ATE534999T1 - Probabilistische fehlerkorrektur in einem mehrbit-pro-zelle-flash-speicher - Google Patents
Probabilistische fehlerkorrektur in einem mehrbit-pro-zelle-flash-speicherInfo
- Publication number
- ATE534999T1 ATE534999T1 AT06809752T AT06809752T ATE534999T1 AT E534999 T1 ATE534999 T1 AT E534999T1 AT 06809752 T AT06809752 T AT 06809752T AT 06809752 T AT06809752 T AT 06809752T AT E534999 T1 ATE534999 T1 AT E534999T1
- Authority
- AT
- Austria
- Prior art keywords
- per cell
- flash memory
- error correction
- bit per
- estimates
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/38—Response verification devices
- G11C29/42—Response verification devices using error correcting codes [ECC] or parity check
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1068—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in sector programmable memories, e.g. flash disk
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1072—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in multilevel memories
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
- G11C11/5642—Sensing or reading circuits; Data output circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C2029/0409—Online test
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Read Only Memory (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Detection And Correction Of Errors (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US72681705P | 2005-10-17 | 2005-10-17 | |
| US11/339,571 US7526715B2 (en) | 2005-10-17 | 2006-01-26 | Probabilistic error correction in multi-bit-per-cell flash memory |
| PCT/IL2006/001175 WO2007046084A2 (en) | 2005-10-17 | 2006-10-15 | Probabilistic error correction in multi-bit-per-cell flash memory |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE534999T1 true ATE534999T1 (de) | 2011-12-15 |
Family
ID=45217842
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT06809752T ATE534999T1 (de) | 2005-10-17 | 2006-10-15 | Probabilistische fehlerkorrektur in einem mehrbit-pro-zelle-flash-speicher |
Country Status (6)
| Country | Link |
|---|---|
| EP (1) | EP1952290B1 (de) |
| JP (1) | JP4825874B2 (de) |
| KR (1) | KR100943340B1 (de) |
| CN (1) | CN101529525B (de) |
| AT (1) | ATE534999T1 (de) |
| WO (1) | WO2007046084A2 (de) |
Families Citing this family (80)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7388781B2 (en) | 2006-03-06 | 2008-06-17 | Sandisk Il Ltd. | Multi-bit-per-cell flash memory device with non-bijective mapping |
| US8848442B2 (en) | 2006-03-06 | 2014-09-30 | Sandisk Il Ltd. | Multi-bit-per-cell flash memory device with non-bijective mapping |
| WO2007132456A2 (en) | 2006-05-12 | 2007-11-22 | Anobit Technologies Ltd. | Memory device with adaptive capacity |
| US8156403B2 (en) | 2006-05-12 | 2012-04-10 | Anobit Technologies Ltd. | Combined distortion estimation and error correction coding for memory devices |
| CN103258572B (zh) | 2006-05-12 | 2016-12-07 | 苹果公司 | 存储设备中的失真估计和消除 |
| US7697326B2 (en) | 2006-05-12 | 2010-04-13 | Anobit Technologies Ltd. | Reducing programming error in memory devices |
| WO2008026203A2 (en) | 2006-08-27 | 2008-03-06 | Anobit Technologies | Estimation of non-linear distortion in memory devices |
| US7975192B2 (en) | 2006-10-30 | 2011-07-05 | Anobit Technologies Ltd. | Reading memory cells using multiple thresholds |
| US7821826B2 (en) | 2006-10-30 | 2010-10-26 | Anobit Technologies, Ltd. | Memory cell readout using successive approximation |
| US7924648B2 (en) | 2006-11-28 | 2011-04-12 | Anobit Technologies Ltd. | Memory power and performance management |
| WO2008068747A2 (en) | 2006-12-03 | 2008-06-12 | Anobit Technologies Ltd. | Automatic defect management in memory devices |
| US7706182B2 (en) | 2006-12-03 | 2010-04-27 | Anobit Technologies Ltd. | Adaptive programming of analog memory cells using statistical characteristics |
| US7900102B2 (en) | 2006-12-17 | 2011-03-01 | Anobit Technologies Ltd. | High-speed programming of memory devices |
| US7751240B2 (en) | 2007-01-24 | 2010-07-06 | Anobit Technologies Ltd. | Memory device with negative thresholds |
| US8151166B2 (en) | 2007-01-24 | 2012-04-03 | Anobit Technologies Ltd. | Reduction of back pattern dependency effects in memory devices |
| WO2008111058A2 (en) | 2007-03-12 | 2008-09-18 | Anobit Technologies Ltd. | Adaptive estimation of memory cell read thresholds |
| US8001320B2 (en) | 2007-04-22 | 2011-08-16 | Anobit Technologies Ltd. | Command interface for memory devices |
| US8234545B2 (en) | 2007-05-12 | 2012-07-31 | Apple Inc. | Data storage with incremental redundancy |
| US8429493B2 (en) | 2007-05-12 | 2013-04-23 | Apple Inc. | Memory device with internal signap processing unit |
| US7925936B1 (en) | 2007-07-13 | 2011-04-12 | Anobit Technologies Ltd. | Memory device with non-uniform programming levels |
| US8259497B2 (en) | 2007-08-06 | 2012-09-04 | Apple Inc. | Programming schemes for multi-level analog memory cells |
| US8174905B2 (en) | 2007-09-19 | 2012-05-08 | Anobit Technologies Ltd. | Programming orders for reducing distortion in arrays of multi-level analog memory cells |
| US7773413B2 (en) | 2007-10-08 | 2010-08-10 | Anobit Technologies Ltd. | Reliable data storage in analog memory cells in the presence of temperature variations |
| US8068360B2 (en) | 2007-10-19 | 2011-11-29 | Anobit Technologies Ltd. | Reading analog memory cells using built-in multi-threshold commands |
| US8000141B1 (en) | 2007-10-19 | 2011-08-16 | Anobit Technologies Ltd. | Compensation for voltage drifts in analog memory cells |
| US8527819B2 (en) | 2007-10-19 | 2013-09-03 | Apple Inc. | Data storage in analog memory cell arrays having erase failures |
| US8270246B2 (en) | 2007-11-13 | 2012-09-18 | Apple Inc. | Optimized selection of memory chips in multi-chips memory devices |
| US7633798B2 (en) * | 2007-11-21 | 2009-12-15 | Micron Technology, Inc. | M+N bit programming and M+L bit read for M bit memory cells |
| US8225181B2 (en) | 2007-11-30 | 2012-07-17 | Apple Inc. | Efficient re-read operations from memory devices |
| US8209588B2 (en) | 2007-12-12 | 2012-06-26 | Anobit Technologies Ltd. | Efficient interference cancellation in analog memory cell arrays |
| US8456905B2 (en) | 2007-12-16 | 2013-06-04 | Apple Inc. | Efficient data storage in multi-plane memory devices |
| JP5150245B2 (ja) * | 2007-12-27 | 2013-02-20 | 株式会社東芝 | 半導体記憶装置 |
| US8085586B2 (en) | 2007-12-27 | 2011-12-27 | Anobit Technologies Ltd. | Wear level estimation in analog memory cells |
| US8156398B2 (en) | 2008-02-05 | 2012-04-10 | Anobit Technologies Ltd. | Parameter estimation based on error correction code parity check equations |
| US7924587B2 (en) | 2008-02-21 | 2011-04-12 | Anobit Technologies Ltd. | Programming of analog memory cells using a single programming pulse per state transition |
| US7864573B2 (en) | 2008-02-24 | 2011-01-04 | Anobit Technologies Ltd. | Programming analog memory cells for reduced variance after retention |
| US8230300B2 (en) | 2008-03-07 | 2012-07-24 | Apple Inc. | Efficient readout from analog memory cells using data compression |
| KR101378365B1 (ko) * | 2008-03-12 | 2014-03-28 | 삼성전자주식회사 | 하이브리드 메모리 데이터 검출 장치 및 방법 |
| US8400858B2 (en) | 2008-03-18 | 2013-03-19 | Apple Inc. | Memory device with reduced sense time readout |
| US8059457B2 (en) | 2008-03-18 | 2011-11-15 | Anobit Technologies Ltd. | Memory device with multiple-accuracy read commands |
| WO2009139115A1 (ja) * | 2008-05-12 | 2009-11-19 | パナソニック株式会社 | 半導体記録装置 |
| US8464131B2 (en) | 2008-06-23 | 2013-06-11 | Ramot At Tel Aviv University Ltd. | Reading a flash memory by constrained decoding |
| US8458563B2 (en) | 2008-06-23 | 2013-06-04 | Ramot At Tel Aviv University Ltd. | Reading a flash memory by joint decoding and cell voltage distribution tracking |
| US7924613B1 (en) | 2008-08-05 | 2011-04-12 | Anobit Technologies Ltd. | Data storage in analog memory cells with protection against programming interruption |
| US7995388B1 (en) | 2008-08-05 | 2011-08-09 | Anobit Technologies Ltd. | Data storage using modified voltages |
| US8949684B1 (en) | 2008-09-02 | 2015-02-03 | Apple Inc. | Segmented data storage |
| US8169825B1 (en) | 2008-09-02 | 2012-05-01 | Anobit Technologies Ltd. | Reliable data storage in analog memory cells subjected to long retention periods |
| US8482978B1 (en) | 2008-09-14 | 2013-07-09 | Apple Inc. | Estimation of memory cell read thresholds by sampling inside programming level distribution intervals |
| US8000135B1 (en) | 2008-09-14 | 2011-08-16 | Anobit Technologies Ltd. | Estimation of memory cell read thresholds by sampling inside programming level distribution intervals |
| US8239734B1 (en) | 2008-10-15 | 2012-08-07 | Apple Inc. | Efficient data storage in storage device arrays |
| US8713330B1 (en) | 2008-10-30 | 2014-04-29 | Apple Inc. | Data scrambling in memory devices |
| US8208304B2 (en) | 2008-11-16 | 2012-06-26 | Anobit Technologies Ltd. | Storage at M bits/cell density in N bits/cell analog memory cell devices, M>N |
| US8174857B1 (en) | 2008-12-31 | 2012-05-08 | Anobit Technologies Ltd. | Efficient readout schemes for analog memory cell devices using multiple read threshold sets |
| US8248831B2 (en) | 2008-12-31 | 2012-08-21 | Apple Inc. | Rejuvenation of analog memory cells |
| US8924661B1 (en) | 2009-01-18 | 2014-12-30 | Apple Inc. | Memory system including a controller and processors associated with memory devices |
| US8228701B2 (en) | 2009-03-01 | 2012-07-24 | Apple Inc. | Selective activation of programming schemes in analog memory cell arrays |
| US8832354B2 (en) | 2009-03-25 | 2014-09-09 | Apple Inc. | Use of host system resources by memory controller |
| US8259506B1 (en) | 2009-03-25 | 2012-09-04 | Apple Inc. | Database of memory read thresholds |
| US8238157B1 (en) | 2009-04-12 | 2012-08-07 | Apple Inc. | Selective re-programming of analog memory cells |
| US8479080B1 (en) | 2009-07-12 | 2013-07-02 | Apple Inc. | Adaptive over-provisioning in memory systems |
| US8495465B1 (en) | 2009-10-15 | 2013-07-23 | Apple Inc. | Error correction coding over multiple memory pages |
| US8677054B1 (en) | 2009-12-16 | 2014-03-18 | Apple Inc. | Memory management schemes for non-volatile memory devices |
| US8694814B1 (en) | 2010-01-10 | 2014-04-08 | Apple Inc. | Reuse of host hibernation storage space by memory controller |
| US8677203B1 (en) | 2010-01-11 | 2014-03-18 | Apple Inc. | Redundant data storage schemes for multi-die memory systems |
| US8694853B1 (en) | 2010-05-04 | 2014-04-08 | Apple Inc. | Read commands for reading interfering memory cells |
| US8572423B1 (en) | 2010-06-22 | 2013-10-29 | Apple Inc. | Reducing peak current in memory systems |
| US8595591B1 (en) | 2010-07-11 | 2013-11-26 | Apple Inc. | Interference-aware assignment of programming levels in analog memory cells |
| US9104580B1 (en) | 2010-07-27 | 2015-08-11 | Apple Inc. | Cache memory for hybrid disk drives |
| US8645794B1 (en) | 2010-07-31 | 2014-02-04 | Apple Inc. | Data storage in analog memory cells using a non-integer number of bits per cell |
| US8856475B1 (en) | 2010-08-01 | 2014-10-07 | Apple Inc. | Efficient selection of memory blocks for compaction |
| US8493781B1 (en) | 2010-08-12 | 2013-07-23 | Apple Inc. | Interference mitigation using individual word line erasure operations |
| US8694854B1 (en) | 2010-08-17 | 2014-04-08 | Apple Inc. | Read threshold setting based on soft readout statistics |
| US8499227B2 (en) * | 2010-09-23 | 2013-07-30 | Micron Technology, Inc. | Memory quality monitor based compensation method and apparatus |
| US9021181B1 (en) | 2010-09-27 | 2015-04-28 | Apple Inc. | Memory management for unifying memory cell conditions by using maximum time intervals |
| US8787079B2 (en) * | 2012-05-07 | 2014-07-22 | Sandisk Technologies Inc. | Reading data from multi-level cell memory |
| KR101961318B1 (ko) | 2012-09-07 | 2019-07-17 | 삼성전자주식회사 | 중앙처리장치에서의 점유시간을 최소화하는 방어코드 운영 방법 및 그에 따른 메모리 시스템 |
| US8854079B2 (en) * | 2013-01-30 | 2014-10-07 | Texas Instruments Incorporated | Error detection in nonvolatile logic arrays using parity |
| CN104916330B (zh) * | 2014-03-10 | 2019-04-12 | 东芝存储器株式会社 | 存储装置、存储器控制器及存储器控制方法 |
| US11556416B2 (en) | 2021-05-05 | 2023-01-17 | Apple Inc. | Controlling memory readout reliability and throughput by adjusting distance between read thresholds |
| US11847342B2 (en) | 2021-07-28 | 2023-12-19 | Apple Inc. | Efficient transfer of hard data and confidence levels in reading a nonvolatile memory |
Family Cites Families (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5475693A (en) * | 1994-12-27 | 1995-12-12 | Intel Corporation | Error management processes for flash EEPROM memory arrays |
| US6029264A (en) * | 1997-04-28 | 2000-02-22 | The Trustees Of Princeton University | System and method for error correcting a received data stream in a concatenated system |
| JPH11317095A (ja) * | 1997-06-06 | 1999-11-16 | Nippon Steel Corp | 半導体記憶装置、その使用方法及びその読み出し方法並びに使用方法及び読み出し方法が記憶された記憶媒体 |
| US6212654B1 (en) * | 1997-07-22 | 2001-04-03 | Lucent Technologies Inc. | Coded modulation for digital storage in analog memory devices |
| JP3605266B2 (ja) * | 1997-08-12 | 2004-12-22 | 新日本製鐵株式会社 | 半導体記憶装置及び読み出し方法並びに読み出し方法が記録された記録媒体 |
| US5909449A (en) * | 1997-09-08 | 1999-06-01 | Invox Technology | Multibit-per-cell non-volatile memory with error detection and correction |
| JP3648057B2 (ja) * | 1997-12-09 | 2005-05-18 | 新日本製鐵株式会社 | 半導体記憶装置及びその使用方法、並びに記録媒体 |
| JP3165101B2 (ja) * | 1998-03-05 | 2001-05-14 | 日本電気アイシーマイコンシステム株式会社 | 多値式半導体メモリ装置およびその不良救済方法 |
| JPH11283396A (ja) * | 1998-03-27 | 1999-10-15 | Sony Corp | メモリ装置 |
| JP3308915B2 (ja) * | 1998-11-11 | 2002-07-29 | エヌイーシーマイクロシステム株式会社 | 不良救済用メモリセル及びそれを用いた記憶装置 |
| KR100371022B1 (ko) * | 1998-11-26 | 2003-07-16 | 주식회사 하이닉스반도체 | 다중비트 메모리셀의 데이터 센싱장치 |
| DE60043881D1 (de) * | 1999-12-20 | 2010-04-08 | Koninkl Philips Electronics Nv | Empfänger mit verbessertem dekoder |
| US6625236B1 (en) * | 2000-02-08 | 2003-09-23 | Ericsson Inc. | Methods and systems for decoding symbols by combining matched-filtered samples with hard symbol decisions |
| JP2001332096A (ja) * | 2000-05-16 | 2001-11-30 | Hitachi Ltd | 不揮発性半導体メモリおよび不揮発性半導体メモリを用いた記録再生装置 |
| JP4323707B2 (ja) * | 2000-10-25 | 2009-09-02 | 富士通マイクロエレクトロニクス株式会社 | フラッシュメモリの欠陥管理方法 |
| JP2003036693A (ja) * | 2001-05-16 | 2003-02-07 | Fujitsu Ltd | 多値半導体メモリの誤り検出・訂正方法および誤り検出・訂正機能を有する多値半導体メモリ |
| US6751766B2 (en) * | 2002-05-20 | 2004-06-15 | Sandisk Corporation | Increasing the effectiveness of error correction codes and operating multi-level memory systems by using information about the quality of the stored data |
| JP3917563B2 (ja) * | 2002-07-03 | 2007-05-23 | ヒューズ・エレクトロニクス・コーポレーション | 低密度のパリティチェック（ｌｄｐｃ）コードをデコードする方法およびシステム |
| JP2005078721A (ja) * | 2003-09-01 | 2005-03-24 | Nippon Telegr & Teleph Corp <Ntt> | 誤り訂正方法およびメモリ回路 |
| US20050213393A1 (en) * | 2004-03-14 | 2005-09-29 | M-Systems Flash Disk Pioneers, Ltd. | States encoding in multi-bit flash cells for optimizing error rate |
| US7966547B2 (en) * | 2007-07-02 | 2011-06-21 | International Business Machines Corporation | Multi-bit error correction scheme in multi-level memory storage system |
-
2006
- 2006-10-15 WO PCT/IL2006/001175 patent/WO2007046084A2/en active Application Filing
- 2006-10-15 AT AT06809752T patent/ATE534999T1/de active
- 2006-10-15 CN CN200680044045.2A patent/CN101529525B/zh not_active Expired - Fee Related
- 2006-10-15 KR KR1020087010944A patent/KR100943340B1/ko not_active IP Right Cessation
- 2006-10-15 JP JP2008535184A patent/JP4825874B2/ja not_active Expired - Fee Related
- 2006-10-15 EP EP06809752A patent/EP1952290B1/de not_active Not-in-force
Also Published As
| Publication number | Publication date |
|---|---|
| JP2009512112A (ja) | 2009-03-19 |
| EP1952290B1 (de) | 2011-11-23 |
| KR20080077604A (ko) | 2008-08-25 |
| KR100943340B1 (ko) | 2010-02-19 |
| JP4825874B2 (ja) | 2011-11-30 |
| EP1952290A4 (de) | 2009-11-25 |
| EP1952290A2 (de) | 2008-08-06 |
| CN101529525B (zh) | 2016-03-30 |
| CN101529525A (zh) | 2009-09-09 |
| WO2007046084A3 (en) | 2009-04-09 |
| WO2007046084A2 (en) | 2007-04-26 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| ATE534999T1 (de) | Probabilistische fehlerkorrektur in einem mehrbit-pro-zelle-flash-speicher | |
| ATE489675T1 (de) | Verfahren zur fehlerkorrektur in mbc-flash- speicher | |
| US7526715B2 (en) | Probabilistic error correction in multi-bit-per-cell flash memory | |
| US8832526B2 (en) | Data reading method, memory controller, and memory storage device | |
| ATE506649T1 (de) | Korrektur von fehlern in einem speicherarray | |
| US7818653B2 (en) | Methods of soft-input soft-output decoding for nonvolatile memory | |
| US7581154B2 (en) | Method and apparatus to lower operating voltages for memory arrays using error correcting codes | |
| EP2763042B1 (de) | Detektion und Decodierung in Flash-Speichern mit selektiver binärer und nichtbinärer Codierung | |
| US9502117B2 (en) | Cell-level statistics collection for detection and decoding in flash memories | |
| US9411679B2 (en) | Code modulation encoder and decoder, memory controller including them, and flash memory system | |
| US20080082897A1 (en) | Soft-Input Soft-Output Decoder for Nonvolatile Memory | |
| US20130179749A1 (en) | Method and system of dynamic data storage for error correction in a memory device | |
| US10903861B2 (en) | Method and device for generating soft decision detection parameters | |
| JP2003115197A5 (de) | ||
| US9312885B2 (en) | Nonvolatile semiconductor memory system error correction capability of which is improved | |
| WO2008053472A3 (en) | Reading memory cells using multiple thresholds | |
| WO2009074978A2 (en) | Systems and methods for error correction and decoding on multi-level physical media | |
| WO2011146364A2 (en) | Joint encoding of logical pages in multi-page memory architecture | |
| WO2010080257A3 (en) | Data error recovery in non-volatile memory | |
| WO2008058082A3 (en) | Adaptive read and write systems and methods for memory cells | |
| CN112988453B (zh) | 用于闪存的数据恢复方法 | |
| WO2014167535A3 (en) | Restoring ecc syndrome in non-volatile memory devices | |
| US7213191B2 (en) | System and method for securely storing data in a memory | |
| US20160077914A1 (en) | Solid state storage device and error correction method thereof | |
| US9959166B2 (en) | Error correction for non-volatile memory |