ATE520204T1 - Analog-digital-umsetzer mit sukzessiver approximation und differenzeingang mit gleichtaktunterdrückung - Google Patents

Analog-digital-umsetzer mit sukzessiver approximation und differenzeingang mit gleichtaktunterdrückung

Info

Publication number
ATE520204T1
ATE520204T1 AT07837507T AT07837507T ATE520204T1 AT E520204 T1 ATE520204 T1 AT E520204T1 AT 07837507 T AT07837507 T AT 07837507T AT 07837507 T AT07837507 T AT 07837507T AT E520204 T1 ATE520204 T1 AT E520204T1
Authority
AT
Austria
Prior art keywords
common mode
successive approximation
analog
digital converter
differential input
Prior art date
Application number
AT07837507T
Other languages
English (en)
Inventor
Michael Mueck
Michael Christian Wohnsen Coln
Original Assignee
Analog Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Analog Devices Inc filed Critical Analog Devices Inc
Application granted granted Critical
Publication of ATE520204T1 publication Critical patent/ATE520204T1/de

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0675—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy
    • H03M1/0678—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components
    • H03M1/068—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components the original and additional components or elements being complementary to each other, e.g. CMOS
    • H03M1/0682—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components the original and additional components or elements being complementary to each other, e.g. CMOS using a differential network structure, i.e. symmetrical with respect to ground
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
    • H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
    • H03M1/468—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors in which the input S/H circuit is merged with the feedback DAC array
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/74—Simultaneous conversion
    • H03M1/80—Simultaneous conversion using weighted impedances
    • H03M1/802—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices
    • H03M1/804—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices with charge redistribution

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
AT07837507T 2006-12-04 2007-08-30 Analog-digital-umsetzer mit sukzessiver approximation und differenzeingang mit gleichtaktunterdrückung ATE520204T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/633,368 US7432844B2 (en) 2006-12-04 2006-12-04 Differential input successive approximation analog to digital converter with common mode rejection
PCT/US2007/019022 WO2008069850A1 (en) 2006-12-04 2007-08-30 Differential input successive approximation analog to digital converter with common mode rejection

Publications (1)

Publication Number Publication Date
ATE520204T1 true ATE520204T1 (de) 2011-08-15

Family

ID=39106217

Family Applications (1)

Application Number Title Priority Date Filing Date
AT07837507T ATE520204T1 (de) 2006-12-04 2007-08-30 Analog-digital-umsetzer mit sukzessiver approximation und differenzeingang mit gleichtaktunterdrückung

Country Status (4)

Country Link
US (1) US7432844B2 (de)
EP (1) EP2102986B1 (de)
AT (1) ATE520204T1 (de)
WO (1) WO2008069850A1 (de)

Families Citing this family (74)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2422258A (en) * 2005-01-12 2006-07-19 Sharp Kk Bufferless switched capacitor digital to analogue converter
GB2425006A (en) * 2005-04-05 2006-10-11 Sharp Kk Switched capacitor digital/analogue converter arrangement
DE102006015762B4 (de) * 2006-04-04 2013-05-08 Austriamicrosystems Ag Analog/Digital-Wandleranordnung und Verfahren
DE102006025116B4 (de) * 2006-05-30 2020-06-04 Austriamicrosystems Ag Einstellbare Analog-Digital-Wandleranordnung und Verfahren zur Analog-Digital-Wandlung
US7773020B2 (en) * 2007-02-15 2010-08-10 Analog Devices, Inc. Analog to digital converter
US7683820B2 (en) * 2007-03-05 2010-03-23 Kenet, Inc. Charge-domain pipelined charge-redistribution analog-to-digital converter
US7796077B2 (en) * 2007-09-13 2010-09-14 Texas Instruments Incorporated High speed high resolution ADC using successive approximation technique
US7880650B2 (en) * 2008-09-30 2011-02-01 Freescale Semiconductor, Inc. Method and apparatus for testing data converter
JP5175700B2 (ja) * 2008-12-05 2013-04-03 株式会社東芝 Ａ／ｄ変換装置、ａ／ｄ変換方法、通信装置
JP2010171627A (ja) * 2009-01-21 2010-08-05 Sony Corp 半導体集積回路、液晶駆動回路及び液晶表示装置
US8717094B2 (en) 2011-06-06 2014-05-06 Analog Devices, Inc. Charge sharing time domain filter
US8188753B2 (en) 2009-02-18 2012-05-29 Analog Devices, Inc. Analog computation
JP5310222B2 (ja) * 2009-04-20 2013-10-09 富士通株式会社 電荷分配型デジタル・アナログ変換器及びそれを有する逐次比較型アナログ・デジタル変換器
US8264268B2 (en) * 2009-07-27 2012-09-11 Electronics And Telecommunications Research Institute Offset-voltage calibration circuit
US8797204B2 (en) * 2009-09-01 2014-08-05 The Regents Of The University Of Michigan Low-power area-efficient SAR ADC using dual capacitor arrays
TWI382670B (zh) * 2009-10-08 2013-01-11 Holtek Semiconductor Inc 逐漸逼近類比數位轉換器及其方法
JP2011188240A (ja) * 2010-03-09 2011-09-22 Panasonic Corp 逐次比較型ａｄ変換器、移動体無線装置
US8525719B2 (en) * 2010-03-17 2013-09-03 Texas Instruments Incorporated Deutschland, Gmbh Electronic device and method for analog to digital conversion using successive approximation
US8188902B2 (en) 2010-06-11 2012-05-29 Texas Instruments Incorporated Ternary search SAR ADC
FR2961979A1 (fr) * 2010-06-24 2011-12-30 St Microelectronics Sa Convertisseur analogique-numerique differentiel a approximations successives
CN103125071B (zh) * 2010-08-18 2016-03-16 美国亚德诺半导体公司 电荷共享模拟计算电路系统及应用
US8378864B2 (en) 2011-03-16 2013-02-19 Integrated Device Technology, Inc. Apparatuses and methods for reducing errors in analog to digital converters
US8390501B2 (en) * 2011-04-28 2013-03-05 Ncku Research And Development Foundation Successive approximation register ADC with a window predictive function
US8344930B2 (en) * 2011-05-04 2013-01-01 Himax Technologies Limited Successive approximation register analog-to-digital converter
US8581770B2 (en) * 2011-05-04 2013-11-12 Texas Instruments Incorporated Zero-power sampling SAR ADC circuit and method
JP5657490B2 (ja) * 2011-08-29 2015-01-21 株式会社東芝 逐次比較型ａｄ変換器および無線受信機
US8508398B1 (en) * 2011-09-16 2013-08-13 Maxim Integrated Products, Inc. Systems for comparator offset cancellation in successive-approximation-register analog-to-digital converters
US8587465B2 (en) 2011-10-11 2013-11-19 International Business Machines Corporation Successive approximation analog to digital converter with comparator input toggling
TWI477083B (zh) * 2012-01-17 2015-03-11 Univ Nat Chiao Tung 連續近似式類比數位轉換器
JP2013150117A (ja) * 2012-01-18 2013-08-01 Toshiba Corp アナログデジタル変換器および受信機
US8471755B1 (en) * 2012-01-24 2013-06-25 Synopsys, Inc. Dynamic biasing in switched capacitor stages using frame capacitors
US8643527B2 (en) * 2012-02-17 2014-02-04 Analog Devices, Inc. Switched-capacitor MDAC with common-mode hop regulation
US8552897B1 (en) * 2012-03-22 2013-10-08 Analog Devices, Inc. Reference circuit suitable for use with an analog to digital converter and an analog to digital converter including such a reference circuit
US8810443B2 (en) 2012-04-20 2014-08-19 Linear Technology Corporation Analog-to-digital converter system and method
US8599059B1 (en) * 2012-09-07 2013-12-03 Mediatek Inc. Successive approximation register analog-digital converter and method for operating the same
KR101927272B1 (ko) * 2012-09-27 2018-12-11 한국전자통신연구원 연속 근사 레지스터 아날로그 디지털 컨버터
US8754800B2 (en) * 2012-09-29 2014-06-17 Intel Corporation Methods and arrangements for high-speed analog-to-digital conversion
JP6102521B2 (ja) * 2013-05-29 2017-03-29 株式会社ソシオネクスト Ｓａｒアナログ・デジタル変換方法およびｓａｒアナログ・デジタル変換回路
EP2882105B1 (de) * 2013-12-09 2016-09-07 Dialog Semiconductor B.V. Analog-Digital-Wandlerschaltung
US9300316B2 (en) * 2014-02-28 2016-03-29 Qualcomm Incorporated Voltage doubling circuit for an analog to digital converter (ADC)
US9413374B2 (en) * 2014-10-07 2016-08-09 Realtek Semiconductor Corporation Method and apparatus for calibrating comparator offset of successive-approximation-register analog-to-digital converter
JP6421536B2 (ja) * 2014-10-15 2018-11-14 セイコーエプソン株式会社 ドライバー及び電子機器
US9154151B1 (en) 2014-12-22 2015-10-06 Altera Corporation Analog-to-digital converter circuits and methods
CN104868916B (zh) * 2015-06-10 2018-11-30 杭州士兰微电子股份有限公司 模数转换器及其控制方法
US9577654B2 (en) * 2015-06-17 2017-02-21 Cypress Semiconductor Corporation Analog-digital converter and control method
CN105007079B (zh) * 2015-07-01 2018-04-17 西安交通大学 逐次逼近型模数转换器的全差分增量采样方法
US9996131B2 (en) * 2015-10-28 2018-06-12 Intel Corporation Electrical fast transient tolerant input/output (I/O) communication system
US9531400B1 (en) 2015-11-04 2016-12-27 Avnera Corporation Digitally calibrated successive approximation register analog-to-digital converter
US9520891B1 (en) * 2015-11-17 2016-12-13 International Business Machines Corporation Successive approximation register converter
US9667266B1 (en) 2016-02-19 2017-05-30 Analog Devices, Inc. VDD-referenced sampling
JPWO2017158677A1 (ja) * 2016-03-14 2019-01-17 オリンパス株式会社 Ａｄ変換器およびイメージセンサ
US10291249B2 (en) 2016-07-18 2019-05-14 Analog Devices, Inc. Common mode rejection in a reservoir capacitor SAR converter
US9998162B2 (en) * 2016-09-30 2018-06-12 Intel Corporation Scalable stochastic successive approximation register analog-to-digital converter
US10122376B2 (en) * 2016-11-04 2018-11-06 Analog Devices Global Reference precharge techniques for analog-to-digital converters
TWI657666B (zh) * 2017-10-31 2019-04-21 聯陽半導體股份有限公司 類比至數位轉換器及其校正方法以及校正設備
CN109802677B (zh) * 2017-11-16 2022-11-08 智原科技股份有限公司 模拟数字转换装置
CN109802674B (zh) * 2017-11-17 2021-07-16 比亚迪半导体股份有限公司 逐次逼近模数转换器及其数字校准方法和装置
US10439627B2 (en) 2017-12-18 2019-10-08 Qualcomm Incorporated Alias rejection through charge sharing
US11290065B2 (en) 2017-12-29 2022-03-29 Intel Corporation Switched capacitor radio frequency digital power amplifier and radio frequency digital-to-analog converter
CN108306644B (zh) * 2018-01-18 2021-04-20 西安电子科技大学 基于10位超低功耗逐次逼近型模数转换器前端电路
US10128859B1 (en) 2018-02-20 2018-11-13 Analog Devices Global Unlimited Company Correlated double sampling analog-to-digital converter
CN108599766B (zh) * 2018-05-10 2020-02-04 北京华大九天软件有限公司 一种sar-adc高位电容阵列的计算、校准方法
US10348319B1 (en) 2018-05-18 2019-07-09 Analog Devices Global Unlimited Company Reservoir capacitor based analog-to-digital converter
US10447289B1 (en) 2018-06-15 2019-10-15 Analog Devices, Inc. Analog-to-digital converter noise reduction techniques
US10516411B1 (en) 2018-07-11 2019-12-24 Analog Devices Global Unlimited Company Common mode rejection in reservoir capacitor analog-to-digital converter
US10778242B2 (en) 2019-01-11 2020-09-15 Realtek Semiconductor Corporation Analog-to-digital converter device
US10790843B2 (en) 2019-01-11 2020-09-29 Realtek Semiconductor Corporation Analog-to-digital converter device
US10763875B2 (en) * 2019-01-11 2020-09-01 Realtek Semiconductor Corporation Switched capacitor circuit and analog-to-digital converter device
US10673449B1 (en) * 2019-04-30 2020-06-02 Qualcomm Incorporated Digital-to-analog converter with glitch-irrelevant reference voltage to increase linearity
US11323026B2 (en) * 2019-09-06 2022-05-03 Intel Corporation Hybrid digital linear and switched capacitor voltage regulator
US10715160B1 (en) 2019-09-13 2020-07-14 Analog Devices International Unlimited Company Low noise analog-to-digital converter
CN110768670B (zh) * 2019-09-26 2021-05-28 西安交通大学 一种用于逐次逼近型模数转换器的数字分段线性校准方法
CN112968704B (zh) * 2021-02-03 2022-07-29 电子科技大学 基于暂态电容切换方式的逐次逼近型模数转换器量化方法
CN114204942B (zh) * 2022-02-15 2022-05-17 微龛(广州)半导体有限公司 逐次逼近型模数转换器及转换方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4620179A (en) * 1983-08-29 1986-10-28 Harris Corporation Method for successive approximation A/D conversion
JP4694687B2 (ja) * 2000-11-24 2011-06-08 セイコーＮｐｃ株式会社 サンプル・ホールド回路およびａ／ｄ変換器
JP2002232271A (ja) * 2001-02-01 2002-08-16 Fujitsu Ltd Ｄｃオフセットキャンセル回路、光−電気パルス変換回路、及びパルス整形回路
US6724248B2 (en) * 2001-04-24 2004-04-20 Tripath Technology, Inc. DC offset self-calibration system for a digital switching amplifier
US6667702B2 (en) * 2001-04-27 2003-12-23 Rohm Co., Ltd Semiconductor device having DACs and method of testing such semiconductor device
US6667707B2 (en) * 2002-05-02 2003-12-23 Analog Devices, Inc. Analog-to-digital converter with the ability to asynchronously sample signals without bias or reference voltage power consumption
ATE413757T1 (de) * 2004-03-25 2008-11-15 Ibm Empfänger und verfahren mit ausgleich von leitungsungleichheiten

Also Published As

Publication number Publication date
EP2102986A1 (de) 2009-09-23
US7432844B2 (en) 2008-10-07
WO2008069850A1 (en) 2008-06-12
US20080129573A1 (en) 2008-06-05
EP2102986B1 (de) 2011-08-10

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