ATE4749T1 - Verfahren und apparat zur abstandsmessung durch laserinterferometrie mit zwei wellenlaengen. - Google Patents
Verfahren und apparat zur abstandsmessung durch laserinterferometrie mit zwei wellenlaengen.Info
- Publication number
- ATE4749T1 ATE4749T1 AT80401476T AT80401476T ATE4749T1 AT E4749 T1 ATE4749 T1 AT E4749T1 AT 80401476 T AT80401476 T AT 80401476T AT 80401476 T AT80401476 T AT 80401476T AT E4749 T1 ATE4749 T1 AT E4749T1
- Authority
- AT
- Austria
- Prior art keywords
- distance
- dual
- distance measurement
- wavelength laser
- rough estimate
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02056—Passive reduction of errors
- G01B9/02057—Passive reduction of errors by using common path configuration, i.e. reference and object path almost entirely overlapping
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
- G01B9/02004—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies using frequency scans
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02007—Two or more frequencies or sources used for interferometric measurement
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02041—Interferometers characterised by particular imaging or detection techniques
- G01B9/02048—Rough and fine measurement
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02062—Active error reduction, i.e. varying with time
- G01B9/02067—Active error reduction, i.e. varying with time by electronic control systems, i.e. using feedback acting on optics or light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/25—Fabry-Perot in interferometer, e.g. etalon, cavity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/45—Multiple detectors for detecting interferometer signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/70—Using polarization in the interferometer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Optics & Photonics (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
- Optical Radar Systems And Details Thereof (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7925771A FR2468099A1 (fr) | 1979-10-17 | 1979-10-17 | Procede et appareil d'interferometrie laser a deux longueurs d'ondes |
EP80401476A EP0027763B1 (de) | 1979-10-17 | 1980-10-16 | Verfahren und Apparat zur Abstandsmessung durch Laserinterferometrie mit zwei Wellenlängen |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE4749T1 true ATE4749T1 (de) | 1983-10-15 |
Family
ID=9230752
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT80401476T ATE4749T1 (de) | 1979-10-17 | 1980-10-16 | Verfahren und apparat zur abstandsmessung durch laserinterferometrie mit zwei wellenlaengen. |
Country Status (5)
Country | Link |
---|---|
US (1) | US4492464A (de) |
EP (1) | EP0027763B1 (de) |
AT (1) | ATE4749T1 (de) |
DE (1) | DE3064960D1 (de) |
FR (1) | FR2468099A1 (de) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4611915A (en) * | 1983-06-07 | 1986-09-16 | The United States Of America As Represented By The Secretary Of The Air Force | Absolute distance sensor |
US4830486A (en) * | 1984-03-16 | 1989-05-16 | Goodwin Frank E | Frequency modulated lasar radar |
US4593368A (en) * | 1984-06-04 | 1986-06-03 | Kollmorgen Technologies Corporation | Technique for measuring very small spacings |
FR2592950B1 (fr) * | 1986-01-14 | 1988-01-29 | Sopelem | Dispositif optique de mesure de petits angles |
DE3736772A1 (de) * | 1987-08-05 | 1989-05-11 | Bundesrep Deutschland | Laser-doppler-anemometer |
JPH0198902A (ja) * | 1987-10-12 | 1989-04-17 | Res Dev Corp Of Japan | 光波干渉測長装置 |
JPH0749923B2 (ja) * | 1989-05-31 | 1995-05-31 | 大日本スクリーン製造株式会社 | レーザ測長器のための単位変換装置 |
US4995697A (en) * | 1989-09-07 | 1991-02-26 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Fiber optic sensing system |
FR2664603B1 (fr) * | 1990-07-10 | 1994-04-29 | Roquette Freres | Procede de permutation ionique d'amidons ionises et amidons ionises ainsi obtenus. |
DE4033253A1 (de) * | 1990-10-19 | 1992-04-23 | Hommelwerke Gmbh | Optisches interferometer |
US5371587A (en) * | 1992-05-06 | 1994-12-06 | The Boeing Company | Chirped synthetic wavelength laser radar |
US5430537A (en) * | 1993-09-03 | 1995-07-04 | Dynamics Research Corporation | Light beam distance encoder |
AU2854500A (en) | 1999-01-20 | 2000-08-07 | Karl B. Schmidt | Methods and apparatus for providing feedback to a subject in connection with performing a task |
DE19902455A1 (de) * | 1999-01-22 | 2000-08-10 | Bosch Gmbh Robert | Abstandsmeßverfahren und -vorrichtung |
US7557929B2 (en) | 2001-12-18 | 2009-07-07 | Massachusetts Institute Of Technology | Systems and methods for phase measurements |
US6934035B2 (en) * | 2001-12-18 | 2005-08-23 | Massachusetts Institute Of Technology | System and method for measuring optical distance |
US7215413B2 (en) * | 2005-06-24 | 2007-05-08 | The Boeing Company | Chirped synthetic wave laser radar apparatus and methods |
EP2182387A1 (de) | 2008-10-30 | 2010-05-05 | EADS Construcciones Aeronauticas, S.A. | Anzeigesystem und Verfahren für Auftankvorgänge |
EP2806246B1 (de) * | 2013-05-24 | 2019-11-20 | Attocube Systems AG | Doppellaserinterferometer |
CN106092514B (zh) * | 2015-04-28 | 2018-10-02 | 南京理工大学 | 基于双波长斐索干涉仪的光学非均匀性测量装置及方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL6904621A (de) * | 1969-03-25 | 1970-09-29 | ||
FR2051899A5 (de) * | 1969-07-01 | 1971-04-09 | Sud Aviation | |
US3661464A (en) * | 1970-03-16 | 1972-05-09 | Jorway Corp | Optical interferometer |
FR2245932A1 (en) * | 1973-06-15 | 1975-04-25 | Orszag Alain | Distance measuring interferometric instrument - has molecular laser for measuring distances of several hundred metres |
US3970389A (en) * | 1974-02-14 | 1976-07-20 | Mendrin Michael J | Variable frequency interferometer |
-
1979
- 1979-10-17 FR FR7925771A patent/FR2468099A1/fr active Granted
-
1980
- 1980-10-16 AT AT80401476T patent/ATE4749T1/de not_active IP Right Cessation
- 1980-10-16 EP EP80401476A patent/EP0027763B1/de not_active Expired
- 1980-10-16 DE DE8080401476T patent/DE3064960D1/de not_active Expired
-
1984
- 1984-03-27 US US06/593,927 patent/US4492464A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0027763A1 (de) | 1981-04-29 |
FR2468099A1 (fr) | 1981-04-30 |
US4492464A (en) | 1985-01-08 |
FR2468099B1 (de) | 1983-09-30 |
DE3064960D1 (en) | 1983-10-27 |
EP0027763B1 (de) | 1983-09-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
UEP | Publication of translation of european patent specification | ||
REN | Ceased due to non-payment of the annual fee |