ATE266294T1 - Verfahren zur temperaturkompensation der empfindlichkeit eines bilddetektors und bilddetektor zur durchführung des verfahrens - Google Patents

Verfahren zur temperaturkompensation der empfindlichkeit eines bilddetektors und bilddetektor zur durchführung des verfahrens

Info

Publication number
ATE266294T1
ATE266294T1 AT00990832T AT00990832T ATE266294T1 AT E266294 T1 ATE266294 T1 AT E266294T1 AT 00990832 T AT00990832 T AT 00990832T AT 00990832 T AT00990832 T AT 00990832T AT E266294 T1 ATE266294 T1 AT E266294T1
Authority
AT
Austria
Prior art keywords
image
photosensitive spots
spots
blind
ambient temperature
Prior art date
Application number
AT00990832T
Other languages
English (en)
Inventor
Thierry Ducourant
Allende Salvador
Original Assignee
Trixell Sas
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Trixell Sas filed Critical Trixell Sas
Application granted granted Critical
Publication of ATE266294T1 publication Critical patent/ATE266294T1/de

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/673—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction by using reference sources
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/63—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/32—Transforming X-rays

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Radiation Pyrometers (AREA)
  • Solid State Image Pick-Up Elements (AREA)
AT00990832T 1999-12-28 2000-12-28 Verfahren zur temperaturkompensation der empfindlichkeit eines bilddetektors und bilddetektor zur durchführung des verfahrens ATE266294T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR9916592A FR2803082B1 (fr) 1999-12-28 1999-12-28 Procede de compensation en temperature de la sensibilite d'un detecteur d'image
PCT/FR2000/003717 WO2001049044A2 (fr) 1999-12-28 2000-12-28 Procede de compensation en temperature de la sensibilite d'un detecteur d'image

Publications (1)

Publication Number Publication Date
ATE266294T1 true ATE266294T1 (de) 2004-05-15

Family

ID=9553925

Family Applications (1)

Application Number Title Priority Date Filing Date
AT00990832T ATE266294T1 (de) 1999-12-28 2000-12-28 Verfahren zur temperaturkompensation der empfindlichkeit eines bilddetektors und bilddetektor zur durchführung des verfahrens

Country Status (9)

Country Link
US (1) US6828563B2 (de)
EP (1) EP1243132B1 (de)
JP (1) JP5311700B2 (de)
AT (1) ATE266294T1 (de)
AU (1) AU3029701A (de)
CA (1) CA2395571C (de)
DE (1) DE60010519T2 (de)
FR (1) FR2803082B1 (de)
WO (1) WO2001049044A2 (de)

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FR2796239B1 (fr) * 1999-07-06 2001-10-05 Trixell Sas Procede de commande d'un dispositif photosensible apte a produire des images de bonne qualite
FR2817106B1 (fr) * 2000-11-17 2003-03-07 Trixell Sas Dispositif photosensible et procede de commande du dispositif photosensible
AUPR621501A0 (en) 2001-07-06 2001-08-02 Commonwealth Scientific And Industrial Research Organisation Delivery of ds rna
US7381964B1 (en) * 2004-11-24 2008-06-03 General Electric Company Method and system of x-ray data calibration
US7138636B2 (en) * 2005-03-17 2006-11-21 General Electric Co. Systems, methods and apparatus to calibrate a solid state X-ray detector
DE102006003612B3 (de) * 2006-01-25 2007-06-28 Siemens Ag Verfahren, Korrekturverfahren und Röntgensystem
US20110210262A1 (en) * 2006-06-12 2011-09-01 Radiation Watch Limited Apparatus and method for detecting high-energy radiation
GB0611620D0 (en) * 2006-06-12 2006-07-19 Radiation Watch Ltd Semi-conductor-based personal radiation location system
US7455454B2 (en) * 2006-10-03 2008-11-25 General Electric Company X-ray detector methods and apparatus
JP4793397B2 (ja) * 2008-03-14 2011-10-12 コニカミノルタエムジー株式会社 放射線画像検出器
US8072811B2 (en) 2008-05-07 2011-12-06 Aplus Flash Technology, Inc, NAND based NMOS NOR flash memory cell, a NAND based NMOS NOR flash memory array, and a method of forming a NAND based NMOS NOR flash memory array
DE102008046289B3 (de) * 2008-09-08 2009-10-29 Siemens Aktiengesellschaft Verfahren zur Bestimmung der Temperatur eines digitalen Röntgendetektors, Verfahren zur Erstellung eines temperaturkorrigierten Röntgenbildes und digitaler Röntgendetektor
US8120966B2 (en) * 2009-02-05 2012-02-21 Aplus Flash Technology, Inc. Method and apparatus for management of over-erasure in NAND-based NOR-type flash memory
JP5499384B2 (ja) * 2010-06-30 2014-05-21 独立行政法人日本原子力研究開発機構 放射能量測定方法及び装置
US8757878B2 (en) 2011-01-11 2014-06-24 General Electric Company Temperature drift correction for multi-slice detector in computed tomography
US9202453B2 (en) 2012-12-05 2015-12-01 Bose Corporation Asymmetric temperature compensation of microphone sensitivity at an active noise reduction system
US10018504B2 (en) * 2015-11-12 2018-07-10 Sensors Unlimited, Inc. Gain normalization

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JPS62207437A (ja) * 1986-03-07 1987-09-11 株式会社　日立メデイコ Ｘ線ｃｔ装置の温度特性補正装置
JPH01302190A (ja) * 1988-05-31 1989-12-06 Shimadzu Corp マルチスライスリングｅｃｔ装置
JPH0269691A (ja) * 1988-09-05 1990-03-08 Toshiba Corp Ｘ線ｃｔ用放射線検出器
JPH02147923A (ja) * 1988-11-30 1990-06-06 Hitachi Ltd 光検出回路
US5153421A (en) * 1991-11-04 1992-10-06 Xerox Corporation Architecture for analog and digital image sensor arrays
FR2731569B1 (fr) 1995-03-07 1997-04-25 Thomson Tubes Electroniques Dispositif de recopie de tension a grande linearite
US6410896B2 (en) * 1995-10-27 2002-06-25 Medical Indicators, Inc. Shielding method for microwave heating of infant formula to a safe and uniform temperature
JP4030605B2 (ja) * 1995-11-10 2008-01-09 オリンパス株式会社 電子的撮像装置
JP3024532B2 (ja) * 1995-12-15 2000-03-21 日本電気株式会社 熱型赤外線撮像装置
US6271880B1 (en) * 1996-02-26 2001-08-07 Canon Kabushiki Kaisha Apparatus having a photoelectric conversion element and a transistor, in which the duration of the on time of the transistor is based on a detected temperature of the conversion element or transistor
JP3806973B2 (ja) * 1996-06-25 2006-08-09 株式会社ニコン 光電変換器の暗電流補正装置
FR2758039B1 (fr) 1996-12-27 1999-03-26 Thomson Tubes Electroniques Detecteur d'image a contraste ameliore
FR2759509B1 (fr) 1997-02-07 1999-04-30 Thomson Tubes Electroniques Circuit integrateur a linearite amelioree
FR2771513B1 (fr) 1997-11-25 2000-05-26 Trixell Sas Dispositif photosensible equipe d'un dispositif de mesure d'eclairement
US6061092A (en) * 1997-12-05 2000-05-09 Intel Corporation Method and apparatus for dark frame cancellation for CMOS sensor-based tethered video peripherals
JPH11231055A (ja) * 1998-02-12 1999-08-27 Konica Corp 放射線画像読取装置
FR2802698B1 (fr) * 1999-12-17 2002-03-22 Trixell Sas Circuit de lecture de charges protege contre des surcharges provenant de charges de polarite non desiree
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JP3819760B2 (ja) * 2001-11-08 2006-09-13 株式会社日立製作所 画像表示装置
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KR100448244B1 (ko) * 2002-03-29 2004-09-13 주식회사 하이닉스반도체 이미지센서의 화소배열부 및 그를 포함하는 이미지센서 및이미지센서의 자동 블랙 레벨 보상 방법

Also Published As

Publication number Publication date
FR2803082B1 (fr) 2002-03-22
US6828563B2 (en) 2004-12-07
JP2003518624A (ja) 2003-06-10
CA2395571A1 (fr) 2001-07-05
CA2395571C (fr) 2009-05-19
FR2803082A1 (fr) 2001-06-29
WO2001049044A3 (fr) 2002-05-23
JP5311700B2 (ja) 2013-10-09
DE60010519T2 (de) 2005-05-12
WO2001049044A2 (fr) 2001-07-05
US20020195567A1 (en) 2002-12-26
EP1243132B1 (de) 2004-05-06
DE60010519D1 (de) 2004-06-09
EP1243132A2 (de) 2002-09-25
AU3029701A (en) 2001-07-09

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