ATE172810T1 - Informationsverarbeitungsvorrichtung - Google Patents

Informationsverarbeitungsvorrichtung

Info

Publication number
ATE172810T1
ATE172810T1 AT92303508T AT92303508T ATE172810T1 AT E172810 T1 ATE172810 T1 AT E172810T1 AT 92303508 T AT92303508 T AT 92303508T AT 92303508 T AT92303508 T AT 92303508T AT E172810 T1 ATE172810 T1 AT E172810T1
Authority
AT
Austria
Prior art keywords
elastic members
detecting
displacement
information
processor
Prior art date
Application number
AT92303508T
Other languages
English (en)
Inventor
Ryo Kuroda
Toshihiko Miyazaki
Kunihiro Sakai
Kiyoshi Takimoto
Original Assignee
Canon Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Kk filed Critical Canon Kk
Application granted granted Critical
Publication of ATE172810T1 publication Critical patent/ATE172810T1/de

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • G11B9/1418—Disposition or mounting of heads or record carriers
    • G11B9/1427—Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/874—Probe tip array
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/902—Specified use of nanostructure
    • Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
    • Y10S977/943—Information storage or retrieval using nanostructure
    • Y10S977/947—Information storage or retrieval using nanostructure with scanning probe instrument

Landscapes

  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Debugging And Monitoring (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Saccharide Compounds (AREA)
AT92303508T 1991-04-22 1992-04-21 Informationsverarbeitungsvorrichtung ATE172810T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3116545A JP3000492B2 (ja) 1991-04-22 1991-04-22 情報処理装置

Publications (1)

Publication Number Publication Date
ATE172810T1 true ATE172810T1 (de) 1998-11-15

Family

ID=14689770

Family Applications (1)

Application Number Title Priority Date Filing Date
AT92303508T ATE172810T1 (de) 1991-04-22 1992-04-21 Informationsverarbeitungsvorrichtung

Country Status (6)

Country Link
US (1) US5260926A (de)
EP (1) EP0510895B1 (de)
JP (1) JP3000492B2 (de)
AT (1) ATE172810T1 (de)
CA (1) CA2066343C (de)
DE (1) DE69227397T2 (de)

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JPH041949A (ja) * 1990-04-18 1992-01-07 Canon Inc 情報入力及び／または取出し装置
JPH041948A (ja) * 1990-04-18 1992-01-07 Canon Inc 情報記録装置及び情報再生装置及び情報記録再生装置
JPH05282717A (ja) * 1992-03-31 1993-10-29 Canon Inc 記録媒体の製造方法、及び記録媒体、及び情報処理装置
JP2895694B2 (ja) * 1992-12-08 1999-05-24 シャープ株式会社 情報記録・再生用スライダー、情報記録・再生用スライダーの製造方法および情報記録・再生装置
JP3384009B2 (ja) * 1992-12-25 2003-03-10 キヤノン株式会社 デジタルテレビジョン受像機
DE4310349C2 (de) * 1993-03-30 2000-11-16 Inst Mikrotechnik Mainz Gmbh Sensorkopf und Verfahren zu seiner Herstellung
JP3162883B2 (ja) * 1993-09-29 2001-05-08 キヤノン株式会社 情報記録再生装置
US5633455A (en) * 1993-10-05 1997-05-27 Board Of Trustees Of The Leland Stanford, Jr. University Method of detecting particles of semiconductor wafers
US7073254B2 (en) 1993-11-16 2006-07-11 Formfactor, Inc. Method for mounting a plurality of spring contact elements
US20020053734A1 (en) 1993-11-16 2002-05-09 Formfactor, Inc. Probe card assembly and kit, and methods of making same
US5453616A (en) * 1994-10-18 1995-09-26 Seiko Instruments, Inc. Probe microscope having error correction piezoelectric scanner
US20100065963A1 (en) 1995-05-26 2010-03-18 Formfactor, Inc. Method of wirebonding that utilizes a gas flow within a capillary from which a wire is played out
US5874668A (en) * 1995-10-24 1999-02-23 Arch Development Corporation Atomic force microscope for biological specimens
JPH09196933A (ja) * 1996-01-19 1997-07-31 Canon Inc プローブとプローブの作製方法、及びプローブユニット、並びにこれを用いた情報記録再生装置
US8033838B2 (en) 1996-02-21 2011-10-11 Formfactor, Inc. Microelectronic contact structure
JPH10246730A (ja) * 1997-03-04 1998-09-14 Canon Inc プローブとその製造方法、及び該プローブを備えた情報処理装置
US6139759A (en) 1997-07-08 2000-10-31 International Business Machines Corporation Method of manufacturing silicided silicon microtips for scanning probe microscopy
US7304486B2 (en) * 1998-07-08 2007-12-04 Capres A/S Nano-drive for high resolution positioning and for positioning of a multi-point probe
CN100387968C (zh) * 1999-06-05 2008-05-14 株式会社大宇电子 原子力显微镜及其驱动方法
US6525307B1 (en) * 1999-09-16 2003-02-25 Ut-Battelle, Llc Integrated optical interrogation of micro-structures
US7262611B2 (en) 2000-03-17 2007-08-28 Formfactor, Inc. Apparatuses and methods for planarizing a semiconductor contactor
US6729019B2 (en) 2001-07-11 2004-05-04 Formfactor, Inc. Method of manufacturing a probe card
EP1575058A1 (de) * 2004-03-08 2005-09-14 Consejo Superior De Investigaciones Cientificas Vorrichtung und Verfahren zur Erfassung von Verschiebungen einer Mehrheit von Mikro- und Nanomechanischen Bauelementen, wie Mikrocantilevern.
US7571638B1 (en) * 2005-05-10 2009-08-11 Kley Victor B Tool tips with scanning probe microscopy and/or atomic force microscopy applications
US9423693B1 (en) 2005-05-10 2016-08-23 Victor B. Kley In-plane scanning probe microscopy tips and tools for wafers and substrates with diverse designs on one wafer or substrate
US7136215B1 (en) * 2005-05-18 2006-11-14 Avago Technologies Fiber Ip (Singapore) Pte. Ltd. Piezoelectrically-activated cantilevered spatial light modulator
US7622780B2 (en) * 2006-12-21 2009-11-24 Intel Corporation Seek-scan probe (SSP) including see-saw scan probe with redundant tip
JP4946763B2 (ja) * 2007-10-01 2012-06-06 ブラザー工業株式会社 屈曲検出装置
JP2010156682A (ja) * 2008-12-04 2010-07-15 Kinki Univ 帯電物の電位測定装置及び当該測定装置を使用した場合の測定方法
WO2010085768A1 (en) * 2009-01-26 2010-07-29 Nanoink,Inc. Large area, homogeneous array fabbrication including leveling with use of bright spots
US20130205455A1 (en) * 2012-02-07 2013-08-08 University Of Western Australia System and method of performing atomic force measurements
US9835591B2 (en) 2011-02-25 2017-12-05 Panorama Synergy Ltd Optical cantilever based analysis
US9057706B2 (en) 2011-02-25 2015-06-16 University Of Western Australia Optical cantilever based analyte detection
US9778572B1 (en) 2013-03-15 2017-10-03 Victor B. Kley In-plane scanning probe microscopy tips and tools for wafers and substrates with diverse designs on one wafer or substrate

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3609002A (en) * 1969-12-30 1971-09-28 Bell Telephone Labor Inc Multiple element optical memory structures using fine grain ferroelectric ceramics
JPS60143462A (ja) * 1983-12-29 1985-07-29 Fuji Photo Film Co Ltd 磁気記録情報再生方法および装置
DE3509710C2 (de) * 1984-04-13 1996-03-28 Xerox Corp Elektrostatisches Voltmeter
JPS62112242A (ja) * 1985-11-11 1987-05-23 Hitachi Ltd マルチ再生光ピツクアツプ
JP2756254B2 (ja) * 1988-03-25 1998-05-25 キヤノン株式会社 記録装置及び再生装置
JPH02187944A (ja) * 1989-01-13 1990-07-24 Sharp Corp 再生装置
GB8910566D0 (en) * 1989-05-08 1989-06-21 Amersham Int Plc Imaging apparatus and method
DE69029478T2 (de) * 1989-06-23 1997-05-15 Univ Leland Stanford Junior Verfahren und vorrichtung zum speichern numerischer informationen in form gespeicherter ladungen
EP0413042B1 (de) * 1989-08-16 1992-12-16 International Business Machines Corporation Verfahren für die Herstellung mikromechanischer Messfühler für AFM/STM-Profilometrie und mikromechanischer Messfühlerkopf
US5144128A (en) * 1990-02-05 1992-09-01 Hitachi, Ltd. Surface microscope and surface microscopy
US5065103A (en) * 1990-03-27 1991-11-12 International Business Machines Corporation Scanning capacitance - voltage microscopy
ATE155579T1 (de) * 1990-08-14 1997-08-15 Canon Kk Biegebalkenmessfühler und mit dem messfühler ausgestattete informationsverarbeitungsvorrichtung
JPH04115103A (ja) * 1990-09-05 1992-04-16 Canon Inc カンチレバー型プローブ及び該プローブを用いた走査型トンネル顕微鏡、精密位置決め装置、情報処理装置
US5166520A (en) * 1991-05-13 1992-11-24 The Regents Of The University Of California Universal, microfabricated probe for scanning probe microscopes

Also Published As

Publication number Publication date
CA2066343C (en) 1995-10-03
CA2066343A1 (en) 1992-10-23
EP0510895A3 (en) 1994-06-01
DE69227397T2 (de) 1999-04-29
JPH04321955A (ja) 1992-11-11
US5260926A (en) 1993-11-09
EP0510895B1 (de) 1998-10-28
EP0510895A2 (de) 1992-10-28
DE69227397D1 (de) 1998-12-03
JP3000492B2 (ja) 2000-01-17

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