WO2022138246A1 - 転写材料及び積層体の製造方法 - Google Patents
転写材料及び積層体の製造方法 Download PDFInfo
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- WO2022138246A1 WO2022138246A1 PCT/JP2021/045627 JP2021045627W WO2022138246A1 WO 2022138246 A1 WO2022138246 A1 WO 2022138246A1 JP 2021045627 W JP2021045627 W JP 2021045627W WO 2022138246 A1 WO2022138246 A1 WO 2022138246A1
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- photosensitive layer
- temporary support
- mass
- transfer material
- compound
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- FRIPRWYKBIOZJU-UHFFFAOYSA-N fluorone Chemical compound C1=CC=C2OC3=CC(=O)C=CC3=CC2=C1 FRIPRWYKBIOZJU-UHFFFAOYSA-N 0.000 description 1
- 238000010528 free radical solution polymerization reaction Methods 0.000 description 1
- 239000001530 fumaric acid Substances 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 238000004817 gas chromatography Methods 0.000 description 1
- 125000003055 glycidyl group Chemical group C(C1CO1)* 0.000 description 1
- 229940100608 glycol distearate Drugs 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910021389 graphene Inorganic materials 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 125000003187 heptyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- RRAMGCGOFNQTLD-UHFFFAOYSA-N hexamethylene diisocyanate Chemical compound O=C=NCCCCCCN=C=O RRAMGCGOFNQTLD-UHFFFAOYSA-N 0.000 description 1
- 125000002883 imidazolyl group Chemical group 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 235000019239 indanthrene blue RS Nutrition 0.000 description 1
- 239000011229 interlayer Substances 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- RBTARNINKXHZNM-UHFFFAOYSA-K iron trichloride Chemical compound Cl[Fe](Cl)Cl RBTARNINKXHZNM-UHFFFAOYSA-K 0.000 description 1
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- IQPQWNKOIGAROB-UHFFFAOYSA-N isocyanate group Chemical group [N-]=C=O IQPQWNKOIGAROB-UHFFFAOYSA-N 0.000 description 1
- VFQXVTODMYMSMJ-UHFFFAOYSA-N isonicotinamide Chemical compound NC(=O)C1=CC=NC=C1 VFQXVTODMYMSMJ-UHFFFAOYSA-N 0.000 description 1
- 150000003951 lactams Chemical class 0.000 description 1
- 238000004811 liquid chromatography Methods 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 239000011777 magnesium Substances 0.000 description 1
- VZCYOOQTPOCHFL-UPHRSURJSA-N maleic acid Chemical compound OC(=O)\C=C/C(O)=O VZCYOOQTPOCHFL-UPHRSURJSA-N 0.000 description 1
- 239000011976 maleic acid Substances 0.000 description 1
- FPYJFEHAWHCUMM-UHFFFAOYSA-N maleic anhydride Chemical compound O=C1OC(=O)C=C1 FPYJFEHAWHCUMM-UHFFFAOYSA-N 0.000 description 1
- 125000005439 maleimidyl group Chemical group C1(C=CC(N1*)=O)=O 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 229910001507 metal halide Inorganic materials 0.000 description 1
- 150000005309 metal halides Chemical class 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 125000005395 methacrylic acid group Chemical group 0.000 description 1
- DCUFMVPCXCSVNP-UHFFFAOYSA-N methacrylic anhydride Chemical compound CC(=C)C(=O)OC(=O)C(C)=C DCUFMVPCXCSVNP-UHFFFAOYSA-N 0.000 description 1
- WSFSSNUMVMOOMR-NJFSPNSNSA-N methanone Chemical compound O=[14CH2] WSFSSNUMVMOOMR-NJFSPNSNSA-N 0.000 description 1
- RUAIJHHRCIHFEV-UHFFFAOYSA-N methyl 4-amino-5-chlorothiophene-2-carboxylate Chemical compound COC(=O)C1=CC(N)=C(Cl)S1 RUAIJHHRCIHFEV-UHFFFAOYSA-N 0.000 description 1
- DWCZIOOZPIDHAB-UHFFFAOYSA-L methyl green Chemical compound [Cl-].[Cl-].C1=CC(N(C)C)=CC=C1C(C=1C=CC(=CC=1)[N+](C)(C)C)=C1C=CC(=[N+](C)C)C=C1 DWCZIOOZPIDHAB-UHFFFAOYSA-L 0.000 description 1
- WBYWAXJHAXSJNI-UHFFFAOYSA-N methyl p-hydroxycinnamate Natural products OC(=O)C=CC1=CC=CC=C1 WBYWAXJHAXSJNI-UHFFFAOYSA-N 0.000 description 1
- 125000001570 methylene group Chemical group [H]C([H])([*:1])[*:2] 0.000 description 1
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- SHXOKQKTZJXHHR-UHFFFAOYSA-N n,n-diethyl-5-iminobenzo[a]phenoxazin-9-amine;hydrochloride Chemical compound [Cl-].C1=CC=C2C3=NC4=CC=C(N(CC)CC)C=C4OC3=CC(=[NH2+])C2=C1 SHXOKQKTZJXHHR-UHFFFAOYSA-N 0.000 description 1
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 239000002070 nanowire Substances 0.000 description 1
- 125000001624 naphthyl group Chemical group 0.000 description 1
- SLCVBVWXLSEKPL-UHFFFAOYSA-N neopentyl glycol Chemical compound OCC(C)(C)CO SLCVBVWXLSEKPL-UHFFFAOYSA-N 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- OTLDLKLSNZMTTA-UHFFFAOYSA-N octahydro-1h-4,7-methanoindene-1,5-diyldimethanol Chemical compound C1C2C3C(CO)CCC3C1C(CO)C2 OTLDLKLSNZMTTA-UHFFFAOYSA-N 0.000 description 1
- 229920002114 octoxynol-9 Polymers 0.000 description 1
- 239000012788 optical film Substances 0.000 description 1
- 125000000962 organic group Chemical group 0.000 description 1
- 239000012044 organic layer Substances 0.000 description 1
- 239000012860 organic pigment Substances 0.000 description 1
- 229940105570 ornex Drugs 0.000 description 1
- 235000006408 oxalic acid Nutrition 0.000 description 1
- 150000002916 oxazoles Chemical class 0.000 description 1
- 125000003566 oxetanyl group Chemical group 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- WXZMFSXDPGVJKK-UHFFFAOYSA-N pentaerythritol Chemical compound OCC(CO)(CO)CO WXZMFSXDPGVJKK-UHFFFAOYSA-N 0.000 description 1
- 125000005010 perfluoroalkyl group Chemical group 0.000 description 1
- 239000013500 performance material Substances 0.000 description 1
- CMCWWLVWPDLCRM-UHFFFAOYSA-N phenidone Chemical compound N1C(=O)CCN1C1=CC=CC=C1 CMCWWLVWPDLCRM-UHFFFAOYSA-N 0.000 description 1
- 125000000286 phenylethyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000005506 phthalide group Chemical group 0.000 description 1
- FSDNTQSJGHSJBG-UHFFFAOYSA-N piperidine-4-carbonitrile Chemical compound N#CC1CCNCC1 FSDNTQSJGHSJBG-UHFFFAOYSA-N 0.000 description 1
- 238000001020 plasma etching Methods 0.000 description 1
- 239000002798 polar solvent Substances 0.000 description 1
- 229920001983 poloxamer Polymers 0.000 description 1
- 229920000083 poly(allylamine) Polymers 0.000 description 1
- 229920001200 poly(ethylene-vinyl acetate) Polymers 0.000 description 1
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 1
- 239000009719 polyimide resin Substances 0.000 description 1
- 239000004926 polymethyl methacrylate Substances 0.000 description 1
- 229920000259 polyoxyethylene lauryl ether Polymers 0.000 description 1
- 229920006324 polyoxymethylene Polymers 0.000 description 1
- 229920005650 polypropylene glycol diacrylate Polymers 0.000 description 1
- 229920005749 polyurethane resin Polymers 0.000 description 1
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- 239000011148 porous material Substances 0.000 description 1
- 239000011591 potassium Substances 0.000 description 1
- 229960003975 potassium Drugs 0.000 description 1
- 239000011736 potassium bicarbonate Substances 0.000 description 1
- 229910000028 potassium bicarbonate Inorganic materials 0.000 description 1
- 235000015497 potassium bicarbonate Nutrition 0.000 description 1
- 229910000027 potassium carbonate Inorganic materials 0.000 description 1
- 235000011181 potassium carbonates Nutrition 0.000 description 1
- TYJJADVDDVDEDZ-UHFFFAOYSA-M potassium hydrogencarbonate Chemical compound [K+].OC([O-])=O TYJJADVDDVDEDZ-UHFFFAOYSA-M 0.000 description 1
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- 235000011118 potassium hydroxide Nutrition 0.000 description 1
- 229910001414 potassium ion Inorganic materials 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- HJWLCRVIBGQPNF-UHFFFAOYSA-N prop-2-enylbenzene Chemical compound C=CCC1=CC=CC=C1 HJWLCRVIBGQPNF-UHFFFAOYSA-N 0.000 description 1
- BOQSSGDQNWEFSX-UHFFFAOYSA-N propan-2-yl 2-methylprop-2-enoate Chemical compound CC(C)OC(=O)C(C)=C BOQSSGDQNWEFSX-UHFFFAOYSA-N 0.000 description 1
- 125000002572 propoxy group Chemical group [*]OC([H])([H])C(C([H])([H])[H])([H])[H] 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- 238000010298 pulverizing process Methods 0.000 description 1
- 150000003219 pyrazolines Chemical class 0.000 description 1
- 150000003222 pyridines Chemical class 0.000 description 1
- 125000000168 pyrrolyl group Chemical group 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
- 150000003242 quaternary ammonium salts Chemical class 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000007261 regionalization Effects 0.000 description 1
- PYWVYCXTNDRMGF-UHFFFAOYSA-N rhodamine B Chemical compound [Cl-].C=12C=CC(=[N+](CC)CC)C=C2OC2=CC(N(CC)CC)=CC=C2C=1C1=CC=CC=C1C(O)=O PYWVYCXTNDRMGF-UHFFFAOYSA-N 0.000 description 1
- 229940043267 rhodamine b Drugs 0.000 description 1
- RAPZEAPATHNIPO-UHFFFAOYSA-N risperidone Chemical compound FC1=CC=C2C(C3CCN(CC3)CCC=3C(=O)N4CCCCC4=NC=3C)=NOC2=C1 RAPZEAPATHNIPO-UHFFFAOYSA-N 0.000 description 1
- 239000005060 rubber Substances 0.000 description 1
- RMAQACBXLXPBSY-UHFFFAOYSA-N silicic acid Chemical compound O[Si](O)(O)O RMAQACBXLXPBSY-UHFFFAOYSA-N 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 229910000030 sodium bicarbonate Inorganic materials 0.000 description 1
- 235000017557 sodium bicarbonate Nutrition 0.000 description 1
- 235000017550 sodium carbonate Nutrition 0.000 description 1
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- 229940073455 tetraethylammonium hydroxide Drugs 0.000 description 1
- LRGJRHZIDJQFCL-UHFFFAOYSA-M tetraethylazanium;hydroxide Chemical compound [OH-].CC[N+](CC)(CC)CC LRGJRHZIDJQFCL-UHFFFAOYSA-M 0.000 description 1
- LPSKDVINWQNWFE-UHFFFAOYSA-M tetrapropylazanium;hydroxide Chemical compound [OH-].CCC[N+](CCC)(CCC)CCC LPSKDVINWQNWFE-UHFFFAOYSA-M 0.000 description 1
- 229920002803 thermoplastic polyurethane Polymers 0.000 description 1
- 150000003557 thiazoles Chemical class 0.000 description 1
- 239000002562 thickening agent Substances 0.000 description 1
- 150000003577 thiophenes Chemical class 0.000 description 1
- YRHRIQCWCFGUEQ-UHFFFAOYSA-N thioxanthen-9-one Chemical class C1=CC=C2C(=O)C3=CC=CC=C3SC2=C1 YRHRIQCWCFGUEQ-UHFFFAOYSA-N 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 239000011135 tin Substances 0.000 description 1
- LDHQCZJRKDOVOX-UHFFFAOYSA-N trans-crotonic acid Natural products CC=CC(O)=O LDHQCZJRKDOVOX-UHFFFAOYSA-N 0.000 description 1
- PJANXHGTPQOBST-VAWYXSNFSA-N trans-stilbene Chemical class C=1C=CC=CC=1/C=C/C1=CC=CC=C1 PJANXHGTPQOBST-VAWYXSNFSA-N 0.000 description 1
- 238000000411 transmission spectrum Methods 0.000 description 1
- 125000005259 triarylamine group Chemical group 0.000 description 1
- 239000001003 triarylmethane dye Substances 0.000 description 1
- 125000005409 triarylsulfonium group Chemical group 0.000 description 1
- 150000003918 triazines Chemical class 0.000 description 1
- 150000003852 triazoles Chemical group 0.000 description 1
- 239000013638 trimer Substances 0.000 description 1
- MTPVUVINMAGMJL-UHFFFAOYSA-N trimethyl(1,1,2,2,2-pentafluoroethyl)silane Chemical compound C[Si](C)(C)C(F)(F)C(F)(F)F MTPVUVINMAGMJL-UHFFFAOYSA-N 0.000 description 1
- QXJQHYBHAIHNGG-UHFFFAOYSA-N trimethylolethane Chemical compound OCC(C)(CO)CO QXJQHYBHAIHNGG-UHFFFAOYSA-N 0.000 description 1
- 230000004304 visual acuity Effects 0.000 description 1
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- 230000037303 wrinkles Effects 0.000 description 1
- 239000001018 xanthene dye Substances 0.000 description 1
- 150000007964 xanthones Chemical class 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B7/00—Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
- B32B7/02—Physical, chemical or physicochemical properties
- B32B7/023—Optical properties
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B7/00—Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
- B32B7/04—Interconnection of layers
- B32B7/06—Interconnection of layers permitting easy separation
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/032—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
- G03F7/033—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders the binders being polymers obtained by reactions only involving carbon-to-carbon unsaturated bonds, e.g. vinyl polymers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
Definitions
- This disclosure relates to a transfer material and a method for manufacturing a laminate.
- Patent Document 1 has a photosensitive layer, an adhesive layer, and a temporary support in this order on a cover film, the photosensitive layer contains particles, and the photosensitive layer and the adhesive layer come into contact with each other.
- the photosensitive layer and the adhesive layer can be peeled off, and the surface of the photosensitive layer after peeling the photosensitive layer and the adhesive layer has irregularities formed by the particles.
- the transfer material is disclosed.
- the temporary support is provided before the exposure of the photosensitive layer due to various reasons such as improvement of resolution and reduction of defects generated in the pattern.
- a method of peeling may be used.
- the photosensitive layer exposed by the peeling of the temporary support may adhere to a transport device such as a roller, and the transportability may be deteriorated.
- the above-mentioned phenomenon is likely to occur when the temporarily stationary conveyed object is moved again.
- the photomask is brought into contact with the photosensitive layer exposed by peeling of the temporary support to expose the photosensitive layer, the photosensitive layer may adhere to the photomask, making it difficult to align the photomask.
- One embodiment of the present disclosure is an object of the present invention to provide a transfer material including a photosensitive layer having excellent slipperiness.
- Another embodiment of the present disclosure is an object of the present invention to provide a method for producing a laminate using a transfer material containing a photosensitive layer having excellent slipperiness.
- the disclosure includes the following aspects: ⁇ 1> The roughness Ra of the surface of the photosensitive layer, which includes the temporary support and the photosensitive layer in contact with the temporary support and is exposed when the temporary support is peeled from the photosensitive layer, is 2 nm or more. Is a transfer material. ⁇ 2> The transfer material according to ⁇ 1>, wherein the roughness Ra of the surface of the temporary support exposed when the temporary support is peeled from the photosensitive layer is 2 nm or more. ⁇ 3> The transfer material according to ⁇ 1> or ⁇ 2>, wherein the surface roughness Ra of the photosensitive layer exposed when the temporary support is peeled off from the photosensitive layer is 1,000 nm or less.
- ⁇ 4> One of ⁇ 1> to ⁇ 3>, wherein the roughness Ra of the surface of the temporary support exposed when the temporary support is peeled from the photosensitive layer is 1,000 nm or less.
- ⁇ 5> The invention according to any one of ⁇ 1> to ⁇ 4>, wherein the static friction coefficient of the surface of the photosensitive layer exposed when the temporary support is peeled off from the photosensitive layer is 1.0 or less.
- Transfer material. ⁇ 6> Any of ⁇ 1> to ⁇ 5>, wherein the photosensitive layer contains a polymer compound having a weight average molecular weight of 10,000 or more, and the glass transition temperature of the polymer compound is 50 ° C. or more. The transfer material according to one.
- the photosensitive layer contains a polymerizable compound having a molecular weight of 1,500 or less, and the ratio of the mass of the polymerizable compound contained in the photosensitive layer to the mass of the polymer compound contained in the photosensitive layer is , 50% or less, according to ⁇ 6>.
- the polymerizable compound comprises a polymerizable compound having two or more polymerizable groups and a polymerizable compound having three or more polymerizable groups.
- ⁇ 10> The transfer material according to any one of ⁇ 7> to ⁇ 9>, wherein the polymerizable compound is an ethoxylated methacrylate compound.
- the photosensitive layer contains a surfactant.
- the thickness of the photosensitive layer is 5 ⁇ m or less.
- the transfer material including the temporary support and the photosensitive layer in contact with the temporary support is bonded to the substrate, and the photosensitive layer and the temporary support are arranged in this order on the substrate, and the photosensitive layer is arranged in this order.
- the photosensitive layer includes, in this order, peeling the temporary support from the layer and subjecting the photosensitive layer exposed by the peeling of the temporary support to exposure treatment and development treatment to form a pattern.
- a method for producing a laminated body wherein the surface roughness Ra of the photosensitive layer exposed by peeling off the temporary support is 2 nm or more.
- the method for producing a laminate according to ⁇ 13>, wherein the surface roughness Ra of the photosensitive layer exposed by peeling the temporary support from the photosensitive layer is 1,000 nm or less.
- the exposure process comprises contacting the photosensitive layer with a photomask to expose the photosensitive layer.
- a transfer material including a photosensitive layer having excellent slipperiness is provided.
- a method for producing a laminate using a transfer material containing a photosensitive layer having excellent slipperiness is provided.
- FIG. 1 is a schematic diagram showing an example of the configuration of a transfer material of a certain embodiment.
- FIG. 2 is a schematic plan view showing the pattern A.
- FIG. 3 is a schematic plan view showing the pattern B.
- the numerical range represented by using “-” means a range including the numerical values before and after "-" as the lower limit value and the upper limit value.
- “(meth) acrylic” represents both acrylic and methacrylic, or either, and "(meth) acrylate” represents both acrylate and methacrylate, or either, and "(meth) acryloyl”. Represents both acryloyl and / or methacryloyl.
- the amount of each component in the composition means the total amount of the plurality of applicable substances present in the composition when a plurality of the substances corresponding to each component are present in the composition, unless otherwise specified. do.
- the term "process" is included in this term not only as an independent process but also as long as the intended purpose of the process is achieved even if it cannot be clearly distinguished from other processes.
- the notation not describing substitution and non-substitution includes those having no substituent as well as those having a substituent.
- the "alkyl group” includes not only an alkyl group having no substituent (unsubstituted alkyl group) but also an alkyl group having a substituent (substituted alkyl group).
- "exposure” includes not only exposure using light but also drawing using particle beams such as an electron beam and an ion beam, unless otherwise specified.
- the light used for exposure generally, the emission line spectrum of a mercury lamp, far ultraviolet rays typified by an excima laser, extreme ultraviolet rays (EUV light), X-rays, active rays such as electron beams (active energy rays) are used. Can be mentioned.
- the chemical structural formula in the present disclosure may be described as a simplified structural formula omitting a hydrogen atom.
- “% by mass” and “% by weight” are synonymous, and “parts by mass” and “parts by weight” are synonymous.
- a combination of two or more preferred embodiments is a more preferred embodiment.
- “transparent” means that the average transmittance of visible light having a wavelength of 400 nm to 700 nm is 80% or more, and is preferably 90% or more.
- the average transmittance of visible light is a value measured by using a spectrophotometer, and can be measured by, for example, a spectrophotometer U-3310 manufactured by Hitachi, Ltd.
- the weight average molecular weight (Mw) and the number average molecular weight (Mn) in the present disclosure are gel permeations using columns of TSKgel GMHxL, TSKgel G4000HxL, and TSKgel G2000HxL (all are trade names manufactured by Tosoh Corporation). It is a molecular weight converted by detecting with a solvent THF (tetrahydrofuran) and a differential refraction meter by an ion chromatography (GPC) analyzer and using polystyrene as a standard substance.
- the content of the metal element is a value measured by using an inductively coupled plasma (ICP) spectroscopic analyzer.
- ICP inductively coupled plasma
- the refractive index is a value measured using an ellipsometer at a wavelength of 550 nm.
- the hue is a value measured using a color difference meter (CR-221, manufactured by Minolta Co., Ltd.).
- alkali-soluble means that the solubility of sodium carbonate having a liquid temperature of 22 ° C. in 100 g of a 1% by mass aqueous solution is 0.1 g or more.
- solid content means all components except solvents.
- the layer thickness of each layer provided in the transfer material is obtained by observing a cross section in a direction perpendicular to the main surface of the transfer material with a scanning electron microscope (SEM). Based on this, the thickness of each layer is measured at an arbitrary 5 points or more, and the average value is calculated.
- SEM scanning electron microscope
- the transfer material according to the embodiment of the present disclosure includes a temporary support and a photosensitive layer in contact with the temporary support, and the photosensitive layer exposed when the temporary support is peeled from the photosensitive layer.
- the surface roughness Ra is 2 nm or more.
- a transfer material including a photosensitive layer having excellent slipperiness is provided.
- the presumed reason for improving the slipperiness of the photosensitive layer is considered as follows. When the roughness Ra of the surface of the exposed photosensitive layer when the temporary support is peeled from the photosensitive layer is 2 nm or more, the friction generated on the surface of the photosensitive layer is reduced. Therefore, it is presumed that the slipperiness of the surface of the photosensitive layer is improved.
- the transfer material will be specifically described.
- the surface of the temporary support facing the photosensitive layer in the transfer material is referred to as "the first surface of the temporary support”
- the surface of the photosensitive layer facing the temporary support in the transfer material is referred to as “the first surface of the photosensitive layer”. May be said.
- the first surface of the temporary support faces the first surface of the photosensitive layer.
- another layer may be laminated on the surface of the photosensitive layer opposite to the surface facing the temporary support.
- the other layer include a refractive index adjusting layer and a protective film.
- each layer may be a single layer or a plurality of layers.
- An example of the composition of the transfer material is shown below. However, the composition of the transfer material is not limited to the following examples.
- the photosensitive layer is preferably a negative photosensitive layer. Further, it is also preferable that the photosensitive layer is a colored resin layer.
- FIG. 1 is a schematic diagram showing the configuration of a transfer material according to an embodiment.
- the transfer material 100 shown in FIG. 1 includes a temporary support 10, a photosensitive layer 20, and a protective film 30 in this order.
- the protective film 30 of the transfer material 100 does not have to be arranged.
- the total thickness of the other layers may be 0.1% to 30% with respect to the thickness of the photosensitive layer. It is preferably 0.1% to 20%, more preferably 0.1% to 20%.
- the maximum width of the swell of the transfer material is preferably 300 ⁇ m or less, more preferably 200 ⁇ m or less, and further preferably 60 ⁇ m or less.
- the maximum width of the waviness of the transfer material is preferably 0 ⁇ m or more, more preferably 0.1 ⁇ m or more, and further preferably 1 ⁇ m or more.
- the maximum width of the swell of the transfer material is measured by the following procedure. First, the transfer material is cut in a direction perpendicular to the main surface so as to have a size of 20 cm in length ⁇ 20 cm in width, and a test sample is prepared. If the transfer material contains a protective film, the protective film is peeled off.
- test sample is placed on a stage having a smooth surface and a horizontal surface so that the surface of the temporary support faces the stage.
- the surface of the test sample was scanned with a laser microscope (for example, VK-9700SP manufactured by Keyence Co., Ltd.) for a range of 10 cm square in the center of the test sample to obtain a three-dimensional surface image, and the obtained three-dimensional surface was obtained.
- a laser microscope for example, VK-9700SP manufactured by Keyence Co., Ltd.
- the above operation is performed on 10 test samples, and the arithmetic mean value is defined as the "maximum width of the waviness of the transfer material".
- the transfer material includes a temporary support.
- the temporary support is a support that supports at least the photosensitive layer and is removable.
- the temporary support is in contact with the photosensitive layer.
- the surface of the temporary support facing the photosensitive layer that is, the first surface of the temporary support is in contact with the photosensitive layer and can be exposed by peeling the temporary support from the photosensitive layer.
- the roughness of the first surface of the temporary support can affect the roughness of the first surface of the photosensitive layer, which will be described later.
- the roughness of the first surface of the temporary support becomes smaller, the roughness of the first surface of the photosensitive layer tends to become smaller.
- the roughness of the first surface of the temporary support increases, the roughness of the first surface of the photosensitive layer also tends to increase.
- the roughness Ra of the surface of the temporary support exposed when the temporary support is peeled from the photosensitive layer that is, the roughness Ra of the first surface of the temporary support is preferably 1,000 nm or less. , 500 nm or less, more preferably 200 nm or less.
- the roughness Ra of the first surface of the temporary support is preferably 2 nm or more, more preferably 50 nm or more, and further preferably 100 nm or more.
- the roughness Ra of the first surface of the temporary support is preferably 2 nm to 1,000 nm, more preferably 50 nm to 500 nm, and even more preferably 100 nm to 200 nm.
- the method of adjusting the roughness of the first surface of the temporary support is not limited.
- a method for adjusting the roughness Ra of the first surface of the temporary support for example, a method of bringing a matted roll (hereinafter, may be referred to as “matted roll”) into contact with the first surface of the temporary support.
- the roughness Ra of the first surface of the temporary support is adjusted according to the surface roughness of the matted roll.
- a method of adjusting the roughness Ra of the first surface of the temporary support for example, a method of projecting fine sand on the first surface of the temporary support to make the first surface of the temporary support uneven (for example,). Sandblast method) can be mentioned.
- the roughness Ra of the first surface of the temporary support is adjusted according to the size of the projected sand and the projected strength.
- the roughness Ra of the first surface of the temporary support is measured using a surface roughness and surface shape measuring machine (NewView6300, manufactured by Zygo).
- a surface roughness and surface shape measuring machine manufactured by Zygo.
- the temporary support is peeled off from the photosensitive layer.
- a 50x objective lens set "Image Zoom of Measurement Control” to x0.5, set “Scan Lens” to 40 ⁇ m, and select "CYLDER” in "Remov” of "Average Control”.
- the value of the center surface average roughness Ra shown in "Surface map” is adopted as the roughness Ra.
- the temporary support may have a single-layer structure or a multi-layer structure.
- the temporary support is preferably a film, more preferably a resin film.
- the temporary support is preferably a film that is flexible and does not undergo significant deformation, shrinkage, or elongation under pressure, or under pressure and heating.
- the film include polyethylene terephthalate (PET) film (for example, biaxially stretched polyethylene terephthalate film), polymethylmethacrylate film, cellulose triacetate film, polystyrene film, polyimide film and polycarbonate film.
- PET polyethylene terephthalate
- the temporary support a polyethylene terephthalate film is preferable. Further, it is preferable that the film used as the temporary support is free from deformation such as wrinkles and scratches.
- the layer constituting the first surface of the temporary support preferably contains a thermoplastic resin.
- the temporary support preferably includes a thermoplastic resin layer that comes into contact with the photosensitive layer.
- the fact that the temporary support includes a thermoplastic resin layer in contact with the photosensitive layer, that is, that the first surface of the temporary support is composed of the thermoplastic resin layer controls the roughness of the first surface of the temporary support. Is preferable because it facilitates.
- thermoplastic resin examples include polyolefin resins (for example, polyethylene, polypropylene, ethylene- (meth) acrylic acid copolymer resin, ethylene- (meth) acrylic acid metal salt copolymer resin, ethylene-vinyl acetate copolymer resin and Ethylene-vinyl alcohol copolymer resin), polyester resin, styrene-butadiene copolymer resin, acrylic resin, urethane resin, epoxy resin and polyamide resin can be mentioned.
- polyolefin-based resin is preferable because it can be easily peeled off from the photosensitive layer.
- the reason why the peeling from the photosensitive layer is easy is due to the interaction between the molecules between the thermoplastic resin layer and the photosensitive layer, and by using the polyolefin resin as the thermoplastic resin, the hydrogen bonding interaction and the hydrogen bonding interaction and It is presumed that the bipolar interaction is suppressed.
- the polyolefin-based resins polyethylene having a low hydrogen-bonding interaction and a dipole interaction and a low softening temperature is most preferable.
- the transparency of the temporary support is preferably high.
- the transmittance of the temporary support with respect to light having a wavelength of 365 nm is preferably 60% or more, and more preferably 70% or more.
- the haze of the temporary support is preferably small.
- the haze value of the temporary support is preferably 2% or less, more preferably 0.5% or less, still more preferably 0.1% or less. From the viewpoint of the transparency of the temporary support, it is preferable that the number of coarse particles, foreign substances, and defects contained in the temporary support is small.
- the number of particles, foreign substances, and defects having a diameter of 1 ⁇ m or more in the temporary support is preferably 50/10 mm 2 or less, more preferably 10/10 mm 2 or less, and 3/10 mm 2 or less. Is more preferable, and 0 pieces / 10 mm 2 is particularly preferable.
- the thickness of the temporary support is preferably 5 ⁇ m to 200 ⁇ m, more preferably 10 ⁇ m to 150 ⁇ m, and further preferably 10 ⁇ m to 50 ⁇ m from the viewpoint of ease of handling and versatility.
- the thickness of the temporary support is calculated as an average value of the thicknesses of any five points measured by cross-sectional observation using a scanning electron microscope (SEM).
- Examples of the temporary support include a biaxially stretched polyethylene terephthalate film having a thickness of 16 ⁇ m, a biaxially stretched polyethylene terephthalate film having a thickness of 12 ⁇ m, and a biaxially stretched polyethylene terephthalate film having a thickness of 9 ⁇ m.
- Preferred embodiments of the provisional support include, for example, paragraphs 0017 to 0018 of JP2014-85643A, paragraphs 0019 to 0026 of JP2016-27363, and paragraphs 0041 to 0057 of International Publication No. 2012/081680. It is described in paragraphs 0029 to 0040 of International Publication No. 2018/179370 and paragraphs 0012 to 0032 of JP-A-2019-101405, and the contents of these publications are incorporated in the present specification.
- a layer containing fine particles may be provided on the surface of the temporary support.
- the lubricant layer may be provided on one side of the temporary support or on both sides.
- the diameter of the particles contained in the lubricant layer is preferably 0.05 ⁇ m to 0.8 ⁇ m.
- the thickness of the lubricant layer is preferably 0.05 ⁇ m to 1.0 ⁇ m.
- the transfer material includes a photosensitive layer that comes into contact with the temporary support.
- the photosensitive layer can form a pattern by exposure and development, for example, after being transferred onto a substrate.
- the surface of the photosensitive layer facing the temporary support that is, the first surface of the photosensitive layer is in contact with the temporary support and can be exposed by peeling the temporary support from the photosensitive layer.
- the surface of the photosensitive layer exposed when the temporary support is peeled off from the photosensitive layer that is, the roughness Ra of the first surface of the photosensitive layer is 2 nm or more.
- the roughness Ra of the first surface of the photosensitive layer is preferably 10 nm or more, more preferably 50 nm or more, and further preferably 100 nm or more.
- the roughness Ra of the first surface of the photosensitive layer is preferably 1,000 nm or less, more preferably 500 nm or less, further preferably 200 nm or less, and particularly preferably 100 nm or less.
- the roughness Ra of the first surface of the photosensitive layer is 1,000 nm or less, the linearity of the pattern formed from the photosensitive layer is improved.
- the roughness Ra of the first surface of the photosensitive layer is preferably 2 nm to 1,000 nm, more preferably 50 nm to 500 nm, and 100 nm to 200 nm. Is more preferable.
- the roughness Ra of the first surface of the photosensitive layer is measured by a method according to the method for measuring the roughness Ra of the first surface of the temporary support described in the section of “Temporary Support”.
- the static friction coefficient of the surface of the photosensitive layer exposed when the temporary support is peeled from the photosensitive layer is preferably less than 2.0, more preferably 1.0 or less. It is preferably 0.6 or less, and more preferably 0.6 or less.
- the coefficient of static friction of the first surface of the photosensitive layer is less than 2.0, the slipperiness of the surface of the photosensitive layer is improved.
- the photosensitive layer exposed by the peeling of the temporary support in the transporting process after the peeling of the temporary support adheres to a transport device such as an exposure mask and a transport roller.
- the coefficient of static friction of the first surface of the photosensitive layer is preferably 0.1 or more, more preferably 0.2 or more, and further preferably 0.3 or more.
- the coefficient of static friction of the first surface of the photosensitive layer is preferably 0.1 or more and less than 2.0, more preferably 0.2 to 1.0, and preferably 0.3 to 0.6. More preferred.
- the dynamic friction coefficient of the surface of the photosensitive layer exposed when the temporary support is peeled from the photosensitive layer is preferably less than 1.5, more preferably 1.0 or less. It is preferably 0.5 or less, and more preferably 0.5 or less. When the coefficient of dynamic friction of the first surface of the photosensitive layer is less than 1.5, the slipperiness of the surface of the photosensitive layer is improved.
- the dynamic friction coefficient of the first surface of the photosensitive layer is preferably 0.05 or more, more preferably 0.1 or more, and further preferably 0.2 or more.
- the dynamic friction coefficient of the first surface of the photosensitive layer is preferably 0.05 or more and less than 1.5, more preferably 0.1 to 1.0, and preferably 0.2 to 0.5. More preferred.
- the static friction coefficient and the dynamic friction coefficient of the first surface of the photosensitive layer are measured by the following methods.
- the transfer material is laminated on a polyethylene terephthalate (PET) substrate with a copper layer under laminating conditions of a linear pressure of 0.6 MPa and a linear velocity (laminating speed) of 0.5 m / min.
- PET polyethylene terephthalate
- laminating speed 0.5 m / min.
- the temporary support is peeled off, and the exposed photosensitive layer is brought into contact with a transparent soda glass (200 x 200 mm ⁇ ) having a thickness of 5 mm.
- Plastic-film and sheet friction coefficient using Tencilon universal material tester (RTF1210, manufactured by A & D Co., Ltd.) and plastic friction coefficient jig (J-PZ2-50N, manufactured by A & D Co., Ltd.) The coefficient of static friction and the coefficient of dynamic friction are measured by a test method (JIS K7125: 1999). The test conditions are shown below. Load: 200g Contact area: 63 mm x 63 mm Test speed: 100 mm / min
- the photosensitive layer may be a negative type photosensitive layer or a positive type photosensitive layer.
- the photosensitive layer is preferably a negative photosensitive layer.
- the formed pattern corresponds to a cured layer.
- the photosensitive layer is a negative photosensitive layer, the negative photosensitive layer preferably contains a resin, a polymerizable compound and a polymerization initiator.
- an alkali-soluble resin is contained as a part or all of the resin. That is, in one embodiment, the photosensitive layer preferably contains a resin containing an alkali-soluble resin, a polymerizable compound, and a polymerization initiator.
- the photosensitive layer is 10% by mass to 90% by mass of an alkali-soluble resin, 5% by mass to 70% by mass of an ethylenically unsaturated compound, and 0.01% by mass to 20% by mass of photopolymerization with respect to the total mass of the photosensitive layer. It is preferable to include an initiator.
- the photosensitive layer preferably contains a polymer compound.
- the "polymer compound” means a compound having a weight average molecular weight of 5,000 or more.
- the weight average molecular weight of the polymer compound is preferably 10,000 or more.
- the weight average molecular weight of the polymer compound is preferably 5,000 to 500,000, preferably 10,000 to 500,000.
- the hardness of the photosensitive layer increases.
- the strength of the photosensitive layer increases.
- the slipperiness of the surface of the photosensitive layer is improved.
- the glass transition temperature of the polymer compound is preferably 30 ° C. or higher, more preferably 40 ° C. or higher, further preferably 50 ° C. or higher, particularly preferably 60 ° C. or higher, and particularly preferably 70 ° C. The above is the most preferable.
- the glass transition temperature of the polymer compound increases, the hardness of the photosensitive layer increases. As the hardness of the photosensitive layer increases, the slipperiness of the surface of the photosensitive layer improves.
- the glass transition temperature of the polymer compound is preferably 135 ° C. or lower.
- Examples of the polymer compound include an alkali-soluble resin described later.
- the photosensitive layer preferably contains an alkali-soluble resin.
- the alkali-soluble resin include known alkali-soluble resins used in etching resists.
- the alkali-soluble resin is preferably a binder polymer.
- the alkali-soluble resin is preferably an alkali-soluble resin having an acid group.
- polymer A which will be described later, is preferable.
- the photosensitive layer preferably contains the polymer A as the alkali-soluble resin.
- the acid value of the polymer A is preferably 220 mgKOH / g or less, and more preferably less than 200 mgKOH / g, from the viewpoint that the resolution is more excellent by suppressing the swelling of the photosensitive layer due to the developing solution. , 190 mgKOH / g or less, more preferably.
- the lower limit of the acid value of the polymer A is not particularly limited.
- the acid value of the polymer A is preferably 60 mgKOH / g or more, more preferably 120 mgKOH / g or more, further preferably 150 mgKOH / g or more, and 170 mgKOH / g or more. It is particularly preferable that it is g or more.
- the acid value is the mass [mg] of potassium hydroxide required to neutralize 1 g of the sample, and in the present disclosure, the unit is described as mgKOH / g.
- the acid value can be calculated, for example, from the average content of acid groups in the compound.
- the acid value of the polymer A may be adjusted according to the type of the structural unit constituting the polymer A and the content of the structural unit containing an acid group.
- the weight average molecular weight of the polymer A is preferably 5,000 to 500,000. It is preferable that the weight average molecular weight is 500,000 or less from the viewpoint of improving the resolvability and the developability.
- the weight average molecular weight of the polymer A is more preferably 100,000 or less, further preferably 60,000 or less, and particularly preferably 50,000 or less.
- the weight average molecular weight of the polymer A is more preferably 10,000 or more, further preferably 20,000 or more, and particularly preferably 30,000 or more.
- the edge fuse property refers to the degree of ease with which the photosensitive layer protrudes from the end face of the roll when the transfer material is wound into a roll.
- the cut chip property refers to the degree of ease of chip flying when the unexposed film is cut with a cutter. If this chip adheres to the upper surface of the photosensitive layer or the like, it is transferred to the mask in a later exposure step or the like, which causes a defective product.
- the dispersity of the polymer A is preferably 1.0 to 6.0, more preferably 1.0 to 5.0, and even more preferably 1.0 to 4.0. It is particularly preferably 0.0 to 3.0.
- the weight average molecular weight (Mw) and the number average molecular weight (Mn) are values measured by gel permeation chromatography.
- the degree of dispersion is the ratio of the weight average molecular weight to the number average molecular weight (weight average molecular weight / number average molecular weight).
- the polymer A preferably has an aromatic hydrocarbon group, and has a structural unit having an aromatic hydrocarbon group. Is more preferable.
- the aromatic hydrocarbon group include a substituted or unsubstituted phenyl group and a substituted or unsubstituted aralkyl group.
- the content ratio of the structural unit having an aromatic hydrocarbon group in the polymer A is preferably 20% by mass or more, more preferably 30% by mass or more, more preferably 40% by mass, based on the total mass of the polymer A. It is more preferably mass% or more, particularly preferably 45% by mass or more, and most preferably 50% by mass or more.
- the upper limit is not particularly limited, but is preferably 95% by mass or less, and more preferably 85% by mass or less.
- the content ratio of the structural unit having an aromatic hydrocarbon group is determined as a weight average value.
- Examples of the monomer forming a structural unit having an aromatic hydrocarbon group include a monomer having an aralkyl group, styrene, and a polymerizable styrene derivative (for example, methylstyrene, vinyltoluene, tert-butoxystyrene, acetoxy). Styrene, 4-vinyl benzoic acid, styrene dimer, styrene trimer, etc.) can be mentioned. Of these, a monomer having an aralkyl group or styrene is preferable.
- the content ratio of the structural unit derived from styrene is 20 based on the total mass of the polymer A. It is preferably mass% to 50% by mass, more preferably 25% by mass to 45% by mass, further preferably 30% by mass to 40% by mass, and 30% by mass to 35% by mass. Is particularly preferable.
- aralkyl group examples include a substituted or unsubstituted phenylalkyl group, and a substituted or unsubstituted benzyl group is preferable.
- Examples of the monomer having a phenylalkyl group other than the substituted or unsubstituted benzyl group include phenylethyl (meth) acrylate and the like.
- a (meth) acrylate having a substituted or unsubstituted benzyl group for example, benzyl (meth) acrylate, chlorobenzyl (meth) acrylate, etc.
- vinyl monomers eg, vinylbenzyl chloride, vinylbenzyl alcohol, etc.
- benzyl (meth) acrylate is preferable.
- the content ratio of the structural unit derived from the benzyl (meth) acrylate is the polymer A. It is preferably 50% by mass to 95% by mass, more preferably 60% by mass to 90% by mass, further preferably 70% by mass to 90% by mass, and 75% by mass based on the total mass of the above. It is particularly preferably% to 90% by mass.
- the polymer A having a structural unit having an aromatic hydrocarbon group is a monomer having an aromatic hydrocarbon group, at least one of the first monomer described later, and / or a second single amount described later. It is preferably obtained by polymerizing with at least one of the bodies.
- the polymer A having no structural unit having an aromatic hydrocarbon group is preferably obtained by polymerizing at least one of the first monomers described later, and at least one of the first monomers. It is more preferable to obtain it by copolymerizing with at least one of the second monomer described later.
- the first monomer is a monomer having a carboxy group in the molecule.
- the first monomer include (meth) acrylic acid, fumaric acid, cinnamic acid, crotonic acid, itaconic acid, 4-vinylbenzoic acid, maleic acid anhydride, maleic acid semi-ester and the like.
- (meth) acrylic acid is preferable.
- the content ratio of the structural unit derived from the first monomer in the polymer A is preferably 5% by mass to 50% by mass, preferably 10% by mass to 40% by mass, based on the total mass of the polymer A. It is more preferably 15% by mass to 30% by mass.
- the content ratio of the structural unit derived from the first monomer is preferably 10% by mass to 50% by mass based on the total mass of the polymer A. It is preferable to set the above ratio to 10% by mass or more from the viewpoint of exhibiting good developability, controlling edge fuseability, and the like, more preferably 15% by mass or more, and further preferably 20% by mass or more. It is preferable that the content ratio is 50% by mass or less from the viewpoint of high resolution and the shape of the resist pattern, and further from the viewpoint of chemical resistance of the resist pattern, and from these viewpoints, it is 35% by mass or less. Is more preferable, 30% by mass or less is further preferable, and 27% by mass or less is particularly preferable.
- the second monomer is a monomer that is non-acidic and has at least one ethylenically unsaturated group in the molecule.
- Examples of the second monomer include methyl (meth) acrylate, ethyl (meth) acrylate, n-propyl (meth) acrylate, isopropyl (meth) acrylate, n-butyl (meth) acrylate, and isobutyl (meth) acrylate.
- methyl (meth) acrylate, 2-ethylhexyl (meth) acrylate, and n-butyl (meth) acrylate are preferable, and methyl (meth) acrylate is particularly preferable.
- the content ratio of the structural unit derived from the second monomer in the polymer A is preferably 5% by mass to 60% by mass, preferably 15% by mass to 50% by mass, based on the total mass of the polymer A. It is more preferably 20% by mass to 45% by mass.
- the polymer A contains at least one structural unit selected from the group consisting of a structural unit having an aralkyl group and a structural unit derived from styrene, when the focal position at the time of exposure is deviated. It is preferable from the viewpoint of suppressing the line width thickening and the deterioration of the resolution.
- a copolymer containing methacrylic acid, benzyl methacrylate and styrene a copolymer containing methacrylic acid, methyl methacrylate, benzyl methacrylate and styrene and the like are preferable.
- the polymer A contains 25% by mass to 40% by mass of a structural unit having an aromatic hydrocarbon group, 20% by mass to 35% by mass of a structural unit derived from the first monomer, and a second. It is preferable that the polymer contains 30% by mass to 45% by mass of the structural unit derived from the monomer of. In another embodiment, the polymer contains 70% by mass to 90% by mass of a structural unit having an aromatic hydrocarbon group and 10% by mass to 25% by mass of a structural unit derived from the first monomer. Is preferable.
- the polymer A may have a branched structure and / or an alicyclic structure in the side chain.
- a monomer having a group having a branched structure in the side chain or a monomer having a group having an alicyclic structure in the side chain a branched structure or an alicyclic structure can be introduced into the side chain of the polymer A. ..
- the alicyclic structure may be a monocyclic structure or a polycyclic structure.
- the monomer containing a group having a branched structure in the side chain include (meth) acrylate iso-propyl, (meth) acrylate iso-butyl, (meth) acrylate sec-butyl, and (meth) acrylate tert.
- -Butyl (meth) acrylate iso-amyl, (meth) acrylate-amyl, (meth) acrylate isoamyl, (meth) acrylate 2-octyl, (meth) acrylate 3-octyl, and (meth) Examples thereof include tert-octyl acrylate.
- iso-propyl (meth) acrylate, iso-butyl (meth) acrylate, or tert-butyl methacrylate are preferable, and iso-propyl methacrylate or tert-butyl methacrylate are more preferable.
- the monomer having a group having an alicyclic structure in the side chain examples include a monomer having a monocyclic aliphatic hydrocarbon group and a monomer having a polycyclic aliphatic hydrocarbon group.
- a (meth) acrylate having an alicyclic hydrocarbon group having 5 to 20 carbon atoms (carbon atoms) can be mentioned. More specific examples include (meth) acrylic acid (bicyclo [2.2.1] heptyl-2), (meth) acrylic acid-1-adamantyl, (meth) acrylic acid-2-adamantyl, (meth).
- (meth) acrylic acid esters (meth) acrylic acid cyclohexyl, (meth) acrylic acid (nor) boronyl, (meth) acrylic acid isobornyl, (meth) acrylic acid-1-adamantyl, (meth) acrylic acid- 2-adamantyl, fentyl (meth) acrylate, -1-mentyl (meth) acrylate or tricyclodecane (meth) acrylate are preferred, cyclohexyl (meth) acrylate, (nor) bornyl, (meth) acrylate, ( Isobornyl acrylate, -2-adamantyl (meth) acrylate or tricyclodecane (meth) acrylate are more preferred.
- the photosensitive layer may contain the polymer A alone or in combination of two or more.
- two kinds of the polymer A having an aromatic hydrocarbon group may be mixed and used, or the polymer A having an aromatic hydrocarbon group and the polymer A having no aromatic hydrocarbon group may not be used. It is preferable to use the polymer A in combination.
- the content ratio of the polymer A having an aromatic hydrocarbon group is preferably 50% by mass or more, more preferably 70% by mass or more, based on the total mass of the polymer A. It is more preferably 80% by mass or more, and particularly preferably 90% by mass or more.
- a radical polymerization initiator such as benzoyl peroxide and azoisobutyronitrile is added to a solution obtained by diluting the one or more monomers described above with a solvent such as acetone, methyl ethyl ketone and isopropanol. Is preferably added in an appropriate amount and heated and stirred. In some cases, the synthesis is carried out while dropping a part of the mixture into the reaction solution. After completion of the reaction, a solvent may be further added to adjust the concentration to a desired level.
- a solvent may be further added to adjust the concentration to a desired level.
- the synthesis means bulk polymerization, suspension polymerization, or emulsion polymerization may be used in addition to solution polymerization.
- the glass transition temperature Tg of the polymer A is preferably 30 ° C. or higher and 135 ° C. or lower.
- the Tg of the polymer A is more preferably 130 ° C. or lower, further preferably 120 ° C. or lower, and particularly preferably 110 ° C. or lower.
- the polymer A having a Tg of 30 ° C. or higher from the viewpoint of improving the edge fuse resistance.
- the Tg of the polymer A is more preferably 40 ° C. or higher, further preferably 50 ° C. or higher, particularly preferably 60 ° C. or higher, and most preferably 70 ° C. or higher. ..
- the alkali-soluble resin may be used alone or in combination of two or more.
- the ratio of the alkali-soluble resin to the total mass of the photosensitive layer is preferably 10% by mass to 90% by mass, more preferably 30% by mass to 70% by mass, and further preferably 40% by mass to 60% by mass. be. It is preferable that the ratio of the alkali-soluble resin to the photosensitive layer is 90% by mass or less from the viewpoint of controlling the developing time. On the other hand, it is preferable to make the ratio of the alkali-soluble resin to the photosensitive layer 10% by mass or more from the viewpoint of improving the edge fuse resistance.
- the photosensitive layer may contain a resin other than the alkali-soluble resin.
- the resin other than the alkali-soluble resin may be a resin having a solubility of less than 0.1 g in 100 g of a 1 mass% aqueous solution of sodium carbonate having a liquid temperature of 22 ° C., for example, an acrylic resin or a styrene-acrylic co-weight.
- polyurethane resin polyvinyl alcohol, polyvinyl formal, polyamide resin, polyester resin, polyamide resin, epoxy resin, polyacetal resin, polyhydroxystyrene resin, polyimide resin, poly Examples thereof include benzoxazole resin, polysiloxane resin, polyethyleneimine, polyallylamine, and polyalkylene glycol.
- the photosensitive layer When the photosensitive layer is a negative photosensitive layer, the negative photosensitive layer preferably contains a polymerizable compound having a polymerizable group.
- the "polymerizable compound” means a compound that polymerizes under the action of a polymerization initiator described later, and is different from the above-mentioned alkali-soluble resin.
- the molecular weight of the polymerizable compound is preferably 1,500 or less.
- the molecular weight of the polymerizable compound is preferably 150 or more.
- the type of polymerizable group is not limited as long as it is a group involved in the polymerization reaction.
- the polymerizable group include a group having an ethylenically unsaturated group such as a vinyl group, an acryloyl group, a methacryloyl group, a styryl group and a maleimide group.
- examples of the polymerizable group include groups having a cationically polymerizable group such as an epoxy group and an oxetane group.
- a group having an ethylenically unsaturated group is preferable, and an acryloyl group or a methacryloyl group is more preferable.
- the polymerizable compound preferably contains a polymerizable compound having two or more polymerizable groups.
- the polymerizable compound more preferably contains a polymerizable compound having two or more polymerizable groups and a polymerizable compound having three or more polymerizable groups.
- a compound having one or more ethylenically unsaturated groups that is, an ethylenically unsaturated compound
- two or more in one molecule because the negative photosensitive layer is more excellent in photosensitivity.
- a compound having an ethylenically unsaturated group that is, a polyfunctional ethylenically unsaturated compound
- the number of ethylenically unsaturated groups contained in one molecule of the ethylenically unsaturated compound is preferably 6 or less, more preferably 3 or less, and 2 or less in terms of excellent resolution and peelability. More preferred.
- the photosensitive layer is a compound having two or three ethylenically unsaturated groups in one molecule (ie, bifunctional or bifunctional or) in that the negative photosensitive layer has a better balance between photosensitivity, resolution and peelability. It is preferable to contain a trifunctional ethylenically unsaturated compound), and more preferably to contain a compound having two ethylenically unsaturated groups in one molecule (that is, a bifunctional ethylenically unsaturated compound).
- the content of the bifunctional ethylenically unsaturated compound with respect to the total mass of the polymerizable compound is preferably 20% by mass or more, more preferably more than 40% by mass, from the viewpoint of excellent peelability with respect to the total mass of the negative photosensitive layer. It is preferably 55% by mass or more, more preferably 55% by mass or more.
- the upper limit is not particularly limited and may be 100% by mass. That is, all the polymerizable compounds may be bifunctional ethylenically unsaturated compounds. Further, as the ethylenically unsaturated compound, a (meth) acrylate compound having a (meth) acryloyl group as a polymerizable group is preferable.
- the photosensitive layer preferably contains an aromatic ring and an ethylenically unsaturated compound B1 having two ethylenically unsaturated groups.
- the ethylenically unsaturated compound B1 is a bifunctional ethylenically unsaturated compound having one or more aromatic rings in one molecule among the above-mentioned ethylenically unsaturated compounds.
- the mass ratio of the content of the ethylenically unsaturated compound B1 to the content of the ethylenically unsaturated compound in the photosensitive layer is preferably 40% by mass or more, preferably 50% by mass or more, from the viewpoint of better resolution. It is more preferably 55% by mass or more, and particularly preferably 60% by mass or more.
- the upper limit is not particularly limited, but from the viewpoint of peelability, 99% by mass or less is preferable, 95% by mass or less is more preferable, 90% by mass or less is further preferable, and 85% by mass or less is particularly preferable.
- Examples of the aromatic ring contained in the ethylenically unsaturated compound B1 include an aromatic hydrocarbon ring such as a benzene ring, a naphthalene ring and an anthracene ring, a thiophene ring, a furan ring, a pyrrole ring, an imidazole ring, a triazole ring and a pyridine ring.
- Aromatic heterocycles and fused rings thereof are mentioned, and aromatic hydrocarbon rings are preferable, and benzene rings are more preferable.
- the aromatic ring may have a substituent.
- the ethylenically unsaturated compound B1 may have only one aromatic ring or may have two or more aromatic rings.
- the ethylenically unsaturated compound B1 preferably has a bisphenol structure from the viewpoint of improving the resolution by suppressing the swelling of the photosensitive layer due to the developing solution.
- the bisphenol structure include a bisphenol A structure derived from bisphenol A (2,2-bis (4-hydroxyphenyl) propane) and a bisphenol derived from bisphenol F (2,2-bis (4-hydroxyphenyl) methane).
- examples thereof include an F structure and a bisphenol B structure derived from bisphenol B (2,2-bis (4-hydroxyphenyl) butane), and a bisphenol A structure is preferable.
- Examples of the ethylenically unsaturated compound B1 having a bisphenol structure include a compound having a bisphenol structure and two polymerizable groups (preferably (meth) acryloyl groups) bonded to both ends of the bisphenol structure. Both ends of the bisphenol structure and the two polymerizable groups may be directly bonded or may be bonded via one or more alkyleneoxy groups. As the alkyleneoxy group added to both ends of the bisphenol structure, an ethyleneoxy group or a propyleneoxy group is preferable, and an ethyleneoxy group is more preferable.
- the number of alkyleneoxy groups added to the bisphenol structure is not particularly limited, but is preferably 4 to 16 per molecule, more preferably 6 to 14.
- the ethylenically unsaturated compound B1 having a bisphenol structure is described in paragraphs 0072 to 0080 of JP-A-2016-224162, and the contents described in this publication are incorporated in the present specification.
- ethylenically unsaturated compound B1 a bifunctional ethylenically unsaturated compound having a bisphenol A structure is preferable, and 2,2-bis (4-((meth) acryloxypolyalkoxy) phenyl) propane is more preferable.
- 2,2-bis (4-((meth) acryloxypolyalkoxy) phenyl) propane for example, 2,2-bis (4- (methacryloxydiethoxy) phenyl) propane (FA-324M, Hitachi Chemical Co., Ltd.) Made by the company), 2,2-bis (4- (methacryloxyethoxypropoxy) phenyl) propane, 2,2-bis (4- (methacryloxypentethoxy) phenyl) propane (BPE-500, Shin-Nakamura Chemical Industry Co., Ltd.) , 2,2-Bis (4- (methacryloxidedecaethoxytetrapropoxy) phenyl) propane (FA-3200MY, manufactured by Hitachi Chemical Co., Ltd.), 2,2-bis (4- (methacryloxypentadecaethoxy) phenyl) ) Propane (BPE-1300, manufactured by Shin-Nakamura Chemical Industry Co., Ltd.), 2,2-bis (4- (methacryloxydiethoxy) phenyl) propane (
- the ethylenically unsaturated compound B1 preferably contains a compound represented by the following formula (Bis) from the viewpoint of the change in the line width of the leaving time, the change in the line width of the developing temperature, and the sensitivity.
- R 1 and R 2 independently represent a hydrogen atom or a methyl group
- A is C 2 H 4
- B is C 3 H 6
- n 1 and n 3 are independent, respectively.
- n 1 + n 3 is an integer of 1 to 39
- n 1 + n 3 is an integer of 2 to 40
- n 2 and n 4 are independently integers of 0 to 29, and n 2 + n 4 is an integer of 0 to 40.
- n 1 + n 2 + n 3 + n 4 is preferably an integer of 2 to 20, more preferably an integer of 2 to 16, and even more preferably an integer of 4 to 12. Further, n 2 + n 4 is preferably an integer of 0 to 10, more preferably an integer of 0 to 4, further preferably an integer of 0 to 2, and particularly preferably 0.
- the ethylenically unsaturated compound B1 may be used alone or in combination of two or more.
- the content of the ethylenically unsaturated compound B1 in the photosensitive layer is preferably 10% by mass or more, more preferably 20% by mass or more, based on the total mass of the photosensitive layer, from the viewpoint of better resolution.
- the upper limit is not particularly limited, but is preferably 70% by mass or less, more preferably 60% by mass or less, from the viewpoint of transferability and edge fusion (a phenomenon in which the components in the photosensitive layer exude from the edge of the transfer material).
- the photosensitive layer may contain an ethylenically unsaturated compound other than the above-mentioned ethylenically unsaturated compound B1.
- the ethylenically unsaturated compound other than the ethylenically unsaturated compound B1 is not particularly limited and can be appropriately selected from known compounds.
- a compound having one ethylenically unsaturated group in one molecule (monofunctional ethylenically unsaturated compound), a bifunctional ethylenically unsaturated compound having no aromatic ring, and a trifunctional or higher ethylenically unsaturated compound. Examples include compounds.
- Examples of the monofunctional ethylenically unsaturated compound include ethyl (meth) acrylate, ethylhexyl (meth) acrylate, 2- (meth) acryloyloxyethyl succinate, polyethylene glycol mono (meth) acrylate, and polypropylene glycol mono (meth) acrylate. , And phenoxyethyl (meth) acrylate.
- bifunctional ethylenically unsaturated compound having no aromatic ring examples include alkylene glycol di (meth) acrylate, polyalkylene glycol di (meth) acrylate, urethane di (meth) acrylate, and trimethylolpropane diacrylate. Be done.
- alkylene glycol di (meth) acrylate examples include tricyclodecanedimethanol diacrylate (A-DCP, manufactured by Shin-Nakamura Chemical Industry Co., Ltd.) and tricyclodecanedimethanol dimethacrylate (DCP, manufactured by Shin-Nakamura Chemical Industry Co., Ltd.).
- 1,9-Nonandiol diacrylate (A-NOD-N, manufactured by Shin-Nakamura Chemical Industry Co., Ltd.), 1,6-hexanediol diacrylate (A-HD-N, manufactured by Shin-Nakamura Chemical Industry Co., Ltd.), Examples thereof include ethylene glycol dimethacrylate, 1,10-decanediol diacrylate, and neopentyl glycol di (meth) acrylate.
- polyalkylene glycol di (meth) acrylate examples include polyethylene glycol di (meth) acrylate, dipropylene glycol diacrylate, tripropylene glycol diacrylate, and polypropylene glycol di (meth) acrylate.
- urethane di (meth) acrylate examples include propylene oxide-modified urethane di (meth) acrylate, and ethylene oxide and propylene oxide-modified urethane di (meth) acrylate.
- Commercially available urethane di (meth) acrylates include, for example, 8UX-015A (manufactured by Taisei Fine Chemical Co., Ltd.), UA-32P (manufactured by Shin-Nakamura Chemical Industry Co., Ltd.), and UA-1100H (manufactured by Shin-Nakamura Chemical Industry Co., Ltd.). ).
- Examples of the trifunctional or higher functional ethylenically unsaturated compound include dipentaerythritol (tri / tetra / penta / hexa) (meth) acrylate, pentaerythritol (tri / tetra) (meth) acrylate, and trimethylolpropane tri (meth).
- Examples thereof include acrylates, trimethylolpropane tetra (meth) acrylates, trimethylolethanetri (meth) acrylates, isocyanuric acid tri (meth) acrylates, glycerintri (meth) acrylates, and alkylene oxide-modified products thereof.
- (tri / tetra / penta / hexa) (meth) acrylate) is a concept including tri (meth) acrylate, tetra (meth) acrylate, penta (meth) acrylate, and hexa (meth) acrylate.
- (Tri / tetra) (meth) acrylate” is a concept that includes tri (meth) acrylate and tetra (meth) acrylate.
- the photosensitive layer preferably contains the above-mentioned ethylenically unsaturated compound B1 and a trifunctional or higher ethylenically unsaturated compound, and the above-mentioned ethylenically unsaturated compound B1 and two or more trifunctional or higher ethylenes. It is more preferable to contain a sex unsaturated compound.
- the mass ratio of the ethylenically unsaturated compound B1 to the trifunctional or higher ethylenically unsaturated compound is (total mass of the ethylenically unsaturated compound B1): (total mass of the trifunctional or higher ethylenically unsaturated compound).
- the photosensitive layer preferably contains the above-mentioned ethylenically unsaturated compound B1 and two or more trifunctional ethylenically unsaturated compounds.
- alkylene oxide-modified product of the trifunctional or higher ethylenically unsaturated compound examples include caprolactone-modified (meth) acrylate compound (KAYARAD (registered trademark) DPCA-20 manufactured by Nippon Kayaku Co., Ltd. and A-9300 manufactured by Shin-Nakamura Chemical Industry Co., Ltd.). -1CL, etc.), alkylene oxide-modified (meth) acrylate compound (KAYARAD RP-1040 manufactured by Nippon Kayaku Co., Ltd., ATM-35E and A-9300 manufactured by Shin-Nakamura Chemical Industry Co., Ltd., EBECRYL manufactured by Daicel Ornex Co., Ltd.
- caprolactone-modified (meth) acrylate compound (KAYARAD (registered trademark) DPCA-20 manufactured by Nippon Kayaku Co., Ltd. and A-9300 manufactured by Shin-Nakamura Chemical Industry Co., Ltd.).
- -1CL, etc. alkylene oxide-modified (meth
- A-GLY-9E ethoxylated glycerin triacrylate
- A-GLY-9E ethoxylated glycerin triacrylate
- Aronix registered trademark
- TO-2349 manufactured by Shin-Nakamura Chemical Industry Co., Ltd.
- Aronix M-520 manufactured by Toa Synthetic Co., Ltd.
- Aronix M-510 manufactured by Toa Synthetic Co., Ltd.
- the ethylenically unsaturated compound other than the ethylenically unsaturated compound B1 the ethylenically unsaturated compound having an acid group described in paragraphs 0025 to 0030 of JP-A-2004-239942 may be used.
- the ratio of the content Mm of the ethylenically unsaturated compound to the content Mb of the alkali-soluble resin in the photosensitive layer is 1.0 or less from the viewpoint of resolution and linearity. It is more preferably 0.9 or less, and particularly preferably 0.5 or more and 0.9 or less.
- the ethylenically unsaturated compound in the photosensitive layer preferably contains a (meth) acrylic compound, and more preferably contains a (meth) acrylate compound, from the viewpoint of curability and resolvability.
- the ethylenically unsaturated compound in the photosensitive layer contains a (meth) acrylic compound from the viewpoint of curability, resolution and linearity, and acrylic with respect to the total mass of the (meth) acrylic compound contained in the photosensitive layer. It is more preferable that the content of the compound is 60% by mass or less.
- the molecular weight (weight average molecular weight (Mw) when having a distribution) of the ethylenically unsaturated compound containing the ethylenically unsaturated compound B1 is preferably 200 to 3,000, more preferably 280 to 2,200, and 300. -2,200 is more preferable.
- the polymerizable compound is preferably at least one selected from the group consisting of an ethoxylated acrylate compound and an ethoxylated methacrylate compound, and more preferably an ethoxylated methacrylate compound.
- the ethoxylated methacrylate compound include 2,2-bis (4- (methacryloxydiethoxy) phenyl) propane (FA-324M, manufactured by Hitachi Chemical Co., Ltd.) and 2,2-bis (4- (methacryloxyethoxy)).
- BPE-500 manufactured by Shin-Nakamura Chemical Industry Co., Ltd.
- the polymerizable compound may be used alone or in combination of two or more.
- the content of the polymerizable compound in the photosensitive layer is preferably 10% by mass to 70% by mass, more preferably 20% by mass to 60% by mass, still more preferably 20% by mass to 50% by mass, based on the total mass of the photosensitive layer. ..
- the ratio of the mass of the polymerizable compound contained in the photosensitive layer to the mass of the polymer compound contained in the photosensitive layer is preferably 50% or less, more preferably 40% or less, and more preferably 35% or less. Is more preferable.
- the ratio of the mass of the polymerizable compound to the mass of the polymer compound becomes small, the hardness of the photosensitive layer increases.
- the hardness of the photosensitive layer increases, for example, the strength of the photosensitive layer increases.
- the slipperiness of the surface of the photosensitive layer is improved.
- the ratio of the mass of the polymerizable compound contained in the photosensitive layer to the mass of the polymer compound contained in the photosensitive layer is preferably 10% or more, more preferably 20% or more, and more preferably 25% or more. Is more preferable. When the ratio of the mass of the polymerizable compound to the mass of the polymer compound is large, the dissolution rate in the developer is improved and the linearity of the wiring pattern is improved.
- the negative photosensitive layer preferably contains a polymerization initiator.
- the polymerization initiator is selected according to the type of the polymerization reaction, and examples thereof include a thermal polymerization initiator and a photopolymerization initiator. Further, examples of the polymerization initiator include a radical polymerization initiator and a cationic polymerization initiator.
- the negative photosensitive layer preferably contains a photopolymerization initiator.
- the photopolymerization initiator is a compound that initiates the polymerization of a polymerizable compound by receiving active rays such as ultraviolet rays, visible rays and X-rays.
- the photopolymerization initiator is not particularly limited, and a known photopolymerization initiator can be used. Examples of the photopolymerization initiator include a photoradical polymerization initiator and a photocationic polymerization initiator, and a photoradical polymerization initiator is preferable.
- Examples of the photoradical polymerization initiator include a photopolymerization initiator having an oxime ester structure, a photopolymerization initiator having an ⁇ -aminoalkylphenone structure, a photopolymerization initiator having an ⁇ -hydroxyalkylphenone structure, and an acylphosphine oxide. Examples thereof include a photopolymerization initiator having a structure and a photopolymerization initiator having an N-phenylglycine structure.
- the negative photosensitive layer is a 2,4,5-triarylimidazole dimer and a derivative thereof as a photoradical polymerization initiator from the viewpoints of photosensitive, visibility and resolution of exposed and unexposed areas. It is preferable to include at least one selected from the group consisting of.
- the two 2,4,5-triarylimidazole structures in the 2,4,5-triarylimidazole dimer and its derivatives may be the same or different.
- Derivatives of the 2,4,5-triarylimidazole dimer include, for example, 2- (o-chlorophenyl) -4,5-diphenylimidazole dimer, 2- (o-chlorophenyl) -4,5-di.
- the photoradical polymerization initiator for example, the polymerization initiator described in paragraphs 0031 to 0042 of JP-A-2011-95716 and paragraphs 0064-0081 of JP-A-2015-14783 may be used.
- photoradical polymerization initiator examples include ethyl dimethylaminobenzoate (DBE, CAS No. 10287-53-3), benzoin methyl ether, anisyl (p, p'-dimethoxybenzyl), and TAZ-110 (trade name:).
- photoradical polymerization initiators examples include 1- [4- (phenylthio) phenyl] -1,2-octanedione-2- (O-benzoyloxime) (trade name: IRGACURE (registered trademark) OXE-.
- the photocationic polymerization initiator is a compound that generates an acid by receiving active light rays.
- a compound that is sensitive to active light having a wavelength of 300 nm or more, preferably a wavelength of 300 to 450 nm and generates an acid is preferable, but its chemical structure is not limited.
- a photocationic polymerization initiator that is not directly sensitive to active light with a wavelength of 300 nm or more is also a sensitizer if it is a compound that is sensitive to active light with a wavelength of 300 nm or more and generates an acid when used in combination with a sensitizer. Can be preferably used in combination with.
- a photocationic polymerization initiator that generates an acid having a pKa of 4 or less is preferable, a photocationic polymerization initiator that generates an acid having a pKa of 3 or less is more preferable, and an acid having a pKa of 2 or less is used.
- the generated photocationic polymerization initiator is particularly preferred.
- the lower limit of pKa is not particularly defined, but is preferably -10.0 or higher, for example.
- Examples of the photocationic polymerization initiator include an ionic photocationic polymerization initiator and a nonionic photocationic polymerization initiator.
- Examples of the ionic photocationic polymerization initiator include onium salt compounds such as diaryliodonium salts and triarylsulfonium salts, and quaternary ammonium salts.
- the ionic photocationic polymerization initiator described in paragraphs 0114 to 0133 of JP-A-2014-85643 may be used.
- nonionic photocationic polymerization initiator examples include trichloromethyl-s-triazines, diazomethane compounds, imide sulfonate compounds, and oxime sulfonate compounds.
- trichloromethyl-s-triazines the diazomethane compound and the imide sulfonate compound
- the compounds described in paragraphs 0083 to 0088 of JP-A-2011-22149 may be used.
- the oxime sulfonate compound the compound described in paragraphs 0084 to 0088 of International Publication No. 2018/179640 may be used.
- the photosensitive layer may contain one type of photopolymerization initiator alone or two or more types.
- the content of the photopolymerization initiator in the photosensitive layer is not particularly limited, but is preferably 0.1% by mass or more, more preferably 0.5% by mass or more, and more preferably 1.0% by mass or more, based on the total mass of the photosensitive layer. Is more preferable.
- the upper limit is not particularly limited, but is preferably 10% by mass or less, more preferably 5% by mass or less, based on the total mass of the photosensitive layer.
- the photosensitive layer preferably contains a dye from the viewpoints of visibility of exposed and unexposed areas, pattern visibility after development, and resolution, and has a maximum absorption wavelength in the wavelength range of 400 nm to 780 nm at the time of color development. It is more preferable to contain a dye having a wavelength of 450 nm or more and whose maximum absorption wavelength is changed by an acid, a base, or a radical (also referred to simply as “dye N”). When the dye N is contained, the detailed mechanism is unknown, but the adhesion to the adjacent layer (for example, a temporary support and the intermediate layer) is improved, and the resolution is more excellent.
- the maximum absorption wavelength is changed by an acid, a base or a radical means that the dye in a color-developing state is decolorized by an acid, a base or a radical, and the dye in a decolorized state is an acid or a base.
- it may mean any aspect of a mode in which color is developed by a radical and a mode in which a dye in a color-developing state changes to a color-developing state of another hue.
- the dye N may be a compound that changes its color from the decolorized state by exposure and may be a compound that changes its color from the decolorized state by exposure.
- it may be a dye whose color development or decolorization state is changed by the acid, base or radical generated and acted on in the photosensitive layer by exposure, and the state in the photosensitive layer (for example, pH) by the acid, base or radical. It may be a dye whose color development or decolorization state changes by changing. Further, it may be a dye that changes its color development or decolorization state by directly receiving an acid, a base or a radical as a stimulus without going through exposure.
- the dye N is preferably a dye whose maximum absorption wavelength is changed by an acid or a radical, and more preferably a dye whose maximum absorption wavelength is changed by a radical.
- the photosensitive layer preferably contains both a dye whose maximum absorption wavelength is changed by radicals as dye N and a photoradical polymerization initiator.
- the dye N is preferably a dye that develops color by an acid, a base, or a radical.
- a photoradical polymerization initiator, a photocationic polymerization initiator (photoacid generator) or a photobase generator is added to the photosensitive layer, and a photoradical polymerization initiator is added after exposure.
- a radical-reactive dye, an acid-reactive dye or a base-reactive dye for example, a leuco dye
- a radical-reactive dye, an acid-reactive dye or a base-reactive dye for example, a leuco dye
- the dye N preferably has a maximum absorption wavelength of 550 nm or more in the wavelength range of 400 nm to 780 nm at the time of color development, more preferably 550 nm to 700 nm. It is more preferably ⁇ 650 nm. Further, the dye N may have only one maximum absorption wavelength in the wavelength range of 400 nm to 780 nm at the time of color development, or may have two or more. When the dye N has two or more maximum absorption wavelengths in the wavelength range of 400 nm to 780 nm at the time of color development, the maximum absorption wavelength having the highest absorbance among the two or more maximum absorption wavelengths may be 450 nm or more.
- the maximum absorption wavelength of the dye N is the transmission spectrum of the solution (liquid temperature 25 ° C.) containing the dye N in the range of 400 nm to 780 nm using a spectrophotometer: UV3100 (manufactured by Shimadzu Corporation) in an atmospheric atmosphere. Is measured, and the wavelength at which the light intensity becomes the minimum (maximum absorption wavelength) is detected.
- Examples of the dye that develops or decolorizes by exposure include a leuco compound.
- Examples of the dye to be decolorized by exposure include leuco compounds, diarylmethane dyes, oxadin dyes, xanthene dyes, iminonaphthoquinone dyes, azomethine dyes and anthraquinone dyes.
- As the dye N a leuco compound is preferable from the viewpoint of visibility of the exposed portion and the non-exposed portion.
- the leuco compound examples include a leuco compound having a triarylmethane skeleton (triarylmethane dye), a leuco compound having a spiropyran skeleton (spiropylan dye), a leuco compound having a fluorane skeleton (fluorane dye), and a diarylmethane skeleton. It has a leuco compound (diarylmethane dye), a leuco compound having a rhodamine lactam skeleton (rodamine lactam dye), a leuco compound having an indrill phthalide skeleton (indrill phthalide dye), and a leuco auramine skeleton.
- triarylmethane dye triarylmethane dye
- spiropyran skeleton a leuco compound having a spiropyran skeleton
- fluorane dye fluorane skeleton
- diarylmethane skeleton a diarylmethane
- Leuco compounds (leuco-auramine-based dyes) can be mentioned. Of these, triarylmethane-based dyes or fluorane-based dyes are preferable, and leuco compounds (triphenylmethane-based dyes) or fluorane-based dyes having a triphenylmethane skeleton are more preferable.
- the leuco compound preferably has a lactone ring, a surujin ring, or a sultone ring from the viewpoint of visibility of the exposed portion and the non-exposed portion.
- the lactone ring, sultin ring, or sulton ring of the leuco compound is reacted with the radical generated from the photoradical polymerization initiator or the acid generated from the photocationic polymerization initiator to change the leuco compound into a closed ring state.
- the color can be decolorized or the leuco compound can be changed to an open ring state to develop a color.
- the leuco compound is preferably a compound having a lactone ring, a sultone ring or a sultone ring, and the lactone ring, the sultone ring or the sultone ring is opened by a radical or an acid to develop color, and the lactone ring is formed by a radical or an acid.
- a compound in which the lactone ring is opened to develop a color is more preferable.
- Examples of the dye N include the following dyes and leuco compounds. Specific examples of the dyes among the dyes N include Brilliant Green, Ethyl Violet, Methyl Green, Crystal Violet, Basic Fuxin, Methyl Violet 2B, Kinaldine Red, Rose Bengal, Metanyl Yellow, Timor Sulfophthalein, Xylenol Blue, and Methyl.
- leuco compound among the dyes N include p, p', p "-hexamethyltriaminotriphenylmethane (leucocrystal violet), Pergascript Blue SRB (manufactured by Ciba Geigy), crystal violet lactone, and malakite green lactone.
- the dye N is preferably a dye whose maximum absorption wavelength is changed by radicals from the viewpoints of visibility of exposed and unexposed areas, pattern visibility after development, and resolution, and is a dye that develops color by radicals. Is more preferable.
- As the dye N leuco crystal violet, crystal violet lactone, brilliant green, or Victoria pure blue-naphthalene sulfonate is preferable.
- the dye may be used alone or in combination of two or more.
- the content of the dye is preferably 0.1% by mass or more, preferably 0% by mass, based on the total mass of the photosensitive layer from the viewpoints of visibility of the exposed and non-exposed areas, pattern visibility after development, and resolution. .1% by mass to 10% by mass is more preferable, 0.1% by mass to 5% by mass is further preferable, and 0.1% by mass to 1% by mass is particularly preferable.
- the content of the dye N is 0.1% by mass or more with respect to the total mass of the photosensitive layer from the viewpoints of visibility of the exposed portion and the non-exposed portion, pattern visibility after development, and resolution. It is preferable, 0.1% by mass to 10% by mass, more preferably 0.1% by mass to 5% by mass, and particularly preferably 0.1% by mass to 1% by mass.
- the content of the dye N means the content of the dye when all of the dye N contained in the photosensitive layer is in a colored state.
- a method for quantifying the content of dye N will be described by taking a dye that develops color by radicals as an example.
- Two kinds of solutions in which 0.001 g or 0.01 g of the dye is dissolved in 100 mL of methyl ethyl ketone are prepared.
- Irradicure OXE01 (trade name, manufactured by BASF), a photoradical polymerization initiator, is added to each of the obtained solutions, and radicals are generated by irradiating with light of 365 nm to bring all the dyes into a colored state.
- the absorbance of each solution having a liquid temperature of 25 ° C. is measured using a spectrophotometer (UV3100, manufactured by Shimadzu Corporation), and a calibration curve is prepared.
- UV3100 UV3100, manufactured by Shimadzu Corporation
- the absorbance of the solution in which all the dyes are developed is measured by the same method as above except that 3 g of the photosensitive layer is dissolved in methyl ethyl ketone instead of the dye. From the absorbance of the obtained solution containing the photosensitive layer, the content of the dye contained in the photosensitive layer is calculated based on the calibration curve.
- the photosensitive layer preferably contains a heat-crosslinkable compound from the viewpoint of the strength of the obtained cured film and the adhesiveness of the obtained uncured film.
- the heat-crosslinkable compound having an ethylenically unsaturated group which will be described later, is not treated as an ethylenically unsaturated compound, but is treated as a heat-crosslinkable compound.
- the heat-crosslinkable compound include a methylol compound and a blocked isocyanate compound. Of these, a blocked isocyanate compound is preferable from the viewpoint of the strength of the obtained cured film and the adhesiveness of the obtained uncured film.
- the blocked isocyanate compound reacts with the hydroxy group and the carboxy group, for example, when the alkali-soluble resin and / or the ethylenically unsaturated compound has at least one of the hydroxy group and the carboxy group, the film formed.
- the hydrophilicity is lowered, and the function when a film obtained by curing the photosensitive layer is used as a protective film tends to be enhanced.
- the blocked isocyanate compound refers to "a compound having a structure in which the isocyanate group of isocyanate is protected (so-called masked) with a blocking agent".
- the dissociation temperature of the blocked isocyanate compound is not particularly limited, but is preferably 100 ° C to 160 ° C, more preferably 130 ° C to 150 ° C.
- the dissociation temperature of the blocked isocyanate means "the temperature of the heat absorption peak associated with the deprotection reaction of the blocked isocyanate when measured by DSC (Differential scanning calorimetry) analysis using a differential scanning calorimeter".
- DSC Different scanning calorimeter
- a differential scanning calorimeter model: DSC6200 manufactured by Seiko Instruments Inc. can be preferably used.
- the differential scanning calorimeter is not limited to this.
- the blocking agent having a dissociation temperature of 100 ° C. to 160 ° C. examples include active methylene compounds [malonic acid diester (dimethyl malonate, diethyl malonate, din-butyl malonate, di2-ethylhexyl malonic acid, etc.)] and oxime compounds.
- the blocking agent having a dissociation temperature of 100 ° C. to 160 ° C. preferably contains, for example, an oxime compound from the viewpoint of storage stability.
- the blocked isocyanate compound preferably has an isocyanurate structure, for example, from the viewpoint of improving the brittleness of the membrane and improving the adhesion to the transferred body.
- the blocked isocyanate compound having an isocyanurate structure can be obtained, for example, by subjecting hexamethylene diisocyanate to isocyanurate to protect it.
- the compound having an oxime structure using an oxime compound as a blocking agent is easier to set the dissociation temperature in a preferable range than the compound having no oxime structure, and reduces the development residue. It is preferable from the viewpoint of ease.
- the blocked isocyanate compound may have a polymerizable group.
- the polymerizable group is not particularly limited, and a known polymerizable group can be used, and a radically polymerizable group is preferable.
- the polymerizable group include an ethylenically unsaturated group such as a (meth) acryloxy group, a (meth) acrylamide group and a styryl group, and a group having an epoxy group such as a glycidyl group.
- an ethylenically unsaturated group is preferable, a (meth) acryloxy group is more preferable, and an acryloxy group is further preferable.
- blocked isocyanate compound a commercially available product can be used.
- examples of commercially available blocked isocyanate compounds include Karenz (registered trademark) AOI-BM, Karenz (registered trademark) MOI-BM, Karenz (registered trademark) MOI-BP (all manufactured by Showa Denko KK), and block type.
- Duranate series for example, Duranate (registered trademark) TPA-B80E, Duranate (registered trademark) WT32-B75P, etc., manufactured by Asahi Kasei Chemicals Co., Ltd.
- the blocked isocyanate compound a compound having the following structure can also be used.
- the heat-crosslinkable compound may be used alone or in combination of two or more.
- the content of the heat-crosslinkable compound is preferably 1% by mass to 50% by mass, more preferably 5% by mass to 30% by mass, based on the total mass of the photosensitive layer.
- the photosensitive layer may contain components other than the above-mentioned alkali-soluble resin, polymerizable compound, polymerization initiator, dye and heat-crosslinkable compound.
- examples of other components include radical polymerization inhibitors, surfactants, sensitizers, various additives and the like.
- the other components may be used alone or in combination of two or more.
- the photosensitive layer may contain a radical polymerization inhibitor.
- the radical polymerization inhibitor include the thermal polymerization inhibitor described in paragraph 0018 of Japanese Patent No. 4502784. Of these, phenothiazine, phenoxazine, or 4-methoxyphenol is preferable.
- examples of other radical polymerization inhibitors include naphthylamine, cuprous chloride, nitrosophenylhydroxyamine aluminum salt, diphenylnitrosamine and the like. It is preferable to use a nitrosophenylhydroxylamine aluminum salt as a radical polymerization inhibitor so as not to impair the sensitivity of the photosensitive layer.
- the radical polymerization inhibitor may be used alone or in combination of two or more.
- the content of the radical polymerization inhibitor is preferably 0.001% by mass to 5.0% by mass, preferably 0.01% by mass to 3% by mass, based on the total mass of the photosensitive layer. 0.0% by mass is more preferable, and 0.02% by mass to 2.0% by mass is further preferable.
- the content of the radical polymerization inhibitor is preferably 0.005% by mass to 5.0% by mass, more preferably 0.01% by mass to 3.0% by mass, based on the total mass of the polymerizable compound. , 0.01% by mass to 1.0% by mass is more preferable.
- the photosensitive layer preferably contains a surfactant.
- the surfactant include the surfactants described in paragraphs 0017 of Japanese Patent No. 4502784 and paragraphs 0060 to 0071 of Japanese Patent Application Laid-Open No. 2009-237362. Further, as the surfactant, a nonionic surfactant, a fluorine-based surfactant or a silicone-based surfactant is preferable.
- fluorine-based surfactants include, for example, Megafuck (trade names) F-171, F-172, F-173, F-176, F-177, F-141, F-142, F-143. , F-144, F-437, F-444, F-475, F-477, F-479, F-482, F-551-A, F-552, F-554, F-555-A, F -556, F-557, F-558, F-559, F-560, F-561, F-565, F-563, F-568, F-575, F-780, EXP. MFS-330, EXP. MFS-578, EXP. MFS-578-2, EXP. MFS-579, EXP.
- the fluorine-based surfactant has a molecular structure having a functional group containing a fluorine atom, and an acrylic compound in which a portion of the functional group containing a fluorine atom is cut off and the fluorine atom volatilizes when heat is applied.
- fluorine-based surfactants include Megafuck (trade name) DS series manufactured by DIC Corporation (The Chemical Daily (February 22, 2016), Nikkei Sangyo Shimbun (February 23, 2016)).
- Megafuck (trade name) DS-21 can be mentioned.
- the fluorine-based surfactant it is also preferable to use a polymer of a fluorine atom-containing vinyl ether compound having a fluorinated alkyl group or a fluorinated alkylene ether group and a hydrophilic vinyl ether compound.
- a block polymer can also be used as the fluorine-based surfactant.
- the fluorine-based surfactant has a structural unit derived from a (meth) acrylate compound having a fluorine atom and 2 or more (preferably 5 or more) alkyleneoxy groups (preferably ethyleneoxy groups and propyleneoxy groups) (meth).
- a fluorine-containing polymer compound containing a structural unit derived from an acrylate compound can also be preferably used.
- fluorine-based surfactant a fluorine-containing polymer having an ethylenically unsaturated group in the side chain can also be used. Megafuck (trade name) RS-101, RS-102, RS-718K, RS-72-K (all manufactured by DIC Corporation) and the like can be mentioned.
- a fluorine-based surfactant for example, a compound having a linear perfluoroalkyl group having 7 or more carbon atoms may be used. However, from the viewpoint of improving environmental aptitude, it is preferable to use a substitute material of perfluorooctanoic acid (PFOA) or perfluorooctanesulfonic acid (PFOS) as the fluorosurfactant.
- PFOA perfluorooctanoic acid
- PFOS perfluorooctanesulfonic acid
- Nonionic surfactants include glycerol, trimethylolpropane, trimethylolethane, their ethoxylates and propoxylates (eg, glycerol propoxylates, glycerol ethoxylates, etc.), polyoxyethylene lauryl ethers, polyoxyethylene stearyl ethers, etc.
- silicone-based surfactant examples include a linear polymer composed of a siloxane bond and a modified siloxane polymer having an organic group introduced into a side chain or a terminal.
- Specific examples of the silicone-based surfactant include EXP. S-309-2, EXP. S-315, EXP. S-503-2, EXP.
- the photosensitive layer may contain one type of surfactant alone or two or more types.
- the content of the surfactant is preferably 0.001% by mass to 10% by mass, more preferably 0.01% by mass to 3% by mass, based on the total mass of the photosensitive layer.
- the photosensitive layer may contain a sensitizer.
- the sensitizer is not particularly limited, and known sensitizers, dyes and pigments can be used.
- Examples of the sensitizer include dialkylaminobenzophenone compounds, pyrazoline compounds, anthracene compounds, coumarin compounds, xanthone compounds, thioxanthone compounds, acridone compounds, oxazole compounds, benzoxazole compounds, thiazole compounds, benzothiazole compounds, and triazole compounds (for example). 1,2,4-triazole), stilben compounds, triazine compounds, thiophene compounds, naphthalimide compounds, triarylamine compounds, and aminoacridin compounds.
- the sensitizer may be used alone or in combination of two or more.
- the content of the sensitizer can be appropriately selected depending on the purpose, but from the viewpoint of improving the sensitivity to the light source and improving the curing rate by balancing the polymerization rate and the chain transfer, the photosensitive layer is selected. It is preferably 0.01% by mass to 5% by mass, more preferably 0.05% by mass to 1% by mass, based on the total mass of the above.
- the photosensitive layer may contain known additives, if necessary.
- the additive include plasticizers, heterocyclic compounds, benzotriazoles, carboxybenzotriazoles, pyridines (isonicotinamide and the like), purine bases (adenine and the like), and solvents.
- the photosensitive layer may contain one kind of each additive alone, or may contain two or more kinds of additives.
- benzotriazoles include 1,2,3-benzotriazole, 1-chloro-1,2,3-benzotriazole, bis (N-2-ethylhexyl) aminomethylene-1,2,3-benzotriazole, and the like. Examples thereof include bis (N-2-ethylhexyl) aminomethylene-1,2,3-tolyltriazole and bis (N-2-hydroxyethyl) aminomethylene-1,2,3-benzotriazole.
- carboxybenzotriazoles examples include 4-carboxy-1,2,3-benzotriazole, 5-carboxy-1,2,3-benzotriazole, and N- (N, N-di-2-ethylhexyl) aminomethylene. Examples thereof include carboxybenzotriazole, N- (N, N-di-2-hydroxyethyl) aminomethylenecarboxybenzotriazole, N- (N, N-di-2-ethylhexyl) aminoethylenecarboxybenzotriazole and the like.
- a commercially available product such as CBT-1 (Johoku Chemical Industry Co., Ltd., trade name) can be used.
- the total content of the benzotriazols and the carboxybenzotriazols is preferably 0.01% by mass to 3% by mass, and 0.05% by mass to 1% by mass with respect to the total mass of the photosensitive layer. Is more preferable. It is preferable that the content is 0.01% by mass or more from the viewpoint of imparting storage stability to the photosensitive layer. On the other hand, it is preferable to set the content to 3% by mass or less from the viewpoint of maintaining the sensitivity and suppressing the decolorization of the dye.
- the photosensitive layer may contain at least one selected from the group consisting of a plasticizer and a heterocyclic compound.
- a plasticizer and a heterocyclic compound include the compounds described in paragraphs 097 to 0103 and 0111 to 0118 of International Publication No. 2018/179640.
- the photosensitive layer may contain a solvent.
- the photosensitive layer is formed of a photosensitive resin composition containing a solvent, the solvent may remain on the photosensitive layer.
- the photosensitive layer includes metal oxide particles, antioxidants, dispersants, acid growth agents, development accelerators, conductive fibers, thermal acid generators, ultraviolet absorbers, thickeners, cross-linking agents, and organic or organic layers. It may further contain known additives such as an inorganic anti-precipitation agent. Additives contained in the photosensitive layer are described in paragraphs 0165 to 0184 of JP-A-2014-85643, and the contents of this publication are incorporated in the present specification.
- the photosensitive layer may contain a predetermined amount of impurities.
- impurities include sodium, potassium, magnesium, calcium, iron, manganese, copper, aluminum, titanium, chromium, cobalt, nickel, zinc, tin, halogen and ions thereof.
- halide ions, sodium ions, and potassium ions are likely to be mixed as impurities, so the following content is preferable.
- the content of impurities in the photosensitive layer is preferably 80 ppm or less, more preferably 10 ppm or less, still more preferably 2 ppm or less on a mass basis.
- the content of impurities may be 1 ppb or more, or 0.1 ppm or more, on a mass basis.
- Examples of the method for keeping impurities within the above range include selecting a composition having a low content of impurities as a raw material, preventing impurities from being mixed during the production of the photosensitive layer, and cleaning and removing the impurities. By such a method, the amount of impurities can be kept within the above range.
- the impurities can be quantified by known methods such as ICP (Inductively Coupled Plasma) emission spectroscopy, atomic absorption spectroscopy, and ion chromatography.
- ICP Inductively Coupled Plasma
- the content of compounds such as benzene, formaldehyde, trichlorethylene, 1,3-butadiene, carbon tetrachloride, chloroform, N, N-dimethylformamide, N, N-dimethylacetamide, and hexane in the photosensitive layer is preferably low. ..
- the content of these compounds with respect to the total mass of the photosensitive layer is preferably 100 ppm or less, more preferably 20 ppm or less, still more preferably 4 ppm or less on a mass basis.
- the lower limit can be 10 ppb or more and 100 ppb or more with respect to the total mass of the photosensitive layer on a mass basis.
- the content of these compounds can be suppressed in the same manner as the above-mentioned metal impurities. Further, it can be quantified by a known measurement method.
- the water content in the photosensitive layer is preferably 0.01% by mass to 1.0% by mass, more preferably 0.05% by mass to 0.5% by mass, from the viewpoint of improving reliability and laminateability.
- the photosensitive layer may contain a residual monomer corresponding to each structural unit of the alkali-soluble resin described above.
- the content of the residual monomer is preferably 5,000 mass ppm or less, more preferably 2,000 mass ppm or less, and 500 mass ppm or less with respect to the total mass of the alkali-soluble resin from the viewpoint of patterning property and reliability. Is more preferable.
- the lower limit is not particularly limited, but 1 mass ppm or more is preferable, and 10 mass ppm or more is more preferable.
- the residual monomer of each structural unit of the alkali-soluble resin is preferably 3,000 mass ppm or less, more preferably 600 mass ppm or less, more preferably 100 mass ppm or less, based on the total mass of the photosensitive layer, from the viewpoint of patterning property and reliability. More preferably, the mass is ppm or less.
- the lower limit is not particularly limited, but is preferably 0.1 mass ppm or more, and more preferably 1 mass ppm or more.
- the amount of residual monomer of the monomer when synthesizing the alkali-soluble resin by the polymer reaction is also preferably in the above range.
- the content of glycidyl acrylate is preferably in the above range.
- the amount of the residual monomer can be measured by a known method such as liquid chromatography and gas chromatography.
- the thickness of the photosensitive layer is preferably 20 ⁇ m or less, more preferably 10 ⁇ m or less, further preferably 8 ⁇ m or less, and further preferably 5 ⁇ m or less. Is particularly preferable, and most preferably 1 ⁇ m or more and 5 ⁇ m or less.
- the thickness of the photosensitive layer is calculated by a method according to the method for calculating the thickness of the temporary support described above.
- the transmittance of light having a wavelength of 365 nm in the photosensitive layer is preferably 10% or more, preferably 30% or more, and more preferably 50% or more.
- the upper limit is not particularly limited, but is preferably 99.9% or less.
- the method for forming the photosensitive layer is not particularly limited as long as it is a method capable of forming a layer containing the above components.
- a method for forming the photosensitive layer for example, a photosensitive resin composition containing an alkali-soluble resin, an ethylenically unsaturated compound, a photopolymerization initiator, a solvent and the like is prepared, and the photosensitive resin composition is formed on the surface of a temporary support or the like. Examples thereof include a method of forming by applying an object and drying a coating film of a photosensitive resin composition.
- the photosensitive layer is preferably formed by applying a photosensitive resin composition to the surface of the temporary support.
- a method for drying the coating film of the photosensitive resin composition heat drying and vacuum drying are preferable.
- drying means removing at least a part of the solvent contained in the composition. Examples of the drying method include natural drying, heat drying, and vacuum drying. The above methods can be applied alone or in combination.
- the drying temperature is preferably 80 ° C. or higher, more preferably 90 ° C. or higher.
- the upper limit thereof is preferably 130 ° C. or lower, more preferably 120 ° C. or lower. It can also be dried by continuously changing the temperature.
- the drying time is preferably 20 seconds or longer, more preferably 40 seconds or longer, and even more preferably 60 seconds or longer.
- the upper limit is not particularly limited, but is preferably 600 seconds or less, and more preferably 300 seconds or less.
- Examples of the photosensitive resin composition used for forming the photosensitive layer include an alkali-soluble resin, an ethylenically unsaturated compound, a photopolymerization initiator, and a composition containing the above-mentioned optional components and a solvent.
- the photosensitive resin composition preferably contains a solvent in order to adjust the viscosity of the photosensitive resin composition and facilitate the formation of the photosensitive layer.
- the solvent contained in the photosensitive resin composition is not particularly limited as long as it can dissolve or disperse an alkali-soluble resin, an ethylenically unsaturated compound, a photopolymerization initiator and the above optional components, and a known solvent is used.
- a known solvent is used.
- the solvent include an alkylene glycol ether solvent, an alkylene glycol ether acetate solvent, an alcohol solvent (for example, methanol and ethanol), a ketone solvent (for example, acetone and methyl ethyl ketone), and an aromatic hydrocarbon solvent (for example, toluene).
- the photosensitive resin composition preferably contains at least one selected from the group consisting of an alkylene glycol ether solvent and an alkylene glycol ether acetate solvent.
- a mixed solvent containing at least one selected from the group consisting of an alkylene glycol ether solvent and an alkylene glycol ether acetate solvent and at least one selected from the group consisting of a ketone solvent and a cyclic ether solvent is more preferable.
- a mixed solvent containing at least one selected from the group consisting of a glycol ether solvent and an alkylene glycol ether acetate solvent, a ketone solvent, and at least three types of a cyclic ether solvent is more preferable.
- alkylene glycol ether solvent examples include ethylene glycol monoalkyl ether, ethylene glycol dialkyl ether, propylene glycol monoalkyl ether, propylene glycol dialkyl ether, diethylene glycol dialkyl ether, dipropylene glycol monoalkyl ether and dipropylene glycol dialkyl ether. ..
- alkylene glycol ether acetate solvent examples include ethylene glycol monoalkyl ether acetate, propylene glycol monoalkyl ether acetate, diethylene glycol monoalkyl ether acetate and dipropylene glycol monoalkyl ether acetate.
- the solvent described in paragraphs 0092 to 0094 of International Publication No. 2018/179640 and the solvent described in paragraph 0014 of JP-A-2018-177789 may be used, and the contents thereof are described in the present specification. Incorporated into the book.
- the photosensitive resin composition may contain one type of solvent alone or may contain two or more types of solvent.
- the content of the solvent when the photosensitive resin composition is applied is preferably 50 parts by mass to 1,900 parts by mass, preferably 100 parts by mass to 900 parts by mass with respect to 100 parts by mass of the total solid content in the photosensitive resin composition. The part is more preferable.
- the method for preparing the photosensitive resin composition is not particularly limited.
- a photosensitive resin composition is prepared by preparing a solution in which each component is dissolved in the above solvent in advance and mixing the obtained solution in a predetermined ratio. There is a method of preparing.
- the photosensitive resin composition is preferably filtered using a filter having a pore size of 0.2 ⁇ m to 30 ⁇ m before forming the photosensitive layer.
- the method of applying the photosensitive resin composition is not particularly limited, and it may be applied by a known method. Examples of the coating method include slit coating, spin coating, curtain coating and inkjet coating. Further, the photosensitive layer may be formed by applying a photosensitive resin composition on a protective film described later and drying the photosensitive layer.
- the transfer material according to one embodiment of the present disclosure preferably contains a protective film as the outermost layer on the side opposite to the temporary support side. Further, it is preferable that the protective film comes into contact with the surface of the photosensitive layer opposite to the surface of the photosensitive layer that comes into contact with the temporary support.
- Examples of the material constituting the protective film include a resin film and paper, and a resin film is preferable from the viewpoint of strength and flexibility.
- Examples of the resin film include a polyethylene film, a polypropylene film, a polyethylene terephthalate film, a cellulose triacetate film, a polystyrene film, and a polycarbonate film. Of these, polyethylene film, polypropylene film, or polyethylene terephthalate film is preferable.
- the thickness (layer thickness) of the protective film is not particularly limited, but is preferably 1 ⁇ m to 100 ⁇ m, more preferably 5 ⁇ m to 50 ⁇ m, further preferably 5 ⁇ m to 40 ⁇ m, and particularly preferably 15 ⁇ m to 30 ⁇ m.
- the arithmetic mean roughness Ra value of the surface of the protective film in contact with the photosensitive layer (hereinafter, also simply referred to as “the surface of the protective film”) is preferably 0.3 ⁇ m or less, preferably 0.1 ⁇ m or less, from the viewpoint of excellent resolution. Is more preferable, and 0.05 ⁇ m or less is further preferable.
- the Ra value on the surface of the protective film is in the above range to improve the uniformity of the layer thickness of the photosensitive layer and the formed resin pattern.
- the lower limit of the Ra value on the surface of the protective film is not particularly limited, but 0.001 ⁇ m or more is preferable.
- the Ra value on the surface of the protective film is measured by the following method. Using a three-dimensional optical profiler (New View7300, manufactured by Zygo), the surface of the protective film is measured under the following conditions to obtain the surface profile of the optical film. As the measurement / analysis software, Microscope Application of MetroPro ver8.3.2 is used. Next, the Surface Map screen is displayed by the above analysis software, and the histogram data is obtained in the Surface Map screen. From the obtained histogram data, the arithmetic mean roughness is calculated, and the Ra value on the surface of the protective film is obtained. When the protective film is attached to the transfer material, the protective film may be peeled from the transfer material and the Ra value of the surface on the peeled side may be measured.
- a transfer material can be manufactured by adhering a protective film to a photosensitive layer or the like.
- the method of attaching the protective film to the photosensitive layer or the like is not particularly limited, and known methods can be mentioned.
- Examples of the device for adhering the protective film to the photosensitive layer include a vacuum laminator and a known laminator such as an auto-cut laminator. It is preferable that the laminator is provided with an arbitrary heatable roller such as a rubber roller and can be pressurized and heated.
- the transfer material according to one embodiment of the present disclosure may include a refractive index adjusting layer (that is, a contrast enhancement layer).
- a refractive index adjusting layer that is, a contrast enhancement layer.
- the contrast enhancement layer is described in paragraph 0134 of WO 2018/179640. Further, the other layers are described in paragraphs 0194 to 0196 of JP-A-2014-85643. The contents of these publications are incorporated herein.
- the total thickness of each layer of the transfer material excluding the temporary support and the protective film is preferably 20 ⁇ m or less, more preferably 10 ⁇ m or less, and more preferably 8 ⁇ m, from the viewpoint of resolution and adhesion to the substrate. It is more preferably 2 ⁇ m or more, and particularly preferably 8 ⁇ m or less.
- the breaking elongation of the cured film obtained by curing the photosensitive layer at 120 ° C. is 15% or more, and the arithmetic mean roughness Ra of the surface of the temporary support on the photosensitive layer side is 50 nm or less. It is preferable that the arithmetic mean roughness Ra of the surface of the protective film on the photosensitive layer side is 150 nm or less.
- the transfer material according to the present disclosure preferably satisfies the following formula (R1).
- X ⁇ Y ⁇ 1,500 Equation (R1)
- X represents the value (%) of the elongation at break at 120 ° C. of the cured film obtained by curing the photosensitive layer
- Y is the arithmetic mean roughness of the surface of the temporary support on the photosensitive layer side.
- X ⁇ Y is more preferably 750 or less.
- the breaking elongation at 120 ° C. is twice or more larger than the breaking elongation at 23 ° C. of the cured film obtained by curing the photosensitive layer.
- the breaking elongation is obtained after the photosensitive layer having a thickness of 20 ⁇ m is exposed to 120 mJ / cm 2 with an ultrahigh pressure mercury lamp and cured, then further exposed to 400 mJ / cm 2 with a high pressure mercury lamp and heated at 145 ° C. for 30 minutes. It is measured by a tensile test using a cured film.
- the transfer material according to the present disclosure preferably satisfies the following formula (R2).
- Y represents the arithmetic mean roughness Ra value (nm) of the surface of the temporary support on the photosensitive layer side
- Z is the arithmetic mean of the surface of the protective film on the photosensitive layer side. Represents the value (nm) of roughness Ra.
- the method for producing the transfer material according to the present disclosure is not particularly limited, and a known production method, for example, a known method for forming each layer can be used.
- a method for producing a transfer material according to the present disclosure will be described with reference to FIG. 1.
- the transfer material according to the present disclosure is not limited to the one having the configuration shown in FIG.
- a photosensitive resin composition containing an alkali-soluble resin and an ethylenically unsaturated compound is applied to the surface of the temporary support 10, and then the coating film of the photosensitive resin composition is dried.
- a method including a step of forming the photosensitive layer 20 can be mentioned.
- a photosensitive resin composition containing an alkali-soluble resin, an ethylenically unsaturated compound, and at least one selected from the group consisting of an alkylene glycol ether solvent and an alkylene glycol ether acetate solvent is used. Is preferable.
- the transfer material 100 is manufactured by crimping the protective film 30 to the photosensitive layer 20 of the laminate manufactured by the above manufacturing method.
- the method for producing the transfer material used in the present disclosure includes a step of providing the protective film 30 so as to be in contact with the surface of the photosensitive layer 20 opposite to the side on which the temporary support 10 is provided. 10. It is preferable to manufacture the transfer material 100 including the photosensitive layer 20 and the protective film 30. After the transfer material 100 is manufactured by the above-mentioned manufacturing method, the transfer material 100 may be wound up to prepare and store the transfer material in the form of a roll.
- the roll-type transfer material can be provided as it is in the process of bonding with a substrate in the roll-to-roll method described later.
- the transfer material according to the embodiment of the present disclosure can be suitably used for various applications requiring precision microfabrication by photolithography.
- the photosensitive layer may be used as a coating for etching, or electroforming may be performed mainly by electroplating.
- the cured film obtained by patterning may be used as a permanent film, or may be used, for example, as an interlayer insulating film, a wiring protective film, a wiring protective film having an index matching layer, or the like.
- the transfer material according to the embodiment of the present disclosure is a semiconductor package, a printed circuit board, various wiring forming applications of a sensor board, a touch panel, an electromagnetic wave shielding material, a conductive film such as a film heater, a liquid crystal seal material, a micromachine or a micro. It can be suitably used for applications such as the formation of structures in the field of electronics.
- the photosensitive layer is a colored resin layer containing a pigment
- the colored resin layer is used for, for example, a liquid crystal display (LCD) and a color used for a solid-state image sensor [for example, a CCD (charge-coupled device) and a CMOS (complementary metal oxide semiconductor)]. It is suitable for forming colored pixels such as filters or a black matrix.
- liquid crystal display windows of electronic devices may be provided with a cover glass having a black frame-shaped light-shielding layer formed on the peripheral edge of the back surface of a transparent glass substrate or the like in order to protect the liquid crystal display window. be.
- a colored resin layer can be used to form such a light-shielding layer.
- the embodiments other than the pigment in the colored resin layer are the same as those described above.
- the pigment used for the colored resin layer may be appropriately selected according to the desired hue, and can be selected from black pigments, white pigments, and chromatic pigments other than black and white. Above all, when forming a black pattern, a black pigment is preferably selected as the pigment.
- the black pigment a known black pigment (organic pigment, inorganic pigment, etc.) can be appropriately selected as long as the effect in the present disclosure is not impaired.
- examples of the black pigment include carbon black, titanium oxide, titanium carbide, iron oxide, titanium oxide, graphite and the like, and carbon black is particularly preferable.
- carbon black from the viewpoint of surface resistance, carbon black having at least a part of the surface coated with a resin is preferable.
- the particle size of the black pigment is preferably 0.001 ⁇ m to 0.1 ⁇ m, more preferably 0.01 ⁇ m to 0.08 ⁇ m in terms of number average particle size.
- the particle size refers to the diameter of a circle when the area of the pigment particles is obtained from a photographic image of the pigment particles taken with an electronic microscope and a circle having the same area as the area of the pigment particles is considered, and the number average particle size. Is an average value obtained by obtaining the above particle size for any 100 particles and averaging the obtained 100 particle sizes.
- the white pigment described in paragraphs 0015 and 0114 of JP-A-2005-007765 can be used as the white pigment.
- the white pigments as the inorganic pigment, titanium oxide, zinc oxide, lithopone, light calcium carbonate, white carbon, aluminum oxide, aluminum hydroxide, or barium sulfate are preferable, and titanium oxide or zinc oxide is more preferable. Titanium oxide is preferable, and titanium oxide is more preferable.
- rutile-type or anatase-type titanium oxide is more preferable, and rutile-type titanium oxide is particularly preferable.
- the surface of titanium oxide may be treated with silica, alumina, titania, zirconia, or an organic substance, or may be subjected to two or more treatments.
- the catalytic activity of titanium oxide is suppressed, and heat resistance, fading and the like are improved.
- at least one of alumina treatment and zirconia treatment is preferable as the surface treatment of the surface of titanium oxide, and both alumina treatment and zirconia treatment are particularly preferable.
- the photosensitive layer is a colored resin layer
- the photosensitive layer further contains a chromatic pigment other than the black pigment and the white pigment from the viewpoint of transferability.
- a chromatic pigment is contained, the particle size of the chromatic pigment is preferably 0.1 ⁇ m or less, more preferably 0.08 ⁇ m or less, in that the dispersibility is more excellent.
- chromatic pigments include Victoria Pure Blue BO (Color Index (hereinafter CI) 42595), Auramine (CI41000), Fat Black HB (CI26150), and Monolite.
- CI Pigment Yellow 12 Permanent Yellow GR
- Permanent Yellow HR Permanent Yellow HR
- Pigment Red 146 Hoster Balm Red ESB (CI Pigment Violet 19), Permanent Ruby FBH (CI Pigment Red 11), Fastel Pink B Supra (CI Pigment) Red 81), Monastral First Blue (CI Pigment Blue 15), Monolite First Black B (CI Pigment Black 1) and Carbon, C.I. I. Pigment Red 97, C.I. I. Pigment Red 122, C.I. I. Pigment Red 149, C.I. I. Pigment Red 168, C.I. I. Pigment Red 177, C.I. I. Pigment Red 180, C.I. I. Pigment Red 192, C.I. I. Pigment Red 215, C.I. I. Pigment Green 7, C.I. I.
- Pigment Blue 15 1, C.I. I. Pigment Blue 15: 4, C.I. I. Pigment Blue 22, C.I. I. Pigment Blue 60, C.I. I. Pigment Blue 64, and C.I. I. Pigment Violet 23 and the like. Above all, C.I. I. Pigment Red 177 is preferred.
- the content of the pigment is preferably more than 3% by mass and 40% by mass or less, more preferably more than 3% by mass and 35% by mass or less, based on the total mass of the photosensitive layer. It is more preferably more than mass% and 35% by mass or less, and particularly preferably 10% by mass or more and 35% by mass or less.
- the content of the pigment other than the black pigment is preferably 30% by mass or less, preferably 1% by mass to 20% by mass, based on the black pigment. % Is more preferable, and 3% by mass to 15% by mass is further preferable.
- the black pigment (preferably carbon black) is introduced into the photosensitive resin composition in the form of a pigment dispersion.
- the dispersion liquid may be prepared by adding a mixture obtained by previously mixing a black pigment and a pigment dispersant to an organic solvent (or vehicle) and dispersing it with a disperser.
- the pigment dispersant may be selected depending on the pigment and the solvent, and for example, a commercially available dispersant can be used.
- the vehicle refers to a portion of the medium in which the pigment is dispersed when the pigment is dispersed, and is a liquid, a binder component that holds the black pigment in a dispersed state, and a solvent component that dissolves and dilutes the binder component. (Organic solvent) and.
- the disperser is not particularly limited, and examples thereof include known dispersers such as a kneader, a roll mill, an attritor, a super mill, a dissolver, a homomixer, and a sand mill. Further, it may be finely pulverized by mechanical grinding using frictional force.
- disperser and fine pulverization the description of "Encyclopedia of Pigments" (Kunizo Asakura, First Edition, Asakura Shoten, 2000, 438, 310) can be referred to.
- a transfer material including a temporary support and a photosensitive layer in contact with the temporary support is bonded to a substrate, and the photosensitive layer and the temporary support are placed on the substrate.
- Arranging the supports in this order hereinafter, may be referred to as “bonding step” and peeling the temporary support from the photosensitive layer (hereinafter, may be referred to as “peeling step”).
- peeling step peeling the temporary support from the photosensitive layer
- the photosensitive layer exposed by peeling of the temporary support is subjected to exposure treatment and development treatment to form a pattern (hereinafter, may be referred to as “pattern forming step”).
- the surface roughness Ra of the photosensitive layer exposed by peeling the temporary support from the photosensitive layer is 2 nm or more.
- the transfer material described in the above-mentioned "transfer material" section is applied as the transfer material.
- at least a part of the pattern obtained in the pattern forming step includes a line-and-space pattern.
- the width of at least one set of lines and spaces in the line-and-space pattern is preferably 20 ⁇ m or less in total.
- the transfer material including the temporary support and the photosensitive layer in contact with the temporary support and the substrate are bonded, and the photosensitive layer and the temporary support are arranged on the substrate in this order.
- the conductive layer is provided on the surface of the substrate, it is preferable to bond the transfer material and the conductive layer of the substrate.
- the bonding of the transfer material and the substrate preferably includes crimping the transfer material and the substrate. Since the adhesion between the transfer material and the substrate is improved, the patterned photosensitive layer after exposure and development can be suitably used as an etching resist when etching the conductive layer. If the transfer material includes a protective film, the protective film may be removed and then bonded.
- the method of crimping the transfer material and the substrate is not particularly limited, and a known transfer method and laminating method can be used.
- the bonding of the transfer material and the substrate is preferably performed by stacking the transfer material and the substrate and applying pressure and heating by means such as a roll.
- a known laminator such as a laminator, a vacuum laminator, and an auto-cut laminator capable of further increasing productivity can be used.
- the laminating temperature is not particularly limited, but is preferably 70 ° C to 130 ° C, for example.
- the method for manufacturing the laminated body including the bonding step is performed by a roll-to-roll method.
- the roll-to-roll method uses a substrate that can be wound and unwound as a substrate, and unwinds the substrate or a structure including the substrate before any of the steps included in the method for manufacturing a laminated body (a step of unwinding the substrate or a structure including the substrate).
- a "unwinding step") and a step of winding the substrate or a structure including the substrate also referred to as a "winding step” after any of the steps, and at least one of the steps (also referred to as a "winding step”).
- the unwinding method in the unwinding step and the winding method in the winding step are not particularly limited, and a known method may be used in the manufacturing method to which the roll-to-roll method is applied.
- the substrate a known substrate may be used, but a substrate having a conductive layer is preferable, and it is more preferable to have a conductive layer on the surface of the substrate.
- the substrate may have any layer other than the conductive layer, if necessary.
- the substrate include a resin substrate, a glass substrate, and a semiconductor substrate. Preferred embodiments of the substrate include, for example, description in paragraph 0140 of WO 2018/155193, the contents of which are incorporated herein.
- the material of the resin substrate cycloolefin polymer and polyimide are preferable.
- the thickness of the resin substrate is preferably 5 ⁇ m to 200 ⁇ m, more preferably 10 ⁇ m to 100 ⁇ m.
- the conductive layer examples include a conductive layer used for general circuit wiring or touch panel wiring. Further, as the conductive layer, at least one layer selected from the group consisting of a metal layer, a conductive metal oxide layer, a graphene layer, a carbon nanotube layer and a conductive polymer layer is used from the viewpoint of conductivity and fine wire forming property. Preferably, a metal layer is more preferable, and a copper layer or a silver layer is further preferable.
- the substrate may have one conductive layer alone, or may have two or more layers. When having two or more conductive layers, it is preferable to have conductive layers made of different materials.
- Examples of the material of the conductive layer include metals and conductive metal oxides.
- Examples of the metal include Al, Zn, Cu, Fe, Ni, Cr, Mo, Ag and Au.
- Examples of the conductive metal oxide include ITO (Indium Tin Oxide), IZO (Indium Zinc Oxide) and SiO 2 .
- conductivity means that the volume resistivity is less than 1 ⁇ 106 ⁇ cm.
- the volume resistivity of the conductive metal oxide is preferably less than 1 ⁇ 10 4 ⁇ cm.
- a resin pattern is manufactured using a substrate having a plurality of conductive layers
- the conductive layer an electrode pattern corresponding to the sensor of the visual recognition portion used in the capacitive touch panel or wiring of the peripheral extraction portion is preferable.
- Preferred embodiments of the conductive layer include, for example, description in paragraph 0141 of WO 2018/155193, the contents of which are incorporated herein.
- a substrate having at least one of a transparent electrode and a routing wire is preferable.
- the above-mentioned substrate can be suitably used as a touch panel substrate.
- the transparent electrode may function suitably as a touch panel electrode.
- the transparent electrode is preferably composed of a metal oxide film such as ITO (indium tin oxide) and IZO (indium zinc oxide), a metal mesh, and a fine metal wire such as a metal nanowire.
- the thin metal wire include thin wires such as silver and copper. Of these, silver conductive materials such as silver mesh and silver nanowires are preferable.
- Metal is preferable as the material of the routing wiring.
- the metal that is the material of the routing wiring include gold, silver, copper, molybdenum, aluminum, titanium, chromium, zinc, and manganese, and alloys composed of two or more of these metal elements.
- copper, molybdenum, aluminum, or titanium is preferable, and copper is particularly preferable.
- the electrode protective film for a touch panel formed by using the transfer material according to the present disclosure has an electrode or the like directly or another layer for the purpose of protecting the electrode or the like (that is, at least one of the electrode for the touch panel and the wiring for the touch panel). It is preferable that it is provided so as to cover the interposition.
- peeling process the temporary support is peeled from the photosensitive layer.
- the method of peeling the temporary support is not limited.
- the same mechanism as the cover film peeling mechanism described in paragraphs 0161 to 0162 of Japanese Patent Application Laid-Open No. 2010-072589 can be used.
- the surface of the photosensitive layer exposed by peeling the temporary support from the photosensitive layer that is, the roughness Ra of the first surface of the photosensitive layer is 2 nm or more.
- the roughness Ra of the first surface of the photosensitive layer is 2 nm or more, the slipperiness of the surface of the photosensitive layer is improved.
- a preferable range of the roughness Ra of the first surface of the photosensitive layer is described in the above-mentioned "photosensitive layer" section.
- the static friction coefficient of the surface of the photosensitive layer exposed by peeling the temporary support from the photosensitive layer is preferably less than 2.0.
- the coefficient of static friction of the first surface of the photosensitive layer is 1.0 or less, the slipperiness of the surface of the photosensitive layer is improved.
- the preferred range of the coefficient of static friction of the first surface of the photosensitive layer is described in the above section "Photosensitive layer".
- the dynamic friction coefficient of the surface of the photosensitive layer exposed by peeling the temporary support from the photosensitive layer is preferably less than 1.5.
- the coefficient of dynamic friction of the first surface of the photosensitive layer is less than 1.5, the slipperiness of the surface of the photosensitive layer is improved.
- the preferred range of the coefficient of dynamic friction of the first surface of the photosensitive layer is described in the above section "Photosensitive layer".
- Pattern formation process In the pattern forming step, the photosensitive layer exposed by peeling of the temporary support is exposed and developed to form a pattern.
- the development process is usually performed after the exposure process.
- the exposure process preferably includes pattern exposure of the photosensitive layer.
- the "pattern exposure” refers to an exposure in a pattern of exposure, that is, a form in which an exposed portion and a non-exposed portion are present.
- the positional relationship between the exposed area and the unexposed area in the pattern exposure is not particularly limited and is appropriately adjusted.
- the photosensitive layer may be exposed from the side opposite to the side on which the substrate is provided, or may be exposed from the side on which the substrate is provided.
- the detailed arrangement and specific size of the pattern in the pattern exposure are not particularly limited.
- at least a part of the pattern so as to improve the display quality of a display device (for example, a touch panel) having an input device having a circuit wiring manufactured by a circuit wiring manufacturing method and to reduce the area occupied by the take-out wiring.
- the electrode pattern of the touch panel and / or the portion of the take-out wiring includes a thin wire having a width of 20 ⁇ m or less, and more preferably a thin wire having a width of 10 ⁇ m or less.
- the light source used for exposure can be appropriately selected and used as long as it is a light source that irradiates the photosensitive layer with light having a wavelength that allows exposure (for example, 365 nm or 405 nm).
- a light source that irradiates the photosensitive layer with light having a wavelength that allows exposure for example, 365 nm or 405 nm.
- Specific examples thereof include ultra-high pressure mercury lamps, high pressure mercury lamps, metal halide lamps and LEDs (Light Emitting Diodes).
- the exposure amount is preferably 5 mJ / cm 2 to 200 mJ / cm 2 , more preferably 10 mJ / cm 2 to 100 mJ / cm 2 .
- Preferred embodiments of the light source, exposure amount, and exposure method used for exposure include, for example, paragraphs 0146 to 0147 of International Publication No. 2018/155193, the contents of which are incorporated in the present specification.
- the exposure method select the contact exposure method in the case of contact exposure, the proximity exposure method in the case of the non-contact exposure method, the projection exposure method of the lens system or the mirror system, the direct exposure method using an exposure laser, etc. as appropriate. Can be used.
- an exposure machine having an appropriate numerical aperture (NA) of the lens can be used according to the required resolving power and depth of focus.
- drawing may be performed directly on the photosensitive layer, or reduced projection exposure may be performed on the photosensitive layer via a lens. Further, the exposure may be performed not only in the atmosphere but also under reduced pressure or vacuum, or may be exposed by interposing a liquid such as water between the light source and the photosensitive layer.
- the photosensitive layer When the photosensitive layer is exposed using a photomask, the photosensitive layer may be brought into contact with the photomask to expose the photosensitive layer, or the photomask may be brought close to the photosensitive layer without contacting the photosensitive layer and the photomask.
- the photosensitive layer may be exposed.
- the exposure treatment preferably includes exposing the photosensitive layer by bringing the photosensitive layer into contact with the photomask.
- the exposed photosensitive layer can be developed by using a developing solution.
- a developing solution for example, a known developer such as the developer described in JP-A-5-72724 can be used.
- the developer may contain a water-soluble organic solvent and / or a surfactant.
- the developer the developer described in paragraph 0194 of International Publication No. 2015/093271 is also preferably mentioned.
- Preferred development methods include, for example, the development method described in paragraph 0195 of International Publication No. 2015/093271.
- the development method is not particularly limited, and may be any of paddle development, shower development, shower and spin development, and dip development.
- Shower development is a development process for removing an exposed portion or a non-exposed portion by spraying a developing solution on the photosensitive layer after exposure by a shower. After development, it is preferable to spray the cleaning agent with a shower and rub with a brush to remove the development residue.
- the liquid temperature of the developing solution is not particularly limited, but is preferably 20 ° C to 40 ° C.
- the method for producing the laminate preferably includes a step of peeling the protective film from the transfer material.
- the method of peeling the protective film is not limited, and a known method can be applied.
- the method for producing a laminate may include a step of exposing a pattern obtained by a pattern forming step (post-exposure step) and / or a step of heating (post-baking step).
- post-exposure step a step of exposing a pattern obtained by a pattern forming step
- post-baking step a step of heating
- the exposure amount of the post exposure is preferably 100 mJ / cm 2 to 5,000 mJ / cm 2 , more preferably 200 mJ / cm 2 to 3,000 mJ / cm 2 .
- the temperature of the post bake is preferably 80 ° C to 250 ° C, more preferably 90 ° C to 160 ° C.
- the post-baking time is preferably 1 minute to 180 minutes, more preferably 10 minutes to 60 minutes.
- the method for producing a laminate according to an embodiment of the present disclosure may include any step other than the above-mentioned steps.
- the steps described in the circuit wiring manufacturing method or the touch panel manufacturing method shown below may be mentioned, but the steps are not limited to these steps.
- the laminate manufactured by the method for producing a laminate according to an embodiment of the present disclosure can be applied to various devices.
- the device provided with the laminated body include an input device and the like, and a touch panel is preferable, and a capacitive touch panel is more preferable.
- the input device can be applied to a display device such as an organic electroluminescence display device and a liquid crystal display device.
- the formed pattern is preferably used as a touch panel electrode or a protective film for touch panel wiring. That is, the transfer material according to the present disclosure is preferably used for forming an electrode protective film for a touch panel or wiring for a touch panel.
- a transfer material including a temporary support and a photosensitive layer in contact with the temporary support is bonded to a substrate, and the photosensitive layer and the temporary support are placed on the substrate.
- the bodies are arranged in this order (that is, “bonding step"), the temporary support is peeled from the photosensitive layer (that is, “peeling step”), and the temporary support is exposed by peeling.
- the photosensitive layer is exposed and developed to form a pattern (that is, a "pattern forming step”), and the substrate is etched in a region where the pattern is not arranged (hereinafter, "etching").
- the surface roughness Ra of the photosensitive layer exposed by peeling the temporary support from the photosensitive layer is 2 nm or more.
- etching step the substrate is etched in the region where the pattern is not arranged. That is, in the etching step, a pattern formed from the photosensitive layer is used as an etching resist to perform an etching process.
- a method of etching treatment a known method can be applied, and for example, the method described in paragraphs 0209 to 0210 of JP-A-2017-120435 and paragraphs 0048-paragraph 0054 of JP-A-2010-152155. Examples thereof include a wet etching method in which the material is immersed in an etching solution, and a dry etching method such as plasma etching.
- an acidic or alkaline etching solution may be appropriately selected according to the etching target.
- the acidic etching solution include an aqueous solution of an acidic component alone selected from hydrochloric acid, sulfuric acid, nitric acid, acetic acid, hydrofluoric acid, oxalic acid and phosphoric acid, and the acidic component, ferric chloride, ammonium fluoride and Examples thereof include a mixed aqueous solution with a salt selected from potassium permanganate.
- the acidic component may be a component in which a plurality of acidic components are combined.
- the alkaline etching solution includes an aqueous solution of an alkaline component alone selected from sodium hydroxide, potassium hydroxide, ammonia, an organic amine, and a salt of an organic amine (tetramethylammonium hydroxide, etc.), and an alkaline component and a salt. Examples thereof include a mixed aqueous solution with (potassium permanganate, etc.).
- the alkaline component may be a component in which a plurality of alkaline components are combined.
- the method for manufacturing a circuit wiring according to an embodiment of the present disclosure preferably includes a step of removing a remaining pattern (hereinafter, may be referred to as a "removal step").
- the removal step is preferably performed after the etching step.
- the method for removing the remaining pattern is not particularly limited, and examples thereof include a method for removing by chemical treatment, and a method for removing with a removing liquid is preferable.
- a method for removing the remaining pattern a substrate having the remaining pattern is placed in a stirring removing liquid having a liquid temperature of preferably 30 ° C. to 80 ° C., more preferably 50 ° C. to 80 ° C. for 1 minute to 30 minutes. Examples include a method of dipping.
- the removing liquid examples include a removing liquid in which an inorganic alkaline component or an organic alkaline component is dissolved in water, dimethyl sulfoxide, N-methylpyrrolidone, or a mixed solution thereof.
- examples of the inorganic alkaline component include sodium hydroxide and potassium hydroxide.
- examples of the organic alkali component include a primary amine compound, a secondary amine compound, a tertiary amine compound and a quaternary ammonium salt compound.
- the removing liquid may be used and removed by a known method such as a spray method, a shower method and a paddle method.
- the method for manufacturing a circuit wiring according to an embodiment of the present disclosure may include any process other than the above-mentioned process.
- the following steps can be mentioned, but the steps are not limited to these steps.
- examples of the exposure step, the developing step, and other steps applicable to the method for manufacturing the circuit wiring include the steps described in paragraphs 0035 to 0051 of JP-A-2006-23696.
- a step of reducing the visible light reflectance described in paragraph 0172 of International Publication No. 2019/022089 a new step on the insulating film described in paragraph 0172 of International Publication No. 2019/022089. Examples thereof include a step of forming a conductive layer, but the process is not limited to these steps.
- the method for manufacturing a circuit wiring may include a step of reducing the visible light reflectance of a part or all of a plurality of conductive layers included in the substrate.
- the treatment for reducing the visible light reflectance include an oxidation treatment.
- the visible light reflectance of the conductive layer can be lowered by oxidizing copper to copper oxide and blackening the conductive layer.
- the treatment for reducing the visible light reflectance is described in paragraphs 0017 to 0025 of JP-A-2014-150118, and paragraphs 0041, 0042, 0048 and 0058 of JP-2013-206315. The contents of these publications are incorporated herein by reference.
- the method for manufacturing a circuit wiring preferably includes a step of forming an insulating film on the surface of the circuit wiring and a step of forming a new conductive layer on the surface of the insulating film.
- a second electrode pattern insulated from the first electrode pattern can be formed.
- the step of forming the insulating film is not particularly limited, and examples thereof include a known method of forming a permanent film.
- an insulating film having a desired pattern may be formed by photolithography using a photosensitive material having an insulating property.
- the step of forming the new conductive layer on the insulating film is not particularly limited, and for example, a new conductive layer having a desired pattern may be formed by photolithography using a photosensitive material having conductivity.
- a substrate having a plurality of conductive layers on both surfaces of the substrate is used, and the circuit is sequentially or simultaneously with respect to the conductive layers formed on both surfaces of the substrate. It is also preferable to form. With such a configuration, it is possible to form a circuit wiring for a touch panel in which a first conductive pattern is formed on one surface of a substrate and a second conductive pattern is formed on the other surface. It is also preferable to form the touch panel circuit wiring having such a configuration from both sides of the substrate by roll-to-roll.
- the circuit wiring manufactured by the method for manufacturing a circuit wiring according to an embodiment of the present disclosure can be applied to various devices.
- Examples of the device provided with the circuit wiring manufactured by the above manufacturing method include an input device, a touch panel is preferable, and a capacitance type touch panel is more preferable.
- the input device can be applied to a display device such as an organic EL display device and a liquid crystal display device.
- a transfer material including a temporary support and a photosensitive layer in contact with the temporary support is bonded to a substrate, and the photosensitive layer and the temporary support are placed on the substrate.
- the temporary support is peeled from the photosensitive layer (that is, the “peeling step"), and the photosensitive exposed by the peeling of the temporary support.
- the layer is exposed and developed to form a pattern (that is, a "pattern forming step"), and the substrate is etched in a region where the pattern is not arranged (that is, an "etching step”).
- the roughness Ra of the surface of the photosensitive layer exposed by peeling the temporary support from the photosensitive layer is 2 nm or more.
- each step in the touch panel manufacturing method and the embodiment such as the order in which each step is performed are described in the above-mentioned sections of "Manufacturing method of laminated body" and "Manufacturing method of circuit wiring". The same is true for the preferred embodiment.
- a known method for manufacturing the touch panel may be referred to, except that the wiring for the touch panel is formed by the above method.
- the touch panel manufacturing method may include any process (other process) other than those described above.
- FIGS. 2 and 3 show an example of a mask pattern used for manufacturing a touch panel.
- GR is a non-image part (light-shielding part)
- EX is an image part (exposure part)
- DL virtualizes a frame for alignment. It is shown as a target.
- a touch panel for example, by exposing a negative photosensitive layer through a mask having a pattern A shown in FIG. 2, a touch panel having a circuit wiring having a pattern A corresponding to EX can be manufactured. Specifically, it can be produced by the method shown in FIG. 1 of International Publication No. 2016/190405.
- the central portion (pattern portion where the qualifications are connected) of the exposed portion EX is the portion where the transparent electrode (touch panel electrode) is formed, and the peripheral portion (thin line portion) of the exposed portion EX is. This is the part where the wiring of the peripheral extraction part is formed.
- a touch panel having at least touch panel wiring is manufactured.
- the touch panel preferably has a transparent substrate, electrodes, and an insulating layer or a protective layer.
- Examples of the detection method on the touch panel include known methods such as a resistance film method, a capacitance method, an ultrasonic method, an electromagnetic induction method, and an optical method. Above all, the capacitance method is preferable.
- the touch panel type includes a so-called in-cell type (for example, those shown in FIGS. 5, 6, 7, and 8 of JP-A-2012-51751), and a so-called on-cell type (for example, JP-A-2013-168125).
- 2013-5472 (described in FIG. 2), various out-cell types (so-called GG, G1 / G2, GFF, GF2, GF1, G1F, etc.) and other configurations (for example, Japanese Patent Application Laid-Open No. 2013-164871).
- Examples of the touch panel include those described in paragraph 0229 of JP-A-2017-120435.
- the temporary support S-1 is a Lumirror 16QS62 manufactured by Toray Industries, Inc.
- Temporal support S-2 Polyethylene was melt-extruded and laminated on a polyethylene terephthalate (PET) film having a thickness of 16 ⁇ m so that the thickness of the polyethylene was 10 ⁇ m. In the laminating, a matted roll having a surface roughness Ra of 0.1 ⁇ m was pressed against the polyethylene layer. By the above procedure, a PET film with matted polyethylene was produced as the temporary support S-2.
- the roughness Ra of the first surface of the temporary support S-2 shown in Table 1 is a value measured on the surface of the polyethylene layer.
- Temporal support S-3 A temporary support S-3 was obtained by a method according to the method for manufacturing the temporary support S-2, except that the surface roughness Ra of the matted roll was changed to 0.2 ⁇ m.
- the roughness Ra of the first surface of the temporary support S-3 shown in Table 1 is a value measured on the surface of the polyethylene layer.
- the temporary support S-4 is a sand matte processed film type S manufactured by Kaisei Kogyo Co., Ltd.
- Temporal support S-5 is a sand matte processed film type A manufactured by Kaisei Kogyo Co., Ltd.
- A-1 Composition containing 30% by mass polymer A-1 produced by the method described below
- A-2 Composition containing 30% by mass polymer A-2 produced by the method described below.
- a composition containing 30% by mass of the polymer A-1 was obtained by the following method.
- the following abbreviations represent the following compounds, respectively.
- St Styrene (manufactured by Wako Pure Chemical Industries, Ltd.)
- MAA Methacrylic acid (manufactured by Fujifilm Wako Pure Chemical Industries, Ltd.)
- MMA Methyl methacrylate (manufactured by Fujifilm Wako Pure Chemical Industries, Ltd.)
- V-601 2,2'-azobis (isobutyric acid) dimethyl (manufactured by Fujifilm Wako Pure Chemical Industries, Ltd., polymerization initiator)
- PGMEA Propylene Glycol Monomethyl Ether Acetate
- PGMEA 116.5 parts by mass was placed in a three-necked flask, and the temperature was raised to 90 ° C. under a nitrogen atmosphere.
- St 52.0 parts by mass
- MMA (19.0 parts by mass)
- MAA 29.0 parts by mass
- V-601 3 parts by mass
- a mixed solution of 4.0 parts by mass) and PGMEA 116.5 parts by mass was added dropwise into a three-necked flask over 2 hours. After completion of the dropping, the mixture was stirred for 2 hours while maintaining the liquid temperature at 90 ° C. ⁇ 2 ° C. to obtain a composition containing 30% by mass of the polymer A-1.
- the properties of polymer A-1 are shown in the table below.
- a composition containing 30% by mass of the polymer A-2 was obtained by a method according to the method for synthesizing the polymer A-1, except that the amount of V-601 added was changed to 12.0 parts by mass.
- the properties of polymer A-2 are shown in the table below.
- B-1 NK Ester BPE-500 (2,2-bis (4- (methacryloxypentethoxy) phenyl) propane, manufactured by Shin Nakamura Chemical Industry Co., Ltd.)
- B-2 Aronix M-270 (polypropylene glycol diacrylate, manufactured by Toagosei Co., Ltd.)
- B-3 Sartomer SR-454 (epoxidized trimethylolpropane triacrylate, manufactured by Arkema)
- Example 1> (Preparation of transfer material)
- the photosensitive resin composition P-3 is applied onto the polyethylene layer of the temporary support S-2 so that the dry film thickness is 3.0 ⁇ m, dried in an oven at 100 ° C. for 2 minutes, and then polypropylene is used as a protective film.
- a film (Trefan # 30-2500H, 26 ⁇ m thick, manufactured by Toray Industries, Inc.) was laminated to prepare a transfer material.
- a copper layer having a thickness of 200 nm was prepared by sputtering on a polyethylene terephthalate (PET) film having a thickness of 100 ⁇ m, and a PET substrate with a copper layer was prepared.
- PET polyethylene terephthalate
- the transfer material was laminated on a PET substrate with a copper layer under laminating conditions of a linear pressure of 0.6 MPa and a linear velocity (laminating rate) of 0.5 m / min.
- the temporary support was peeled off.
- the photosensitive layer was allowed to stand for 30 minutes and then developed to form a resin pattern. Development was carried out by shower development for 40 seconds using a 1.0 mass% sodium carbonate aqueous solution at 28 ° C.
- Examples 2 to 9 and Comparative Examples 1 to 2 Transfer material, PET substrate with copper layer, resin pattern and circuit wiring pattern by the method according to the method of Example 1 except that the type of the temporary support and the type of the photosensitive resin composition were changed according to the description in Table 4. Was produced.
- the transfer material was laminated on a PET substrate with a copper layer under laminating conditions of a linear pressure of 0.6 MPa and a linear velocity (laminating speed) of 0.5 m / min.
- laminating speed 0.5 m / min.
- the photosensitive layer and the temporary support were arranged in this order on the copper layer of the PET substrate with a copper layer.
- the temporary support was peeled off, and the exposed photosensitive layer was brought into contact with a transparent soda glass (200 x 200 mm ⁇ ) having a thickness of 5 mm.
- the transfer material was laminated on a PET substrate with a copper layer under laminating conditions of a linear pressure of 0.6 MPa and a linear velocity (laminating rate) of 0.5 m / min.
- An ultrahigh pressure mercury lamp is used to irradiate light including g-line (436 nm), h-line (405 nm) and i-line (365 nm) with an exposure amount such that the line width after development of a 10 ⁇ m line-and-space pattern is 10 ⁇ m.
- the photosensitive layer was exposed through a mask. After allowing to stand for 30 minutes, it was developed.
- a resin pattern was prepared by using a 1.0 mass% sodium carbonate aqueous solution at 28 ° C. and performing shower development for 40 seconds. Wiring is performed by etching the laminate containing the resin pattern at 23 ° C.
- Table 4 shows that the slipperiness (static friction) in Examples 1 to 9 is superior to the slipperiness (static friction) in Comparative Examples 1 and 2.
- Table 4 shows that the slipperiness (dynamic friction) in Examples 1 to 9 is superior to the slipperiness (dynamic friction) in Comparative Examples 1 and 2.
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Abstract
Description
本開示の他の一実施形態は、優れた滑り性を有する感光層を含む転写材料を用いる積層体の製造方法を提供することを目的とする。
<1> 仮支持体と、上記仮支持体に接触する感光層と、を含み、上記感光層から上記仮支持体を剥離した場合に露出した上記感光層の表面の粗さRaが、2nm以上である、転写材料。
<2> 上記感光層から上記仮支持体を剥離した場合に露出した上記仮支持体の表面の粗さRaが、2nm以上である、<1>に記載の転写材料。
<3> 上記感光層から上記仮支持体を剥離した場合に露出した上記感光層の表面の粗さRaが、1,000nm以下である、<1>又は<2>に記載の転写材料。
<4> 上記感光層から上記仮支持体を剥離した場合に露出した上記仮支持体の表面の粗さRaが、1,000nm以下である、<1>~<3>のいずれか1つに記載の転写材料。
<5> 上記感光層から上記仮支持体を剥離した場合に露出した上記感光層の表面の静摩擦係数が、1.0以下である、<1>~<4>のいずれか1つに記載の転写材料。
<6> 上記感光層が、10,000以上の重量平均分子量を有する高分子化合物を含み、上記高分子化合物のガラス転移温度が、50℃以上である、<1>~<5>のいずれか1つに記載の転写材料。
<7> 上記感光層が、1,500以下の分子量を有する重合性化合物を含み、上記感光層に含まれる上記高分子化合物の質量に対する上記感光層に含まれる上記重合性化合物の質量の比率が、50%以下である、<6>に記載の転写材料。
<8> 上記重合性化合物が、2つ以上の重合性基を有する重合性化合物を含む、<7>に記載の転写材料。
<9> 上記重合性化合物が、2つ以上の重合性基を有する重合性化合物と、3つ以上の重合性基を有する重合性化合物と、を含む、<7>に記載の転写材料。
<10> 上記重合性化合物が、エトキシ化メタクリレート化合物である、<7>~<9>のいずれか1つに記載の転写材料。
<11> 上記感光層が、界面活性剤を含む、<1>~<10>のいずれか1つに記載の転写材料。
<12> 上記感光層の厚さが、5μm以下である、<1>~<11>のいずれか1つに記載の転写材料。
<13> 仮支持体及び上記仮支持体に接触する感光層を含む転写材料と基板とを貼り合わせ、上記基板の上に上記感光層及び上記仮支持体をこの順に配置することと、上記感光層から上記仮支持体を剥離することと、上記仮支持体の剥離により露出した上記感光層に対して露光処理及び現像処理を施し、パターンを形成することと、をこの順に含み、上記感光層から上記仮支持体を剥離することで露出した上記感光層の表面の粗さRaが、2nm以上である、積層体の製造方法。
<14> 上記感光層から上記仮支持体を剥離することで露出した上記感光層の表面の粗さRaが、1,000nm以下である、<13>に記載の積層体の製造方法。
<15> 上記露光処理が、上記感光層とフォトマスクとを接触させて上記感光層を露光することを含む、<13>又は<14>に記載の積層体の製造方法。
本開示の他の一実施形態によれば、優れた滑り性を有する感光層を含む転写材料を用いる積層体の製造方法が提供される。
本開示において「~」を用いて表される数値範囲は、「~」の前後に記載される数値を下限値及び上限値として含む範囲を意味する。
本開示において、「(メタ)アクリル」はアクリル及びメタクリルの双方、又は、いずれかを表し、「(メタ)アクリレート」はアクリレート及びメタクリレートの双方、又は、いずれかを表し、「(メタ)アクリロイル」はアクリロイル及びメタクリロイルの双方、又は、いずれかを表す。
本開示において組成物中の各成分の量は、組成物中に各成分に該当する物質が複数存在する場合、特に断らない限り、組成物中に存在する該当する複数の物質の合計量を意味する。
本開示において「工程」との語は、独立した工程だけでなく、他の工程と明確に区別できない場合であっても工程の所期の目的が達成されれば、本用語に含まれる。
本開示における基(原子団)の表記において、置換及び無置換を記していない表記は、置換基を有さないものと共に置換基を有するものをも包含するものである。例えば「アルキル基」とは、置換基を有さないアルキル基(無置換アルキル基)のみならず、置換基を有するアルキル基(置換アルキル基)をも包含するものである。
本開示において「露光」とは、特に断らない限り、光を用いた露光のみならず、電子線、イオンビーム等の粒子線を用いた描画も含む。また、露光に用いられる光としては、一般的に、水銀灯の輝線スペクトル、エキシマレーザに代表される遠紫外線、極紫外線(EUV光)、X線、電子線等の活性光線(活性エネルギー線)が挙げられる。
本開示における化学構造式は、水素原子を省略した簡略構造式で記載する場合もある。
本開示において、「質量%」と「重量%」とは同義であり、「質量部」と「重量部」とは同義である。
本開示において、2以上の好ましい態様の組み合わせは、より好ましい態様である。
本開示において、「透明」とは、波長400nm~700nmの可視光の平均透過率が、80%以上であることを意味し、90%以上であることが好ましい。
本開示において、可視光の平均透過率は、分光光度計を用いて測定される値であり、例えば、株式会社日立製作所製の分光光度計U-3310を用いて測定できる。
本開示における重量平均分子量(Mw)及び数平均分子量(Mn)は、特に断りのない限り、TSKgel GMHxL、TSKgel G4000HxL、TSKgel G2000HxL(何れも東ソー株式会社製の商品名)のカラムを使用したゲルパーミエーションクロマトグラフィ(GPC)分析装置により、溶剤THF(テトラヒドロフラン)、示差屈折計により検出し、標準物質としてポリスチレンを用いて換算した分子量である。
本開示において、特段の断りがない限り、金属元素の含有量は、誘導結合プラズマ(ICP:Inductively Coupled Plasma)分光分析装置を用いて測定した値である。
本開示において、特段の断りがない限り、屈折率は、波長550nmでエリプソメーターを用いて測定した値である。
本開示において、特段の断りがない限り、色相は、色差計(CR-221、ミノルタ株式会社製)を用いて測定した値である。
本開示において、「アルカリ可溶性」とは、液温が22℃である炭酸ナトリウムの1質量%水溶液100gへの溶解度が0.1g以上であることを意味する。
本開示において、「固形分」とは、溶剤を除いたすべての成分を意味する。
本開示において、転写材料が備える各層の層厚は、特に断りのない限り、転写材料の主面に対し垂直な方向の断面を走査型電子顕微鏡(SEM)により観察し、得られた観察画像に基づいて各層の厚みを任意の5点以上計測し、その平均値を算出することにより、測定される。
本開示の一実施形態に係る転写材料は、仮支持体と、上記仮支持体に接触する感光層と、を含み、上記感光層から上記仮支持体を剥離した場合に露出した上記感光層の表面の粗さRaが、2nm以上である。上記した実施形態によれば、優れた滑り性を有する感光層を含む転写材料が提供される。感光層の滑り性が向上する推定理由は、次のように考えられる。感光層から仮支持体を剥離した場合に露出した感光層の表面の粗さRaが2nm以上であると、感光層の表面で生じる摩擦が低減する。したがって、感光層の表面の滑り性が向上すると推察される。以下、転写材料について具体的に説明する。以下の説明では、転写材料において感光層を向く仮支持体の面を「仮支持体の第1面」といい、転写材料において仮支持体を向く感光層の面を「感光層の第1面」という場合がある。仮支持体の第1面は、感光層の第1面に対向する。
(1)「仮支持体/感光層/屈折率調整層/保護フィルム」
(2)「仮支持体/感光層/保護フィルム」
本開示の一実施形態に係る転写材料は、仮支持体を含む。仮支持体は、少なくとも感光層を支持し、かつ、剥離可能な支持体である。仮支持体は、感光層に接触している。転写材料において感光層を向く仮支持体の面、すなわち、仮支持体の第1面は、感光層に接触しており、感光層から仮支持体を剥離することで露出できる。
本開示の一実施形態に係る転写材料は、仮支持体に接触する感光層を含む。感光層は、例えば基板の上に転写された後、露光及び現像によってパターンを形成できる。転写材料において仮支持体を向く感光層の面、すなわち、感光層の第1面は、仮支持体に接触しており、感光層から仮支持体を剥離することで露出できる。
感光層から仮支持体を剥離した場合に露出した感光層の表面、すなわち、感光層の第1面の粗さRaは、2nm以上である。感光層の第1面の粗さRaが2nm以上であると、感光層の表面の滑り性が向上する。感光層の第1面の粗さRaは、10nm以上であることが好ましく、50nm以上であることがより好ましく、100nm以上であることが更に好ましい。感光層の第1面の粗さRaは、1,000nm以下であることが好ましく、500nm以下であることがより好ましく、200nm以下であることが更に好ましく、100nm以下であることが特に好ましい。感光層の第1面の粗さRaが1,000nm以下であると、感光層から形成されるパターンの直線性が向上する。感光層の滑り性及びパターンの直線性の観点から、感光層の第1面の粗さRaは、2nm~1,000nmであることが好ましく、50nm~500nmであることがより好ましく、100nm~200nmであることが更に好ましい。感光層の第1面の粗さRaは、「仮支持体」の項で説明した仮支持体の第1面の粗さRaの測定方法に準ずる方法によって測定される。
感光層から仮支持体を剥離した場合に露出した感光層の表面、すなわち、感光層の第1面の静摩擦係数は、2.0未満であることが好ましく、1.0以下であることがより好ましく、0.6以下であることが更に好ましい。感光層の第1面の静摩擦係数が2.0未満であると、感光層の表面の滑り性が向上する。例えば、感光層の第1面の静摩擦係数の低減は、仮支持体の剥離後の搬送過程において仮支持体の剥離によって露出した感光層が、露光マスク、そして、搬送ローラーといった搬送装置に付着することを抑制し、一時的に静止した搬送物を再び円滑に動かすことができる。感光層の第1面の静摩擦係数は、0.1以上であることが好ましく、0.2以上であることがより好ましく、0.3以上であることが更に好ましい。感光層の第1面の静摩擦係数が0.1以上であると、搬送ローラーといった搬送装置に対する保持力が向上し、蛇行及び巻きずれの発生が抑制される。感光層の第1面の静摩擦係数は、0.1以上2.0未満であることが好ましく、0.2~1.0であることがより好ましく、0.3~0.6であることが更に好ましい。
荷重:200g
接触面積:63mm×63mm
試験速度:100mm/分
感光層は、ネガ型感光層又はポジ型感光層であってもよい。感光層は、ネガ型感光層であることが好ましい。感光層がネガ型感光層である場合、形成されるパターンは硬化層に該当する。感光層がネガ型感光層である場合、ネガ型感光層は、樹脂、重合性化合物及び重合開始剤を含むことが好ましい。また、感光層がネガ型感光層である場合、樹脂の一部又は全部としてアルカリ可溶性樹脂が含まれることも好ましい。つまり、一態様において、感光層は、アルカリ可溶性樹脂を含む樹脂、重合性化合物及び重合開始剤を含むことが好ましい。感光層は、感光層の全質量に対し、10質量%~90質量%のアルカリ可溶性樹脂、5質量%~70質量%のエチレン性不飽和化合物及び0.01質量%~20質量%の光重合開始剤を含むことが好ましい。
感光層は、高分子化合物を含むことが好ましい。「高分子化合物」とは、5,000以上の重量平均分子量を有する化合物を意味する。高分子化合物の重量平均分子量は、10,000以上であることが好ましい。高分子化合物の重量平均分子量は、5,000~500,000であることが好ましく、10,000~500,000であることが好ましい。高分子化合物の重量平均分子量が大きくなると、感光層の硬さが増大する。感光層の硬さが増大すると、例えば、感光層の強度が増大する。また、感光層の表面の滑り性が向上する。
感光層は、アルカリ可溶性樹脂を含むことが好ましい。アルカリ可溶性樹脂としては、例えば、エッチングレジストに用いられる公知のアルカリ可溶性樹脂が好適に挙げられる。また、アルカリ可溶性樹脂は、バインダーポリマーであることが好ましい。アルカリ可溶性樹脂は、酸基を有するアルカリ可溶性樹脂であることが好ましい。アルカリ可溶性樹脂としては、後述する重合体Aが好ましい。
感光層は、アルカリ可溶性樹脂として重合体Aを含むことが好ましい。現像液による感光層の膨潤を抑制することにより、解像性がより優れる点から、重合体Aの酸価は、220mgKOH/g以下であることが好ましく、200mgKOH/g未満であることがより好ましく、190mgKOH/g未満であることが更に好ましい。重合体Aの酸価の下限は特に制限されない。現像性がより優れる点から、重合体Aの酸価は、60mgKOH/g以上であることが好ましく、120mgKOH/g以上であることがより好ましく、150mgKOH/g以上であることが更に好ましく、170mgKOH/g以上であることが特に好ましい。酸価は、試料1gを中和するのに必要な水酸化カリウムの質量[mg]であり、本開示においては、単位をmgKOH/gと記載する。酸価は、例えば、化合物中における酸基の平均含有量から算出できる。重合体Aの酸価は、重合体Aを構成する構成単位の種類及び酸基を含有する構成単位の含有量により調整すればよい。
感光層がネガ型感光層である場合、ネガ型感光層は、重合性基を有する重合性化合物を含むことが好ましい。本開示において、「重合性化合物」とは、後述する重合開始剤の作用を受けて重合する化合物であって、上述したアルカリ可溶性樹脂とは異なる化合物を意味する。重合性化合物の分子量は、1,500以下であることが好ましい。重合性化合物の分子量は、150以上であることが好ましい。
感光層がネガ型感光層である場合、ネガ型感光層は、重合開始剤を含むことが好ましい。重合開始剤は重合反応の形式に応じて選択され、例えば、熱重合開始剤、及び、光重合開始剤が挙げられる。また、重合開始剤としては、ラジカル重合開始剤、及び、カチオン重合開始剤が挙げられる。
光カチオン重合開始剤としては、pKaが4以下の酸を発生する光カチオン重合開始剤が好ましく、pKaが3以下の酸を発生する光カチオン重合開始剤がより好ましく、pKaが2以下の酸を発生する光カチオン重合開始剤が特に好ましい。pKaの下限値は特に定めないが、例えば、-10.0以上が好ましい。
感光層は、露光部及び非露光部の視認性、現像後のパターン視認性、及び、解像性の観点から、色素を含有することが好ましく、発色時の波長範囲400nm~780nmにおける極大吸収波長が450nm以上であり、かつ、酸、塩基、又はラジカルにより極大吸収波長が変化する色素(単に「色素N」ともいう。)を含有することがより好ましい。色素Nを含有すると、詳細なメカニズムは不明であるが、隣接する層(例えば仮支持体及び中間層)との密着性が向上し、解像性により優れる。
感光層は、露光部及び非露光部の視認性並びに解像性の観点から、色素Nとしてラジカルにより極大吸収波長が変化する色素、及び、光ラジカル重合開始剤の両者を含有することが好ましい。
また、露光部及び非露光部の視認性の観点から、色素Nは、酸、塩基、又はラジカルにより発色する色素であることが好ましい。
感光層は、得られる硬化膜の強度、及び、得られる未硬化膜の粘着性の観点から、熱架橋性化合物を含むことが好ましい。なお、本開示においては、後述するエチレン性不飽和基を有する熱架橋性化合物は、エチレン性不飽和化合物としては扱わず、熱架橋性化合物として扱うものとする。熱架橋性化合物としては、メチロール化合物、及びブロックイソシアネート化合物が挙げられる。中でも、得られる硬化膜の強度、及び、得られる未硬化膜の粘着性の観点から、ブロックイソシアネート化合物が好ましい。ブロックイソシアネート化合物は、ヒドロキシ基及びカルボキシ基と反応するため、例えば、アルカリ可溶性樹脂及び/又はエチレン性不飽和化合物等が、ヒドロキシ基及びカルボキシ基の少なくとも一方を有する場合には、形成される膜の親水性が下がり、感光層を硬化した膜を保護膜として使用する場合の機能が強化される傾向がある。なお、ブロックイソシアネート化合物とは、「イソシアネートのイソシアネート基をブロック剤で保護(いわゆる、マスク)した構造を有する化合物」を指す。
感光層は、上述したアルカリ可溶性樹脂、重合性化合物、重合開始剤、色素及び熱架橋性化合物以外の他の成分を含有してもよい。他の成分としては、例えば、ラジカル重合禁止剤、界面活性剤、増感剤、各種添加剤等が挙げられる。他の成分は、1種単独で使用してもよく、2種以上使用してもよい。
感光層は、ラジカル重合禁止剤を含んでもよい。ラジカル重合禁止剤としては、例えば、特許第4502784号公報の段落0018に記載された熱重合防止剤が挙げられる。中でも、フェノチアジン、フェノキサジン、又は4-メトキシフェノールが好ましい。その他のラジカル重合禁止剤としては、ナフチルアミン、塩化第一銅、ニトロソフェニルヒドロキシアミンアルミニウム塩、及びジフェニルニトロソアミン等が挙げられる。感光層の感度を損なわないために、ニトロソフェニルヒドロキシアミンアルミニウム塩をラジカル重合禁止剤として使用することが好ましい。
感光層は、界面活性剤を含むことが好ましい。界面活性剤としては、例えば、特許第4502784号公報の段落0017、及び、特開2009-237362号公報の段落0060~0071に記載の界面活性剤が挙げられる。また、界面活性剤としては、ノニオン系界面活性剤、フッ素系界面活性剤又はシリコーン系界面活性剤が好ましい。
感光層は、増感剤を含んでもよい。増感剤は、特に制限されず、公知の増感剤、染料及び顔料を使用できる。増感剤としては、例えば、ジアルキルアミノベンゾフェノン化合物、ピラゾリン化合物、アントラセン化合物、クマリン化合物、キサントン化合物、チオキサントン化合物、アクリドン化合物、オキサゾール化合物、ベンゾオキサゾール化合物、チアゾール化合物、ベンゾチアゾール化合物、トリアゾール化合物(例えば、1,2,4-トリアゾール)、スチルベン化合物、トリアジン化合物、チオフェン化合物、ナフタルイミド化合物、トリアリールアミン化合物、及びアミノアクリジン化合物が挙げられる。
感光層は、上記成分以外に、必要に応じて公知の添加剤を含有してもよい。添加剤としては、例えば、可塑剤、ヘテロ環状化合物、ベンゾトリアゾール類、カルボキシベンゾトリアゾール類、ピリジン類(イソニコチンアミド等)、プリン塩基(アデニン等)、及び、溶剤が挙げられる。感光層は、各添加剤を1種単独で含有してもよいし、2種以上を含有してもよい。
可塑剤及びヘテロ環状化合物としては、国際公開第2018/179640号の段落0097~0103及び0111~0118に記載された化合物が挙げられる。
感光層は、所定量の不純物を含んでいてもよい。不純物の具体例としては、ナトリウム、カリウム、マグネシウム、カルシウム、鉄、マンガン、銅、アルミニウム、チタン、クロム、コバルト、ニッケル、亜鉛、スズ、ハロゲン及びこれらのイオンが挙げられる。中でも、ハロゲン化物イオン、ナトリウムイオン、及びカリウムイオンは不純物として混入し易いため、下記の含有量にすることが好ましい。
感光層は、上述したアルカリ可溶性樹脂の各構成単位に対応する残存モノマーを含む場合がある。残存モノマーの含有量は、パターニング性、及び、信頼性の点から、アルカリ可溶性樹脂全質量に対して、5,000質量ppm以下が好ましく、2,000質量ppm以下がより好ましく、500質量ppm以下が更に好ましい。下限は特に制限されないが、1質量ppm以上が好ましく、10質量ppm以上がより好ましい。アルカリ可溶性樹脂の各構成単位の残存モノマーは、パターニング性、及び、信頼性の点から、感光層の全質量に対して、3,000質量ppm以下が好ましく、600質量ppm以下がより好ましく、100質量ppm以下が更に好ましい。下限は特に制限されないが、0.1質量ppm以上が好ましく、1質量ppm以上がより好ましい。
感光層の厚さは、現像性、及び、解像性の観点から、20μm以下であることが好ましく、10μm以下であることがより好ましく、8μm以下であることが更に好ましく、5μm以下であることが特に好ましく、1μm以上5μm以下であることが最も好ましい。感光層の厚さは、既述の仮支持体の厚さの算出方法に準ずる方法によって算出される。
感光層の形成方法は、上記の成分を含有する層を形成可能な方法であれば特に制限されない。感光層の形成方法としては、例えば、アルカリ可溶性樹脂、エチレン性不飽和化合物、光重合開始剤及び溶剤等を含有する感光性樹脂組成物を調製し、仮支持体等の表面に感光性樹脂組成物を塗布し、感光性樹脂組成物の塗膜を乾燥することにより形成する方法が挙げられる。感光層の第1面の粗さRaの制御の観点から、感光層は、仮支持体の表面に感光性樹脂組成物を塗布して形成されることが好ましい。感光性樹脂組成物の塗膜の乾燥方法としては、加熱乾燥及び減圧乾燥が好ましい。なお、本開示において、「乾燥」とは、組成物に含まれる溶剤の少なくとも一部を除去することを意味する。乾燥方法としては、例えば、自然乾燥、加熱乾燥、及び、減圧乾燥が挙げられる。上記した方法を単独で又は複数組み合わせて適用することができる。乾燥温度としては、80℃以上が好ましく、90℃以上がより好ましい。また、その上限値としては130℃以下が好ましく、120℃以下がより好ましい。温度を連続的に変化させて乾燥させることもできる。乾燥時間としては、20秒以上が好ましく、40秒以上がより好ましく、60秒以上が更に好ましい。また、その上限値としては特に制限されないが、600秒以下が好ましく、300秒以下がより好ましい。
本開示の一実施形態に係る転写材料は、仮支持体側とは反対側における最外層として、保護フィルムを含むことが好ましい。また、保護フィルムは、感光層の仮支持体に接触する面とは反対側の面に接触することが好ましい。
本開示の一実施形態に係る転写材料は、屈折率調整層(すなわち、コントラストエンハンスメント層)を含んでもよい。コントラストエンハンスメント層については、国際公開第2018/179640号の段落0134に記載されている。また、他の層については特開2014-85643号公報の段落0194~0196に記載されている。これらの公報の内容は本明細書に組み込まれる。
本開示の一実施形態に係る転写材料において、感光層を硬化した硬化膜の120℃における破断伸びが15%以上であり、仮支持体の感光層側の表面の算術平均粗さRaが50nm以下であり、保護フィルムの感光層側の表面の算術平均粗さRaが150nm以下であることが好ましい。
X×Y<1,500:式(R1)
ここで、上記式(R1)中、Xは、感光層を硬化した硬化膜の120℃における破断伸びの値(%)を表し、Yは、仮支持体の感光層側の表面の算術平均粗さRaの値(nm)を表す。X×Yは、750以下がより好ましい。
Y≦Z:式(R2)
ここで、上記式(R2)中、Yは、仮支持体の感光層側の表面の算術平均粗さRaの値(nm)を表し、Zは、保護フィルムの感光層側の表面の算術平均粗さRaの値(nm)を表す。
本開示に係る転写材料の製造方法は、特に制限されず、公知の製造方法、例えば、公知の各層の形成方法を用いることができる。以下、図1を参照しながら、本開示に係る転写材料の製造方法について説明する。ただし、本開示に係る転写材料は、図1に示す構成を有するものに制限されない。
本開示の一実施形態に係る積層体の製造方法は、仮支持体及び上記仮支持体に接触する感光層を含む転写材料と基板とを貼り合わせ、上記基板の上に上記感光層及び上記仮支持体をこの順に配置すること(以下、「貼り合わせ工程」という場合がある。)と、上記感光層から上記仮支持体を剥離すること(以下、「剥離工程」という場合がある。)と、上記仮支持体の剥離により露出した上記感光層に対して露光処理及び現像処理を施し、パターンを形成すること(以下、「パターン形成工程」という場合がある。)と、をこの順に含み、上記感光層から上記仮支持体を剥離することで露出した上記感光層の表面の粗さRaが、2nm以上である。本開示の一実施形態に係る積層体の製造方法では、転写材料として、上記「転写材料」の項で説明した転写材料が適用されることが好ましい。また、パターン形成工程において得られるパターンの少なくとも一部は、ラインアンドスペースパターンを含むことが好ましい。ラインアンドスペースパターンにおける少なくとも1組のライン及びスペースの幅は、合計で20μm以下であることが好ましい。
貼り合わせ工程では、仮支持体及び仮支持体に接触する感光層を含む転写材料と基板とを貼り合わせ、基板の上に感光層及び仮支持体をこの順に配置する。基板の表面に導電層が設けられている場合、転写材料と基板の導電層とを貼り合わせることが好ましい。転写材料と基板との貼り合わせは、転写材料と基板とを圧着させることを含むことが好ましい。転写材料と基板との密着性が向上するため、露光及び現像後のパターン形成された感光層は、導電層をエッチングする際のエッチングレジストとして好適に用いることができる。なお、転写材料が保護フィルムを備える場合は、保護フィルムを除去した後、貼り合わせればよい。
剥離工程では、感光層から仮支持体を剥離する。仮支持体の剥離方法は、制限されない。仮支持体の剥離では、特開2010-072589号公報の段落0161~段落0162に記載されたカバーフィルム剥離機構と同様の機構を使用できる。
パターン形成工程では、仮支持体の剥離により露出した感光層に対して露光処理及び現像処理を施し、パターンを形成する。現像処理は、通常、露光処理の後に実施される。
露光処理は、感光層をパターン露光することを含むことが好ましい。「パターン露光」とは、パターン状に露光する形態、すなわち、露光部と非露光部とが存在する形態の露光を指す。パターン露光における露光領域と未露光領域との位置関係は特に制限されず、適宜調整される。感光層は、基板が設けられた側とは反対側から露光されてもよいし、基板が設けられた側から露光されてもよい。
露光された感光層の現像は、現像液を用いて行うことができる。現像液としては、例えば、特開平5-72724号公報に記載の現像液等の公知の現像液が使用できる。現像液としては、pKa=7~13の化合物を0.05mol/L~5mol/Lの濃度で含むアルカリ水溶液系の現像液が好ましい。現像液は、水溶性の有機溶剤及び/又は界面活性剤を含有してもよい。アルカリ性水溶液に含まれ得るアルカリ性化合物としては、例えば、水酸化ナトリウム、水酸化カリウム、炭酸ナトリウム、炭酸カリウム、炭酸水素ナトリウム、炭酸水素カリウム、テトラメチルアンモニウムヒドロキシド、テトラエチルアンモニウムヒドロキシド、テトラプロピルアンモニウムヒドロキシド、テトラブチルアンモニウムヒドロキシド、及び、コリン(2-ヒドロキシエチルトリメチルアンモニウムヒドロキシド)が挙げられる。現像液としては、国際公開第2015/093271号の段落0194に記載の現像液も好ましく挙げられる。好適に用いられる現像方式としては、例えば、国際公開第2015/093271号の段落0195に記載の現像方式が挙げられる。
転写材料が保護フィルムを含む場合、積層体の製造方法は、転写材料から保護フィルムを剥離する工程を含むことが好ましい。保護フィルムを剥離する方法は、制限されず、公知の方法を適用することができる。
本開示の一実施形態に係る積層体の製造方法は、パターン形成工程によって得られたパターンを、露光する工程(ポスト露光工程)及び/又は加熱する工程(ポストベーク工程)を含んでもよい。積層体の製造方法がポスト露光工程及びポストベーク工程の両方を含む場合、ポスト露光の後、ポストベークを実施することが好ましい。ポスト露光の露光量は、100mJ/cm2~5,000mJ/cm2が好ましく、200mJ/cm2~3,000mJ/cm2がより好ましい。ポストベークの温度は、80℃~250℃が好ましく、90℃~160℃がより好ましい。ポストベークの時間は、1分~180分が好ましく、10分~60分がより好ましい。
本開示の一実施形態に係る積層体の製造方法は、上述した工程以外の任意の工程を含んでもよい。例えば、以下に示す回路配線の製造方法又はタッチパネルの製造方法に記載の工程等が挙げられるが、これらの工程に制限されない。
本開示の一実施形態に係る積層体の製造方法により製造される積層体は、種々の装置に適用することができる。積層体を備えた装置としては、例えば、入力装置等が挙げられ、タッチパネルであることが好ましく、静電容量型タッチパネルであることがより好ましい。また、入力装置は、有機エレクトロルミネッセンス表示装置、液晶表示装置等の表示装置に適用することができる。積層体がタッチパネルに適用される場合、形成されたパターンは、タッチパネル用電極又はタッチパネル用配線の保護膜として用いられることが好ましい。つまり、本開示に係る転写材料は、タッチパネル用電極保護膜又はタッチパネル用配線の形成に用いられることが好ましい。
本開示の一実施形態に係る回路配線の製造方法は、仮支持体及び仮支持体に接触する感光層を含む転写材料と基板とを貼り合わせ、上記基板の上に上記感光層及び上記仮支持体をこの順に配置すること(すなわち、「貼り合わせ工程」)と、上記感光層から上記仮支持体を剥離すること(すなわち、「剥離工程」)と、上記仮支持体の剥離により露出した上記感光層に対して露光処理及び現像処理を施し、パターンを形成すること(すなわち、「パターン形成工程」)と、上記パターンが配置されていない領域における上記基板をエッチング処理すること(以下、「エッチング工程」という場合がある。)と、をこの順に含み、上記感光層から上記仮支持体を剥離することで露出した上記感光層の表面の粗さRaが、2nm以上である。以下、回路配線の製造方法が含む各工程について説明するが、特に言及した場合を除き、積層体の製造方法に含まれる各工程について説明した内容は、回路配線の製造方法に含まれる各工程についても適用されるものとする。
エッチング工程では、パターンが配置されていない領域における基板をエッチング処理する。すなわち、エッチング工程では、感光層から形成されたパターンをエッチングレジストとして使用し、エッチング処理を行う。エッチング処理の方法としては、公知の方法を適用でき、例えば、特開2017-120435号公報の段落0209~段落0210に記載の方法、特開2010-152155号公報の段落0048~段落0054に記載の方法、エッチング液に浸漬するウェットエッチング法、及び、プラズマエッチング等のドライエッチングによる方法が挙げられる。
本開示の一実施形態に係る回路配線の製造方法は、残存するパターンを除去する工程(以下、「除去工程」という場合がある。)を含むことが好ましい。除去工程は、エッチング工程の後に行うことが好ましい。残存するパターンを除去する方法としては特に制限されないが、薬品処理により除去する方法が挙げられ、除去液を用いて除去する方法が好ましい。残存するパターンの除去方法としては、好ましくは30℃~80℃、より好ましくは50℃~80℃の液温を有する撹拌中の除去液に、残存するパターンを有する基板を、1分間~30分間浸漬する方法が挙げられる。
本開示の一実施形態に係る回路配線の製造方法は、上述した工程以外の任意の工程を含んでもよい。例えば、以下の工程が挙げられるが、これらの工程に制限されない。また、回路配線の製造方法に適用可能な露光工程、現像工程、及び他の工程としては、特開2006-23696号公報の段落0035~段落0051に記載の工程が挙げられる。さらに、他の工程としては、例えば、国際公開第2019/022089号の段落0172に記載の可視光線反射率を低下させる工程、国際公開第2019/022089号の段落0172に記載の絶縁膜上に新たな導電層を形成する工程等が挙げられるが、これらの工程に制限されない。
本開示の一実施形態に係る回路配線の製造方法は、基板が有する複数の導電層の一部又は全ての可視光線反射率を低下させる処理を行う工程を含んでいてもよい。可視光線反射率を低下させる処理としては、酸化処理が挙げられる。基板が銅を含有する導電層を有する場合、銅を酸化処理して酸化銅とし、導電層を黒化することにより、導電層の可視光線反射率を低下させることができる。可視光線反射率を低下させる処理については、特開2014-150118号公報の段落0017~段落0025、並びに、特開2013-206315号公報の段落0041、段落0042、段落0048及び段落0058に記載されており、これらの公報に記載の内容は本明細書に組み込まれる。
本開示の一実施形態に係る回路配線の製造方法は、回路配線の表面に絶縁膜を形成する工程と、絶縁膜の表面に新たな導電層を形成する工程と、を含むことも好ましい。上記の工程により、第一の電極パターンと絶縁した第二の電極パターンを形成することができる。絶縁膜を形成する工程としては、特に制限されず、公知の永久膜を形成する方法が挙げられる。また、絶縁性を有する感光性材料を用いて、フォトリソグラフィにより所望のパターンの絶縁膜を形成してもよい。絶縁膜上に新たな導電層を形成する工程は、特に制限されず、例えば、導電性を有する感光性材料を用いて、フォトリソグラフィにより所望のパターンの新たな導電層を形成してもよい。
本開示の一実施形態に係る回路配線の製造方法により製造される回路配線は、種々の装置に適用することができる。上記の製造方法により製造される回路配線を備えた装置としては、例えば、入力装置が挙げられ、タッチパネルが好ましく、静電容量型タッチパネルがより好ましい。また、上記入力装置は、有機EL表示装置及び液晶表示装置等の表示装置に適用できる。
本開示の一実施形態に係るタッチパネルの製造方法は、仮支持体及び仮支持体に接触する感光層を含む転写材料と基板とを貼り合わせ、上記基板の上に上記感光層及び上記仮支持体をこの順に配置すること(すなわち、「貼り合わせ工程」)と、上記感光層から上記仮支持体を剥離すること(すなわち、「剥離工程」)と、上記仮支持体の剥離により露出した上記感光層に対して露光処理及び現像処理を施し、パターンを形成すること(すなわち、「パターン形成工程」)と、上記パターンが配置されていない領域における上記基板をエッチング処理すること(すなわち、「エッチング工程」)と、をこの順に含み、上記感光層から上記仮支持体を剥離することで露出した上記感光層の表面の粗さRaが、2nm以上である。
以下の表に示す仮支持体を準備した。
仮支持体S-1は、東レ株式会社製のルミラー16QS62である。
厚さ16μmのポリエチレンテレフタレート(PET)フィルム上に、ポリエチレンの厚みが10μmになるようにポリエチレンを溶融押し出しラミネートした。ラミネートでは、表面粗さRaが0.1μmのマット化ロールをポリエチレン層に押し付けた。以上の手順によって、仮支持体S-2としてマット化ポリエチレン付きPETフィルムを作製した。表1に記載された仮支持体S-2の第1面の粗さRaは、ポリエチレン層の表面で測定された値である。
マット化ロールの表面粗さRaを0.2μmに変更したこと以外は、仮支持体S-2の製造方法に準ずる方法によって仮支持体S-3を得た。表1に記載された仮支持体S-3の第1面の粗さRaは、ポリエチレン層の表面で測定された値である。
仮支持体S-4は、開成工業株式会社製のサンドマット加工フィルムタイプSである。
仮支持体S-5は、開成工業株式会社製のサンドマット加工フィルムタイプAである。
以下の表に示す成分を混合して感光性樹脂組成物を調製した。
・A-1:後述する方法によって製造された30質量%の重合体A-1を含む組成物
・A-2:後述する方法によって製造された30質量%の重合体A-2を含む組成物
以下の方法によって、30質量%の重合体A-1を含む組成物を得た。以下の方法において、以下の略語は以下の化合物をそれぞれ表す。
St:スチレン(富士フイルム和光純薬株式会社製)
MAA:メタクリル酸(富士フイルム和光純薬株式会社製)
MMA:メタクリル酸メチル(富士フイルム和光純薬株式会社製)
V-601:2,2’-アゾビス(イソ酪酸)ジメチル(富士フイルム和光純薬株式会社製、重合開始剤)
PGMEA:プロピレングリコールモノメチルエーテルアセテート
V-601の添加量を12.0質量部に変更したこと以外は、重合体A-1の合成方法に準ずる方法によって、30質量%の重合体A-2を含む組成物を得た。重合体A-2の性質を以下の表に示す。
・B-1:NKエステルBPE-500(2,2-ビス(4-(メタクリロキシペンタエトキシ)フェニル)プロパン、新中村化学工業株式会社製)
・B-2:アロニックスM-270(ポリプロピレングリコールジアクリレート、東亞合成株式会社製)
・B-3:サートマーSR-454(エポキシ化トリメチロールプロパントリアクリレート、アルケマ社製)
・B-CIM(光ラジカル重合開始剤、2-(2-クロロフェニル)-4,5-ジフェニルイミダゾール二量体、Hampford社製)
・SB-PI 701(4,4’-ビス(ジエチルアミノ)ベンゾフェノン、三洋貿易株式会社販売)
・LCV(ロイコクリスタルバイオレット、東京化成工業株式会社製、ラジカルにより発色する色素)
・N-フェニルグリシン(東京化成工業株式会社製)
・CBT-1(カルボキシベンゾトリアゾール、城北化学工業株式会社製)
・TDP-G(フェノチアジン、川口化学工業株式会社製)
・フェニドン(東京化成工業株式会社製)
・メガファックF-552(フッ素系界面活性剤、DIC株式会社製)
・MEK-ST-40(メチルエチルケトン分散シリカゾル、日産化学株式会社製)
・メチルエチルケトン(三協化学株式会社製)
・PGMEA(プロピレングリコールモノメチルエーテルアセテート、昭和電工株式会社製)
(転写材料の作製)
仮支持体S-2のポリエチレン層の上に感光性樹脂組成物P-3を乾燥膜厚が3.0μmとなるように塗布し、100℃のオーブンで2分間乾燥させ、更に保護フィルムとしてポリプロピレン製フィルム(トレファン#30-2500H、26μm厚、東レ株式会社製)をラミネートし、転写材料を作製した。
厚さ100μmのポリエチレンテレフタレート(PET)フィルム上に、スパッタリングによって厚さ200nmの銅層を作製し、銅層付きPET基板を作製した。
保護フィルムを剥離した後、転写材料を、線圧0.6MPa、線速度(ラミネート速度)0.5m/分のラミネート条件で銅層付きPET基板にラミネートした。仮支持体を剥離した。露出した感光層と線幅3μm~20μmのラインアンドスペースのパターン(Duty比=1:1)を有するガラス製マスクとを、露光位置(アライメント)を調整しながら接触させ、マスクを介して超高圧水銀灯で感光層を露光後、30分間静置した後に現像し、樹脂パターンを形成した。現像は、28℃の1.0質量%炭酸ナトリウム水溶液を用い、シャワー現像で40秒行った。以上の手順によって、樹脂パターンを含む積層体を得た。
銅エッチング液(Cu-02、関東化学株式会社製)を用いて、樹脂パターンを含む積層体を23℃で30秒間エッチングし、4質量%水酸化ナトリウム溶液を用いてレジスト剥離を行うことで回路配線パターンを作製した。実施例1において得られた回路配線パターンを顕微鏡で観察したところ、剥がれ及び欠けは無く、きれいなパターンであった。
表4の記載に従って仮支持体の種類及び感光性樹脂組成物の種類を変更したこと以外は、実施例1の方法に準ずる方法によって、転写材料、銅層付きPET基板、樹脂パターン及び回路配線パターンを作製した。
保護フィルムを剥離した後、転写材料を、線圧0.6MPa、線速(ラミネート速度)0.5m/分のラミネート条件で銅層付きPET基板にラミネートした。銅層付きPET基板への転写材料のラミネートにより、銅層付きPET基板の銅層の上に、感光層及び仮支持体をこの順に配置した。仮支持体を剥離し、露出した感光層と5mmの厚さを有する透明ソーダガラス(200x200mm□)とを接触させた。テンシロン万能材料試験機(RTF1210、株式会社エー・アンド・デイ製)及びプラスチック摩擦係数治具(J-PZ2-50N、株式会社エー・アンド・デイ製)を用いて、プラスチック-フィルム及びシート摩擦係数試験方法(JIS K7125:1999)により静摩擦係数及び動摩擦係数を測定した。試験条件を以下に示し、測定結果を表4に示す。
荷重:200g
接触面積:63mm×63mm
試験速度:100mm/分
静摩擦係数に基づいて、以下の基準に従って滑り性を評価した。評価結果を表4に示す。
5:0.4未満
4:0.4以上0.6未満
3:0.6以上1.0未満
2:1.0以上2.0未満
1:2.0以上又は測定不可
動摩擦係数に基づいて、以下の基準に従って滑り性を評価した。評価結果を表4に示す。
5:0.3未満
4:0.3以上0.45未満
3:0.45以上0.75未満
2:0.75以上1.5未満
1:1.5以上又は測定不可
保護フィルムを剥離した後、転写材料を、線圧0.6MPa、線速度(ラミネート速度)0.5m/分のラミネート条件で銅層付きPET基板にラミネートした。仮支持体を剥離し、転写材料の感光層と線幅10μmのラインアンドスペースのパターン(Duty比=1:1)を有するガラス製マスクとを接触させた。10μmのラインアンドスペースのパターンの現像後の線幅が10μmとなる露光量で、超高圧水銀灯を用いてg線(436nm)、h線(405nm)及びi線(365nm)を含む光を照射し、マスクを介して感光層を露光した。30分静置した後に現像した。現像では、28℃の1.0質量%炭酸ナトリウム水溶液を用い、シャワー現像で40秒行うことで樹脂パターンを作製した。銅エッチング液(Cu-02、関東化学株式会社製)を用いて、樹脂パターンを含む積層体を23℃で30秒間エッチングし、4質量%水酸化ナトリウム溶液を用いてレジスト剥離を行うことで配線パターンを作製した。配線パターンの線幅を100点測定し、LWR(すなわち、線幅の標準偏差)を算出した。LWRに基づいて、以下の基準に従って配線の直線性を評価した。評価結果を表4に示す。以下に示す基準1~5の数値が大きいほど配線パターンの直線性が優れる。
5:150nm未満
4:150nm以上200nm未満
3:200nm以上300nm未満
2:300nm以上500nm未満
1:500nm以上
20:感光層
30:保護フィルム
100:転写材料
GR:遮光部(非画像部)
EX:露光部(画像部)
DL:アライメント合せの枠
Claims (15)
- 仮支持体と、前記仮支持体に接触する感光層と、を含み、
前記感光層から前記仮支持体を剥離した場合に露出した前記感光層の表面の粗さRaが、2nm以上である、
転写材料。 - 前記感光層から前記仮支持体を剥離した場合に露出した前記仮支持体の表面の粗さRaが、2nm以上である、請求項1に記載の転写材料。
- 前記感光層から前記仮支持体を剥離した場合に露出した前記感光層の表面の粗さRaが、1,000nm以下である、請求項1又は請求項2に記載の転写材料。
- 前記感光層から前記仮支持体を剥離した場合に露出した前記仮支持体の表面の粗さRaが、1,000nm以下である、請求項1~請求項3のいずれか1項に記載の転写材料。
- 前記感光層から前記仮支持体を剥離した場合に露出した前記感光層の表面の静摩擦係数が、1.0以下である、請求項1~請求項4のいずれか1項に記載の転写材料。
- 前記感光層が、10,000以上の重量平均分子量を有する高分子化合物を含み、前記高分子化合物のガラス転移温度が、50℃以上である、請求項1~請求項5のいずれか1項に記載の転写材料。
- 前記感光層が、1,500以下の分子量を有する重合性化合物を含み、前記感光層に含まれる前記高分子化合物の質量に対する前記感光層に含まれる前記重合性化合物の質量の比率が、50%以下である、請求項6に記載の転写材料。
- 前記重合性化合物が、2つ以上の重合性基を有する重合性化合物を含む、請求項7に記載の転写材料。
- 前記重合性化合物が、2つ以上の重合性基を有する重合性化合物と、3つ以上の重合性基を有する重合性化合物と、を含む、請求項7に記載の転写材料。
- 前記重合性化合物が、エトキシ化メタクリレート化合物である、請求項7~請求項9のいずれか1項に記載の転写材料。
- 前記感光層が、界面活性剤を含む、請求項1~請求項10のいずれか1項に記載の転写材料。
- 前記感光層の厚さが、5μm以下である、請求項1~請求項11のいずれか1項に記載の転写材料。
- 仮支持体及び前記仮支持体に接触する感光層を含む転写材料と基板とを貼り合わせ、前記基板の上に前記感光層及び前記仮支持体をこの順に配置することと、
前記感光層から前記仮支持体を剥離することと、
前記仮支持体の剥離により露出した前記感光層に対して露光処理及び現像処理を施し、パターンを形成することと、をこの順に含み、
前記感光層から前記仮支持体を剥離することで露出した前記感光層の表面の粗さRaが、2nm以上である、
積層体の製造方法。 - 前記感光層から前記仮支持体を剥離することで露出した前記感光層の表面の粗さRaが、1,000nm以下である、請求項13に記載の積層体の製造方法。
- 前記露光処理が、前記感光層とフォトマスクとを接触させて前記感光層を露光することを含む、請求項13又は請求項14に記載の積層体の製造方法。
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JP2017191336A (ja) * | 2014-06-30 | 2017-10-19 | 太陽インキ製造株式会社 | 感光性ドライフィルムおよびそれを用いたプリント配線板の製造方法 |
JP2019061224A (ja) * | 2017-09-26 | 2019-04-18 | 旭化成株式会社 | 感光性樹脂フィルム積層体 |
WO2019221012A1 (ja) * | 2018-05-16 | 2019-11-21 | 日立化成株式会社 | 感光性フィルム及び永久マスクレジストの形成方法 |
JP2020076961A (ja) * | 2014-04-25 | 2020-05-21 | 日立化成株式会社 | 感光性エレメント、積層体、永久マスクレジスト及びその製造方法並びに半導体パッケージの製造方法 |
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JP2020076961A (ja) * | 2014-04-25 | 2020-05-21 | 日立化成株式会社 | 感光性エレメント、積層体、永久マスクレジスト及びその製造方法並びに半導体パッケージの製造方法 |
JP2017191336A (ja) * | 2014-06-30 | 2017-10-19 | 太陽インキ製造株式会社 | 感光性ドライフィルムおよびそれを用いたプリント配線板の製造方法 |
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