ATE246340T1 - Balkensonde für kraftmikroskop - Google Patents

Balkensonde für kraftmikroskop

Info

Publication number
ATE246340T1
ATE246340T1 AT99924287T AT99924287T ATE246340T1 AT E246340 T1 ATE246340 T1 AT E246340T1 AT 99924287 T AT99924287 T AT 99924287T AT 99924287 T AT99924287 T AT 99924287T AT E246340 T1 ATE246340 T1 AT E246340T1
Authority
AT
Austria
Prior art keywords
probes
probe
magnetic
film
force microscope
Prior art date
Application number
AT99924287T
Other languages
German (de)
English (en)
Inventor
Stuart M Lindsay
Tianwei Jing
Original Assignee
Molecular Imaging Corp
Univ Arizona
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Molecular Imaging Corp, Univ Arizona filed Critical Molecular Imaging Corp
Application granted granted Critical
Publication of ATE246340T1 publication Critical patent/ATE246340T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G01Q60/40—Conductive probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/08—Probe characteristics
    • G01Q70/14—Particular materials
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/865—Magnetic force probe
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/873—Tip holder

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Micromachines (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Measuring Leads Or Probes (AREA)
AT99924287T 1998-05-20 1999-05-17 Balkensonde für kraftmikroskop ATE246340T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/082,095 US6121611A (en) 1998-05-20 1998-05-20 Force sensing probe for scanning probe microscopy
PCT/US1999/010859 WO1999060330A1 (en) 1998-05-20 1999-05-17 Force sensing probe for scanning probe microscopy

Publications (1)

Publication Number Publication Date
ATE246340T1 true ATE246340T1 (de) 2003-08-15

Family

ID=22169036

Family Applications (1)

Application Number Title Priority Date Filing Date
AT99924287T ATE246340T1 (de) 1998-05-20 1999-05-17 Balkensonde für kraftmikroskop

Country Status (6)

Country Link
US (1) US6121611A (https=)
EP (1) EP1080340B1 (https=)
JP (1) JP2002515592A (https=)
AT (1) ATE246340T1 (https=)
DE (1) DE69910014T2 (https=)
WO (1) WO1999060330A1 (https=)

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* Cited by examiner, † Cited by third party
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JP2002515592A (ja) 2002-05-28
WO1999060330A1 (en) 1999-11-25
DE69910014D1 (de) 2003-09-04
DE69910014T2 (de) 2004-04-15
EP1080340A1 (en) 2001-03-07
US6121611A (en) 2000-09-19

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