WO2022209860A1 - 弾性波装置 - Google Patents
弾性波装置 Download PDFInfo
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- WO2022209860A1 WO2022209860A1 PCT/JP2022/011662 JP2022011662W WO2022209860A1 WO 2022209860 A1 WO2022209860 A1 WO 2022209860A1 JP 2022011662 W JP2022011662 W JP 2022011662W WO 2022209860 A1 WO2022209860 A1 WO 2022209860A1
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- support
- wave device
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- elastic wave
- electrode
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Images
Classifications
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- H03H9/0514—Holders; Supports for bulk acoustic wave devices consisting of mounting pads or bumps
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Definitions
- the present invention relates to elastic wave devices.
- an elastic wave device described in Patent Document 1 below has a piezoelectric substrate, a support member provided on the piezoelectric substrate, and a cover member provided on the support member.
- This elastic wave device has a hollow space surrounded by a piezoelectric substrate, a support member, and a cover member.
- An IDT (Interdigital Transducer) electrode is provided on the piezoelectric substrate so as to face the hollow space.
- a recess is provided above the support member.
- a piezoelectric thin film is provided on the support member so as to cover the recess. That is, a hollow space is provided on the support member side.
- An IDT electrode is provided in a portion of the piezoelectric thin film that covers the recess.
- a package structure as described in Patent Document 1 may be used in an elastic wave device as described in Patent Document 2.
- the piezoelectric thin film may warp toward the hollow space provided on the supporting member side, and the piezoelectric thin film may stick to the supporting member, resulting in sticking.
- An object of the present invention is to provide an elastic wave device capable of suppressing sticking of the piezoelectric layer to the supporting member.
- An elastic wave device comprises: a support member including a support substrate; a piezoelectric substrate including a piezoelectric layer provided on the support member; a functional electrode provided on the piezoelectric layer; one support and a lid, wherein one of the at least one supports is provided on the piezoelectric substrate so as to surround the functional electrode, and a lid is provided on the support
- the support member is provided with a first cavity, the first cavity overlaps at least a part of the functional electrode in a plan view, and the piezoelectric substrate and the , the support provided between the piezoelectric substrate and the lid, and a second cavity surrounded by the lid, wherein the piezoelectric substrate, the piezoelectric substrate, and the lid are provided.
- the height of the first hollow portion is defined as the direction in which the support provided between the lid portions and the lid portion are laminated is the height direction, and the dimension along the height direction is the height. height is higher than the height of the second cavity.
- FIG. 1 is a schematic front cross-sectional view of an elastic wave device according to a first embodiment of the present invention.
- FIG. 2 is a schematic plan view showing the configuration on the piezoelectric substrate of the elastic wave device according to the first embodiment of the present invention.
- FIG. 3 is a schematic cross-sectional view showing a portion corresponding to FIG. 1 of an elastic wave device according to a first modification of the first embodiment of the invention.
- FIG. 4 is a schematic cross-sectional view showing a portion corresponding to FIG. 1 of an elastic wave device according to a second modification of the first embodiment of the invention.
- FIG. 5 is a schematic cross-sectional view showing a configuration on a piezoelectric substrate of an elastic wave device according to a third modification of the first embodiment of the invention.
- FIG. 1 is a schematic front cross-sectional view of an elastic wave device according to a first embodiment of the present invention.
- FIG. 2 is a schematic plan view showing the configuration on the piezoelectric substrate of the elastic wave device according
- FIG. 6 is a schematic plan view showing a portion corresponding to FIG. 1 of an elastic wave device according to a fourth modification of the first embodiment of the invention.
- FIG. 7 is a schematic front cross-sectional view of an elastic wave device according to a fifth modification of the first embodiment of the invention.
- FIG. 8 is a schematic plan view showing a configuration on a piezoelectric substrate of an acoustic wave device according to a second embodiment of the invention.
- FIG. 9 is a schematic plan view showing the configuration on the piezoelectric substrate of the acoustic wave device according to the first modification of the second embodiment of the invention.
- FIG. 10 is a schematic plan view showing a configuration on a piezoelectric substrate of an elastic wave device according to a second modification of the second embodiment of the invention.
- FIG. 11 is a schematic cross-sectional view showing the vicinity of the first support in the third embodiment of the invention.
- FIG. 12 is a schematic cross-sectional view showing the vicinity of a first support in a modification of the third embodiment of the invention.
- FIG. 13 is a schematic cross-sectional view showing the vicinity of the first support and the third support in the fourth embodiment of the invention.
- FIG. 14 is a schematic cross-sectional view showing a portion corresponding to FIG. 1 of an elastic wave device according to a fifth embodiment of the invention.
- FIG. 15 is a schematic cross-sectional view showing a portion corresponding to the portion shown in FIG. 1 of an elastic wave device according to a sixth embodiment of the invention.
- FIG. 16(a) is a schematic perspective view showing the external appearance of an elastic wave device that utilizes a thickness shear mode bulk wave
- FIG. 16(b) is a plan view showing an electrode structure on a piezoelectric layer
- FIG. 17 is a cross-sectional view of a portion taken along line AA in FIG. 16(a).
- FIG. 18(a) is a schematic front cross-sectional view for explaining a Lamb wave propagating through a piezoelectric film of an acoustic wave device
- FIG. 18(b) is a thickness shear propagating
- FIG. 2 is a schematic front cross-sectional view for explaining bulk waves in a mode;
- FIG. 19 is a diagram showing amplitude directions of bulk waves in the thickness shear mode.
- FIG. 19 is a diagram showing amplitude directions of bulk waves in the thickness shear mode.
- FIG. 20 is a diagram showing resonance characteristics of an elastic wave device that utilizes bulk waves in a thickness-shear mode.
- FIG. 21 is a diagram showing the relationship between d/p and the fractional bandwidth of the resonator, where p is the center-to-center distance between adjacent electrodes and d is the thickness of the piezoelectric layer.
- FIG. 22 is a plan view of an acoustic wave device that utilizes thickness shear mode bulk waves.
- FIG. 23 is a diagram showing the resonance characteristics of the elastic wave device of the reference example in which spurious appears.
- FIG. 24 is a diagram showing the relationship between the fractional bandwidth and the amount of phase rotation of the spurious impedance normalized by 180 degrees as the magnitude of the spurious.
- FIG. 25 is a diagram showing the relationship between d/2p and the metallization ratio MR.
- FIG. 26 is a diagram showing a map of fractional bandwidth with respect to Euler angles (0°, ⁇ , ⁇ ) of LiNbO 3 when d/p is infinitely close to 0.
- FIG. 27 is a partially cutaway perspective view for explaining an elastic wave device that utilizes Lamb waves.
- FIG. 1 is a schematic front cross-sectional view of an elastic wave device according to a first embodiment of the present invention.
- FIG. 2 is a schematic plan view showing the configuration on the piezoelectric substrate of the elastic wave device according to the first embodiment.
- an IDT electrode which will be described later, is shown by a schematic diagram in which two diagonal lines are added to a rectangle.
- FIG. 2 a dielectric film, which will be described later, is omitted.
- the same applies to schematic plan views other than FIG. 1 is a cross-sectional view schematically showing a portion along line II in FIG.
- the acoustic wave device 10 has a piezoelectric substrate 12 and an IDT electrode 11 as a functional electrode.
- the piezoelectric substrate 12 has a support member 13 and a piezoelectric layer 14 .
- support member 13 includes support substrate 16 and intermediate layer 15 .
- An intermediate layer 15 is provided on the support substrate 16 .
- a piezoelectric layer 14 is provided on the intermediate layer 15 .
- the support member 13 may be composed of only the support substrate 16 .
- the piezoelectric layer 14 has a first main surface 14a and a second main surface 14b.
- the first main surface 14a and the second main surface 14b face each other.
- the second principal surface 14b is located on the support member 13 side.
- the material of the support substrate 16 for example, semiconductors such as silicon, ceramics such as aluminum oxide, and the like can be used.
- the material of intermediate layer 15 may be any suitable dielectric such as silicon oxide or tantalum pentoxide.
- materials for the piezoelectric layer 14 include lithium niobate, lithium tantalate, zinc oxide, aluminum nitride, crystal, and PZT (lead zirconate titanate). It should be noted that the piezoelectric layer 14 is preferably a lithium tantalate layer such as a LiTaO 3 layer or a lithium niobate layer such as a LiNbO 3 layer.
- the support member 13 is provided with a first hollow portion 10a. More specifically, intermediate layer 15 is provided with a recess. A piezoelectric layer 14 is provided on the intermediate layer 15 so as to close the recess. This constitutes the first hollow portion 10a.
- the first hollow portion 10a may be provided in the intermediate layer 15 and the support substrate 16, or may be provided in the support substrate 16 only.
- the support member 13 may be provided with at least one first cavity 10a.
- a plurality of IDT electrodes 11 are provided on the first main surface 14a of the piezoelectric layer 14. As shown in FIG. Thereby, a plurality of elastic wave resonators are configured.
- the elastic wave device 10 in this embodiment is a filter device. In addition, the elastic wave device 10 only needs to have at least one IDT electrode 11 .
- An elastic wave device according to the present invention may include at least one elastic wave resonator.
- At least a portion of the IDT electrode 11 overlaps with the first cavity portion 10a in plan view. More specifically, as shown in FIG. 2, in this embodiment, a plurality of first cavities 10a are provided. In plan view, the IDT electrode 11 of each elastic wave resonator overlaps with the separate first cavity 10a. However, a plurality of IDT electrodes 11 may overlap the same first cavity 10a.
- plan view means viewing from a direction corresponding to the upper side in FIG.
- a plan view means viewing along the direction in which the later-described first support 18 and the lid portion 25 are stacked. In FIG. 1, for example, between the support substrate 16 and the piezoelectric layer 14, the piezoelectric layer 14 side is the upper side.
- a first support 18 and a plurality of second supports 19 are provided on the first main surface 14 a of the piezoelectric layer 14 .
- the first support 18 and the second support 19 are each a laminate of multiple metal layers.
- the first support 18 has a frame-like shape.
- the second support 19 has a columnar shape.
- the first support 18 is provided so as to surround the multiple IDT electrodes 11 and the multiple second supports 19 . More specifically, the first support 18 has an opening 18c.
- the plurality of IDT electrodes 11 and the plurality of second supports 19 are positioned within the opening 18c. At least one second support 19 may be provided.
- a frame-shaped electrode layer 17A is provided between the piezoelectric layer 14 and the first support 18.
- the electrode layer 17A surrounds the multiple IDT electrodes 11 and the multiple second supports 19 in plan view, similarly to the first support 18 .
- the electrode layer 17A may not be provided.
- Lids 25 are provided on the first support 18 and the plurality of second supports 19 so as to close the openings 18c.
- a second cavity 10b surrounded by the piezoelectric substrate 12, the electrode layer 17A, the first support 18 and the lid 25 is provided.
- a plurality of IDT electrodes 11 and a plurality of second supports 19 are arranged in the second cavity 10b.
- a feature of this embodiment is that when the direction in which the piezoelectric substrate 12, the first support 18, and the lid portion 25 are stacked is the height direction, and the dimension along the height direction is the height, the first cavity The height of the portion 10a is higher than the height of the second hollow portion 10b. As a result, sticking of the piezoelectric layer 14 to the support member 13 can be suppressed even when the piezoelectric layer 14 deforms convexly from the second cavity portion 10b side to the first cavity portion 10a side.
- a dielectric film 24 is provided on the piezoelectric substrate 12 so as to cover the IDT electrodes 11 .
- the IDT electrode 11 is less likely to be damaged.
- Silicon oxide, silicon nitride, or silicon oxynitride, for example, can be used for the dielectric film 24 . If the dielectric film 24 is made of silicon oxide, the frequency temperature characteristics can be improved. On the other hand, if the dielectric film 24 is made of silicon nitride or the like, the dielectric film 24 can be used as a frequency adjustment film. Note that the dielectric film 24 may not be provided.
- a through hole 20 is continuously provided in the piezoelectric layer 14 and the dielectric film 24 .
- the through hole 20 is provided so as to reach the first hollow portion 10a.
- the through-hole 20 is used for removing the sacrificial layer in the intermediate layer 15 when manufacturing the elastic wave device 10 .
- the through hole 20 may not necessarily be provided.
- the lid portion 25 has a lid portion main body 26, and an insulator layer 27A and an insulator layer 27B.
- the lid body 26 has a first major surface 26a and a second major surface 26b.
- the first main surface 26a and the second main surface 26b face each other.
- the second main surface 26b is located on the piezoelectric substrate 12 side.
- An insulator layer 27A is provided on the first main surface 26a.
- An insulator layer 27B is provided on the second main surface 26b.
- the main component of the lid body 26 is silicon.
- the material of the lid main body 26 is not limited to the above, it is preferable that the main component is a semiconductor such as silicon.
- the term "main component" refers to a component that accounts for more than 50% by weight.
- the insulator layers 27A and 27B are, for example, silicon oxide layers.
- a via electrode 21A is provided on the lid portion 25 as an under bump metal. More specifically, a through hole is provided in the lid portion 25 . The through hole is provided to reach the second support 19 .
- a via electrode 21A is provided in the through hole. One end of the via electrode 21A is connected to the second support 19 .
- An electrode pad 21B is provided so as to be connected to the other end of the via electrode 21A.
- the via electrode 21A and the electrode pad 21B are integrally provided. However, the via electrodes 21A and the electrode pads 21B may be provided separately.
- a bump 22 is joined to the electrode pad 21B.
- an insulator layer 27A is provided so as to cover the vicinity of the outer periphery of the electrode pad 21B.
- a bump 22 is joined to a portion of the electrode pad 21B that is not covered with the insulator layer 27A.
- the outer peripheral edge is the outer peripheral edge in plan view.
- the insulator layer 27A may extend between the electrode pad 21B and the lid body 26 .
- the insulator layer 27A may extend between the via electrode 21A and the lid portion main body 26 .
- the insulator layer 27A and the insulator layer 27B may be integrally provided through a through hole of the lid main body 26 .
- a plurality of wiring electrodes 23 are provided on the piezoelectric substrate 12 . Some of the wiring electrodes 23 connect the IDT electrodes 11 to each other. Some of the plurality of wiring electrodes 23 electrically connect the IDT electrodes 11 and the second support 19 . More specifically, a conductive film 17B is provided on the piezoelectric substrate 12 as shown in FIG. A second support 19 is provided on the conductive film 17B. Therefore, the wiring electrode 23 is electrically connected to the second support 19 via the conductive film 17B.
- the plurality of IDT electrodes 11 are electrically connected to the outside through wiring electrodes 23 , conductive films 17 B, second supports 19 , via electrodes 21 A, electrode pads 21 B and bumps 22 .
- the plurality of second supports 19 may include second supports 19 that are not connected to via electrodes 21A.
- the first support 18 has a first portion 18a and a second portion 18b.
- the first portion 18a is located on the lid portion 25 side, and the second portion 18b is located on the piezoelectric substrate 12 side. That is, the second portion 18b is located closer to the piezoelectric layer 14 in the height direction than the first portion 18a.
- the second portion 18b is a laminate. More specifically, the second portion 18b has a first layer 18d and a second layer 18e.
- the first portion 18a is a single-layer metal layer.
- the first portion 18a and the first layer 18d of the second portion 18b are made of the same metal.
- the first portion 18a and the first layer 18d are bonded.
- the first portion 18a and the first layer 18d constitute a first integrated portion.
- the first layer 18d and the second layer 18e are made of different metals.
- the second support 19 has a first portion 19a and a second portion 19b.
- the first portion 19a is located on the lid portion 25 side
- the second portion 19b is located on the piezoelectric substrate 12 side.
- the second portion 19b is a laminate. More specifically, the second portion 19b has a first layer 19d and a second layer 19e.
- the first portion 19a is a single-layer metal layer.
- the first portion 19a and the first layer 19d of the second portion 19b are made of the same metal.
- the first portion 19a and the first layer 19d are bonded.
- the first portion 19a and the first layer 19d constitute a second integrated portion.
- the first layer 19d and the second layer 19e are made of different metals.
- the first integral part and the second integral part are each made of, for example, Au.
- the second layer 18e of the second portion 18b and the second layer 19e of the second portion 19b of the first support 18 and the second support 19 are made of Al, for example.
- the phrase "a certain member is made of a certain material" includes the case where a minute amount of impurity is included to such an extent that the electrical characteristics of the elastic wave device are not deteriorated.
- first support 18 the first portion 18a and the first layer 18d of the second portion 18b do not have to be made of the same metal.
- second support 19 the first portion 19a and the first layer 19d of the second portion 19b do not have to be made of the same metal.
- the wiring electrode 23 is provided on the piezoelectric layer 14 over a portion that overlaps with the first cavity portion 10a in plan view and a portion that does not overlap with the first cavity portion 10a in plan view. preferably.
- the piezoelectric layer 14 can be prevented from bending from the side of the second cavity 10b toward the side of the first cavity 10a. Therefore, sticking of the piezoelectric layer 14 to the support member 13 can be effectively suppressed.
- the first portion 18a and the second portion 18b of the first support 18 preferably contain different metals.
- the first portion 19a and the second portion 19b of the second support 19 preferably comprise dissimilar metals. In these cases, it is difficult for stress to concentrate on the piezoelectric layer 14 . Therefore, it is possible to suppress bending of the piezoelectric layer 14 from the side of the second cavity 10b toward the side of the first cavity 10a. Therefore, sticking of the piezoelectric layer 14 to the support member 13 can be further suppressed.
- first portion 18a and the second portion 18b of the first support 18 do not have to contain metals different from each other.
- the first portion 19a and the second portion 19b of the second support 19 do not have to contain different metals.
- the present invention is particularly suitable because the piezoelectric layer 14 is more likely to bend from the second cavity 10b side to the first cavity 10a side.
- the area of the second hollow portion 10b in plan view is preferably larger than the area of the first hollow portion 10a in plan view.
- the area of the first hollow portion 10a in plan view specifically means the total area of the first hollow portion 10a in plan view.
- the total area of the plurality of first cavities 10a in plan view is the area of the first cavity 10a in plan view.
- the area of the second hollow portion 10b in plan view is the area of the portion surrounded by the first support 18 in plan view.
- at least one second support 19 is provided in a portion surrounded by the first supports 18 .
- the area of the second cavity 10b in plan view is the area obtained by subtracting the area of the second support 19 in plan view from the area of the portion surrounded by the first support 18 in plan view. is.
- the area of the first cavity 10a and the second cavity 10b in plan view may be simply referred to as area.
- the second support 19 is preferably arranged so as not to overlap the first hollow portion 10a in plan view. Thereby, the fragility of the portion where the second support 19 is provided can be reduced more reliably.
- the conductive film 17B and the wiring electrode 23 are preferably made of the same material.
- the conductive film 17B and the wiring electrode 23 are integrally provided. Thereby, productivity can be improved. Note that the conductive film 17B does not have to be connected to the wiring electrode 23 .
- the first support 18 and the plurality of second supports 19 are provided on the piezoelectric layer 14 of the piezoelectric substrate 12 .
- at least part of the first support 18 may be provided on a portion of the piezoelectric substrate 12 where the piezoelectric layer 14 is not provided.
- at least part of the second support 19 may be provided on a portion of the piezoelectric substrate 12 where the piezoelectric layer 14 is not provided.
- at least part of the first support 18 or the second support 19 may be provided on the intermediate layer 15 or on the support substrate 16 .
- the first to fourth modifications of the first embodiment will be shown below.
- the first to fourth modifications differ from the first embodiment only in the arrangement of the dielectric film, the arrangement of the IDT electrodes, the arrangement of the second support, or the arrangement of the wiring electrodes. Also in the first to fourth modifications, sticking of the piezoelectric layer to the support member can be suppressed. In addition, the fragility of the elastic wave device can be reduced without impeding the excitation of elastic waves.
- the dielectric film 24 is provided on the second main surface 14b of the piezoelectric layer 14 and not provided on the first main surface 14a.
- the dielectric film 24 is located inside the first cavity 10a.
- the dielectric film 24 may be provided integrally with the intermediate layer 15 .
- the dielectric film 24 and the intermediate layer 15 may be provided separately.
- the dielectric film 24 is provided on both the first main surface 14a and the second main surface 14b of the piezoelectric layer 14.
- At least a portion of the dielectric film 24 is provided in a portion of at least one of the first main surface 14a and the second main surface 14b of the piezoelectric layer 14, which overlaps the first hollow portion 10a in plan view. is preferred.
- the piezoelectric layer 14 is easily bent from the second cavity portion 10b side to the first cavity portion 10a side, so the present invention is particularly suitable.
- the IDT electrode 11 is provided on the second main surface 14b of the piezoelectric layer 14.
- Dielectric film 24 is provided on second main surface 14 b so as to cover IDT electrode 11 .
- At least one pair of second supports 19 are arranged to sandwich the IDT electrode 11 .
- the piezoelectric layer 14 is easily bent from the second cavity portion 10b side to the first cavity portion 10a side, so the present invention is particularly suitable.
- heat generated in the IDT electrode 11 can be released to the outside through at least one pair of second supports 19 . Therefore, heat dissipation can be improved.
- At least one second support 19 is preferably provided between the first support 18 and the IDT electrode 11, as shown in FIG. In this case, the second support 19 is not sandwiched between the multiple IDT electrodes 11 . Therefore, heat generated in one IDT electrode 11 can be efficiently dissipated through the second support 19 . This configuration is suitable when the IDT electrode 11 is particularly required to withstand electric power.
- the main component of the lid body 26 is a semiconductor.
- the lid portion 25 and the first support 18 are configured separately.
- the lid main body 26 may be made of resin.
- the first support 18A and the lid body 26A are made of resin, and the first support 18A and the lid body 26A are configured as a single unit.
- the first support 18A and the lid main body 26A are configured by providing the recesses in the resin layer.
- the recess overlaps the IDT electrode 11 in plan view.
- the recess is closed by the piezoelectric layer 14 .
- a dashed line in FIG. 7 is a boundary line between the first support 18A and the lid main body 26A.
- An insulator layer 27A is provided on the lid main body 26A, as in the first embodiment.
- the insulator layer 27B is not provided.
- no second support is provided.
- at least one second support made of resin may be provided integrally with the first support 18A and the lid main body 26A.
- at least one second support may be provided as in the first embodiment.
- a via electrode 21A penetrates the lid body 26A and the first support 18A.
- One end of the via electrode 21A is connected to the conductive film 17C.
- the conductive film 17C is composed of two metal layers. However, the conductive film 17C may be composed of a single metal layer as in the first embodiment.
- the height of the first hollow portion 10a is higher than the height of the second hollow portion.
- the area of the second cavity is larger than the area of the first cavity 10a. Therefore, sticking of the piezoelectric layer 14 to the support member 13 can be suppressed, as in the first embodiment.
- the fragility of the elastic wave device can be reduced without impeding the excitation of elastic waves.
- FIG. 8 is a schematic plan view showing the configuration on the piezoelectric substrate of the elastic wave device according to the second embodiment.
- This embodiment differs from the first embodiment in the arrangement of the second support 19, the IDT electrode 11, and the first cavity 10a, and the routing of wiring.
- This embodiment also differs from the first embodiment in that a second support 39 having a shape different from that of the second support 19 is provided. Except for the above points, the elastic wave device of this embodiment has the same configuration as the elastic wave device 10 of the first embodiment.
- the second support 39 has a wall-like shape. More specifically, the second support 39 has a rectangular shape in plan view.
- the wall-shaped second support 39 may include a portion extending in any one direction in plan view.
- the second support 39 may include curved portions in plan view.
- the columnar second support 19 is specifically columnar.
- the second support 19 may be prismatic or the like.
- the second support in the present invention may have one of a wall-like shape and a columnar shape.
- only the columnar second support 19 is provided as the second support.
- both the wall-shaped second support 39 and the column-shaped second support 19 are provided as the second support.
- only the wall-shaped second support 39 may be provided as the second support.
- the lid can be supported more reliably. Therefore, for example, when the cover is made of resin, a configuration in which the second support 39 is provided is suitable.
- the height of the first hollow portion 10a is higher than the height of the second hollow portion 10b.
- the area of the second cavity 10b is larger than the area of the first cavity 10a. Therefore, sticking of the piezoelectric layer 14 to the support member 13 can be suppressed, as in the first embodiment.
- the fragility of the elastic wave device can be reduced without impeding the excitation of elastic waves.
- the second support 39 is composed of a laminate of a plurality of metal layers.
- the second support 39 may be made of resin.
- An example of this is shown by the following first and second modifications of the second embodiment. In the first modification and the second modification, sticking of the piezoelectric layer 14 to the support member 13 can be suppressed as in the second embodiment. In addition, the fragility of the elastic wave device can be reduced without impeding the excitation of elastic waves.
- a second support 39A made of resin is provided over the two wiring electrodes 23.
- the second support 39A is provided on the other wiring electrode 23 via the piezoelectric layer 14 from one wiring electrode 23 .
- the two wiring electrodes 23 are connected to different potentials.
- the second support 39A is made of resin, it hardly affects the electrical characteristics of the elastic wave device.
- the portion above the wiring electrode 23 can be used as the portion where the second support 39A is provided, it is possible to easily reduce the size of the elastic wave device.
- three second supports 39A are provided.
- One second support 39A is provided as in the first variant.
- the other two second supports 39A are provided over the same wiring electrode 23 and the piezoelectric layer 14, respectively.
- a third hollow portion 30c is provided between two second supports 39A provided on the same wiring electrode 23 in plan view.
- the third hollow portion 30c is provided in the support member 13, similarly to the first hollow portion 10a.
- the third cavity 30c is not connected to the first cavity 10a.
- the third hollow portion 30c is provided independently.
- the third cavity 30c does not overlap the IDT electrode 11 in plan view.
- the third hollow portion 30c overlaps the wiring electrode 23 in plan view. This makes it easy to reduce the parasitic capacitance of the wiring electrode 23 .
- the third cavity 30c does not overlap the second support 39A.
- fragility can be more reliably reduced even in the portion where the third cavity portion 30c is provided.
- FIG. 11 is a schematic cross-sectional view showing the vicinity of the first support in the third embodiment.
- This embodiment differs from the first embodiment in the configuration of the first support 48 . Except for the above points, this embodiment has the same configuration as the first embodiment. Therefore, in this embodiment, as in the first embodiment, the height of the first cavity is higher than the height of the second cavity. Therefore, sticking of the piezoelectric layer to the support member can be suppressed.
- both the first portion 48a and the second portion 48b are laminates.
- the first portion 48a has a first layer 48g, a second layer 48h and a third layer 48i.
- the second portion 48b has a first layer 48d, a second layer 48e and a third layer 48f.
- the number of layers of the first portion 48a and the second portion 48b may be two, or may be three or more.
- first layer 48g In the first portion 48a, a first layer 48g, a second layer 48h and a third layer 48i are laminated in this order.
- the first layer 48g is the portion of the first portion 48a closest to the second portion 48b.
- a first layer 48d, a second layer 48e and a third layer 48f are laminated in this order.
- the first layer 48d is the portion of the second portion 48b closest to the first portion 48a.
- a first integrated portion is configured by the first layer 48g and the first layer 48d of the first portion 48a and the second portion 48b, respectively.
- the first support 48 has a frame-like shape, as in the first embodiment.
- the width of the first layer 48g of the first portion 48a and the width of the first layer 48d of the second portion 48b are different from each other. Accordingly, in plan view, the area of the first layer 48g of the first portion 48a and the area of the first layer 48d of the second portion 48b are different from each other.
- the width of each portion of the first support 48 is as follows. That is, the width is perpendicular to both the direction in which the piezoelectric substrate 12 , the first support 48 and the lid portion 25 are laminated, and the direction in which the first support 48 extends on the piezoelectric substrate 12 . 2 is the dimension of each portion of the first support 48 along the direction of
- the strength of the first support 48 can be increased more reliably. More specifically, for example, the first portion 48 a of the first support 48 is formed on the lid portion 25 when manufacturing the elastic wave device. On the other hand, a second portion 48b of the first support 48 is formed on the piezoelectric substrate 12. As shown in FIG. The first portion 48a and the second portion 48b are then joined together.
- the area of the first portion 48a and the area of the second portion 48b are different from each other in plan view. Specifically, in plan view, the area of the first layer 48g of the first portion 48a and the area of the first layer 48d of the second portion 48b are different from each other. Thereby, it is easy to make the bonding area of the first portion 48a and the second portion 48b constant.
- the bonding area can be kept constant. Therefore, the strength of the first support 48 can be increased more reliably.
- the support including the first support and the second support in each embodiment described in this specification among the adjacent layers, the inner side of the outer peripheral edge of the layer having a large area in plan view , where the layer with the smaller area is located.
- the area of each portion of the first support 48 in plan view is simply referred to as area.
- the area of all layers other than the first layer 48d is larger than the area of the first layer 48d. Therefore, the area of the second layer 48e is larger than the area of the first layer 48d. Thereby, all portions of the first layer 48d can be easily formed on the second layer 48e. Thereby, the planar accuracy of the first layer 48d can be improved. Therefore, the bonding strength between the first portion 48a and the second portion 48b can be increased more reliably, and hermetic sealing can be performed more reliably. Moreover, hermetic sealing can be performed more reliably without providing a bonding agent made of Sn or the like between the first portion 48a and the second portion 48b. Therefore, productivity can be effectively improved.
- the area of all layers other than the first layer 48g is larger than the area of the first layer 48g. Therefore, the bonding strength between the first portion 48a and the second portion 48b can be increased more reliably, and airtight sealing can be performed more reliably.
- the layers farther from the layers forming the first integrated portion have a larger area. More specifically, the area of the third layer 48i of the first portion 48a is greater than the area of the second layer 48h, and the area of the second layer 48h is greater than the area of the first layer 48g. preferable.
- the area of the third layer 48f of the second portion 48b is larger than the area of the second layer 48e, and the area of the second layer 48e is larger than the area of the first layer 48d.
- the first integral part is preferably made of Au. In this case, electrical resistance can be reduced.
- One of the first portion 48a and the second portion 48b may be a laminate.
- the one having the smaller area of the portion constituting the first joint portion is preferably the laminate.
- the area of at least one layer other than the first layer 48d may be larger than the area of the first layer 48d.
- the area of each layer of the second portion 48x is larger in the order of the third layer 48f, the first layer 48j and the second layer 48e.
- the first layer 48j is provided on the third layer 48f so as to cover the second layer 48e. Even in this case, the first layer 48j can be easily formed on the third layer 48f, and the planar accuracy of the portion of the first layer 48j located on the second layer 48e can be improved. can be enhanced.
- sticking of the piezoelectric layer to the support member can be suppressed, as in the third embodiment.
- At least one frame-like support such as the first support 48 should be provided.
- the configuration of the first support 48 provided between the piezoelectric substrate 12 and the lid portion 25 is shown.
- At least one frame-shaped support may include a support provided between the support substrate and the piezoelectric layer.
- the frame-shaped support provided between the support substrate and the piezoelectric layer will be referred to as a third support.
- An example in which the third support is configured similarly to the first support 48 is shown by the fourth embodiment.
- FIG. 13 is a schematic cross-sectional view showing the vicinity of the first support and the third support in the fourth embodiment.
- This embodiment differs from the third embodiment in that the support member 53 does not have an intermediate layer and has a third support 58 . Except for the above points, the elastic wave device of this embodiment has the same configuration as the elastic wave device of the third embodiment.
- a third support 58 is provided on the support substrate 16 .
- a piezoelectric layer 14 is provided on the third support 58 .
- the third support 58 has a frame-like shape.
- the first cavity 50 a is a cavity surrounded by the piezoelectric layer 14 , the third support 58 and the support substrate 16 .
- the height of the third support 58 is greater than the height of the first support 48 . Therefore, also in this embodiment, the height of the first cavity portion 50a is higher than the height of the second cavity portion 10b. Therefore, sticking of the piezoelectric layer 14 to the support member 53 can be suppressed.
- the support member 53 may have at least one fourth support.
- the fourth support is arranged, for example, so as to overlap the second support in plan view.
- a fourth support is provided on the support substrate 16 .
- a piezoelectric layer is provided on the fourth support.
- the third support 58 is configured similarly to the first support 48 except for size. Specifically, the third support 58 has a first portion 58a and a second portion 58b. Of the first portion 58a and the second portion 58b, the first portion 58a is located on the support substrate 16 side, and the second portion 58b is located on the piezoelectric layer 14 side. That is, the second portion 58b is positioned closer to the piezoelectric layer 14 than the first portion 58a in the height direction.
- both the first portion 58a and the second portion 58b are laminates.
- the first portion 58a has a first layer 58g, a second layer 58h and a third layer 58i.
- the second portion 58b has a first layer 58d, a second layer 58e and a third layer 58f.
- the number of layers of the first portion 58a and the second portion 58b may be two, or may be three or more.
- first layer 58g In the first portion 58a, a first layer 58g, a second layer 58h and a third layer 58i are laminated in this order.
- the first layer 58g is the portion of the first portion 58a closest to the second portion 58b.
- a first layer 58d, a second layer 58e and a third layer 58f are laminated in this order.
- the first layer 58d is the portion of the second portion 58b closest to the first portion 58a.
- the first layer 58g and the first layer 58d of the first portion 58a and the second portion 58b, respectively, are made of the same material.
- a first integrated portion is configured by the first layer 58g and the first layer 58d of the first portion 58a and the second portion 58b, respectively.
- the area of each portion of the third support 58 in plan view is simply referred to as area.
- the area of all layers other than the first layer 58d is larger than the area of the first layer 58d.
- the area of at least one layer other than the first layer 58d may be larger than the area of the first layer 58d. Therefore, the planar accuracy of the first layer 58d can be improved. Therefore, the bonding strength between the first portion 58a and the second portion 58b can be increased more reliably, and hermetic sealing can be performed more reliably.
- the area of all layers other than the first layer 58g is larger than the area of the first layer 58g.
- the area of at least one layer other than the first layer 58g may be larger than the area of the first layer 58g.
- a layer farther from the layer forming the first integral part has a larger area. More specifically, it is preferable that the area of the third layer 58i of the first portion 58a is larger than the area of the second layer 58h, and the area of the second layer 58h is larger than the area of the first layer 58g. .
- the area of the third layer 58f of the second portion 58b is larger than the area of the second layer 58e, and the area of the second layer 58e is larger than the area of the first layer 58d.
- the planar accuracy of the first layer 58g and the first layer 58d of the first portion 58a and the second portion 58b can be more reliably improved. Therefore, it is possible to more reliably and effectively reduce variations in bonding area between the first portion 58a and the second portion 58b.
- One of the first portion 58a and the second portion 58b may be a laminate.
- the one having the smaller area of the portion forming the joint portion is preferably the laminate.
- the area of the first cavity 50a may be made smaller than the area of the second cavity 10b.
- the area of the first hollow portion 50a is calculated from the area of the portion surrounded by the third support 58 in a plan view. It is the area obtained by subtracting the area in plan view.
- the area of the first hollow portion 50a may be reduced by forming the fourth support into a wall-like shape. Thereby, the fragility of the elastic wave device can be reduced without disturbing the excitation of the elastic wave.
- the height of the third support 58 is higher than the height of the first support 48 .
- the areas of the first cavity 50a and the second cavity 10b may be the same.
- the thickness of at least one layer in the third support 58 is thicker than the thickness of at least one layer in the first support 48 so that the height of the third support 58 is greater than that of the first support 48 .
- the number of layers of the third support 58 is greater than the number of layers of the first support 48, so that the height of the third support 58 is higher than the height of the first support 48.
- support member 53 may include an intermediate layer.
- FIG. 14 is a schematic cross-sectional view showing a portion corresponding to FIG. 1 of the elastic wave device according to the fifth embodiment.
- This embodiment differs from the first embodiment in the configuration of the second support 69 .
- This embodiment also differs from the first embodiment in that the second support 69 shown in FIG. 14 is not connected to the via electrode. Except for the above points, the elastic wave device of this embodiment has the same configuration as the elastic wave device 10 of the first embodiment.
- the first integral portion is constituted by the first layer 18d of the first portion 18a and the second portion 18b.
- the first part 19a and the first layer 19d of the second part 19b constitute a second integral part.
- the width of the portion of the first layer 19d of the second integrated portion in one second support 69 is the width of the narrowest portion of the first integrated portion of the first support 18. Narrower than wide.
- the width of at least a portion of the second integral portion in at least one second support 69 should be narrower than the width of the first integral portion.
- the width of each part of the second support 69 means the width of the second support 69 along the direction orthogonal to the direction in which the piezoelectric substrate 12, the second support 69 and the lid portion 25 are laminated. are the dimensions of each part of
- the width of the portion of the second integrated portion that is narrower than the width of the first integrated portion is 1 ⁇ m or more. Thereby, the electrical resistance of the second support 69 can be lowered, and the second support 69 can be used as wiring. It is preferable that the width of the portion of the second integrated portion that is narrower than the width of the first integrated portion is less than 16 ⁇ m. As a result, the acoustic wave device can be more reliably made compact.
- the height of the first cavity 10a is higher than the height of the second cavity 10b. Therefore, sticking of the piezoelectric layer 14 to the support member 13 can be suppressed.
- Each elastic wave resonator in the first to fifth embodiments or each modified example is configured to be able to use bulk waves in a thickness-shlip mode such as a thickness-shlip primary mode, for example.
- Each elastic wave resonator may be configured to be able to use Lamb waves, or may be configured to be able to use bulk waves other than bulk waves in the thickness-shear mode.
- An example in which the elastic wave resonator is a BAW (Bulk Acoustic Wave) element is shown below.
- FIG. 15 is a schematic cross-sectional view showing a portion corresponding to the portion shown in FIG. 1 of the elastic wave device according to the sixth embodiment.
- This embodiment differs from the first embodiment in that the functional electrode has an upper electrode 71A and a lower electrode 71B. This embodiment also differs from the first embodiment in that the dielectric film 24 is not provided. Except for the above points, the elastic wave device 70 of this embodiment has the same configuration as the elastic wave device 10 of the first embodiment.
- the upper electrode 71A is provided on the first main surface 14a of the piezoelectric layer 14.
- the lower electrode 71B is provided on the second main surface 14b of the piezoelectric layer 14. As shown in FIG.
- the upper electrode 71A and the lower electrode 71B face each other with the piezoelectric layer 14 interposed therebetween.
- the upper electrode 71A and the lower electrode 71B are connected to potentials different from each other.
- a region where the upper electrode 71A and the lower electrode 71B face each other is an excitation region. By applying an AC electric field between the upper electrode 71A and the lower electrode 71B, elastic waves are excited in the excitation region.
- the conductive film 17B, the wiring electrode 23 and the upper electrode 71A are integrally provided.
- the conductive film 17B, the wiring electrode 23 and the upper electrode 71A may be provided separately.
- the dielectric film 24 shown in FIG. 1 may be provided so as to cover the upper electrode 71A or the lower electrode 71B as the excitation electrode. In this case, the upper electrode 71A or the lower electrode 71B is less likely to break.
- the height of the first cavity 10a is higher than the height of the second cavity 10b.
- the IDT electrode 11 has the structure of an IDT electrode, which will be described later.
- An "electrode” in the IDT electrode corresponds to an electrode finger in the present invention.
- the supporting member in the following examples corresponds to the supporting substrate in the present invention.
- FIG. 16(a) is a schematic perspective view showing the external appearance of an elastic wave device that utilizes a thickness shear mode bulk wave
- FIG. 16(b) is a plan view showing an electrode structure on a piezoelectric layer
- FIG. 17 is a cross-sectional view of a portion taken along line AA in FIG. 16(a).
- the acoustic wave device 1 has a piezoelectric layer 2 made of LiNbO 3 .
- the piezoelectric layer 2 may consist of LiTaO 3 .
- the cut angle of LiNbO 3 and LiTaO 3 is Z-cut, but may be rotational Y-cut or X-cut.
- the thickness of the piezoelectric layer 2 is not particularly limited, it is preferably 40 nm or more and 1000 nm or less, more preferably 50 nm or more and 1000 nm or less, in order to effectively excite the thickness-shear mode.
- the piezoelectric layer 2 has first and second major surfaces 2a and 2b facing each other. Electrodes 3 and 4 are provided on the first main surface 2a.
- the electrode 3 is an example of the "first electrode” and the electrode 4 is an example of the "second electrode”.
- 16(a) and 16(b) a plurality of electrodes 3 are connected to the first bus bar 5.
- a plurality of electrodes 4 are connected to a second bus bar 6 .
- the plurality of electrodes 3 and the plurality of electrodes 4 are interleaved with each other.
- Electrodes 3 and 4 have a rectangular shape and a length direction.
- the electrode 3 and the adjacent electrode 4 face each other in a direction perpendicular to the length direction. Both the length direction of the electrodes 3 and 4 and the direction orthogonal to the length direction of the electrodes 3 and 4 are directions crossing the thickness direction of the piezoelectric layer 2 .
- the electrode 3 and the adjacent electrode 4 face each other in the direction crossing the thickness direction of the piezoelectric layer 2 .
- the length direction of the electrodes 3 and 4 may be interchanged with the direction perpendicular to the length direction of the electrodes 3 and 4 shown in FIGS. 16(a) and 16(b). That is, in FIGS. 16A and 16B, the electrodes 3 and 4 may extend in the direction in which the first busbar 5 and the second busbar 6 extend. In that case, the first busbar 5 and the second busbar 6 extend in the direction in which the electrodes 3 and 4 extend in FIGS. 16(a) and 16(b).
- a plurality of pairs of structures in which an electrode 3 connected to one potential and an electrode 4 connected to the other potential are adjacent to each other are provided in a direction perpendicular to the length direction of the electrodes 3 and 4.
- the electrodes 3 and 4 are adjacent to each other, it does not mean that the electrodes 3 and 4 are arranged so as to be in direct contact with each other, but that the electrodes 3 and 4 are arranged with a gap therebetween. point to When the electrodes 3 and 4 are adjacent to each other, no electrodes connected to the hot electrode or the ground electrode, including the other electrodes 3 and 4, are arranged between the electrodes 3 and 4.
- the logarithms need not be integer pairs, but may be 1.5 pairs, 2.5 pairs, or the like.
- the center-to-center distance or pitch between the electrodes 3 and 4 is preferably in the range of 1 ⁇ m or more and 10 ⁇ m or less.
- the width of the electrodes 3 and 4, that is, the dimension in the facing direction of the electrodes 3 and 4 is preferably in the range of 50 nm or more and 1000 nm or less, more preferably in the range of 150 nm or more and 1000 nm or less.
- the center-to-center distance between the electrodes 3 and 4 means the distance between the center of the dimension (width dimension) of the electrode 3 in the direction orthogonal to the length direction of the electrode 3 and the distance between the center of the electrode 4 in the direction orthogonal to the length direction of the electrode 4. It is the distance connecting the center of the dimension (width dimension) of
- the direction perpendicular to the length direction of the electrodes 3 and 4 is the direction perpendicular to the polarization direction of the piezoelectric layer 2 .
- “perpendicular” is not limited to being strictly perpendicular, but is substantially perpendicular (the angle formed by the direction perpendicular to the length direction of the electrodes 3 and 4 and the polarization direction is, for example, 90° ⁇ 10°). within the range).
- a supporting member 8 is laminated on the second main surface 2b side of the piezoelectric layer 2 with an insulating layer 7 interposed therebetween.
- the insulating layer 7 and the support member 8 have a frame shape and, as shown in FIG. 17, have through holes 7a and 8a.
- a cavity 9 is thereby formed.
- the cavity 9 is provided so as not to disturb the vibration of the excitation region C of the piezoelectric layer 2 . Therefore, the support member 8 is laminated on the second main surface 2b with the insulating layer 7 interposed therebetween at a position not overlapping the portion where at least one pair of electrodes 3 and 4 are provided. Note that the insulating layer 7 may not be provided. Therefore, the support member 8 can be directly or indirectly laminated to the second main surface 2b of the piezoelectric layer 2 .
- the insulating layer 7 is made of silicon oxide. However, in addition to silicon oxide, suitable insulating materials such as silicon oxynitride and alumina can be used.
- the support member 8 is made of Si. The plane orientation of the surface of Si on the piezoelectric layer 2 side may be (100), (110), or (111). It is desirable that the Si constituting the support member 8 has a high resistivity of 4 k ⁇ cm or more. However, the support member 8 can also be constructed using an appropriate insulating material or semiconductor material.
- Materials for the support member 8 include, for example, aluminum oxide, lithium tantalate, lithium niobate, piezoelectric materials such as crystal, alumina, magnesia, sapphire, silicon nitride, aluminum nitride, silicon carbide, zirconia, cordierite, mullite, and steer.
- Various ceramics such as tight and forsterite, dielectrics such as diamond and glass, and semiconductors such as gallium nitride can be used.
- the plurality of electrodes 3, 4 and the first and second bus bars 5, 6 are made of appropriate metals or alloys such as Al, AlCu alloys.
- the electrodes 3 and 4 and the first and second bus bars 5 and 6 have a structure in which an Al film is laminated on a Ti film. Note that an adhesion layer other than the Ti film may be used.
- d/p is 0.0, where d is the thickness of the piezoelectric layer 2 and p is the center-to-center distance between any one of the pairs of electrodes 3 and 4 adjacent to each other. 5 or less. Therefore, the thickness-shear mode bulk wave is effectively excited, and good resonance characteristics can be obtained. More preferably, d/p is 0.24 or less, in which case even better resonance characteristics can be obtained.
- the elastic wave device 1 Since the elastic wave device 1 has the above configuration, even if the logarithm of the electrodes 3 and 4 is reduced in an attempt to reduce the size, the Q value is unlikely to decrease. This is because the propagation loss is small even if the number of electrode fingers in the reflectors on both sides is reduced. Moreover, the fact that the number of electrode fingers can be reduced is due to the fact that bulk waves in the thickness-shear mode are used. The difference between the Lamb wave used in the elastic wave device and the bulk wave in the thickness shear mode will be described with reference to FIGS. 18(a) and 18(b).
- FIG. 18(a) is a schematic front cross-sectional view for explaining a Lamb wave propagating through a piezoelectric film of an acoustic wave device as described in Japanese Unexamined Patent Publication No. 2012-257019.
- waves propagate through the piezoelectric film 201 as indicated by arrows.
- the first main surface 201a and the second main surface 201b face each other, and the thickness direction connecting the first main surface 201a and the second main surface 201b is the Z direction. is.
- the X direction is the direction in which the electrode fingers of the IDT electrodes are arranged.
- the Lamb wave propagates in the X direction as shown.
- the wave is generated on the first main surface 2a and the second main surface of the piezoelectric layer 2. 2b, ie, the Z direction, and resonate. That is, the X-direction component of the wave is significantly smaller than the Z-direction component. Further, since resonance characteristics are obtained by propagating waves in the Z direction, propagation loss is unlikely to occur even if the number of electrode fingers of the reflector is reduced. Furthermore, even if the number of electrode pairs consisting of the electrodes 3 and 4 is reduced in an attempt to promote miniaturization, the Q value is unlikely to decrease.
- FIG. 19 schematically shows bulk waves when a voltage is applied between the electrodes 3 and 4 so that the potential of the electrode 4 is higher than that of the electrode 3 .
- the first region 451 is a region of the excitation region C between the first main surface 2a and a virtual plane VP1 that is perpendicular to the thickness direction of the piezoelectric layer 2 and bisects the piezoelectric layer 2 .
- the second region 452 is a region of the excitation region C between the virtual plane VP1 and the second main surface 2b.
- the acoustic wave device 1 at least one pair of electrodes consisting of the electrodes 3 and 4 is arranged.
- the number of electrode pairs need not be plural. That is, it is sufficient that at least one pair of electrodes is provided.
- the electrode 3 is an electrode connected to a hot potential
- the electrode 4 is an electrode connected to a ground potential.
- electrode 3 may also be connected to ground potential and electrode 4 to hot potential.
- at least one pair of electrodes is an electrode connected to a hot potential or an electrode connected to a ground potential, as described above, and no floating electrodes are provided.
- FIG. 20 is a diagram showing resonance characteristics of the elastic wave device shown in FIG.
- the design parameters of the elastic wave device 1 with this resonance characteristic are as follows.
- Insulating layer 7 Silicon oxide film with a thickness of 1 ⁇ m.
- Support member 8 Si.
- the length of the excitation region C is the dimension along the length direction of the electrodes 3 and 4 of the excitation region C.
- the inter-electrode distances of the electrode pairs consisting of the electrodes 3 and 4 are all the same in a plurality of pairs. That is, the electrodes 3 and 4 were arranged at equal pitches.
- d/p is more preferably 0.5 or less, as described above. is less than or equal to 0.24. This will be described with reference to FIG.
- FIG. 21 is a diagram showing the relationship between this d/p and the fractional bandwidth of the acoustic wave device as a resonator.
- the specific bandwidth when d/p>0.5, even if d/p is adjusted, the specific bandwidth is less than 5%.
- the specific bandwidth when d/p ⁇ 0.5, the specific bandwidth can be increased to 5% or more by changing d/p within that range. can be configured. Further, when d/p is 0.24 or less, the specific bandwidth can be increased to 7% or more.
- d/p when adjusting d/p within this range, a resonator with a wider specific band can be obtained, and a resonator with a higher coupling coefficient can be realized. Therefore, by setting d/p to 0.5 or less, it is possible to construct a resonator having a high coupling coefficient using the thickness-shear mode bulk wave.
- FIG. 22 is a plan view of an elastic wave device that utilizes thickness-shear mode bulk waves.
- elastic wave device 80 a pair of electrodes having electrode 3 and electrode 4 is provided on first main surface 2 a of piezoelectric layer 2 .
- K in FIG. 22 is the crossing width.
- the number of pairs of electrodes may be one. Even in this case, if d/p is 0.5 or less, bulk waves in the thickness-shear mode can be effectively excited.
- the adjacent excitation region C is an overlapping region when viewed in the direction in which any adjacent electrodes 3 and 4 are facing each other. It is desirable that the metallization ratio MR of the mating electrodes 3, 4 satisfy MR ⁇ 1.75(d/p)+0.075. In that case, spurious can be effectively reduced. This will be described with reference to FIGS. 23 and 24.
- the metallization ratio MR will be explained with reference to FIG. 16(b).
- the excitation region C is the portion surrounded by the dashed-dotted line.
- the excitation region C is a region where the electrode 3 and the electrode 4 overlap each other when the electrodes 3 and 4 are viewed in a direction perpendicular to the length direction of the electrodes 3 and 4, i.e., in a facing direction. 3 and an overlapping area between the electrodes 3 and 4 in the area between the electrodes 3 and 4 .
- the area of the electrodes 3 and 4 in the excitation region C with respect to the area of the excitation region C is the metallization ratio MR. That is, the metallization ratio MR is the ratio of the area of the metallization portion to the area of the excitation region C.
- MR may be the ratio of the metallization portion included in the entire excitation region to the total area of the excitation region.
- FIG. 24 is a diagram showing the relationship between the fractional bandwidth and the amount of phase rotation of the spurious impedance normalized by 180 degrees as the magnitude of the spurious when a large number of acoustic wave resonators are configured according to this embodiment. be.
- the ratio band was adjusted by changing the film thickness of the piezoelectric layer and the dimensions of the electrodes.
- FIG. 24 shows the results obtained when a piezoelectric layer made of Z-cut LiNbO 3 is used, but the same tendency is obtained when piezoelectric layers with other cut angles are used.
- the spurious is as large as 1.0.
- the fractional band exceeds 0.17, that is, when it exceeds 17%, even if a large spurious with a spurious level of 1 or more changes the parameters constituting the fractional band, the passband appear within. That is, as in the resonance characteristics shown in FIG. 23, a large spurious component indicated by arrow B appears within the band. Therefore, the specific bandwidth is preferably 17% or less. In this case, by adjusting the film thickness of the piezoelectric layer 2 and the dimensions of the electrodes 3 and 4, the spurious response can be reduced.
- FIG. 25 is a diagram showing the relationship between d/2p, metallization ratio MR, and fractional bandwidth.
- various elastic wave devices having different d/2p and MR were constructed, and the fractional bandwidth was measured.
- the hatched portion on the right side of the dashed line D in FIG. 25 is the area where the fractional bandwidth is 17% or less.
- FIG. 26 is a diagram showing a map of fractional bandwidth with respect to Euler angles (0°, ⁇ , ⁇ ) of LiNbO 3 when d/p is infinitely close to 0.
- FIG. The hatched portion in FIG. 26 is a region where a fractional bandwidth of at least 5% or more is obtained, and when the range of the region is approximated, the following formulas (1), (2) and (3) ).
- Equation (1) (0° ⁇ 10°, 20° to 80°, 0° to 60° (1-( ⁇ -50) 2 /900) 1/2 ) or (0° ⁇ 10°, 20° to 80°, [180 °-60° (1-( ⁇ -50) 2 /900) 1/2 ] ⁇ 180°) Equation (2) (0° ⁇ 10°, [180°-30°(1-( ⁇ -90) 2 /8100) 1/2 ] ⁇ 180°, arbitrary ⁇ ) Equation (3)
- the fractional band can be sufficiently widened, which is preferable.
- the piezoelectric layer 2 is a lithium tantalate layer.
- FIG. 27 is a partially cutaway perspective view for explaining an elastic wave device that utilizes Lamb waves.
- the elastic wave device 81 has a support substrate 82 .
- the support substrate 82 is provided with a concave portion that is open on the upper surface.
- a piezoelectric layer 83 is laminated on the support substrate 82 .
- a hollow portion 9 is thereby formed.
- An IDT electrode 84 is provided on the piezoelectric layer 83 above the cavity 9 .
- Reflectors 85 and 86 are provided on both sides of the IDT electrode 84 in the elastic wave propagation direction.
- the outer periphery of the hollow portion 9 is indicated by broken lines.
- the IDT electrode 84 has first and second bus bars 84a and 84b, a plurality of first electrode fingers 84c and a plurality of second electrode fingers 84d.
- the plurality of first electrode fingers 84c are connected to the first busbar 84a.
- the plurality of second electrode fingers 84d are connected to the second busbar 84b.
- the plurality of first electrode fingers 84c and the plurality of second electrode fingers 84d are interposed.
- a Lamb wave as a plate wave is excited by applying an AC electric field to the IDT electrodes 84 on the cavity 9. Since the reflectors 85 and 86 are provided on both sides, the resonance characteristics due to the Lamb wave can be obtained.
- the elastic wave device of the present invention may use plate waves.
- the IDT electrodes 84, the reflectors 85, and the reflectors 86 shown in FIG. 27 may be provided on the piezoelectric layer in the first to fifth embodiments or modifications.
- d/p is 0.5 or less as described above. is preferred, and 0.24 or less is more preferred. Thereby, even better resonance characteristics can be obtained. Furthermore, in the elastic wave devices of the first to fifth embodiments or each of the modified examples having the elastic wave resonator that utilizes thickness-shear mode bulk waves, as described above, MR ⁇ 1.75 (d/p )+0.075. In this case, spurious can be suppressed more reliably.
- the piezoelectric layer in the elastic wave devices of the first to fifth embodiments or each modified example having an elastic wave resonator that utilizes thickness-shear mode bulk waves is preferably a lithium niobate layer or a lithium tantalate layer.
- the Euler angles ( ⁇ , ⁇ , ⁇ ) of lithium niobate or lithium tantalate constituting the piezoelectric layer are within the range of the above formula (1), formula (2), or formula (3). is preferred. In this case, the fractional bandwidth can be widened sufficiently.
- Support member 58 Third support bodies 58a, 58b... First and second parts 58d to 58f, 58g to 58i... First to third layers 69... Second support body 70... Elastic wave device 71A... Upper electrode 71B Lower electrodes 80, 81 Elastic wave device 82 Support substrate 83 Piezoelectric layer 84 IDT electrodes 84a, 84b First and second bus bars 84c, 84d First and second electrode fingers 85, 86...Reflector 201...Piezoelectric films 201a, 201b...First and second principal surfaces 451, 452...First and second regions C...Excitation region VP1...Virtual plane
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Abstract
Description
電極3と電極4の長さ方向と直交する方向に見たときに、電極3と電極4とが重なっている領域、すなわち励振領域Cの長さ=40μm、電極3,4からなる電極の対数=21対、電極間中心距離=3μm、電極3,4の幅=500nm、d/p=0.133。
絶縁層7:1μmの厚みの酸化ケイ素膜。
支持部材8:Si。
(0°±10°,20°~80°,0°~60°(1-(θ-50)2/900)1/2) または (0°±10°,20°~80°,[180°-60°(1-(θ-50)2/900)1/2]~180°) …式(2)
(0°±10°,[180°-30°(1-(ψ-90)2/8100)1/2]~180°,任意のψ) …式(3)
2…圧電層
2a,2b…第1,第2の主面
3,4…電極
5,6…第1,第2のバスバー
7…絶縁層
7a…貫通孔
8…支持部材
8a…貫通孔
9…空洞部
10…弾性波装置
10a,10b…第1,第2空洞部
11…IDT電極
12…圧電性基板
13…支持部材
14…圧電層
14a,14b…第1,第2の主面
15…中間層
16…支持基板
17A…電極層
17B,17C…導電膜
18,18A…第1の支持体
18a,18b…第1,第2部分
18c…開口部
18d,18e…第1,第2の層
19…第2の支持体
19a,19b…第1,第2部分
19d,19e…第1,第2の層
20…貫通孔
21A…ビア電極
21B…電極パッド
22…バンプ
23…配線電極
24…誘電体膜
25…蓋部
26,26A…蓋部本体
26a,26b…第1,第2の主面
27A,27B…絶縁体層
30c…第3空洞部
39,39A…第2の支持体
48…第1の支持体
48a,48b…第1,第2部分
48d~48f,48g~48i…第1~第3の層
48j…第1の層
48x…第2部分
50a…第1空洞部
53…支持部材
58…第3の支持体
58a,58b…第1,第2部分
58d~58f,58g~58i…第1~第3の層
69…第2の支持体
70…弾性波装置
71A…上部電極
71B…下部電極
80,81…弾性波装置
82…支持基板
83…圧電層
84…IDT電極
84a,84b…第1,第2のバスバー
84c,84d…第1,第2の電極指
85,86…反射器
201…圧電膜
201a,201b…第1,第2の主面
451,452…第1,第2領域
C…励振領域
VP1…仮想平面
Claims (42)
- 支持基板を含む支持部材と、前記支持部材上に設けられている圧電層と、を含む圧電性基板と、
前記圧電層上に設けられている機能電極と、
少なくとも1つの支持体と、
蓋部と、
を備え、
前記少なくとも1つの支持体のうち1つの支持体が、前記圧電性基板上に前記機能電極を囲むように設けられており、該支持体上に蓋部が設けられており、
前記支持部材に、第1空洞部が設けられており、前記第1空洞部が、平面視において、前記機能電極の少なくとも一部と重なっており、
前記圧電性基板と、前記圧電性基板及び前記蓋部の間に設けられた前記支持体と、前記蓋部とにより囲まれた第2空洞部が設けられており、
前記圧電性基板と、前記圧電性基板及び前記蓋部の間に設けられた前記支持体と、前記蓋部とが積層されている方向を高さ方向とし、前記高さ方向に沿う寸法を高さとしたときに、前記第1空洞部の高さが前記第2空洞部の高さよりも高い、弾性波装置。 - 前記圧電層上に設けられている配線電極をさらに備え、
前記配線電極の少なくとも一部が、平面視において前記第1空洞部と重なっている、請求項1に記載の弾性波装置。 - 前記配線電極が、前記圧電層上における、平面視において前記第1空洞部と重なっている部分、及び平面視において前記第1空洞部と重なっていない部分にわたり設けられている、請求項2に記載の弾性波装置。
- 前記圧電層が対向し合う第1の主面及び第2の主面を有し、
前記第1の主面及び前記第2の主面のうち少なくとも一方における、平面視において前記第1空洞部と重なる部分に少なくとも一部が設けられている、誘電体膜をさらに備える、請求項1~3のいずれか1項に記載の弾性波装置。 - 前記圧電層の前記第1の主面及び前記第2の主面のうち、前記第2の主面が前記支持部材側に位置し、前記誘電体膜が前記第2の主面に設けられている、請求項4に記載の弾性波装置。
- 前記圧電性基板及び前記蓋部側の間に設けられた前記支持体と前記蓋部とが別体として構成されている、請求項1~5のいずれか1項に記載の弾性波装置。
- 前記蓋部が半導体を主成分とする蓋部本体を含む、請求項1~6のいずれか1項に記載の弾性波装置。
- 前記圧電性基板及び前記蓋部側の間に設けられた前記支持体及び前記蓋部が樹脂からなり、前記支持体と前記蓋部とが一体として構成されている、請求項1~5のいずれか1項に記載の弾性波装置。
- 前記支持体が、第1部分と、前記第1部分よりも前記高さ方向において前記圧電層側に設けられている第2部分と、を有する、請求項1~7のいずれか1項に記載の弾性波装置。
- 前記第1部分及び前記第2部分が別種の金属を含む、請求項9に記載の弾性波装置。
- 前記支持体において、前記第1部分における最も前記第2部分側に位置している部分と、前記第2部分における最も前記第1部分側に位置している部分とが同じ材料からなり、
前記第1部分における最も前記第2部分側に位置している部分と、前記第2部分における最も前記第1部分側に位置している部分とが一体となっている、一体部が構成されており、
平面視において、前記第1部分における最も前記第2部分側に位置している部分の面積と、前記第2部分における最も前記第1部分側に位置している部分の面積とが異なる、請求項9または10に記載の弾性波装置。 - 前記第1部分及び前記第2部分のうち少なくとも一方が積層体であり、
平面視において、前記積層体における前記一体部を構成している層の面積よりも、前記積層体における該層以外の少なくとも1層の面積が大きい、請求項11に記載の弾性波装置。 - 前記積層体において、前記一体部を構成している層の面積よりも、前記積層体における該層以外の全ての層の面積が大きい、請求項12に記載の弾性波装置。
- 前記積層体において、前記一体部を構成している層から遠い層ほど、平面視における面積が大きい、請求項13に記載の弾性波装置。
- 前記第1の支持体の前記積層体の層数が少なくとも3層である、請求項12~14のいずれか1項に記載の弾性波装置。
- 前記第1部分及び前記第2部分のうち、前記一体部を構成している部分の平面視における面積が小さい方が、前記積層体である、請求項12~15のいずれか1項に記載の弾性波装置。
- 前記第1部分及び前記第2部分の双方が前記積層体である、請求項12~16のいずれか1項に記載の弾性波装置。
- 前記一体部がAuからなる、請求項11~17のいずれか1項に記載の弾性波装置。
- 前記圧電性基板及び前記蓋部側の間に設けられた前記支持体が第1の支持体であり、
前記圧電性基板上に設けられており、かつ前記第2空洞部内に配置されている少なくとも1つの第2の支持体をさらに備え、
前記第1の支持体及び前記第2の支持体がそれぞれ、前記蓋部側に設けられている第1部分と、前記圧電性基板側に設けられている第2部分と、を有し、
前記第1の支持体の前記第1部分における最も前記第2部分側に位置している部分と、前記第2部分における最も前記第1部分側に位置している部分とが一体となっている、第1の一体部が構成されており、
前記第2の支持体の前記第1部分における最も前記第2部分側に位置している部分と、前記第2部分における最も前記第1部分側に位置している部分とが一体となっている、第2の一体部が構成されており、
前記圧電性基板、前記第1の支持体及び前記蓋部が積層されている方向、及び前記第1の支持体が前記圧電性基板上において延びている方向の双方と直交する方向に沿う、前記第1の支持体の各部分の寸法を前記第1の支持体の各部分の幅とし、前記圧電性基板、前記第2の支持体及び前記蓋部が積層されている方向と直交する方向に沿う、前記第2の支持体の各部分の寸法を前記第2の支持体の各部分の幅としたときに、少なくとも1つの前記第2の支持体における前記第2の一体部の少なくとも一部の幅が、前記第1の一体部の幅よりも狭い、請求項9~18のいずれか1項に記載の弾性波装置。 - 前記第2の支持体が、前記機能電極と電気的に接続されている、請求項19に記載の弾性波装置。
- 前記第2の一体部の幅が、1μm以上、16μm未満である、請求項19または20に記載の弾性波装置。
- 平面視における前記第2空洞部の面積が、平面視における前記第1空洞部の面積よりも大きい、請求項1~21のいずれか1項に記載の弾性波装置。
- 前記圧電性基板及び前記蓋部側の間に設けられた前記支持体が第1の支持体であり、
前記圧電性基板上に設けられており、かつ前記第2空洞部内に配置されている少なくとも1つの第2の支持体をさらに備え、
平面視において、前記第2の支持体が前記第1空洞部と重なっておらず、
平面視における前記第2空洞部の面積が、前記第1の支持体に囲まれた部分の面積から、前記第2の支持体の面積を引いた面積である、請求項22に記載の弾性波装置。 - 前記圧電性基板及び前記蓋部側の間に設けられた前記支持体が第1の支持体であり、
前記圧電性基板上に設けられており、かつ前記第2空洞部内に配置されている少なくとも1つの第2の支持体をさらに備え、
少なくとも1つの前記第2の支持体が、前記第1の支持体と前記機能電極との間に設けられている、請求項1~23のいずれか1項に記載の弾性波装置。 - 前記圧電性基板及び前記蓋部側の間に設けられた前記支持体が第1の支持体であり、
前記圧電性基板上に設けられており、かつ前記第2空洞部内に配置されている複数の第2の支持体をさらに備え、
前記複数の第2の支持体が、前記機能電極を挟むように設けられている少なくとも1対の第2の支持体を含む、請求項1~24のいずれか1項に記載の弾性波装置。 - 前記圧電性基板及び前記蓋部側の間に設けられた前記支持体が第1の支持体であり、
前記圧電性基板上に設けられており、かつ前記第2空洞部内に配置されている少なくとも1つの第2の支持体をさらに備え、
前記第2の支持体が、前記蓋部側に設けられている第1部分と、前記圧電性基板側に設けられている第2部分と、を有し、前記第1部分及び前記第2部分が別種の金属を含む、請求項1~25のいずれか1項に記載の弾性波装置。 - 前記圧電性基板及び前記蓋部側の間に設けられた前記支持体が第1の支持体であり、
前記圧電性基板上に設けられており、かつ前記第2空洞部内に配置されている少なくとも1つの第2の支持体をさらに備え、
前記第2の支持体が、壁状の形状及び柱状の形状のうち一方の形状を有する、請求項1~26のいずれか1項に記載の弾性波装置。 - 前記圧電性基板上に設けられている配線電極をさらに備え、
前記支持部材に、前記第1空洞部と接続されていない第3空洞部が設けられており、前記第3空洞部が、平面視において、前記配線電極と重なっており、かつ前記第2の支持体及び前記機能電極と重なっていない、請求項27に記載の弾性波装置。 - 前記少なくとも1つの支持体が、前記圧電性基板及び前記蓋部側の間に設けられた前記支持体のみである、請求項1~28に記載の弾性波装置。
- 前記少なくとも1つの支持体が、前記支持基板及び前記圧電層の間に設けられた支持体をさらに含む、請求項1~27に記載の弾性波装置。
- 前記支持部材が、前記支持基板及び前記圧電層の間に設けられている中間層を含む、請求項1~30のいずれか1項に記載の弾性波装置。
- 前記支持部材が、前記支持基板及び前記圧電層の間に設けられている中間層を含み、
前記第1空洞部の少なくとも一部が前記中間層に設けられている、請求項1~29のいずれか1項に記載の弾性波装置。 - 前記圧電層が、タンタル酸リチウム層またはニオブ酸リチウム層である、請求項1~32のいずれか1項に記載の弾性波装置。
- 前記機能電極が、対向する第1,第2のバスバーと、前記第1のバスバーに接続された第1の電極指と、前記第2のバスバーに接続された第2の電極指と、を有する、請求項1~33のいずれか1項に記載の弾性波装置。
- 前記機能電極は、前記第1の電極指と、前記第2の電極指とをそれぞれ複数本有するIDT電極である、請求項34に記載の弾性波装置。
- 板波を利用可能に構成されている、請求項35に記載の弾性波装置。
- 厚み滑りモードのバルク波を利用可能に構成されている、請求項34または35に記載の弾性波装置。
- 前記圧電層の厚みをd、隣り合う前記第1,第2の電極指同士の中心間距離をpとした場合、d/pが0.5以下である、請求項34または35に記載の弾性波装置。
- d/pが0.24以下である、請求項38に記載の弾性波装置。
- 隣り合う前記第1,第2の電極指同士が対向する方向から見たときに、隣り合う前記第1,第2の電極指同士が重なり合う領域が励振領域であり、前記励振領域に対する、前記複数の電極指のメタライゼーション比をMRとしたときに、MR≦1.75(d/p)+0.075を満たす、請求項38または39に記載の弾性波装置。
- 前記圧電層が、タンタル酸リチウム層またはニオブ酸リチウム層であり、
前記圧電層を構成しているニオブ酸リチウムまたはタンタル酸リチウムのオイラー角(φ,θ,ψ)が、以下の式(1)、式(2)または式(3)の範囲にある、請求項37~40のいずれか1項に記載の弾性波装置。
(0°±10°,0°~20°,任意のψ) …式(1)
(0°±10°,20°~80°,0°~60°(1-(θ-50)2/900)1/2) または (0°±10°,20°~80°,[180°-60°(1-(θ-50)2/900)1/2]~180°) …式(2)
(0°±10°,[180°-30°(1-(ψ-90)2/8100)1/2]~180°,任意のψ) …式(3) - 前記圧電層が、対向し合う第1の主面及び第2の主面を有し、
前記機能電極が、前記圧電層の前記第1の主面に設けられている上部電極と、前記第2の主面に設けられている下部電極と、を有し、前記上部電極及び前記下部電極が、前記圧電層を挟み互いに対向している、請求項1~33のいずれか1項に記載の弾性波装置。
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Publication number | Priority date | Publication date | Assignee | Title |
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JP2004320784A (ja) * | 2003-04-18 | 2004-11-11 | Samsung Electronics Co Ltd | 基板接合を利用して製造されたエアギャップ型fbarおよびデュプレクサとその製造方法 |
WO2004105237A1 (ja) * | 2003-05-26 | 2004-12-02 | Murata Manufacturing Co., Ltd. | 圧電電子部品、およびその製造方法、通信機 |
JP2006521211A (ja) * | 2003-03-31 | 2006-09-21 | インテル・コーポレーション | マイクロエレクトロメカニカルシステム(mems)デバイスならびにそれを生成するシステムおよび方法 |
US20200321939A1 (en) * | 2019-04-05 | 2020-10-08 | Resonant Inc. | Transversely-excited film bulk acoustic resonator package and method |
WO2021012377A1 (zh) * | 2019-07-19 | 2021-01-28 | 中芯集成电路(宁波)有限公司上海分公司 | 体声波谐振器的封装方法及封装结构 |
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JP2004320784A (ja) * | 2003-04-18 | 2004-11-11 | Samsung Electronics Co Ltd | 基板接合を利用して製造されたエアギャップ型fbarおよびデュプレクサとその製造方法 |
WO2004105237A1 (ja) * | 2003-05-26 | 2004-12-02 | Murata Manufacturing Co., Ltd. | 圧電電子部品、およびその製造方法、通信機 |
US20200321939A1 (en) * | 2019-04-05 | 2020-10-08 | Resonant Inc. | Transversely-excited film bulk acoustic resonator package and method |
WO2021012377A1 (zh) * | 2019-07-19 | 2021-01-28 | 中芯集成电路(宁波)有限公司上海分公司 | 体声波谐振器的封装方法及封装结构 |
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