WO2022201844A1 - チャンバ装置、ガスレーザ装置、及び電子デバイスの製造方法 - Google Patents
チャンバ装置、ガスレーザ装置、及び電子デバイスの製造方法 Download PDFInfo
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- WO2022201844A1 WO2022201844A1 PCT/JP2022/003119 JP2022003119W WO2022201844A1 WO 2022201844 A1 WO2022201844 A1 WO 2022201844A1 JP 2022003119 W JP2022003119 W JP 2022003119W WO 2022201844 A1 WO2022201844 A1 WO 2022201844A1
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Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/02—Constructional details
- H01S3/03—Constructional details of gas laser discharge tubes
- H01S3/036—Means for obtaining or maintaining the desired gas pressure within the tube, e.g. by gettering, replenishing; Means for circulating the gas, e.g. for equalising the pressure within the tube
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70008—Production of exposure light, i.e. light sources
- G03F7/70025—Production of exposure light, i.e. light sources by lasers
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/7055—Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
- G03F7/70575—Wavelength control, e.g. control of bandwidth, multiple wavelength, selection of wavelength or matching of optical components to wavelength
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/70883—Environment aspects, e.g. pressure of beam-path gas, temperature of optical system
- G03F7/70891—Temperature
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/02—Constructional details
- H01S3/03—Constructional details of gas laser discharge tubes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/02—Constructional details
- H01S3/03—Constructional details of gas laser discharge tubes
- H01S3/034—Optical devices within, or forming part of, the tube, e.g. windows, mirrors
- H01S3/0346—Protection of windows or mirrors against deleterious effects
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/09—Processes or apparatus for excitation, e.g. pumping
- H01S3/097—Processes or apparatus for excitation, e.g. pumping by gas discharge of a gas laser
- H01S3/0971—Processes or apparatus for excitation, e.g. pumping by gas discharge of a gas laser transversely excited
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/02—Constructional details
- H01S3/03—Constructional details of gas laser discharge tubes
- H01S3/038—Electrodes, e.g. special shape, configuration or composition
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/14—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range characterised by the material used as the active medium
- H01S3/22—Gases
- H01S3/223—Gases the active gas being polyatomic, i.e. containing two or more atoms
- H01S3/225—Gases the active gas being polyatomic, i.e. containing two or more atoms comprising an excimer or exciplex
Definitions
- the present disclosure relates to a chamber apparatus, a gas laser apparatus, and an electronic device manufacturing method.
- a KrF excimer laser device that outputs laser light with a wavelength of about 248 nm and an ArF excimer laser device that outputs laser light with a wavelength of about 193 nm are used.
- the spectral line width of the spontaneous oscillation light of the KrF excimer laser device and the ArF excimer laser device is as wide as 350 pm to 400 pm. Therefore, if the projection lens is made of a material that transmits ultraviolet light, such as KrF and ArF laser light, chromatic aberration may occur. As a result, resolution can be reduced. Therefore, it is necessary to narrow the spectral line width of the laser light output from the gas laser device to such an extent that the chromatic aberration can be ignored. Therefore, in the laser resonator of the gas laser device, a line narrowing module (LNM) including a band narrowing element (etalon, grating, etc.) is provided in order to narrow the spectral line width.
- LNM line narrowing module
- a gas laser device whose spectral line width is narrowed will be referred to as a band-narrowed gas laser device.
- a chamber device includes a housing that encloses a laser gas, a pair of discharge electrodes that are arranged facing each other in an internal space of the housing and that generate light from the laser gas when a voltage is applied; A window arranged on the wall surface of the housing for transmitting light, a first fan arranged in the internal space for causing the laser gas to flow between the pair of discharge electrodes, a filter arranged in the internal space, and driving the first fan.
- a second fan that rotates together with the first fan by the driving force from the source, and a fan side that is provided in the internal space and causes the laser gas filtered by the filter to flow by the second fan and flow a part of the laser gas away from the window. and a window-side flow path provided in the internal space, communicating with the fan-side flow path, and allowing the laser gas flowed from the fan-side flow path by the second fan to flow to the window side.
- a gas laser device includes a chamber device, and the chamber device is arranged to face each other in a housing that encloses a laser gas and an internal space of the housing.
- a pair of discharge electrodes for generating a pair of discharge electrodes, a window arranged on the wall surface of the housing through which light passes, a first fan arranged in the internal space for causing a laser gas to flow between the pair of discharge electrodes, and a first fan arranged in the internal space.
- a second fan that rotates together with the first fan by a driving force from a driving source of the first fan; and a laser gas that is provided in the internal space and filtered by the filter flows by the second fan, and a part of the laser gas flows.
- a window-side flow path provided in the internal space, communicating with the fan-side flow path, and allowing the laser gas flowed from the fan-side flow path by the second fan to flow toward the window. You may prepare.
- a method for manufacturing an electronic device includes a housing that encloses a laser gas, and a pair of discharges that are arranged facing each other in an internal space of the housing and generate light from the laser gas by applying a voltage.
- an electrode a window placed on the wall surface of the housing to allow light to pass through, a first fan placed in the internal space to flow the laser gas between the pair of discharge electrodes, and a filter placed in the internal space to filter the laser gas.
- a second fan that rotates together with the first fan by driving force from the driving source of the first fan; a filter that is arranged in the internal space; and a filter that rotates together with the first fan by driving force from the driving source of the first fan.
- a laser beam is generated by a gas laser device that includes a chamber device that communicates with the flow path and that is provided with a window-side flow path for flowing the laser gas flowed from the fan-side flow path by the second fan toward the window side, and the laser light is output to the exposure device.
- a photosensitive substrate may be exposed to laser light in an exposure apparatus to manufacture an electronic device.
- FIG. 1 is a schematic diagram showing an example of the overall configuration of an electronic device manufacturing apparatus.
- FIG. 2 is a schematic diagram showing an example of the overall configuration of a gas laser device of a comparative example.
- 3 is a view of the internal space of the housing of the chamber device shown in FIG. 2, viewed from the insulating section side toward the cross flow fan side.
- FIG. 4 is a cross-sectional view of the chamber apparatus shown in FIG. 2 perpendicular to the traveling direction of laser light.
- FIG. 5 is a view of the internal space of the housing of the chamber device of Embodiment 1, viewed from the insulating section side toward the cross flow fan side.
- FIG. 1 is a schematic diagram showing an example of the overall configuration of an electronic device manufacturing apparatus.
- FIG. 2 is a schematic diagram showing an example of the overall configuration of a gas laser device of a comparative example.
- 3 is a view of the internal space of the housing of the chamber device shown in FIG. 2, viewed from the insulating section side toward
- FIG. 6 is a perspective view of the partition walls and the front-side channel viewed from the internal space in which the electrodes are arranged.
- FIG. 7 is a perspective view of the partition wall and the front-side channel viewed from the inner space on the window side.
- FIG. 8 is a view of the internal space of the housing of the chamber device of Embodiment 2, viewed from the insulating portion side toward the cross flow fan side.
- FIG. 1 is a schematic diagram showing an example of the overall schematic configuration of an electronic device manufacturing apparatus used in an electronic device exposure process.
- the manufacturing apparatus used in the exposure process includes a gas laser device 100 and an exposure device 200.
- Exposure apparatus 200 includes an illumination optical system 210 including a plurality of mirrors 211 , 212 and 213 and a projection optical system 220 .
- the illumination optical system 210 illuminates the reticle pattern on the reticle stage RT with laser light incident from the gas laser device 100 .
- the projection optical system 220 reduces and projects the laser light transmitted through the reticle to form an image on a workpiece (not shown) placed on the workpiece table WT.
- the workpiece is a photosensitive substrate, such as a semiconductor wafer, to which photoresist is applied.
- the exposure apparatus 200 synchronously translates the reticle stage RT and the workpiece table WT to expose the workpiece to laser light reflecting the reticle pattern.
- a semiconductor device which is an electronic device, can be manufactured by transferring a device pattern onto a semiconductor wafer through the exposure process as described above.
- FIG. 2 is a schematic diagram showing an example of the overall configuration of the gas laser device 100 of this example.
- Gas laser device 100 is, for example, an ArF excimer laser device that uses a mixed gas containing argon (Ar), fluorine ( F2), and neon (Ne). In this case, the gas laser device 100 outputs pulsed laser light with a center wavelength of approximately 193 nm.
- the gas laser device 100 may be a gas laser device other than an ArF excimer laser device, for example, a KrF excimer laser device using a mixed gas containing krypton (Kr), F 2 and Ne. In this case, the gas laser device 100 emits pulsed laser light with a central wavelength of about 248 nm.
- a mixed gas containing Ar, F 2 and Ne as laser media and a mixed gas containing Kr, F 2 and Ne as laser media are sometimes called laser gas.
- Helium (He) may be used instead of Ne in the mixed gas used in each of the ArF excimer laser device and the KrF excimer laser device.
- the gas laser device 100 of this example includes a housing 110, a laser oscillator 130 arranged in the inner space of the housing 110, a monitor module 150, a laser gas supply device (not shown), a laser gas exhaust device (not shown), and a laser processor 190. , as the main configuration.
- the laser oscillator 130 includes a chamber device CH, a charger 141, a pulse power module 143, a rear mirror 145, and an output coupling mirror 147 as main components.
- FIG. 2 shows the internal configuration of the chamber device CH as seen from a direction substantially perpendicular to the traveling direction of the laser light.
- FIG. 3 is a view of the internal space of the housing 30 of the chamber device CH viewed from the insulating portion 33 side toward the cross flow fan 46 side.
- FIG. 4 is a cross-sectional view of the chamber device CH shown in FIG. 2 perpendicular to the traveling direction of the laser light.
- the chamber device CH includes a housing 30, a pair of windows 31a and 31b, a pair of electrodes 32a and 32b, an insulating portion 33, a feedthrough 34, an electrode holder portion 36, a cross flow fan 46, and heat exchange.
- a container 47, a pressure sensor 48, and a filter case 50 are provided as main components.
- the housing 30 encloses the above laser gas.
- Housing 30 also includes an interior space in which light is generated by excitation of the laser gas.
- a laser gas is supplied from a laser gas supply device to the internal space of the housing 30 through a pipe (not shown). Light generated by excitation of the laser gas travels to windows 31a and 31b.
- the window 31a is positioned on the front side in the traveling direction of the laser light from the gas laser device 100 to the exposure device 200, and the window 31b is positioned on the rear side in the traveling direction.
- the windows 31a and 31b are tilted at a Brewster angle with respect to the traveling direction of the laser light so as to suppress the reflection of the P-polarized light of the laser light.
- the window 31a is arranged on the wall surface of the housing 30 on the front side, and the window 31b is arranged on the wall surface of the housing 30 on the rear side.
- the window 31a is held by a tubular holder 31c connected to the wall surface on the front side, and arranged by the holder 31c so as to face the opening 30a in the wall surface.
- the window 31b is held by a holder 31d connected to the wall surface on the rear side with the same structure as the holder 31c, and arranged so as to face the opening 30b in the wall surface by the holder 31d.
- the longitudinal direction of the electrodes 32a and 32b is along the traveling direction of the laser beam, and the electrodes 32a and 32b are arranged in the internal space of the housing 30 so as to face each other. A space between the electrodes 32a and 32b in the housing 30 is sandwiched between windows 31a and 31b.
- the electrodes 32a and 32b are discharge electrodes for exciting the laser medium by glow discharge.
- electrode 32a is the cathode and electrode 32b is the anode.
- the electrode 32 a is supported by the insulating portion 33 .
- the insulating portion 33 closes the opening that continues to the housing 30 .
- the insulating portion 33 includes an insulator. Examples of insulators include alumina ceramics, which have low reactivity with F 2 gas.
- a feedthrough 34 made of a conductive member is arranged in the insulating portion 33 . The feedthrough 34 applies the voltage supplied from the pulse power module 143 to the electrode 32a.
- the electrode 32b is supported by the electrode holder portion 36 and is electrically connected to the electrode holder portion 36.
- illustration of the electrode holder portion 36 is omitted for clarity of illustration.
- the electrode holder portion 36 is electrically connected to the housing 30 via a return plate 37. As shown in FIG.
- a cross-flow fan 46 is arranged in the internal space of the housing 30 on the side opposite to the electrode 32b side with respect to the electrode holder portion 36 .
- the space in which the cross-flow fan 46 is arranged communicates with the space between the electrodes 32a and 32b.
- the cross-flow fan 46 is connected to a motor 46 a arranged outside the housing 30 . When the motor 46a rotates, the cross flow fan 46 rotates.
- the cross flow fan 46 causes the laser gas to flow between the electrodes 32a and 32b by rotation.
- the flow of the laser gas is indicated by thick arrows, and the laser gas flows through the cross-flow fan 46, between the electrodes 32a and 32b, the heat exchanger 47, and the cross-flow fan 46 in this order. Circulate.
- the ON/OFF and rotation speed of the motor 46a are adjusted under the control of the laser processor 190.
- FIG. Therefore, the laser processor 190 can adjust the circulation speed of the laser gas circulating in the internal space of the housing 30 by controlling the motor 46a.
- a heat exchanger 47 is arranged beside the cross flow fan 46 . Most of the laser gas flowed by the cross flow fan 46 passes through this heat exchanger 47, and the heat of the laser gas is removed by the heat exchanger 47.
- the filter case 50 is arranged on the wall surface of the housing 30 on the side opposite to the heat exchanger 47 with respect to the cross-flow fan 46 .
- the filter case 50 includes an inflow port 51 communicating with an opening 30c that is continuous in the approximate center of the housing 30 in the traveling direction of the laser beam, flow paths 30d provided in the wall surfaces of the housing 30 on the front side and the rear side, respectively. and outlets 51a, 51b communicating with 30e.
- a front-side filter 53a is arranged between the inlet 51 and the front-side outlet 51a, and between the inlet 51 and the rear-side outlet 51b. is arranged with a rear-side filter 53b.
- Filters 53a and 53b indicated by dashed lines in FIG. 3, have the same shape and length and filter the laser gas passing therethrough to remove particulates, which will be described later, from the laser gas.
- the flow path 30d communicates with a front-side purge chamber 30g provided in the front-side wall surface of the housing 30, and the purge chamber 30g communicates with the internal space of the housing 30 through an opening 30j in the wall surface, and the opening 30a. is communicated with the internal space of the holder 31c via the .
- a purge chamber is also provided in the rear side wall surface, and like the purge chamber 30g, the rear side purge chamber 30h is connected to the interior space of the housing 30 via the passage 30e and the opening 30k in the wall surface, and It communicates with the internal space of the holder 31d through the opening 30b.
- a cylindrical member 60a on the front side is arranged in the purge chamber 30g.
- the longitudinal direction of the tubular member 60a is along the traveling direction of the laser beam.
- One end of the cylindrical member 60a is separated from the opening 30j and located closer to the holder 31c than the flow path 30d.
- the other end of the cylindrical member 60a is connected to the edge of the holder 31c so as to surround the opening of the holder 31c.
- a rear-side cylindrical member 60b is disposed in the purge chamber 30h, similarly to the purge chamber 30g.
- the tubular member 60a includes a plurality of plate members 61 arranged on the inner peripheral surface of the tubular member 60a.
- Each of the plate members 61 is arranged parallel to the longitudinal direction of the tubular member 60a with a predetermined interval in a state in which the in-plane direction of the plate member 61 is arranged along a direction substantially perpendicular to the longitudinal direction of the tubular member 60a. are placed in Therefore, the plate members 61 are arranged with a gap therebetween.
- An opening 63 continues to each plate member 61 .
- Each opening 63 is arranged on the same straight line.
- the cylindrical member 60b has the same configuration as the cylindrical member 60a.
- the charger 141 is a DC power supply device that charges a capacitor (not shown) provided in the pulse power module 143 with a predetermined voltage.
- the charger 141 is arranged outside the housing 30 and connected to the pulse power module 143 .
- Pulse power module 143 includes a switch 143 a controlled by laser processor 190 . When the switch 143a is turned from OFF to ON by the control, the pulse power module 143 boosts the voltage applied from the charger 141 to generate a pulsed high voltage, and applies this high voltage to the electrodes 32a and 32b. . When a high voltage is applied, the insulation between the electrodes 32a and 32b is broken and discharge occurs.
- the energy of this discharge excites the laser medium in the housing 30 to generate an excited level excimer. After that, when the excimer shifts to the ground level dissociating into two atoms, it emits light corresponding to the energy level difference. The emitted light travels to windows 31a, 31b.
- the rear mirror 145 faces the window 31b, and the output coupling mirror 147 faces the window 31a.
- the rear mirror 145 is coated with a highly reflective film, and the output coupling mirror 147 is coated with a partially reflective film.
- the rear mirror 145 reflects the laser beam emitted from the window 31 b with high reflectance and returns it to the housing 30 .
- the output coupling mirror 147 transmits part of the laser light output from the window 31a, reflects another part, and returns it to the internal space of the housing 30 through the window 31a.
- the output coupling mirror 147 is composed of, for example, an element in which a dielectric multilayer film is formed on a calcium fluoride substrate.
- the rear mirror 145 and the output coupling mirror 147 constitute a Fabry-Perot laser resonator, and the housing 30 is arranged on the optical path of the laser resonator. Therefore, the laser light emitted from the housing 30 reciprocates between the rear mirror 145 and the output coupling mirror 147 .
- the reciprocating laser light is amplified each time it passes through the laser gain space between the electrodes 32a and 32b. Part of the amplified light passes through the output coupling mirror 147 as pulsed laser light.
- the rear mirror 145 is fixed in the internal space of a housing 145 a connected to the rear side of the housing 30 .
- the output coupling mirror 147 is fixed in the internal space of an optical path tube 147 a connected to the front side of the housing 30 .
- the window 31b may have the function of the rear mirror 145.
- the holder 31d has a flexible structure so that the angle of the laser beam incident on the window 31b can be adjusted.
- the function of the output coupling mirror 147 may be given to the window 31a.
- the holder 31c has a flexible structure so that the angle of the laser beam incident on the window 31b can be adjusted.
- a band narrowing module (not shown) that narrows the band of the laser light may be arranged.
- a narrowband module includes a prism, a grating, and a rotation stage. The prism, grating, and rotation stage are arranged in the internal space of the housing 145a.
- the prism expands the beam width of the light emitted from the window 31b and causes the light to enter the grating.
- the prism also reduces the beam width of the light reflected from the grating and returns the light to the internal space of the housing 30 through the window 31b.
- At least one prism should be arranged.
- the surface of the grating is made of a highly reflective material, and a large number of grooves are provided at predetermined intervals on the surface.
- a grating is a dispersive optical element.
- the cross-sectional shape of each groove is, for example, a right triangle.
- Light entering the grating from the prism is reflected by these grooves and diffracted in a direction according to the wavelength of the light.
- the grating is Littrow-arranged so that the incident angle of the light incident on the grating from the prism and the diffraction angle of the diffracted light of the desired wavelength match. As a result, light around the desired wavelength is returned to the housing 30 via the prism.
- the rotating stage supports the prism and rotates the prism. Rotating the prism changes the angle of incidence of the light on the grating. Therefore, by rotating the prism, the wavelength of light returning from the grating to housing 30 through the prism can be selected.
- a laser resonator is composed of the output coupling mirror 147 and the grating provided with the casing 30 interposed therebetween, and the casing 30 is arranged on the optical path of the laser resonator. Therefore, light emitted from housing 30 reciprocates between the grating and output coupling mirror 147 .
- the monitor module 150 is arranged on the optical path of the pulsed laser light that passes through the output coupling mirror 147 .
- the monitor module 150 includes a housing 151, and a beam splitter 152, a condenser lens 153, and an optical sensor 154 arranged in the internal space of the housing 151 as main components.
- An opening continues to the housing 151, and an optical path tube 147a is connected so as to surround the opening. Therefore, the internal space of the housing 151 communicates with the internal space of the optical path tube 147a through this opening.
- the beam splitter 152 allows the pulsed laser light that passes through the output coupling mirror 147 to pass through the output window 161 with high transmittance, and reflects part of the pulsed laser light toward the condenser lens 153 .
- Condensing lens 153 converges the pulsed laser light onto the light receiving surface of optical sensor 154 .
- the optical sensor 154 measures the pulse energy E of the pulsed laser beam incident on the light receiving surface.
- Optical sensor 154 is electrically connected to laser processor 190 and outputs a signal to laser processor 190 indicative of data relating to the pulse energy E to be measured.
- An opening is continuous on the opposite side of the housing 151 of the monitor module 150 to the side to which the optical path tube 147a is connected, and the optical path tube 161a is connected so as to surround this opening. Therefore, the internal space of the housing 151 and the internal space of the optical path tube 161a communicate with each other. Also, the optical path tube 161 a is connected to the housing 110 . An exit window 161 is provided at a position surrounded by the optical path tube 161 a in the housing 110 . Light transmitted through the beam splitter 152 of the monitor module 150 is emitted from the emission window 161 to the exposure apparatus 200 outside the housing 110 .
- the optical path tubes 147a, 161a and the internal spaces of the housings 145a, 151 are filled with a purge gas.
- the purge gas contains an inert gas such as high-purity nitrogen containing few impurities such as oxygen.
- the purge gas is supplied from a purge gas supply source (not shown) arranged outside the housing 110 to the internal spaces of the optical pipes 147a and 161a and the housings 145a and 151 through pipes (not shown).
- the pressure sensor 48 measures the pressure in the internal space of the housing 30.
- the pressure sensor 48 is electrically connected to the laser processor 190 and outputs to the laser processor 190 a signal indicative of data relating to the pressure being measured.
- the laser gas supply device is supplied with laser gas from a laser gas supply source (not shown) arranged outside the housing 110 through a pipe (not shown).
- the laser gas supply device is provided with valves and flow control valves (not shown), and is connected to other pipes connected to the housing 30 .
- the laser gas supply device supplies a plurality of gases to the internal space of the housing 30 through the other piping according to control signals from the laser processor 190 .
- a pipe connected to the housing 30 is connected to the laser gas exhaust device.
- the laser gas exhaust device includes an exhaust pump (not shown), which exhausts the gas in the internal space of the housing 30 into the internal space of the housing 110 through a pipe.
- the housing 110 is provided with an exhaust duct 111 .
- the gas is exhausted to the outside of the housing 110 through the exhaust duct 111 .
- the gas is exhausted from the internal space of the housing 30 to the internal space of the housing 110 by the laser gas exhaust device, or is discharged from the optical path tubes 147a and 161a to the internal space of the housing 110 by a configuration not shown. gas.
- the laser processor 190 of the present disclosure is a processing device that includes a storage device that stores control programs and a CPU that executes the control programs.
- Laser processor 190 is specially configured or programmed to perform various processes contained in this disclosure.
- the laser processor 190 controls the entire gas laser device 100 .
- the laser processor 190 is electrically connected to the exposure processor of the exposure apparatus 200, and transmits and receives various signals to and from the exposure processor.
- the internal spaces of the optical path tubes 147a and 161a and the internal spaces of the housings 145a and 151 are filled with a purge gas from a purge gas supply source (not shown).
- a laser gas is supplied to the internal space of the housing 30 from a laser gas supply device (not shown).
- the laser processor 190 controls the motor 46a to rotate the cross flow fan 46. As shown in FIG. The rotation of the cross-flow fan 46 causes the laser gas to circulate in the internal space of the housing 30 .
- the laser processor 190 sets a predetermined charging voltage to the charger 141 and turns on the switch 143a.
- the pulse power module 143 generates a pulsed high voltage from the electrical energy held in the charger 141, and the high voltage is applied between the electrodes 32a and 32b.
- the insulation between the electrodes 32a and 32b is broken and discharge occurs.
- the energy of this discharge excites the laser medium contained in the laser gas between the electrodes 32a and 32b to emit spontaneous emission light when returning to the ground state.
- a part of this light is ultraviolet light, and the light transmitted through the window 31b is reflected by the rear mirror 145.
- the light reflected by the rear mirror 145 propagates through the window 31b into the internal space of the housing 30 again.
- the light propagating in the internal space of the housing 30 causes stimulated emission in the laser medium in an excited state, thereby amplifying the light.
- the light passes through window 31 a and travels to output coupling mirror 147 .
- a portion of the light is transmitted through the output coupling mirror 147 and the remaining portion of the light is reflected by the output coupling mirror 147, transmitted through the window 31a, and propagated into the internal space of the housing 30.
- FIG. Light propagating in the internal space of housing 30 travels to rear mirror 145 as described above.
- the laser light reciprocates between the rear mirror 145 and the output coupling mirror 147 and is amplified each time it passes through the discharge space in the internal space of the housing 30 .
- a portion of the laser light passes through the output coupling mirror 147 as pulsed laser light and travels to the beam splitter 152 .
- a portion of the pulsed laser light traveling to the beam splitter 152 is reflected by the beam splitter 152 .
- the reflected pulsed laser light is received by the optical sensor 154, and the optical sensor 154 measures the pulse energy E of the received pulsed laser light.
- Optical sensor 154 outputs a signal to laser processor 190 indicative of data relating to the pulse energy E to be measured.
- the laser processor 190 feedback-controls the charging voltage of the charger 141 so that the difference ⁇ E between the pulse energy E and the target pulse energy Et is within the allowable range.
- This pulsed laser light is ArF laser light, which is ultraviolet light with a center wavelength of about 193 nm.
- the pressure in the internal space of the housing 30 is measured by the pressure sensor 48 , and a signal indicating pressure data from the pressure sensor 48 is input to the laser processor 190 .
- the laser processor 190 controls the laser gas supply device based on the signal from the pressure sensor 48, and supplies the laser gas until the pressure in the internal space of the housing 30 reaches a predetermined pressure. is supplied to the internal space of the housing 30 .
- the laser processor 190 controls the laser gas exhaust device based on the signal, and discharges the laser gas from the internal space of the housing 30 until the pressure reaches a predetermined pressure. Exhaust.
- the laser gas from which fine particles have been removed passes through the flow path 30d and flows into the purge chamber 30g.
- a part of the flowing laser gas flows into the internal space of the housing 30 through the opening 30j.
- Another part of the laser gas blows the window 31a.
- another part of the laser gas bounces off the window 31a and flows into the internal space of the housing 30 through the opening 30j.
- fine particles floating in the internal space of the housing 30 may pass through the purge chamber 30g through the opening 30j and flow into the window 31a.
- the cylindrical member 60a is arranged in order to suppress adhesion of such fine particles to the window 31a.
- the laser gas containing fine particles from the opening 30j is compressed when passing through the opening 63 of the cylindrical member 60a, and after passing through the gap between the adjacent plate members 61, the compression is released and the laser gas expands.
- the laser gas travels in the longitudinal direction of the cylindrical member 60a in the inner space of the cylindrical member 60a, the laser gas is repeatedly compressed and expanded. and removed.
- the laser gas from which fine particles have been removed flows to the window 31a and blows the window 31a. Therefore, adhesion of fine particles flowing from the opening 30j to the window 31a is suppressed.
- the flow and blowing of the laser gas are explained using the front side, but the flow and blowing of the laser gas on the rear side are the same. Therefore, by blowing the laser gas onto the window 31b, adhesion of fine particles to the window 31b is suppressed.
- the transmittance decreases, the energy density of the pulsed laser light emitted from the gas laser device 100 toward the exposure device 200 may decrease. Therefore, there arises a concern that the reliability of the gas laser device 100 is lowered. This shortage of flow rate becomes more conspicuous as the pulse energy of the gas laser device 100 increases, because the number of fine particles generated increases due to the increase in electrode area and the like.
- a chamber device CH capable of suppressing deterioration in reliability of the gas laser device 100 is illustrated.
- FIG. 5 is a view of the internal space of the housing 30 of the chamber device CH of this embodiment viewed from the insulating portion 33 side toward the cross flow fan 46 side. Unlike the chamber device CH of the comparative example, the chamber device CH of the present embodiment is not provided with the filter case 50, the flow paths 30d and 30e, and the purge chambers 30g and 30h.
- the chamber device CH includes partition walls 81 and 83 provided in the internal space of the housing 30 .
- the partition 81 is provided between the electrodes 32a and 32b and the wall surface on the front side
- the partition wall 83 is provided between the electrodes 32a and 32b and the wall surface on the rear side.
- the main surface of the partition 81 faces the wall surface on the front side of the housing 30
- the main surface of the partition wall 83 faces the wall surface on the rear side of the housing 30 .
- Such partition walls 81 and 83 divide the internal space of the housing 30 into three internal spaces 301 , 303 and 305 .
- An internal space 301 is a front window side space between the partition wall 81 and the front side wall surface of the housing 30
- an internal space 303 is a rear window side space between the partition wall 83 and the rear side wall surface of the housing 30 .
- the internal space 301 is in contact with the wall surface on the front side
- the internal space 303 is in contact with the wall surface on the rear side.
- the internal space 305 is a space between the internal space 301 and the internal space 303, specifically, a space between the partition walls 81 and 83 on the side of the electrodes 32a and 32b.
- the internal space 305 is the internal space on the opposite side of the internal space 301 with the partition wall 81 as a reference, and the internal space on the opposite side of the internal space 303 with the partition wall 83 as a reference.
- the internal space 301 and the internal space 303 have the same size, and the internal space 305 is wider than the internal spaces 301 and 305 .
- electrodes 32a and 32b In the internal space 305, electrodes 32a and 32b, an electrode holder portion 36, a cross-flow fan 46 that is a first fan, a heat exchanger 47, and a pressure sensor 48 are arranged. 5, the electrode 32b, the electrode holder portion 36, and the pressure sensor 48 are omitted for clarity of illustration, as in FIG.
- the cross-flow fan 46 and the heat exchanger 47 are arranged in the internal space 305 in the opposite direction from the comparative example.
- Filters 53a and 53b are arranged in the internal space 305 unlike the internal space of the housing 30 of the comparative example.
- the filters 53 a and 53 b are arranged on the opposite side of the cross flow fan 46 with respect to the heat exchanger 47 .
- the cross-flow fan 46 circulates the laser gas through the cross-flow fan 46, between the electrodes 32a and 32b, the filters 53a and 53b, the heat exchanger 47, and the cross-flow fan 46 in this order.
- the filters 53a, 53b filter the laser gas flowing through each of the cross-flow fans 46 to remove particulates from the laser gas.
- the filter 53a is arranged adjacent to the partition wall 81 in the internal space 305 so as to close the opening 81a connected to the partition wall 81
- the filter 53b is arranged adjacent to the partition wall 81 in the internal space 305 so as to close the opening 83a connected to the partition wall 83.
- the openings 81a and 83a are indicated by dashed lines.
- the filters 53a, 53b and the openings 81a, 83a are arranged on the same straight line in the traveling direction of the laser light. Filters 53a and 53b are shorter than each in the comparative example. Note that the filters 53a and 53b may be longer than those of the comparative example, or may have the same length. Alternatively, one filter may be placed between the openings 81a, 83a so as to block the openings 81a, 83a.
- the chamber device CH of the present embodiment includes a second fan, a fan-side flow path in which the second fan is arranged, and a window-side flow path that communicates with the fan-side flow path and allows the laser gas to flow toward the window. It is arranged on each of the front side and the rear side.
- the second fan, the fan-side channel, and the window-side channel on the front side will be described as the second fan 311 , the channel 313 , and the channel 315 .
- the second fan, the fan-side channel, and the window-side channel on the rear side will be described as a second fan 321 , a channel 323 , and a channel 325 .
- the second fan 311, flow path 313, and flow path 315 on the front side will be used. 311 , channel 313 , and channel 315 . Therefore, the second fan 321 , the flow path 323 and the flow path 325 can obtain the same operations, functions and effects as the second fan 311 , the flow path 313 and the flow path 315 .
- FIG. 6 is a perspective view of the partition wall 81 and the flow path 313 seen from the internal space 305
- FIG. 7 is a perspective view of the partition wall 81 and the flow path 313 seen from the internal space 301.
- a second fan 311 is arranged in the channel 313 , and the laser gas filtered by the filter 53 a flows through the channel 313 by the second fan 311 .
- the channel 313 of this embodiment is provided in the internal space 301 and the internal space 305 through the openings 81 a , 81 b , 81 c of the partition wall 81 .
- Such channels 313 include a first channel 313 a provided in the internal space 301 , a second channel 313 b provided in the internal space 305 , and a third channel 313 c provided in the internal space 301 .
- Each of the first flow path 313a, the second flow path 313b, and the third flow path 313c is a space surrounded by the partition wall 81 and the plate member.
- the first flow path 313 a , the second flow path 313 b , and the third flow path 313 c are provided along the planar direction of the partition wall 81 .
- One end of the first flow path 313a communicates with the internal space 305 through the opening 81a and the filter 53a, and the laser gas in the internal space 305 flows from the internal space 305 into the first flow path 313a through the opening 81a, which is the first opening. flow through.
- the other end of the first flow path 313 a communicates with the opening 81 b that continues to the partition wall 81 .
- the opening 81b is smaller than the opening 81a and positioned below the opening 81a.
- part of the first flow path 313a hidden by the third flow path 313c is indicated by broken lines
- part of the first flow path 313a hidden by the partition walls 81 is indicated by broken lines. 5
- the illustration of the opening 81b is omitted for ease of viewing, and the opening 81b is indicated by a dashed line in FIGS.
- One end of the second flow path 313b communicates with the first flow path 313a through an opening 81b, which is a second opening. It flows in through the opening 81b, which is the second opening. Also, the other end of the second flow path 313b communicates with an opening 81c that is a third opening that is continuous with the partition wall 81 .
- a portion of the second flow path 313b hidden by the partition wall 81 is indicated by a broken line.
- the opening 81c is larger than the opening 81b and smaller than the opening 81a.
- the opening 81c is located on the side opposite to the opening 81a with respect to the opening 81b and at approximately the same height as the opening 81a.
- the opening 81c is indicated by a dashed line in FIG.
- One end of the third flow path 313c communicates with the second flow path 313b through an opening 81c, and the laser gas in the second flow path 313b flows into the third flow path 313c from the second flow path 313b through the third opening. It flows in through a certain opening 81c.
- the other end of the third channel 313c communicates with one end of the channel 315 on the partition wall 83 side and with the internal space 305 via the opening 81d.
- Such a third flow path 313c allows part of the laser gas to flow into the internal space 305 through the opening 81d and the other part of the laser gas to flow into the flow path 315. As shown in FIG.
- the third flow path 313c causes part of the laser gas to flow away from the window 31a and another part of the laser gas to flow toward the window 31a.
- the opening 81d is larger than the opening 81c and smaller than the opening 81a.
- the opening 81d is located above the opening 81b.
- the second fan 311 is, for example, a centrifugal fan, and is arranged adjacent to the opening 81c in the third flow path 313c.
- the arrangement position of the second fan 311 is approximately the middle position of the flow path 313 .
- the second fan 311 is rotated in the same direction together with the cross-flow fan 46 by the driving force.
- the second fan 311 causes the laser gas in the flow path 313 to flow to the flow path 315 by rotating.
- the channel 315 is an internal space of a cylindrical member and is provided in the internal space 301 .
- the longitudinal direction of the flow path 315 is along the traveling direction of the laser light.
- a channel 315 is provided in the internal space 301 .
- One end of the flow path 315 communicates with the third flow path 313c, and the other end of the flow path 315 is connected to the wall surface on the front side of the housing 30 so as to surround the opening 30a.
- the opening 81d, the communication portion between the opening 81d and the third flow path 313c, the communication portion between the third flow path 313c and the flow path 315, and the flow path 315 are the windows. 31a.
- the flow path 315 allows the laser gas flowed from the third flow path 313c of the flow path 315 by the second fan 311 to flow toward the window 31a. Further, the channel 315 causes the laser gas bounced off the window 31a to flow away from the window 31a, specifically, the laser gas into the internal space 305 through the opening 81d.
- a tubular member 60 a is arranged in the flow path 315 .
- the cylindrical member 60a is arranged coaxially with the window 31a.
- the cylindrical member 60a is shorter than the flow path 315.
- One end of the cylindrical member 60a is separated from the partition wall 81 and positioned closer to the window 31a than the third flow path 313c.
- the other end of the cylindrical member 60a is connected to the wall surface on the front side of the housing 30 so as to surround the opening 30a.
- each of the flow paths 323 corresponding to the first flow path 313a, the second flow path 313b, and the third flow path 313c is divided into the first flow path 323a, the second flow path 323b, and the third flow path 323c. It is shown as channel 323c. Further, openings corresponding to the openings 81a, 81b, 81c and 81d are shown as openings 83a, 83b, 83c and 83d.
- the drive shaft 46b that connects the motor 46a and the cross flow fan 46 rotates.
- the cross flow fan 46 is rotated by the driving force from the motor 46a.
- the second fan 311 is connected to the drive shaft 46b, it rotates in the same direction as the cross flow fan 46 by the driving force from the motor 46a.
- most of the laser gas circulates through the cross-flow fan 46, between the electrodes 32a and 32b, the filters 53a and 53b, the heat exchanger 47, and the cross-flow fan 46 in this order as the cross-flow fan 46 rotates. .
- Another part of the laser gas passes through the filter 53 a and the opening 81 a and flows into the flow path 313 due to the rotation of the cross flow fan 46 and the second fan 311 .
- the laser gas is filtered by the filter 53a and flows through the flow path 313 in a state in which fine particles contained in the laser gas are removed from the laser gas by filtration.
- the laser gas is caused by the second fan 311 to flow through the first channel 313a, the opening 81b, the second channel 313b, the opening 81c, and the third channel 313c in this order.
- the traveling direction of the laser gas is substantially orthogonal to the axial direction of the opening 81d and the flow path 315.
- the axial direction is the traveling direction of the laser light.
- the laser gas collides with the inner circumferential surface of the third flow path 313c located on the traveling direction of the laser gas. Due to the collision, part of the laser gas passes through the opening 81 d and flows into the internal space 305 , and the other part of the laser gas flows into the flow path 315 .
- the laser gas flows to the cylindrical member 60a, flows to the window 31a, and blows the window 31a.
- the laser gas blown against the window 31a bounces off the window 31a, passes through the tubular member 60a, the flow path 315, and the opening 81d and flows into the internal space 305. As shown in FIG.
- the second fan 311 rotates together with the cross-flow fan 46 by driving force from the motor 46 a that is the drive source of the cross-flow fan 46 .
- the second fan 311 causes the laser gas filtered by the filter 53a to flow through the channel 313, which is the fan-side channel. A portion of the laser gas flows away from the window 31a, and the other portion flows into the channel 315, which is the channel on the window side.
- the laser gas that has flowed through the channel 315 flows toward the window 31a through the channel 315, bounces off the window 31a, and flows through the channel 315 in a direction away from the window 31a.
- the flow rate of the laser gas in the flow path 313 is increased by the second fan 311 . Therefore, even if the laser gas containing fine particles in the internal space 305 on the side of the electrodes 32a and 32b tries to advance to the window 31a, the laser gas flows in the direction away from the window 31a as the flow rate increases as described above. pushed back to As a result, particles can be suppressed from advancing from the internal space 305 to the window 31a, and adhesion of the particles to the window 31a can be suppressed. In addition, since the laser gas flowing through the window 31a is blown against the window 31a in a state in which fine particles have been removed, adhesion of fine particles can be suppressed by the blowing.
- the decrease in transmittance of the window 31a due to adhesion can be suppressed.
- the decrease in transmittance is suppressed, the decrease in the energy density of the pulsed laser light emitted from the gas laser device 100 toward the exposure device 200 can be suppressed, and the decrease in reliability of the gas laser device 100 can be suppressed.
- the second fan 311 rotates together with the cross-flow fan 46, and in this case, the cross-flow fan 46 and the second fan 311 can be driven by a common motor 46a.
- the number of motors 46a can be reduced, the cost of the chamber device CH can be suppressed, and the chamber device CH can be made smaller than when the motors 46a are arranged in the cross flow fan 46 and the second fan 311 respectively. can be.
- the channel 313 is provided in the internal space 301 and the internal space 305 wider than the internal space 301
- the channel 315 is provided in the internal space 301 . Since the internal space 305 is wider than the internal space 301, an extra space is easily secured in the internal space 305 as compared with the internal space 301. - ⁇ Therefore, in the case of the configuration described above, part of the flow path 313 can be easily arranged in the internal space 301 . In addition, since the other part of the channel 313 is arranged in the internal space 305, each channel in the internal space 301 can can be widened. This may facilitate placement of a portion of channel 313 and channel 315 in interior space 301 . Furthermore, since part of the flow path 313 is arranged in the internal space 305, the internal space 301 can be made small, and the length of the housing 30 in the longitudinal direction can be shortened.
- the third flow path 313c communicates with the third flow path 313c via an opening 81d provided on the opposite side of the flow path 315 with respect to the third flow path 313c.
- the laser gas is further flowed into the internal space 305 .
- Fine particles in the internal space 305 may advance from the internal space 305 to the window 31a via the opening 81d, the third flow path 313c, and the flow path 315 by the cross flow fan .
- part of the laser gas flowing through the third flow path 313c flows into the internal space 305 so as to push back the fine particles, so the inflow of the fine particles from the internal space 305 to the window 31a can be suppressed.
- the opening 81d, the communicating portion between the opening 81d and the third flow path 313c, the third flow path 313c and the flow path 315, and , and the channel 315 overlap the window 31a.
- the pulsed laser light travels from the internal space 305 to the window 31a through the opening 81d, the third flow path 313c, and the flow path 315, the opening through which the pulsed laser light passes is provided in the partition wall 81 separately from the opening 81d. may not need to be provided.
- the third flow path 313 c communicates with the flow path 315 on the partition wall 81 side rather than the front wall surface side of the housing 30 .
- the inflow of fine particles from the internal space 305 to the flow path 315 through the opening 81d is suppressed. obtain.
- the filter 53a covers the opening 81a in the internal space 305.
- particulates can be suppressed from advancing to the flow path 313 compared to the case where the filter 53a is arranged in the internal space 305 so as not to cover the opening 81a.
- Suppressing the advance of fine particles into the channel 313 can suppress the accumulation of fine particles in the channels 313 and 315 and the progress of the fine particles through the channels 313 and 315 to the window 31a.
- the cylindrical member 60a is arranged in the flow path 315.
- the cylindrical member 60a includes a plurality of plate members 61 with continuous openings 63, and the respective plate members 61 are arranged in parallel in the longitudinal direction of the cylindrical member 60a at intervals.
- the laser gas repeatedly compresses and expands as it travels through the inner space of the cylindrical member 60a, and fine particles contained in the laser gas can adhere to the plate member 61, and the fine particles can be further removed from the laser gas.
- the second fan 311 is connected to the drive shaft 46b of the cross flow fan 46 and is rotated by the rotation of the drive shaft 46b.
- This configuration allows the second fan 311 to rotate simultaneously with the cross-flow fan 46 .
- the number of drive shafts 46b can be reduced compared to the case where the drive shafts 46b are arranged separately for the cross flow fan 46 and the second fan 311, respectively, and the cost of the chamber device CH can be suppressed.
- the chamber device CH can be miniaturized.
- the cross-flow fan 46 has been described as the first fan in the chamber device CH of the present embodiment, the first fan may be a reflux fan. Also, although the second fan 311 has been described as a centrifugal fan, the second fan 311 may be a sirocco fan.
- FIG. 8 is a view of the internal space of the housing 30 of this embodiment viewed from the insulating section 33 side toward the cross flow fan 46 side.
- each configuration of the flow paths 313, 315, 323, 325 is different from that of the first embodiment.
- the flow paths 313 and 315 are used in the description below, the flow paths 323 and 325 have the same configuration as the flow paths 313 and 315 . Therefore, the flow paths 323 and 325 can obtain the same operations, functions and effects as the flow paths 313 and 315.
- the channel 313 of the present embodiment includes a first channel 313a and a second channel 313b, and each of the first channel 313a and the second channel 313b, that is, the entire channel 313 is provided in the internal space 301. be done. Therefore, the partition wall 81 of the present embodiment is not provided with the openings 81b and 81c explained in the first embodiment for communicating the flow paths 313 with each other.
- the second flow path 313b is a space surrounded by the wall surface on the front side of the housing 30 and the plate material, and is provided along the wall surface. One end of the second channel 313b communicates with the other end of the first channel 313a, and the other end of the second channel 313b communicates with the opening 30a.
- the second fan 311 is arranged on one end side of the second flow path 313b, and the cylindrical member 60a is arranged on the other end side of the second flow path 313b.
- the flow path 315 is arranged on the side opposite to the wall surface on the front side of the housing 30 with respect to the cylindrical member 60a.
- One end of the flow path 315 communicates with the other end of the second flow path 313b on the side in the traveling direction of the laser gas flowing through the second flow path 313b.
- the laser gas in the second flow path 313b flows into the flow path 315 from the second flow path 313b along the outer peripheral surface of the cylindrical member 60a.
- the opening 81d of this embodiment is provided on the opposite side of the second flow path 313b with respect to the flow path 315, the diameter of the flow path 315 is larger than the opening 81d, and the other end of the flow path 315 surrounds the opening 81d. is connected to the partition wall 81 at .
- the opening 81d, the communicating portion between the opening 81d and the flow path 315, the flow path 315, and the internal space of the cylindrical member 60a overlap the window 31a.
- the flow path 315 allows part of the laser gas flowing along the outer peripheral surface of the cylindrical member 60a from the second flow path 313b to flow toward the window 31a through the inner space of the cylindrical member 60a.
- the channel 315 causes another part of the laser gas to flow into the internal space 305 through the opening 81d.
- the channel 315 causes the laser gas that bounces off the window 31a and returns to the channel 315 through the cylindrical member 60a to flow into the internal space 305 through the opening 81d.
- the flow path 313 as described above communicates with the second flow path 313b on the wall surface side on the front side of the housing 30 rather than on the partition wall 81 side. Since the partition 81 of this embodiment is not provided with the openings 81b and 81c, the opening 81d is the second opening of the partition 81. As shown in FIG.
- the laser gas is caused to flow through the first flow path 313a and the second flow path 313b in this order by the second fan 311 .
- the laser gas flows into the flow path 315 along the outer peripheral surface of the cylindrical member 60a in the traveling direction of the pulsed laser light.
- a part of the laser gas flowing in the flow path 315 flows into the internal space 305 through the opening 81d.
- the diameter of the channel 315 is larger than that of the opening 81d as described above, the other part of the laser gas is trapped between the peripheral surface of the channel 315 in the partition wall 81 and the edge of the opening 81d. Collide with the wall.
- the collision causes the laser gas to flow to the window 31a through the flow path 315 and the cylindrical member 60a. Therefore, the channel 315 communicating with the second channel 313b allows the laser gas to flow through the window 31a through the tubular member 60a provided in the second channel 313b. Therefore, the second flow path 313b causes part of the laser gas to flow away from the window 31a via the flow path 315 and the opening 81d, and flow part of the laser gas to the window 31a side via the flow path 315.
- the laser gas in flow path 315 blows window 31a.
- the laser gas that blows on the window 31a bounces off the window 31a.
- the channel 315 causes the laser gas bounced off the window 31a to flow away from the window 31a, specifically, the laser gas to the internal space 305 through the opening 81d.
- the channel 313 and the channel 315 are arranged in the internal space 301 . Therefore, it may be unnecessary to provide the openings 81b and 81c in the partition wall 81 . Further, since the flow paths 313 and 315 are not arranged in the internal space 305, it is possible to prevent the flow of gas from the cross-flow fan 46 from being disturbed by the flow paths 313 and 315.
- FIG. 1 A block diagram illustrating an exemplary computing environment.
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Abstract
Description
2.比較例のガスレーザ装置の説明
2.1 構成
2.2 動作
2.3 課題
3.実施形態1のチャンバ装置の説明
3.1 構成
3.2 動作
3.3 作用・効果
4.実施形態2のチャンバ装置の説明
4.1 構成
4.2 作用・効果
以下に説明される実施形態は、本開示のいくつかの例を示すものであって、本開示の内容を限定するものではない。また、各実施形態で説明される構成及び動作の全てが本開示の構成及び動作として必須であるとは限らない。なお、同一の構成要素には同一の参照符号を付して、重複する説明を省略する。
図1は、電子デバイスの露光工程で使用される電子デバイスの製造装置の全体の概略構成例を示す模式図である。図1に示すように、露光工程で使用される製造装置は、ガスレーザ装置100及び露光装置200を含む。露光装置200は、複数のミラー211,212,213を含む照明光学系210と、投影光学系220とを含む。照明光学系210は、ガスレーザ装置100から入射するレーザ光によって、レチクルステージRTのレチクルパターンを照明する。投影光学系220は、レチクルを透過するレーザ光を、縮小投影してワークピーステーブルWT上に配置される不図示のワークピースに結像させる。ワークピースは、フォトレジストが塗布される半導体ウエハ等の感光基板である。露光装置200は、レチクルステージRTとワークピーステーブルWTとを同期して平行移動させることにより、レチクルパターンを反映するレーザ光をワークピースに露光する。以上のような露光工程によって半導体ウエハにデバイスパターンを転写することで電子デバイスである半導体デバイスを製造することができる。
2.1 構成
比較例のガスレーザ装置100について説明する。なお、本開示の比較例とは、出願人のみによって知られていると出願人が認識している形態であって、出願人が自認している公知例ではない。
次に、比較例のガスレーザ装置100の動作について説明する。
比較例のチャンバ装置CHでは、クロスフローファン46の駆動によって生じる圧力差によるレーザガスの流れだけでは、フィルタケース50に流れるレーザガスの流量が不足する懸念が生じる。この場合、パージ室30g,30gから開口30j,30kを介して筐体30の内部空間に流れるレーザガスの流量が少なくなり、筐体30の内部空間から開口30j,30kを介してウインドウ31a,31bに微粒子が進行してしまうことがある。筒部材60a及び筒部材60bではレーザガス中の微粒子の一部しか取り除けないため、微粒子がウインドウ31a,31bに付着してしまい、ウインドウ31a,31bの透過率が微粒子によって低下してしまうことがある。透過率が低下すると、ガスレーザ装置100から露光装置200に向かって出射するパルスレーザ光のエネルギー密度が低下してしまうことがある。従って、ガスレーザ装置100の信頼性が低下するという懸念が生じる。この流量不足は、ガスレーザ装置100のパルスエネルギが大きくなると、電極面積の増加等により発生する微粒子が増加するため、より顕著になる。
次に、実施形態1のチャンバ装置CHについて説明する。なお、上記において説明した構成と同様の構成については同一の符号を付し、特に説明する場合を除き、重複する説明は省略する。また、一部の図面では、見易さのため、部材の一部を省略または簡略して記載している場合がある。
図5は、本実施形態のチャンバ装置CHの筐体30の内部空間を絶縁部33側からクロスフローファン46側に向かって見る図である。本実施形態のチャンバ装置CHでは、比較例のチャンバ装置CHとは異なり、フィルタケース50、流路30d,30e、及びパージ室30g,30hが設けられていない。
次に、本実施形態におけるクロスフローファン46、及び第2ファン311の動作について説明する。
本実施形態のチャンバ装置CHでは、第2ファン311は、クロスフローファン46の駆動源であるモータ46aからの駆動力によってクロスフローファン46と共に回転する。ファン側流路である流路313には、フィルタ53aによってろ過されるレーザガスが第2ファン311によって流れる。当該レーザガスの一部はウインドウ31aから離れる方向に流れ、他の一部はウインドウ側流路である流路315に流れる。流路315に流れたレーザガスは、流路315によってウインドウ31a側に流れると共に、ウインドウ31aによって跳ね返り、流路315によってウインドウ31aから離れる方向に流れる。
次に、実施形態2のチャンバ装置CHについて説明する。なお、上記において説明した構成と同様の構成については同一の符号を付し、特に説明する場合を除き、重複する説明は省略する。
図8は、本実施形態の筐体30の内部空間を絶縁部33側からクロスフローファン46側に向かって見る図である。本実施形態のチャンバ装置CHでは、流路313,315,323,325のそれぞれの構成が、実施形態1のそれぞれの構成と異なる。以下では、流路313,315を用いて説明するが、流路323,325は、流路313,315と同じ構成である。従って、流路323,325は、流路313,315と同様の動作・作用・効果を得ることができる。
本実施形態のチャンバ装置CHでは、流路313及び流路315は、内部空間301に配置される。このため、隔壁81に開口81b,81cを設ける必要がなくなり得る。また、流路313及び流路315が内部空間305に配置されないため、クロスフローファン46によるガスの流れが流路313及び流路315によって乱れてしまうことが抑制され得る。
本明細書及び請求の範囲全体で使用される用語は、明記が無い限り「限定的でない」用語と解釈されるべきである。たとえば、「含む」、「有する」、「備える」、「具備する」などの用語は、「記載されたもの以外の構成要素の存在を除外しない」と解釈されるべきである。また、修飾語「1つの」は、「少なくとも1つ」又は「1又はそれ以上」を意味すると解釈されるべきである。また、「A、B及びCの少なくとも1つ」という用語は、「A」「B」「C」「A+B」「A+C」「B+C」又は「A+B+C」と解釈されるべきであり、さらに、それらと「A」「B」「C」以外のものとの組み合わせも含むと解釈されるべきである。
Claims (20)
- レーザガスを封入する筐体と、
前記筐体の内部空間において互いに対向して配置され、電圧が印加されることで前記レーザガスから光を発生させる一対の放電電極と、
前記筐体の壁面に配置され、前記光が透過するウインドウと、
前記内部空間に配置され、前記レーザガスを前記一対の放電電極の間に流す第1ファンと、
前記内部空間に配置されるフィルタと、
前記第1ファンの駆動源からの駆動力によって前記第1ファンと共に回転する第2ファンと、
前記内部空間に設けられ、前記フィルタによってろ過される前記レーザガスが前記第2ファンによって流れ、当該レーザガスの一部を前記ウインドウから離れる方向に流すファン側流路と、
前記内部空間に設けられ、前記ファン側流路に連通し、前記第2ファンによって前記ファン側流路から流される前記レーザガスを前記ウインドウ側に流すウインドウ側流路と、
を備える
チャンバ装置。 - 請求項1に記載のチャンバ装置であって、
前記ウインドウが設けられる前記壁面と前記放電電極との間に設けられ、前記内部空間を前記ウインドウが設けられる前記壁面に接するウインドウ側内部空間と前記放電電極が位置し前記ウインドウ側内部空間よりも広い電極側内部空間とに仕切る隔壁を備え、
前記ファン側流路は、前記ウインドウ側内部空間と、前記電極側内部空間とに前記隔壁を通じて設けられ、
前記ウインドウ側流路は、前記ウインドウ側内部空間に設けられる。 - 請求項2に記載のチャンバ装置であって、
前記ファン側流路は、
前記ウインドウ側内部空間に設けられ、前記電極側内部空間の前記レーザガスが前記隔壁の第1開口を介して流入する第1流路と、
前記電極側内部空間に設けられ、前記第1流路の前記レーザガスが前記隔壁の第2開口を介して流入する第2流路と、
前記ウインドウ側内部空間に設けられ、前記第2流路の前記レーザガスが前記隔壁の第3開口を介して流入し、当該レーザガスを前記ウインドウ側流路に流す第3流路と、
を含む。 - 請求項3に記載のチャンバ装置であって、
前記第2ファンは、前記第3流路に配置される。 - 請求項3に記載のチャンバ装置であって、
前記フィルタは、前記電極側内部空間において前記第1開口を覆う。 - 請求項3に記載のチャンバ装置であって、
前記ウインドウ側流路に配置される筒部材をさらに備え、
前記筒部材は、前記筒部材の内部空間に配置されると共に開口が連続する複数の板部材を含み、
それぞれの前記板部材は、間隔をあけて前記光の進行方向に並列に配置される。 - 請求項3に記載のチャンバ装置であって、
前記第3流路は、前記隔壁の第4開口を介して前記電極側内部空間に前記レーザガスを流す。 - 請求項7に記載のチャンバ装置であって、
前記光の進行方向に沿って見る場合において、前記第4開口、前記第4開口と前記第3流路との連通部、前記第3流路と前記ウインドウ側流路との連通部、及び前記ウインドウ側流路は、前記ウインドウと重なる。 - 請求項1に記載のチャンバ装置であって、
前記ウインドウが設けられる前記壁面と前記放電電極との間に設けられる隔壁を備え、
前記ファン側流路及び前記ウインドウ側流路は、前記内部空間のうちの前記隔壁と前記ウインドウが設けられる前記壁面との間のウインドウ側内部空間に設けられる。 - 請求項9に記載のチャンバ装置であって、
前記第2ファンは、前記ファン側流路に配置される。 - 請求項9に記載のチャンバ装置であって、
前記ファン側流路には、前記隔壁を基準にして前記ウインドウ側内部空間とは反対側で前記放電電極が位置する電極側内部空間の前記レーザガスが前記隔壁の第1開口を介して流入し、
前記フィルタは、前記電極側内部空間において前記第1開口を覆う。 - 請求項9に記載のチャンバ装置であって、
前記ファン側流路に配置される筒部材をさらに備え、
前記筒部材は、前記筒部材の内部空間に配置されると共に開口が連続する複数の板部材を含み、
それぞれの前記板部材は、間隔をあけて前記光の進行方向に並列に配置される。 - 請求項9に記載のチャンバ装置であって、
前記ファン側流路は、前記ウインドウ側流路及び前記隔壁の第2開口を介して、前記隔壁を基準にして前記ウインドウ側内部空間とは反対側で前記放電電極が位置する電極側内部空間に前記レーザガスを流す。 - 請求項1に記載のチャンバ装置であって、
前記第2ファンは、前記第1ファンの駆動軸と連結し、前記駆動軸の回転によって回転する。 - 請求項1に記載のチャンバ装置であって、
前記第2ファンは、遠心ファンである。 - 請求項1に記載のチャンバ装置であって、
前記第2ファンは、シロッコファンである。 - チャンバ装置を備えるガスレーザ装置であって、
前記チャンバ装置は、
レーザガスを封入する筐体と、
前記筐体の内部空間において互いに対向して配置され、電圧が印加されることで前記レーザガスから光を発生させる一対の放電電極と、
前記筐体の壁面に配置され、前記光が透過するウインドウと、
前記内部空間に配置され、前記レーザガスを前記一対の放電電極の間に流す第1ファンと、
前記内部空間に配置されるフィルタと、
前記第1ファンの駆動源からの駆動力によって前記第1ファンと共に回転する第2ファンと、
前記内部空間に設けられ、前記フィルタによってろ過される前記レーザガスが前記第2ファンによって流れ、当該レーザガスの一部を前記ウインドウから離れる方向に流すファン側流路と、
前記内部空間に設けられ、前記ファン側流路に連通し、前記第2ファンによって前記ファン側流路から流される前記レーザガスを前記ウインドウ側に流すウインドウ側流路と、
を備える。 - 請求項17に記載のガスレーザ装置であって、
前記ガスレーザ装置は、エキシマレーザ装置である。 - 電子デバイスの製造方法であって、
レーザガスを封入する筐体と、
前記筐体の内部空間において互いに対向して配置され、電圧が印加されることで前記レーザガスから光を発生させる一対の放電電極と、
前記筐体の壁面に配置され、前記光が透過するウインドウと、
前記内部空間に配置され、前記レーザガスを前記一対の放電電極の間に流す第1ファンと、
前記内部空間に配置されるフィルタと、
前記第1ファンの駆動源からの駆動力によって前記第1ファンと共に回転する第2ファンと、
前記内部空間に設けられ、前記フィルタによってろ過される前記レーザガスが前記第2ファンによって流れ、当該レーザガスの一部を前記ウインドウから離れる方向に流すファン側流路と、
前記内部空間に設けられ、前記ファン側流路に連通し、前記第2ファンによって前記ファン側流路から流される前記レーザガスを前記ウインドウ側に流すウインドウ側流路と、
を備えるチャンバ装置を備えるガスレーザ装置によってレーザ光を生成し、
前記レーザ光を露光装置に出力し、
電子デバイスを製造するために、前記露光装置内で感光基板上に前記レーザ光を露光すること
を含む電子デバイスの製造方法。 - 請求項19に記載の電子デバイスの製造方法であって、
前記ガスレーザ装置は、エキシマレーザ装置である。
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JPH06275902A (ja) * | 1993-03-24 | 1994-09-30 | Komatsu Ltd | エキシマレーザ装置 |
JP2002136046A (ja) * | 2000-10-24 | 2002-05-10 | Ebara Corp | 磁気軸受モータおよびエキシマレーザ装置 |
JP2007507858A (ja) * | 2003-07-31 | 2007-03-29 | ヴィズイクス・インコーポレーテッド | エキシマまたは横放電レーザに使用するための受動ガス流の管理とフィルタ・デバイス |
US20070002918A1 (en) * | 2005-06-30 | 2007-01-04 | Norbert Niemoeller | Acoustic shock-wave damping in pulsed gas-laser discharge |
US20100107870A1 (en) * | 2008-10-30 | 2010-05-06 | Richard Morton | Metal fluoride trap |
WO2014069636A1 (ja) * | 2012-11-05 | 2014-05-08 | ギガフォトン株式会社 | レーザチャンバ及び放電励起式ガスレーザ装置 |
JP2015537386A (ja) * | 2012-11-21 | 2015-12-24 | 中国科学院光▲電▼研究院 | ダブル電極放電チャンバの導流装置及びこれを適用した放電チャンバ、エキシマレーザ |
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US20230387642A1 (en) | 2023-11-30 |
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