KR910004158B1 - Thermal deformation measuring system of ceranics and the like - Google Patents

Thermal deformation measuring system of ceranics and the like

Info

Publication number
KR910004158B1
KR910004158B1 KR8404936A KR840004936A KR910004158B1 KR 910004158 B1 KR910004158 B1 KR 910004158B1 KR 8404936 A KR8404936 A KR 8404936A KR 840004936 A KR840004936 A KR 840004936A KR 910004158 B1 KR910004158 B1 KR 910004158B1
Authority
KR
South Korea
Prior art keywords
deformation measuring
measuring system
thermal deformation
ceranics
illuminator
Prior art date
Application number
KR8404936A
Other languages
English (en)
Other versions
KR850001546A (ko
Inventor
Hirosi Kyoden
Yasuhiro Endo
Deiichi Fujiwara
Tosisada Mirula
Kihachiro Nisikawa
Syoichi Nisizawa
Original Assignee
Sinagawa Sirotenga Co Ltd
Matsushita Electric Ind Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP14796683A external-priority patent/JPS6039540A/ja
Application filed by Sinagawa Sirotenga Co Ltd, Matsushita Electric Ind Co Ltd filed Critical Sinagawa Sirotenga Co Ltd
Priority claimed from JP12752684A external-priority patent/JPS617452A/ja
Publication of KR850001546A publication Critical patent/KR850001546A/ko
Application granted granted Critical
Publication of KR910004158B1 publication Critical patent/KR910004158B1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Length Measuring Devices By Optical Means (AREA)
KR8404936A 1983-08-15 1984-04-14 Thermal deformation measuring system of ceranics and the like KR910004158B1 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP14796683A JPS6039540A (ja) 1983-08-15 1983-08-15 熱膨張率測定装置
JP147966/83 1983-08-15
JP127526/84 1984-06-22
JP12752684A JPS617452A (ja) 1984-06-22 1984-06-22 セラミツク等の熱間における変位測定装置

Publications (2)

Publication Number Publication Date
KR850001546A KR850001546A (ko) 1985-03-30
KR910004158B1 true KR910004158B1 (en) 1991-06-22

Family

ID=26463472

Family Applications (1)

Application Number Title Priority Date Filing Date
KR8404936A KR910004158B1 (en) 1983-08-15 1984-04-14 Thermal deformation measuring system of ceranics and the like

Country Status (5)

Country Link
US (1) US4636969A (ko)
EP (1) EP0145115B1 (ko)
KR (1) KR910004158B1 (ko)
AT (1) ATE42402T1 (ko)
DE (1) DE3477836D1 (ko)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5350899A (en) * 1992-04-15 1994-09-27 Hiroichi Ishikawa Semiconductor wafer temperature determination by optical measurement of wafer expansion in processing apparatus chamber
FR2595814A1 (fr) * 1986-03-14 1987-09-18 Bertin & Cie Procede et dispositif de mesure du diametre d'une fibre, en particulier d'une fibre optique
US5099096A (en) * 1990-04-05 1992-03-24 Martin Marietta Energy Systems, Inc. Microwave furnace having microwave compatible dilatometer
US5143689A (en) * 1990-11-09 1992-09-01 The Standard Oil Company Method for determining the coefficient of thermal expansion of coke
JP2976574B2 (ja) * 1991-04-16 1999-11-10 住友電気工業株式会社 セラミックスの評価方法
US5221142A (en) * 1991-05-20 1993-06-22 Peak Systems, Inc. Method and apparatus for temperature measurement using thermal expansion
JPH05223761A (ja) * 1992-02-07 1993-08-31 Nippon Seiko Kk 焼入検査方法
JP3210073B2 (ja) * 1992-04-24 2001-09-17 愛三工業株式会社 ステップモータ制御装置
US5645351A (en) * 1992-05-20 1997-07-08 Hitachi, Ltd. Temperature measuring method using thermal expansion and an apparatus for carrying out the same
FR2706613B1 (fr) * 1993-06-17 1995-09-01 Aerospatiale Procédé pour déterminer la résistance à la déchirure ductile d'un matériau.
US5757473A (en) * 1996-11-13 1998-05-26 Noranda, Inc. Optical strain sensor for the measurement of microdeformations of surfaces
DE19748088A1 (de) * 1997-10-30 1999-05-12 Wacker Siltronic Halbleitermat Verfahren und Vorrichtung zum Erkennen einer Fehllage einer Halbleiterscheibe
US6303411B1 (en) 1999-05-03 2001-10-16 Vortek Industries Ltd. Spatially resolved temperature measurement and irradiance control
IT1315680B1 (it) * 2000-10-13 2003-03-14 Expert System Solutions Srl Apparecchiatura per misurare variazioni dimensionali indotte su corpida variazioni di temperatura
DE10052631C1 (de) * 2000-10-24 2002-04-04 Bosch Gmbh Robert Vorrichtung zur Prüfung von einem durch Anlegen eines elektrischen und/oder magnetischen Feldes formändernden Material
US6594446B2 (en) * 2000-12-04 2003-07-15 Vortek Industries Ltd. Heat-treating methods and systems
ITMO20010248A1 (it) * 2001-12-12 2003-06-12 Expert System Solutions Srl Dilatometro ottico perfezionato
AU2002350358A1 (en) * 2001-12-26 2003-07-30 Vortek Indusries Ltd. Temperature measurement and heat-treating methods and systems
JP4988202B2 (ja) 2002-12-20 2012-08-01 マトソン テクノロジー カナダ インコーポレイテッド 工作物の支持及び熱処理の方法とシステム
US7025498B2 (en) * 2003-05-30 2006-04-11 Asml Holding N.V. System and method of measuring thermal expansion
DE10336718B4 (de) * 2003-08-08 2006-08-17 Krüss GmbH, Wissenschaftliche Laborgeräte Vorrichtung zur optischen Vermessung der Konturen von Probenkörpern bei hohen Temperaturen in einem gasdicht verschlossenem Rohrofen
JP5630935B2 (ja) 2003-12-19 2014-11-26 マトソン テクノロジー、インコーポレイテッド 工作物の熱誘起運動を抑制する機器及び装置
CN1936558B (zh) * 2005-09-22 2010-11-24 富士康(昆山)电脑接插件有限公司 热变形测试装置
DE102006019433B4 (de) * 2006-04-24 2013-07-25 BÄHR-Thermoanalyse GmbH Optisches Dilatometer
CN100447546C (zh) * 2006-08-31 2008-12-31 重庆交通大学 望远式全天候自标定挠度/位移测量装置及方法
WO2008058397A1 (en) * 2006-11-15 2008-05-22 Mattson Technology Canada, Inc. Systems and methods for supporting a workpiece during heat-treating
US20080122932A1 (en) * 2006-11-28 2008-05-29 George Aaron Kibbie Remote video monitoring systems utilizing outbound limited communication protocols
JP4515509B2 (ja) * 2008-03-03 2010-08-04 キヤノンアネルバ株式会社 基板表面温度計測方法、及び、これを用いた基板処理装置
US9070590B2 (en) 2008-05-16 2015-06-30 Mattson Technology, Inc. Workpiece breakage prevention method and apparatus
DE102010044969A1 (de) * 2010-09-10 2012-03-15 Carl Zeiss Smt Gmbh Verfahren zum Betreiben einer Projektionsbelichtungsanlage sowie Steuervorrichtung
US9464890B2 (en) * 2010-09-21 2016-10-11 James L. Arnone Dynamic data acquisition, and apparatus and methods therefor
EP2906501B1 (en) 2012-10-12 2018-07-18 Methanex New Zealand Limited Tube monitor and process measurement and control in or for a reformer
CN109323662B (zh) * 2018-09-05 2020-07-10 西安交通大学 高温环境下环形包壳内外表面温度控制及变形测量装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD59943B (ko) *
US3433051A (en) * 1966-02-28 1969-03-18 Atomic Energy Commission Apparatus for determining mechanical and thermal properties of metals
US4173788A (en) * 1976-09-27 1979-11-06 Atmospheric Sciences, Inc. Method and apparatus for measuring dimensions
SU729493A1 (ru) * 1977-10-28 1980-04-25 Предприятие П/Я В-8624 Пол ризационно-оптический микродилатометр
DE2819395C2 (de) * 1978-05-03 1980-01-10 Hoesch Werke Ag, 4600 Dortmund Verfahren und Vorrichtung zum Bestimmen der Breite von Walzerzeugnissen
DE2919858A1 (de) * 1978-05-17 1979-11-22 British Steel Corp Verfahren und vorrichtung zur bestimmung der abmessungen von werkstuecken
GB2052734B (en) * 1979-05-21 1983-10-19 Daystrom Ltd Position and dimension measuring apparaus
FR2483070B1 (fr) * 1980-05-21 1985-06-28 Daystrom Ltd Appareil de mesure de dimensions d'un objet eclaire
FR2497341A1 (fr) * 1980-12-30 1982-07-02 Socles Goudrons Derives Dispositif pour mesurer la deformation d'un materiau sous l'effet de la chaleur et son application a la determination du pouvoir mouillant des brais
US4468136A (en) * 1982-02-12 1984-08-28 The Johns Hopkins University Optical beam deflection thermal imaging
US4522510A (en) * 1982-07-26 1985-06-11 Therma-Wave, Inc. Thin film thickness measurement with thermal waves

Also Published As

Publication number Publication date
ATE42402T1 (de) 1989-05-15
US4636969A (en) 1987-01-13
KR850001546A (ko) 1985-03-30
EP0145115A1 (en) 1985-06-19
DE3477836D1 (en) 1989-05-24
EP0145115B1 (en) 1989-04-19

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