WO2023007628A1 - 電気回路異常検知装置 - Google Patents
電気回路異常検知装置 Download PDFInfo
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- WO2023007628A1 WO2023007628A1 PCT/JP2021/027957 JP2021027957W WO2023007628A1 WO 2023007628 A1 WO2023007628 A1 WO 2023007628A1 JP 2021027957 W JP2021027957 W JP 2021027957W WO 2023007628 A1 WO2023007628 A1 WO 2023007628A1
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- reflected wave
- electric circuit
- abnormality
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- directional coupler
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/58—Testing of lines, cables or conductors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/005—Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing phase or frequency of 2 mutually independent oscillations in demodulators)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
- G01R23/165—Spectrum analysis; Fourier analysis using filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
- G01R29/027—Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/08—Locating faults in cables, transmission lines, or networks
- G01R31/11—Locating faults in cables, transmission lines, or networks using pulse reflection methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/54—Testing for continuity
Definitions
- the present invention relates to an electric circuit abnormality detection device that detects an abnormality in an electric circuit.
- a flip chip bonding method is used in which a conductive bonding material such as a solder bump or a gold bump is placed between the wiring part in the semiconductor chip and the substrate, and the conductive bonding material is heated and melted by a heater to bond the semiconductor chip and the substrate. It is This method involves heating the entire bonding area where the gold bumps are present to rapidly raise the temperature to thermally melt the conductive bonding material, and then rapidly lowering the temperature of the bonding area to solidify the conductive bonding material.
- a pulse heater capable of
- JP-A-10-275833 Japanese Patent No. 3277862
- an object of the present invention is to detect an abnormality in an electric circuit at an early stage.
- An electric circuit abnormality detection device of the present invention is provided between a pulse generator that inputs a pulse signal to an electric circuit and a connection line that connects the electric circuit and the pulse generator, and the pulse signal is input from the pulse generator to the electric circuit.
- a directional coupler for extracting a reflected wave from the electrical circuit of the pulse signal;
- a detection unit connected to the directional coupler for processing the reflected wave input from the directional coupler to detect an abnormality in the electrical circuit; wherein the detection unit has a waveform of a reference reflected wave input from the directional coupler when a pulse signal is input to a normal reference electrical circuit having the same wiring pattern as the electrical circuit
- an abnormality in the electric circuit is detected.
- Abnormality detection can be performed without being affected by a change in resistance value due to an increase.
- an abnormality such as a partial disconnection, in which an increase in resistance value due to an abnormality in an electric circuit is mixed with an increase in resistance value due to heat generated during energization, can be detected at an early stage.
- the electric circuit abnormality detection device of the present invention includes a low-pass filter provided between the directional coupler and the detection unit, the electric circuit includes a large number of reflection sources that reflect the pulse signal input from the pulse generator, The reflected wave and the reference reflected wave input to the detection unit have a waveform obtained by passing through a low-pass filter a composite reflected wave in which a large number of individual reflected waves reflected by a large number of reflection sources are superimposed. may detect an abnormality in the electric circuit when the difference between the magnitude of the reflected wave and the magnitude of the reference reflected wave exceeds a predetermined range after the magnitude of the reflected wave exceeds a predetermined threshold. .
- the electric circuit and the reference electric circuit may be heaters in which resistance wires are folded in multiple stages.
- heater abnormalities can be detected early.
- the present invention can detect an abnormality in an electric circuit at an early stage.
- FIG. 2 is a plan view showing an electric circuit of a pulse heater for which the electric circuit abnormality detection device of the embodiment performs abnormality detection
- 5 is a graph showing a change over time of reflected waves from the pulse heater that are input to the detection unit of the electrical circuit abnormality detection device of the embodiment when a pulse signal is input to the pulse heater.
- It is a flow chart which shows the operation of the electric circuit abnormality detection device of the embodiment.
- the electrical circuit abnormality detection device 10 of the embodiment will be described below with reference to the drawings. In the following description, the electrical circuit abnormality detection device 10 will be described as detecting an abnormality in the resistance wire 33 of the pulse heater 30 shown in FIG. It is also possible to
- the electrical circuit abnormality detection device 10 is composed of a pulse generator 11, a directional coupler 12, a low-pass filter 13, and a detection unit 14.
- the pulse generator 11 outputs a rectangular or triangular pulse signal to the resistance wire 33 (see FIG. 2) of the pulse heater 30, which is an electric circuit.
- the directional coupler 12 is provided between a connection line 15 that connects the pulse heater 30 and the pulse generator 11 , and multiple reflections from the pulse heater 30 of the pulse signal input from the pulse generator 11 to the pulse heater 30 . It is a device that extracts waves.
- the low-pass filter 13 removes high-frequency noise from the composite reflected wave input from the directional coupler 12 and outputs the resulting reflected wave to the detection unit 14 .
- the detection unit 14 processes the reflected wave input from the low-pass filter 13 to detect an abnormality in the resistance wire 33 of the pulse heater 30 .
- the detection unit 14 is connected to an operation unit 21 including a CPU 23 which is a processor for processing information, and stores an operation program 24 and a reference reflected wave database 25 including waveform information of reference reflected waves. and a storage unit 22 that stores the data.
- the sensing unit 14 may, for example, consist of a general-purpose computer.
- the resistance wire 33 of the pulse heater 30, which is the target of abnormality detection is folded back in multiple stages between the input terminal 31 and the output terminal 32, and includes a large number of bends 34.
- a pulse signal output from the pulse generator 11 and entering the resistance wire 33 is reflected by a large number of bends 34 to form individual reflected waves, which are reflected from the resistance wire 33 toward the pulse generator 11 .
- the resistance wire 33 Since the resistance wire 33 is long and has many bends 34 , many individual reflected waves are reflected from the resistance wire 33 toward the pulse generator 11 . These multiple individual reflected waves become composite reflected waves that are superimposed while traveling through the resistance line 33 . The composite reflected wave contains large high frequency noise.
- a composite reflected wave that has entered the directional coupler 12 from the pulse heater 30 is extracted by the directional coupler 12 and input to the low-pass filter 13 .
- a signal from which high-frequency noise has been removed by the low-pass filter 13 is input to the detection unit 14 as a reflected wave as shown in FIG.
- the waveform of the reflected wave varies depending on the degree of abnormality.
- the solid line a in FIG. 3 indicates the case where the resistance line 33 is normal
- the one-dot chain line b and the two-dot chain line c indicate the case of partial disconnection
- the dashed line d indicates the case of complete disconnection.
- the partial breakage is a case where the cross-sectional area of a part of the resistance wire 33 is smaller than the normal state.
- the waveform of the reflected wave of the state is shown.
- the two-dot chain line c shows the waveform of the reflected wave when the crack in the resistance wire 33 is larger and the loss of the cross-sectional area is larger than in the case of the one-dot chain line b.
- the output voltage value of the reflected wave rises to a predetermined threshold value Vs at time t0, and rapidly rises from time t0.
- the output voltage value increases at first, and becomes a substantially constant output voltage value over time.
- the output increases in the same way as the solid line a without breakage, and after time t1, the output increases slightly from the solid line a.
- the output voltage value increases stepwise with a delay, and as time elapses, the output voltage value becomes a substantially constant output voltage value slightly smaller than when there is no abnormality indicated by the solid line a. For this reason, the output voltage value of the reflected wave from the normal resistance wire 33 with no abnormality indicated by the solid line a, and the output voltage value of the reflected wave from the resistance wire 33 in the case of partial disconnection due to a small crack indicated by the dashed line b The difference from the value becomes large after time t1 shown in FIG. 3, and then the difference becomes small.
- the output voltage value temporarily increases after time t0, but begins to decrease at time t1, and becomes a substantially constant output voltage value that is much smaller than the waveform in the normal state with the passage of time.
- the output voltage increases once after time t0, begins to decrease after time t1, and becomes a substantially constant output voltage value that is much smaller than the waveform in a normal state with no abnormality as time passes. becomes.
- the substantially constant output voltage value at this time is slightly smaller than in the case of the partial disconnection of the two-dot chain line c. For this reason, the output voltage value of the reflected wave from the normal resistance line 33 with no abnormality indicated by the solid line a, and the resistance line when there is an abnormality such as a partial disconnection indicated by the two-dot chain line c and a complete disconnection indicated by the broken line d The difference from the output voltage value of the reflected wave from 33 gradually increases after time t1 shown in FIG.
- the reference reflected wave database 25 stored in the storage unit 22 will be described.
- a normal reference pulse heater having the same wiring pattern as the resistance wire 33 of the pulse heater 30 to be detected as an abnormality is set as a reference electric circuit.
- the time change of the output voltage value of the reflected wave input from the low-pass filter 13 when the pulse signal is input from the pulse generator 11 to the heater is stored as the time change of the reference voltage value of the reference reflected wave.
- the time change of the waveform of the reflected wave indicated by the solid line a in FIG. 3 is stored as waveform information.
- the reference reflected wave database 25 may be, for example, a database that stores temporal changes in the reference voltage value of the reference reflected wave with respect to time from when the reference voltage value of the reference reflected wave exceeds a predetermined threshold value Vs. Since the waveform of the reflected wave differs if the wiring pattern of the resistance wire 33 of the pulse heater 30 is different, the reference reflected wave database 25 stores a plurality of reference waveforms for each type of wiring pattern of the resistance wire 33 of the pulse heater 30 . Waveform information of the reflected wave is stored.
- step S101 in FIG. 4 the pulse generator 11 is caused to emit a pulse signal. Then, the signal of the reflected wave from the low-pass filter 13 is input to the detection unit 14 as shown from time 0 to time t0 in FIG.
- step S102 of FIG. 4 the calculation section 21 of the detection unit 14 waits until the output voltage value of the input reflected wave exceeds a predetermined threshold value Vs. Since the output voltage value reaches the threshold value Vs at time t0 shown in FIG. Start the timer that defines the detection period. Then, the calculation unit 21 proceeds to step S104 in FIG. 4 to calculate the difference ⁇ V between the output voltage value of the reflected wave at time t0 and the reference voltage value of the reference reflected wave stored in the reference reflected wave database 25, It is determined whether the absolute value of the difference ⁇ V exceeds a predetermined value ⁇ Vs.
- the output voltage value of the reflected wave at time t0 is waveform information of the reflected wave at time t0
- the reference voltage value of the reference wave at time t0 is waveform information of the reference wave at time t0.
- the output voltage values of the waveforms of the three reflected waves indicated by the one-dot chain line b, the two-dot chain line c, and the dashed line d are the output voltage values of the waveform indicated by the solid line a, which is similar to the waveform of the reference reflected wave. Since it is almost the same as the voltage value, the calculation unit 21 determines NO in step S104 in FIG. 4, proceeds to step S106 in FIG. 4, and waits until the detection interval ⁇ t shown in FIG. 3 has elapsed. Then, at time t1 after the detection interval ⁇ t from time t0, it is determined whether the timer has expired in step S107 of FIG. 4.
- step S107 of FIG. the difference ⁇ V between the output voltage value of the reflected wave at time t1 and the reference voltage value of the reference reflected wave stored in the reference reflected wave database 25 is calculated. determine whether it exceeds
- the calculation unit 21 determines NO in step S104 of FIG. 4 again, proceeds to step S106 of FIG. Wait until the time elapses, and if the timer has not expired in step S107, return to step S104 in FIG.
- the output voltage values of the waveforms of the three reflected waves indicated by the one-dot chain line b, the two-dot chain line c, and the dashed line d are indicated by the solid line a similar to the waveform of the reference reflected wave. Since there is a difference of the predetermined value ⁇ Vs or more from the output voltage value of the waveform, the calculation unit 21 determines YES in step S104 of FIG. 4, proceeds to step S105 of FIG. 4, and outputs abnormality detection.
- the calculation unit 21 executes steps S106 and S107 in FIG. 4 if NO is determined at the time t2 shown in FIG. There is no difference between the output voltage value of the reflected wave and the reference voltage value of the reference reflected wave, and the waveform of the reflected wave is the same as the waveform of the reference reflected wave. determines that there is no abnormality, and outputs a no-abnormality signal in step S108.
- the electrical circuit abnormality detection device 10 of the embodiment inputs a pulse signal to the pulse heater 30, and stores the waveform information of the reflected wave reflected by the resistance wire 33 of the pulse heater 30 and the waveform information of the reference reflected wave. Since the abnormality of the resistance wire 33 of the pulse heater 30 is detected by the comparison, the abnormality of the resistance wire 33 can be detected without being affected by the change in the resistance value due to the temperature rise of the resistance wire 33 . As a result, an abnormality such as a partial disconnection, in which an increase in resistance due to an abnormality in the pulse heater 30 is mixed with an increase in resistance due to heat generated during energization, can be detected at an early stage.
- the electric circuit abnormality detection device 10 of the embodiment can be used even when the resistance wire 33 includes a large number of bends 34 which are reflection sources for reflecting the pulse signal input from the pulse generator 11. 21, the difference between the magnitude of the reference reflected wave and the reflected wave after passing through the low-pass filter 13 a composite reflected wave in which a large number of individual reflected waves reflected by a large number of reflection sources are superimposed exceeds a predetermined range. Therefore, even when the resistance wire 33 includes many bends 34 which are reflection sources, erroneous detection can be suppressed and the abnormality of the resistance wire 33 can be reliably detected.
- the low-pass filter 13 is connected between the directional coupler 12 and the detection unit 14 to remove high-frequency noise contained in the composite reflected wave from the resistance wire 33 of the pulse heater 30.
- the reflected wave is input to the detection unit 14, and the detection unit 14 detects an abnormality of the resistance wire 33 based on the input reflected wave.
- An abnormality of the resistance wire 33 may be detected by inputting it to the unit 14 .
- the arithmetic unit 21 of the detection unit 14 arithmetically processes the input composite reflected wave, removes high-frequency noise, generates a reflected wave, and detects an abnormality of the resistance wire 33 based on the generated reflected wave. You may do so. Further, the waveform and pattern of high-frequency noise are detected in advance and stored in the reference reflected wave database, the data is used to generate a reflected wave from which the high-frequency noise is removed, and the generated reflected wave is used to generate the resistance line 33. abnormalities may be detected.
- the abnormality of the resistance wire 33 may be detected by high-speed arithmetic processing in which the arithmetic speed of the arithmetic section 21 of the detection unit 14 is set to a frequency that greatly exceeds the frequency of the high-frequency noise.
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- Mathematical Physics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
Description
Claims (3)
- 電気回路にパルス信号を入力するパルスジェネレータと、
前記電気回路と前記パルスジェネレータとの間を接続する接続線の間に設けられて前記パルスジェネレータから前記電気回路に入力された前記パルス信号の前記電気回路からの反射波を取り出す方向性結合器と、
前記方向性結合器に接続されて前記方向性結合器から入力される前記反射波を処理して前記電気回路の異常を検知する検知ユニットと、
を備える電気回路異常検知装置であって、
前記検知ユニットは、前記電気回路と同一の配線パターンで異常のない基準電気回路に前記パルス信号を入力した際に前記方向性結合器から入力される基準反射波の波形情報を格納した記憶部と、
前記電気回路に前記パルス信号を入力した際に前記方向性結合器から入力される前記反射波の波形情報と前記記憶部に格納された前記基準反射波の波形情報とを比較することにより、前記電気回路の異常を検知する演算部と、を備えること、
を特徴とする電気回路異常検知装置。 - 請求項1に記載の電気回路異常検知装置であって、
前記方向性結合器と前記検知ユニットとの間に設けられたローパスフィルタを含み、
前記電気回路は、前記パルスジェネレータから入力された前記パルス信号を反射する反射源を多数含み、
前記検知ユニットに入力される前記反射波及び前記基準反射波は、多数の前記反射源で反射された多数の個別反射波が重ね合わされた複合反射波を前記ローパスフィルタに通した波形を有し、
前記検知ユニットの前記演算部は、前記反射波の大きさが所定の閾値を超えた後に、前記反射波の大きさと前記基準反射波の大きさとの差が所定の範囲を超えている場合に、前記電気回路の異常を検知すること、
を特徴とする電気回路異常検知装置。 - 請求項2に記載の電気回路異常検知装置であって、
前記電気回路と前記基準電気回路とは、抵抗線を多段折り返し配置したヒータであること、
を特徴とする電気回路異常検知装置。
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US18/016,354 US12298358B2 (en) | 2021-07-28 | 2021-07-28 | Resistance wire abnormality detection device |
| CN202180037820.6A CN115885189B (zh) | 2021-07-28 | 2021-07-28 | 电子电路异常检测装置 |
| PCT/JP2021/027957 WO2023007628A1 (ja) | 2021-07-28 | 2021-07-28 | 電気回路異常検知装置 |
| KR1020237008829A KR102866412B1 (ko) | 2021-07-28 | 2021-07-28 | 저항선 이상 감지 장치 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2021/027957 WO2023007628A1 (ja) | 2021-07-28 | 2021-07-28 | 電気回路異常検知装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2023007628A1 true WO2023007628A1 (ja) | 2023-02-02 |
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| Application Number | Title | Priority Date | Filing Date |
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| PCT/JP2021/027957 Ceased WO2023007628A1 (ja) | 2021-07-28 | 2021-07-28 | 電気回路異常検知装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US12298358B2 (ja) |
| KR (1) | KR102866412B1 (ja) |
| CN (1) | CN115885189B (ja) |
| WO (1) | WO2023007628A1 (ja) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11132484A (ja) * | 1997-10-30 | 1999-05-21 | Matsushita Electric Ind Co Ltd | 浴室用床暖房の漏電検出装置 |
| JP2009250761A (ja) * | 2008-04-04 | 2009-10-29 | Mitsubishi Electric Corp | 基板接続検査装置 |
| JP2010025890A (ja) * | 2008-07-24 | 2010-02-04 | Sinfonia Technology Co Ltd | 断線検出器 |
| WO2016117375A1 (ja) * | 2015-01-22 | 2016-07-28 | 株式会社デンソー | ヒータ装置 |
| JP2017044662A (ja) * | 2015-08-28 | 2017-03-02 | シャープ株式会社 | 検査装置 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3255871B2 (ja) | 1997-03-31 | 2002-02-12 | 住友大阪セメント株式会社 | パルスヒーター及び半導体チップ実装ボードの製法 |
| JP3277862B2 (ja) | 1997-10-13 | 2002-04-22 | 松下電器産業株式会社 | 熱圧着装置のヒータ温度制御装置およびヒータ温度制御方法 |
| JP5385688B2 (ja) * | 2009-06-10 | 2014-01-08 | 矢崎総業株式会社 | 絶縁抵抗検出装置 |
| GB201021032D0 (en) * | 2010-12-10 | 2011-01-26 | Creo Medical Ltd | Electrosurgical apparatus |
| JP2012149914A (ja) * | 2011-01-17 | 2012-08-09 | Mitsubishi Electric Corp | プリント基板劣化検査装置および劣化検査方法 |
| JP2019091526A (ja) * | 2017-11-10 | 2019-06-13 | 東京エレクトロン株式会社 | パルスモニタ装置及びプラズマ処理装置 |
| US11070053B2 (en) * | 2019-05-14 | 2021-07-20 | Koolbridge Solar, Inc. | Fast fault current limiter |
| CN110243493B (zh) * | 2019-06-03 | 2020-09-25 | 太原理工大学 | 基于超连续谱的布里渊光时域反射仪装置及方法 |
| TWI849402B (zh) * | 2022-04-08 | 2024-07-21 | 飛宏科技股份有限公司 | 直流充電樁中控制導引點異常的偵測電路 |
-
2021
- 2021-07-28 WO PCT/JP2021/027957 patent/WO2023007628A1/ja not_active Ceased
- 2021-07-28 KR KR1020237008829A patent/KR102866412B1/ko active Active
- 2021-07-28 US US18/016,354 patent/US12298358B2/en active Active
- 2021-07-28 CN CN202180037820.6A patent/CN115885189B/zh active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11132484A (ja) * | 1997-10-30 | 1999-05-21 | Matsushita Electric Ind Co Ltd | 浴室用床暖房の漏電検出装置 |
| JP2009250761A (ja) * | 2008-04-04 | 2009-10-29 | Mitsubishi Electric Corp | 基板接続検査装置 |
| JP2010025890A (ja) * | 2008-07-24 | 2010-02-04 | Sinfonia Technology Co Ltd | 断線検出器 |
| WO2016117375A1 (ja) * | 2015-01-22 | 2016-07-28 | 株式会社デンソー | ヒータ装置 |
| JP2017044662A (ja) * | 2015-08-28 | 2017-03-02 | シャープ株式会社 | 検査装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20230056708A (ko) | 2023-04-27 |
| CN115885189A (zh) | 2023-03-31 |
| CN115885189B (zh) | 2026-03-20 |
| US12298358B2 (en) | 2025-05-13 |
| US20240175941A1 (en) | 2024-05-30 |
| KR102866412B1 (ko) | 2025-09-29 |
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