ATE549798T1 - A/d-umsetzer mit sukzessiver approximation in der ladungsdomäne - Google Patents
A/d-umsetzer mit sukzessiver approximation in der ladungsdomäneInfo
- Publication number
- ATE549798T1 ATE549798T1 AT07787041T AT07787041T ATE549798T1 AT E549798 T1 ATE549798 T1 AT E549798T1 AT 07787041 T AT07787041 T AT 07787041T AT 07787041 T AT07787041 T AT 07787041T AT E549798 T1 ATE549798 T1 AT E549798T1
- Authority
- AT
- Austria
- Prior art keywords
- circuit
- charge
- steering
- capacitor
- converter
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
- H03M1/0675—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy
- H03M1/0678—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components
- H03M1/068—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components the original and additional components or elements being complementary to each other, e.g. CMOS
- H03M1/0682—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components the original and additional components or elements being complementary to each other, e.g. CMOS using a differential network structure, i.e. symmetrical with respect to ground
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
- H03M1/1245—Details of sampling arrangements or methods
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
- H03M1/40—Analogue value compared with reference values sequentially only, e.g. successive approximation type recirculation type
- H03M1/403—Analogue value compared with reference values sequentially only, e.g. successive approximation type recirculation type using switched capacitors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
- H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/66—Digital/analogue converters
- H03M1/68—Digital/analogue converters with conversions of different sensitivity, i.e. one conversion relating to the more significant digital bits and another conversion to the less significant bits
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/66—Digital/analogue converters
- H03M1/74—Simultaneous conversion
- H03M1/80—Simultaneous conversion using weighted impedances
- H03M1/802—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices
- H03M1/804—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices with charge redistribution
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Analogue/Digital Conversion (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US83117106P | 2006-07-14 | 2006-07-14 | |
EP07100741A EP1947769A1 (de) | 2007-01-18 | 2007-01-18 | A/D-Lastbereichswandler mit schrittweiser Annäherung |
PCT/EP2007/056727 WO2008006751A1 (en) | 2006-07-14 | 2007-07-04 | Charge domain successive approximation a/d converter |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE549798T1 true ATE549798T1 (de) | 2012-03-15 |
Family
ID=37887329
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT07787041T ATE549798T1 (de) | 2006-07-14 | 2007-07-04 | A/d-umsetzer mit sukzessiver approximation in der ladungsdomäne |
Country Status (5)
Country | Link |
---|---|
US (1) | US7961131B2 (de) |
EP (2) | EP1947769A1 (de) |
JP (1) | JP4855519B2 (de) |
AT (1) | ATE549798T1 (de) |
WO (1) | WO2008006751A1 (de) |
Families Citing this family (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2107683A1 (de) | 2008-03-31 | 2009-10-07 | Imec | Analog-Digital-Wandler mit komparatorbasierter asynchroner binärer Suche |
US7898453B2 (en) | 2008-12-05 | 2011-03-01 | Qualcomm Incorporated | Apparatus and method for successive approximation analog-to-digital conversion |
EP2388923B1 (de) * | 2010-05-21 | 2013-12-04 | Stichting IMEC Nederland | Asynchroner Analog-Digital-Wandler mit digitaler Steigung und Verfahren dafür |
US8390502B2 (en) * | 2011-03-23 | 2013-03-05 | Analog Devices, Inc. | Charge redistribution digital-to-analog converter |
US8537045B2 (en) * | 2011-04-28 | 2013-09-17 | Analog Devices, Inc. | Pre-charged capacitive digital-to-analog converter |
US8669896B2 (en) * | 2011-10-25 | 2014-03-11 | Mediatek Inc. | Successive-approximation-register analog-to-digital convertor and related controlling method |
US8593325B2 (en) * | 2011-11-02 | 2013-11-26 | Semtech Corporation | Successive approximation analog-to-digital conversion |
EP2629427B1 (de) | 2012-02-17 | 2019-01-23 | IMEC vzw | Vorrichtung, System und Verfahren zur Analog-Digital-Umwandlung unter Verwendung einer Stormintegrationsschaltung |
US8810283B2 (en) * | 2012-05-22 | 2014-08-19 | Analog Devices, Inc. | CMOS transistor linearization method |
JP5960627B2 (ja) | 2013-03-11 | 2016-08-02 | ルネサスエレクトロニクス株式会社 | 半導体集積回路装置 |
CN103281083B (zh) * | 2013-05-20 | 2016-07-06 | 电子科技大学 | 带数字校正的逐次逼近全差分模数转换器及其处理方法 |
US10205462B2 (en) | 2014-12-17 | 2019-02-12 | Analog Devices, Inc. | SAR ADCs with dedicated reference capacitor for each bit capacitor |
US9641189B2 (en) | 2014-12-17 | 2017-05-02 | Analog Devices, Inc. | Calibration techniques for SAR ADCs with on-chip reservoir capacitors |
CN105049050B (zh) * | 2015-07-27 | 2018-01-12 | 电子科技大学 | 一种用于逐次逼近模数转换器的电荷重分配方法 |
CN105049049B (zh) * | 2015-07-27 | 2017-12-15 | 电子科技大学 | 一种提高逐次逼近模数转换器dnl/inl的电容交换方法 |
CN106571827B (zh) * | 2015-10-09 | 2021-03-02 | 国民技术股份有限公司 | 差分sar adc和其开关电容结构、a/d转换方法、版图实现方法 |
CN115853711A (zh) | 2015-10-26 | 2023-03-28 | 通用电气公司 | 对电容器组预充电 |
CN105322966B (zh) * | 2015-11-12 | 2018-06-19 | 电子科技大学 | 提高逐次逼近模数转换器线性度的电容交换与平均方法 |
US9698813B2 (en) | 2015-12-01 | 2017-07-04 | Mediatek Inc. | Input buffer and analog-to-digital converter |
US10291249B2 (en) | 2016-07-18 | 2019-05-14 | Analog Devices, Inc. | Common mode rejection in a reservoir capacitor SAR converter |
US10038452B2 (en) * | 2016-09-23 | 2018-07-31 | Analog Devices, Inc. | Incremental preloading in an analog-to-digital converter |
US9712181B1 (en) * | 2016-09-23 | 2017-07-18 | Analog Devices, Inc. | Incremental preloading in an analog-to-digital converter |
US10122376B2 (en) | 2016-11-04 | 2018-11-06 | Analog Devices Global | Reference precharge techniques for analog-to-digital converters |
KR102484142B1 (ko) * | 2017-12-01 | 2023-01-05 | 삼성전자주식회사 | 기준 전압의 변화량을 입력 레벨에 관계없이 균등하게 만드는 스위치드 커패시터 회로 |
US10348319B1 (en) | 2018-05-18 | 2019-07-09 | Analog Devices Global Unlimited Company | Reservoir capacitor based analog-to-digital converter |
US10516411B1 (en) | 2018-07-11 | 2019-12-24 | Analog Devices Global Unlimited Company | Common mode rejection in reservoir capacitor analog-to-digital converter |
CN109150186B (zh) * | 2018-08-22 | 2020-10-27 | 电子科技大学 | 一种适用于逐次逼近模数转换器的预测量化方法 |
US10291251B1 (en) | 2018-09-21 | 2019-05-14 | Semiconductor Components Industries, Llc | Imaging systems with sub-radix-2 charge sharing successive approximation register (SAR) analog-to-digital converters |
WO2020170617A1 (ja) * | 2019-02-20 | 2020-08-27 | ソニーセミコンダクタソリューションズ株式会社 | 逐次比較型ADコンバータ、Iotセンサ、及び生体センサ |
US11271480B2 (en) | 2020-08-03 | 2022-03-08 | xMEMS Labs, Inc. | Driving circuit with energy recycle capability and method thereof |
US11251802B1 (en) * | 2020-08-03 | 2022-02-15 | xMEMS Labs, Inc. | Nonlinear digital-to-analog converter |
CN112187273B (zh) * | 2020-10-14 | 2023-06-02 | 电子科技大学中山学院 | 一种低功耗的逐次逼近型模数转换电路模块 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54144858A (en) * | 1978-05-04 | 1979-11-12 | Cho Lsi Gijutsu Kenkyu Kumiai | Ad converter |
US6118400A (en) * | 1998-01-20 | 2000-09-12 | Microchip Technology Incorporated | Capacitor array for a successive approximation register (SAR) based analog to digital (A/D) converter and method therefor |
US20030063026A1 (en) | 2001-09-28 | 2003-04-03 | Stmicroelectronics Pvt. Ltd. | Switched-capacitor based charge redistribution successive approximation analog to digital converter (ADC) |
US6720903B2 (en) * | 2002-06-14 | 2004-04-13 | Stmicroelectronics S.R.L. | Method of operating SAR-type ADC and an ADC using the method |
JP3902778B2 (ja) * | 2004-01-07 | 2007-04-11 | 株式会社半導体理工学研究センター | アナログディジタル変換回路 |
WO2006091711A1 (en) | 2005-02-24 | 2006-08-31 | Microchip Technology Incorporated | Analog-to-digital converter with interchange of resolution against number of sample and hold channels |
US7274321B2 (en) * | 2005-03-21 | 2007-09-25 | Analog Devices, Inc. | Analog to digital converter |
-
2007
- 2007-01-18 EP EP07100741A patent/EP1947769A1/de not_active Withdrawn
- 2007-07-04 AT AT07787041T patent/ATE549798T1/de active
- 2007-07-04 EP EP07787041A patent/EP2047601B1/de active Active
- 2007-07-04 JP JP2009519906A patent/JP4855519B2/ja active Active
- 2007-07-04 WO PCT/EP2007/056727 patent/WO2008006751A1/en active Application Filing
- 2007-07-04 US US12/373,884 patent/US7961131B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
EP2047601B1 (de) | 2012-03-14 |
EP2047601A1 (de) | 2009-04-15 |
US7961131B2 (en) | 2011-06-14 |
JP2010517327A (ja) | 2010-05-20 |
WO2008006751A1 (en) | 2008-01-17 |
JP4855519B2 (ja) | 2012-01-18 |
EP1947769A1 (de) | 2008-07-23 |
US20100052957A1 (en) | 2010-03-04 |
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