ATE22752T1 - Magnetron kathodisches zerstaeubungssystem. - Google Patents

Magnetron kathodisches zerstaeubungssystem.

Info

Publication number
ATE22752T1
ATE22752T1 AT83200273T AT83200273T ATE22752T1 AT E22752 T1 ATE22752 T1 AT E22752T1 AT 83200273 T AT83200273 T AT 83200273T AT 83200273 T AT83200273 T AT 83200273T AT E22752 T1 ATE22752 T1 AT E22752T1
Authority
AT
Austria
Prior art keywords
backing plate
spraying system
cathodic spraying
magnetron cathodic
adhere
Prior art date
Application number
AT83200273T
Other languages
English (en)
Inventor
Jacobus Eduardus Crombeen
Petrus Wilhelmus Hen Crooymans
Jan Visser
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Application granted granted Critical
Publication of ATE22752T1 publication Critical patent/ATE22752T1/de

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67017—Apparatus for fluid treatment
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34—Sputtering
    • C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
    • H01J37/3405—Magnetron sputtering
    • H01J37/3408—Planar magnetron sputtering
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411—Constructional aspects of the reactor
    • H01J37/3435—Target holders (includes backing plates and endblocks)
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3488—Constructional details of particle beam apparatus not otherwise provided for, e.g. arrangement, mounting, housing, environment; special provisions for cleaning or maintenance of the apparatus
    • H01J37/3497—Temperature of target
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Materials Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Microwave Tubes (AREA)
  • Particle Accelerators (AREA)
  • Coating By Spraying Or Casting (AREA)
  • Resistance Welding (AREA)
AT83200273T 1982-03-05 1983-02-23 Magnetron kathodisches zerstaeubungssystem. ATE22752T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL8200902A NL8200902A (nl) 1982-03-05 1982-03-05 Magnetron-kathodesputtersysteem.
EP83200273A EP0088463B1 (de) 1982-03-05 1983-02-23 Magnetron kathodisches Zerstäubungssystem

Publications (1)

Publication Number Publication Date
ATE22752T1 true ATE22752T1 (de) 1986-10-15

Family

ID=19839373

Family Applications (1)

Application Number Title Priority Date Filing Date
AT83200273T ATE22752T1 (de) 1982-03-05 1983-02-23 Magnetron kathodisches zerstaeubungssystem.

Country Status (9)

Country Link
US (1) US4392939A (de)
EP (1) EP0088463B1 (de)
JP (1) JPS58164783A (de)
AT (1) ATE22752T1 (de)
AU (1) AU560381B2 (de)
CA (1) CA1192318A (de)
DE (1) DE3366772D1 (de)
ES (1) ES520264A0 (de)
NL (1) NL8200902A (de)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4657654A (en) * 1984-05-17 1987-04-14 Varian Associates, Inc. Targets for magnetron sputter device having separate confining magnetic fields to separate targets subject to separate discharges
US4569746A (en) * 1984-05-17 1986-02-11 Varian Associates, Inc. Magnetron sputter device using the same pole piece for coupling separate confining magnetic fields to separate targets subject to separate discharges
US4606806A (en) * 1984-05-17 1986-08-19 Varian Associates, Inc. Magnetron sputter device having planar and curved targets
US4595482A (en) * 1984-05-17 1986-06-17 Varian Associates, Inc. Apparatus for and the method of controlling magnetron sputter device having separate confining magnetic fields to separate targets subject to separate discharges
US4597847A (en) * 1984-10-09 1986-07-01 Iodep, Inc. Non-magnetic sputtering target
US5215639A (en) * 1984-10-09 1993-06-01 Genus, Inc. Composite sputtering target structures and process for producing such structures
JP2934711B2 (ja) * 1989-12-07 1999-08-16 カシオ計算機株式会社 スパッタ装置
KR950000906B1 (ko) * 1991-08-02 1995-02-03 니찌덴 아넬바 가부시기가이샤 스퍼터링장치
US5458759A (en) * 1991-08-02 1995-10-17 Anelva Corporation Magnetron sputtering cathode apparatus
US5374343A (en) * 1992-05-15 1994-12-20 Anelva Corporation Magnetron cathode assembly
US5286361A (en) * 1992-10-19 1994-02-15 Regents Of The University Of California Magnetically attached sputter targets
US5414588A (en) * 1993-09-20 1995-05-09 The Regents Of The University Of California High performance capacitors using nano-structure multilayer materials fabrication
US6033483A (en) * 1994-06-30 2000-03-07 Applied Materials, Inc. Electrically insulating sealing structure and its method of use in a high vacuum physical vapor deposition apparatus
EP0787818A1 (de) * 1996-01-31 1997-08-06 LEYBOLD MATERIALS GmbH Sputtertarget aus einer Zinn- oder Zinn-Basislegierung
ES2142008T3 (es) * 1996-01-31 2000-04-01 Leybold Materials Gmbh Blanco para proyeccion ionica constituido por estaño o una aleacion a base de estaño.
JP2000133693A (ja) * 1998-08-19 2000-05-12 Shibaura Mechatronics Corp 真空装置用駆動機構および真空装置
JP3568845B2 (ja) * 1999-11-09 2004-09-22 株式会社日鉱マテリアルズ スパッタリングターゲット／バッキングプレート組立体の矯正方法及び同矯正装置
US20050145487A1 (en) * 2002-04-15 2005-07-07 Michael Geisler Coating installation
DE10216671A1 (de) * 2002-04-15 2003-12-18 Applied Films Gmbh & Co Kg Beschichtungsanlage
US20080067058A1 (en) * 2006-09-15 2008-03-20 Stimson Bradley O Monolithic target for flat panel application
KR100899355B1 (ko) * 2007-11-15 2009-05-27 한국과학기술연구원 플라스마 증착 장치 및 방법
KR20130017314A (ko) * 2011-08-10 2013-02-20 삼성디스플레이 주식회사 스퍼터링 장치

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR846557A (fr) * 1938-04-14 1939-09-20 Procédé pour métalliser des articles métalliques par pulvérisation cathodique
US3616449A (en) * 1970-03-30 1971-10-26 Bendix Corp Sputtering anode
US4204936A (en) * 1979-03-29 1980-05-27 The Perkin-Elmer Corporation Method and apparatus for attaching a target to the cathode of a sputtering system
US4297190A (en) * 1979-05-14 1981-10-27 Western Electric Co., Inc. Method for removing heat from a workpiece during processing in a vacuum chamber
US4274476A (en) * 1979-05-14 1981-06-23 Western Electric Company, Inc. Method and apparatus for removing heat from a workpiece during processing in a vacuum chamber
US4272355A (en) * 1980-02-26 1981-06-09 International Business Machines Corporation Process of bonding sputtering targets to target electrodes
US4341810A (en) * 1981-08-27 1982-07-27 Dynagel Incorporated Gelled gelatin food product prepared from non-gelled aqueous gelatin compositions

Also Published As

Publication number Publication date
AU560381B2 (en) 1987-04-02
NL8200902A (nl) 1983-10-03
JPH0214425B2 (de) 1990-04-09
EP0088463B1 (de) 1986-10-08
EP0088463A1 (de) 1983-09-14
AU1203283A (en) 1983-09-08
CA1192318A (en) 1985-08-20
ES8401678A1 (es) 1983-12-01
US4392939A (en) 1983-07-12
ES520264A0 (es) 1983-12-01
JPS58164783A (ja) 1983-09-29
DE3366772D1 (en) 1986-11-13

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Legal Events

Date Code Title Description
UEP Publication of translation of european patent specification
REN Ceased due to non-payment of the annual fee