ATE401671T1 - Hall-effekt element mit integrierter abweichungsregelung und verfahren zum betreiben eines solchen elements zur reduzierung der nullpunktabweichung - Google Patents

Hall-effekt element mit integrierter abweichungsregelung und verfahren zum betreiben eines solchen elements zur reduzierung der nullpunktabweichung

Info

Publication number
ATE401671T1
ATE401671T1 AT01924664T AT01924664T ATE401671T1 AT E401671 T1 ATE401671 T1 AT E401671T1 AT 01924664 T AT01924664 T AT 01924664T AT 01924664 T AT01924664 T AT 01924664T AT E401671 T1 ATE401671 T1 AT E401671T1
Authority
AT
Austria
Prior art keywords
layer
active layer
axis
disposed
disposing
Prior art date
Application number
AT01924664T
Other languages
English (en)
Inventor
Mark Plagens
Walter Matger
Michael Haji-Sheikh
Original Assignee
Honeywell Int Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell Int Inc filed Critical Honeywell Int Inc
Application granted granted Critical
Publication of ATE401671T1 publication Critical patent/ATE401671T1/de

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Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N52/00—Hall-effect devices
    • H10N52/101—Semiconductor Hall-effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Hall/Mr Elements (AREA)
  • Control Of Motors That Do Not Use Commutators (AREA)
AT01924664T 2000-04-04 2001-04-04 Hall-effekt element mit integrierter abweichungsregelung und verfahren zum betreiben eines solchen elements zur reduzierung der nullpunktabweichung ATE401671T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/542,213 US6492697B1 (en) 2000-04-04 2000-04-04 Hall-effect element with integrated offset control and method for operating hall-effect element to reduce null offset

Publications (1)

Publication Number Publication Date
ATE401671T1 true ATE401671T1 (de) 2008-08-15

Family

ID=24162811

Family Applications (1)

Application Number Title Priority Date Filing Date
AT01924664T ATE401671T1 (de) 2000-04-04 2001-04-04 Hall-effekt element mit integrierter abweichungsregelung und verfahren zum betreiben eines solchen elements zur reduzierung der nullpunktabweichung

Country Status (7)

Country Link
US (1) US6492697B1 (de)
EP (1) EP1269552B1 (de)
JP (1) JP2003532279A (de)
AT (1) ATE401671T1 (de)
CA (1) CA2405149A1 (de)
DE (1) DE60134839D1 (de)
WO (1) WO2001074139A2 (de)

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US10495699B2 (en) 2013-07-19 2019-12-03 Allegro Microsystems, Llc Methods and apparatus for magnetic sensor having an integrated coil or magnet to detect a non-ferromagnetic target
US10145908B2 (en) 2013-07-19 2018-12-04 Allegro Microsystems, Llc Method and apparatus for magnetic sensor producing a changing magnetic field
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US11029372B2 (en) * 2016-11-18 2021-06-08 Asahi Kasei Microdevices Corporation Hall element for mitigating current concentration and fabrication method thereof
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Also Published As

Publication number Publication date
US6492697B1 (en) 2002-12-10
DE60134839D1 (de) 2008-08-28
WO2001074139A3 (en) 2002-09-26
EP1269552B1 (de) 2008-07-16
JP2003532279A (ja) 2003-10-28
EP1269552A2 (de) 2003-01-02
CA2405149A1 (en) 2001-10-11
WO2001074139A2 (en) 2001-10-11

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