WO2022215497A1 - 処理液流通方法、及び、処理液供給装置 - Google Patents
処理液流通方法、及び、処理液供給装置 Download PDFInfo
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- WO2022215497A1 WO2022215497A1 PCT/JP2022/012647 JP2022012647W WO2022215497A1 WO 2022215497 A1 WO2022215497 A1 WO 2022215497A1 JP 2022012647 W JP2022012647 W JP 2022012647W WO 2022215497 A1 WO2022215497 A1 WO 2022215497A1
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- pressure
- pipe
- processing liquid
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- pump
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Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F04—POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
- F04B—POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS
- F04B23/00—Pumping installations or systems
- F04B23/02—Pumping installations or systems having reservoirs
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F04—POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
- F04B—POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS
- F04B49/00—Control, e.g. of pump delivery, or pump pressure of, or safety measures for, machines, pumps, or pumping installations, not otherwise provided for, or of interest apart from, groups F04B1/00 - F04B47/00
- F04B49/02—Stopping, starting, unloading or idling control
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F04—POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
- F04B—POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS
- F04B49/00—Control, e.g. of pump delivery, or pump pressure of, or safety measures for, machines, pumps, or pumping installations, not otherwise provided for, or of interest apart from, groups F04B1/00 - F04B47/00
- F04B49/06—Control using electricity
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F04—POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
- F04B—POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS
- F04B53/00—Component parts, details or accessories not provided for in, or of interest apart from, groups F04B1/00 - F04B23/00 or F04B39/00 - F04B47/00
- F04B53/20—Filtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
Definitions
- the present invention relates to a processing liquid circulation method and a processing liquid supply device.
- the liquid processing apparatus described in Patent Document 1 includes a tank, a circulation line, a pump, a filter, a back pressure valve, and a controller.
- the tank stores the processing liquid.
- a circulation line returns processing liquid from the tank to the tank.
- the pump forms a circulating flow of processing liquid in the circulation line.
- a filter is provided downstream of the pump in the circulation line.
- a back pressure valve is provided downstream of the filter in the circulation line.
- the controller controls the pump and the back pressure valve. Then, the controller increases the discharge pressure of the pump at the first pressure when starting circulation of the treatment liquid in the circulation line, and increases the discharge pressure of the pump to a second pressure that is higher than the first pressure after a lapse of a predetermined time. to control the discharge pressure of the pump.
- the differential pressure between the upstream side and the downstream side of the filter can be suppressed to a small differential pressure.
- the inventors of the present application have conducted intensive research on technology for reducing particles contained in the treatment liquid by a method different from that of the liquid treatment apparatus described in Patent Document 1.
- An object of the present invention is to provide a processing liquid distribution method and a processing liquid supply device that can effectively reduce particles contained in the processing liquid.
- the processing liquid to be supplied to a nozzle for discharging the processing liquid onto the substrate is circulated.
- the processing liquid circulation method includes a monitoring process, a driving process, and a circulation process.
- a pump that is arranged upstream of the filter and sends out the processing liquid to the first pipe is driven.
- the processing liquid is circulated through the first pipe by opening the closed flow path of the first pipe at a position downstream of the filter while the pump is being driven.
- the distribution process includes a differential pressure adjustment process.
- the differential pressure adjustment step based on the monitoring results of the first pressure and the second pressure, the differential pressure between the first pressure and the second pressure after the flow path of the first pipe is opened, It is made smaller than the differential pressure between the first pressure and the second pressure before the passage of the first pipe is opened.
- one end and the other end of the first pipe are connected to a processing liquid tank that stores the processing liquid.
- the treatment liquid circulates through the first pipe.
- the differential pressure adjustment step by adjusting the pressure on the secondary side of the filter based on the monitoring results of the first pressure and the second pressure, the pressure after the flow path of the first pipe is opened It is preferable to make the differential pressure smaller than the differential pressure before the passage of the first pipe is opened.
- the processing liquid distribution method includes, after the driving step and before the distribution step, a flow path of a second pipe extending from the first pipe to the processing liquid tank. It is preferable to further include a circulation step of circulating the treatment liquid in the second pipe by opening the .
- a first drainage step of discharging the treated liquid to a first drainage pipe extending from the filter is further included. is preferred.
- the target output value set for the pump is set to a value larger than the target output value set for the pump when the processing liquid is circulated in the second pipe. It is preferable to set
- the distribution step preferably includes a second drainage step of discharging the processing liquid to a second drainage pipe extending from the first pipe.
- the differential pressure is adjusted so that the differential pressure after the passage of the first pipe is opened falls within a predetermined range.
- the processing liquid supply device supplies the processing liquid to a nozzle that discharges the processing liquid onto the substrate.
- the processing liquid supply device includes a first pipe, a filter, a first pressure detection section, a second pressure detection section, a pump, a flow rate adjustment mechanism, and a control section.
- the processing liquid flows through the first pipe.
- a filter is arranged in the first pipe and traps particles contained in the processing liquid.
- the first pressure detector detects a first pressure indicating the pressure on the primary side of the filter.
- the second pressure detector detects a second pressure indicating the pressure on the secondary side of the filter.
- a pump is arranged upstream of the filter and pumps the treatment liquid to the first pipe.
- a flow rate adjusting mechanism is arranged in the first pipe downstream of the filter, and adjusts the flow rate of the processing liquid flowing through the first pipe.
- the controller controls the flow rate adjustment mechanism.
- the controller drives the pump in a stopped state.
- the control unit controls the flow rate adjustment mechanism so as to open the closed flow path of the first pipe when the pump is driven.
- the control unit Based on the monitoring results of the first pressure and the second pressure, the control unit adjusts the differential pressure between the first pressure and the second pressure after the flow path of the first pipe is opened to the second pressure.
- the flow rate adjusting mechanism is controlled so that the pressure difference between the first pressure and the second pressure before the flow path of one pipe is opened becomes smaller.
- FIG. 1 is a plan view showing the inside of a substrate processing apparatus according to Embodiment 1 of the present invention
- FIG. 3 is a side view showing the inside of the processing unit according to Embodiment 1
- FIG. 1 is a diagram showing the configuration of a processing liquid supply device according to Embodiment 1.
- FIG. 4 is a flow chart showing a substrate processing method according to Embodiment 1.
- FIG. 4 is a flow chart showing an internal circulation preparation operation of the processing liquid supply device according to the first embodiment.
- FIG. 10 is a diagram showing an inner circulation preparatory operation of the processing liquid supply device according to the first embodiment; 4A and 4B are diagrams showing an inner circulation operation of the processing liquid supply device according to the first embodiment;
- FIG. 4A and 4B are diagrams showing a filter draining operation of the processing liquid supply apparatus according to the first embodiment;
- FIG. 4 is a flow chart showing an outer circulation operation of the processing liquid supply device according to Embodiment 1.
- FIG. 4A and 4B are diagrams showing an outer circulation operation of the processing liquid supply device according to Embodiment 1;
- FIG. 4A and 4B are diagrams showing the processing liquid supply operation of the processing liquid supply apparatus according to the first embodiment;
- FIG. 4 is a graph showing an example of the pump state, first pressure, second pressure, and differential pressure according to the first embodiment.
- 8 is a flow chart showing the outer circulation operation of the processing liquid supply device according to Embodiment 2 of the present invention.
- FIG. 10 is a diagram showing the external circulation and drainage operation of the processing liquid supply device according to Embodiment 2;
- FIG. 1 is a plan view showing the inside of the substrate processing apparatus 100.
- FIG. A substrate processing apparatus 100 shown in FIG. 1 processes a substrate W with a processing liquid.
- the substrate W is, for example, a semiconductor wafer, a liquid crystal display device substrate, a plasma display substrate, a field emission display (FED) substrate, an optical disk substrate, a magnetic disk substrate, a magneto-optical disk substrate, or a photomask. substrate, a ceramic substrate, or a substrate for solar cells.
- a semiconductor wafer for example, a semiconductor wafer, a liquid crystal display device substrate, a plasma display substrate, a field emission display (FED) substrate, an optical disk substrate, a magnetic disk substrate, a magneto-optical disk substrate, or a photomask.
- FED field emission display
- the processing liquid is, for example, a chemical liquid.
- the chemical solution include dilute hydrofluoric acid (DHF), hydrofluoric acid (HF), hydrofluoric acid (mixture of hydrofluoric acid and nitric acid (HNO 3 )), buffered hydrofluoric acid (BHF), ammonium fluoride, HFEG (hydrofluoric acid and ethylene glycol), phosphoric acid (H 3 PO 4 ), sulfuric acid, acetic acid, nitric acid, hydrochloric acid, ammonia water, hydrogen peroxide water, organic acids (e.g., citric acid, oxalic acid), organic alkalis (e.g., TMAH : tetramethylammonium hydroxide), sulfuric acid-hydrogen peroxide mixture (SPM), ammonia-hydrogen peroxide mixture (SC1), hydrochloric acid-hydrogen peroxide mixture (SC2), isopropyl alcohol (IPA), surfactant or a corrosion inhibitor.
- the substrate processing apparatus 100 includes a plurality of load ports LP, an indexer robot IR, a center robot CR, a plurality of processing units 1, a controller 2, a plurality of fluid boxes 3, and a processing liquid cabinet 4 .
- Each of the load ports LP accommodates a plurality of substrates W stacked one on top of another.
- the indexer robot IR transports substrates W between the load port LP and the center robot CR.
- the center robot CR transports substrates W between the indexer robot IR and the processing units 1 .
- Each of the processing units 1 supplies a processing liquid to the substrate W to process the substrate W.
- Each fluid box 3 houses a fluid device.
- the processing liquid cabinet 4 contains processing liquids.
- the plurality of processing units 1 form a plurality of towers TW (four towers TW in the example of FIG. 1) arranged to surround the center robot CR in plan view.
- Each tower TW includes a plurality of vertically stacked processing units 1 (three processing units 1 in the example of FIG. 1).
- a plurality of fluid boxes 3 correspond to a plurality of towers TW, respectively.
- the processing liquid in the processing liquid cabinet 4 is supplied to all the processing units 1 included in the tower TW corresponding to the fluid box 3 via one of the fluid boxes 3 .
- the control device 2 controls the load port LP, indexer robot IR, center robot CR, processing unit 1, fluid box 3, and processing liquid cabinet 4.
- the control device 2 is, for example, a computer.
- the control device 2 includes a control unit 21 and a storage unit 22.
- the control unit 21 includes a processor such as a CPU (Central Processing Unit).
- the storage unit 22 includes a storage device and stores data and computer programs. Specifically, the storage unit 22 includes a main storage device such as a semiconductor memory, and an auxiliary storage device such as a semiconductor memory, a solid state drive, and/or a hard disk drive.
- the storage unit 22 may include removable media.
- the storage unit 22 corresponds to an example of a non-temporary computer-readable storage medium.
- FIG. 2 is a side view showing the inside of the processing unit 1.
- the processing unit 1 includes a chamber 11, a spin chuck 12, a spin motor 13, a nozzle 14, a nozzle moving section 15, a plurality of guards 16, a standby pod 17, and a nozzle 18. including.
- the substrate processing apparatus 100 further includes a processing liquid supply device 200 , a drainage pipe 7 , a valve 8 , a valve 19 and a pipe 20 .
- the processing liquid supply device 200 includes a valve 5 and a pipe 6 .
- the drain pipe 7 and the valve 8 can also be regarded as components of the processing liquid supply device 200 .
- the chamber 11 has a substantially box shape.
- the chamber 11 includes a spin chuck 12, a spin motor 13, a nozzle 14, a nozzle moving portion 15, a plurality of guards 16, a standby pod 17, a nozzle 18, a portion of the pipe 6, a portion of the drainage pipe 7, and a pipe 20. accommodates part of the In addition, for example, the valves 5, 8, and 19 may be accommodated in the chamber 11.
- FIG. 1 A schematic diagrammatic chamber 11
- the spin chuck 12 holds the substrate W.
- the spin motor 13 rotates the spin chuck 12 around the rotation axis AX1. Therefore, the spin chuck 12 rotates the substrate W around the rotation axis AX1 while holding the substrate W horizontally.
- the spin chuck 12 includes a spin base 121 and multiple chuck members 122 .
- the spin base 121 has a substantially disc shape and supports the plurality of chuck members 122 in a horizontal posture.
- a plurality of chuck members 122 hold the substrate W in a horizontal posture.
- the nozzle 14 ejects the processing liquid onto the substrate W.
- the nozzle moving unit 15 raises and lowers the nozzle 14 and horizontally rotates the nozzle 14 around the rotation axis AX2.
- the nozzle moving unit 15 includes, for example, a ball screw mechanism and an electric motor that applies a driving force to the ball screw mechanism in order to move the nozzle 14 up and down. Further, the nozzle moving unit 15 includes, for example, an electric motor to horizontally rotate the nozzle 14 .
- the processing liquid supply device 200 supplies the processing liquid to the nozzle 14 .
- the pipe 6 of the processing liquid supply device 200 supplies the processing liquid to the nozzle 14 . Therefore, the processing liquid flows through the pipe 6 .
- a valve 5 is arranged in the pipe 6 . The valve 5 opens and closes the flow path of the pipe 6 to switch between supplying and stopping the supply of the treatment liquid to the nozzle 14 .
- the standby pod 17 is arranged below the nozzle 14 standby position.
- the standby position indicates a position outside the spin chuck 12 with respect to the rotation axis AX1.
- the standby pod 17 receives the processing liquid ejected by the nozzle 14 located at the standby position.
- the nozzle moving unit 15 horizontally rotates the nozzle 14 between the standby position and the processing position.
- the processing position of the nozzle 14 indicates a position above the substrate W.
- the pre-dispense process is a process of discharging the processing liquid toward the standby pod 17 before discharging the processing liquid onto the substrate W. As shown in FIG. On the other hand, the nozzle 14 ejects the processing liquid toward the substrate W at the processing position.
- a drainage pipe 7 is connected to the standby pod 17 .
- the processing liquid received by the standby pod 17 is discharged through the drainage pipe 7 .
- the drainage pipe 7 is connected to, for example, a drainage tank.
- a valve 8 is arranged in the drain pipe 7 . The valve 8 opens and closes the flow path of the drainage pipe 7 to switch between discharging the treatment liquid through the drainage pipe 7 and stopping the discharge.
- the nozzle 18 supplies the rinse liquid toward the substrate W. As a result, the processing liquid is washed away from the substrate W.
- the rinsing liquid is, for example, deionized water, carbonated water, electrolytic ion water, hydrogen water, ozone water, or diluted hydrochloric acid water (for example, about 10 ppm to 100 ppm).
- the pipe 20 supplies the rinse liquid to the nozzle 18 . Therefore, the rinse liquid flows through the pipe 20 .
- a valve 19 is arranged in the pipe 20 . Then, the valve 19 opens and closes the flow path of the pipe 20 to switch between supplying and stopping the supply of the rinse liquid to the nozzle 18 .
- Each guard 16 has a substantially cylindrical shape. Each guard 16 receives the processing liquid or rinse liquid discharged from the substrate W. FIG.
- FIG. 3 is a diagram showing the processing liquid supply device 200.
- the processing liquid supply device 200 includes a processing liquid tank 30, heaters 31 and 32, a temperature sensor 33, a pump 34, a pulse damper 35, a first pressure gauge P1, and a filter 37. , second pressure gauge P2, temperature sensors 39, 40, third pressure gauge 41, temperature sensor 42, valves 44, 45, 46, 47, 48, 49, flow rate adjustment mechanism 50, outer circulation piping 60 , an inner circulation line 61 , a drain line 62 , a line 63 , a drain line 64 , and lines 65 , 66 .
- the flow rate adjustment mechanism 50 includes a valve 38 and a valve 43 .
- the processing liquid supply device 200 also includes a plurality of pipes 6 and a plurality of valves 5 corresponding to the plurality of processing units 1 .
- the control unit 21 controls the processing liquid supply device 200 . Specifically, the heaters 31 , 32 , the pump 34 , the valves 5 , 8 , 44 , 45 , 46 , 47 , 48 , 49 and the flow rate adjusting mechanism 50 are controlled by the controller 21 . Further, the temperature sensors 33 , 39 , 40 and 42 detect the temperature of the treatment liquid and output detection values indicating the detected temperatures to the control section 21 . Further, the first pressure gauge P ⁇ b>1 , the second pressure gauge P ⁇ b>2 , and the third pressure gauge 41 detect the pressure of the treatment liquid and output detection values indicating the detected pressures to the control unit 21 .
- part of the outer circulation pipe 60, the temperature sensor 40, the third pressure gauge 41, the temperature sensor 42, the valve 43, the valve 5, and part of the pipe 6 are housed in the fluid box 3 (Fig. 1). be done.
- the processing liquid tank 30 stores the processing liquid.
- the pipe 66 replenishes the processing liquid tank 30 with new processing liquid.
- the valve 49 is arranged in the pipe 66 and opens and closes the flow path of the pipe 66 .
- the outer circulation pipe 60 includes a first circulation pipe 601 and a second circulation pipe 602 .
- One end of the first circulation pipe 601 is connected to the processing liquid tank 30 and the other end of the first circulation pipe 601 is connected to the filter 37 .
- One end of the first circulation pipe 601 is the upstream end of the outer circulation pipe 60 .
- One end of the second circulation pipe 602 is connected to the filter 37 and the other end of the second circulation pipe 602 is connected to the processing liquid tank 30 .
- the other end of the second circulation pipe 602 is the downstream end of the outer circulation pipe 60 .
- a plurality of second circulation pipes 602 are provided corresponding to the plurality of towers TW (FIG. 1), respectively.
- the plurality of second distribution pipes 602 branch on the secondary side of the filter 37 .
- the outer circulation pipe 60 corresponds to an example of the "first pipe" of the present invention.
- the heater 31, the heater 32, the pump 34, the pulse damper 35, the first pressure gauge P1, and the filter 37 are arranged in this order from upstream to downstream in the outer circulation pipe 60 (specifically, the first circulation pipe 601). placed in Also, the filter 37 is arranged at a position 73 of the outer circulation pipe 60 .
- a position 73 is a position downstream of the pump 34 and upstream of the branch position 74 and the flow control mechanism 50 .
- the heaters 31 and 32 heat the processing liquid in the processing liquid tank 30 to adjust the temperature of the processing liquid in the processing liquid tank 30 .
- the processing liquid supply device 200 has two heaters 31 and 32 connected in series, but it may have one heater or three or more heaters. You may have
- the pump 34 sends out the processing liquid in the processing liquid tank 30 to the outer circulation pipe 60 .
- the pump 34 sends out the processing liquid in the processing liquid tank 30 to the first circulation pipe 601 .
- the pump 34 is arranged upstream of the filter 37 and the branch position 72 in the outer circulation pipe 60 (specifically, the first circulation pipe 601).
- a temperature sensor 33 detects the temperature of the processing liquid flowing through the first flow pipe 601 at a position 80 between the heater 32 and the pump 34 .
- the pulse damper 35 suppresses pulsation of the processing liquid delivered from the pump 34 .
- the filter 37 captures particles contained in the processing liquid passing through the filter 37 .
- the filter 37 removes particles contained in the processing liquid passing through the filter 37 .
- the filter 37 filters the processing liquid.
- the filter 37 has many holes (not shown).
- the processing liquid then passes through the pores of the filter 37 .
- the processing liquid is filtered by the filter 37 .
- particles contained in the processing liquid pass through the pores of the filter 37, they are adsorbed by the walls defining the pores and captured within the pores. As a result, particles are removed from the processing liquid.
- the filter 37 includes a PTFE (polytetrafluoroethylene) hydrophilic membrane as a filtration membrane.
- a PTFE hydrophilic membrane is a membrane obtained by hydrophilizing the surface of a PTFE base material.
- the particle trapping ability of the filter 37 changes as the pressure applied to the filter 37 fluctuates. When the filter 37 is under pressure, it is possible to capture smaller particles than when the filter 37 is not under pressure. And as the pressure applied to the filter 37 increases, smaller and smaller particles can be captured.
- the first pressure gauge P1 is arranged on the primary side of the filter 37.
- a first pressure gauge P1 detects a first pressure indicating the pressure on the primary side of the filter 37 .
- the first pressure gauge P1 outputs a detected value indicating the first pressure to the controller 21 .
- the control unit 21 acquires a detection value indicating the first pressure and monitors the first pressure in real time.
- the first pressure gauge P1 is, for example, a pressure sensor.
- the first pressure gauge P1 corresponds to an example of the "first pressure detector" of the present invention.
- the second pressure gauge P2 is arranged on the secondary side of the filter 37.
- a second pressure gauge P2 detects a second pressure indicating the pressure on the secondary side of the filter 37 .
- the second pressure gauge P2 outputs a detected value indicating the second pressure to the controller 21 .
- the control unit 21 acquires a detection value indicating the second pressure and monitors the second pressure in real time.
- the second pressure gauge P2 is, for example, a pressure sensor.
- the second pressure gauge P2 corresponds to an example of the "second pressure detector" of the present invention.
- the first pressure is denoted by the same reference numeral "P1" as the first pressure gauge P1
- the second pressure is denoted by the same reference numeral as the second pressure gauge P2.
- the filter 37 is arranged in the outer circulation pipe 60 between the first pressure gauge P1 and the second pressure gauge P2.
- the differential pressure DF between the first pressure P1 and the second pressure P2 is large, some of the particles captured by the filter 37 separate from the filter 37 and the outer circulation pipe 60 may spread to For example, the differential pressure DF tends to increase when the pump 34 is started, that is, when the stopped pump 34 is driven.
- the differential pressure DF is large, some of the particles captured by the filter 37 may diffuse to the secondary side of the filter 37 compared to when the differential pressure DF is small.
- the processing liquid supply device 200 detects that the flow path of the outer circulation pipe 60 is the filter 37 based on the monitoring results of the first pressure P1 and the second pressure P2.
- the differential pressure DF after opening at a position downstream of the filter 37 is made smaller than the differential pressure DF before the flow path of the outer circulation pipe 60 is opened at a position downstream of the filter 37 . Therefore, the particles captured by the filter 37 can be prevented from diffusing to the secondary side of the filter 37 due to the differential pressure DF. As a result, particles contained in the processing liquid can be effectively reduced.
- the flow rate adjustment mechanism 50 is arranged in the outer circulation pipe 60 (specifically, the second circulation pipe 602) downstream of the filter 37.
- the flow rate adjusting mechanism 50 adjusts the flow rate of the processing liquid flowing through the outer circulation pipe 60 .
- Adjustment of the flow rate of the treatment liquid includes not only increasing or decreasing the flow rate but also setting the flow rate to zero. Therefore, the flow rate adjusting mechanism 50 closes or opens the flow path of the outer circulation pipe 60, and increases or decreases the flow rate of the treatment liquid.
- the flow rate adjustment mechanism 50 adjusts the pressure of the processing liquid flowing through the second circulation pipe 602 . Further in other words, the flow rate adjustment mechanism 50 adjusts the pressure on the secondary side of the filter 37 .
- valve 38 of the flow rate adjustment mechanism 50 is arranged in the second circulation pipe 602 (outer circulation pipe 60) downstream of the filter 37 and the second pressure gauge P2 and upstream of the branch position 74. be done.
- the valve 38 closes or opens the channel of the second circulation pipe 602 on the secondary side of the filter 37 .
- the valve 43 is arranged in the second circulation pipe 602 (outer circulation pipe 60) at a position downstream of the filter 37, the second pressure gauge P2, and the branch position 74.
- the valve 43 adjusts the flow rate of the processing liquid flowing through the second distribution pipe 602 .
- the valve 43 adjusts the pressure of the processing liquid flowing through the second circulation pipe 602 .
- the valve 43 adjusts the pressure on the secondary side of the filter 37 (second pressure P2).
- Valve 43 is, for example, a motor needle valve, a back pressure valve, or a relief valve.
- the controller 21 can adjust the degree of opening of the valve 43 continuously or stepwise. The degree of opening indicates the extent to which the valve 43 is open.
- the temperature sensor 39 detects the temperature of the processing liquid flowing through the second circulation pipe 602 (the outer circulation pipe 60) at a position 81 downstream of the filter 37 and the valve 38.
- the temperature sensor 40 detects the temperature of the processing liquid flowing through the second circulation pipe 602 (the outer circulation pipe 60) at a position 82 downstream of the temperature sensor 39. As shown in FIG. Position 82 is a position upstream of branch position 74 .
- the third pressure gauge 41 detects the pressure of the processing liquid flowing through the second circulation pipe 602 (the outer circulation pipe 60) at a position 83 on the primary side of the valve 43.
- Position 83 is a position downstream of branch position 74 .
- the temperature sensor 42 detects the temperature of the processing liquid flowing through the second circulation pipe 602 (the outer circulation pipe 60 ) at a position 84 on the primary side of the valve 43 .
- Position 84 is a position downstream of branch position 74 .
- a plurality of pipes 6 are connected to a plurality of branch positions 74 of the second circulation pipe 602 (outer circulation pipe 60). The pipe 6 then extends from the branch position 74 to the nozzle 14 .
- the branch position 74 is located downstream of the filter 37 and upstream of the valve 43 .
- the inner circulation pipe 61 extends from the branch position 72 of the first circulation pipe 601 (outer circulation pipe 60 ) to the processing liquid tank 30 .
- the branch position 72 is downstream of the pump 34 and upstream of the filter 37 .
- the valve 44 is arranged in the inner circulation pipe 61 . The valve 44 opens and closes the flow path of the inner circulation pipe 61 .
- the inner circulation pipe 61 corresponds to an example of the "second pipe" of the present invention.
- the drainage pipe 62 extends from the filter 37.
- the drainage pipe 62 is a pipe for discharging the processing liquid present inside the filter 37 (specifically, the internal primary side). Specifically, one end of the drain pipe 62 is connected to the primary space inside the filter 37, and the other end of the drain pipe 62 is connected to, for example, a drain tank.
- a valve 45 is arranged in the drainage pipe 62 . The valve 45 opens and closes the channel of the drainage pipe 62 .
- the drainage pipe 62 corresponds to an example of the "first drainage pipe" of the present invention.
- a drainage pipe 64 extends from the filter 37 .
- the drainage pipe 64 is a pipe for discharging the processing liquid present inside the filter 37 (specifically, on the internal secondary side). Specifically, one end of the drain pipe 64 is connected to the secondary space inside the filter 37, and the other end of the drain pipe 64 is connected to, for example, a drain tank.
- a valve 46 is arranged in the drain line 64 . The valve 46 opens and closes the channel of the drainage pipe 64 .
- a pipe 63 extends from the filter 37 to the processing liquid tank 30 .
- the pipe 63 is a pipe for removing air bubbles inside the filter 37 (specifically, the internal primary side) that cause generation of particles.
- one end of the pipe 63 is connected to the primary space inside the filter 37
- the other end of the pipe 63 is connected to the processing liquid tank 30 .
- a valve 47 is arranged in the pipe 63 . The valve 47 opens and closes the channel of the pipe 63 .
- a pipe 65 extends from the filter 37 to the processing liquid tank 30 .
- the pipe 65 is a pipe for removing air bubbles inside the filter 37 (specifically, on the internal secondary side) that cause generation of particles.
- one end of the pipe 65 is connected to the secondary space inside the filter 37
- the other end of the pipe 65 is connected to the processing liquid tank 30 .
- Valve 48 is arranged in pipe 65 . The valve 48 opens and closes the channel of the pipe 65 .
- FIG. 4 is a flow chart showing the substrate processing method according to the first embodiment.
- FIG. 5 is a flow chart showing the inner circulation preparatory operation in step S2 of FIG. 6A and 6B are diagrams showing the inner circulation preparatory operation of the processing liquid supply device 200.
- FIG. 7A and 7B are diagrams showing the inner circulation operation of the processing liquid supply device 200.
- FIG. 8A and 8B are diagrams showing the filter draining operation of the processing liquid supply device 200.
- FIG. FIG. 9 is a flow chart showing the external circulation operation of the processing liquid supply device 200.
- FIG. 10A and 10B are diagrams showing the outer circulation operation of the processing liquid supply device 200.
- FIG. 11A and 11B are diagrams showing the processing liquid supply operation of the processing liquid supply device 200.
- FIG. 10A and 10B are diagrams showing the outer circulation operation of the processing liquid supply device 200.
- FIG. 11A and 11B are diagrams showing the processing liquid supply operation of the processing liquid supply device 200.
- valves e.g. valves 5, 8, 38, 43, 44, 45, 46, 47, 48, 49
- white indicates that the valve is closed and black indicates that the valve is open.
- black indicates that the valve is open.
- a white triangle indicates that the pump 34 is stopped, and a black triangle indicates that the pump 34 is in operation.
- the flow path of the treatment liquid is indicated by thick lines.
- the substrate processing method according to Embodiment 1 includes steps S1 to S10.
- the substrate processing method is executed by the substrate processing apparatus 100 under the control of the controller 21 .
- steps S1 to S5 constitute a processing liquid flow method.
- the processing liquid distribution method is executed by the processing liquid supply device 200 under the control of the control unit 21 .
- the processing liquid circulation method the processing liquid to be supplied to the nozzles 14 for discharging the processing liquid onto the substrate W is circulated.
- the processing liquid supplied to the nozzles 14 for discharging the processing liquid onto the substrate W is circulated.
- step S1 the control unit 21 starts monitoring the first pressure P1 and the second pressure P2. That is, the control unit 21 starts obtaining a detected value indicating the first pressure P1 from the first pressure gauge P1 and starts obtaining a detected value indicating the second pressure P2 from the second pressure gauge P2.
- Step S1 corresponds to an example of the "monitoring step" of the present invention.
- step S2 the treatment liquid supply device 200 performs an inner circulation preparatory operation.
- the inner circulation preparatory operation is performed before the inner circulation operation in step S3 and is an operation for preparing for the inner circulation.
- Inner circulation indicates that the temperature of the processing liquid reaches the target temperature while circulating the processing liquid in the processing liquid tank 30 through the inner circulation pipe 61 .
- step S2 inner circulation preparatory operation
- step S201 inner circulation preparatory operation
- step S202 inner circulation preparatory operation
- the control unit 21 drives the pump 34 in a stopped state.
- the control unit 21 sets the first target output value TG1 as the target output value of the pump 34 .
- the target output value is a set value set for the pump 34 so that the pump 34 achieves the target discharge pressure.
- the larger the set target output value the larger the target discharge pressure.
- the pump 34 is a non-positive displacement pump such as centrifugal and propeller pumps
- the target output value is indicated by the number of revolutions of rotating bodies such as impellers and propellers.
- Step S201 corresponds to an example of the "driving step" of the present invention.
- step S202 the control unit 21 opens the valves 38, 44, 47, 48 and closes the valves 5, 8, 43, 45, 46. Since the valve 38 is opened, the flow path of the inner circulation pipe 61 is opened. As a result, the processing liquid flows through the inner circulation pipe 61 .
- control unit 21 ends step S202 when the first pressure P1 reaches the target pressure P11. Then, the process returns to the main routine of FIG. Note that the control unit 21 may cause the processing liquid supply device 200 to continue the inner circulation preparatory operation of step S2 for a predetermined preparatory period.
- the predetermined preparation period is predetermined experimentally and/or empirically, for example.
- step S3 the treatment liquid supply device 200 internally circulates the treatment liquid.
- Step S3 corresponds to an example of the "circulation step” of the present invention.
- Step S3 can also be described as an inner circulation step.
- step S3 the control unit 21 opens the valve 44 and closes the valves 5, 8, 38, 43, 45, 46, 47, and 48.
- the processing liquid stored in the processing liquid tank 30 circulates through the first circulation pipe 601 and the inner circulation pipe 61, and the inner circulation is performed.
- the controller 21 monitors the temperature of the processing liquid detected by the temperature sensor 33 and controls the heaters 31 and 32 so that the temperature of the processing liquid circulating inside reaches the target temperature.
- the control unit 21 may cause the processing liquid supply device 200 to perform the inner circulation of the processing liquid only for a predetermined inner circulation period.
- the predetermined circulation period is predetermined experimentally and/or empirically, for example.
- step S3 after step S2 (steps S201 and S202) and before steps S4 and S5, the control unit 21 opens the flow path of the inner circulation pipe 61 by means of the valve 44. , the inner circulation pipe 61 circulates the processing liquid. Therefore, in Embodiment 1, the temperature of the treatment liquid can reach the target temperature before step S5 (external circulation operation). As a result, the processing liquid in the outer circulation can be quickly supplied to the nozzles 14 .
- step S4 the processing liquid supply device 200 discharges the processing liquid inside the filter 37 to the drainage pipe 62.
- the processing liquid supply device 200 discharges the processing liquid present in the primary space inside the filter 37 to the drainage pipe 62 .
- Step S4 corresponds to an example of the "first draining step" of the present invention.
- step S4 the control unit 21 closes the valves 5, 8, 38, 43, 44, 46, 47, and 48 and closes the valves only during the first drainage period. Open 45. Accordingly, the processing liquid inside the filter 37 is discharged to the liquid discharge pipe 62 during the first liquid discharge period. As a result, particles in the processing liquid are also discharged from the liquid drain pipe 62 .
- the first drainage period is predetermined experimentally and/or empirically, for example.
- step S4 after step S3 and before step S5, the control unit 21 opens the valve 45 to discharge the processing liquid to the drain pipe 62. Therefore, particles existing on the primary side of the filter 37 and particles existing inside the filter 37 (internal primary side) can be discharged through the drainage pipe 62 . As a result, particles contained in the processing liquid can be effectively reduced.
- control unit 21 may open the valve 46 for a certain period of time after opening the valve 45 or before opening the valve 45 at the same time as opening the valve 45 .
- the particles present inside the filter 37 can be discharged through the drainage pipe 64 .
- particles contained in the processing liquid can be further effectively reduced.
- step S5 the processing liquid supply device 200 externally circulates the processing liquid. External circulation indicates that the treatment liquid is circulated through the external circulation pipe 60 . Therefore, in step S5, the processing liquid circulates through the outer circulation pipe 60. As shown in FIG. Step S5 corresponds to an example of the "distribution step" of the present invention. Step S5 can be described as an extra-circulation step.
- step S5 (external circulation operation) includes steps S501 to S503.
- step S501 the control unit 21 changes the target output value of the pump 34 from the first target output value TG1 to the second target output value TG2.
- the second target output value TG2 is greater than the first target output value TG1. That is, in step S501 (step S5), the control unit 21 sets the target output value to be set to the pump 34 from the target output value (first target output value TG1) set to the pump 34 in steps S2 to S4. set to a large value. For example, in step S501 (step S5), the control unit 21 sets the target output value set for the pump 34 to the target output value (first target Set to a value greater than the output value TG1).
- step S502 the control unit 21 operates the flow rate adjusting mechanism 50 (valves 38, 43) so as to open the flow path of the closed outer circulation pipe 60 (specifically, the second circulation pipe 602).
- Control Specifically, in a state in which the pump 34 is driven, the control unit 21 controls the flow rate adjustment mechanism 50 so as to open the flow path of the closed outer circulation pipe 60 . Therefore, the flow rate adjusting mechanism 50 circulates the processing liquid in the outer circulation pipe 60 by opening the flow path of the outer circulation pipe 60 which is in a closed state. More specifically, as shown in FIG. 10, the controller 21 opens the valves 38 and 43 and closes the valves 5, 8, 44, 45, 46, 47 and 48. As a result, the processing liquid stored in the processing liquid tank 30 circulates through the outer circulation pipe 60 . The external circulation of the treatment liquid is continued until the control unit 21 receives an instruction to stop the external circulation.
- step S503 the control unit 21 adjusts the differential pressure DF between the first pressure P1 and the second pressure P2 using the valve 43 of the flow rate adjusting mechanism 50.
- the control unit 21 opens the flow path of the outer circulation pipe 60 (specifically, the second circulation pipe 602) based on the monitoring results of the first pressure P1 and the second pressure P2 (step S1).
- the differential pressure DF between the first pressure P1 and the second pressure P2 after the pressure is reduced becomes smaller than the differential pressure DF between the first pressure P1 and the second pressure P2 before the flow path of the outer circulation pipe 60 is opened.
- the valve 43 of the flow rate adjustment mechanism 50 is controlled.
- Step S1 the valve 43 adjusts the pressure on the secondary side of the filter 37, that is, the second pressure P2, based on the monitoring results of the first pressure P1 and the second pressure P2 (step S1).
- the differential pressure DF after the channel 60 is opened is made smaller than the differential pressure DF before the channel of the outer circulation pipe 60 is opened. Therefore, the particles captured by the filter 37 can be prevented from diffusing to the secondary side of the filter 37 due to the differential pressure DF. As a result, particles contained in the processing liquid can be effectively reduced.
- Step S503 corresponds to an example of the "differential pressure adjusting step" of the present invention.
- the differential pressure DF is adjusted based on the monitoring results (step S1) of the first pressure P1 and the second pressure P2, when the first pressure P1 and the second pressure P2 are not monitored (not detected) (case), the differential pressure DF can be adjusted more accurately.
- "after the flow path of the outer circulation pipe 60 is opened” means “after the flow path of the second circulation pipe 602 is opened” or “at a position downstream of the filter 37. After the passage of the pipe 60 has been opened”.
- the differential pressure DF when the processing liquid is circulating in the outer circulation (that is, the differential pressure DF when the processing liquid is circulating in the outer circulation pipe 60) is is made smaller than the differential pressure DF before the is opened (the differential pressure DF before the treatment liquid is circulated outside). Therefore, the particles captured by the filter 37 can be prevented from diffusing into the outer circulation pipe 60 due to the differential pressure DF.
- the controller 21 controls the differential pressure DF after the flow path of the outer circulation pipe 60 is opened (that is, the differential pressure DF when the treatment liquid is circulating in the outer circulation pipe 60).
- step S503 based on the monitoring results of the first pressure P1 and the second pressure P2 (step S1), the differential pressure DF after the flow path of the outer circulation pipe 60 is opened (that is, the processing liquid
- the differential pressure DF may be adjusted so that the differential pressure DF during circulation in the outer circulation pipe 60 falls within a predetermined range RG.
- the control unit 21 may control the valve 43 so that the differential pressure DF after the flow path of the outer circulation pipe 60 is opened falls within the predetermined range RG.
- the valve 43 adjusts the pressure on the secondary side of the filter 37, that is, the second pressure P2, so that the differential pressure DF after the passage of the outer circulation pipe 60 is opened is within the predetermined range RG. adjust.
- the differential pressure DF within the predetermined range RG is smaller than the differential pressure DF before the passage of the outer circulation pipe 60 is opened.
- the differential pressure DF within the predetermined range RG is smaller than the differential pressure DF in step S3.
- the predetermined range RG preferably includes zero, for example.
- the predetermined range RG is set, for example, as a range of ⁇ K with respect to the reference value or a range of ⁇ Q% with respect to the reference value.
- K and "Q" are positive real numbers.
- the control unit 21 causes the valve 43 to adjust the second pressure P2 so that the second pressure P2 on the secondary side of the filter 37 is substantially the same as the first pressure P1 on the primary side of the filter 37 .
- the differential pressure DF is substantially zero. That is, the control unit 21 causes the valve 43 to adjust the second pressure P2 so that the differential pressure DF becomes substantially zero. Therefore, it is possible to more effectively suppress diffusion of the particles captured by the filter 37 to the secondary side of the filter 37 due to the differential pressure DF. As a result, particles contained in the processing liquid can be further effectively reduced.
- step S503 may be performed continuously while the treatment liquid is being externally circulated, or may be performed for a predetermined adjustment period from the start of step S502 (at the start of external circulation). good.
- the predetermined adjustment period is predetermined experimentally and/or empirically, for example.
- step S503 may be performed, for example, from the start of step S502 (at the start of external circulation) until the first pressure P1 reaches the target pressure P12 (FIG. 12, described below).
- step S503 may be performed from the start of step S502 (at the start of external circulation) until the second pressure P2 reaches the target pressure P20 (FIG. 12 described later).
- the target pressure P12 and the target pressure P20 are higher than the target pressure P11, which is the target value of the first pressure P1 in step S2 (that is, the first pressure P1 during inner circulation in step S3) (FIG. 12 described later). . Moreover, in order to make the differential pressure DF substantially zero, it is preferable that the target pressure P12 and the target pressure P20 are substantially the same.
- the center robot CR loads the substrate W into the processing unit 1 in step S6.
- the spin chuck 12 holds the substrate W in the processing unit 1 .
- the spin motor 13 rotates the substrate W by rotating the spin chuck 12 .
- step S7 the processing liquid supply device 200 supplies the processing liquid from the outer circulation pipe 60 to the nozzle 14 through the pipe 6. As a result, the nozzle 14 ejects the processing liquid onto the substrate W. FIG. The substrate W is then processed with the processing liquid. Note that step S7 may be included in the processing liquid distribution method according to the first embodiment.
- the control unit 21 causes the valves 38 and 43 to be opened and the valves 8, 44, 45, 46, 47, and 48 to be closed for a predetermined processing period. Open valve 5.
- the processing liquid flowing through the outer circulation pipe 60 is supplied from the pipe 6 to the nozzle 14 during a predetermined processing period.
- the nozzle 14 discharges the processing liquid onto the substrate W during a predetermined processing period.
- a predetermined processing period elapses after the valve 5 is opened, the valve 5 is closed and the discharge of the processing liquid from the nozzle 14 is stopped.
- the predetermined processing period is determined in advance according to the purpose of processing the substrate W.
- step S7 the processing liquid supply device 200 moves the processing liquid from the outer circulation pipe 60 to the nozzle 14 while the processing liquid is being circulated in the outer circulation, that is, the processing liquid is circulating in the outer circulation pipe 60. supply the processing solution to the
- the processing liquid supply device 200 supplies the processing liquid from the outer circulation pipe 60 to the nozzle 14 while the differential pressure adjustment in step S503 is being continued or after the differential pressure adjustment in step S503. supply.
- the processing liquid supplied to the nozzle 14 is discharged onto the substrate W by the nozzle 14 .
- the substrate W can be processed with the processing liquid with reduced particles.
- the nozzle 18 discharges the rinse liquid onto the substrate W in step S8. As a result, the processing liquid on the substrate W is washed away by the rinse liquid.
- the nozzle 18 discharges the rinse liquid onto the substrate W when the valve 19 is opened.
- the valve 19 is closed and the discharge of the rinse liquid from the nozzle 18 is stopped.
- the predetermined rinse period is predetermined experimentally and/or empirically, for example.
- step S9 the substrate W is dried by rotating it at high speed.
- the spin motor 13 accelerates the substrate W in the rotational direction, and rotates the substrate W at a high rotational speed that is higher than the rotational speed of the substrate W in steps S7 and S8. As a result, the liquid is removed from the substrate W and the substrate W is dried. After a predetermined drying period has elapsed since the substrate W started rotating at high speed, the spin motor 13 stops rotating. Then, the rotation of the substrate W is stopped.
- the predetermined drying period is predetermined experimentally and/or empirically, for example.
- the center robot CR unloads the substrate W from the processing unit 1 in step S10. That is, the processed substrate W is unloaded from the chamber 11 .
- the substrate processing method then ends.
- step S503 the differential pressure DF after the start of the outer circulation is made smaller than the differential pressure DF before the start of the outer circulation. As a result, it is possible to effectively suppress diffusion of particles from the filter 37 due to the differential pressure DF.
- step S501 the target output value set for the pump 34 during outer circulation is set to a value greater than the target output value set for the pump 34 during inner circulation. Therefore, sufficient ejection pressure can be secured for the nozzle 18 to eject the processing liquid onto the substrate W in step S7 (FIG. 4).
- FIG. 12 is a graph showing an example of the state of the pump 34, the first pressure P1, the second pressure P2, and the differential pressure DF. It should be noted that FIG. 2 is not a strict graph, but is referred to for an overview to facilitate understanding.
- the horizontal axes of graphs GP1 to GP4 indicate time.
- the vertical axis of graph GP1 indicates the state of pump 34 .
- the vertical axis of graph GP2 indicates the first pressure P1 on the primary side of filter 37 .
- the vertical axis of graph GP3 indicates the second pressure P2 on the secondary side of filter 37 .
- the vertical axis of the graph GP4 indicates the differential pressure DF between the first pressure P1 and the second pressure P2.
- the pump 34 in the off state (stopped state) is driven to start the inner circulation preparatory operation (step S2).
- the target output value of the pump 34 is set to the first target output value TG1.
- the valve 44 opens the flow path of the inner circulation pipe 61 . Therefore, as shown in graph GP2, the first pressure P1 rises during period T1 from time t1 to time t2. Then, at time t2, the first pressure P1 reaches the target pressure P11.
- the inner circulation preparatory operation (step S2) shown in FIG. 6 is performed.
- step S3 the inner circulation operation is started.
- the inner circulation operation is performed during a period T2 from time t2 to time t3.
- the first pressure P1 is substantially maintained at the target pressure P11 and is substantially constant.
- the valve 38 closes the second circulation pipe 602 of the outer circulation pipe 60, so the second pressure P2 is substantially zero. Therefore, as shown in the graph GP4, during the period T2, the differential pressure DF is substantially constant like the first pressure P1.
- Step S4 is started.
- the filter drain operation is an operation for discharging the processing liquid from the filter 37 to the drain pipe 62 .
- the filter draining operation is performed during a period T3 from time t3 to time t4.
- the first pressure P1 drops due to the execution of drainage from the filter 37.
- step S5 the external circulation operation (step S5) is started.
- the outer circulation operation is performed in period T4 after time t4.
- the target output value of the pump 34 is set to the second target output value TG2.
- the second target output value TG2 is greater than the first target output value TG1.
- the first pressure P1 increases. Then, at time t5, the first pressure P1 reaches the target pressure P12.
- the valve 43 increases the second pressure P2 to make the differential pressure DF after the start of the outer circulation higher than the differential pressure DF before the start of the outer circulation. also smaller.
- the valve 43 raises the second pressure P2 to make the differential pressure DF approximately zero after the outer circulation starts.
- the second pressure P2 reaches the target pressure P20.
- the target pressure P12 of the first pressure P1 and the target pressure P20 of the second pressure P2 are substantially the same.
- the first pressure P1 is maintained at the target pressure P12 and the second pressure P2 is maintained at the target pressure P20 during a period T42 from time t5 to time t6.
- the differential pressure DF is substantially zero as shown in the graph GP4.
- the control unit 21 changes the opening degree of the valve 43 to decrease the first pressure P1 and the second pressure P2. Then, the first pressure P1 is set to the target pressure P13, and the second pressure P2 is set to the target pressure P21. For example, at time t6, the opening degree of the valve 43 is increased to decrease the first pressure P1 and the second pressure P2.
- the target pressure P13 is lower than the target pressure P12 and higher than the target pressure P11.
- target pressure P21 is lower than target pressure P20.
- the target pressure P13 and the target pressure P21 are substantially the same.
- the differential pressure DF is substantially zero as shown in the graph GP4.
- the valve 5 is opened and the processing liquid is supplied from the outer circulation pipe 60 to the pipe 6.
- the nozzle 18 ejects the processing liquid onto the substrate W.
- the differential pressure DF is substantially zero as shown in graph GP4. Therefore, diffusion of particles from the filter 37 due to the differential pressure DF is suppressed. As a result, particles contained in the processing liquid discharged onto the substrate W from the nozzle 18 can be effectively reduced.
- FIG. Embodiment 2 differs from Embodiment 1 mainly in that external circulation drainage is performed in Embodiment 2.
- FIG. Further, the overall configurations of the substrate processing apparatus 100 and the processing unit 1 according to the second embodiment are similar to the overall configurations of the substrate processing apparatus 100 and the processing unit 1 according to the first embodiment described with reference to FIGS. 1 and 2, respectively. It is the same.
- the overall configuration of the processing liquid supply device 200 according to the second embodiment is the same as the overall configuration of the processing liquid supply device 200 according to the first embodiment described with reference to FIG.
- FIG. 4 will be referred to as appropriate in the description of the second embodiment. In the following, differences of the second embodiment from the first embodiment will be mainly described.
- the substrate processing method according to the second embodiment includes steps S1 to S10 as in the first embodiment. Further, steps S1 to S5 constitute the processing liquid distribution method according to the second embodiment, as in the first embodiment.
- Steps S1 to S4 according to the second embodiment are the same as steps S1 to S4 according to the first embodiment, respectively.
- Steps S6 to S10 according to the second embodiment are the same as steps S6 to S10 according to the first embodiment, respectively.
- step S5 according to the second embodiment is the same as step S5 according to the first embodiment in that the processing liquid supply device 200 externally circulates the processing liquid.
- Embodiment 2 differs from Embodiment 1 mainly in that external circulation drainage is performed.
- FIG. 13 is a flow chart showing the outer circulation operation performed in step S5 of FIG. 4 in the second embodiment.
- 14A and 14B are diagrams showing the external circulation and drainage operation of the processing liquid supply apparatus 200 according to the second embodiment.
- the processing liquid supply device 200 according to the second embodiment further includes a valve 51 , a valve 52 and a drainage pipe 53 .
- the drain pipe 53 branches off from the second flow pipe 602 downstream of the valve 43 .
- the valve 51 is arranged in the drainage pipe 53 and opens and closes the flow path of the drainage pipe 53 .
- the valve 52 is arranged in the second circulation pipe 602 downstream of the valve 43 and opens and closes the flow path of the second circulation pipe 602 .
- the valve 51 is closed in steps S1 to S4 and steps S6 to S10. Further, the valve 52 is closed in steps S1 to S4.
- FIG. 3 will be referred to as appropriate in the following description for easy understanding.
- step S5 (external circulation operation) according to the second embodiment includes steps S601 to S604.
- step S601 the control unit 21 changes the target output value of the pump 34 from the first target output value TG1 to the second target output value TG2 (TG2>TG1). .
- step S501 the first target output value
- step S601 valves 51 and 52 in FIG. 15 are closed.
- step S602 the treatment liquid starts to be discharged from the outer circulation pipe 60 (specifically, the second circulation pipe 602) to the drainage pipe 53. That is, in step S602, the processing liquid is discharged to the drainage pipe 53 extending from the outer circulation pipe 60 (specifically, the second circulation pipe 602).
- Step S602 corresponds to an example of the "second draining step” of the present invention.
- the drainage pipe 53 corresponds to an example of the "second drainage pipe” of the present invention.
- the control unit 21 opens the valves 38 and 43 of the flow rate adjustment mechanism 50 . Further, the controller 21 opens the valve 51 only during the second drainage period while the valve 52 is closed. Accordingly, the processing liquid flowing through the outer circulation pipe 60 (the second circulation pipe 602) is discharged from the liquid discharge pipe 53 together with the particles. As a result, particles contained in the processing liquid supplied to the substrate W can be effectively reduced. On the other hand, since the valve 52 is closed, the processing liquid does not circulate through the outer circulation pipe 60 .
- the second drainage period is predetermined experimentally and/or empirically, for example. After the second drain period has elapsed, the process proceeds to step S603.
- step S603 the control unit 21 stops discharging the processing liquid from the outer circulation pipe 60 (specifically, the second circulation pipe 602) to the drainage pipe 53, and starts the outer circulation. Specifically, the control unit 21 closes the valve 51 and opens the valve 52 while the valves 38 and 43 are open. Therefore, the discharge of the processing liquid is stopped, and the processing liquid stored in the processing liquid tank 30 circulates through the outer circulation pipe 60 .
- step S604 the control unit 21 adjusts the differential pressure DF between the first pressure P1 and the second pressure P2 using the valve 43 of the flow rate adjusting mechanism 50. Specifically, the control unit 21 determines that the differential pressure DF after the flow path of the outer circulation pipe 60 (specifically, the second circulation pipe 602) is opened is The valve 43 of the flow rate adjusting mechanism 50 is controlled so that the differential pressure DF becomes smaller than the differential pressure DF.
- Step S604 may be performed continuously while the treatment liquid is being externally circulated, or may be performed for a predetermined adjustment period from the start of external circulation in step S603. Otherwise, step S604 is the same as step S503 in FIG. Step S604 corresponds to an example of the "differential pressure adjustment step" of the present invention.
- step S604 the differential pressure DF after starting the external circulation is made smaller than the differential pressure DF before starting the external circulation. .
- the differential pressure DF is made smaller than the differential pressure DF before starting the external circulation.
- the processing liquid distribution method shown in FIG. 4 should include at least step S1, step S5, and step S201 (FIG. 5). This is because particles contained in the processing liquid can be effectively removed. Therefore, the processing liquid distribution method does not need to include steps S2 (except step S201), steps S3, and steps S4. However, the processing liquid distribution method may include one or more of steps S2 to S4.
- the order of steps S501 to S503 is not particularly limited as long as step S503 is executed after step S502. Further, in FIG. 9, for example, steps S501 to S503 may be executed substantially simultaneously. Further, in FIG. 13, for example, steps S2 and S3 may be performed after step S4. However, in this case, the external circulation is started before execution of step S4.
- step S5 In the process liquid distribution method shown in FIG. 4, after setting the target output value set for the pump 34 to a value smaller than the target output value set for the pump 34 during the inner circulation, the outer circulation in step S5 may be performed. In this case, before executing the outer circulation of step S5, the first pressure P1 is reduced in accordance with the reduction in the target output value of the pump 34, and the differential pressure DF between the first pressure P1 and the second pressure P2 is also reduced. . As a result, it is possible to more effectively suppress diffusion of particles from the filter 37 due to the differential pressure DF.
- control unit 21 changes the target output value of the pump 34 from the first target output value TG1 to the third target output value TG3, and after changing the target output value, the internal Stop circulation.
- control unit 21 changes the target output value of the pump 34 from the first target output value TG1 to the third target output value TG3, Stop draining after changing the output value.
- the third target output value TG3 is smaller than the first target output value TG1 (FIG. 12).
- step S602 of FIG. 13 the control unit 21 may open the valves 5, 8, 38, 43, and 52 and close the valve 51. In this case, a pre-dispense process is performed, and the nozzles 14 discharge the processing liquid to the standby pod 17 . Therefore, the processing liquid flowing through the outer circulation pipe 60 is discharged to the pipe 6 through the nozzle 14 and the standby pod 17 together with the particles. Then, in step S603 of FIG. 13, the control unit 21 closes the valves 5 and 8. As a result, external circulation of the processing liquid is performed.
- the target output value set for the pump 34 is changed, but in steps S1 to S10 of FIG. 4, the target output value set for the pump 34 may be constant.
- the differential pressure DF may be the absolute value of the difference between the first pressure P1 and the second pressure P2.
- the present invention relates to a processing liquid distribution method and a processing liquid supply device, and has industrial applicability.
- Nozzle 21 Control Unit 30 Processing Liquid Tank 34 Pump 37 Filter 50 Flow Control Mechanism 53 Drain Pipe (Second Drain Pipe) 60 outer circulation pipe (first pipe) 61 inner circulation pipe (second pipe) 62 drainage pipe (first drainage pipe) 200 treatment liquid supply device P1 first pressure gauge (first pressure detection unit) P2 Second pressure gauge (second pressure detection part) W substrate
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Abstract
Description
まず、図1を参照して、基板処理装置100を説明する。図1は、基板処理装置100の内部を示す平面図である。図1に示す基板処理装置100は、基板Wを処理液によって処理する。
図4、図13及び図14を参照して本発明の実施形態2に係る基板処理装置100を説明する。実施形態2では外循環排液を行う点で、実施形態2は主に実施形態1と異なる。また、実施形態2に係る基板処理装置100及び処理ユニット1の全体構成は、それぞれ、図1及び図2を参照して説明した実施形態1に係る基板処理装置100及び処理ユニット1の全体構成と同様である。更に、実施形態2に係る処理液供給装置200の全体構成は、図3を参照して説明した実施形態1に係る処理液供給装置200の全体構成と同様である。また、実施形態2に係る基板処理方法の全体構成は、図4を参照して説明した実施形態1に係る基板処理方法の全体構成と同様である。従って、実施形態2の説明において、図4を適宜参照する。以下、実施形態2が実施形態1と異なる点を主に説明する。
21 制御部
30 処理液タンク
34 ポンプ
37 フィルター
50 流量調整機構
53 排液配管(第2排液配管)
60 外循環配管(第1配管)
61 内循環配管(第2配管)
62 排液配管(第1排液配管)
200 処理液供給装置
P1 第1圧力計(第1圧力検出部)
P2 第2圧力計(第2圧力検出部)
W 基板
Claims (8)
- 基板に対して処理液を吐出するノズルに供給する前記処理液を流通させるための処理液流通方法であって、
第1配管に配置されて前記処理液に含まれるパーティクルを捕捉するフィルターの一次側の圧力を示す第1圧力と、前記フィルターの二次側の圧力を示す第2圧力とを監視する監視工程と、
前記フィルターよりも上流に配置されて前記処理液を前記第1配管に送り出すポンプを駆動する駆動工程と、
前記ポンプを駆動した状態において、閉じた状態の前記第1配管の流路を、前記フィルターよりも下流の位置で開くことで、前記第1配管に前記処理液を流通させる流通工程と
を含み、
前記流通工程は、前記第1圧力及び前記第2圧力の監視結果に基づいて、前記第1配管の流路が開かれた後の前記第1圧力と前記第2圧力との差圧を、前記第1配管の流路が開かれる前の前記第1圧力と前記第2圧力との差圧よりも小さくする差圧調整工程を含む、処理液流通方法。 - 前記第1配管の一端及び他端が前記処理液を貯留する処理液タンクに接続され、
前記流通工程では、前記第1配管を前記処理液が循環し、
前記差圧調整工程では、前記第1圧力及び前記第2圧力の監視結果に基づいて前記フィルターの二次側の圧力を調整することで、前記第1配管の流路が開かれた後の前記差圧を、前記第1配管の流路が開かれる前の前記差圧よりも小さくする、請求項1に記載の処理液流通方法。 - 前記駆動工程よりも後であって、前記流通工程よりも前において、前記第1配管から前記処理液タンクまでの延びる第2配管の流路を開くことで、前記第2配管において前記処理液を循環させる循環工程を更に含む、請求項2に記載の処理液流通方法。
- 前記循環工程よりも後であって、前記流通工程よりも前において、前記フィルターから延びる第1排液配管に前記処理液を排出する第1排液工程を更に含む、請求項3に記載の処理液流通方法。
- 前記流通工程では、前記ポンプに設定する目標出力値を、前記第2配管において前記処理液を循環させる時に前記ポンプに設定されている目標出力値よりも大きな値に設定する、請求項3又は請求項4に記載の処理液流通方法。
- 前記流通工程は、前記第1配管から延びる第2排液配管に前記処理液を排出する第2排液工程を含む、請求項1から請求項5のいずれか1項に記載の処理液流通方法。
- 前記差圧調整工程では、前記第1配管の流路が開かれた後の前記差圧が所定範囲内に入るように前記差圧を調整する、請求項1から請求項6のいずれか1項に記載の処理液流通方法。
- 基板に対して処理液を吐出するノズルに前記処理液を供給する処理液供給装置であって、
前記処理液が流れる第1配管と、
前記第1配管に配置され、前記処理液に含まれるパーティクルを捕捉するフィルターと、
前記フィルターの一次側の圧力を示す第1圧力を検出する第1圧力検出部と、
前記フィルターの二次側の圧力を示す第2圧力を検出する第2圧力検出部と、
前記フィルターよりも上流に配置されて前記処理液を前記第1配管に送り出すポンプと、
前記フィルターよりも下流において前記第1配管に配置され、前記第1配管を流れる前記処理液の流量を調整する流量調整機構と、
前記流量調整機構を制御する制御部と
を備え、
前記制御部は、
停止した状態の前記ポンプを駆動し、
前記ポンプを駆動した状態において、閉じた状態の前記第1配管の流路を開くように、前記流量調整機構を制御し、
前記第1圧力及び前記第2圧力の監視結果に基づいて、前記第1配管の流路が開かれた後の前記第1圧力と前記第2圧力との差圧が、前記第1配管の流路が開かれる前の前記第1圧力と前記第2圧力との差圧よりも小さくなるように、前記流量調整機構を制御する、処理液供給装置。
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