IT1172446B - Dispositivo semiconduttore - Google Patents

Dispositivo semiconduttore

Info

Publication number
IT1172446B
IT1172446B IT24175/83A IT2417583A IT1172446B IT 1172446 B IT1172446 B IT 1172446B IT 24175/83 A IT24175/83 A IT 24175/83A IT 2417583 A IT2417583 A IT 2417583A IT 1172446 B IT1172446 B IT 1172446B
Authority
IT
Italy
Prior art keywords
semiconductive device
semiconductive
Prior art date
Application number
IT24175/83A
Other languages
English (en)
Other versions
IT8324175A0 (it
IT8324175A1 (it
Inventor
Henricus Theodorus Jaco Tacken
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Publication of IT8324175A0 publication Critical patent/IT8324175A0/it
Publication of IT8324175A1 publication Critical patent/IT8324175A1/it
Application granted granted Critical
Publication of IT1172446B publication Critical patent/IT1172446B/it

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/0684Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape, relative sizes or dispositions of the semiconductor regions or junctions between the regions
    • H01L29/0692Surface layout
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
    • H01L27/0203Particular design considerations for integrated circuits
    • H01L27/0207Geometrical layout of the components, e.g. computer aided design; custom LSI, semi-custom LSI, standard cell technique
    • H01L27/0211Geometrical layout of the components, e.g. computer aided design; custom LSI, semi-custom LSI, standard cell technique adapted for requirements of temperature
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/08Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/0804Emitter regions of bipolar transistors
IT24175/83A 1982-12-17 1983-12-14 Dispositivo semiconduttore IT1172446B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL8204878A NL8204878A (nl) 1982-12-17 1982-12-17 Halfgeleiderinrichting.

Publications (3)

Publication Number Publication Date
IT8324175A0 IT8324175A0 (it) 1983-12-14
IT8324175A1 IT8324175A1 (it) 1985-06-14
IT1172446B true IT1172446B (it) 1987-06-18

Family

ID=19840761

Family Applications (1)

Application Number Title Priority Date Filing Date
IT24175/83A IT1172446B (it) 1982-12-17 1983-12-14 Dispositivo semiconduttore

Country Status (8)

Country Link
US (1) US4642668A (it)
JP (1) JPS59117263A (it)
CA (1) CA1204521A (it)
DE (1) DE3343632C2 (it)
FR (1) FR2538168B1 (it)
GB (1) GB2133619B (it)
IT (1) IT1172446B (it)
NL (1) NL8204878A (it)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1215230B (it) * 1985-01-08 1990-01-31 Ates Componenti Elettron Diretta. dispositivo a semiconduttore integrato con drastica riduzione dei fenomeni di rottura secondaria
DE3802767A1 (de) * 1988-01-30 1989-08-10 Bosch Gmbh Robert Elektronisches geraet
DE3802821A1 (de) * 1988-01-30 1989-08-03 Bosch Gmbh Robert Leistungstransistor
EP0560123A3 (en) * 1992-03-12 1994-05-25 Siemens Ag Power transistor with multiple finger contacts
US6611172B1 (en) * 2001-06-25 2003-08-26 Sirenza Microdevices, Inc. Thermally distributed darlington amplifier
US6703895B1 (en) * 2002-09-26 2004-03-09 Motorola, Inc. Semiconductor component and method of operating same
US10403621B2 (en) 2014-10-29 2019-09-03 Taiwan Semiconductor Manufacturing Company, Ltd. Circuit layout, layout method and system for implementing the method

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3567506A (en) * 1968-03-22 1971-03-02 Hughes Aircraft Co Method for providing a planar transistor with heat-dissipating top base and emitter contacts
US3896486A (en) * 1968-05-06 1975-07-22 Rca Corp Power transistor having good thermal fatigue capabilities
GB1288384A (it) * 1969-01-31 1972-09-06
US3667064A (en) * 1969-05-19 1972-05-30 Massachusetts Inst Technology Power semiconductor device with negative thermal feedback
US3704398A (en) * 1970-02-14 1972-11-28 Nippon Electric Co Multi-emitter power transistor having emitter region arrangement for achieving substantially uniform emitter-base junction temperatures
US3995304A (en) * 1972-01-10 1976-11-30 Teledyne, Inc. D/A bit switch
US3868720A (en) * 1973-12-17 1975-02-25 Westinghouse Electric Corp High frequency bipolar transistor with integral thermally compensated degenerative feedback resistance
NL7405237A (nl) * 1974-04-18 1975-10-21 Philips Nv Parallelschakelen van halfgeleidersystemen.
US3952259A (en) * 1975-04-28 1976-04-20 Rockwell International Corporation Gain control apparatus
NL181612C (nl) * 1977-05-25 1988-03-16 Philips Nv Halfgeleiderinrichting.
JPS5422784A (en) * 1977-07-22 1979-02-20 Hitachi Ltd Semiconductor integrated circuit device for output
US4136354A (en) * 1977-09-15 1979-01-23 National Semiconductor Corporation Power transistor including a sense emitter and a reference emitter for enabling power dissipation to be limited to less than a destructive level
US4161740A (en) * 1977-11-07 1979-07-17 Microwave Semiconductor Corp. High frequency power transistor having reduced interconnection inductance and thermal resistance

Also Published As

Publication number Publication date
JPH0420264B2 (it) 1992-04-02
NL8204878A (nl) 1984-07-16
GB2133619A (en) 1984-07-25
FR2538168A1 (fr) 1984-06-22
CA1204521A (en) 1986-05-13
IT8324175A0 (it) 1983-12-14
FR2538168B1 (fr) 1988-10-14
IT8324175A1 (it) 1985-06-14
DE3343632C2 (de) 1993-09-30
GB2133619B (en) 1986-08-20
DE3343632A1 (de) 1984-06-20
JPS59117263A (ja) 1984-07-06
US4642668A (en) 1987-02-10
GB8333233D0 (en) 1984-01-18

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Legal Events

Date Code Title Description
TA Fee payment date (situation as of event date), data collected since 19931001

Effective date: 19960111