ATE42402T1 - System zum messen der thermischen verformung von keramik und aehnlichem. - Google Patents
System zum messen der thermischen verformung von keramik und aehnlichem.Info
- Publication number
- ATE42402T1 ATE42402T1 AT84305300T AT84305300T ATE42402T1 AT E42402 T1 ATE42402 T1 AT E42402T1 AT 84305300 T AT84305300 T AT 84305300T AT 84305300 T AT84305300 T AT 84305300T AT E42402 T1 ATE42402 T1 AT E42402T1
- Authority
- AT
- Austria
- Prior art keywords
- thermal deformation
- ceramic
- similar
- measuring thermal
- deformation measuring
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14796683A JPS6039540A (ja) | 1983-08-15 | 1983-08-15 | 熱膨張率測定装置 |
JP12752684A JPS617452A (ja) | 1984-06-22 | 1984-06-22 | セラミツク等の熱間における変位測定装置 |
EP84305300A EP0145115B1 (de) | 1983-08-15 | 1984-08-03 | System zum Messen der thermischen Verformung von Keramik und ähnlichem |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE42402T1 true ATE42402T1 (de) | 1989-05-15 |
Family
ID=26463472
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT84305300T ATE42402T1 (de) | 1983-08-15 | 1984-08-03 | System zum messen der thermischen verformung von keramik und aehnlichem. |
Country Status (5)
Country | Link |
---|---|
US (1) | US4636969A (de) |
EP (1) | EP0145115B1 (de) |
KR (1) | KR910004158B1 (de) |
AT (1) | ATE42402T1 (de) |
DE (1) | DE3477836D1 (de) |
Families Citing this family (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5350899A (en) * | 1992-04-15 | 1994-09-27 | Hiroichi Ishikawa | Semiconductor wafer temperature determination by optical measurement of wafer expansion in processing apparatus chamber |
FR2595814A1 (fr) * | 1986-03-14 | 1987-09-18 | Bertin & Cie | Procede et dispositif de mesure du diametre d'une fibre, en particulier d'une fibre optique |
US5099096A (en) * | 1990-04-05 | 1992-03-24 | Martin Marietta Energy Systems, Inc. | Microwave furnace having microwave compatible dilatometer |
US5143689A (en) * | 1990-11-09 | 1992-09-01 | The Standard Oil Company | Method for determining the coefficient of thermal expansion of coke |
JP2976574B2 (ja) * | 1991-04-16 | 1999-11-10 | 住友電気工業株式会社 | セラミックスの評価方法 |
US5221142A (en) * | 1991-05-20 | 1993-06-22 | Peak Systems, Inc. | Method and apparatus for temperature measurement using thermal expansion |
JPH05223761A (ja) * | 1992-02-07 | 1993-08-31 | Nippon Seiko Kk | 焼入検査方法 |
JP3210073B2 (ja) * | 1992-04-24 | 2001-09-17 | 愛三工業株式会社 | ステップモータ制御装置 |
US5645351A (en) * | 1992-05-20 | 1997-07-08 | Hitachi, Ltd. | Temperature measuring method using thermal expansion and an apparatus for carrying out the same |
FR2706613B1 (fr) * | 1993-06-17 | 1995-09-01 | Aerospatiale | Procédé pour déterminer la résistance à la déchirure ductile d'un matériau. |
US5757473A (en) * | 1996-11-13 | 1998-05-26 | Noranda, Inc. | Optical strain sensor for the measurement of microdeformations of surfaces |
DE19748088A1 (de) * | 1997-10-30 | 1999-05-12 | Wacker Siltronic Halbleitermat | Verfahren und Vorrichtung zum Erkennen einer Fehllage einer Halbleiterscheibe |
US6303411B1 (en) | 1999-05-03 | 2001-10-16 | Vortek Industries Ltd. | Spatially resolved temperature measurement and irradiance control |
IT1315680B1 (it) * | 2000-10-13 | 2003-03-14 | Expert System Solutions Srl | Apparecchiatura per misurare variazioni dimensionali indotte su corpida variazioni di temperatura |
DE10052631C1 (de) * | 2000-10-24 | 2002-04-04 | Bosch Gmbh Robert | Vorrichtung zur Prüfung von einem durch Anlegen eines elektrischen und/oder magnetischen Feldes formändernden Material |
US6594446B2 (en) * | 2000-12-04 | 2003-07-15 | Vortek Industries Ltd. | Heat-treating methods and systems |
ITMO20010248A1 (it) * | 2001-12-12 | 2003-06-12 | Expert System Solutions Srl | Dilatometro ottico perfezionato |
CN100416243C (zh) * | 2001-12-26 | 2008-09-03 | 加拿大马特森技术有限公司 | 测量温度和热处理的方法及系统 |
WO2004057650A1 (en) | 2002-12-20 | 2004-07-08 | Mattson Technology Canada, Inc. | Methods and systems for supporting a workpiece and for heat-treating the workpiece |
US7025498B2 (en) * | 2003-05-30 | 2006-04-11 | Asml Holding N.V. | System and method of measuring thermal expansion |
DE10336718B4 (de) * | 2003-08-08 | 2006-08-17 | Krüss GmbH, Wissenschaftliche Laborgeräte | Vorrichtung zur optischen Vermessung der Konturen von Probenkörpern bei hohen Temperaturen in einem gasdicht verschlossenem Rohrofen |
JP5630935B2 (ja) | 2003-12-19 | 2014-11-26 | マトソン テクノロジー、インコーポレイテッド | 工作物の熱誘起運動を抑制する機器及び装置 |
CN1936558B (zh) * | 2005-09-22 | 2010-11-24 | 富士康(昆山)电脑接插件有限公司 | 热变形测试装置 |
DE102006019433B4 (de) * | 2006-04-24 | 2013-07-25 | BÄHR-Thermoanalyse GmbH | Optisches Dilatometer |
CN100447546C (zh) * | 2006-08-31 | 2008-12-31 | 重庆交通大学 | 望远式全天候自标定挠度/位移测量装置及方法 |
WO2008058397A1 (en) * | 2006-11-15 | 2008-05-22 | Mattson Technology Canada, Inc. | Systems and methods for supporting a workpiece during heat-treating |
US20080122932A1 (en) * | 2006-11-28 | 2008-05-29 | George Aaron Kibbie | Remote video monitoring systems utilizing outbound limited communication protocols |
JP4515509B2 (ja) * | 2008-03-03 | 2010-08-04 | キヤノンアネルバ株式会社 | 基板表面温度計測方法、及び、これを用いた基板処理装置 |
KR101610269B1 (ko) | 2008-05-16 | 2016-04-07 | 맷슨 테크놀로지, 인크. | 워크피스 파손 방지 방법 및 장치 |
DE102010044969A1 (de) * | 2010-09-10 | 2012-03-15 | Carl Zeiss Smt Gmbh | Verfahren zum Betreiben einer Projektionsbelichtungsanlage sowie Steuervorrichtung |
US9464890B2 (en) * | 2010-09-21 | 2016-10-11 | James L. Arnone | Dynamic data acquisition, and apparatus and methods therefor |
CA2876998C (en) | 2012-10-12 | 2017-04-18 | Methanex New Zealand Limited | Tube monitor and process measurement and control in or for a reformer |
CN109323662B (zh) * | 2018-09-05 | 2020-07-10 | 西安交通大学 | 高温环境下环形包壳内外表面温度控制及变形测量装置 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DD59943B (de) * | ||||
US3433051A (en) * | 1966-02-28 | 1969-03-18 | Atomic Energy Commission | Apparatus for determining mechanical and thermal properties of metals |
US4173788A (en) * | 1976-09-27 | 1979-11-06 | Atmospheric Sciences, Inc. | Method and apparatus for measuring dimensions |
SU729493A1 (ru) * | 1977-10-28 | 1980-04-25 | Предприятие П/Я В-8624 | Пол ризационно-оптический микродилатометр |
DE2819395C2 (de) * | 1978-05-03 | 1980-01-10 | Hoesch Werke Ag, 4600 Dortmund | Verfahren und Vorrichtung zum Bestimmen der Breite von Walzerzeugnissen |
DE2919858A1 (de) * | 1978-05-17 | 1979-11-22 | British Steel Corp | Verfahren und vorrichtung zur bestimmung der abmessungen von werkstuecken |
GB2052734B (en) * | 1979-05-21 | 1983-10-19 | Daystrom Ltd | Position and dimension measuring apparaus |
FR2483070B1 (fr) * | 1980-05-21 | 1985-06-28 | Daystrom Ltd | Appareil de mesure de dimensions d'un objet eclaire |
FR2497341A1 (fr) * | 1980-12-30 | 1982-07-02 | Socles Goudrons Derives | Dispositif pour mesurer la deformation d'un materiau sous l'effet de la chaleur et son application a la determination du pouvoir mouillant des brais |
US4468136A (en) * | 1982-02-12 | 1984-08-28 | The Johns Hopkins University | Optical beam deflection thermal imaging |
US4522510A (en) * | 1982-07-26 | 1985-06-11 | Therma-Wave, Inc. | Thin film thickness measurement with thermal waves |
-
1984
- 1984-04-14 KR KR8404936A patent/KR910004158B1/ko not_active IP Right Cessation
- 1984-08-03 DE DE8484305300T patent/DE3477836D1/de not_active Expired
- 1984-08-03 EP EP84305300A patent/EP0145115B1/de not_active Expired
- 1984-08-03 AT AT84305300T patent/ATE42402T1/de not_active IP Right Cessation
-
1985
- 1985-09-17 US US06/776,920 patent/US4636969A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0145115A1 (de) | 1985-06-19 |
KR910004158B1 (en) | 1991-06-22 |
DE3477836D1 (en) | 1989-05-24 |
KR850001546A (ko) | 1985-03-30 |
US4636969A (en) | 1987-01-13 |
EP0145115B1 (de) | 1989-04-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
UEP | Publication of translation of european patent specification | ||
REN | Ceased due to non-payment of the annual fee |