ATE533128T1 - Verfahren zum überprüfen von abdrücken - Google Patents
Verfahren zum überprüfen von abdrückenInfo
- Publication number
- ATE533128T1 ATE533128T1 AT03292310T AT03292310T ATE533128T1 AT E533128 T1 ATE533128 T1 AT E533128T1 AT 03292310 T AT03292310 T AT 03292310T AT 03292310 T AT03292310 T AT 03292310T AT E533128 T1 ATE533128 T1 AT E533128T1
- Authority
- AT
- Austria
- Prior art keywords
- image
- prepare
- applying
- filter applied
- gray scale
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
- G06T7/12—Edge-based segmentation
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
- G06T7/155—Segmentation; Edge detection involving morphological operators
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30144—Printing quality
Landscapes
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Immunology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Signal Processing (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- Quality & Reliability (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
- Inking, Control Or Cleaning Of Printing Machines (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002275115A JP3669698B2 (ja) | 2002-09-20 | 2002-09-20 | 印刷物の検査方法及び検査装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE533128T1 true ATE533128T1 (de) | 2011-11-15 |
Family
ID=31944604
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT03292310T ATE533128T1 (de) | 2002-09-20 | 2003-09-19 | Verfahren zum überprüfen von abdrücken |
Country Status (4)
Country | Link |
---|---|
US (1) | US7260244B2 (de) |
EP (1) | EP1400922B1 (de) |
JP (1) | JP3669698B2 (de) |
AT (1) | ATE533128T1 (de) |
Families Citing this family (43)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004017318A (ja) * | 2002-06-12 | 2004-01-22 | Seiko Epson Corp | 画像パターン出力精度の評価方法 |
US7502116B2 (en) * | 2003-09-09 | 2009-03-10 | Hewlett-Packard Development Company, L.P. | Densitometers and methods for measuring optical density |
DE102004019978B3 (de) * | 2004-04-23 | 2005-08-04 | Koenig & Bauer Ag | Verfahren zur Beurteilung einer Qualität einer von einer Druckmaschine produzierten Drucksache |
JP2006098151A (ja) * | 2004-09-29 | 2006-04-13 | Dainippon Screen Mfg Co Ltd | パターン検査装置およびパターン検査方法 |
JP4758263B2 (ja) * | 2005-03-30 | 2011-08-24 | ヤマハ発動機株式会社 | 部品移載装置、表面実装機および部品検査装置 |
US8717647B2 (en) * | 2005-10-13 | 2014-05-06 | Hewlett-Packard Development Company, L.P. | Imaging methods, imaging device calibration methods, imaging devices, and hard imaging device sensor assemblies |
JP2007161257A (ja) * | 2005-12-09 | 2007-06-28 | Nihon Tetra Pak Kk | 紙製包装容器用外観検査装置 |
JP2009115565A (ja) * | 2007-11-06 | 2009-05-28 | Dainippon Printing Co Ltd | 打抜き片の検査装置 |
WO2009097687A1 (en) * | 2008-02-05 | 2009-08-13 | CENTRE DE RECHERCHE INDUSTRIELLE DU QUéBEC | Method and apparatus for measuring size distribution of granular matter |
JP5521440B2 (ja) * | 2009-08-28 | 2014-06-11 | 株式会社リコー | 画像検査装置、画像検査方法、プログラムおよび記録媒体 |
JP5324391B2 (ja) * | 2009-10-22 | 2013-10-23 | キヤノン株式会社 | 画像処理装置およびその制御方法 |
JP5537121B2 (ja) | 2009-10-30 | 2014-07-02 | キヤノン株式会社 | 画像処理装置およびその制御方法 |
CN102811863B (zh) * | 2010-01-21 | 2015-07-22 | 惠普印迪戈股份公司 | 打印图像的自动检查 |
JP5411049B2 (ja) * | 2010-04-07 | 2014-02-12 | オムロン株式会社 | 画像処理装置 |
CN101984346A (zh) * | 2010-10-19 | 2011-03-09 | 浙江大学 | 基于低通滤波的水果表面缺陷检测方法 |
US8922641B2 (en) | 2011-06-29 | 2014-12-30 | The Procter & Gamble Company | System and method for inspecting components of hygienic articles |
JP5699051B2 (ja) * | 2011-07-15 | 2015-04-08 | 株式会社Screenホールディングス | 画像検査装置および画像記録装置、並びに、画像検査方法 |
CN103175839A (zh) * | 2011-12-21 | 2013-06-26 | 北京兆维电子(集团)有限责任公司 | 胶印版材表面检测的处理方法及系统 |
JP6010933B2 (ja) | 2012-03-08 | 2016-10-19 | 富士ゼロックス株式会社 | 印刷システムおよび画像形成装置 |
CN103175844A (zh) * | 2012-03-16 | 2013-06-26 | 沈阳理工大学 | 一种金属零部件表面划痕缺陷检测方法 |
US8805025B2 (en) * | 2012-03-30 | 2014-08-12 | Ncr Corporation | Stain detection |
CN102788806B (zh) * | 2012-07-19 | 2014-09-03 | 北京农业智能装备技术研究中心 | 基于类球形亮度变换的水果表面缺陷检测方法 |
CN102809565A (zh) * | 2012-08-29 | 2012-12-05 | 常州大学 | 一种消失模切削表面质量的检测方法 |
JP6286921B2 (ja) * | 2012-09-14 | 2018-03-07 | 株式会社リコー | 画像検査装置、画像検査システム及び画像検査方法 |
CN103760165B (zh) * | 2013-12-31 | 2016-08-17 | 深圳市华星光电技术有限公司 | 显示面板的缺陷检测方法及缺陷检测装置 |
CN104296667A (zh) * | 2014-11-07 | 2015-01-21 | 重庆邮电大学 | 基于优化盒维数图像匹配的微机电系统面内位移测量方法 |
JP6327163B2 (ja) * | 2015-01-28 | 2018-05-23 | 京セラドキュメントソリューションズ株式会社 | 検査装置および検査方法 |
DE102015204800B3 (de) | 2015-03-17 | 2016-12-01 | MTU Aero Engines AG | Verfahren und Vorrichtung zur Qualitätsbeurteilung eines mittels eines additiven Herstellungsverfahrens hergestellten Bauteils |
JP6694362B2 (ja) * | 2016-09-30 | 2020-05-13 | 富士フイルム株式会社 | 画像検査方法及び装置、プログラム並びに画像記録システム |
CN107610090B (zh) * | 2017-07-15 | 2020-09-18 | 河北工业大学 | 一种光伏电池片表面栅线偏移的检测方法 |
CN108416765B (zh) * | 2018-01-30 | 2020-08-18 | 华南理工大学 | 一种字符缺陷自动检测方法和系统 |
JP2019158757A (ja) * | 2018-03-15 | 2019-09-19 | コニカミノルタ株式会社 | 画像処理装置およびプログラム |
US10643332B2 (en) * | 2018-03-29 | 2020-05-05 | Uveye Ltd. | Method of vehicle image comparison and system thereof |
US10650530B2 (en) * | 2018-03-29 | 2020-05-12 | Uveye Ltd. | Method of vehicle image comparison and system thereof |
JP2019217724A (ja) * | 2018-06-22 | 2019-12-26 | コニカミノルタ株式会社 | 画像検査装置、画像形成システム及びプログラム |
CN109580632B (zh) * | 2018-11-23 | 2021-03-30 | 京东方科技集团股份有限公司 | 一种缺陷确定方法、装置及存储介质 |
DE102019106437A1 (de) * | 2019-03-13 | 2020-09-17 | Bundesdruckerei Gmbh | Vorrichtung zum Erfassen eines Oberflächendefekts eines Identifikationsdokumentes |
CN112991243B (zh) * | 2019-12-17 | 2023-08-25 | 中国科学院沈阳自动化研究所 | 均匀目标表面缺陷检测灰度照度补偿方法 |
CN111060527B (zh) | 2019-12-30 | 2021-10-29 | 歌尔股份有限公司 | 一种字符缺陷检测方法及装置 |
JP7474067B2 (ja) * | 2020-02-26 | 2024-04-24 | キヤノン株式会社 | 画像処理装置、画像処理方法 |
CN112834515B (zh) * | 2020-12-30 | 2022-09-23 | 常州创度信息技术有限公司 | 一种基于图像处理的产品表面检测系统 |
CN113034488B (zh) * | 2021-04-13 | 2024-04-19 | 荣旗工业科技(苏州)股份有限公司 | 一种喷墨印刷品的视觉检测方法 |
CN113450316B (zh) * | 2021-06-09 | 2022-03-22 | 广州大学 | 一种金属表面字符缺陷检测方法、系统、装置及存储介质 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2556894B2 (ja) | 1988-12-19 | 1996-11-27 | 株式会社小森コーポレーション | 印刷物の品質検査装置及びその方法 |
US5063448A (en) | 1989-07-31 | 1991-11-05 | Imageware Research And Development Inc. | Apparatus and method for transforming a digitized signal of an image |
US5365596A (en) * | 1992-12-17 | 1994-11-15 | Philip Morris Incorporated | Methods and apparatus for automatic image inspection of continuously moving objects |
JP2822830B2 (ja) | 1993-01-08 | 1998-11-11 | ダックエンジニアリング株式会社 | シート状印刷物の欠陥検出方法 |
JPH0763691A (ja) | 1993-08-24 | 1995-03-10 | Toshiba Corp | パターン欠陥検査方法及びその装置 |
JP3322958B2 (ja) | 1993-09-22 | 2002-09-09 | 株式会社東芝 | 印刷物検査装置 |
JPH07186375A (ja) | 1993-12-28 | 1995-07-25 | Toppan Printing Co Ltd | 印刷物の検査方法 |
JP3598558B2 (ja) | 1995-02-07 | 2004-12-08 | 凸版印刷株式会社 | 印刷物の周期性連続欠陥検出方法及び装置 |
US5828771A (en) * | 1995-12-15 | 1998-10-27 | Xerox Corporation | Method and article of manufacture for determining whether a scanned image is an original image or fax image |
US5848189A (en) * | 1996-03-25 | 1998-12-08 | Focus Automation Systems Inc. | Method, apparatus and system for verification of patterns |
US6061476A (en) | 1997-11-24 | 2000-05-09 | Cognex Corporation | Method and apparatus using image subtraction and dynamic thresholding |
WO2002019698A2 (en) * | 2000-08-31 | 2002-03-07 | Rytec Corporation | Sensor and imaging system |
US7017492B2 (en) * | 2003-03-10 | 2006-03-28 | Quad/Tech, Inc. | Coordinating the functioning of a color control system and a defect detection system for a printing press |
-
2002
- 2002-09-20 JP JP2002275115A patent/JP3669698B2/ja not_active Expired - Fee Related
-
2003
- 2003-09-18 US US10/667,075 patent/US7260244B2/en active Active
- 2003-09-19 EP EP03292310A patent/EP1400922B1/de not_active Expired - Lifetime
- 2003-09-19 AT AT03292310T patent/ATE533128T1/de active
Also Published As
Publication number | Publication date |
---|---|
US7260244B2 (en) | 2007-08-21 |
JP2004109047A (ja) | 2004-04-08 |
EP1400922A1 (de) | 2004-03-24 |
EP1400922B1 (de) | 2011-11-09 |
US20040057629A1 (en) | 2004-03-25 |
JP3669698B2 (ja) | 2005-07-13 |
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