AR231671A1 - Aparato para probar la capacidad de funcionamiento de un dispositivo semiconductor - Google Patents

Aparato para probar la capacidad de funcionamiento de un dispositivo semiconductor

Info

Publication number
AR231671A1
AR231671A1 AR291286A AR29128682A AR231671A1 AR 231671 A1 AR231671 A1 AR 231671A1 AR 291286 A AR291286 A AR 291286A AR 29128682 A AR29128682 A AR 29128682A AR 231671 A1 AR231671 A1 AR 231671A1
Authority
AR
Argentina
Prior art keywords
testing
operating capacity
semiconductive device
semiconductive
capacity
Prior art date
Application number
AR291286A
Other languages
English (en)
Original Assignee
Dimetronic Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dimetronic Sa filed Critical Dimetronic Sa
Application granted granted Critical
Publication of AR231671A1 publication Critical patent/AR231671A1/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/263—Circuits therefor for testing thyristors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Safety Devices In Control Systems (AREA)
  • Tests Of Electronic Circuits (AREA)
AR291286A 1981-11-14 1982-11-12 Aparato para probar la capacidad de funcionamiento de un dispositivo semiconductor AR231671A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB8134401 1981-11-14

Publications (1)

Publication Number Publication Date
AR231671A1 true AR231671A1 (es) 1985-01-31

Family

ID=10525905

Family Applications (1)

Application Number Title Priority Date Filing Date
AR291286A AR231671A1 (es) 1981-11-14 1982-11-12 Aparato para probar la capacidad de funcionamiento de un dispositivo semiconductor

Country Status (13)

Country Link
US (1) US4554507A (es)
EP (1) EP0079743B1 (es)
JP (1) JPS5892971A (es)
AR (1) AR231671A1 (es)
AU (1) AU549250B2 (es)
BR (1) BR8206592A (es)
DE (1) DE3269226D1 (es)
ES (1) ES8402943A1 (es)
GB (1) GB2110389B (es)
MX (1) MX151751A (es)
NZ (1) NZ202464A (es)
ZA (1) ZA827794B (es)
ZW (1) ZW23682A1 (es)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4845475A (en) * 1987-11-17 1989-07-04 The Boeing Company Automatic testing of position sensing devices employing stored sensed position
US5223821A (en) * 1991-10-28 1993-06-29 Forney International, Inc. Triac power switching and testing system
GB9310828D0 (en) * 1993-05-26 1993-07-14 Brown Nigel Testing electrical devices
GB2286891B (en) * 1994-02-24 1997-12-17 Strand Lighting Ltd Dimmer fault reporting
DE19532633A1 (de) * 1995-08-22 1997-02-27 Fahrzeugausruestung Berlin Gmb Schaltungsanordnung zur Überwachung der Sperrfähigkeit in Reihe geschalteter elektronischer Schaltelemente
FR2747864B1 (fr) * 1996-04-22 1998-07-17 Crouzet Automatismes Relais statique avec detection d'etat
DE10231180A1 (de) * 2002-07-10 2003-10-30 Siemens Ag Messumformer
US7402992B2 (en) * 2006-05-26 2008-07-22 At&T Knowledge Ventures, L.P. Circuit component tester
CA2783100C (en) 2011-07-14 2018-05-01 Sunbeam Products, Inc. Safety circuit for heating device
US10164421B1 (en) * 2016-01-13 2018-12-25 Gabriel S. Kohn Safety circuits for electrical products

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL259823A (es) * 1961-01-06
US3648233A (en) * 1968-07-03 1972-03-07 Gulf & Western Industries Load control error detector
FR2299757A1 (fr) * 1975-01-31 1976-08-27 Alsthom Cgee Controle automatique des thyristors en fonctionnement
US4415844A (en) * 1981-02-09 1983-11-15 Priam Digital motor speed controller

Also Published As

Publication number Publication date
AU9033882A (en) 1983-05-19
BR8206592A (pt) 1983-10-04
MX151751A (es) 1985-03-04
US4554507A (en) 1985-11-19
ES517335A0 (es) 1984-03-01
AU549250B2 (en) 1986-01-23
EP0079743B1 (en) 1986-02-19
ZW23682A1 (en) 1983-02-02
GB2110389B (en) 1986-01-22
NZ202464A (en) 1985-12-13
GB2110389A (en) 1983-06-15
DE3269226D1 (en) 1986-03-27
EP0079743A1 (en) 1983-05-25
ES8402943A1 (es) 1984-03-01
ZA827794B (en) 1983-09-28
JPS5892971A (ja) 1983-06-02

Similar Documents

Publication Publication Date Title
DE3263256D1 (en) Device for testing semiconductor devices at a high temperature
IT1161868B (it) Dispositivo a semicondutturi e procedimento per la sua fabbricazione
ES525837A0 (es) Un dispositivo para ensayo de pozos
DE3370249D1 (de) Mis semiconductor device
NO830725L (no) Anordning for maaling i borehull
DE3382802D1 (de) Halbleiterspeichergerät
IT1147355B (it) Dispositivo per lo scarto di pacchetti difettosi
IT1167659B (it) Procedimento per la fabbricazione di un dispositivo a semiconduttori
ES495473A0 (es) Aparato para la sujecion de dispositivos sometidos a prueba de estanqueidad
IT1164353B (it) Dispositivo semiconduttore
NO860418L (no) I segmenter oppdelt tetningsanordning for roterende utstyr
AR231671A1 (es) Aparato para probar la capacidad de funcionamiento de un dispositivo semiconductor
ES525658A0 (es) Un metodo para producir un dispositivo semiconductor de pelicula delgada
AR231194A1 (es) Un aparato para la medicion de fuerzas
BR7904617A (pt) Dispositivo de refrigeracao para elementos construtivos semicondutores
ES518662A0 (es) Procedimiento para la formacion de un dispositivo semiconductor.
IT1139664B (it) Dispositivo semiconduttore
KR840005919A (ko) 반도체 장치
IT1151209B (it) Procedimento per la fabbricazione di un dispositivo a semiconduttori
JPS5543900A (en) Apparatus for manufacturing semiconductor device
IT1138316B (it) Dispositivo semiconduttore
IT1172446B (it) Dispositivo semiconduttore
IT1139848B (it) Dispositivo semiconduttore
ES270612Y (es) Un aparato para medir la velocidad de reaccion de un ser humano.
IT1161869B (it) Dispositivo a semiconduttori e procedimento per la sua fabbricazione