ZA793095B - A method and apparatus for measuring the content or quantity of a given element by means of x-ray-radiation - Google Patents

A method and apparatus for measuring the content or quantity of a given element by means of x-ray-radiation

Info

Publication number
ZA793095B
ZA793095B ZA793095A ZA793095A ZA793095B ZA 793095 B ZA793095 B ZA 793095B ZA 793095 A ZA793095 A ZA 793095A ZA 793095 A ZA793095 A ZA 793095A ZA 793095 B ZA793095 B ZA 793095B
Authority
ZA
South Africa
Prior art keywords
ray
radiation
measuring
content
given element
Prior art date
Application number
ZA793095A
Other languages
English (en)
Inventor
N Baecklund
Original Assignee
N Baecklund
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by N Baecklund filed Critical N Baecklund
Publication of ZA793095B publication Critical patent/ZA793095B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/10—Power supply arrangements for feeding the X-ray tube
    • H05G1/12—Power supply arrangements for feeding the X-ray tube with dc or rectified single-phase ac or double-phase
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/112—Non-rotating anodes
    • H01J35/116—Transmissive anodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/16—Vessels; Containers; Shields associated therewith
    • H01J35/18—Windows
    • H01J35/186—Windows used as targets or X-ray converters

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
ZA793095A 1978-06-21 1979-06-21 A method and apparatus for measuring the content or quantity of a given element by means of x-ray-radiation ZA793095B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE7807078A SE415804B (sv) 1978-06-21 1978-06-21 Sett att medelst rontgenstralning meta halten eller mengden av ett forutbestemt grundemne i ett prov, samt anordning for utforande av settet

Publications (1)

Publication Number Publication Date
ZA793095B true ZA793095B (en) 1980-08-27

Family

ID=20335268

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA793095A ZA793095B (en) 1978-06-21 1979-06-21 A method and apparatus for measuring the content or quantity of a given element by means of x-ray-radiation

Country Status (11)

Country Link
US (1) US4344181A (fi)
JP (2) JPS552991A (fi)
AU (1) AU522334B2 (fi)
CA (1) CA1139021A (fi)
DE (1) DE2924244C2 (fi)
FI (1) FI72814C (fi)
FR (1) FR2429425A1 (fi)
GB (1) GB2025040B (fi)
NL (1) NL7904500A (fi)
SE (1) SE415804B (fi)
ZA (1) ZA793095B (fi)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE428974B (sv) * 1979-02-07 1983-08-01 Nils Johannes Baecklund Sett att medelst rontgenstralning meta halten av ett forutbestemt emne i ett prov
US4484341A (en) * 1981-10-02 1984-11-20 Radiation Dynamics, Inc. Method and apparatus for selectively radiating materials with electrons and X-rays
US4731804A (en) * 1984-12-31 1988-03-15 North American Philips Corporation Window configuration of an X-ray tube
FR2600422B1 (fr) * 1986-05-29 1989-10-13 Instruments Sa Appareil et procede d'analyses chimiques locales a la surface de materiaux solides par spectroscopie de photo-electrons x
GB8621983D0 (en) * 1986-09-12 1986-10-22 K X Technology Ltd Ore analysis
US5452720A (en) * 1990-09-05 1995-09-26 Photoelectron Corporation Method for treating brain tumors
US5442678A (en) * 1990-09-05 1995-08-15 Photoelectron Corporation X-ray source with improved beam steering
US5369679A (en) * 1990-09-05 1994-11-29 Photoelectron Corporation Low power x-ray source with implantable probe for treatment of brain tumors
US5153900A (en) * 1990-09-05 1992-10-06 Photoelectron Corporation Miniaturized low power x-ray source
US5115457A (en) * 1990-10-01 1992-05-19 E. I. Du Pont De Nemours And Company Method of determining titanium dioxide content in paint
EP0847249A4 (en) 1995-08-24 2004-09-29 Medtronic Ave Inc X-RAYS CATHETER
US6377846B1 (en) 1997-02-21 2002-04-23 Medtronic Ave, Inc. Device for delivering localized x-ray radiation and method of manufacture
DE69823406T2 (de) * 1997-02-21 2005-01-13 Medtronic AVE, Inc., Santa Rosa Röntgenvorrichtung versehen mit einer Dehnungsstruktur zur lokalen Bestrahlung des Inneren eines Körpers
FI102697B (fi) * 1997-06-26 1999-01-29 Metorex Internat Oy Polarisoitua herätesäteilyä hyödyntävä röntgenfluoresenssimittausjärje stely ja röntgenputki
US5854822A (en) * 1997-07-25 1998-12-29 Xrt Corp. Miniature x-ray device having cold cathode
US6108402A (en) * 1998-01-16 2000-08-22 Medtronic Ave, Inc. Diamond vacuum housing for miniature x-ray device
US6069938A (en) * 1998-03-06 2000-05-30 Chornenky; Victor Ivan Method and x-ray device using pulse high voltage source
US6195411B1 (en) 1999-05-13 2001-02-27 Photoelectron Corporation Miniature x-ray source with flexible probe
JP2003142294A (ja) * 2001-10-31 2003-05-16 Ge Medical Systems Global Technology Co Llc 高電圧発生回路およびｘ線発生装置
EP2111239B1 (en) 2006-12-15 2013-03-06 Lifebond Ltd. Gelatin-transglutaminase hemostatic dressings and sealants
EP2133069A1 (en) 2008-06-12 2009-12-16 Lifebond Process for manufacture of gelatin solutions and products thereof
US20110112573A1 (en) * 2008-06-18 2011-05-12 Orahn Preiss Bloom Methods and devices for use with sealants
CN102124058B (zh) 2008-06-18 2014-05-28 生命连结有限公司 改进的交联组合物
EP2543394A1 (en) * 2008-06-18 2013-01-09 Lifebond Ltd A method for enzymatic cross-linking of a protein
EP2515957B1 (en) 2009-12-22 2015-07-29 Lifebond Ltd Modification of enzymatic crosslinkers for controlling properties of crosslinked matrices
CN103118713B (zh) 2010-08-05 2016-06-01 生命连结有限公司 干组合物伤口敷料及粘合剂
US11998654B2 (en) 2018-07-12 2024-06-04 Bard Shannon Limited Securing implants and medical devices

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE518895A (fi) * 1952-02-20
US2999937A (en) * 1958-10-20 1961-09-12 Philips Corp X-ray apparatus
DE1773759A1 (de) * 1968-07-03 1972-03-16 Vnii Raswedotschnoj Geofisiki Vorrichtung fuer Roentgenspektralanalyse
JPS5435078B1 (fi) * 1970-07-30 1979-10-31
US4048496A (en) * 1972-05-08 1977-09-13 Albert Richard D Selectable wavelength X-ray source, spectrometer and assay method
US3925660A (en) * 1972-05-08 1975-12-09 Richard D Albert Selectable wavelength X-ray source, spectrometer and assay method
JPS5139580B2 (fi) * 1973-02-08 1976-10-28
JPS5232593B2 (fi) * 1973-09-06 1977-08-23
JPS5346062Y2 (fi) * 1973-11-06 1978-11-04
JPS5139580U (fi) * 1974-09-18 1976-03-24
US3963922A (en) * 1975-06-09 1976-06-15 Nuclear Semiconductor X-ray fluorescence device
GB1537099A (en) * 1976-06-15 1978-12-29 United Scient Corp X-ray fluorescence device

Also Published As

Publication number Publication date
FI791817A (fi) 1979-12-22
NL7904500A (nl) 1979-12-28
AU522334B2 (en) 1982-05-27
CA1139021A (en) 1983-01-04
GB2025040B (en) 1982-11-17
DE2924244A1 (de) 1980-01-03
AU4823679A (en) 1980-01-03
JPS6419160U (fi) 1989-01-31
DE2924244C2 (de) 1987-05-07
JPH0334681Y2 (fi) 1991-07-23
SE415804B (sv) 1980-10-27
FR2429425A1 (fr) 1980-01-18
GB2025040A (en) 1980-01-16
US4344181A (en) 1982-08-10
FI72814B (fi) 1987-03-31
JPS552991A (en) 1980-01-10
SE7807078L (sv) 1979-12-22
FI72814C (fi) 1987-07-10
FR2429425B1 (fi) 1985-04-26

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