WO2022105431A1

WO2022105431A1 - Built-in capacitor detection method and apparatus, detection device, and storage medium

Info

Publication number: WO2022105431A1
Application number: PCT/CN2021/120914
Authority: WO
Inventors: 赵旭; 董亚明
Original assignee: 苏州华兴源创科技股份有限公司
Priority date: 2020-11-18
Filing date: 2021-09-27
Publication date: 2022-05-27
Also published as: CN112485640A; JP2023545138A; KR20230056773A; CN112485640B

Abstract

Disclosed in embodiments of the present invention are a built-in capacitor detection method and apparatus, a detection device, and a storage medium. The method comprises: obtaining charging current values of test channels, built-in capacitors of chips to be detected being connected to at least one test channel by means of pins of said chips; respectively controlling the test channels to charge the connected built-in capacitors by using corresponding charging current values, and obtaining detection voltage values of the built-in capacitors; and determining, according to the charging current values and the detection voltage values, whether the built-in capacitors in said chips are correctly mounted, and generating a detection result. In the embodiments of the present invention, by using the technical solutions, the time consumed for detecting the built-in capacitors of said chips can be shortened, and the detection efficiency of the built-in capacitors can be improved, thereby implementing the detection of the built-in capacitors of said chips in a mass production stage.

Description

Detection method, device, detection device and storage medium of built-in capacitor

technical field

The present invention relates to the technical field of detection, and in particular, to a detection method, device, detection device and storage medium of a built-in capacitor.

Background technique

At present, the external pins of most chips are connected with capacitors inside the chip to achieve the filtering performance of the chip pins.

In order to ensure that no capacitors are missed or incorrectly attached during the production process of the chip, the built-in capacitors corresponding to the chip pins need to be tested according to the chip design drawing. Existing capacitor testing technologies mostly use oscillating circuits, and the size of the capacitor is obtained by measuring the resonant frequency, and then it is judged whether the built-in capacitor of the chip is correctly pasted.

However, the single-time detection of the built-in capacitor of the chip takes a long time, and the cost is high, and the built-in capacitor detection in the stage of mass production of the chip cannot be realized.

SUMMARY OF THE INVENTION

In view of this, embodiments of the present invention provide a detection method, device, detection device, and storage medium for a built-in capacitor, so as to realize the built-in capacitor detection in the stage of chip mass production.

In a first aspect, an embodiment of the present invention provides a method for detecting a built-in capacitor, including:

acquiring the charging current value of each channel to be detected, wherein the built-in capacitor of the chip to be detected is connected to at least one channel to be detected through the pins of the chip to be detected;

Control each channel to be detected separately to charge the connected built-in capacitor with the corresponding charging current value, and obtain the detected voltage value of each built-in capacitor;

According to each charging current value and each detection voltage value, it is determined whether each built-in capacitor of the to-be-detected chip is correctly installed, and a detection result is generated.

In a second aspect, an embodiment of the present invention provides a detection device with a built-in capacitor, including:

a current acquisition module for acquiring the charging current value of each channel to be detected, wherein the built-in capacitor of the chip to be detected is connected to at least one channel to be detected through the pins of the chip to be detected;

The voltage detection module is used to separately control each channel to be detected to charge the connected built-in capacitor with the corresponding charging current value, and obtain the detected voltage value of each built-in capacitor;

The result generating module is configured to determine whether each built-in capacitor of the to-be-detected chip is correctly installed according to each charging current value and each detection voltage value, and generate a detection result.

In a third aspect, an embodiment of the present invention provides a detection device, including:

one or more processors;

memory for storing one or more programs,

When the one or more programs are executed by the one or more processors, the one or more processors implement the method for detecting a built-in capacitor according to the embodiment of the present invention.

In a fourth aspect, an embodiment of the present invention further provides a computer-readable storage medium storing a computer program thereon, and when the program is executed by a processor, the method for detecting a built-in capacitor according to the embodiment of the present invention is implemented.

In the above technical solution for detecting built-in capacitors, the charging current values of the channels to be detected to which the built-in capacitors of the chips to be detected are connected through the pins of the chips to be detected are obtained, and the charging current values of the channels to be detected are respectively used to transfer the charging current values of the channels to be detected to the corresponding channels to be detected. The built-in capacitor connected to the channel is charged, and the detection voltage value of each built-in capacitor is obtained, and then according to the charging current value and charging voltage value of each built-in capacitor, it is determined whether each built-in capacitor of the chip to be tested is correctly installed, and the detection result is generated. By adopting the above technical solution, the embodiment of the present invention can detect the capacitance value of the built-in capacitor without using an oscillation circuit, and can realize the parallel detection of each built-in capacitor of the built-in to-be-detected chip, which can shorten the time spent in detecting the built-in capacitor of the to-be-detected chip. The detection efficiency of the built-in capacitor is improved, so as to realize the built-in capacitor detection in the mass production stage of the chip to be tested.

Description of drawings

Other features, objects and advantages of the present invention will become more apparent by reading the detailed description of non-limiting embodiments made with reference to the following drawings:

1 is a schematic flowchart of a method for detecting a built-in capacitor according to Embodiment 1 of the present invention;

2 is a schematic flowchart of a method for detecting a built-in capacitor according to Embodiment 2 of the present invention;

3 is a structural block diagram of a detection device with a built-in capacitor provided in Embodiment 3 of the present invention;

FIG. 4 is a schematic structural diagram of a detection device according to Embodiment 4 of the present invention.

Detailed ways

The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention. In addition, it should be noted that, for the convenience of description, the drawings only show some but not all of the contents related to the present invention. Furthermore, the embodiments of the invention and the features of the embodiments may be combined with each other without conflict.

Example 1

Embodiment 1 of the present invention provides a detection method for a built-in capacitor. The method can be performed by a detection device with a built-in capacitor, wherein the device can be implemented by software and/or hardware, can be integrated into a detection device, and is suitable for a scenario where the built-in capacitor of a chip is detected. FIG. 1 is a schematic flowchart of a method for detecting a built-in capacitor according to Embodiment 1 of the present invention. As shown in FIG. 1 , the detection method for a built-in capacitor provided in this embodiment may include:

S110. Acquire the charging current value of each channel to be detected, wherein the built-in capacitor of the chip to be detected is connected to at least one channel to be detected through the pins of the chip to be detected.

The charging current value can be understood as the current value of the current that each test channel needs to input to the built-in capacitor connected to the built-in capacitor when the built-in capacitor is detected. The chip to be tested can be understood as a chip whose built-in capacitor needs to be tested, such as a chip obtained by mass production. The channel to be detected can be the detection channel that needs to be turned on for this detection. Different channels to be detected are connected to different pins of the chip to be detected. The pins connected to each channel to be detected can be the pins of the same chip to be detected, or they can be different. The pins of the chip to be tested, that is, the testing equipment can test the built-in capacitors of only one chip to be tested at a time, or can test the built-in capacitors of different chips to be tested, depending on the actual testing requirements and the needs of the chips to be tested The number of built-in capacitors depends on the number of built-in capacitors. For example, when the number of chips to be tested is large, and the number of built-in capacitors to be tested for each chip to be tested is small (for example, no more than 180), multiple The chips are tested; when the number of chips to be tested to be tested is small or the number of built-in capacitors to be tested for each chip to be tested is large (eg more than 300), only one chip to be tested can be tested at a time.

In this embodiment, the detection device may be provided with multiple detection channels. For example, the number of detection channels may be greater than 100 or 200. For another example, the detection device may be provided with 360 detection channels; When each built-in capacitor is detected, the pin connected to each built-in capacitor can be connected to one or two detection channels of the detection device. For example, when one end of the built-in capacitor is grounded, the pin connected to the other end of the built-in capacitor can be connected. The pin is connected to a detection channel of the detection device; when both ends of the built-in capacitor are not grounded, the pin connected to one end of the built-in capacitor can be connected to a detection channel of the detection device, and the pin connected to the other end of the built-in capacitor can be connected to a detection channel of the detection device. The pin is connected to another detection channel of the detection device. The following description is given by taking an example where one end of the built-in capacitor is grounded.

In one embodiment, the charging current value of each channel to be detected can be set by the testing personnel, for example, each built-in capacitor that needs to be detected on the chip to be detected is connected to different testing channels of the testing device through the pins connected to the built-in capacitors After that, the inspector can set the channel to be detected that needs to be turned on this time (that is to be charged this time) and the charging current value of each channel to be detected through the host computer, that is, the inspector can input the charging current of each channel through the host computer. value, the upper computer obtains the detection current value input by the inspection personnel, and writes it into the memory configured by the inspection equipment. Wherein, the memory of the detection device can be any type of memory, preferably a double-rate (Double Data Rate) synchronous dynamic random access memory, the memory can be physically connected with the processor of the detection device, and the processor of the detection device can be field programmable Logic Gate Array (Field Programmable Gate Array, FPGA).

In another embodiment, the charging current value of each channel to be detected can be calculated by the detection device. At this time, preferably, the acquiring the charging current value of each channel to be detected includes: acquiring capacitor parameters of the built-in capacitors connected to each channel to be detected, the capacitor parameters including theoretical capacitance value, charging current threshold value and detection voltage threshold value ; Determine the charging current value of each channel to be detected according to the preset detection time and the capacitor parameters.

Among them, the capacitor parameters can include the theoretical capacitance value of the built-in capacitor, the charging current threshold value and the detection voltage value. The theoretical capacitance value can be understood as the theoretical value of the capacitance of the built-in capacitor, and the charging current threshold value can be understood as the current threshold value when the built-in capacitor is working normally. It can include the maximum current threshold and the minimum current threshold. The detection voltage threshold can be understood as the voltage value that the capacitor needs to rise to at least during this detection process. The capacitor parameters of each built-in capacitor can be input by the testing personnel into the host computer. The detection time range can be understood as the detection time of the current detection, which can be a preset time value or a preset time range. The following takes the detection time as the preset time value as an example for description.

In the above-mentioned embodiment, the testing personnel can set the current testing time. Correspondingly, the testing equipment can control the voltage value of each built-in capacitor to rise to an appropriate voltage value within the testing time for testing, so as to reach the testing time. During the detection time, the detection of each built-in capacitor is completed, so that each built-in capacitor can complete the detection synchronously as much as possible during the same detection, and reduce the waiting time of the testing personnel.

Exemplarily, the inspector can set the channels to be inspected that need to be opened this time and the connection relationship between each channel to be inspected and the built-in capacitors of the chips to be inspected before inspecting the chips to be inspected in this batch production, and move upward. Input the capacitor parameters and detection time of each built-in capacitor of the chip to be detected in the host computer; correspondingly, the host computer can input the identification information of the channel to be detected that needs to be opened this time, and the built-in capacitor connected to each channel to be detected. The capacitor parameters and detection time are written into the detection device; thus, the detection device can determine the channels to be detected that need to be opened according to the identification information written by the host computer, and according to the detection time written by the host computer and the channels connected to the channels to be detected The capacitor parameter of the built-in capacitor determines the charging current value of the detection channel. For example, the charging current value of each channel to be detected can be calculated based on the formula i ₀ =C ₀ ×u ₀ /t ₀ , where i ₀ is the charging current value of the channel to be detected Current value, C ₀ is the theoretical capacitance value of the built-in capacitor connected to the channel to be detected, u ₀ is the detection voltage value of the built-in capacitor connected to the channel to be detected, and t ₀ is the detection time.

When the host computer writes the identification information of the channel to be detected that needs to be opened this time entered by the inspector into the inspection device, for example, the inspection device may be provided with a device for recording the inspection channel that needs to be opened and the inspection channel that does not need to be opened. Channel register, each bit in the channel register corresponds to a detection channel, a bit of 1 indicates that the corresponding detection channel needs to be turned on during detection, and a bit of 0 indicates that the corresponding detection channel does not need to be turned on during detection. Therefore, the upper The computer can set the corresponding bit in the channel register of the channel to be detected that needs to be turned on this time to 1, and set the bit corresponding to the channel to be detected that needs to be turned on this time in the channel register to 0.

It is understandable that the tester usually considers the charging current threshold of the built-in capacitor when setting the test time, that is, the test time set by the tester generally does not cause the actual charging current of the built-in capacitor to be within the range of the charging current during normal operation. In addition, therefore, in this embodiment, when determining the charging current value of each channel to be detected, the charging current threshold value of each built-in capacitor may not be considered, and the charging current threshold value of each built-in capacitor may be determined only according to the preset detection time and the theoretical capacitance value of the built-in capacitor. The charging current value, at this time, correspondingly, the capacitor parameter may only include the theoretical capacitance value and the detection voltage threshold value.

S120 , respectively controlling each channel to be detected to charge the connected built-in capacitor with a corresponding charging current value, and acquiring the detected voltage value of each built-in capacitor.

The detection voltage value of the built-in capacitor can be understood as the voltage value of the built-in capacitor detected during the charging process.

In this embodiment, the detection device can detect the detection capacitance of the built-in capacitor connected to each channel to be detected in parallel, such as controlling the charging device provided in each channel to be detected for charging the built-in capacitor with the charging of the channel to be detected to which it belongs. The current value charges the built-in capacitor connected to the to-be-detected channel to which it belongs, and controls the detection device set in each to-be-detected channel to detect the detection voltage value of the to-be-detected channel to which it belongs.

In one embodiment, the charging device set in the channel to be detected may be a parameter measurement unit (Parametric Measurement Unit, PMU), and the detection device set in the channel to be detected may be an analog-to-digital conversion (Analogue to Digital Conversion, ADC) chip, Correspondingly, the separately controlling each channel to be detected uses the corresponding charging current value to charge the connected built-in capacitor, and acquiring the detected voltage value of each built-in capacitor includes: for each channel to be detected, controlling the channel to be detected The parameter measurement unit inside uses the target current to charge the built-in capacitor connected to the channel to be detected, and periodically detects the detected voltage value of the built-in capacitor through the analog-to-digital conversion chip in the channel to be detected; wherein, the The current value of the target current is the charging current value of the built-in capacitor connected to the channel to be detected.

In the above embodiment, each detection channel of the detection device may be provided with a parameter measurement unit and an analog-to-digital conversion chip, and the parameter measurement unit in a certain channel to be detected may be respectively associated with the analog-to-digital conversion chip in the channel to be detected to which it belongs. The pins of the detection chip are connected to the processor of the detection device; the analog-to-digital conversion chip in a certain channel to be detected can be respectively connected to the pins of the to-be-detected chip and the processor of the detection device.

Exemplarily, the processor of the detection device may simultaneously send a charging instruction to the parameter measurement unit in each channel to be detected for controlling the parameter measurement unit to charge the built-in capacitor connected to the channel to be detected according to the charging current value of the corresponding channel to be detected. Correspondingly, after receiving the charging command sent by the processor, the parameter measurement unit in each channel to be detected can charge the built-in capacitor connected to the channel to be detected to which it belongs according to the charging current value corresponding to the charging command.

In this embodiment, each channel to be detected can continue to charge the built-in capacitor connected to it until the built-in capacitor reaches the maximum power that it can hold or receives a stop charging instruction sent by the processor; When the preset timeout time is reached, the charging to the built-in capacitor connected thereto is stopped. At this time, preferably, the detection method for the built-in capacitor provided in this embodiment may further include: when the charging time of each built-in capacitor reaches the preset timeout When the time is up, control each channel to be detected to stop charging the connected built-in capacitor. Among them, the timeout time can be set by the testing personnel or calculated by the testing equipment according to the testing time set by the testing personnel, such as setting the timeout time to a set multiple (such as 3 times) of the testing time; When the size or quantity of the detection voltage value detected by the detection channel has been able to determine whether the built-in capacitor connected to the channel to be detected is correctly installed, the charging stop command is sent to the channel to be detected, or it can be detected in all channels to be detected. When the size or quantity of the detection voltage value can already determine whether the built-in capacitor connected to the corresponding detection channel is correctly installed, a charging stop command is sent to each channel to be detected, which is not limited in this embodiment.

S130. Determine whether each built-in capacitor of the to-be-detected chip is correctly installed according to each charging current value and each detection voltage value, and generate a detection result.

In this embodiment, the method for determining whether each built-in capacitor is correctly installed can be selected according to needs. Whether the difference between the reached second voltage values is within a certain voltage range, if so, it is determined that the built-in capacitor is installed correctly; if not, it is determined that the built-in capacitor is not installed correctly; or according to the charging current value of the built-in capacitor Calculate the capacitance value of the built-in capacitor with the detected voltage value. If the capacitance value and its theoretical capacitance value are within a certain error range, it is determined that the built-in capacitor is installed correctly. If not, it is determined that the built-in capacitor is not installed correctly.

In the method for detecting built-in capacitors provided in the first embodiment of the present invention, the charging current values of the channels to be detected connected to the built-in capacitors of the chips to be detected through the pins of the chips to be detected are obtained, and the charging current values of the channels to be detected are respectively used to The built-in capacitor connected to the corresponding channel to be detected is charged, and the detection voltage value of each built-in capacitor is obtained, and then according to the charging current value and charging voltage value of each built-in capacitor, it is determined whether each built-in capacitor of the chip to be detected is correctly installed, and the detection result is generated. . By adopting the above technical solution, the present embodiment can detect the capacitance value of the built-in capacitor without using an oscillation circuit, and can realize the parallel detection of each built-in capacitor of the chip to be detected, which can shorten the time spent on detecting the built-in capacitor of the chip to be detected, and improve the built-in capacitor value. The detection efficiency of the capacitor is realized, so as to realize the built-in capacitor detection in the mass production stage of the chip to be tested.

Embodiment 2

FIG. 2 is a schematic flowchart of a method for detecting a built-in capacitor provided in this embodiment. In this embodiment, on the basis of the above-mentioned embodiments, "determining whether each built-in capacitor of the chip to be tested is correctly installed according to each charging current value and each detection voltage value" is optimized as: according to the charging current value of each built-in capacitor and the detection The voltage value calculates the detection capacitance value of each built-in capacitor; the detection capacitance value of each built-in capacitor is sent to the upper computer, so that the upper computer determines whether each built-in capacitor of the chip to be detected is correctly installed according to each detection capacitance value.

Further, before the said separately controlling each channel to be detected adopts the corresponding charging current value to charge the connected built-in capacitor, it also includes: respectively controlling each channel to be detected to apply 0V voltage to the connected built-in capacitor to release each built-in capacitor. residual charge in the capacitor.

Correspondingly, as shown in FIG. 2 , the method for detecting a built-in capacitor provided in this embodiment may include:

S210. Acquire the charging current value of each channel to be detected, wherein the built-in capacitor of the chip to be detected is connected to at least one channel to be detected through the pins of the chip to be detected.

S220 , respectively controlling each channel to be detected to apply a voltage of 0V to the connected built-in capacitors, so as to release the residual charges in each built-in capacitor.

In this embodiment, since charges may remain in the built-in capacitors of the chip to be detected, after each channel to be detected is enabled, the parameter measurement unit in each channel to be detected can be controlled to be connected to the channel to be detected to which it belongs. The built-in capacitors output 0V voltage to control the discharge of each built-in capacitor, so as to prevent the residual charge in the built-in capacitor from affecting the detection of the built-in capacitor. Among them, the residual charge can be connected to the residual charge in the built-in capacitor.

S230. For each channel to be detected, control the parameter measurement unit in the channel to be detected to charge the built-in capacitor connected to the channel to be detected by using the target current, and periodically pass the analog-to-digital conversion chip in the channel to be detected The detection voltage value of the built-in capacitor is grounded; wherein, the current value of the target current is the charging current value of the built-in capacitor connected to the channel to be detected.

S240. Calculate the detection capacitance value of each built-in capacitor according to the charging current value and the detection voltage value of each built-in capacitor.

The detection capacitance value can be understood as the capacitance value of the built-in capacitor detected by the detection device.

Specifically, the change amount of the detection voltage value of each built-in capacitor in unit time can be calculated according to the monitoring voltage value of each built-in capacitor in at least two detection cycles, and then according to the charging current of each built-in capacitor and the voltage value of each built-in capacitor in unit time The detection capacitance value of each built-in capacitor is obtained by calculating the change amount of the detection voltage value.

In order to further improve the accuracy of the calculated detection capacitance value of the built-in capacitor, and further improve the accuracy of the final detection result, preferably, the detection of each built-in capacitor is calculated according to the charging current value and the detection voltage value of each built-in capacitor. The capacitance value includes: for each built-in capacitor, determining the voltage rise time of the built-in capacitor from the preset minimum voltage value to the preset maximum voltage value according to the detection voltage value of the built-in capacitance value in each detection period; The detection capacitance value of the built-in capacitor is calculated from the charging current value, the voltage rise time, and the voltage difference between the preset maximum voltage value and the preset minimum voltage value. Wherein, the preset minimum voltage value and the preset maximum voltage value may be two voltage values within a time period in which the capacitor is charged relatively stably, which may be preset by the testing personnel.

Exemplarily, after controlling each channel to be detected to charge the connected built-in capacitors, the detection device may periodically detect the detected voltage value of each built-in capacitor, and determine whether the detected voltage value reaches the preset minimum voltage value, and then It starts timing when it reaches the preset minimum voltage value, continues to judge whether the detection voltage value of the built-in capacitor reaches the preset maximum voltage value, and stops timing when it reaches the preset maximum voltage value to obtain the voltage rise time of the built-in capacitor; then Calculate the ratio between the difference between the preset maximum voltage value and the preset minimum voltage value and the voltage rise time, and further calculate the product between the ratio and the charging current value of the built-in capacitor, and then the detection of the built-in capacitor can be obtained. capacitance value.

S250. Send the detected capacitance value of each built-in capacitor to the upper computer, so that the upper computer determines whether each built-in capacitor of the chip to be detected is correctly installed according to each detected capacitance value, and generates a detection result.

Exemplarily, after the detection device detects and obtains the detection capacitance value of each built-in capacitor, it can store the detection capacitance value of each built-in capacitor in the memory and notify the upper computer that the detection is completed, for example, setting the detection register inside the detection device from 0 to 1, to indicate that the detection capacitance value of each built-in capacitor has been detected; when the host computer monitors that the detection register is set to 1, it can determine that the detection of the detection capacitance value of each built-in capacitor is completed, and read each built-in capacitor from the memory of the detection device. The detection capacitance value of the capacitor, and further determine whether the difference between the detection capacitance value of each built-in capacitor and its theoretical capacitance value is within the preset capacitance range. If so, it can be judged that the built-in capacitor is installed correctly; The built-in capacitor is not properly installed, and further confirms that the test result of the chip to be tested is unqualified.

The method for detecting a built-in capacitor provided in the second embodiment of the present invention obtains the charging current value of each channel to be detected, first controls each channel to be detected to apply 0V voltage to the connected built-in capacitor, and then controls the channel to be detected to use the corresponding charging current The value charges the connected built-in capacitor, and detects the detection voltage value of each built-in capacitor, and then calculates the detection capacitor of each built-in capacitor according to each charging current value and detection voltage value, and sends the detection capacitor of each built-in capacitor to the upper computer. In order to make the upper computer judge whether each built-in capacitor is installed correctly according to the detected capacitance value of each built-in capacitor, and generate the detection result. By adopting the above technical solution in this embodiment, the accuracy of the detected capacitance value of the built-in capacitor obtained by detection can be further improved, thereby improving the accuracy of the detection result of the chip to be detected.

Embodiment 3

The third embodiment of the present invention provides a detection device with a built-in capacitor. The device can be implemented by software and/or hardware, can be integrated into a detection device, and can detect the built-in capacitor by executing a method for detecting the built-in capacitor. FIG. 3 is a structural block diagram of a detection device with a built-in capacitor according to Embodiment 3 of the present invention. As shown in FIG. 3, the device includes: a current acquisition module 301, a voltage detection module 302 and a result generation module 303, wherein,

The current acquisition module 301 is used for acquiring the charging current value of each channel to be detected, wherein the built-in capacitor of the chip to be detected is connected to at least one channel to be detected through the pins of the chip to be detected;

The voltage detection module 302 is used to separately control each channel to be detected to charge the connected built-in capacitor with the corresponding charging current value, and obtain the detected voltage value of each built-in capacitor;

The result generating module 303 is configured to determine whether each built-in capacitor of the to-be-detected chip is correctly installed according to each charging current value and each detection voltage value, and generate a detection result.

In the detection device for built-in capacitors provided by the third embodiment of the present invention, the current acquisition module 301 acquires the charging current values of the channels to be detected connected to the built-in capacitors of the to-be-detected chip through the pins of the to-be-detected chip, and the voltage detection module 302 respectively Use the charging current value of each channel to be detected to charge the built-in capacitor connected to the corresponding channel to be detected, and obtain the detected voltage value of each built-in capacitor, and then pass the result generation module 303 according to the charging current value and charging voltage value of each built-in capacitor. Determine whether each built-in capacitor of the chip to be tested is installed correctly, and generate the test result. By adopting the above technical solution, the present embodiment can detect the capacitance value of the built-in capacitor without using an oscillation circuit, and can realize the parallel detection of each built-in capacitor of the chip to be detected, which can shorten the time spent on detecting the built-in capacitor of the chip to be detected, and improve the built-in capacitor value. The detection efficiency of the capacitor is realized, so as to realize the built-in capacitor detection in the mass production stage of the chip to be tested.

In the above solution, the voltage detection module 302 can be specifically configured to: for each channel to be detected, control the parameter measurement unit in the channel to be detected to charge the built-in capacitor connected to the channel to be detected by using the target current, and The detection voltage value of the built-in capacitor is periodically detected by the analog-to-digital conversion chip in the channel to be detected; wherein, the current value of the target current is the charging current value of the built-in capacitor connected to the channel to be detected.

In the above solution, the result generation module 303 may include: a capacitance calculation unit for calculating the detection capacitance value of each built-in capacitor according to the charging current value and detection voltage value of each built-in capacitor; The detected capacitance value of the capacitor is sent to the upper computer, so that the upper computer determines whether each built-in capacitor of the chip to be detected is correctly installed according to each detected capacitance value, and generates a detection result.

In the above solution, the capacitance calculation unit may include: a time detection subunit, configured for each built-in capacitor to determine, for each built-in capacitor, the built-in capacitor from a preset minimum voltage value according to the detected voltage value of the built-in capacitor in each detection period. The voltage rise time for the value to rise to the preset maximum voltage value; the capacitance calculation sub-unit is used to calculate the value according to the charging current value, the voltage rise time and the difference between the preset maximum voltage value and the preset minimum voltage value The detected capacitance value of the built-in capacitor is calculated from the voltage difference value.

Further, the detection device for built-in capacitors provided in this embodiment may further include: a charging stop module, configured to control each channel to be detected to stop charging the connected built-in capacitors when the charging time of each built-in capacitor reaches a preset timeout time. .

Further, the detection device for built-in capacitors provided in this embodiment may further include: a charge release module, configured to separately control each to-be-detected channel to charge the connected built-in capacitor with a corresponding charging current value. The detection channel applies 0V to the connected built-in capacitors to discharge the residual charge in each built-in capacitor.

In the above solution, the current acquisition module may include: a parameter acquisition unit for acquiring capacitor parameters of the built-in capacitors connected to each channel to be detected, the capacitor parameters including theoretical capacitance value, charging current threshold and detection voltage threshold; The current determining unit is configured to determine the charging current value of each channel to be detected according to the preset detection time and the capacitor parameter.

The device for detecting a built-in capacitor provided in Embodiment 3 of the present invention can execute the method for detecting a built-in capacitor provided in any embodiment of the present invention, and has functional modules and beneficial effects corresponding to executing the method for detecting a built-in capacitor. For technical details not described in detail in this embodiment, reference may be made to the detection method for a built-in capacitor provided by any embodiment of the present invention.

Embodiment 4

FIG. 4 is a schematic structural diagram of a detection device according to Embodiment 4 of the present invention. As shown in FIG. 4 , the detection device includes a processor 40 and a memory 41, and may also include a plurality of detection channels 42; the processor 40 in the detection device The number can be one or more, and one processor 40 is taken as an example in FIG. 4 ; the processor 40, the memory 41 and each detection channel in the detection device can be connected through a bus or other means.

As a computer-readable storage medium, the memory 41 can be used to store software programs, computer-executable programs, and modules, such as program instructions/modules corresponding to the built-in capacitor detection method in the embodiment of the present invention (for example, a built-in capacitor detection device) The current acquisition module 301, the voltage detection module 302 and the result generation module 303). The processor 40 executes various functional applications and data processing of the detection device by running the software programs, instructions and modules stored in the memory 41 , that is, to implement the above-mentioned detection method for a built-in capacitor.

The memory 41 may mainly include a storage program area and a storage data area, wherein the storage program area may store an operating system, an application program required for at least one function; the storage data area may store data created according to the use of the terminal, and the like. In addition, memory 41 may include high-speed random access memory, and may also include non-volatile memory, such as at least one magnetic disk storage device, flash memory device, or other non-volatile solid-state storage device. In some instances, memory 41 may further include memory located remotely relative to processor 40, and these remote memories may be connected to the detection device through a network. Examples of such networks include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

The detection channel 42 may include a parameter measurement unit 421 and an analog-to-digital conversion chip 422, the parameter measurement unit 421 may be used to charge the built-in capacitor, and the analog-to-digital conversion chip 422 may be used to detect the detection capacitance value of the built-in capacitor, and convert it from an analog signal to Digital signal. The fourth embodiment of the present invention also provides a storage medium containing computer-executable instructions, the computer-executable instructions being used to execute a method for detecting a built-in capacitor when executed by a computer processor, the method comprising:

Of course, a storage medium containing computer-executable instructions provided by an embodiment of the present invention, the computer-executable instructions of which are not limited to the above-mentioned method operations, and can also perform the detection method for a built-in capacitor provided by any embodiment of the present invention. related operations in .

From the above description of the embodiments, those skilled in the art can clearly understand that the present invention can be realized by software and necessary general-purpose hardware, and of course can also be realized by hardware, but in many cases the former is a better embodiment . Based on such understanding, the technical solutions of the present invention can be embodied in the form of software products in essence or the parts that make contributions to the prior art, and the computer software products can be stored in a computer-readable storage medium, such as a floppy disk of a computer , read-only memory (Read-Only Memory, ROM), random access memory (Random Access Memory, RAM), flash memory (FLASH), hard disk or optical disk, etc., including several instructions to make a computer device (which can be a personal computer , server, or network device, etc.) to execute the methods described in the various embodiments of the present invention.

It is worth noting that, in the above-mentioned embodiment of the detection device with built-in capacitor, the included units and modules are only divided according to functional logic, but are not limited to the above-mentioned division, as long as the corresponding functions can be realized; , the specific names of the functional units are only for the convenience of distinguishing from each other, and are not used to limit the protection scope of the present invention.

Note that the above are only preferred embodiments of the present invention and applied technical principles. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and various obvious changes, readjustments and substitutions can be made by those skilled in the art without departing from the protection scope of the present invention. Therefore, although the present invention has been described in detail through the above embodiments, the present invention is not limited to the above embodiments, and can also include more other equivalent embodiments without departing from the concept of the present invention. The scope is determined by the scope of the appended claims.

Claims

A detection method for a built-in capacitor, characterized in that,

acquiring the charging current value of each channel to be detected, wherein the built-in capacitor of the chip to be detected is connected to at least one channel to be detected through the pins of the chip to be detected;

Control each channel to be detected separately to charge the connected built-in capacitor with the corresponding charging current value, and obtain the detected voltage value of each built-in capacitor;

According to each charging current value and each detection voltage value, it is determined whether each built-in capacitor of the to-be-detected chip is correctly installed, and a detection result is generated.
The method according to claim 1, wherein the step of separately controlling each channel to be detected to charge the connected built-in capacitor with a corresponding charging current value, and acquiring the detected voltage value of each built-in capacitor, comprises:

For each channel to be detected, the parameter measurement unit in the channel to be detected is controlled to charge the built-in capacitor connected to the channel to be detected by using the target current, and the analog-to-digital conversion chip in the channel to be detected is periodically detected. The detection voltage value of the built-in capacitor; wherein, the current value of the target current is the charging current value of the built-in capacitor connected to the channel to be detected.
The method according to claim 2, wherein the determining whether each built-in capacitor of the to-be-detected chip is correctly installed according to each charging current value and each detection voltage value comprises:

Calculate the detection capacitance value of each built-in capacitor according to the charging current value and detection voltage value of each built-in capacitor;

The detected capacitance value of each built-in capacitor is sent to the upper computer, so that the upper computer determines whether each built-in capacitor of the chip to be detected is correctly installed according to each detected capacitance value.
The method according to claim 3, wherein calculating the detection capacitance value of each built-in capacitor according to the charging current value and the detection voltage value of each built-in capacitor comprises:

For each built-in capacitor, determine the voltage rise time of the built-in capacitor from the preset minimum voltage value to the preset maximum voltage value according to the detection voltage value of the built-in capacitor in each detection period;

The detection capacitance value of the built-in capacitor is calculated according to the charging current value, the voltage rise time, and the voltage difference between the preset maximum voltage value and the preset minimum voltage value.
The method according to any one of claims 1-4, characterized in that, further comprising:

When the charging time of each built-in capacitor reaches a preset timeout time, each channel to be detected is controlled to stop charging the connected built-in capacitor.
The method according to any one of claims 1-4, characterized in that before the separately controlling each channel to be detected to charge the connected built-in capacitor with a corresponding charging current value, the method further comprises:

Control each channel to be detected to apply 0V voltage to the connected built-in capacitors, so as to release the residual charge in each built-in capacitor.
The method according to any one of claims 1-4, wherein the acquiring the charging current value of each channel to be detected comprises:

Acquiring capacitor parameters of the built-in capacitors connected to each channel to be detected, the capacitor parameters including theoretical capacitance value, charging current threshold and detection voltage threshold;

The charging current value of each channel to be detected is determined according to the preset detection time and the capacitor parameters.
A detection device with a built-in capacitor, characterized in that:

a current acquisition module for acquiring the charging current value of each channel to be detected, wherein the built-in capacitor of the chip to be detected is connected to at least one channel to be detected through the pins of the chip to be detected;

The voltage detection module is used to separately control each channel to be detected to charge the connected built-in capacitor with the corresponding charging current value, and obtain the detected voltage value of each built-in capacitor;

The result generating module is used for determining whether each built-in capacitor of the to-be-detected chip is correctly installed according to each charging current value and each detection voltage value, and generating a detection result.
A detection device, characterized in that it includes:

one or more processors;

memory for storing one or more programs,

When the one or more programs are executed by the one or more processors, the one or more processors implement the method for detecting a built-in capacitor according to any one of claims 1-7.
A computer-readable storage medium on which a computer program is stored, characterized in that, when the program is executed by a processor, the method for detecting a built-in capacitor according to any one of claims 1-7 is implemented.