ATE212469T1 - Versetzter zielleitungsbetrieb in einem einzigen ras-zyklus - Google Patents

Versetzter zielleitungsbetrieb in einem einzigen ras-zyklus

Info

Publication number
ATE212469T1
ATE212469T1 AT97945588T AT97945588T ATE212469T1 AT E212469 T1 ATE212469 T1 AT E212469T1 AT 97945588 T AT97945588 T AT 97945588T AT 97945588 T AT97945588 T AT 97945588T AT E212469 T1 ATE212469 T1 AT E212469T1
Authority
AT
Austria
Prior art keywords
row
signals
address
decode
activated
Prior art date
Application number
AT97945588T
Other languages
English (en)
Inventor
James P Rupp
Original Assignee
Micron Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micron Technology Inc filed Critical Micron Technology Inc
Application granted granted Critical
Publication of ATE212469T1 publication Critical patent/ATE212469T1/de

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C8/00Arrangements for selecting an address in a digital store
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/30Accessing single arrays
    • G11C29/34Accessing multiple bits simultaneously
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C8/00Arrangements for selecting an address in a digital store
    • G11C8/04Arrangements for selecting an address in a digital store using a sequential addressing device, e.g. shift register, counter
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C8/00Arrangements for selecting an address in a digital store
    • G11C8/10Decoders
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C8/00Arrangements for selecting an address in a digital store
    • G11C8/12Group selection circuits, e.g. for memory block selection, chip selection, array selection
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C8/00Arrangements for selecting an address in a digital store
    • G11C8/18Address timing or clocking circuits; Address control signal generation or management, e.g. for row address strobe [RAS] or column address strobe [CAS] signals

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Dram (AREA)
  • Steroid Compounds (AREA)
  • Optical Recording Or Reproduction (AREA)
  • Inorganic Insulating Materials (AREA)
  • Inert Electrodes (AREA)
AT97945588T 1996-11-04 1997-10-31 Versetzter zielleitungsbetrieb in einem einzigen ras-zyklus ATE212469T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/743,476 US5691951A (en) 1996-11-04 1996-11-04 Staggered row line firing in single ras cycle
PCT/US1997/019967 WO1998020495A1 (en) 1996-11-04 1997-10-31 Staggered row line firing in a single ras cycle

Publications (1)

Publication Number Publication Date
ATE212469T1 true ATE212469T1 (de) 2002-02-15

Family

ID=24988927

Family Applications (1)

Application Number Title Priority Date Filing Date
AT97945588T ATE212469T1 (de) 1996-11-04 1997-10-31 Versetzter zielleitungsbetrieb in einem einzigen ras-zyklus

Country Status (8)

Country Link
US (1) US5691951A (de)
EP (1) EP0935802B1 (de)
JP (1) JP3271175B2 (de)
KR (1) KR100298821B1 (de)
AT (1) ATE212469T1 (de)
AU (1) AU5102798A (de)
DE (1) DE69710093T2 (de)
WO (1) WO1998020495A1 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6477082B2 (en) 2000-12-29 2002-11-05 Micron Technology, Inc. Burst access memory with zero wait states
US6556503B2 (en) 2001-08-21 2003-04-29 Micron Technology, Inc. Methods and apparatus for reducing decoder area
KR100927395B1 (ko) * 2003-04-29 2009-11-19 주식회사 하이닉스반도체 데이터 인 스트로브 신호 발생 장치

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4885720A (en) * 1988-04-01 1989-12-05 International Business Machines Corporation Memory device and method implementing wordline redundancy without an access time penalty
JP2601931B2 (ja) * 1990-04-06 1997-04-23 株式会社東芝 半導体不揮発性メモリ装置
US5291443A (en) * 1991-06-26 1994-03-01 Micron Technology, Inc. Simultaneous read and refresh of different rows in a dram
US5274591A (en) * 1992-08-13 1993-12-28 Micron Technology, Inc. Serial clock noise immunity in a semiconductor memory integrated circuit having a serial port
US5297087A (en) * 1993-04-29 1994-03-22 Micron Semiconductor, Inc. Methods and devices for accelerating failure of marginally defective dielectric layers
JP3130705B2 (ja) * 1993-06-25 2001-01-31 株式会社東芝 半導体メモリ回路
US5381368A (en) * 1993-12-10 1995-01-10 Micron Semiconductor, Inc. Hardware implemented row copy enable mode for DRAMS to create repetitive backgrounds for video images or DRAM testing
WO1995024774A2 (en) * 1994-03-09 1995-09-14 Philips Electronics N.V. Memory iddq-testable through cumulative word line activation
US5440517A (en) * 1994-08-15 1995-08-08 Micron Technology, Inc. DRAMs having on-chip row copy circuits for use in testing and video imaging and method for operating same
US5469384A (en) * 1994-09-27 1995-11-21 Cypress Semiconductor Corp. Decoding scheme for reliable multi bit hot electron programming
US5625790A (en) * 1995-09-14 1997-04-29 Micron Technology, Inc. Method and apparatus for reducing the access time of a memory device by decoding a row address during a precharge period of the memory device

Also Published As

Publication number Publication date
DE69710093T2 (de) 2002-07-18
KR100298821B1 (ko) 2001-09-29
EP0935802B1 (de) 2002-01-23
EP0935802A1 (de) 1999-08-18
DE69710093D1 (de) 2002-03-14
US5691951A (en) 1997-11-25
JP3271175B2 (ja) 2002-04-02
KR20000053023A (ko) 2000-08-25
WO1998020495A1 (en) 1998-05-14
JP2000504459A (ja) 2000-04-11
AU5102798A (en) 1998-05-29

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Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties