WO2022255221A1 - 発光材料及びその製造方法 - Google Patents
発光材料及びその製造方法 Download PDFInfo
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- WO2022255221A1 WO2022255221A1 PCT/JP2022/021585 JP2022021585W WO2022255221A1 WO 2022255221 A1 WO2022255221 A1 WO 2022255221A1 JP 2022021585 W JP2022021585 W JP 2022021585W WO 2022255221 A1 WO2022255221 A1 WO 2022255221A1
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- luminescent material
- heat
- moles
- fluoride
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- 239000000463 material Substances 0.000 title claims abstract description 333
- 238000004519 manufacturing process Methods 0.000 title claims description 77
- 239000000203 mixture Substances 0.000 claims abstract description 139
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 claims abstract description 138
- 229910052783 alkali metal Inorganic materials 0.000 claims abstract description 61
- 150000001340 alkali metals Chemical class 0.000 claims abstract description 59
- 239000013078 crystal Substances 0.000 claims abstract description 43
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 39
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 35
- 229910052748 manganese Inorganic materials 0.000 claims abstract description 32
- 229910052700 potassium Inorganic materials 0.000 claims abstract description 17
- XPIIDKFHGDPTIY-UHFFFAOYSA-N F.F.F.P Chemical compound F.F.F.P XPIIDKFHGDPTIY-UHFFFAOYSA-N 0.000 claims description 198
- 239000002245 particle Substances 0.000 claims description 167
- 238000010438 heat treatment Methods 0.000 claims description 128
- 239000007788 liquid Substances 0.000 claims description 123
- -1 rare earth phosphate Chemical class 0.000 claims description 91
- 229910052761 rare earth metal Inorganic materials 0.000 claims description 67
- 238000011282 treatment Methods 0.000 claims description 44
- 229910019142 PO4 Inorganic materials 0.000 claims description 37
- 239000010452 phosphate Substances 0.000 claims description 37
- 229910052731 fluorine Inorganic materials 0.000 claims description 36
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 36
- 229910052751 metal Inorganic materials 0.000 claims description 35
- 239000002184 metal Substances 0.000 claims description 35
- 150000004703 alkoxides Chemical class 0.000 claims description 33
- 238000000034 method Methods 0.000 claims description 33
- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 claims description 27
- 239000012298 atmosphere Substances 0.000 claims description 25
- 239000000126 substance Substances 0.000 claims description 25
- 239000011261 inert gas Substances 0.000 claims description 18
- 238000000862 absorption spectrum Methods 0.000 claims description 15
- 229910052746 lanthanum Inorganic materials 0.000 claims description 13
- 229910052719 titanium Inorganic materials 0.000 claims description 12
- 229910052718 tin Inorganic materials 0.000 claims description 10
- 229910052688 Gadolinium Inorganic materials 0.000 claims description 9
- 238000010521 absorption reaction Methods 0.000 claims description 9
- 229910052725 zinc Inorganic materials 0.000 claims description 9
- 229910052726 zirconium Inorganic materials 0.000 claims description 9
- 229910052684 Cerium Inorganic materials 0.000 claims description 8
- 229910052692 Dysprosium Inorganic materials 0.000 claims description 8
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 claims description 6
- 239000011591 potassium Substances 0.000 claims description 6
- 230000003647 oxidation Effects 0.000 claims description 5
- 238000007254 oxidation reaction Methods 0.000 claims description 5
- 239000000047 product Substances 0.000 description 152
- 239000011572 manganese Substances 0.000 description 83
- 239000000243 solution Substances 0.000 description 67
- 230000000052 comparative effect Effects 0.000 description 55
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 46
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 43
- 150000002500 ions Chemical class 0.000 description 33
- 239000011342 resin composition Substances 0.000 description 29
- 235000021317 phosphate Nutrition 0.000 description 27
- 239000011737 fluorine Substances 0.000 description 26
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 25
- 229920005989 resin Polymers 0.000 description 25
- 239000011347 resin Substances 0.000 description 25
- 239000000843 powder Substances 0.000 description 24
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 23
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 23
- 229910004298 SiO 2 Inorganic materials 0.000 description 23
- 230000014759 maintenance of location Effects 0.000 description 21
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 19
- LQFNMFDUAPEJRY-UHFFFAOYSA-K lanthanum(3+);phosphate Chemical compound [La+3].[O-]P([O-])([O-])=O LQFNMFDUAPEJRY-UHFFFAOYSA-K 0.000 description 19
- 239000000377 silicon dioxide Substances 0.000 description 19
- 229920002050 silicone resin Polymers 0.000 description 19
- 230000004907 flux Effects 0.000 description 18
- 235000012239 silicon dioxide Nutrition 0.000 description 18
- 229910001414 potassium ion Inorganic materials 0.000 description 17
- 238000002156 mixing Methods 0.000 description 16
- 238000003756 stirring Methods 0.000 description 16
- 238000005406 washing Methods 0.000 description 16
- 239000003638 chemical reducing agent Substances 0.000 description 15
- 239000007822 coupling agent Substances 0.000 description 15
- 239000007789 gas Substances 0.000 description 15
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 14
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 14
- 239000006087 Silane Coupling Agent Substances 0.000 description 14
- 238000011156 evaluation Methods 0.000 description 14
- 230000005284 excitation Effects 0.000 description 14
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 13
- 150000001875 compounds Chemical class 0.000 description 13
- 238000009826 distribution Methods 0.000 description 13
- 238000001035 drying Methods 0.000 description 13
- 229910000040 hydrogen fluoride Inorganic materials 0.000 description 13
- 239000010410 layer Substances 0.000 description 13
- 229910000077 silane Inorganic materials 0.000 description 13
- 230000008878 coupling Effects 0.000 description 12
- 238000010168 coupling process Methods 0.000 description 12
- 238000005859 coupling reaction Methods 0.000 description 12
- 230000000694 effects Effects 0.000 description 12
- 238000001878 scanning electron micrograph Methods 0.000 description 12
- 238000000926 separation method Methods 0.000 description 12
- 230000015572 biosynthetic process Effects 0.000 description 11
- 238000006243 chemical reaction Methods 0.000 description 11
- 238000003786 synthesis reaction Methods 0.000 description 10
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 description 9
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 9
- 238000000295 emission spectrum Methods 0.000 description 9
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 8
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 8
- 238000012423 maintenance Methods 0.000 description 8
- 229910001437 manganese ion Inorganic materials 0.000 description 8
- 230000008569 process Effects 0.000 description 8
- 239000010936 titanium Substances 0.000 description 8
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 7
- 239000007864 aqueous solution Substances 0.000 description 7
- 230000007423 decrease Effects 0.000 description 7
- 239000006185 dispersion Substances 0.000 description 7
- 239000010703 silicon Substances 0.000 description 7
- 238000012360 testing method Methods 0.000 description 7
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 6
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 6
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 6
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 6
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 6
- 238000004458 analytical method Methods 0.000 description 6
- 229910052681 coesite Inorganic materials 0.000 description 6
- 229910052906 cristobalite Inorganic materials 0.000 description 6
- 229910001873 dinitrogen Inorganic materials 0.000 description 6
- 238000002354 inductively-coupled plasma atomic emission spectroscopy Methods 0.000 description 6
- 239000012528 membrane Substances 0.000 description 6
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- 229910052814 silicon oxide Inorganic materials 0.000 description 6
- 238000004513 sizing Methods 0.000 description 6
- 229910052682 stishovite Inorganic materials 0.000 description 6
- 229910052905 tridymite Inorganic materials 0.000 description 6
- 238000004846 x-ray emission Methods 0.000 description 6
- 238000005033 Fourier transform infrared spectroscopy Methods 0.000 description 5
- 238000002441 X-ray diffraction Methods 0.000 description 5
- 229910052799 carbon Inorganic materials 0.000 description 5
- 125000004432 carbon atom Chemical group C* 0.000 description 5
- 230000008859 change Effects 0.000 description 5
- 125000000118 dimethyl group Chemical group [H]C([H])([H])* 0.000 description 5
- 239000012535 impurity Substances 0.000 description 5
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical compound [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 229940085991 phosphate ion Drugs 0.000 description 5
- 239000002244 precipitate Substances 0.000 description 5
- 239000007787 solid Substances 0.000 description 5
- 239000002904 solvent Substances 0.000 description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 4
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 4
- 229920000388 Polyphosphate Polymers 0.000 description 4
- NPYPAHLBTDXSSS-UHFFFAOYSA-N Potassium ion Chemical compound [K+] NPYPAHLBTDXSSS-UHFFFAOYSA-N 0.000 description 4
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 4
- 238000009825 accumulation Methods 0.000 description 4
- 125000001931 aliphatic group Chemical group 0.000 description 4
- 150000004645 aluminates Chemical class 0.000 description 4
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 4
- 229910021529 ammonia Inorganic materials 0.000 description 4
- 230000006866 deterioration Effects 0.000 description 4
- 125000000524 functional group Chemical group 0.000 description 4
- 150000004767 nitrides Chemical class 0.000 description 4
- 229910052757 nitrogen Inorganic materials 0.000 description 4
- 239000003002 pH adjusting agent Substances 0.000 description 4
- 239000001205 polyphosphate Substances 0.000 description 4
- 235000011176 polyphosphates Nutrition 0.000 description 4
- 238000002360 preparation method Methods 0.000 description 4
- 238000010298 pulverizing process Methods 0.000 description 4
- 150000002910 rare earth metals Chemical class 0.000 description 4
- 239000002002 slurry Substances 0.000 description 4
- 229910052712 strontium Inorganic materials 0.000 description 4
- 238000004381 surface treatment Methods 0.000 description 4
- 239000011701 zinc Substances 0.000 description 4
- WEVYAHXRMPXWCK-UHFFFAOYSA-N Acetonitrile Chemical compound CC#N WEVYAHXRMPXWCK-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 3
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 description 3
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 3
- 230000002776 aggregation Effects 0.000 description 3
- 239000005456 alcohol based solvent Substances 0.000 description 3
- 150000001298 alcohols Chemical class 0.000 description 3
- 229910052791 calcium Inorganic materials 0.000 description 3
- 239000000460 chlorine Substances 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 238000000921 elemental analysis Methods 0.000 description 3
- 238000004993 emission spectroscopy Methods 0.000 description 3
- 230000007613 environmental effect Effects 0.000 description 3
- 239000011888 foil Substances 0.000 description 3
- 239000008187 granular material Substances 0.000 description 3
- 230000006872 improvement Effects 0.000 description 3
- 238000009616 inductively coupled plasma Methods 0.000 description 3
- 229910052747 lanthanoid Inorganic materials 0.000 description 3
- 150000002602 lanthanoids Chemical class 0.000 description 3
- 239000004973 liquid crystal related substance Substances 0.000 description 3
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 3
- 229910017604 nitric acid Inorganic materials 0.000 description 3
- NROKBHXJSPEDAR-UHFFFAOYSA-M potassium fluoride Chemical compound [F-].[K+] NROKBHXJSPEDAR-UHFFFAOYSA-M 0.000 description 3
- 150000003839 salts Chemical class 0.000 description 3
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 3
- 239000011734 sodium Substances 0.000 description 3
- 238000003746 solid phase reaction Methods 0.000 description 3
- 229910052727 yttrium Inorganic materials 0.000 description 3
- 239000011787 zinc oxide Substances 0.000 description 3
- WYTZZXDRDKSJID-UHFFFAOYSA-N (3-aminopropyl)triethoxysilane Chemical compound CCO[Si](OCC)(OCC)CCCN WYTZZXDRDKSJID-UHFFFAOYSA-N 0.000 description 2
- 229910018085 Al-F Inorganic materials 0.000 description 2
- 229910018179 Al—F Inorganic materials 0.000 description 2
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 description 2
- WTDHULULXKLSOZ-UHFFFAOYSA-N Hydroxylamine hydrochloride Chemical compound Cl.ON WTDHULULXKLSOZ-UHFFFAOYSA-N 0.000 description 2
- 238000004566 IR spectroscopy Methods 0.000 description 2
- BPQQTUXANYXVAA-UHFFFAOYSA-N Orthosilicate Chemical compound [O-][Si]([O-])([O-])[O-] BPQQTUXANYXVAA-UHFFFAOYSA-N 0.000 description 2
- 229910052771 Terbium Inorganic materials 0.000 description 2
- 230000002378 acidificating effect Effects 0.000 description 2
- 230000003213 activating effect Effects 0.000 description 2
- 238000004220 aggregation Methods 0.000 description 2
- 235000011114 ammonium hydroxide Nutrition 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 229910052788 barium Inorganic materials 0.000 description 2
- 229910052801 chlorine Inorganic materials 0.000 description 2
- 210000001072 colon Anatomy 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 238000005336 cracking Methods 0.000 description 2
- 238000000354 decomposition reaction Methods 0.000 description 2
- KQAHMVLQCSALSX-UHFFFAOYSA-N decyl(trimethoxy)silane Chemical compound CCCCCCCCCC[Si](OC)(OC)OC KQAHMVLQCSALSX-UHFFFAOYSA-N 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 239000008367 deionised water Substances 0.000 description 2
- 229910021641 deionized water Inorganic materials 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 235000011180 diphosphates Nutrition 0.000 description 2
- 229910000397 disodium phosphate Inorganic materials 0.000 description 2
- 235000019800 disodium phosphate Nutrition 0.000 description 2
- 238000004090 dissolution Methods 0.000 description 2
- 239000012153 distilled water Substances 0.000 description 2
- 238000007580 dry-mixing Methods 0.000 description 2
- NKSJNEHGWDZZQF-UHFFFAOYSA-N ethenyl(trimethoxy)silane Chemical compound CO[Si](OC)(OC)C=C NKSJNEHGWDZZQF-UHFFFAOYSA-N 0.000 description 2
- 230000001747 exhibiting effect Effects 0.000 description 2
- 238000001914 filtration Methods 0.000 description 2
- 239000001307 helium Substances 0.000 description 2
- 229910052734 helium Inorganic materials 0.000 description 2
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 2
- 229940005740 hexametaphosphate Drugs 0.000 description 2
- CZWLNMOIEMTDJY-UHFFFAOYSA-N hexyl(trimethoxy)silane Chemical compound CCCCCC[Si](OC)(OC)OC CZWLNMOIEMTDJY-UHFFFAOYSA-N 0.000 description 2
- 239000005453 ketone based solvent Substances 0.000 description 2
- NUJOXMJBOLGQSY-UHFFFAOYSA-N manganese dioxide Chemical compound O=[Mn]=O NUJOXMJBOLGQSY-UHFFFAOYSA-N 0.000 description 2
- 238000001471 micro-filtration Methods 0.000 description 2
- 239000003960 organic solvent Substances 0.000 description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 2
- IOLCXVTUBQKXJR-UHFFFAOYSA-M potassium bromide Chemical compound [K+].[Br-] IOLCXVTUBQKXJR-UHFFFAOYSA-M 0.000 description 2
- BWHMMNNQKKPAPP-UHFFFAOYSA-L potassium carbonate Chemical compound [K+].[K+].[O-]C([O-])=O BWHMMNNQKKPAPP-UHFFFAOYSA-L 0.000 description 2
- 239000011698 potassium fluoride Substances 0.000 description 2
- 239000008213 purified water Substances 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 238000001223 reverse osmosis Methods 0.000 description 2
- 125000003808 silyl group Chemical group [H][Si]([H])([H])[*] 0.000 description 2
- 239000002335 surface treatment layer Substances 0.000 description 2
- LFQCEHFDDXELDD-UHFFFAOYSA-N tetramethyl orthosilicate Chemical compound CO[Si](OC)(OC)OC LFQCEHFDDXELDD-UHFFFAOYSA-N 0.000 description 2
- ZUEKXCXHTXJYAR-UHFFFAOYSA-N tetrapropan-2-yl silicate Chemical compound CC(C)O[Si](OC(C)C)(OC(C)C)OC(C)C ZUEKXCXHTXJYAR-UHFFFAOYSA-N 0.000 description 2
- 239000001577 tetrasodium phosphonato phosphate Substances 0.000 description 2
- BPSIOYPQMFLKFR-UHFFFAOYSA-N trimethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CO[Si](OC)(OC)CCCOCC1CO1 BPSIOYPQMFLKFR-UHFFFAOYSA-N 0.000 description 2
- LWIHDJKSTIGBAC-UHFFFAOYSA-K tripotassium phosphate Chemical compound [K+].[K+].[K+].[O-]P([O-])([O-])=O LWIHDJKSTIGBAC-UHFFFAOYSA-K 0.000 description 2
- 238000000108 ultra-filtration Methods 0.000 description 2
- 238000004876 x-ray fluorescence Methods 0.000 description 2
- 229910001928 zirconium oxide Inorganic materials 0.000 description 2
- ASZZHBXPMOVHCU-UHFFFAOYSA-N 3,9-diazaspiro[5.5]undecane-2,4-dione Chemical compound C1C(=O)NC(=O)CC11CCNCC1 ASZZHBXPMOVHCU-UHFFFAOYSA-N 0.000 description 1
- QTBSBXVTEAMEQO-UHFFFAOYSA-M Acetate Chemical compound CC([O-])=O QTBSBXVTEAMEQO-UHFFFAOYSA-M 0.000 description 1
- 102100032047 Alsin Human genes 0.000 description 1
- 101710187109 Alsin Proteins 0.000 description 1
- QGZKDVFQNNGYKY-UHFFFAOYSA-O Ammonium Chemical compound [NH4+] QGZKDVFQNNGYKY-UHFFFAOYSA-O 0.000 description 1
- 238000012935 Averaging Methods 0.000 description 1
- 238000004438 BET method Methods 0.000 description 1
- 239000004215 Carbon black (E152) Substances 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- 229910052691 Erbium Inorganic materials 0.000 description 1
- 229910052693 Europium Inorganic materials 0.000 description 1
- 229910002601 GaN Inorganic materials 0.000 description 1
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 1
- 229910052689 Holmium Inorganic materials 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 1
- UEZVMMHDMIWARA-UHFFFAOYSA-N Metaphosphoric acid Chemical compound OP(=O)=O UEZVMMHDMIWARA-UHFFFAOYSA-N 0.000 description 1
- 229910017855 NH 4 F Inorganic materials 0.000 description 1
- 229910052779 Neodymium Inorganic materials 0.000 description 1
- NHNBFGGVMKEFGY-UHFFFAOYSA-N Nitrate Chemical compound [O-][N+]([O-])=O NHNBFGGVMKEFGY-UHFFFAOYSA-N 0.000 description 1
- 240000007594 Oryza sativa Species 0.000 description 1
- 235000007164 Oryza sativa Nutrition 0.000 description 1
- 240000007320 Pinus strobus Species 0.000 description 1
- WCUXLLCKKVVCTQ-UHFFFAOYSA-M Potassium chloride Chemical compound [Cl-].[K+] WCUXLLCKKVVCTQ-UHFFFAOYSA-M 0.000 description 1
- 229910052777 Praseodymium Inorganic materials 0.000 description 1
- 229910052772 Samarium Inorganic materials 0.000 description 1
- 229910008051 Si-OH Inorganic materials 0.000 description 1
- 229910004283 SiO 4 Inorganic materials 0.000 description 1
- 229910006358 Si—OH Inorganic materials 0.000 description 1
- 229910006404 SnO 2 Inorganic materials 0.000 description 1
- QAOWNCQODCNURD-UHFFFAOYSA-L Sulfate Chemical compound [O-]S([O-])(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-L 0.000 description 1
- 229910052775 Thulium Inorganic materials 0.000 description 1
- 229910010413 TiO 2 Inorganic materials 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 1
- 229910052769 Ytterbium Inorganic materials 0.000 description 1
- 150000001242 acetic acid derivatives Chemical class 0.000 description 1
- 150000007513 acids Chemical class 0.000 description 1
- 239000012190 activator Substances 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 238000005054 agglomeration Methods 0.000 description 1
- 230000001476 alcoholic effect Effects 0.000 description 1
- 229910001515 alkali metal fluoride Inorganic materials 0.000 description 1
- 229910000318 alkali metal phosphate Inorganic materials 0.000 description 1
- SMZOGRDCAXLAAR-UHFFFAOYSA-N aluminium isopropoxide Chemical compound [Al+3].CC(C)[O-].CC(C)[O-].CC(C)[O-] SMZOGRDCAXLAAR-UHFFFAOYSA-N 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- JPUHCPXFQIXLMW-UHFFFAOYSA-N aluminium triethoxide Chemical compound CCO[Al](OCC)OCC JPUHCPXFQIXLMW-UHFFFAOYSA-N 0.000 description 1
- ZRIUUUJAJJNDSS-UHFFFAOYSA-N ammonium phosphates Chemical class [NH4+].[NH4+].[NH4+].[O-]P([O-])([O-])=O ZRIUUUJAJJNDSS-UHFFFAOYSA-N 0.000 description 1
- 150000001450 anions Chemical class 0.000 description 1
- 125000004429 atom Chemical group 0.000 description 1
- 150000007514 bases Chemical class 0.000 description 1
- 229910052792 caesium Inorganic materials 0.000 description 1
- TVFDJXOCXUVLDH-UHFFFAOYSA-N caesium atom Chemical compound [Cs] TVFDJXOCXUVLDH-UHFFFAOYSA-N 0.000 description 1
- 150000001721 carbon Chemical class 0.000 description 1
- 150000004649 carbonic acid derivatives Chemical class 0.000 description 1
- 150000001768 cations Chemical class 0.000 description 1
- 238000005119 centrifugation Methods 0.000 description 1
- GWXLDORMOJMVQZ-UHFFFAOYSA-N cerium Chemical compound [Ce] GWXLDORMOJMVQZ-UHFFFAOYSA-N 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000011247 coating layer Substances 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 229910052593 corundum Inorganic materials 0.000 description 1
- 238000002447 crystallographic data Methods 0.000 description 1
- 230000001186 cumulative effect Effects 0.000 description 1
- 125000004122 cyclic group Chemical group 0.000 description 1
- FCHQAKNQGRFZDC-UHFFFAOYSA-N decyl(triethyl)silane Chemical compound CCCCCCCCCC[Si](CC)(CC)CC FCHQAKNQGRFZDC-UHFFFAOYSA-N 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- ZPWVASYFFYYZEW-UHFFFAOYSA-L dipotassium hydrogen phosphate Chemical compound [K+].[K+].OP([O-])([O-])=O ZPWVASYFFYYZEW-UHFFFAOYSA-L 0.000 description 1
- 235000019797 dipotassium phosphate Nutrition 0.000 description 1
- 229910000396 dipotassium phosphate Inorganic materials 0.000 description 1
- BNIILDVGGAEEIG-UHFFFAOYSA-L disodium hydrogen phosphate Chemical compound [Na+].[Na+].OP([O-])([O-])=O BNIILDVGGAEEIG-UHFFFAOYSA-L 0.000 description 1
- KBQHZAAAGSGFKK-UHFFFAOYSA-N dysprosium atom Chemical compound [Dy] KBQHZAAAGSGFKK-UHFFFAOYSA-N 0.000 description 1
- 238000010828 elution Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- XGZNHFPFJRZBBT-UHFFFAOYSA-N ethanol;titanium Chemical compound [Ti].CCO.CCO.CCO.CCO XGZNHFPFJRZBBT-UHFFFAOYSA-N 0.000 description 1
- UARGAUQGVANXCB-UHFFFAOYSA-N ethanol;zirconium Chemical compound [Zr].CCO.CCO.CCO.CCO UARGAUQGVANXCB-UHFFFAOYSA-N 0.000 description 1
- 125000001301 ethoxy group Chemical group [H]C([H])([H])C([H])([H])O* 0.000 description 1
- SBRXLTRZCJVAPH-UHFFFAOYSA-N ethyl(trimethoxy)silane Chemical compound CC[Si](OC)(OC)OC SBRXLTRZCJVAPH-UHFFFAOYSA-N 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 150000002222 fluorine compounds Chemical group 0.000 description 1
- 125000001153 fluoro group Chemical group F* 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- UIWYJDYFSGRHKR-UHFFFAOYSA-N gadolinium atom Chemical compound [Gd] UIWYJDYFSGRHKR-UHFFFAOYSA-N 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 150000004820 halides Chemical class 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- QOSATHPSBFQAML-UHFFFAOYSA-N hydrogen peroxide;hydrate Chemical compound O.OO QOSATHPSBFQAML-UHFFFAOYSA-N 0.000 description 1
- 150000004679 hydroxides Chemical class 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000010191 image analysis Methods 0.000 description 1
- 238000010348 incorporation Methods 0.000 description 1
- UQNMKSXNBQAKLM-UHFFFAOYSA-N lanthanum(3+) trinitrate dihydrate Chemical compound O.O.[La+3].[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O UQNMKSXNBQAKLM-UHFFFAOYSA-N 0.000 description 1
- FYDKNKUEBJQCCN-UHFFFAOYSA-N lanthanum(3+);trinitrate Chemical compound [La+3].[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O FYDKNKUEBJQCCN-UHFFFAOYSA-N 0.000 description 1
- 238000007561 laser diffraction method Methods 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 125000005341 metaphosphate group Chemical group 0.000 description 1
- ZEIWWVGGEOHESL-UHFFFAOYSA-N methanol;titanium Chemical compound [Ti].OC.OC.OC.OC ZEIWWVGGEOHESL-UHFFFAOYSA-N 0.000 description 1
- 125000000956 methoxy group Chemical group [H]C([H])([H])O* 0.000 description 1
- BFXIKLCIZHOAAZ-UHFFFAOYSA-N methyltrimethoxysilane Chemical compound CO[Si](C)(OC)OC BFXIKLCIZHOAAZ-UHFFFAOYSA-N 0.000 description 1
- 150000007522 mineralic acids Chemical class 0.000 description 1
- 239000011259 mixed solution Substances 0.000 description 1
- XONPDZSGENTBNJ-UHFFFAOYSA-N molecular hydrogen;sodium Chemical compound [Na].[H][H] XONPDZSGENTBNJ-UHFFFAOYSA-N 0.000 description 1
- 229910000402 monopotassium phosphate Inorganic materials 0.000 description 1
- 235000019796 monopotassium phosphate Nutrition 0.000 description 1
- 239000012452 mother liquor Substances 0.000 description 1
- 150000002825 nitriles Chemical class 0.000 description 1
- 238000010606 normalization Methods 0.000 description 1
- 235000006408 oxalic acid Nutrition 0.000 description 1
- 150000002978 peroxides Chemical class 0.000 description 1
- PJNZPQUBCPKICU-UHFFFAOYSA-N phosphoric acid;potassium Chemical compound [K].OP(O)(O)=O PJNZPQUBCPKICU-UHFFFAOYSA-N 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- SCVFZCLFOSHCOH-UHFFFAOYSA-M potassium acetate Chemical compound [K+].CC([O-])=O SCVFZCLFOSHCOH-UHFFFAOYSA-M 0.000 description 1
- 235000015320 potassium carbonate Nutrition 0.000 description 1
- 229910000027 potassium carbonate Inorganic materials 0.000 description 1
- 235000003270 potassium fluoride Nutrition 0.000 description 1
- FGIUAXJPYTZDNR-UHFFFAOYSA-N potassium nitrate Chemical compound [K+].[O-][N+]([O-])=O FGIUAXJPYTZDNR-UHFFFAOYSA-N 0.000 description 1
- 229910000160 potassium phosphate Inorganic materials 0.000 description 1
- 235000011009 potassium phosphates Nutrition 0.000 description 1
- 159000000001 potassium salts Chemical class 0.000 description 1
- VBKNTGMWIPUCRF-UHFFFAOYSA-M potassium;fluoride;hydrofluoride Chemical compound F.[F-].[K+] VBKNTGMWIPUCRF-UHFFFAOYSA-M 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- RLJWTAURUFQFJP-UHFFFAOYSA-N propan-2-ol;titanium Chemical compound [Ti].CC(C)O.CC(C)O.CC(C)O.CC(C)O RLJWTAURUFQFJP-UHFFFAOYSA-N 0.000 description 1
- BCWYYHBWCZYDNB-UHFFFAOYSA-N propan-2-ol;zirconium Chemical compound [Zr].CC(C)O.CC(C)O.CC(C)O.CC(C)O BCWYYHBWCZYDNB-UHFFFAOYSA-N 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 238000000746 purification Methods 0.000 description 1
- 229940048084 pyrophosphate Drugs 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 235000009566 rice Nutrition 0.000 description 1
- 229910052701 rubidium Inorganic materials 0.000 description 1
- IGLNJRXAVVLDKE-UHFFFAOYSA-N rubidium atom Chemical compound [Rb] IGLNJRXAVVLDKE-UHFFFAOYSA-N 0.000 description 1
- 239000012266 salt solution Substances 0.000 description 1
- 229910052706 scandium Inorganic materials 0.000 description 1
- 238000004062 sedimentation Methods 0.000 description 1
- VSZWPYCFIRKVQL-UHFFFAOYSA-N selanylidenegallium;selenium Chemical compound [Se].[Se]=[Ga].[Se]=[Ga] VSZWPYCFIRKVQL-UHFFFAOYSA-N 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- FQENQNTWSFEDLI-UHFFFAOYSA-J sodium diphosphate Chemical compound [Na+].[Na+].[Na+].[Na+].[O-]P([O-])(=O)OP([O-])([O-])=O FQENQNTWSFEDLI-UHFFFAOYSA-J 0.000 description 1
- GCLGEJMYGQKIIW-UHFFFAOYSA-H sodium hexametaphosphate Chemical compound [Na]OP1(=O)OP(=O)(O[Na])OP(=O)(O[Na])OP(=O)(O[Na])OP(=O)(O[Na])OP(=O)(O[Na])O1 GCLGEJMYGQKIIW-UHFFFAOYSA-H 0.000 description 1
- 235000019982 sodium hexametaphosphate Nutrition 0.000 description 1
- 239000001488 sodium phosphate Substances 0.000 description 1
- 229910000162 sodium phosphate Inorganic materials 0.000 description 1
- 235000011008 sodium phosphates Nutrition 0.000 description 1
- 229940048086 sodium pyrophosphate Drugs 0.000 description 1
- 159000000000 sodium salts Chemical class 0.000 description 1
- 235000019832 sodium triphosphate Nutrition 0.000 description 1
- 238000000992 sputter etching Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000000725 suspension Substances 0.000 description 1
- JBQYATWDVHIOAR-UHFFFAOYSA-N tellanylidenegermanium Chemical compound [Te]=[Ge] JBQYATWDVHIOAR-UHFFFAOYSA-N 0.000 description 1
- RYCLIXPGLDDLTM-UHFFFAOYSA-J tetrapotassium;phosphonato phosphate Chemical compound [K+].[K+].[K+].[K+].[O-]P([O-])(=O)OP([O-])([O-])=O RYCLIXPGLDDLTM-UHFFFAOYSA-J 0.000 description 1
- 235000019818 tetrasodium diphosphate Nutrition 0.000 description 1
- 238000005979 thermal decomposition reaction Methods 0.000 description 1
- 229920005992 thermoplastic resin Polymers 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- NMEPHPOFYLLFTK-UHFFFAOYSA-N trimethoxy(octyl)silane Chemical compound CCCCCCCC[Si](OC)(OC)OC NMEPHPOFYLLFTK-UHFFFAOYSA-N 0.000 description 1
- HQYALQRYBUJWDH-UHFFFAOYSA-N trimethoxy(propyl)silane Chemical compound CCC[Si](OC)(OC)OC HQYALQRYBUJWDH-UHFFFAOYSA-N 0.000 description 1
- JRSJRHKJPOJTMS-MDZDMXLPSA-N trimethoxy-[(e)-2-phenylethenyl]silane Chemical compound CO[Si](OC)(OC)\C=C\C1=CC=CC=C1 JRSJRHKJPOJTMS-MDZDMXLPSA-N 0.000 description 1
- UAEJRRZPRZCUBE-UHFFFAOYSA-N trimethoxyalumane Chemical compound [Al+3].[O-]C.[O-]C.[O-]C UAEJRRZPRZCUBE-UHFFFAOYSA-N 0.000 description 1
- YUYCVXFAYWRXLS-UHFFFAOYSA-N trimethoxysilane Chemical compound CO[SiH](OC)OC YUYCVXFAYWRXLS-UHFFFAOYSA-N 0.000 description 1
- RYFMWSXOAZQYPI-UHFFFAOYSA-K trisodium phosphate Chemical compound [Na+].[Na+].[Na+].[O-]P([O-])([O-])=O RYFMWSXOAZQYPI-UHFFFAOYSA-K 0.000 description 1
- 229910001845 yogo sapphire Inorganic materials 0.000 description 1
- WXKZSTUKHWTJCF-UHFFFAOYSA-N zinc;ethanolate Chemical compound [Zn+2].CC[O-].CC[O-] WXKZSTUKHWTJCF-UHFFFAOYSA-N 0.000 description 1
- JXNCWJJAQLTWKR-UHFFFAOYSA-N zinc;methanolate Chemical compound [Zn+2].[O-]C.[O-]C JXNCWJJAQLTWKR-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/50—Wavelength conversion elements
- H01L33/501—Wavelength conversion elements characterised by the materials, e.g. binder
- H01L33/502—Wavelength conversion materials
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/61—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing fluorine, chlorine, bromine, iodine or unspecified halogen elements
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/64—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing aluminium
Definitions
- the present disclosure relates to a luminescent material and a manufacturing method thereof.
- JP 2012-224536 A discloses a fluoride phosphor having a composition represented by, for example, K 2 SiF 6 :Mn, as a red-emitting phosphor having a narrow half width of an emission peak.
- an object of one embodiment of the present disclosure is to provide a light-emitting material containing a red-light-emitting phosphor with high luminance.
- a first aspect is a luminescent material containing a fluoride phosphor having a first composition containing an alkali metal containing K, Si, Al, Mn, and F.
- the first composition when the total number of moles of alkali metals is 2, the total number of moles of Si, Al and Mn is 0.9 or more and 1.1 or less, and the number of moles of Al is more than 0 0.1 or less, the number of moles of Mn is more than 0 and not more than 0.2, and the number of moles of F is 5.5 or more and less than 6.0.
- the fluoride phosphor includes a cubic crystal structure in its crystal structure and has a lattice constant of 0.8138 nm or more.
- a second aspect is a luminescent material containing a fluoride phosphor having a first composition containing an alkali metal containing K, Si, Al, Mn and F.
- the first composition when the total number of moles of alkali metals is 2, the total number of moles of Si, Al and Mn is 0.9 or more and 1.1 or less, and the number of moles of Al is more than 0 0.1 or less, the number of moles of Mn is more than 0 and not more than 0.2, and the number of moles of F is 5.5 or more and less than 6.0.
- the fluoride phosphor has an absorption peak in the wave number range of 590 cm ⁇ 1 to 610 cm ⁇ 1 in the infrared absorption spectrum.
- the third embodiment contains an alkali metal containing K, Si, Mn, and F, and when the total number of moles of the alkali metal is 2, the total number of moles of Si and Mn is 0.9 or more and 1 .1 or less, the number of moles of Mn is more than 0 and not more than 0.2, and the number of moles of F is 5.5 or more and less than 6.0.
- an alkali metal containing K, Al, and F, and the number of moles of Al is 1, the total number of moles of the alkali metal is 2 or more and 3 or less, and the number of moles of F is preparing second fluoride particles having a third composition of 5 or more and 6 or less; and obtaining a first heat-treated product by performing a first heat treatment in a temperature range of 0° C. or higher and 780° C. or lower.
- FIG. 1 is a flow chart showing an example of the order of steps in a method for producing a fluoride phosphor.
- 1 is a schematic cross-sectional view showing an example of a light-emitting device containing a fluoride phosphor;
- FIG. 4 is an infrared absorption spectrum of a fluoride phosphor;
- 4 is an example of a scanning electron microscope (SEM) image of a fluoride phosphor according to Comparative Example 1.
- FIG. 10 is an example of an SEM image of a fluoride phosphor according to Example 3.
- FIG. 4 is an infrared absorption spectrum of first and second fluoride particles; It is an example of a cross-sectional SEM image of a fluoride phosphor according to Example 17.
- 11 is an example of a SEM image of a fluoride phosphor according to Example 17.
- the term "process” is not only an independent process, but even if it cannot be clearly distinguished from other processes, it is included in this term as long as the intended purpose of the process is achieved.
- the content of each component in the composition means the total amount of the plurality of substances present in the composition unless otherwise specified when there are multiple substances corresponding to each component in the composition.
- the upper and lower limits of the numerical ranges described herein can be arbitrarily selected and combined. In this specification, the relationship between color names and chromaticity coordinates, the relationship between wavelength ranges of light and color names of monochromatic light, and the like conform to JIS Z8110.
- the half width of a phosphor, luminescent material, or light emitting element means the wavelength width (full width at half maximum; FWHM) of an emission spectrum at which the emission intensity is 50% of the maximum emission intensity.
- the median diameter of a phosphor or luminescent material is a volume-based median diameter, and refers to a particle size corresponding to 50% of the cumulative volume from the small diameter side in the volume-based particle size distribution.
- the particle size distribution of the phosphor or luminescent material is measured using a laser diffraction particle size distribution analyzer according to the laser diffraction method.
- the multiple elements described separated by commas (,) are at least one of these multiple elements. It means that the element is contained in the composition.
- the formulas representing the composition of the phosphor or luminescent material before the colon (:) represents the host crystal, and after the colon (:) represents the activating element.
- the embodiments shown below exemplify fluoride phosphors, light-emitting materials, methods for producing the same, and light-emitting devices for embodying the technical idea of the present invention. It is not limited to chemical phosphors, luminescent materials, methods of manufacturing the same, and luminescent devices.
- the luminescent material is a fluoride fluorescent material having a first composition comprising an alkali metal containing potassium (K), silicon (Si), aluminum (Al), manganese (Mn), and fluorine (F). Including body.
- the fluoride phosphor has a cubic crystal structure and a lattice constant of 0.8138 nm or more. Also, the fluoride phosphor has an absorption peak in the wavenumber range of 590 cm ⁇ 1 to 610 cm ⁇ 1 in the infrared absorption spectrum.
- the total number of moles of alkali metals is 2, the total number of moles of Si, Al and Mn is 0.9 or more and 1.1 or less, and the number of moles of Al is more than 0 and 0 .1 or less, the number of moles of Mn is more than 0 and not more than 0.2, and the number of moles of F is 5.5 or more and less than 6.0.
- Mn contained in the fluoride phosphor may contain tetravalent Mn ions.
- the fluoride phosphor can be produced, for example, by a method for producing a fluoride phosphor, which will be described later.
- the fluoride phosphor contains Si and Al, has a composition in which Al has a specific content ratio, and has a cubic crystal structure in which the lattice constant is a predetermined value or more, thereby exhibiting higher luminance.
- This can be considered as follows. It can be considered that the replacement of a part of Si constituting the crystal structure of the fluoride phosphor with Al compensates for the F deficiency in the crystal structure and stabilizes the crystal structure.
- Al for part of Si in the crystal structure of the fluoride phosphor, it exhibits a lattice constant equal to or greater than a predetermined value.
- the fluoride phosphor contains Al in its crystal structure, it exhibits peaks derived from Al—F bonds in, for example, the infrared absorption spectrum.
- the ratio of the total number of moles of Si, Al and Mn to the total number of moles of alkali metals contained in the composition may be, for example, 0.9 or more and 1.1 or less, It is preferably 0.95 or more and 1.05 or less, 0.97 or more and 1.03 or less, or 1.0.
- the ratio of the number of moles of Al to the total number of moles of alkali metals, 2, may be, for example, more than 0 and 0.1 or less, preferably more than 0 and 0.06 or less, more than 0 and 0.03 0.002 or more and 0.02 or less, or 0.003 or more and 0.015 or less.
- the ratio of the number of moles of Mn to the total number of moles of alkali metals, 2, may be, for example, greater than 0 and 0.2 or less, preferably 0.005 or more and 0.15 or less, and 0.01 or more and 0.12. or less, or 0.015 or more and 0.1 or less.
- the ratio of the number of moles of F to the total number of moles of alkali metals, 2, may be, for example, 5.9 or more and 6.1 or less, preferably 5.9 or more and 6.1 or less, and 5.92 or more. 6.05 or less, or 5.95 or more and 6.025 or less.
- the ratio of the number of moles of F to the total number of moles of alkali metals, 2, may be, for example, 5.5 or more and less than 6.0, preferably 5.9 or more and less than 6.0, and 5.96 or more. 5.995 or less, or 5.97 or more and 5.99 or less.
- the ratio of the number of moles of Si to the total number of moles of alkali metals, 2, may be, for example, 0.7 or more and 1.1 or less, preferably 0.8 or more and 1.03 or less and 0.85 or more. 1.01 or less, or 0.92 or more and less than 0.95.
- the ratio of the number of moles of Al to the number of moles of Si may be, for example, 0.001 or more and 0.14 or less, preferably 0.002 or more and 0.04 or less, or 0.003 or more and 0.003 or more. 0.015 or less.
- the composition of fluoride phosphors can be measured, for example, by inductively coupled plasma (ICP) emission spectroscopy.
- the first composition of the fluoride phosphor may satisfy the following numerical range.
- the ratio of the total number of moles of Si, Al and Mn to the total number of moles of alkali metals contained in the composition may be, for example, 0.9 or more, 0.95 or more, or 0.97 or more, or 1.1 1.05 or less, 1.03 or less, or 1.0.
- the ratio of the number of moles of Al to the total number of moles of alkali metals, 2 may exceed, for example, 0, and may be 0.002 or more, 0.003 or more, 0.005 or more, or 0.01 or more, It may also be 0.06 or less, 0.03 or less, 0.02 or less, or 0.015 or less.
- the ratio of the number of moles of Mn to the total number of moles of alkali metals, 2, may exceed, for example, 0, may be 0.005 or more, 0.01 or more, or 0.015 or more, and may be 0.2 or less. , 0.15 or less, 0.12 or less, or 0.1 or less.
- the ratio of the number of moles of F to the total number of moles of alkali metals 2 may be, for example, 5.5 or more, 5.9 or more, 5.92 or more, 5.95 or more, or 5.97 or more, and It may be 6.1 or less, 6.05 or less, 6.025 or less, less than 6.0, 5.998 or less, 5.995 or less, or 5.99 or less.
- the ratio of the number of moles of Si to the total number of moles of alkali metals, 2, may be, for example, 0.7 or more, 0.8 or more, 0.85 or more, or 0.92 or more, and 1.1 or less, It may be 1.03 or less, 1.01 or less, less than 1, or less than 0.95.
- the ratio of the number of moles of Al to the number of moles of Si may be, for example, 0.001 or more, 0.002 or more, or 0.003 or more, and 0.14 or less, 0.04 or less, or 0.015 or less.
- the fluoride phosphor may have a composition represented by the following formula (I) as a first composition.
- I [ SipAlqMnrFs ]
- M represents an alkali metal and may contain at least K.
- Mn may be a tetravalent Mn ion.
- p, q, r and s are 0.9 ⁇ p+q+r ⁇ 1.1, 0 ⁇ q ⁇ 0.1, 0 ⁇ r ⁇ 0.2, 5.9 ⁇ s ⁇ 6.1 or 5.5 ⁇ s ⁇ 6.0 may be satisfied.
- 0.95 ⁇ p+q+r ⁇ 1.05, 0.97 ⁇ p+q+r ⁇ 1.03 or p+q+r 1.0, 0 ⁇ q ⁇ 0.06, 0 ⁇ q ⁇ 0.03, 0.002 ⁇ q ⁇ 0.02 or 0.003 ⁇ q ⁇ 0.015, or 0.005 ⁇ q ⁇ 0.06 or 0.01 ⁇ q ⁇ 0.03, 0.005 ⁇ r ⁇ 0.15, 0.01 ⁇ r ⁇ 0.12 or 0.015 ⁇ r ⁇ 0.1, 5.92 ⁇ s ⁇ 6.05 or 5.95 ⁇ s ⁇ 6.025, or 5.9 ⁇ s ⁇ 6.0, 5.96 ⁇ s ⁇ 5.995 or 5.97 ⁇ s ⁇ 5.99.
- the fluoride phosphor may have a first theoretical composition represented by the following formula (Ia).
- Ia M2 (Si,Al) F6 :Mn(Ia)
- M represents an alkali metal and may contain at least K.
- Mn may be a tetravalent Mn ion.
- the alkali metal in the composition of the fluoride phosphor and the first fluoride particles and the second fluoride particles described later contains at least K, lithium (Li), sodium (Na), rubidium (Rb) and cesium (Cs ) may contain at least one selected from the group consisting of
- the ratio of the number of moles of K to the total number of moles of alkali metals in the composition may be, for example, 0.90 or more, preferably 0.95 or more, or 0.97 or more.
- the upper limit of the molar ratio of K may be, for example, 1 or 0.995 or less.
- part of the alkali metal may be replaced with ammonium ions (NH 4 + ).
- the ratio of the number of moles of ammonium ions to the total number of moles of alkali metal in the composition may be, for example, 0.10 or less, preferably 0.05 or less, or 0.03 or less.
- the lower limit of the ratio of the number of moles of ammonium ions may be, for example, greater than 0, preferably 0.005 or more.
- the fluoride phosphor may contain a cubic crystal structure, or may contain a crystal structure of another crystal system such as a hexagonal crystal system in addition to the cubic crystal structure, and substantially It may be composed only of a cubic crystal structure.
- “substantially” means that the content of crystal structures other than the cubic system is less than 0.5%.
- its lattice constant may be, for example, 0.8138 nm or more, preferably 0.8140 nm or more, or 0.8143 nm or more.
- the upper limit of the lattice constant may be, for example, 0.8150 nm or less.
- the fact that the fluoride phosphor has a cubic crystal structure and its lattice constant can be evaluated by measuring the X-ray diffraction pattern of the fluoride phosphor.
- the fluoride phosphor may have an absorption peak in the infrared absorption spectrum, for example, in a wavenumber range of 590 cm -1 or more and 610 cm -1 or less, preferably 593 cm -1 or more and 607 cm -1 or less, or 595 cm -1 or more. It may have an absorption peak in the wavenumber range of 605 cm ⁇ 1 or less. Absorption peaks in a given wavenumber range are believed to originate, for example, from Al—F bonds in a cubic crystal structure.
- the infrared absorption spectrum is measured, for example, by the total reflection (ATR) method.
- the fluoride phosphor may have unevenness, grooves, etc. on its particle surface. It is believed that the incorporation of Al into the crystal structure of the fluoride phosphor changes the crystal structure, forming unevenness, grooves, etc. on the particle surface.
- the state of the particle surface can be evaluated, for example, by measuring the angle of repose of the powder made of fluoride phosphor.
- the repose angle of the powder made of fluoride phosphor may be, for example, 60° or less, preferably 55° or less, or 50° or less.
- the lower limit of the angle of repose is, for example, 30° or more.
- the angle of repose of powder can be measured, for example, using a powder characteristic measuring instrument (for example, ABD powder characteristic measuring instrument, manufactured by Tsutsui Rikagaku Kikai Co., Ltd.).
- the state of the particle surface of the fluoride phosphor can also be evaluated, for example, by measuring the degree of dispersion, bulk density, etc. of the powder made of the fluoride phosphor.
- a fluoride phosphor having a predetermined degree of dispersion or a predetermined bulk density suppresses agglomeration of the powder made of the fluoride phosphor, so that the powder can be easily handled when manufacturing a light-emitting device. Workability in the manufacturing process of is improved.
- the filling density of the fluoride phosphor can be increased in the light-emitting device, an improvement in the luminous flux of the light-emitting device can be expected.
- the degree of dispersion of the powder made of fluoride phosphor may be, for example, 2.0% or more, preferably 5.0% or more, 15% or more, or 20% or more.
- the upper limit of the dispersity may be, for example, 75% or less, 60% or less, or 50% or less.
- the degree of dispersion of powder can be measured using, for example, a powder property measuring instrument (eg, ABD powder property measuring instrument, manufactured by Tsutsui Rikagaku Kikai Co., Ltd.). Specifically, the sample is dropped from the hopper to the dispersity tray, and the value obtained by subtracting the weight of the sample remaining in the tray from the weight of the dropped sample is divided by the weight of the dropped sample to obtain the dispersity as a percentage. is calculated.
- a powder property measuring instrument eg, ABD powder property measuring instrument, manufactured by Tsutsui Rikagaku Kikai Co., Ltd.
- the bulk density of the powder made of fluoride phosphor may be, for example, 1.00 g cm ⁇ 3 or more, preferably 1.05 g cm ⁇ 3 or more, 1.10 g cm ⁇ 3 or more, or 1 0.15 g ⁇ cm ⁇ 3 or more.
- the upper limit of bulk density may be, for example, 1.50 g ⁇ cm ⁇ 3 or less, 1.40 g ⁇ cm ⁇ 3 or less, or 1.30 g ⁇ cm ⁇ 3 or less.
- Bulk density is measured, for example, by a normal measuring method using a graduated cylinder. The bulk density will be specifically described below.
- the bulk density of a powder is measured by measuring the volume of a powder sample of known weight placed in a graduated cylinder, or by measuring the weight of a powder sample of known volume placed in a container through a volume meter, or Determined by using a dedicated measurement container.
- a method using a graduated cylinder will be explained.
- a sufficient amount of sample is prepared for measurement and, if necessary, passed through a sieve.
- the required amount of sample is then placed in a dry graduated cylinder of fixed volume.
- the upper surface of the sample is leveled as necessary. Perform these operations gently so as not to affect the physical properties of the sample.
- the volume is read to the minimum scale unit, and the bulk density is obtained by calculating the weight of the sample per unit volume.
- the bulk density is preferably measured repeatedly, more preferably measured a plurality of times and calculated as the arithmetic mean value of the measured values.
- the volume-based median diameter of the fluoride phosphor may be, for example, 10 ⁇ m or more and 90 ⁇ m or less, preferably 15 ⁇ m or more and 70 ⁇ m or less, or 20 ⁇ m or more and 50 ⁇ m or less, from the viewpoint of improving luminance.
- the particle size distribution of the fluoride phosphor may exhibit, for example, a single-peak particle size distribution, preferably a single-peak particle size distribution with a narrow distribution width, from the viewpoint of improving luminance.
- the ratio of D90 to D10 (D90 /D10) may be 3.0 or less.
- a fluoride phosphor is, for example, a phosphor activated by tetravalent Mn, which absorbs light in the short wavelength region of visible light and emits red light.
- the excitation light may be mainly light in the blue region, and the peak wavelength of the excitation light may be within the wavelength range of 380 nm or more and 485 nm or less, for example.
- the emission peak wavelength in the emission spectrum of the fluoride phosphor or the luminescent material may be, for example, within the wavelength range of 610 nm or more and 650 nm or less.
- the half width in the emission spectrum of the fluoride phosphor or luminescent material may be, for example, 10 nm or less.
- the luminescent material may contain a fluoride phosphor and an oxide arranged on at least part of the surface of the fluoride phosphor.
- the oxide may contain at least one selected from the group consisting of silicon (Si), aluminum (Al), titanium (Ti), zirconium (Zr), tin (Sn) and zinc (Zn).
- the content of the oxide in the luminescent material may be 2% by mass or more and 30% by mass or less with respect to the luminescent material.
- the moisture resistance of the luminescent material is improved.
- the reliability of the light-emitting device provided with the fluorescent member containing the light-emitting material containing the fluoride phosphor and the resin can be improved.
- reduction in mass of the fluorescent member is suppressed in a high-temperature environment or a high-humidity environment.
- the decrease in the mass of the fluorescent member is considered to be mainly due to the decrease in the amount of resin.
- Direct contact between the fluoride phosphor and the resin in a high-temperature environment or a high-humidity environment is thought to cause some kind of reaction, resulting in scattering of decomposition products in which some of the interatomic bonds of the resin are broken.
- a predetermined amount of oxide which is considered to be more chemically stable than the fluoride phosphor
- the resin also functions as a protective member for the luminescent material, it is conceivable that a decrease in the amount of the resin makes the luminescent material more susceptible to the effects of the external environment including moisture, accelerating the deterioration of the luminescent material. Also, due to the decrease in the amount of resin, for example, the shape of the light emitting surface of the fluorescent member in the light emitting device shown in FIG. For this reason, less light is extracted to the outside of the light emitting device, and the luminous flux of the light emitting device may decrease.
- the luminescent material may contain an oxide arranged on at least part of the surface of the fluoride phosphor.
- the oxide may cover the surface of the fluoride phosphor in the form of an oxide film, or may be arranged on the surface of the fluoride phosphor as an oxide layer.
- the oxide film covering the surface of the fluoride phosphor is not limited to a state in which no cracks are present at all, and the oxide film covering the surface of the fluoride phosphor may be used to the extent that the effects of the invention can be obtained. Cracks may exist in the part.
- the oxide film covering the surface of the fluoride phosphor preferably completely covers the entire surface, a part of the oxide film may be partially missing, and the effect of the invention can be obtained.
- the coverage of the oxide of the fluoride phosphor in the luminescent material may be, for example, 50% or more, preferably 80% or more, or 90% or more.
- the oxide coverage of the fluoride phosphor is calculated as the ratio of the area covered by the oxide to the surface area of the fluoride phosphor.
- the oxide may contain at least one selected from the group consisting of Si, Al, Ti, Zr, Sn and Zn. That is, oxides include silicon oxide (e.g., SiOx, where x may be 1 or more and 2 or less, preferably 1.5 or more and 2 or less, or about 2 ), aluminum oxide (e.g., Al2O3 ), oxide containing at least one selected from the group consisting of titanium (e.g. TiO 2 ), zirconium oxide (e.g. ZrO 2 ), tin oxide (e.g. SnO, SnO 2 etc.) and zinc oxide (e.g. ZnO) It may well contain at least silicon oxide.
- the oxide may consist of only one kind, or may contain two or more kinds.
- the content of the oxide in the luminescent material may be 2% by mass or more and 30% by mass or less, preferably 5% by mass or more and 20% by mass or less, or 8% by mass or more and 15% by mass or less. you can
- the oxide content in the light-emitting material can be determined, for example, when the oxide is silicon oxide, by inductively coupled plasma (ICP) emission spectroscopy to determine oxide-covered fluoride phosphors and oxide-free fluoride phosphors. The amount of each constituent element contained in the phosphor is analyzed, and the molar ratio of each constituent element is calculated so that the number of moles of the alkali metal is two.
- ICP inductively coupled plasma
- the difference in the molar ratio of silicon before and after covering with oxide is converted to the mass of silicon oxide (e.g., SiO 2 ), and the mass of the fluoride phosphor (luminescent material) covered with oxide is 100% by mass. (eg, SiO 2 ) content is calculated.
- silicon oxide e.g., SiO 2
- fluoride phosphor (luminescent material) covered with oxide 100% by mass. (eg, SiO 2 ) content is calculated.
- the oxide content is within the above range, the reliability of the light-emitting device can be further improved.
- the fluoride phosphor may be covered with an oxide layer.
- the average thickness of the oxide layer covering the fluoride phosphor may be, for example, 0.1 ⁇ m or more and 1.8 ⁇ m or less, preferably 0.15 ⁇ m or more and 1.0 ⁇ m or less, or 0.2 ⁇ m or more and 0.8 ⁇ m or less. you can
- the average thickness of the oxide layer in the light-emitting material may be, for example, an actually-measured average thickness obtained by measuring the thickness of the layer identified as the oxide layer at several locations in the cross-sectional image of the light-emitting material and obtaining the arithmetic average of the thicknesses.
- the average thickness of the oxide layer in the light-emitting material may be a theoretical thickness calculated from the K ⁇ ray intensity ratio of the F element, which will be described later.
- the theoretical thickness is the peak intensity of the K ⁇ ray of the F element in the fluoride phosphor (light emitting material) covered with an oxide layer relative to the peak intensity of the K ⁇ ray of the F element in the fluoride phosphor not covered with the oxide layer. can be calculated using the CXRO (The Center for X-Ray Optics) database.
- the theoretical thickness is calculated as a value obtained by averaging the existence of defects such as cracks and chips in the oxide layer.
- the peak intensity of the characteristic X-rays derived from the fluoride phosphor decreases according to the amount of oxide covering the fluoride phosphor. Therefore, in a light-emitting material containing a fluoride phosphor, by evaluating the peak intensity of the characteristic X-rays derived from the fluoride phosphor, it is possible to evaluate the oxide coating state.
- the ratio of the peak intensity of the K ⁇ ray of the F element in the luminescent material to the peak intensity of the K ⁇ ray of the F element in the fluoride phosphor is, for example, 80% or less.
- the lower limit of the peak intensity ratio may be, for example, 20% or more.
- the ratio of the peak intensity of the K ⁇ line of the F element in the light-emitting material is within the above range, the reliability of the light-emitting device can be more effectively improved.
- a rare earth phosphate may be arranged on at least part of the surface of the fluoride phosphor. This tends to further improve the moist heat resistance of the luminescent material.
- the rare earth phosphate disposed on the surface of the fluoride phosphor may be attached to at least a portion of the surface of the fluoride phosphor as particles, or as a film or layer on at least a portion of the surface of the fluoride phosphor. may be coated. It may preferably adhere to the surface of the fluoride phosphor as particles.
- a rare earth phosphate may be arranged on at least part of the surface of the fluoride phosphor, and the oxide may cover the fluoride phosphor via the rare earth phosphate. This tends to further improve the moist heat resistance of the luminescent material. In addition, there is a tendency that the adhesion of the oxide to the fluoride phosphor is improved, and the coverage by the oxide is further improved.
- the rare earth phosphate may contain at least one rare earth element selected from the group consisting of lanthanum (La), cerium (Ce), dysprosium (Dy) and gadolinium (Gd), and preferably contains at least lanthanum.
- La lanthanum
- Ce cerium
- Dy dysprosium
- Gd gadolinium
- the content of the rare earth phosphate in the light emitting material may be, for example, 0.1% by mass or more and 20% by mass or less, preferably 0.2% by mass or more and 15% by mass or less, or 0 as the content of the rare earth element. .3% by mass or more and 10% by mass or less.
- a light-emitting material obtained by coating a fluoride phosphor with at least one of an oxide and a rare earth phosphate has a surface condition of the fluoride phosphor even after coating at least one of the oxide and the rare earth phosphate. It may have unevenness, grooves, etc. on its surface. As a result, the contact area between the particles of the luminescent material is reduced due to the irregularities and grooves on the surface of the luminescent material, and aggregation of the luminescent material is suppressed. Therefore, the particles of the light-emitting material can be more uniformly dispersed in the resin composition when manufacturing the light-emitting device.
- a dispenser when a dispenser is used in manufacturing a light-emitting device, problems such as clogging of the needle of the dispenser with the light-emitting material are less likely to occur.
- a light-emitting device with less aggregation of the light-emitting material and less variation in chromaticity can be obtained.
- the surface of the luminescent material may be further treated with a coupling agent. That is, a surface-treated layer containing a functional group derived from a coupling agent may be arranged on the surface of the luminescent material. By arranging the surface treatment layer on the surface of the light-emitting material, for example, the moisture resistance of the light-emitting material is further improved.
- the functional group derived from the coupling agent includes, for example, a silyl group having an aliphatic group having 1 to 20 carbon atoms, preferably a silyl group having an aliphatic group having 6 to 12 carbon atoms. .
- the functional groups derived from the coupling agent may be used singly or in combination of two or more.
- Examples of coupling agents include silane coupling agents, titanium coupling agents, and aluminum coupling agents.
- Examples of silane coupling agents include alkyltrialkoxysilanes such as methyltrimethoxysilane, ethyltrimethoxysilane, propyltrimethoxysilane, hexyltrimethoxysilane, octyltrimethoxysilane, decyltrimethoxysilane, and decyltriethylsilane; aryltrialkoxysilanes such as trimethoxysilane and styryltrimethoxysilane; vinyltrialkoxysilanes such as vinyltrimethoxysilane; aminoalkyltrialkoxysilanes such as 3-aminopropyltriethoxysilane; 3-glycidoxypropyltrimethoxysilane. and glycidoxyalkyltrialkoxysilanes, etc., and
- FIG. 1 is a flow chart showing an example of steps in a method for producing a luminescent material.
- a method for producing a luminescent material includes preparing first fluoride particles (S101), preparing second fluoride particles (S102), and performing a first heat treatment to obtain a first heat-treated product. (S103). Either the preparation of the first fluoride particles (S101) or the preparation of the second fluoride particles (S102) may be performed first, or may be performed simultaneously.
- the method for producing a luminescent material may include washing (S104) after the first heat treatment (S103), and further washing (S104) followed by a second heat treatment. Obtaining a second heat treated product (S105) may be included.
- the method for producing a light-emitting material may include, after performing the first heat treatment (S103), performing a second heat treatment without washing to obtain a second heat-treated product (S105).
- a method for producing a luminescent material comprises a first preparation step of preparing first fluoride particles, a second preparation step of preparing second fluoride particles, the first fluoride particles and the second fluoride particles. and a first heat treatment step of performing a first heat treatment on the mixture in an inert gas atmosphere at a temperature range of 600° C. or higher and 780° C. or lower to obtain a first heat treated product.
- the first fluoride particles have a second composition comprising an alkali metal containing K, Si, Mn, and F.
- the second fluoride particles have a third composition including an alkali metal including K, Al, and F.
- the number of moles of Al is 1, the total number of moles of alkali metals is 2 or more and 3 or less, and the number of moles of F is 5 or more and 6 or less.
- first fluoride particles having a second composition are provided.
- the ratio of the total number of moles of Si and Mn to the total number of moles of alkali metals is 0.9 or more and 1.1 or less
- the ratio of the number of moles of Mn is more than 0 and 0 .2 or less
- the molar ratio of F may be 5.9 or more and 6.1 or less, or 5.5 or more and less than 6.0.
- the total molar ratio of Si and Mn may preferably be 0.95 or more and 1.05 or less, or 0.97 or more and 1.03 or less.
- the molar ratio of Mn may be preferably 0.005 or more and 0.15 or less, 0.01 or more and 0.12 or less, or 0.015 or more and 0.1 or less.
- the molar ratio of F is preferably 5.95 or more and 6.05 or less, or 5.97 or more and 6.03 or less, or 5.9 or more and less than 6.0, 5.96 or more and 5.995 or less, or 5.97 or more and less than 6.03. It may be 97 or more and 5.99 or less.
- the first fluoride particles may have a composition represented by the following formula (III) as a second composition.
- III M2 [ SibMncFd ] ( III )
- M represents an alkali metal and may contain at least K.
- Mn may be a tetravalent Mn ion.
- b, c and d may satisfy 0.9 ⁇ b+c ⁇ 1.1, 0 ⁇ c ⁇ 0.2, 5.9 ⁇ d ⁇ 6.1 or 5.5 ⁇ d ⁇ 6.0.
- the first fluoride particles may have a second theoretical composition represented by the following formula (IIIa).
- IIIa M2SiF6 : Mn(IIIa)
- M represents an alkali metal and may contain at least K.
- Mn may be a tetravalent Mn ion.
- the volume-based median diameter of the first fluoride particles may be, for example, 10 ⁇ m or more and 90 ⁇ m or less, preferably 15 ⁇ m or more and 70 ⁇ m or less, or 20 ⁇ m or more and 50 ⁇ m or less, from the viewpoint of improving luminance.
- the particle size distribution of the first fluoride particles may, for example, exhibit a single peak particle size distribution in terms of brightness enhancement. It may preferably exhibit a single-peak particle size distribution with a narrow distribution width. Specifically, in the volume-based particle size distribution, if the particle size corresponding to 10% volume accumulation from the small diameter side is D10 and the particle size corresponding to 90% volume accumulation is D90, the ratio of D90 to D10 (D90 /D10) may be 3.0 or less.
- the first fluoride particles may be, for example, a phosphor activated by tetravalent Mn ions, and may absorb light in the short wavelength region of visible light and emit red light.
- the excitation light may be mainly light in the blue region, and the peak wavelength of the excitation light may be within the wavelength range of 380 nm or more and 485 nm or less, for example.
- the emission peak wavelength in the emission spectrum of the first fluoride particles may be, for example, within the wavelength range of 610 nm or more and 650 nm or less.
- the half width of the emission spectrum of the first fluoride particles may be, for example, 10 nm or less.
- the first fluoride particles may be purchased and prepared, or may be manufactured and prepared by the following manufacturing method. Although the production method in the case where the alkali metal is potassium will be described below, the same production method can be used when the alkali metal contains an alkali metal other than potassium.
- the method for producing the first fluoride particles includes, for example, a first solution containing at least potassium ions and hydrogen fluoride, and a first complex ion containing tetravalent Mn ions and a second solution containing at least hydrogen fluoride. mixing the solution with a third solution containing at least a second complex ion containing silicon and fluoride ions; By mixing the first solution, the second solution, and the third solution, the first fluoride particles having a desired composition and functioning as a phosphor are produced in a simple and highly productive manner. can be manufactured by a method.
- the first solution contains at least potassium ions and hydrogen fluoride, and may contain other components as necessary.
- the first solution is obtained, for example, as an aqueous solution of hydrofluoric acid of a compound containing potassium ions.
- the compound containing potassium ions that constitute the first solution include water-soluble compounds containing potassium ions, such as halides, hydrofluorides, hydroxides, acetates, and carbonates. Specific examples include water-soluble potassium salts such as KF, KHF2 , KOH, KCl, KBr, KI, CH3COOK , K2CO3 .
- KHF 2 is preferable because it can be dissolved without lowering the concentration of hydrogen fluoride in the solution and has a small heat of dissolution and high safety.
- the compounds containing potassium ions that constitute the first solution may be used singly or in combination of two or more.
- the lower limit of the hydrogen fluoride concentration in the first solution is usually 1% by mass or more, preferably 3% by mass or more, and more preferably 5% by mass or more.
- the upper limit of the hydrogen fluoride concentration in the first solution is usually 80% by mass or less, preferably 75% by mass or less, and more preferably 70% by mass or less.
- the lower limit of the potassium ion concentration in the first solution is usually 1% by mass or more, preferably 3% by mass or more, and more preferably 5% by mass or more.
- the upper limit of the potassium ion concentration in the first solution is usually 30% by mass or less, preferably 25% by mass or less, more preferably 20% by mass or less. When the potassium ion concentration is 5% by mass or more, the yield of the first fluoride particles tends to improve.
- the second solution contains at least the first complex ions containing tetravalent Mn ions and hydrogen fluoride, and may contain other components as necessary.
- the second solution is obtained, for example, as an aqueous solution of hydrofluoric acid containing a source of tetravalent manganese.
- a manganese source is, for example, a compound containing tetravalent Mn ions.
- Specific examples of the manganese source that constitutes the second solution include K 2 MnF 6 , KMnO 4 , K 2 MnCl 6 and the like.
- K 2 MnF 6 is preferred because it can exist as Among manganese sources, those containing potassium ions can also serve as the potassium ion source contained in the first solution.
- the manganese source that constitutes the second solution may be used singly or in combination of two or more.
- the lower limit of the hydrogen fluoride concentration in the second solution is usually 1% by mass or more, preferably 3% by mass or more, and more preferably 5% by mass or more.
- the upper limit of the hydrogen fluoride concentration in the second solution is usually 80% by mass or less, preferably 75% by mass or less, more preferably 70% by mass or less.
- the lower limit of the first complex ion concentration in the second solution is usually 0.01% by mass or more, preferably 0.03% by mass or more, and more preferably 0.05% by mass or more.
- the upper limit of the concentration of the first complex ion in the second solution is usually 5% by mass or less, preferably 3% by mass or less, more preferably 2% by mass or less.
- the third solution contains at least the second complex ions containing silicon and fluorine ions, and may contain other components as necessary.
- the third solution is obtained, for example, as an aqueous solution containing the second source of complex ions.
- the second complex ion source is preferably a compound containing silicon and fluoride ions and having excellent solubility in a solution.
- Specific examples of the second complex ion source include H 2 SiF 6 , Na 2 SiF 6 , (NH 4 ) 2 SiF 6 , Rb 2 SiF 6 and Cs 2 SiF 6 .
- H 2 SiF 6 is preferable because it has high solubility in water and does not contain an alkali metal element as an impurity.
- the second complex ion source that constitutes the third solution may be used singly or in combination of two or more.
- the lower limit of the second complex ion concentration in the third solution is usually 10% by mass or more, preferably 15% by mass or more, and more preferably 20% by mass or more.
- the upper limit of the second complex ion concentration in the third solution is usually 60% by mass or less, preferably 55% by mass or less, more preferably 50% by mass or less.
- the second solution and the third solution may be added and mixed while stirring the first solution, and the third solution
- the first and second solutions may be added and mixed while stirring the solutions.
- the first solution, the second solution, and the third solution may be put into containers and stirred and mixed.
- the first complex ions, the potassium ions, and the second complex ions react to form the desired first fluoride particles. Crystals precipitate.
- the precipitated crystals can be collected by solid-liquid separation by filtration or the like.
- a reducing agent such as hydrogen peroxide solution may be added, and a solvent such as ethanol, isopropyl alcohol, water, or acetone may be used for washing.
- Further drying treatment may be performed. The drying treatment is usually carried out at 50°C or higher, preferably 55°C or higher, more preferably 60°C or higher, and usually 110°C or lower, preferably 105°C or lower, more preferably 100°C or lower.
- the drying time is not particularly limited as long as the water adhering to the first fluoride particles can be removed, and is, for example, about 10 hours.
- the first method for producing fluoride particles may include a granule sizing step that combines treatments such as pulverization, pulverization, and classification after the drying treatment.
- a powder having a desired particle size can be obtained by the sizing process.
- second fluoride particles having a third composition are provided.
- the third composition may have a ratio of the total number of moles of alkali metals of 1 to 3 and a ratio of the number of moles of F of 4 to 6 to 1 mole of Al.
- the third composition may have a total molar ratio of alkali metals of 2 or more and 3 or less and a molar ratio of F of 5 or more and 6 or less per mole of Al of 1. .
- the second fluoride particles may have a composition represented by the following formula (IV) as a third composition.
- M represents an alkali metal and may contain at least K.
- e and f may satisfy 2 ⁇ e ⁇ 3 and 5 ⁇ f ⁇ 6.
- the second fluoride particles may have a composition represented by the following formula (IVa) or (IVb), or may contain both compositions.
- IVa AlF 6 ]
- IVb M2 [ AlF5 ]
- the specific surface area of the second fluoride particles may be, for example, 0.3 m 2 ⁇ g ⁇ 1 or more, preferably 1 m 2 ⁇ g ⁇ 1 or more, from the viewpoint of reactivity with the first fluoride particles. , or 3 m 2 ⁇ g ⁇ 1 or more.
- the upper limit of the specific surface area of the second fluoride particles may be, for example, 30 m 2 ⁇ g ⁇ 1 or less.
- a specific surface area is measured by, for example, the BET method.
- the second fluoride particles may be purchased and prepared, or may be manufactured and prepared by a known manufacturing method.
- First heat treatment step In the first heat treatment step, the prepared first fluoride particles and second fluoride particles are mixed to obtain a mixture, and the obtained mixture is heated to 600 ° C. or higher in an inert gas atmosphere. and obtaining a first heat treated product by performing a first heat treatment in a temperature range of 780° C. or less.
- the first heat-treated product contains the target fluoride phosphor.
- the first fluoride particles and the second fluoride particles may be mixed, for example, by dry mixing which is usually performed. Dry mixing can be carried out using, for example, a high-speed fluid mixer or the like.
- the ratio of the first fluoride particles and the second fluoride particles in the mixture is the ratio of the number of moles of the second fluoride particles to the total number of moles of the first fluoride particles and the second fluoride particles, For example, it may be greater than 0 and less than 0.1. Preferably, it may be less than 0.05 or less than 0.03 mol.
- the lower limit of the molar ratio of the second fluoride particles may be preferably 0.003 or more or 0.005 or more.
- the heat treatment temperature in the first heat treatment step may be, for example, 600°C or higher.
- the heat treatment temperature may preferably be 625° C. or higher, 650° C. or higher, or 675° C. or higher. If the heat treatment temperature is 600 ° C. or higher, the first fluoride particles can efficiently incorporate the second fluoride particles, and part of Si in the crystal structure of the first fluoride particles is converted to Al. A substituted fluoride phosphor with high brightness can be obtained.
- the heat treatment temperature in the first heat treatment step may be, for example, less than 800°C.
- the heat treatment temperature may preferably be 780° C. or less, 770° C. or less, 760° C.
- the first heat treatment temperature in the first heat treatment may be 650° C. or higher and 750° C. or lower.
- the heat treatment time in the first heat treatment step may be, for example, 1 hour or more and 40 hours or less, preferably 2 hours or more and 30 hours or less.
- substitution of Al for Si contained in the crystal structure of the first fluoride particles tends to proceed more efficiently, resulting in a fluoride phosphor with high brightness.
- the heat treatment time in the first heat treatment step means the time during which the mixture of the first fluoride particles and the second fluoride particles is held at the first heat treatment temperature.
- the heating rate to the first heat treatment temperature in the first heat treatment step may be, for example, 1° C./min or more.
- the mixture may be heat treated in an inert gas atmosphere.
- the inert gas atmosphere means, for example, an atmosphere containing a rare gas such as argon or helium or an inert gas such as nitrogen as a main component.
- the main component of the inert gas atmosphere may be at least one selected from argon, helium, nitrogen, etc., and may contain at least nitrogen.
- the concentration of an inert gas such as nitrogen gas in the inert gas atmosphere may be, for example, 70% by volume or more, preferably 80% by volume or more, 85% by volume or more, 90% by volume or more, or 95% by volume or more. It's okay.
- Inert gases may contain active gases such as oxygen as unavoidable impurities.
- the active gas concentration contained in the atmosphere in the first heat treatment step may be 15% by volume or less, preferably less than 5% by volume, less than 1% by volume, less than 0.3% by volume, or less than 0.1% by volume. you can
- the inert gas atmosphere may not contain active gas such as oxygen. When the active gas concentration in the inert gas atmosphere is within the above range, oxidation of tetravalent Mn contained in the mixture can be sufficiently suppressed.
- the pressure during heat treatment in the first heat treatment step may be, for example, atmospheric pressure (0.101 MPa).
- the pressure during the heat treatment may be more than 0.101 MPa and 1 MPa or less, or may be a reduced pressure lower than the atmospheric pressure (0.101 MPa).
- the method for producing a luminescent material may further include a washing step of bringing the first heat-treated product obtained in the first heat treatment step into contact with the first liquid medium.
- the washing step may include, for example, contacting the first heat-treated product with the first liquid medium, and solid-liquid separating the first heat-treated product contacted with the first liquid medium. It may further include drying the first heat-treated product after solid-liquid separation according to.
- the impurities for example, alkali metal fluorides such as potassium fluoride
- the change in composition of the obtained fluoride phosphor can be suppressed by this, and the decrease in luminance caused by the change in composition can be effectively suppressed.
- the first liquid medium to be brought into contact with the first heat-treated product examples include lower alcohols such as ethanol and isopropyl alcohol, ketone solvents such as acetone, and water.
- the first liquid medium may contain at least water, and the water may be deionized water or distilled water, and may be purified with a microfiltration membrane, an ultrafiltration membrane, a reverse osmosis membrane, or the like. Purified water may also be used.
- the first liquid medium may contain a reducing agent such as hydrogen peroxide. Since the first liquid medium contains a reducing agent, even if the tetravalent Mn ion, which is an activator in the fluoride phosphor, is oxidized by the first heat treatment, reduction in the first liquid medium Reduced by the agent, the resulting fluoride phosphor can have higher emission properties.
- the first liquid medium contains a reducing agent
- the content may be, for example, 0.01% by mass or more and 5% by mass or less, preferably 0.05% by mass or more and 1% by mass or less.
- the amount of the first liquid medium used for contact with the first heat-treated product may be, for example, 2 times or more and 20 times or less with respect to the total mass of the first heat-treated product.
- the first heat-treated product and the first liquid medium may be brought into contact with each other by mixing the first heat-treated product and the first liquid medium, and then removing the first liquid medium. It may be carried out by passing the first liquid medium through the first heat-treated product.
- the contact time between the first heat-treated product and the first liquid medium may be, for example, 1 hour or more and 20 hours or less.
- the contact temperature between the first heat-treated product and the first liquid medium may be, for example, 10° C. or higher and 50° C. or lower.
- a drying treatment may be performed on the first heat-treated product that has been brought into contact with the first liquid medium.
- the drying temperature in the drying treatment may be, for example, 50° C. or higher, preferably 55° C. or higher or 60° C. or higher, and may be, for example, 110° C. or lower, preferably 105° C. or lower or 100° C. or lower. It's okay.
- the drying time is the time during which at least part of the first liquid medium (e.g., moisture) adhering to the first heat-treated product can be evaporated by contact with the first liquid medium, and is, for example, about 10 hours. is.
- Second heat treatment step In the method for producing a luminescent material, the first heat-treated product after contact with the first liquid medium is subjected to a second heat treatment at a second heat treatment temperature of 400 ° C. or higher to obtain a second heat-treated product.
- a second heat treatment step may be further included.
- the second heat-treated product contains the target fluoride phosphor.
- the method for producing a luminescent material further includes a second heat treatment step of subjecting the first heat-treated product, which is not in contact with the liquid medium, to a second heat treatment at a second heat treatment temperature of 400° C. or higher to obtain a second heat-treated product. may contain.
- the effects of the second heat treatment step can be considered, for example, as follows.
- silicon ions eg Si 4+
- aluminum ions eg Al 3+
- Mn 4+ manganese ions
- vacancies are thought to exist in the atomic coordinates of fluorine ions in the crystal, depending on the abundance of each ion.
- the fluoride particles having the third composition synthesized by the liquid phase reaction method a large number of atoms introduced into the crystal by the hydroxide ions present in the reaction solution are located at the atomic coordinates of the fluorine ions in the crystal. Hydroxide ions are mixed, and it is considered that these hydroxide ions are the cause of the deterioration of the stability of the phosphor.
- the fluoride phosphor having the first composition synthesized by the solid phase reaction method by the first heat treatment does not contain hydroxide ions that cause deterioration of the stability of the phosphor. .
- manganese ions with different valences may be mixed in the crystal of the phosphor or on the surface of the crystal in the fluoride phosphor having the first composition synthesized by the solid phase reaction method by the first heat treatment. be done. Even when manganese ions with different valences are mixed in the phosphor in this way, the valence of the manganese ions can be adjusted to a tetravalent state by performing the second heat treatment. It is also considered that the extraction efficiency of fluorescence emitted from the fluoride phosphor can be increased.
- the second heat treatment may be performed on the first heat-treated product by maintaining the second heat treatment temperature for a predetermined period of time.
- the second heat treatment temperature may be, for example, 400° C. or higher, preferably higher than 400° C., 425° C. or higher, 450° C. or higher, or 480° C. or higher.
- the upper limit of the second heat treatment temperature may be, for example, less than 600°C, preferably 580°C or less, 550°C or less, or 520°C or less.
- the second heat treatment temperature may be lower than the first heat treatment temperature.
- the manganese ions contained in the first heat-treated product can be sufficiently arranged in a tetravalent state, and the brightness of the resulting luminescent material containing a fluoride phosphor is further improved.
- the temperature of the second heat treatment is equal to or lower than the upper limit, the decomposition of the obtained luminescent material containing the fluoride phosphor is more effectively suppressed, and the luminance of the obtained luminescent material containing the fluoride phosphor is further improved.
- the heat treatment time in the second heat treatment may be, for example, 1 hour or more and 40 hours or less, preferably 2 hours or more or 3 hours or more, and preferably It may be 30 hours or less, 10 hours or less, or 8 hours or less. If the heat treatment time at the second heat treatment temperature is within the above range, the manganese ions contained in the first heat treatment product can be sufficiently arranged in a tetravalent state. As a result, the crystal structure of the luminescent material containing the fluoride phosphor becomes more stable, and there is a tendency to obtain a luminescent material containing the fluoride phosphor with high brightness.
- the heat treatment time at the second heat treatment temperature may be the same as the heat treatment time at the first heat treatment temperature, or may be longer than the heat treatment time at the first heat treatment temperature. That is, the heat treatment time at the second heat treatment temperature may be one or more times the heat treatment time at the first heat treatment temperature.
- the pressure in the second heat treatment step may be atmospheric pressure (0.101 MPa), may be above atmospheric pressure to 5 MPa or less, or may be above atmospheric pressure to 1 MPa or less.
- the second heat treatment may be performed while the first heat treatment product is in contact with the fluorine-containing substance.
- the fluorine-containing substance used in the second heat treatment step may be in a solid state, a liquid state, or a gaseous state at room temperature.
- solid or liquid fluorine-containing substances include NH 4 F and the like.
- gaseous fluorine-containing substances include F 2 , CHF 3 , CF 4 , NH 4 HF 2 , HF, SiF 4 , KrF 4 , XeF 2 , XeF 4 , and NF 3 . It may be at least one selected from the group consisting of, preferably at least one selected from the group consisting of F2 and HF.
- the first heat-treated product When the fluorine-containing substance is in a solid state or a liquid state at room temperature, the first heat-treated product after being brought into contact with the liquid medium is mixed with the fluorine-containing substance to bring them into contact with each other. can be done.
- the first heat-treated product is, for example, 1% by mass or more and 20% by mass or less, preferably 2% by mass or more and 10% by mass in terms of the mass of fluorine atoms with respect to the total amount of 100% by mass of the first heat-treated product and the fluorine-containing substance. It may be mixed with the following fluorine-containing substances.
- the temperature at which the first heat-treated product and the fluorine-containing substance are mixed may be, for example, from room temperature (20°C ⁇ 5°C) to a temperature lower than the second heat treatment temperature, or may be the second heat treatment temperature. Specifically, the temperature may be 20° C. or higher and lower than 400° C., or the temperature may be 400° C. or higher.
- the temperature at which the first heat-treated product is brought into contact with the fluorine-containing substance in a solid or liquid state at room temperature is 20°C or higher and lower than 400°C
- the first heat-treated product and the fluorine-containing substance are contacted at a temperature of 400°C or higher.
- a second heat treatment is performed at temperature.
- the first heat-treated product may be placed in an atmosphere containing the fluorine-containing substance and brought into contact therewith.
- the atmosphere containing the fluorine-containing substance may contain inert gas such as rare gas and nitrogen in addition to the fluorine-containing substance.
- the concentration of the fluorine-containing substance in the atmosphere may be, for example, 3% by volume or more and 35% by volume or less, preferably 5% by volume or more or 10% by volume or more, and preferably 30% by volume. or less or 25% by volume or less.
- the method for producing a luminescent material may include a granule sizing step in which the second heat-treated product obtained after the second heat treatment step is subjected to a combination of treatments such as crushing, pulverization, and classification.
- a powder having a desired particle size can be obtained by the sizing process.
- the method for producing a luminescent material may further include a pressure heating step of obtaining a third heat-treated product by pressure-treating and heat-treating a mixture containing the first heat-treated product and the second liquid medium.
- a pressure heating step of obtaining a third heat-treated product by pressure-treating and heat-treating a mixture containing the first heat-treated product and the second liquid medium.
- the second liquid medium examples include lower alcohols such as ethanol and isopropyl alcohol, ketone solvents such as acetone, and water.
- the second liquid medium may contain at least water, and the water may be deionized water or distilled water, and may be purified by a microfiltration membrane, an ultrafiltration membrane, a reverse osmosis membrane, or the like. Purified water may also be used.
- the second liquid medium may be a substance that is gas at normal pressure but liquefies by pressurization, or a substance that is solid at normal temperature and liquefies by heating.
- the second liquid medium may be used alone or in combination of two or more. 0.5 or more and 2 or less, preferably 0.7 or more and 1.6 or less.
- the second liquid medium may further contain a component soluble in the second liquid medium.
- components that can be dissolved in the second liquid medium include inorganic acids such as hydrogen fluoride (HF), hexafluorosilicic acid (H 2 SiF 6 ) and nitric acid (HNO 3 ); peroxides such as hydrogen peroxide; ; inorganic acid salts containing potassium ions such as potassium hydrogen fluoride (KHF 2 ), potassium nitrate (KNO 3 ) and potassium fluoride (KF).
- the second liquid medium may contain at least potassium ions, and may contain at least an inorganic acid salt containing potassium ions.
- the concentration of potassium ions may be, for example, 5% by mass or more and 10% by mass or less.
- the components that are soluble in the second liquid medium may be used singly or in combination of two or more.
- the pressure of the pressurizing treatment may be, for example, 1.5 MPa or higher, preferably 2.5 MPa or higher, or 5.0 MPa or higher.
- the upper limit of the pressure may be, for example, 30 MPa or less, preferably 15 MPa or less, from the viewpoint of durability and production efficiency.
- the time for pressurization treatment may be appropriately selected according to the treatment conditions such as pressure.
- the treatment time may be, for example, 4 hours or longer, preferably 6 hours or longer, or 8 hours or longer, from the viewpoint of improving durability.
- the upper limit of the treatment time may be, for example, 48 hours or less, preferably 24 hours or less, or 20 hours or less, from the viewpoint of durability and production efficiency.
- the mixture may be placed in a pressure-tight sealed container such as an autoclave and pressurized.
- the pressurization method may be appropriately selected from commonly used pressurization methods.
- the pressure treatment may be performed by reducing the volume of the pressure-resistant sealed container, the pressure treatment may be performed by injecting a gas such as air or an inert gas, or the heat treatment may be performed while maintaining the sealed state. By doing so, pressure treatment may be performed by pressure due to the vapor pressure of a liquid medium or the like.
- the atmosphere in the pressure treatment may be an air atmosphere or an inert gas atmosphere.
- the temperature of the heat treatment may be, for example, 100°C or higher, preferably 120°C or higher, or 150°C or higher.
- the upper limit of the heat treatment temperature may be, for example, 300° C. or lower, preferably 200° C. or lower, from the viewpoint of durability and production efficiency.
- the heat treatment time may be selected as appropriate according to the treatment conditions such as temperature. From the viewpoint of improving durability, the heat treatment time may be, for example, 4 hours or longer, preferably 8 hours or longer. From the viewpoint of durability and production efficiency, the upper limit of the heat treatment time may be, for example, 24 hours or less, preferably 20 hours or less.
- the atmosphere in the heat treatment may be an air atmosphere or an inert gas atmosphere.
- the pressurization treatment and heat treatment may be performed sequentially, or the respective treatments may be performed temporally.
- the pressure treatment and the heat treatment are performed at the same time, for example, the pressure treatment can be performed by the vapor pressure of the liquid medium by putting the above mixture in a pressure-resistant sealed container and heat-treating it.
- the first heat-treated product is subjected to pressure heating treatment together with the second liquid medium, for example, at a temperature of 120° C. or higher and 300° C. or lower and a pressure of 2.5 MPa or higher and 30 MPa or lower for 8 hours or longer and 48 hours or shorter.
- the temperature is 150° C. to 200° C. and the pressure is 5.0 MPa to 12 MPa for 6 hours to 24 hours.
- the method for producing a luminescent material may further include post-treatment steps such as separation treatment, purification treatment, and drying treatment of the third heat-treated product, and crushing, pulverization, and classification operations. It may include a granule sizing step performed by combining such treatments. A powder having a desired particle size can be obtained by the sizing process.
- the fluoride phosphor contained in the obtained luminescent material may have a composition represented by the following formula (I). M2 [ SipAlqMnrFs ] ( I )
- M represents an alkali metal and may contain at least K.
- p, q, r and s are 0.9 ⁇ p+q+r ⁇ 1.1, 0 ⁇ q ⁇ 0.1, 0 ⁇ r ⁇ 0.2, 5.9 ⁇ s ⁇ 6.1 or 5.5 ⁇ s ⁇ 6.0 is satisfied.
- the method for producing a light-emitting material includes the first heat-treated product, the second heat-treated product, or the third heat-treated product obtained by the above-described production method, and at least one selected from the group consisting of Si, Al, Ti, Zr, Sn, and Zn.
- Contact with a metal alkoxide containing seeds in a liquid medium to cause oxidation derived from the metal alkoxide to at least part of the surface of the fluoride phosphor contained in the first heat-treated product, the second heat-treated product, or the third heat-treated product It may further comprise a synthetic step of arranging the object. In the synthesis step, the amount of the oxide disposed may be 2% by mass or more and 30% by mass or less with respect to the light-emitting material.
- a light-emitting material in which the derived oxide is arranged can be efficiently produced.
- a light-emitting device provided with a fluorescent member containing the obtained light-emitting material and resin, for example, reliability in a high-temperature environment is improved.
- an oxide derived from the metal alkoxide can be produced by solvolyzing the metal alkoxide, and the produced oxide is at least part of the surface of the fluoride phosphor contained in the second heat-treated product.
- a luminescent material is obtained which is arranged in the
- the aliphatic group of the alkoxide constituting the metal alkoxide may have, for example, 1 to 6 carbon atoms, preferably 1 to 4 carbon atoms, or 1 to 3 carbon atoms.
- the metal alkoxide contains at least one selected from the group consisting of Si, Al, Ti, Zr, Sn and Zn, and may contain at least Si.
- the metal and aliphatic group contained in the metal alkoxide may each be of only one type, or may be contained in combination of two or more types.
- metal alkoxides include tetramethoxysilane, tetraethoxysilane, tetraisopropoxysilane, trimethoxyaluminum, triethoxyaluminum, triisopropoxyaluminum, tetramethoxytitanium, tetraethoxytitanium, tetraisopropoxytitanium, and tetramethoxyzirconium.
- tetraethoxyzirconium, tetraisopropoxyzirconium, tetraethoxytin, dimethoxyzinc, diethoxyzinc and the like preferably at least one selected from the group consisting of tetramethoxysilane, tetraethoxysilane and More preferably, it is at least one selected from the group consisting of tetraisopropoxysilane.
- the metal alkoxide in the synthesis step may be used singly or in combination of two or more.
- the amount of the metal alkoxide added in the synthesis step is, in terms of oxide, the total mass of the first heat-treated product, the second heat-treated product, or the third heat-treated product, for example, 2% by mass or more and 30% by mass or less. , preferably 5% by mass or more, or 8% by mass or more, and preferably 25% by mass or less, or 20% by mass or less.
- the amount of metal alkoxide added in the synthesis step is, for example, 5% by mass or more and 110% by mass or less with respect to the total mass of the first heat-treated product, the second heat-treated product, or the third heat-treated product as the amount of metal alkoxide added. , preferably 15% by mass or more, or 25% by mass or more, and preferably 90% by mass or less, or 75% by mass or less.
- the contact between the first heat-treated product, the second heat-treated product, or the third heat-treated product and the metal alkoxide is carried out in a liquid medium.
- the liquid medium include water; alcohol solvents such as methanol, ethanol and isopropyl alcohol; nitrile solvents such as acetonitrile; and hydrocarbon solvents such as hexane.
- the liquid medium may contain at least water and an alcoholic solvent.
- the content of the alcohol-based solvent in the liquid medium may be, for example, 60% by mass or more, preferably 70% by mass or more.
- the content of water in the liquid medium may be, for example, 4% by mass or more and 40% by mass or less.
- the liquid medium may further contain a pH adjuster.
- pH adjusters that can be used include alkaline substances such as ammonia, sodium hydroxide and potassium hydroxide, and acidic substances such as hydrochloric acid, nitric acid, sulfuric acid and acetic acid.
- the pH of the liquid medium may be, for example, 1 or more and 6 or less, preferably 2 or more and 5 or less, under acidic conditions. Under alkaline conditions, it may be 8 or more and 12 or less, preferably 8 or more and 11 or less.
- the mass ratio of the liquid medium to the first heat-treated product, the second heat-treated product, or the third heat-treated product may be, for example, 100% by mass or more and 1000% by mass or less, preferably 150% by mass or more, or 180% by mass or more. and preferably 600% by mass or less, or 300% by mass or less.
- the mass ratio of the liquid medium is within the above range, there is a tendency that the fluoride phosphor can be more uniformly covered with the oxide.
- the contact between the first heat-treated product, the second heat-treated product, or the third heat-treated product and the metal alkoxide is, for example, by adding the metal alkoxide to the suspension containing the first heat-treated product, the second heat-treated product, or the third heat-treated product. It can be carried out. At this time, stirring or the like may be performed as necessary.
- the contact temperature between the first heat-treated product, the second heat-treated product, or the third heat-treated product and the metal alkoxide may be, for example, 0°C or higher and 70°C or lower, preferably 10°C or higher and 40°C or lower.
- the contact time may be, for example, from 1 hour to 12 hours.
- the contact time includes the time required for adding the metal alkoxide.
- the method for producing a luminescent material may further include, after the synthesis step, a step of recovering the luminescent material obtained in the synthesis step by solid-liquid separation, a step of drying the solid-liquid separated luminescent material, and the like.
- the method for producing a luminescent material includes the first heat-treated product, the second heat-treated product, or the third heat-treated product obtained by the above-described production method, and at least one lanthanoid selected from the group consisting of La, Ce, Dy and Gd.
- the rare earth ions and the phosphate ions are brought into contact with each other in a liquid medium to form a rare earth phosphate on at least a part of the surface of the fluoride phosphor contained in the first heat-treated product, the second heat-treated product, or the third heat-treated product. may further include a deposition step of obtaining a fluoride phosphor having attached thereto.
- At least one surface of the fluoride phosphor By contacting the fluoride phosphor contained in the first heat-treated product, the second heat-treated product, or the third heat-treated product, the rare earth ions, and the phosphate ions in a liquid medium, at least one surface of the fluoride phosphor It is possible to efficiently produce a luminescent material in which a rare earth phosphate is attached to the part. A luminescent material in which a rare earth phosphate is attached to the surface of a fluoride phosphor tends to have more improved resistance to moisture and heat.
- the fluoride phosphor, rare earth ions, and phosphate ions contained in the first heat-treated product, the second heat-treated product, or the third heat-treated product are brought into contact with each other in a liquid medium.
- a fluoride phosphor is obtained in which the rare earth phosphate is attached to the surface of the fluoride phosphor and the rare earth phosphate is attached. It is believed that by attaching the rare earth phosphate to the fluoride phosphor in a liquid medium, the rare earth phosphate is more uniformly attached to, for example, the fluoride phosphor surface.
- the liquid medium should be capable of dissolving phosphate ions and rare earth ions, and preferably contains at least water in order to facilitate dissolution of these ions.
- the liquid medium may further contain a reducing agent such as hydrogen peroxide, an organic solvent, a pH adjuster, and the like.
- organic solvents that the liquid medium may contain include alcohols such as ethanol and isopropanol.
- pH adjusters include basic compounds such as ammonia, sodium hydroxide and potassium hydroxide; and acidic compounds such as hydrochloric acid, nitric acid, sulfuric acid and acetic acid.
- the pH of the liquid medium is, for example, 1 to 6, preferably 1.5 to 4.
- the liquid medium contains water
- the content of water in the liquid medium is, for example, 70% by mass or more, preferably 80% by mass or more, and more preferably 90% by mass or more.
- the mass ratio of the liquid medium to the first heat-treated product, the second heat-treated product, or the third heat-treated product is, for example, 100% by mass or more or 200% by mass or more, and is, for example, 1000% by mass or less or 800% by mass or less.
- the mass ratio of the liquid medium is at least the above lower limit, it becomes easier to uniformly adhere the rare earth phosphate to the surface of the fluoride phosphor.
- the adhesion rate of phosphate to the fluoride phosphor tends to be further improved.
- the liquid medium preferably contains phosphate ions, more preferably water and phosphate ions.
- the first heat-treated product, the second heat-treated product, or the third heat-treated product is mixed with the liquid medium, and further mixed with a solution containing rare earth ions to obtain the first heat-treated product, the third Phosphate ions and rare earth ions can be brought into contact in a liquid medium containing the second heat-treated product or the third heat-treated product.
- the phosphate ion concentration in the liquid medium is, for example, 0.05% by mass or more, preferably 0.1% by mass or more, and for example, 5% by mass or less, preferably 3% by mass. % or less.
- the phosphate ion concentration in the liquid medium is at least the above lower limit, the amount of the liquid medium does not become too large, the elution of the composition components from the second heat-treated product or the third heat-treated product is suppressed, and the first heat-treated product and the third heat-treated product are suppressed.
- the properties of the fluoride phosphor contained in the second heat-treated product or the third heat-treated product tend to be maintained well. Further, when the content is equal to or less than the above upper limit, there is a tendency that the uniformity of deposits on the first heat-treated product, the second heat-treated product, or the third heat-treated product is improved.
- Phosphate ions include orthophosphate ions, polyphosphate (metaphosphate) ions, phosphite ions, and hypophosphite ions.
- Polyphosphate ions include linear polyphosphate ions such as pyrophosphate ions and tripolyphosphate ions, and cyclic polyphosphate ions such as hexametaphosphate ions.
- the liquid medium When the liquid medium contains phosphate ions, it may be prepared by dissolving a compound serving as a phosphate ion source in the liquid medium, or by mixing a solution containing the phosphate ion source with the liquid medium.
- Phosphate ion sources include, for example, phosphoric acid; metaphosphoric acid; alkali metal phosphates such as sodium phosphate and potassium phosphate; alkali metal hydrogen phosphates such as sodium hydrogen phosphate and potassium hydrogen phosphate; Alkali metal dihydrogen phosphates such as sodium hydrogen and potassium dihydrogen phosphate; alkali metal hexametaphosphates such as sodium hexametaphosphate and potassium hexametaphosphate; alkali metal pyrophosphates such as sodium pyrophosphate and potassium pyrophosphate; phosphoric acid and ammonium phosphate salts such as ammonium.
- the liquid medium preferably contains a reducing agent, more preferably contains water and a reducing agent, and still more preferably contains water, phosphate ions and a reducing agent.
- the reducing agent contained in the liquid medium may be capable of reducing, for example, tetravalent manganese ions eluted into the liquid medium from the first heat-treated product, the second heat-treated product, or the third heat-treated product, such as hydrogen peroxide, Examples include oxalic acid, hydroxylamine hydrochloride, and the like.
- hydrogen peroxide is preferable in that it does not adversely affect the fluoride phosphor contained in the first heat-treated product, the second heat-treated product, or the third heat-treated product because it decomposes into water.
- the liquid medium contains a reducing agent
- it may be prepared by dissolving a compound to be the reducing agent in the liquid medium, or by mixing a solution containing the reducing agent and the liquid medium.
- the content of the reducing agent in the liquid medium is not particularly limited, it is, for example, 0.1% by mass or more, preferably 0.3% by mass or more, for the reasons described above.
- rare earth elements that become rare earth ions to be brought into contact with phosphate ions include La, Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb and A lanthanoid composed of Lu can be mentioned, and at least one selected from the lanthanoids is preferable, and at least one selected from the group consisting of La, Ce, Dy and Gd is more preferable.
- the contact between the phosphate ions and the rare earth ions in the liquid medium may be carried out, for example, by dissolving a compound serving as a rare earth ion source in the liquid medium containing the phosphate ions. It may be performed by mixing with a solution containing ions.
- a solution containing rare earth ions can be prepared, for example, by dissolving a compound serving as a rare earth ion source in a solvent such as water.
- a compound that serves as a rare earth ion source is, for example, a metal salt containing a rare earth element, and examples of anions constituting the metal salt include nitrate ion, sulfate ion, acetate ion, chloride ion, and the like.
- Contacting phosphate ions and rare earth ions in a liquid medium includes, for example, mixing a liquid medium containing phosphate ions and preferably further containing a reducing agent and the first heat-treated product, the second heat-treated product, or the third heat-treated product. obtaining a slurry; and mixing the slurry and the solution comprising the rare earth ions.
- the content of rare earth ions in the liquid medium in which phosphate ions and rare earth ions are brought into contact is, for example, 0.05% by mass or more or 0.1% by mass or more, and for example, 3% by mass or less or 2% by mass or less. be.
- the content of rare earth ions in the amount of the first heat-treated product, the second heat-treated product, or the third heat-treated product in the liquid medium is, for example, 0.2% by mass or more, or 0.5% by mass or more, or, for example, 30% by mass. or less, or 20% by mass or less.
- the adhesion rate of the rare earth phosphate to the fluoride phosphor tends to be further improved. It tends to be easier to deposit the salt more uniformly on the surface of the fluoride phosphor.
- the contact temperature between the phosphate ions forming the rare earth phosphate and the rare earth ions is, for example, 10°C to 50°C, preferably 20°C to 35°C.
- the contact time is, for example, 1 minute to 1 hour, preferably 3 minutes to 30 minutes. The contact may be carried out while stirring the liquid medium.
- a separation step may be provided to separate the luminescent material containing the fluoride phosphor to which the rare earth phosphate is attached from the liquid medium. Separation can be performed by solid-liquid separation means such as filtration and centrifugation. The luminescent material obtained by solid-liquid separation may be subjected to washing treatment, drying treatment, or the like, if necessary.
- the method for producing a luminescent material includes, after the deposition step, a first heat-treated product, a second heat-treated product, or a third heat-treated product containing a fluoride phosphor to which a rare earth phosphate is attached, and Si, Al, Ti, Zr, Sn and a metal alkoxide containing at least one selected from the group consisting of Zn in a liquid medium, and the rare earth phosphate contained in the first heat-treated product, the second heat-treated product, or the third heat-treated product adhered It may further include a synthesis step of arranging an oxide derived from a metal alkoxide on at least part of the surface of the fluoride phosphor. In the synthesis step, the amount of the oxide disposed may be 2% by mass or more and 30% by mass or less with respect to the light-emitting material. The details of the synthetic steps are as described.
- the method for producing a luminescent material may include a first heat treatment step, a second heat treatment step, a pressure heat treatment step, a synthesis step, or a surface treatment step of treating the fluoride phosphor obtained in the adhesion step with a coupling agent. good. That is, the method for producing a luminescent material may include subjecting the fluoride phosphor contained in the first heat-treated product, the second heat-treated product, or the third heat-treated product to a silane coupling treatment. Further, the method for producing a light-emitting material may further include performing a silane coupling treatment after arranging an oxide derived from a metal alkoxide on at least part of the surface of the fluoride phosphor.
- the method for producing a luminescent material may further include performing a silane coupling treatment after disposing the rare earth phosphate on at least part of the surface of the fluoride phosphor.
- the method for producing a light-emitting material comprises disposing a rare earth phosphate on at least part of the surface of a fluoride phosphor, and disposing an oxide derived from a metal alkoxide on at least part of the surface of the fluoride phosphor.
- it may include performing a silane coupling treatment.
- a surface treatment layer containing functional groups derived from the coupling agent can be provided on the surface of the fluoride phosphor by bringing the fluoride phosphor and the coupling agent into contact with each other. This improves, for example, the moisture resistance of the fluoride phosphor.
- the amount of the coupling agent used in the surface treatment step may be, for example, 0.5% by mass or more and 10% by mass or less, preferably 1% by mass or more and 5% by mass or less, relative to the mass of the light-emitting material. It's okay.
- the contact temperature between the fluoride phosphor and the coupling agent may be, for example, 0° C. or higher and 70° C. or lower, preferably 10° C. or higher and 40° C. or lower.
- the contact time between the fluoride phosphor and the coupling agent may be, for example, 1 minute or more and 10 hours or less, preferably 10 minutes or more and 1 hour or less.
- a light-emitting device includes a light-emitting material containing the fluoride phosphor (hereinafter also referred to as a first light-emitting material) and a light-emitting element having an emission peak wavelength in the wavelength range of 380 nm or more and 485 nm or less.
- the light-emitting device may further include other components as necessary.
- FIG. 2 is a schematic cross-sectional view showing an example of the light emitting device according to this embodiment.
- This light emitting device is an example of a surface mount type light emitting device.
- the light-emitting device 100 includes a light-emitting element 10 that emits light having an emission peak wavelength on the short wavelength side of visible light (for example, in the range of 380 nm to 485 nm), and a molded body 40 on which the light-emitting element 10 is mounted.
- the body 40 has a first lead 20 and a second lead 30, and is integrally molded of thermoplastic resin or thermosetting resin.
- a light emitting element 10 is mounted on the bottom surface of the recess, and the light emitting element 10 has a pair of positive and negative electrodes, and the pair of positive and negative electrodes are a first lead 20 and a second lead 30. and are electrically connected via a wire 60.
- the light emitting element 10 is covered in the recess with a fluorescent member 50.
- the fluorescent member 50 is a wavelength conversion material 70 that converts the wavelength of the light from the light emitting element 10.
- the fluorescent member 50 includes the first light emitting material as the wavelength converting material and a wavelength range different from the first light emitting material by the excitation light from the light emitting element 10 may contain a second light-emitting material that emits light having an emission peak wavelength.
- the fluorescent member may contain a resin and a wavelength conversion material.
- the resin constituting the fluorescent member include silicone resin and epoxy resin.
- the fluorescent member may further contain a light diffusing material in addition to the resin and the wavelength conversion material. By containing the light diffusing material, the directivity from the light emitting element can be relaxed and the viewing angle can be increased.
- light diffusing materials include silicon oxide, titanium oxide, zinc oxide, zirconium oxide, and aluminum oxide.
- the light emitting element emits light having an emission peak wavelength in the wavelength range of 380 nm or more and 485 nm or less, which is the short wavelength region of visible light.
- the light emitting element may be an excitation light source that excites the fluoride phosphor.
- the light-emitting element preferably has an emission peak wavelength in the range of 380 nm or more and 480 nm or less, more preferably 410 nm or more and 480 nm or less.
- a semiconductor light-emitting element is preferably used as the light-emitting element as the excitation light source.
- a semiconductor light-emitting element As an excitation light source, it is possible to obtain a stable light-emitting device with high efficiency, high output linearity with respect to input, and resistance to mechanical impact.
- the semiconductor light emitting device for example, a semiconductor light emitting device using a nitride semiconductor can be used.
- the half width of the emission peak in the emission spectrum of the light emitting element is preferably, for example, 30 nm or less.
- a light-emitting device in which an excitation light source is covered with a fluorescent member containing a first light-emitting material, part of the light emitted from the excitation light source is absorbed by the first light-emitting material containing a fluoride phosphor, and is emitted as red light. be done.
- an excitation light source that emits light having an emission peak wavelength in the range of 380 nm or more and 485 nm or less, the radiated light can be used more effectively, and the loss of light emitted from the light emitting device can be reduced. and a highly efficient light emitting device can be provided.
- the light-emitting device further includes, in addition to the first light-emitting material containing the fluoride phosphor, a second light-emitting material containing a phosphor other than the fluoride phosphor.
- a phosphor other than the fluoride phosphor may be used as long as it absorbs light from the light source and converts the wavelength into light of a wavelength different from that of the fluoride phosphor.
- the second luminescent material can be contained in the fluorescent member, for example, in the same manner as the first luminescent material.
- the second light-emitting material may have an emission peak wavelength in the wavelength range of 495 nm or more and 590 nm or less, and is preferably a ⁇ -sialon phosphor, a halosilicate phosphor, a silicate phosphor, a rare earth aluminate phosphor, or a perovskite-based light-emitting material. At least one selected from the group consisting of materials and nitride phosphors may be included.
- the ⁇ -sialon phosphor may have, for example, a composition represented by formula (IIa) below.
- the halosilicate phosphor may have, for example, a composition represented by formula (IIb) below.
- the silicate phosphor may have, for example, a composition represented by formula (IIc) below.
- the rare earth aluminate phosphor may have a composition represented by the following formula (IId).
- the perovskite-based luminescent material may have, for example, a composition represented by the following formula (IIe).
- the nitride phosphor may have, for example, a composition represented by the following formula (IIf), (IIg) or (IIh).
- the luminescent material or the luminescent material of a fluoride phosphor having the first composition, a cubic crystal structure, and a lattice constant of 0.8138 nm or more includes use in the manufacture of devices. Also includes the use of a fluoride phosphor having the first composition and having an absorption peak in the wave number range of 590 cm ⁇ 1 or more and 610 cm ⁇ 1 or less in the infrared absorption spectrum in the manufacture of the light emitting material or the light emitting device. do. It further encompasses the use of said luminescent material in the manufacture of said luminescent device.
- Production Example 1 Production of First Fluoride Particles 7029 g of KHF 2 was weighed and dissolved in 38.5 L of 55% by mass HF aqueous solution to prepare a first solution. Also, 1049.7 g of K 2 MnF 6 was weighed, and this K 2 MnF 6 was dissolved in 12.0 L of 55% by mass HF aqueous solution to prepare a second solution. Subsequently, 15.5 L of an aqueous solution containing 40% by mass of H 2 SiF 6 was prepared to prepare a third solution. Next, the first solution was added dropwise to the second and third solutions over a period of about 20 hours while stirring at room temperature.
- the resulting first fluoride particles had a composition represented by K 2 [Si 0.949 Mn 0.051 F 6 ].
- Example 1 The first fluoride particles having a composition represented by K 2 [Si 0.949 Mn 0.051 F 6 ] produced in Production Example 1 and the second fluoride particles having a composition represented by K 3 [AlF 6 ] 2200 g of the first fluoride particles and 7.76 g of the second fluoride particles were weighed so that the ratio of the number of moles of the second fluoride particles to the total number of moles of the fluoride particles was 0.003. , were mixed to prepare a mixture of the first fluoride particles and the second fluoride particles.
- the mixture of the first fluoride particles and the second fluoride particles is subjected to the first heat treatment at a temperature of 700 ° C. and a heat treatment time of 5 hours. to obtain the first heat-treated product.
- the obtained first heat-treated product was sufficiently washed with washing water containing 1% by mass of hydrogen peroxide.
- the first heat-treated product after cleaning is brought into contact with fluorine gas in an atmosphere having a fluorine gas (F 2 ) concentration of 20% by volume and a nitrogen gas concentration of 80% by volume, and the temperature is set to 500° C. for a heat treatment time.
- a second heat treatment was performed for 5 hours to produce the luminescent material of Example 1.
- the heat treatment time in the first heat treatment and the second heat treatment is the time elapsed from reaching a predetermined heat treatment temperature to stopping the heating.
- the luminescent material of Example 1 had a composition represented by K 2 [Si 0.948 Al 0.002 Mn 0.050 F 5.998 ].
- Comparative example 1 The first fluoride particles having the composition represented by K 2 [Si 0.949 Mn 0.051 F 6 ] produced in Production Example 1 were mixed with the first fluoride particles without mixing the second fluoride particles. A luminescent material was produced under the same conditions as in Example 1, except that only compound particles were used. The luminescent material of Comparative Example 1 had a composition represented by K 2 [Si 0.950 Mn 0.050 F 6 ].
- Example 2 The mass of the second fluoride particles is 15.57 g so that the ratio of the number of moles of the second fluoride particles to the total number of moles of the first fluoride particles and the second fluoride particles is 0.006.
- a light-emitting material was produced under the same conditions as in Example 1, except that it was changed to .
- the luminescent material of Example 2 had a composition represented by K 2 [Si 0.946 Al 0.005 Mn 0.049 F 5.995 ].
- Example 3 The mass of the second fluoride particles is 23.43 g so that the ratio of the number of moles of the second fluoride particles to the total number of moles of the first fluoride particles and the second fluoride particles is 0.009.
- a light-emitting material was produced under the same conditions as in Example 1, except that it was changed to .
- the luminescent material of Example 3 had a composition represented by K 2 [Si 0.942 Al 0.008 Mn 0.050 F 5.992 ].
- Example 4 The mass of the second fluoride particles is 39.28 g so that the ratio of the number of moles of the second fluoride particles to the total number of moles of the first fluoride particles and the second fluoride particles is 0.015.
- a light-emitting material was produced under the same conditions as in Example 1, except that it was changed to .
- the luminescent material of Example 4 had a composition represented by K 2 [Si 0.939 Al 0.014 Mn 0.047 F 5.986 ].
- Example 5 The mass of the second fluoride particles is 55.33 g so that the ratio of the number of moles of the second fluoride particles to the total number of moles of the first fluoride particles and the second fluoride particles is 0.021.
- a light-emitting material was produced under the same conditions as in Example 1, except that it was changed to .
- the luminescent material of Example 5 had a composition represented by K 2 [Si 0.933 Al 0.018 Mn 0.049 F 5.982 ].
- Relative Luminance Based on the emission spectrum data measured for each of the luminescent materials of Examples and Comparative Examples, the luminance of the luminescent materials of Examples 1 to 5 is calculated based on the luminance of the luminescent material of Comparative Example 1 as 100%. I asked as Table 1 shows the results.
- composition analysis was performed by inductively coupled plasma atomic emission spectrometry (ICP-AES), and the molar content of each element when potassium contained in the composition was 2 mol. A ratio was calculated. Table 1 shows the results.
- the angle of repose was measured using a D powder property measuring instrument (product name: ABD-100, manufactured by Tsutsui Rikagaku Kikai Co., Ltd.), and the angle of repose was obtained from the average value of two measurements. Table 1 shows the results.
- A.D. B The bulk density was measured three times using a D powder property measuring instrument (product name: ABD-100 type, manufactured by Tsutsui Rikagaku Kikai Co., Ltd.), and the arithmetic mean value of the measured values was taken as the bulk density. Table 1 shows the results.
- the luminescent materials of Examples have higher luminance than the luminescent materials of Comparative Examples. This is presumed to be due to the effect of reducing F vacancies by substituting a portion of Si in the crystal structure with Al in the light-emitting materials of Examples. Further, in the light-emitting materials of Examples, the lattice constant increases as the amount of Al increases. It is considered that this suggests that Si in the crystal structure is substituted with Al.
- Infrared spectroscopy For the fluoride phosphor luminescent materials of the obtained examples and comparative examples, using a Fourier transform infrared spectrometer (JASCO; FT-IR-6200), total reflection ( An infrared absorption spectrum was measured by the ATR) method.
- FIG. 3 shows enlarged portions of the infrared absorption spectra of the luminescent materials of Examples 1 to 5 and Comparative Example 1.
- FIG. 6 shows infrared absorption spectra of the first fluoride particles and the second fluoride particles.
- the luminescent material of the example showed a characteristic absorption peak in the wave number range of 590 cm ⁇ 1 to 610 cm ⁇ 1 .
- no such absorption peak was observed in the luminescent material of the comparative example. This is considered to suggest that part of Si in the crystal structure is substituted with Al in the light-emitting materials of Examples.
- the luminescent material of Example 3 shown in FIG. 5 has fine steps on the particle surface. It is presumed that this made it difficult for the particles to agglomerate, resulting in a smaller angle of repose. Due to such a state of the particle surface of the luminescent material, as shown in Table 1, the luminescent materials of the examples have a greater degree of dispersion and bulk density than the luminescent materials of the comparative examples. In the fluoride phosphors of Examples 1 to 5, the higher the Al content, the higher the degree of dispersion and the bulk density.
- Example 1 Light Emitting Device
- a ⁇ -sialon phosphor having a composition represented by Si 5.81 Al 0.19 O 0.19 N 7.81 :Eu and having an emission peak wavelength near 540 nm was used as the second light-emitting material.
- a resin is obtained by mixing a phosphor 70 in which the first light-emitting material and the second light-emitting material are blended so that x is 0.280 and y is near 0.270 in the chromaticity coordinates in the CIE 1931 color system, and a silicone resin.
- a composition was obtained.
- the electrodes of the light emitting element 10 and the first lead 20 and the second lead 30 were connected with wires 60, respectively. Further, a resin composition was injected into the concave portion of the molded body 40 using a syringe so as to cover the light emitting element 10 , and the resin composition was cured to form a fluorescent member, thereby manufacturing the light emitting device 1 .
- Relative Luminous Flux Using a total luminous flux measuring device using an integrating sphere, the luminous flux of the light-emitting device 1 using the luminescent material of Example 3 or Comparative Example 1 was measured. The luminous flux of the light-emitting device 1 using the luminescent material of Example 3 was determined as the relative luminous flux, with the luminous flux of the light-emitting device 1 using the fluoride phosphor according to Comparative Example 1 set to 100%. Table 2 shows the results.
- the light-emitting device using the light-emitting material of Example 3 compared with the light-emitting device using the light-emitting material of Comparative Example 1, uses a light-emitting material with a higher luminance, resulting in a relative luminous flux of improved.
- Comparative example 2 A second theoretical composition represented by K 2 SiF 6 :Mn having a Mn content of 1.5% by mass (hereinafter sometimes abbreviated as “KSF”) was obtained by the same method as in Production Example 1.
- KSF K 2 SiF 6 :Mn having a Mn content of 1.5% by mass
- Comparative example 3 The fluoride phosphor produced in Comparative Example 2 was brought into contact with fluorine gas in an atmosphere having a fluorine gas (F 2 ) concentration of 20% by volume and a nitrogen gas concentration of 80% by volume, and the temperature was set to 500 ° C. A second heat treatment was performed with the heat treatment set to 8 hours to obtain a light-emitting material of Comparative Example 3 having a Mn content of 1.5% by mass and a second theoretical composition represented by K 2 SiF 6 :Mn. rice field.
- F 2 fluorine gas
- Example 6 First fluoride particles, which are phosphors having a Mn content of 1.1% by mass and a second theoretical composition represented by K 2 SiF 6 :Mn, were obtained by the same method as in Production Example 1. .
- the ratio of the number of moles of the second fluoride particles to the total number of moles of the obtained first fluoride particles and the second fluoride particles having the composition represented by K 3 [AlF 6 ] is 0.01
- the first fluoride particles and the second fluoride particles were weighed and mixed to prepare a mixture.
- the mixture was subjected to a first heat treatment in an inert gas atmosphere with a nitrogen gas concentration of 100% by volume at a temperature of 700° C. for a heat treatment time of 5 hours to obtain a first heat treated product.
- the obtained first heat-treated product was thoroughly washed with washing water containing 1% by mass of hydrogen peroxide, and the Mn content was 1.1% by mass and the K 2 Si 0.99 Al 0.01 F 5
- the luminescent material of Example 6 was obtained as a fluoride phosphor having a first theoretical composition represented by .99 :Mn.
- Example 7 A liquid medium 1 was prepared by dissolving 6.7 g of KHF 2 in 33.3 g of a 55% aqueous hydrofluoric acid solution. Liquid medium 1 and 50 g of the fluoride phosphor produced in Example 6 were placed in an autoclave coated with a fluororesin, and heat-pressurized at 170° C. and about 7.5 MPa for 8 hours. The obtained heat-pressurized product was thoroughly washed with washing water containing 1% by mass of hydrogen peroxide, and after solid-liquid separation, washing with ethanol was performed, and drying was performed at 90°C for 10 hours to give the product of Example 7. A luminescent material was obtained.
- Example 8 A first fluoride particle having a second theoretical composition represented by K 2 SiF 6 :Mn with a Mn content of 1.1 mass % was obtained by the above method. The first heat treatment and washing were performed in the same manner as in Example 6 except that the obtained first fluoride particles were used to obtain fluoride particles, which are phosphors having the first theoretical composition.
- Example 9 A first fluoride particle having a second theoretical composition represented by K 2 SiF 6 :Mn with a Mn content of 1.6% by mass was obtained by the method described above. The first heat treatment, washing, and second heat treatment were performed in the same manner as in Example 8 except that the obtained first fluoride particles were used, and the Mn content was 1.5% by mass. A luminescent material of Example 9, which is a fluoride phosphor having a first theoretical composition represented by K 2 Si 0.99 Al 0.01 F 5.99 :Mn, was obtained.
- Example 10 To 150.0 g of an aqueous sodium salt solution of phosphoric acid (phosphoric acid concentration: 2.4% by mass), 15.0 g of 35% by mass hydrogen peroxide solution and 735.0 g of pure water were added, and 300 g of the fluoride phosphor produced in Example 9 was added while stirring at several 400 rpm and then at room temperature to prepare a phosphor slurry.
- a lanthanum nitrate aqueous solution prepared by dissolving 23.4 g of lanthanum nitrate dihydrate in 156.6 g of pure water was added dropwise to the phosphor slurry over about 1 minute. After about 30 minutes from the completion of dropping, stirring was stopped and the mixture was allowed to stand. The obtained precipitate was subjected to solid-liquid separation, washed with ethanol, and dried at 90° C. for 10 hours to prepare a luminescent material of Example 10 having lanthanum phosphate arranged on the surface.
- Example 11 A luminescent material of Example 11 having lanthanum phosphate arranged on the surface thereof was produced in the same manner as in Example 10 except that the fluoride phosphor produced in Example 8 was used.
- Example 12 A first fluoride particle having a second theoretical composition represented by K 2 SiF 6 :Mn with a Mn content of 1.3% by mass was obtained by the method described above. The first heat treatment, washing, and second heat treatment were performed in the same manner as in Example 8 except that the obtained first fluoride particles were used. A fluoride phosphor , which is a phosphor having a first theoretical composition represented by 2Si0.99Al0.01F5.99 :Mn , was obtained. A luminescent material of Example 12 having lanthanum phosphate arranged on the surface was prepared in the same manner as in Example 10, except that the obtained fluoride phosphor having the first theoretical composition was used.
- Comparative example 4 A luminescent material of Comparative Example 4 having lanthanum phosphate arranged on the surface thereof was produced in the same manner as in Example 10 except that the fluoride phosphor produced in Comparative Example 3 was used.
- Example 13 100 g of the fluoride phosphor produced in Example 6 was weighed, added to a mixed solution of 180 ml of ethanol, 43.4 ml of ammonia water containing 16.5% by mass of ammonia, and 20 ml of pure water, and stirred. While stirring at 300 rpm using a wing, the liquid temperature was kept at room temperature to obtain a reaction mother liquid. 35.7 g of tetraethoxysilane (TEOS: Si(OC 2 H 5 ) 4 ) was weighed and added dropwise to the stirred reaction mother liquor over about 3 hours. After that, stirring was continued for 1 hour, and after adding 10 g of 35% by mass hydrogen peroxide (H 2 O 2 ), the stirring was stopped.
- TEOS tetraethoxysilane
- Example 13 covered with silicon dioxide (SiO 2 ).
- the amount of tetraethoxysilane dropped was about 10% by mass in terms of silicon dioxide with respect to the fluoride particles.
- Example 14 A luminescent material of Example 14 was produced in the same manner as in Example 13 except that the fluoride phosphor produced in Example 7 was used.
- Example 15 300 g of the fluoride phosphor produced in Example 8 was weighed, put into a solution obtained by mixing 540 ml of ethanol, 130.2 ml of ammonia water containing 16.5% by mass of ammonia, and 60 ml of pure water, and stirred with a stirring blade. While stirring at a rotation speed of 350 rpm using A luminescent material of Example 15 was produced in the same manner as in Example 13, except that the silane was dropped for 6 hours. It was about 10% by mass in terms of silicon dioxide with respect to fluoride particles.
- Example 16 A luminescent material of Example 16 was produced in the same manner as in Example 15 except that the fluoride phosphor produced in Example 9 was used and the stirring speed was set to 500 rpm.
- Example 17 A luminescent material of Example 17 was produced in the same manner as in Example 16 except that the fluoride phosphor produced in Example 10 was used.
- Example 18 50 g of the luminescent material prepared in Example 17 was weighed. Next, 84.9 ml of ethanol, 5.8 ml of pure water, and decyltrimethoxysilane ((CH 3 O) 3 Si(CH 2 ) 9 CH 3 )) as a silane coupling agent were mixed. After stirring for 20 minutes, the mixture was allowed to stand for 20 hours or longer. The fluoride phosphor E10 produced in Example 10 was put into this solution, and after stirring at 200 rpm for 1 hour, the stirring was stopped. The obtained precipitate was subjected to solid-liquid separation and then dried at 105° C. for 10 hours for silane coupling treatment to obtain a luminescent material of Example 18.
- Example 19 A luminescent material of Example 19 was obtained in the same manner as in Example 15, except that the amount of tetraethoxysilane added was 64.3 g.
- Example 20 A luminescent material of Example 20 was obtained in the same manner as in Example 15, except that the amount of tetraethoxysilane added was 32.2 g.
- Example 21 A fluoride phosphor E16 of Example 21 was produced in the same manner as in Example 15 except that the luminescent material produced in Example 11 was used.
- Example 22 A luminescent material of Example 22 was produced in the same manner as in Example 18 except that the luminescent material produced in Example 21 was used.
- Example 23 A luminescent material was obtained in the same manner as in Example 19, except that the luminescent material produced in Example 12 was used. The resulting luminescent material was subjected to silane coupling treatment in the same manner as in Example 18, except that hexyltrimethoxysilane was used as the silane coupling agent, to obtain a luminescent material of Example 23.
- Example 24 A luminescent material of Example 24 was obtained in the same manner as in Example 23, except that vinyltrimethoxysilane was used as the silane coupling agent.
- Example 25 A luminescent material of Example 25 was obtained in the same manner as in Example 23, except that 3-aminopropyltriethoxysilane was used as the silane coupling agent.
- Example 26 A luminescent material of Example 26 was obtained in the same manner as in Example 23, except that 3-glycidoxypropyltrimethoxysilane was used as the silane coupling agent.
- Infrared spectroscopy For the obtained luminescent materials of Example 6 and Comparative Examples 2 and 3, using a Fourier transform infrared spectrometer iS (manufactured by Thermo Fisher Scientific), An infrared absorption spectrum was measured by a diffuse reflectance method with a KBr background. Correction was performed using the value at 4000 cm ⁇ 1 as a baseline, Kubelka-Munk transformation was performed, and the absorption spectrum was measured by normalization with the maximum peak.
- iS Fourier transform infrared spectrometer
- the integral areas (IR peak areas) of the peaks were obtained. Furthermore, the IR peak area ratio Z1 was obtained as an area ratio represented by the following formula (P). Note that the peak area at 3500 cm -1 or more and 3800 cm -1 is obtained using a straight line connecting the intensity at 3000 cm -1 and the intensity at 3800 cm -1 as the background, and the peak area at 1050 cm -1 or more and 1350 cm -1 or less is 1050 cm -1. The area was determined using a straight line connecting the intensities at .
- X-ray fluorescence elemental analysis XRF evaluation
- an XRF device product name: ZSX PrimusII, manufactured by Rigaku Corporation
- XRF X-Ray Fluorescence Spectrometry
- the peak intensity ratio of the luminescent material of Example 16 was calculated as a relative value with the peak intensity of the fluoride phosphor of Example 9 being 100.
- the average thickness of the silicon dioxide film in the luminescent material of Example 16 was calculated from the obtained peak intensity ratio using the CXRO (The Center for X-Ray Optics) database. Table 3 shows the results.
- Example 17 (4) Scanning Electron Microscope Observation Image observation of the obtained luminescent material of Example 17 was performed using a scanning electron microscope (SEM). A SEM image is shown in FIG. Furthermore, for the luminescent material of Example 17, an arbitrary cross section was observed using a scanning electron microscope (SEM), and the average thickness of the silicon dioxide film was measured by image analysis. Specifically, a plurality of luminescent material particles were embedded in a resin, a cross-sectional sample was prepared by ion milling, and the cross-sectional observation of the luminescent material particles was made possible with a scanning electron microscope. A cross-sectional SEM image is shown in FIG.
- SEM scanning electron microscope
- the thickness of the silicon dioxide film was measured at 5 locations per luminescent material particle, and the measured average thickness was calculated as the arithmetic average of the thicknesses at a total of 25 locations for 5 particles.
- the thickness of the silicon dioxide film here means the thickness of the film that can be seen on the SEM image, including the portion where the film is cut obliquely to the thickness direction. Table 4 shows the results.
- a resin composition was prepared by mixing a silicone resin with a light-emitting material in an amount of 33% by mass based on the silicone resin. About 1 g of the obtained resin composition was weighed onto an aluminum foil and cured, and then the difference between the mass of the cured resin composition and the mass of the aluminum foil was calculated and used as the initial value. The resin composition cured on the aluminum foil was left to stand in a small oven (product name: constant temperature and humidity chamber LH-114, manufactured by Espec Co., Ltd.) maintained at 200 ° C. After 100 hours, 300 hours, and 500 hours.
- a small oven product name: constant temperature and humidity chamber LH-114, manufactured by Espec Co., Ltd.
- silicone resins selected from commercially available silicone resins were used. Specifically, for Examples 6 to 26 and Comparative Examples 2, 3, and 4, Shin-Etsu Chemical Co., Ltd. dimethyl silicone resin (product name KER-2936; refractive index 1.41, hereinafter "dimethyl silicone resin 1" ) was used for evaluation. Further, for Examples 15, 21 and Comparative Example 3, Dow Corning Toray Co., Ltd.
- dimethyl silicone resin (trade name OE-6351; refractive index 1.41, hereinafter referred to as "dimethyl silicone resin 2”), Toray ⁇ Phenyl silicone resin manufactured by Dow Corning Co., Ltd. (trade name OE-6630; refractive index 1.53, hereinafter referred to as “phenyl silicone resin 1”) and a phenyl silicone resin having a different refractive index from the above phenyl silicone resin 1 (refractive ratio 1.50, hereinafter referred to as "phenyl silicone resin 2").
- the luminescent materials of Examples 6 to 10, 16 to 18 and Comparative Examples 2 to 4 were used as the first luminescent material.
- a ⁇ -sialon phosphor having a composition represented by Si 5.81 Al 0.19 O 0.19 N 7.81 :Eu and having an emission peak wavelength near 540 nm was used as the second light-emitting material.
- a silicone resin is mixed with a luminescent material 70 containing a first luminescent material 71 and a second luminescent material 72 so that x is about 0.280 and y is about 0.270 in the chromaticity coordinates in the CIE 1931 color system.
- a resin composition was obtained.
- a molded body 40 having a concave portion is prepared, and a light emitting element 10 made of a gallium nitride-based compound semiconductor having an emission peak wavelength of 451 nm is placed on the first lead 20 on the bottom surface of the concave portion.
- the ten electrodes, the first lead 20 and the second lead 30 were connected with wires 60, respectively.
- a resin composition was injected into the concave portion of the molded body 40 using a syringe so as to cover the light emitting element 10 , and the resin composition was cured to form a fluorescent member, thereby manufacturing the light emitting device 2 .
- the luminescent materials of Examples 11, 12, 15, 19 to 26 and Comparative Example 4 were used as the first luminescent material.
- a combination of phosphors was used.
- a luminescent material 70 containing a first luminescent material 71 and a second luminescent material 72 are blended so that x is 0.459 and y is about 0.411 in the chromaticity coordinates in the CIE 1931 color system, and a silicone resin is mixed.
- a light-emitting device 3 was manufactured in the same manner as in Light-Emitting Device Manufacturing Example 1, except that the resin composition was obtained.
- Durability evaluation 1 Light emitting device 2 using each luminescent material obtained in Examples 9, 10, 16 to 18 and Comparative Examples 3 and 4, and each luminescent material obtained in Examples 12, 23 to 26 A durability test 1 was performed by storing the used light-emitting device 3 in an environmental tester at a temperature of 85° C. and a relative humidity of 85% for 500 hours.
- the luminous flux maintenance factor 1 (%) of the light-emitting device after the durability test 1 was obtained when the luminous flux of the light-emitting device before the durability test 1 was taken as 100%.
- Durability evaluation 2 The light-emitting device 3 using each of the light-emitting materials obtained in Examples 11, 12, 15, 19 to 26 and Comparative Example 4 was tested in an unhumidified environmental tester at a temperature of 85°C at a current value of 150 mA at 1000 A durability test 2 was performed by time-driving.
- the luminous flux maintenance factor 2 (%) of the light-emitting device after the durability test 2 was obtained when the luminous flux of the light-emitting device before the durability test 2 was taken as 100%.
- the higher the luminous flux maintenance factor 2 the better the durability against high heat.
- Durability test 3 The light-emitting devices 2 using the respective light-emitting materials obtained in Examples 6 to 8 and Comparative Examples 2 and 3 were tested in an unhumidified environmental tester at a temperature of 85°C at a current value of 150 mA for 100 hours and 500 hours. The x value in the chromaticity coordinates when driven was measured. When the chromaticity coordinate x at 100 hours was taken as the initial value, the amount of change in x at 500 hours was defined as ⁇ x. A smaller ⁇ x indicates better color stability against high heat. Table 3 shows the results.
- the SiO 2 analytical values of the luminescent materials of Examples 15, 19 and 20 increased with increasing SiO 2 charge.
- the peak intensity ratio of the F element K ⁇ line by XRF in the luminescent material of Example 16 was reduced to 42 with respect to the peak intensity of 100 of the luminescent material of Example 9. From this, it is considered that the K ⁇ ray of the F element is absorbed by the SiO 2 film, and the SiO 2 is considered to cover the surface of the fluoride particles as a film. Also, the film thickness of the SiO 2 film was calculated to be 0.45 ⁇ m from the absorptance.
- the light-emitting material (KSAF) having the first theoretical composition of Example 6 had a smaller FT-IR peak area ratio (Z1) than the light-emitting material having the second theoretical composition (KSF) of Comparative Example 2.
- the light-emitting devices 2 using the light-emitting materials (KSAF) of Examples 6 to 8 had smaller ⁇ x. From this, it can be seen that KSAF has less —OH groups on the particle surface even without the second heat treatment, and is superior to KSF in color stability in a light-emitting device.
- KSAF is excellent in color stability in the first heat-treated product, the second heat-treated product, and the third heat-treated product.
- the resin compositions containing the luminescent materials having SiO 2 films of Examples 13 to 16 had a higher mass retention rate, It was excellent due to the durability of the resin composition.
- the mass retention rate of the resin composition at 1000 hours was further improved in Examples 19 and 15, in which the average thickness of the SiO2 film was thick, compared to Example 20, in which the average thickness of the SiO2 film was thin. It can be seen that the durability of the resin composition is further improved.
- the light-emitting device 2 using the light-emitting material of Comparative Example 16 had a higher luminous flux maintenance factor 1 and was superior in durability. From this, it can be seen that the use of the fluoride phosphor coated with the SiO 2 film exhibits higher durability in the light emitting device as well.
- FIG. 7 A SEM image of the luminescent material obtained in Example 17 observed with a scanning electron microscope is shown in FIG. From FIG. 7, it can be seen that the form of silicon dioxide covering the fluoride particles having the KSAF theoretical composition is not particles but a continuous film.
- FIG. 8 shows an image of a cross section of the luminescent material obtained in Example 17 observed with a scanning electron microscope.
- gray portions correspond to fluoride particles 2
- white portions correspond to lanthanum phosphate 4
- dark gray portions correspond to silicon dioxide 6 . From this, it can be seen that lanthanum phosphate 4 adheres to fluoride particles 2 and is further covered with silicon dioxide 6 .
- the TC analysis values of the luminescent materials of Examples 18 and 22 to 26 were higher than those of the luminescent material of Comparative Example 4, confirming the presence of carbon. Since this carbon is considered to be derived from the silane coupling agent, by subjecting the fluoride phosphor covered with SiO 2 to the silane coupling treatment, a component derived from the silane coupling agent is formed on the surface of the fluoride phosphor. It is considered to adhere.
- the luminescent material of Example 17 covered with a SiO film has a quantum efficiency retention rate in durability evaluation and a resin composition
- the mass retention rate of both increased, and the durability of the light-emitting material and the resin composition was superior.
- Example 17 with lanthanum phosphate attached has a higher quantum efficiency retention rate than Example 16 with no lanthanum phosphate attached, and the surface of the phosphor with lanthanum phosphate attached is covered with SiO 2 . This resulted in a higher effect. That is, even in the fluoride phosphor to which lanthanum phosphate was adhered, the effect of improving the durability was obtained by covering it with the SiO 2 film.
- the light-emitting device 2 using the light-emitting materials of Examples 17 and 18 Compared to the light-emitting device 2 using the light-emitting material of Example 10, the light-emitting device 2 using the light-emitting materials of Examples 17 and 18 exhibited further improvement in durability. Even for particles, the effect of improving durability was obtained by covering them with a SiO 2 film.
- the light-emitting material was most sedimented in the light-emitting device 2 using the light-emitting material of Example 18 subjected to silane coupling treatment. It is believed that the silane coupling treatment improved the affinity with the resin, making it easier for the luminescent material to settle.
- the luminescent materials of Examples 15 and 21 had higher quantum efficiency retention rates than the luminescent material of Comparative Example 3. Further, in the luminescent materials of Examples 15 and 21, the mass retention rate of the resin composition was higher than that of the luminescent material of Comparative Example 3, and the durability of the resin composition was excellent. In the phenyl silicone resins 1 and 2, even the fluoride particles of Comparative Example 3 had high mass retention rates, but Examples 15 and 21 had even higher mass retention rates. When the dimethyl silicone resins 1 and 2 were used, the mass retention rate of the light-emitting material of Comparative Example 3 was greatly reduced, but in Examples 15 and 21, the mass retention rate was high.
- Example 21 the mass retention rate of Example 21 was higher, and a higher effect was obtained by covering the surface of the phosphor to which lanthanum phosphate was attached with the SiO 2 film.
- Example 15 in which the fluoride particles having KSAF in the composition were covered with a SiO film, and the phosphor to which lanthanum phosphate was attached.
- the luminescent materials of Examples 15 and 19 to 22 had higher quantum efficiency retention rates than the luminescent material of Comparative Example 4. The mass retention rate of the resin composition was also increased, and the durability of the resin composition was excellent.
- the light-emitting device 3 using the light-emitting materials of Examples 15 and 19 to 22 had a higher luminous flux maintenance factor 2 than the light-emitting device 3 using the light-emitting material of Example 11, and was superior in durability.
- the light-emitting device 3 using the light-emitting materials of Examples 21 and 22 uses a light-emitting material in which the surface of the phosphor to which lanthanum phosphate is attached is covered with SiO 2 , and these use the light-emitting material of Example 15.
- the luminescent materials of Examples 23 to 26 had higher quantum efficiency retention rates than the luminescent material of Example 12.
- the mass retention rate of the resin composition is also higher, the durability as a powder is excellent, and it is considered that the affinity with the resin is improved by the silane coupling treatment.
- the light-emitting devices using the light-emitting materials of Examples 23, 24 and 26 had a higher luminous flux maintenance factor 1 than the light-emitting device using the light-emitting material of Example 12.
- the light-emitting devices using the light-emitting materials of Examples 23 to 26 had a higher luminous flux maintenance factor 2 than the light-emitting device using the light-emitting material of Example 12. This factor can be considered, for example, as follows.
- the silane coupling agent In the silane coupling agent, the methoxy group or ethoxy group hydrolyzes to form a hydrogen bond with the —OH group on the surface of the phosphor, which is then chemically bonded by heating. Therefore, the silane coupling agent is difficult to bind to the KSAF composition fluoride particles having few —OH groups on the surface. On the other hand, it is thought that many —OH groups are present on the surface of the fluoride phosphor in which the fluoride particles are covered with SiO 2 , which makes it easier for the silane coupling agent to bond, further improving the affinity with the resin. Therefore, it is considered that the above-mentioned effect was obtained.
- the surface of the phosphor to which lanthanum phosphate is attached is covered with SiO 2 .
- This lanthanum phosphate further improves the adhesion of the SiO2 film, and by further suppressing cracking and peeling of the coating layer, the silane coupling agent is more likely to bond uniformly, and the affinity with the resin is further improved. It is thought that
- Fluoride phosphors and light-emitting materials obtained by the production method of the present disclosure are particularly used in light-emitting devices using light-emitting diodes as excitation light sources, for example, light sources for illumination, light sources for LED displays or liquid crystal backlight applications, traffic lights , illuminated switches, various sensors, various indicators, small strobes, and the like.
- excitation light sources for example, light sources for illumination, light sources for LED displays or liquid crystal backlight applications, traffic lights , illuminated switches, various sensors, various indicators, small strobes, and the like.
- Japanese Patent Application No. 2021-091754 (filed date: May 31, 2021), Japanese Patent Application No. 2021-130074 (filed date: August 6, 2021), Japanese Patent Application No. 2021-141629 (filed Date: August 31, 2021) and Japanese Patent Application No. 2022-083514 (filing date: May 23, 2022) are incorporated herein by reference in their entirety. All publications, patent applications and technical standards mentioned herein are to the same extent as if each individual publication, patent application and technical standard were specifically and individually noted to be incorporated by reference. incorporated herein by reference.
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Abstract
Description
発光材料は、カリウム(K)を含むアルカリ金属と、ケイ素(Si)と、アルミニウム(Al)と、マンガン(Mn)と、フッ素(F)とを含む第一の組成を有するフッ化物蛍光体を含む。フッ化物蛍光体は、立方晶系の結晶構造を有し、格子定数が0.8138nm以上である。またフッ化物蛍光体は、赤外吸収スペクトルにおいて590cm-1以上610cm-1以下の波数範囲に吸収ピークを有する。第一の組成は、アルカリ金属の総モル数を2とする場合に、SiとAlとMnの総モル数が0.9以上1.1以下であり、Alのモル数が0を超えて0.1以下であり、Mnのモル数が0を超えて0.2以下であり、Fのモル数が5.5以上6.0未満である。フッ化物蛍光体が含むMnは4価のMnイオンを含んでいてよい。フッ化物蛍光体は、例えば、後述するフッ化物蛍光体の製造方法で製造することができる。
M2[SipAlqMnrFs] (I)
M2(Si,Al)F6:Mn (Ia)
図1は、発光材料の製造方法の工程の一例を示すフローチャートである。発光材料の製造方法は、第一のフッ化物粒子を準備すること(S101)と、第二のフッ化物粒子を準備すること(S102)と、第一の熱処理をして第一熱処理物を得ること(S103)とを含んでいてよい。第一のフッ化物粒子を準備すること(S101)と、第二のフッ化物粒子を準備すること(S102)とはどちらを先におこなってもよく、同時に行ってもよい。また、発光材料の製造方法は、第一の熱処理すること(S103)の後に、洗浄すること(S104)を含んでいてよく、さらに洗浄すること(S104)の後に、第二の熱処理をして第二熱処理物を得ること(S105)を含んでいてよい。また、発光材料の製造方法は、第一の熱処理すること(S103)の後に、洗浄せずに、第二の熱処理をして第二熱処理物を得ること(S105)を含んでいてよい。
第一準備工程では、第二の組成を有する第一のフッ化物粒子を準備する。第二の組成は、アルカリ金属の総モル数2に対して、SiとMnの総モル数の比が0.9以上1.1以下であり、Mnのモル数の比が0を超えて0.2以下であり、Fのモル数の比が5.9以上6.1以下又は5.5以上6.0未満であってよい。SiとMnの総モル数の比は、好ましくは0.95以上1.05以下、又は0.97以上1.03以下であってよい。また、Mnのモル数の比は、好ましくは0.005以上0.15以下、0.01以上0.12以下、又は0.015以上0.1以下であってよい。さらにFのモル数の比は、好ましくは5.95以上6.05以下若しくは5.97以上6.03以下、又は5.9以上6.0未満、5.96以上5.995以下若しくは5.97以上5.99以下であってよい。
M2[SibMncFd] (III)
M2SiF6:Mn (IIIa)
第二準備工程では、第三の組成を有する第二のフッ化物粒子を準備する。第三の組成は、Alのモル数1に対して、アルカリ金属の総モル数の比が1以上3以下であり、Fのモル数の比が4以上6以下であってよい。一態様において、第三の組成は、Alのモル数1に対して、アルカリ金属の総モル数の比が2以上3以下であり、Fのモル数の比が5以上6以下であってよい。
Me[AlFf] (IV)
M3[AlF6] (IVa)
M2[AlF5] (IVb)
第一熱処理工程は、準備した第一のフッ化物粒子及び第二のフッ化物粒子を混合して混合物を得ることと、得られた混合物を不活性ガス雰囲気中で、600℃以上780℃以下の温度範囲で第一の熱処理をして第一熱処理物を得ることとを含んでいてよい。第一熱処理物は目的とするフッ化物蛍光体を含んでいる。
発光材料の製造方法は、第一熱処理工程で得られる第一熱処理物を第一の液媒体と接触させる洗浄工程をさらに含んでいてもよい。洗浄工程は、例えば、第一熱処理物を第一の液媒体と接触させることと、第一の液媒体と接触させた第一熱処理物を固液分離することと、を含んでいてよく、必要に応じて固液分離後の第一熱処理物を乾燥処理することをさらに含んでいてもよい。
発光材料の製造方法は、第一の液媒体と接触させた後の第一熱処理物を、400℃以上の第二熱処理温度で第二の熱処理をして第二熱処理物を得る第二熱処理工程をさらに含んでいてよい。第二熱処理物は目的とするフッ化物蛍光体を含んでいる。また、発光材料の製造方法は、液媒体と接触させていない第一熱処理物を、400℃以上の第二熱処理温度で第二の熱処理をして第二熱処理物を得る第二熱処理工程をさらに含んでいてよい。
M2[SipAlqMnrFs] (I)
発光装置は、前記フッ化物蛍光体を含む発光材料(以下、第一発光材料ともいう)と、380nm以上485nm以下の波長範囲に発光ピーク波長を有する発光素子と、を含む。発光装置は、必要に応じてその他の構成部材をさらに含んでいてもよい。
(式中、tは、0<t≦4.2を満たす数である。)
(Ca,Sr,Ba)8MgSi4O16(F,Cl,Br)2:Eu (IIb)
(Ba,Sr,Ca,Mg)2SiO4:Eu (IIc)
(Y,Lu,Gd,Tb)3(Al,Ga)5O12:Ce (IId)
CsPb(F,Cl,Br,I)3 (IIe)
(La,Y,Gd)3Si6N11:Ce (IIf)
(Sr,Ca)LiAl3N4:Eu (IIg)
(Ca,Sr)AlSiN3:Eu (IIh)
KHF2を7029g秤量し、このKHF2を55質量%のHF水溶液38.5Lに溶解させて、第一の溶液を調製した。またK2MnF6を1049.7g秤量し、このK2MnF6を55質量%のHF水溶液12.0Lに溶解させて第二の溶液を調製した。続いてH2SiF6を40質量%含む水溶液15.5Lを調整し、第三の溶液を調製した。次に第一の溶液を、室温で撹拌しながら、約20時間かけて第二の溶液と第三の溶液とを滴下した。滴下終了後に35%過酸化水素水400mlを加え、純水で洗浄を行い、得られた沈殿物を固液分離後、エタノール洗浄を行い、90℃で10時間乾燥することで、製造例1の第一のフッ化物粒子を製造した。得られた第一のフッ化物粒子は、K2[Si0.949Mn0.051F6]で表される組成を有していた。
製造例1で製造したK2[Si0.949Mn0.051F6]で表される組成を有する第一のフッ化物粒子とK3[AlF6]で表される組成を有する第二のフッ化物粒子との総モル数に対する第二のフッ化物粒子のモル数の比が0.003になるように、第一のフッ化物粒子2200gと第二のフッ化物粒子7.76gとを秤量し、混合して、第一のフッ化物粒子と第二のフッ化物粒子の混合物を調製した。窒素ガス濃度が100体積%である不活性ガス雰囲気中にて、温度を700℃、熱処理時間を5時間として、第一のフッ化物粒子と第二のフッ化物粒子の混合物に第一の熱処理を行って第一熱処理物を得た。得られた第一熱処理物を、過酸化水素を1質量%含む洗浄水で充分に洗浄した。洗浄後の第一熱処理物を、フッ素ガス(F2)濃度が20体積%、窒素ガス濃度が80体積%である雰囲気中にて、フッ素ガスと接触させつつ、温度を500℃、熱処理時間を5時間として第二の熱処理を行って、実施例1の発光材料を製造した。なお、第一の熱処理及び第二の熱処理における熱処理時間は、所定の熱処理温度に達してから、加熱を停止するまでに経過した時間である。実施例1の発光材料は、K2[Si0.948Al0.002Mn0.050F5.998]で表される組成を有していた。
製造例1で製造したK2[Si0.949Mn0.051F6]で表される組成を有する第一のフッ化物粒子に、第二のフッ化物粒子を混合せず、第一のフッ化物粒子のみを用いたこと以外は、実施例1と同じ条件で発光材料を製造した。比較例1の発光材料は、K2[Si0.950Mn0.050F6]で表される組成を有していた。
第一のフッ化物粒子と第二のフッ化物粒子の総モル数に対する第二のフッ化物粒子のモル数の比が0.006になるように、第二のフッ化物粒子の質量を15.57gに変更したこと以外は、実施例1と同じ条件で発光材料を製造した。実施例2の発光材料は、K2[Si0.946Al0.005Mn0.049F5.995]で表される組成を有していた。
第一のフッ化物粒子と第二のフッ化物粒子の総モル数に対する第二のフッ化物粒子のモル数の比が0.009になるように、第二のフッ化物粒子の質量を23.43gに変更したこと以外は、実施例1と同じ条件で発光材料を製造した。実施例3の発光材料は、K2[Si0.942Al0.008Mn0.050F5.992]で表される組成を有していた。
第一のフッ化物粒子と第二のフッ化物粒子の総モル数に対する第二のフッ化物粒子のモル数の比が0.015になるように、第二のフッ化物粒子の質量を39.28gに変更したこと以外は、実施例1と同じ条件で発光材料を製造した。実施例4の発光材料は、K2[Si0.939Al0.014Mn0.047F5.986]で表される組成を有していた。
第一のフッ化物粒子と第二のフッ化物粒子の総モル数に対する第二のフッ化物粒子のモル数の比が0.021になるように、第二のフッ化物粒子の質量を55.33gに変更したこと以外は、実施例1と同じ条件で発光材料を製造した。実施例5の発光材料は、K2[Si0.933Al0.018Mn0.049F5.982]で表される組成を有していた。
色度座標
得られた実施例及び比較例の各発光材料について、分光蛍光光度計(製品名:QE-2000、大塚電子株式会社製)を用いて、ピーク波長が450nmである励起光を各発光材料に照射し、室温における各発光材料の発光スペクトルを測定した。実施例及び比較例の各発光材料の発光スペクトルデータから、CIE(国際照明委員会:Commission international de l’eclarirage)1931表色系におけるxy色度座標を求めた。結果を表1に示す。
得られた実施例及び比較例の各発光材料について測定した発光スペクトルのデータから、比較例1の発光材料の輝度を100%として、実施例1から5の発光材料の発光輝度を相対輝度として求めた。結果を表1に示す。
得られた実施例及び比較例の各発光材料について、誘導結合プラズマ発光分光分析法(ICP-AES)による組成分析を行い、組成に含まれるカリウムを2モルとした場合の各元素のモル含有比を算出した。結果を表1に示す。
得られた実施例及び比較例の発光材料について、A.B.D粉体特性測定器(製品名:ABD-100型、筒井理化学器械株式会社製)を用いて安息角を測定し、2回の測定の平均値から安息角を求めた。結果を表1に示す。
得られた実施例及び比較例の発光材料について、A.B.D粉体特性測定器(製品名:ABD-100型、筒井理化学器械株式会社製)を用いて分散度を3回測定し、それらの測定値の算術平均値を分散度とした。結果を表1に示す。
得られた実施例及び比較例の発光材料について、分散度と同様にA.B.D粉体特性測定器(製品名:ABD-100型、筒井理化学器械株式会社製)を用いて嵩密度を3回測定し、それら測定値の算術平均値を嵩密度とした。結果を表1に示す。
得られた実施例及び比較例の発光材料について、それぞれSi標準試料と1対1の割合で混合し、試料水平型多目的X線回折装置(製品名:Ultima IV、株式会社リガク製)、X線源:CuKα線(λ=0.15418nm、管電圧40kV、管電流40mA)を用いて、角度:10°から70°、走査幅:0.02°、走査速度:20°/minの測定条件でX線回折パターンを測定した。得られた実施例1から5及び比較例1のフッ化物蛍光体のX線回折パターンから、統合粉末X線解析ソフトウェア(PDXL2)とICDD(International Center for Diffraction Data、国際回折データセンター)のカードデータ(K2SiF6:01-081-2264、Si:00-027-1402)を用いて格子定数を算出した。結果を表1に示す。
得られた実施例及び比較例のフッ化物蛍光体発光材料について、フーリエ変換型赤外分光装置(日本分光;FT-IR-6200)を用いて、全反射(ATR)法により赤外吸収スペクトルを測定した。図3に、実施例1から5及び比較例1の発光材料の赤外吸収スペクトルの一部を拡大して示す。また、参考として図6に第一のフッ化物粒子及び第二のフッ化物粒子の赤外吸収スペクトルを示す。
走査電子顕微鏡(Scanning Electron Microscope:SEM)を用いて、発光材料のSEM画像を得た。図4に比較例1の発光材料のSEM画像を示し、図5に実施例3の発光材料のSEM画像を示す。
得られた実施例3又は比較例1の各発光材料を第一発光材料として使用した。また、第二発光材料として、Si5.81Al0.19O0.19N7.81:Euで表される組成を有し、540nm付近に発光ピーク波長を有するβサイアロン蛍光体を使用した。CIE1931表色系における色度座標でxが0.280、yが0.270付近となるように第一発光材料及び第二発光材料を配合した蛍光体70と、シリコーン樹脂とを混合して樹脂組成物を得た。次に、図2に示すような凹部を有する成形体40を準備し、凹部の底面に発光ピーク波長が451nmである、窒化ガリウム系化合物半導体を材料とする発光素子10を第一のリード20に配置した後、発光素子10の電極と第一のリード20、第二のリード30とをそれぞれワイヤ60で接続した。さらに、成形体40の凹部に発光素子10を覆うようにシリンジを用いて樹脂組成物を注入し、樹脂組成物を硬化させて蛍光部材を形成して発光装置1を製造した。
積分球を使用した全光束測定装置を用いて、実施例3又は比較例1の発光材料を用いた発光装置1の光束をそれぞれ測定した。比較例1に係るフッ化物蛍光体を用いた発光装置1の光束を100%として、実施例3の発光材料を用いた発光装置1の光束を相対光束として求めた。結果を表2に示す。
製造例1と同様の方法により、Mn含有率が1.5質量%であり、K2SiF6:Mnで表される第二の理論組成(以下、「KSF」と略記することがある。)を有する比較例2の発光材料を得た。
比較例2で製造したフッ化物蛍光体に、フッ素ガス(F2)濃度が20体積%、窒素ガス濃度が80体積%である雰囲気中にて、フッ素ガスと接触させつつ、温度を500℃、熱処理を8時間として第二の熱処理を行なって、Mn含有率が1.5質量%であり、K2SiF6:Mnで表される第二の理論組成を有する比較例3の発光材料を得た。
製造例1と同様の方法によりMn含有率が1.1質量%であり、K2SiF6:Mnで表される第二の理論組成を有する蛍光体である第一のフッ化物粒子を得た。得られた第一のフッ化物粒子とK3[AlF6]で表される組成を有する第二のフッ化物粒子との総モル数に対する第二のフッ化物粒子のモル数の比が0.01になるように、第一のフッ化物粒子と第二のフッ化物粒子とを秤量し、混合して混合物を調製した。窒素ガス濃度が100体積%である不活性ガス雰囲気にて、温度700℃、熱処理時間を5時間として混合物に第一の熱処理を行い第一の熱処理物を得た。得られた第一の熱処理物を、過酸化水素を1質量%含む洗浄水で充分に洗浄し、Mn含有率が1.1質量%であり、K2Si0.99Al0.01F5.99:Mnで表される第一の理論組成を有するフッ化物蛍光体として、実施例6の発光材料を得た。
6.7gのKHF2を55%フッ化水素酸水溶液33.3gに溶解して液媒体1を調製した。フッ素樹脂コートされたオートクレーブに、液媒体1と50gの実施例6で製造したフッ化物蛍光体とを入れ、170℃、約7.5MPaで8時間、加熱加圧処理した。得られた加熱加圧処理物を、過酸化水素を1質量%含む洗浄水で充分に洗浄し、固液分離後、エタノール洗浄を行い、90℃で10時間乾燥することで、実施例7の発光材料を得た。
上述の方法によりMn含有率が1.1質量%のK2SiF6:Mnで表される第二の理論組成を有する第一のフッ化物粒子を得た。得られた第一のフッ化物粒子を用いたこと以外は実施例6と同様の方法で第一の熱処理および洗浄を行ない、第一の理論組成を有する蛍光体であるフッ化物粒子を得た。
上述の方法によりMn含有率が1.6質量%のK2SiF6:Mnで表される第二の理論組成を有する第一のフッ化物粒子を得た。得られた第一のフッ化物粒子を用いたこと以外は実施例8と同様の方法で第一の熱処理、洗浄、及び第二の熱処理を行ない、Mn含有率が1.5質量%であり、K2Si0.99Al0.01F5.99:Mnで表される第一の理論組成を有するフッ化物蛍光体である実施例9の発光材料を得た。
リン酸のナトリウム塩水溶液(リン酸濃度:2.4質量%)150.0gに、35質量%の過酸化水素水15.0gと、純水735.0gを加え、(攪拌羽を用いて回転数400rpmで攪拌し、)室温で撹拌しながら、実施例9で製造したフッ化物蛍光体を300g投入して蛍光体スラリーを作製した。
実施例8で製造したフッ化物蛍光体を用いたこと以外は実施例10と同様の方法で、表面にリン酸ランタンが配置された実施例11の発光材料を作製した。
上述の方法によりMn含有率が1.3質量%のK2SiF6:Mnで表される第二の理論組成を有する第一のフッ化物粒子を得た。得られた第一フッ化物粒子を用いたこと以外は実施例8と同様の方法で第一の熱処理、洗浄、及び第二の熱処理を行ない、Mn含有率が1.2質量%であり、K2Si0.99Al0.01F5.99:Mnで表される第一の理論組成を有する蛍光体であるフッ化物蛍光体を得た。得られた第一の理論組成を有するフッ化物蛍光体を用いたこと以外は実施例10と同様の方法で表面にリン酸ランタンが配置された実施例12の発光材料を作製した。
比較例3で製造したフッ化物蛍光体を用いたこと以外は実施例10と同様の方法で、表面にリン酸ランタンが配置された比較例4の発光材料を作製した。
実施例6で製造したフッ化物蛍光体を100g秤量し、エタノールを180mlと、16.5質量%のアンモニアを含むアンモニア水を43.4mlと、純水20mlとを混合した溶液に投入し、攪拌羽を用いて300rpmで攪拌しながら液温を常温に保ち反応母液とした。テトラエトキシシラン(TEOS:Si(OC2H5)4)を35.7g秤量し、攪拌中の反応母液に約3時間で滴下した。その後、1時間攪拌を継続し、さらに35質量%の過酸化水素(H2O2)を10g投入した後に攪拌を停止した。得られた沈殿物を固液分離後、エタノール洗浄を行い、105℃で10時間乾燥することにより、二酸化ケイ素(SiO2)で覆われた実施例13の発光材料を作製した。なおテトラエトキシシランの滴下量は、フッ化物粒子に対して二酸化ケイ素換算で約10質量%であった。
実施例7で製造したフッ化物蛍光体を用いたこと以外は実施例13と同様の方法で実施例14の発光材料を作製した。
実施例8で製造したフッ化物蛍光体を300g秤量し、エタノール540mlと、16.5質量%のアンモニアを含むアンモニア水を130.2mlと、純水60mlとを混合した溶液に投入し、攪拌羽を用いて回転数350rpmで攪拌しながら、液温を常温に保ち反応母液と、テトラエトキシシラン(TEOS:Si(OC2H5)4)の滴下量を107.1gとしたことと、テトラエトキシシランの滴下時間を6時間としたこと以外は実施例13と同様の方法で、実施例15の発光材料を作製した。フッ化物粒子に対して二酸化ケイ素換算で約10質量%であった。
実施例9で製造したフッ化物蛍光体を用い、攪拌数を500rpmとしたこと以外は実施例15と同様の方法で実施例16の発光材料を作製した。
実施例10で製造したフッ化物蛍光体を用いたこと以外は実施例16と同様の方法で実施例17の発光材料を作製した。
実施例17で作製した発光材料を50g秤量した。次に、エタノール84.9mlと、純水を5.8mlと、シランカップリング剤としてデシルトリメトキシシラン((CH3O)3Si(CH2)9CH3))と、を混合し、30分間攪拌後、20時間以上静置した。この溶液に実施例10で作製したフッ化物蛍光体E10を投入し、200rpmで1時間攪拌後、攪拌を停止した。得られた沈殿物を固液分離後、105℃で10時間乾燥することでシランカップリング処理を行って、実施例18の発光材料を得た。
テトラエトキシシランの滴下量を64.3gとした以外は実施例15と同様の方法で実施例19の発光材料を得た。
テトラエトキシシランの滴下量を32.2gとした以外は実施例15と同様の方法で実施例20の発光材料を得た。
実施例11で製造した発光材料を用いたこと以外は実施例15と同様の方法で実施例21のフッ化物蛍光体E16を作製した。
実施例21で作製した発光材料を用いたこと以外は実施例18と同様の方法で実施例22の発光材料を作製した。
実施例12で製造した発光材料を用いたこと以外は実施例19と同様の方法で発光材料を得た。得られた発光材料に、シランカップリング剤としてヘキシルトリメトキシシランを用いたこと以外は実施例18と同様の方法でシランカップリング処理を行って、実施例23の発光材料を得た。
シランカップリング剤としてビニルトリメトキシシランを用いた以外は実施例23と同様の方法で実施例24の発光材料を得た。
シランカップリング剤として3-アミノプロピルトリエトキシシランを用いた以外は実施例23と同様の方法で実施例25の発光材料を得た。
シランカップリング剤として3-グリシドキシプロピルトリメトキシシランを用いた以外は実施例23と同様の方法で実施例26の発光材料を得た。
(1)赤外分光法:FT-IR評価
得られた実施例6及び比較例2、3の発光材料について、フーリエ変換型赤外分光装置iS(サーモフィッシャーサイエンティフィック製)を用いて、KBrバックグラウンドとし、拡散反射法により赤外吸収スペクトルを測定した。4000cm-1での値をベースラインとして補正を行い、Kubelka-Munk変換を行い、最大ピークで規格化して吸収スペクトルを測定した。
Z1=(3500cm-1以上3800cm-1以下のピーク面積)/(1050cm-1以上1350cm-1以下のピーク面積) (P)
結果を表3に示す。
得られた各発光材料について、ICP発光分光分析による組成分析を行い、実施例13から26で得られた二酸化ケイ素で覆われた発光材料の分析Si濃度と、実施例6から12の二酸化ケイ素で覆う前のそれぞれのフッ化物蛍光体の分析Si濃度の差分から、フッ化物蛍光体を覆っている二酸化ケイ素量を算出し、発光材料に対する二酸化ケイ素の含有率(SiO2分析値)を求めた。結果を表3から7に示す。
実施例9及び16で得られた発光材料について、XRF装置(製品名:ZSX PrimusII、株式会社リガク製)を用いて、蛍光X線元素分析法(XRF:X-Ray Fluorescence spectrometry)によりF元素のKα線のピーク強度を測定した。実施例16の発光材料のピーク強度比を、実施例9のフッ化物蛍光体のピーク強度を100として相対値として算出した。得られたピーク強度比から実施例16の発光材料における二酸化ケイ素膜の平均厚みを、CXRO(The Center for X-Ray Optics)のデータベースを利用して算出した。結果を表3に示す。
得られた実施例17の発光材料について、走査電子顕微鏡(SEM)を用いて画像観察を行った。SEM画像を図8に示す。さらに実施例17の発光材料について、走査電子顕微鏡(SEM)を用いて、任意断面を観察し、画像解析することで二酸化ケイ素膜の平均厚みを計測した。具体的には、複数の発光材料粒子を樹脂に埋め込み、イオンミリング加工により断面試料を作製し、走査電子顕微鏡による発光材料粒子の断面観察が可能な状態とした。断面SEM画像を図7に示す。
得られた実施例10、18、22から26及び比較例4の発光材料について、全有機体炭素計(製品名:TOC-L、株式会社島津製作所製)を用いてトータルカーボン(TC)の分析を行った。結果を表4、表6及び表7に示す。
得られた実施例10から12、17、18、21から26及び比較例4の発光材料について、誘導結合プラズマ発光分光分析法(ICP-AES)によるランタン含有率の分析を行い、発光材料に対する含有率(La分析値)を求めた。結果を表4から表7に示す。
得られた実施例11、12、15、19から26及び比較例3、4の発光材料について、誘導結合プラズマ発光分光分析法(ICP-AES)によるマンガン含有率の分析を行い、発光材料に対する含有率(Mn分析値)を求めた。結果を表5から表7に示す。
樹脂と発光材料を含む樹脂組成物の質量変化に対する発光材料の影響について次の様にして評価した。シリコーン樹脂に、シリコーン樹脂に対して33質量%の発光材料を混合して樹脂組成物を調製した。得られた樹脂組成物の約1gをアルミ箔上に秤量し、硬化させた後、硬化後の樹脂組成物の質量とアルミ箔の質量との差分を算出し、初期値とした。アルミ箔上で硬化させた樹脂組成物を200℃に維持した小型オーブン(製品名:恒温恒湿器LH-114、エスペック社製)に静置し、100時間後、300時間後、500時間後、1000時間後における質量をそれぞれ測定した。初期値を100%とした時の各時間経過後の樹脂組成物の質量維持率(%)を算出した。質量維持率が高いほど、発光材料と樹脂との反応が抑制されていることを示しており、樹脂組成物の耐久性に優れることを意味する。なお、評価には購入可能なシリコーン樹脂から選択したシリコーン樹脂を用いた。具体的には、実施例6から26及び比較例2、3、4については、信越化学工業株式会社製ジメチルシリコーン樹脂(製品名KER-2936;屈折率1.41、以下「ジメチルシリコーン樹脂1」と呼ぶ。)を用いて評価を行った。また、実施例15、21及び比較例3については、東レ・ダウコーニング株式会社製ジメチルシリコーン樹脂(商品名OE-6351;屈折率1.41、以下「ジメチルシリコーン樹脂2」と呼ぶ。)、東レ・ダウコーニング株式会社製フェニルシリコーン樹脂(商品名OE-6630;屈折率1.53、以下「フェニルシリコーン樹脂1」と呼ぶ。)及び上記フェニルシリコーン樹脂1とは屈折率が異なるフェニルシリコーン樹脂(屈折率1.50、以下「フェニルシリコーン樹脂2」と呼ぶ。)を用いた評価も併せて実施した。
上記で得られた各発光材料の耐久性について次の様にして評価した。各発光材料について、量子効率測定装置(製品名:QE-2000、大塚電子株式会社製)を用いて、450nmの励起光に対する内部量子効率を測定し、初期特性とした。次に、発光材料をガラスシャーレに入れ、温度85℃、相対湿度85%に維持した小型高温高湿槽中(エスペック)で100時間静置した。その後、同様の方法で各発光材料の内部量子効率を測定し、初期特性を100%とした時の量子効率維持率(%)を算出した。量子効率維持率が高いほど、耐久性に優れていることを意味する。結果を表3から表7に示す。
実施例6から10、16から18、比較例2から4の発光材料を第一発光材料として使用した。第二発光材料としてSi5.81Al0.19O0.19N7.81:Euで表される組成を有し、540nm付近に発光ピーク波長を有するβサイアロン蛍光体を使用した。CIE1931表色系における色度座標でxが0.280、yが0.270付近となるように第一発光材料71及び第二発光材料72を配合した発光材料70とシリコーン樹脂とを混合して樹脂組成物を得た。次に、凹部を有する成形体40を準備し、凹部の底面に発光ピーク波長が451nmである、窒化ガリウム系化合物半導体を材料とする発光素子10を第一のリード20に配置した後、発光素子10の電極と第一のリード20、第二のリード30とをそれぞれワイヤ60で接続した。さらに成形体40の凹部に発光素子10を覆うようにシリンジを用いて樹脂組成物を注入し、樹脂組成物を硬化させて蛍光部材を形成して、発光装置2を製造した。
実施例11、12、15、19から26、比較例4の発光材料を第一発光材料として使用した。第二発光材料としてLu3Al5O11:Ceで表される理論組成を有し、530nm付近に発光ピークを有する希土類アルミン酸塩蛍光体と、Y3Al5O11:Ceで表される理論組成を有し、535nm付近に発光ピークを有する希土類アルミン酸塩蛍光体と、(Ca,Sr)AlSiN3:Euで表される理論組成を有し、630nm付近に発光ピーク波長を有する窒化物蛍光体を組み合わせて使用した。CIE1931表色系における色度座標でxが0.459、yが0.411付近となるように第一発光材料71及び第二発光材料72を配合した発光材料70とシリコーン樹脂とを混合して樹脂組成物を得たこと以外は発光装置の製造例1と同様にして発光装置3を製造した。
実施例9、10、16から18及び比較例3、4の発光材料にて得られた各発光材料を用いた発光装置2、並びに実施例12、23から26にて得られた各発光材料を用いた発光装置3について、温度85℃、相対湿度85%の環境試験機内で500時間保管して耐久性試験1を行った。耐久性試験1前の発光装置の光束を100%とした時の、耐久性試験1後の発光装置の光束維持率1(%)を求めた。光束維持率1が高いほど高熱高湿に対する耐久性に優れていることを示す。結果を表3、表4及び表7に示す。
実施例11、12、15、19から26及び比較例4にて得られた各発光材料を用いた発光装置3について、加湿していない温度85℃の環境試験機内にて、電流値150mAで1000時間駆動して耐久性試験2を行った。耐久性試験2前の発光装置の光束を100%とした時の、耐久性試験2後の発光装置の光束維持率2(%)を求めた。光束維持率2が高いほど高熱に対する耐久性に優れていることを示す。結果を表6及び表7に示す。
実施例6から8並びに比較例2及び3にて得られた各発光材料を用いた発光装置2について、加湿していない温度85℃の環境試験機内にて、電流値150mAで100時間および500時間駆動した時の色度座標におけるx値を測定した。100時間での色度座標xを初期値とした時の、500時間でのxの変化量をΔxとした。Δxが小さいほど、高熱に対する色安定性に優れていることを示す。結果を表3に示す。
Claims (23)
- Kを含むアルカリ金属と、Siと、Alと、Mnと、Fと、を含み、アルカリ金属の総モル数を2とする場合に、SiとAlとMnの総モル数が0.9以上1.1以下であり、Alのモル数が0を超えて0.1以下であり、Mnのモル数が0を超えて0.2以下であり、Fのモル数が5.5以上6.0未満である第一の組成を有し、
結晶構造に立方晶系の結晶構造を含み、格子定数が0.8138nm以上であるフッ化物蛍光体を含む発光材料。 - Kを含むアルカリ金属と、Siと、Alと、Mnと、Fと、を含み、アルカリ金属の総モル数を2とする場合に、SiとAlとMnの総モル数が0.9以上1.1以下であり、Alのモル数が0を超えて0.1以下であり、Mnのモル数が0を超えて0.2以下であり、Fのモル数が5.5以上6.0未満である第一の組成を有し、
赤外吸収スペクトルにおいて、590cm-1以上610cm-1以下の波数範囲に吸収ピークを有するフッ化物蛍光体を含む発光材料。 - 前記フッ化物蛍光体は、下記式(I)で表される組成を有する請求項1又は2に記載の発光材料。
M2[SipAlqMnrFs] (I)
(式(I)中、Mはアルカリ金属を示し、少なくともKを含む。p、q、rおよびsは、0.9≦p+q+r≦1.1、0<q≦0.1、0<r≦0.2、5.5≦s<6.0を満たす。) - 前記第一の組成は、アルカリ金属の総モル数を2とする場合に、SiとAlとMnの総モル数が1である請求項1から3のいずれか1項に記載の発光材料。
- 前記第一の組成は、Alのモル数が0を超えて0.06以下である請求項1から4のいずれか1項に記載の発光材料。
- 前記フッ化物蛍光体の表面の少なくとも一部に配置される酸化物をさらに含み、
前記酸化物は、Si、Al、Ti、Zr、Sn及びZnからなる群から選択される少なくとも1種を含み、前記酸化物の含有率が、前記発光材料に対して2質量%以上30質量%以下である請求項1から5のいずれか1項に記載の発光材料。 - 前記フッ化物蛍光体は、その表面に、La、Ce、Dy及びGdからなる群から選択される少なくとも1種の希土類元素を含む希土類リン酸塩が配置され、前記酸化物は前記希土類リン酸塩を介して前記フッ化物蛍光体の表面の少なくとも一部に配置される請求項6に記載の発光材料。
- 前記フッ化物蛍光体の表面の少なくとも一部に配置される希土類リン酸塩をさらに含み、
前記希土類リン酸塩は、La、Ce、Dy及びGdからなる群から選択される少なくとも1種の希土類元素を含む請求項1から5のいずれか1項に記載の発光材料。 - Kを含むアルカリ金属と、Siと、Mnと、Fと、を含み、前記アルカリ金属の総モル数を2とする場合に、SiとMnの総モル数が0.9以上1.1以下であり、Mnのモル数が0を超えて0.2以下であり、Fのモル数が5.5以上6.0未満である第二の組成を有する第一のフッ化物粒子を準備することと、
Kを含むアルカリ金属と、Alと、Fと、を含み、Alのモル数を1とする場合に、前記アルカリ金属の総モル数が2以上3以下であり、Fのモル数が5以上6以下である第三の組成を有する第二のフッ化物粒子を準備することと、
前記第一のフッ化物粒子と前記第二のフッ化物粒子の混合物を不活性ガス雰囲気中で、600℃以上780℃以下の温度で第一の熱処理をして第一熱処理物を得ることと、を含む発光材料の製造方法。 - 前記第一のフッ化物粒子を準備することにおいて、前記第二の組成は、アルカリ金属の総モル数を2とする場合に、SiとMnの総モル数が1である請求項9に記載の発光材料の製造方法。
- 前記第一熱処理物を、第一の液媒体と接触させることをさらに含む請求項9又は10に記載の発光材料の製造方法。
- 前記第一熱処理物を、400℃以上600℃以下の温度で第二の熱処理をして第二熱処理物を得ることをさらに含む請求項9から11のいずれか1項に記載の発光材料の製造方法。
- 前記第二熱処理物と、Si、Al、Ti、Zr、Sn及びZnからなる群から選択される少なくとも1種を含む金属アルコキシドとを液媒体中で接触させることで、前記金属アルコキシドに由来する酸化物を、前記発光材料に対して2質量%以上30質量%以下の量で、前記フッ化物蛍光体の表面の少なくとも一部に配置することを含む請求項12に記載の発光材料の製造方法。
- 前記第二熱処理物と、La、Ce、Dy及びGdからなる群から選択される少なくとも1種を含む希土類イオンと、リン酸イオンと、を液媒体中で接触させて、表面の少なくとも一部に希土類リン酸塩を配置された第二熱処理物を得ることを含む請求項12に記載の発光材料の製造方法。
- 前記希土類リン酸塩が配置された第二熱処理物と、Si、Al、Ti、Zr、Sn及びZnからなる群から選択される少なくとも1種を含む金属アルコキシドとを液媒体中で接触させることで、前記金属アルコキシドに由来する酸化物を、前記発光材料に対して2質量%以上30質量%以下の量で、前記希土類リン酸塩が付着した第二熱処理物の表面の少なくとも一部に配置することをさらに含む請求項14に記載の発光材料の製造方法。
- 前記第一熱処理物を、第二の液媒体と共に加圧処理及び加熱処理して第三熱処理物を得ることをさらに含む請求項9から11のいずれか1項に記載の発光材料の製造方法。
- 前記加熱処理を100℃以上で行う請求項16に記載の発光材料の製造方法。
- 前記加圧処理を1.6MPa以上で行う請求項16又は17に記載の発光材料の製造方法。
- 前記第二の液媒体が水を含む請求項16から18のいずれか1項に記載の発光材料の製造方法。
- 前記第二の液媒体がカリウムを含む請求項16から19のいずれか1項に記載の発光材料の製造方法。
- 前記第三熱処理物と、Si、Al、Ti、Zr、Sn及びZnからなる群から選択される少なくとも1種を含む金属アルコキシドとを液媒体中で接触させることで、前記金属アルコキシドに由来する酸化物を、前記発光材料に対して2質量%以上30質量%以下の量で、前記フッ化物蛍光体の表面の少なくとも一部に配置することを含む請求項16から20のいずれか1項に記載の発光材料の製造方法。
- 前記第三熱処理物と、La、Ce、Dy及びGdからなる群から選択される少なくとも1種を含む希土類イオンと、リン酸イオンと、を液媒体中で接触させて、表面の少なくとも一部に希土類リン酸塩を配置された第二熱処理物を得ることを含む請求項16から20のいずれか1項に記載の発光材料の製造方法。
- 前記希土類リン酸塩が配置された第三熱処理物と、Si、Al、Ti、Zr、Sn及びZnからなる群から選択される少なくとも1種を含む金属アルコキシドとを液媒体中で接触させることで、前記金属アルコキシドに由来する酸化物を、前記発光材料に対して2質量%以上30質量%以下の量で、前記希土類リン酸塩が付着した第二熱処理物の表面の少なくとも一部に配置することをさらに含む請求項22に記載の発光材料の製造方法。
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