接場プローブ及びこの近接場プローブを備えた電気的特性測定装置
CN111351807A (zh) * 2020-04-18 2020-06-30 李赞 使用近场微波的介电谱显微测量
PT118063A (pt) 2022-06-22 2023-12-22 Univ Aveiro Microscópio híbrido de varrimento por micro-ondas de campo próximo

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5821410A (en) * 1996-09-20 1998-10-13 Regents Of The University Of California Scanning tip microwave near field microscope

Also Published As

Publication number Publication date
JP4431273B2 (ja) 2010-03-10
WO1999016102A1 (en) 1999-04-01
EP1018138A4 (en) 2000-12-20
EP1018138A1 (en) 2000-07-12
JP2001517804A (ja) 2001-10-09

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase