ATE329453T1 - Verfahren und vorrichtung zur verarbeitung von messdaten - Google Patents

Verfahren und vorrichtung zur verarbeitung von messdaten

Info

Publication number
ATE329453T1
ATE329453T1 AT03396013T AT03396013T ATE329453T1 AT E329453 T1 ATE329453 T1 AT E329453T1 AT 03396013 T AT03396013 T AT 03396013T AT 03396013 T AT03396013 T AT 03396013T AT E329453 T1 ATE329453 T1 AT E329453T1
Authority
AT
Austria
Prior art keywords
pixels
defected
ccd
binning
super pixels
Prior art date
Application number
AT03396013T
Other languages
English (en)
Inventor
Juha Karunen
Janne Salonen
Original Assignee
Wallac Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wallac Oy filed Critical Wallac Oy
Application granted granted Critical
Publication of ATE329453T1 publication Critical patent/ATE329453T1/de

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/46—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by combining or binning pixels
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
AT03396013T 2002-02-08 2003-02-07 Verfahren und vorrichtung zur verarbeitung von messdaten ATE329453T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/067,826 US7068313B2 (en) 2002-02-08 2002-02-08 Method and arrangement for processing measurement data

Publications (1)

Publication Number Publication Date
ATE329453T1 true ATE329453T1 (de) 2006-06-15

Family

ID=27610519

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03396013T ATE329453T1 (de) 2002-02-08 2003-02-07 Verfahren und vorrichtung zur verarbeitung von messdaten

Country Status (4)

Country Link
US (1) US7068313B2 (de)
EP (1) EP1335588B1 (de)
AT (1) ATE329453T1 (de)
DE (1) DE60305754T2 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI111299B (fi) * 1999-03-11 2003-06-30 Wallac Oy Menetelmä ja järjestely mittaustiedon käsittelemiseksi
DE10245715A1 (de) * 2002-10-01 2004-04-15 Philips Intellectual Property & Standards Gmbh Verfahren und Vorrichtung zur Erzeugung von Teilabbildungen
DE102004015876A1 (de) * 2004-03-31 2005-10-27 Siemens Ag Verfahren zum Auslesen eines Flächendetektors
US20060033826A1 (en) * 2004-08-12 2006-02-16 Xinqiao Liu Imaging array having variable pixel size
JP4850730B2 (ja) * 2006-03-16 2012-01-11 キヤノン株式会社 撮像装置、その処理方法及びプログラム
JP5955007B2 (ja) 2012-02-01 2016-07-20 キヤノン株式会社 撮像装置及び撮像方法

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6800452B1 (en) * 1994-08-08 2004-10-05 Science Applications International Corporation Automated methods for simultaneously performing a plurality of signal-based assays
FI97665C (fi) * 1995-11-21 1997-01-27 Planmed Oy Menetelmät ja laitteet kohteen kuvantamisessa
US5970115A (en) * 1996-11-29 1999-10-19 Varian Medical Systems, Inc. Multiple mode digital X-ray imaging system
JP3819511B2 (ja) * 1997-02-13 2006-09-13 富士写真フイルム株式会社 Ｃｃｄ撮像デバイスにおけるモニタ方法およびディジタルスチルカメラ
US5973310A (en) * 1997-12-10 1999-10-26 Ems Technologies Canada, Ltd. Optical acquisition and tracking system
AU2546299A (en) * 1998-02-10 1999-08-30 Nikon Corporation Method of driving solid-state imaging device, imaging device, alignment device, and aligning method
US6593961B1 (en) * 1998-10-30 2003-07-15 Agilent Technologies, Inc. Test efficient method of classifying image quality of an optical sensor using three categories of pixels
FI111299B (fi) * 1999-03-11 2003-06-30 Wallac Oy Menetelmä ja järjestely mittaustiedon käsittelemiseksi
US6600804B2 (en) * 1999-11-19 2003-07-29 Xcounter Ab Gaseous-based radiation detector and apparatus for radiography
JP2001177756A (ja) 1999-12-21 2001-06-29 Canon Inc 撮像装置及びそれを備えたカメラシステム
US6307915B1 (en) * 2000-06-26 2001-10-23 Afp Imaging Corporation Triggering of solid state X-ray imagers with non-destructive readout capability
JP3631114B2 (ja) * 2000-08-01 2005-03-23 キヤノン株式会社 撮像装置
JP2002185724A (ja) 2000-12-13 2002-06-28 Nikon Corp 撮像装置、露光装置、計測装置、および撮像装置の駆動方法。
US6498831B2 (en) * 2000-12-22 2002-12-24 Ge Medical Systems Global Technology Company, Llc Panel detector pixel replacement method and apparatus
US6470071B1 (en) * 2001-01-31 2002-10-22 General Electric Company Real time data acquisition system including decoupled host computer
US6504895B2 (en) * 2001-01-31 2003-01-07 General Electric Company Method and system monitoring image detection
US6663281B2 (en) * 2001-09-25 2003-12-16 Ge Medical Systems Global Technology Company, Llc X-ray detector monitoring
US6823044B2 (en) * 2001-11-21 2004-11-23 Agilent Technologies, Inc. System for collecting multiple x-ray image exposures of a sample using a sparse configuration
JP2004015711A (ja) * 2002-06-11 2004-01-15 Fuji Photo Film Co Ltd 画像読取方法および装置ならびに補正情報出力方法および装置

Also Published As

Publication number Publication date
US20030151683A1 (en) 2003-08-14
US7068313B2 (en) 2006-06-27
EP1335588A1 (de) 2003-08-13
DE60305754T2 (de) 2007-06-14
DE60305754D1 (de) 2006-07-20
EP1335588B1 (de) 2006-06-07

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