ATE276522T1 - Automatische prüfeinrichtung zur rauschmessung in frequenzschritten - Google Patents

Automatische prüfeinrichtung zur rauschmessung in frequenzschritten

Info

Publication number
ATE276522T1
ATE276522T1 AT00932532T AT00932532T ATE276522T1 AT E276522 T1 ATE276522 T1 AT E276522T1 AT 00932532 T AT00932532 T AT 00932532T AT 00932532 T AT00932532 T AT 00932532T AT E276522 T1 ATE276522 T1 AT E276522T1
Authority
AT
Austria
Prior art keywords
low noise
mixer
variable
processor
amplifier
Prior art date
Application number
AT00932532T
Other languages
English (en)
Inventor
Eugene Rzyski
Original Assignee
Eugene Rzyski
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eugene Rzyski filed Critical Eugene Rzyski
Application granted granted Critical
Publication of ATE276522T1 publication Critical patent/ATE276522T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/20—Measurement of non-linear distortion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Mathematical Physics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Radar Systems Or Details Thereof (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Digital Transmission Methods That Use Modulated Carrier Waves (AREA)
AT00932532T 1999-05-17 2000-05-17 Automatische prüfeinrichtung zur rauschmessung in frequenzschritten ATE276522T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/313,435 US6393372B1 (en) 1999-05-17 1999-05-17 Automated frequency stepping noise measurement system
PCT/US2000/013545 WO2000070357A2 (en) 1999-05-17 2000-05-17 Automated frequency stepping noise measurement test system

Publications (1)

Publication Number Publication Date
ATE276522T1 true ATE276522T1 (de) 2004-10-15

Family

ID=23215682

Family Applications (1)

Application Number Title Priority Date Filing Date
AT00932532T ATE276522T1 (de) 1999-05-17 2000-05-17 Automatische prüfeinrichtung zur rauschmessung in frequenzschritten

Country Status (11)

Country Link
US (1) US6393372B1 (de)
EP (1) EP1204874B1 (de)
JP (1) JP5073887B2 (de)
KR (1) KR100772838B1 (de)
AT (1) ATE276522T1 (de)
AU (1) AU773393B2 (de)
CA (1) CA2372800C (de)
DE (1) DE60013855T2 (de)
ES (1) ES2232455T3 (de)
MX (1) MXPA01011752A (de)
WO (1) WO2000070357A2 (de)

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US7035324B2 (en) * 2001-08-01 2006-04-25 Agilent Technologies, Inc. Phase-noise measurement with compensation for phase noise contributed by spectrum analyzer
KR20030044105A (ko) * 2001-11-28 2003-06-09 엘지이노텍 주식회사 위상 잡음 측정장치
US7079818B2 (en) * 2002-02-12 2006-07-18 Broadcom Corporation Programmable mutlistage amplifier and radio applications thereof
US6745020B2 (en) 2002-08-29 2004-06-01 Eugene Rzyski Direct downconversion receiver
US7155218B1 (en) * 2003-04-15 2006-12-26 Sprint Spectrum L.P. Method and system for determining spurious emission output by a wireless terminal
US6980915B2 (en) * 2004-03-23 2005-12-27 Agilent Technologies, Inc. Phase noise compensation for spectral measurements
US7035743B1 (en) * 2004-10-18 2006-04-25 Agilent Technologies, Inc. Phase noise compensation for phase noise measurements
US7693674B2 (en) * 2005-05-20 2010-04-06 Omniphase Research Laboratories, Inc. Low-noise source
US8965727B2 (en) * 2005-05-20 2015-02-24 Omniphase Research Laboratories, Inc. Intelligent low noise design
US7885632B2 (en) * 2005-05-20 2011-02-08 Omniphase Research Laboratories, Inc. Automated noise measurement system
JP4792340B2 (ja) * 2006-07-11 2011-10-12 株式会社アドバンテスト 試験装置および試験方法
US8269529B2 (en) 2010-01-14 2012-09-18 Advanced Testing Technologies, Inc. Low phase noise RF signal generating system and phase noise measurement calibrating method
US20110169545A1 (en) * 2010-01-14 2011-07-14 Shahen Minassian Low phase noise rf signal generating system and method for calibrating phase noise measurement systems using same
US8248297B1 (en) * 2011-04-11 2012-08-21 Advanced Testing Technologies, Inc. Phase noise measurement system and method
WO2014125736A1 (ja) * 2013-02-14 2014-08-21 ソニー株式会社 音声認識装置、および音声認識方法、並びにプログラム
US9500697B2 (en) * 2014-01-27 2016-11-22 ProPlus Design Solutions, Inc. Noise measurement system
KR101516341B1 (ko) * 2014-07-11 2015-05-04 (주)에스티앤씨 펄스 레이더 실시간 잡음지수 산출 방법 및 그 시스템
CN104122457B (zh) * 2014-07-15 2017-05-31 中国电子科技集团公司第四十一研究所 一种脉冲调制信号相位噪声测量装置及方法
CN107966620A (zh) * 2017-11-21 2018-04-27 中国电子科技集团公司第四十研究所 一种数字鉴频的相位噪声测量装置及方法
DE102018112092A1 (de) * 2018-01-10 2019-07-11 Infineon Technologies Ag Integrierte mehrkanal-hf-schaltung mit phasenerfassung

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Also Published As

Publication number Publication date
ES2232455T3 (es) 2005-06-01
CA2372800C (en) 2011-01-11
EP1204874A2 (de) 2002-05-15
DE60013855T2 (de) 2005-09-22
KR20020044109A (ko) 2002-06-14
DE60013855D1 (de) 2004-10-21
EP1204874B1 (de) 2004-09-15
CA2372800A1 (en) 2000-11-23
KR100772838B1 (ko) 2007-11-02
AU773393B2 (en) 2004-05-27
MXPA01011752A (es) 2004-09-06
AU5023900A (en) 2000-12-05
JP2004500545A (ja) 2004-01-08
JP5073887B2 (ja) 2012-11-14
WO2000070357A2 (en) 2000-11-23
WO2000070357A3 (en) 2001-08-23
US6393372B1 (en) 2002-05-21

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