JPS5599045A - Surface reflection measuring apparatus - Google Patents

Surface reflection measuring apparatus

Info

Publication number
JPS5599045A
JPS5599045A JP691479A JP691479A JPS5599045A JP S5599045 A JPS5599045 A JP S5599045A JP 691479 A JP691479 A JP 691479A JP 691479 A JP691479 A JP 691479A JP S5599045 A JPS5599045 A JP S5599045A
Authority
JP
Japan
Prior art keywords
luminous flux
test piece
energy
route
measuring apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP691479A
Other languages
Japanese (ja)
Inventor
Shigeyuki Kimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jasco Corp
Original Assignee
Japan Spectroscopic Co Ltd
Nihon Bunko Kogyo KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Spectroscopic Co Ltd, Nihon Bunko Kogyo KK filed Critical Japan Spectroscopic Co Ltd
Priority to JP691479A priority Critical patent/JPS5599045A/en
Publication of JPS5599045A publication Critical patent/JPS5599045A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity

Abstract

PURPOSE:To obtain the absolute value of the reflection factor through a highly accurate measurement of a test piece having a high reflection rate by performing an energy damping of the luminous flux on the test piece exponentialwise while the luminous flux is reflected on the surface of the test piece at more than the specified times. CONSTITUTION:In absence of object S to be measured, the standard luminous flux passes through the route of Mirror M4-M5-M6. In the presence of the object S, the luminous flux projected to the test piece passes through the route of S-M4-S-M5-S- M6-S. As a result, the test piece luminous flux is exponentially damped in the energy. This makes the test piece luminous flux larger in the difference of the energy than the standard luminous flux, allowing highly accurate measurement.
JP691479A 1979-01-24 1979-01-24 Surface reflection measuring apparatus Pending JPS5599045A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP691479A JPS5599045A (en) 1979-01-24 1979-01-24 Surface reflection measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP691479A JPS5599045A (en) 1979-01-24 1979-01-24 Surface reflection measuring apparatus

Publications (1)

Publication Number Publication Date
JPS5599045A true JPS5599045A (en) 1980-07-28

Family

ID=11651498

Family Applications (1)

Application Number Title Priority Date Filing Date
JP691479A Pending JPS5599045A (en) 1979-01-24 1979-01-24 Surface reflection measuring apparatus

Country Status (1)

Country Link
JP (1) JPS5599045A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5735704A (en) * 1980-08-13 1982-02-26 Nippon Steel Corp Surface state measuring method of metallic plate and its device
JPS5886408A (en) * 1981-11-18 1983-05-24 Matsushita Electric Ind Co Ltd Detector and extractor for surface strain or the like
JPS5930004A (en) * 1982-08-09 1984-02-17 インタ−ナシヨナル　ビジネス　マシ−ンズ　コ−ポレ−シヨン Measuring device for film thickness

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5161875A (en) * 1974-11-27 1976-05-28 Hitachi Ltd ZETSUTAI HANSHARITSU SOKUTE ISOCHI
JPS5333484B2 (en) * 1973-05-16 1978-09-14

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5333484B2 (en) * 1973-05-16 1978-09-14
JPS5161875A (en) * 1974-11-27 1976-05-28 Hitachi Ltd ZETSUTAI HANSHARITSU SOKUTE ISOCHI

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5735704A (en) * 1980-08-13 1982-02-26 Nippon Steel Corp Surface state measuring method of metallic plate and its device
JPS5886408A (en) * 1981-11-18 1983-05-24 Matsushita Electric Ind Co Ltd Detector and extractor for surface strain or the like
JPH0311403B2 (en) * 1981-11-18 1991-02-15 Matsushita Electric Ind Co Ltd
JPS5930004A (en) * 1982-08-09 1984-02-17 インタ−ナシヨナル　ビジネス　マシ−ンズ　コ−ポレ−シヨン Measuring device for film thickness
JPH0326764B2 (en) * 1982-08-09 1991-04-11 Intaanashonaru Bijinesu Mashiinzu Corp

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